KR20150006511A - Automatic tester with socket for test of photo diode array biochip - Google Patents
Automatic tester with socket for test of photo diode array biochip Download PDFInfo
- Publication number
- KR20150006511A KR20150006511A KR1020130079678A KR20130079678A KR20150006511A KR 20150006511 A KR20150006511 A KR 20150006511A KR 1020130079678 A KR1020130079678 A KR 1020130079678A KR 20130079678 A KR20130079678 A KR 20130079678A KR 20150006511 A KR20150006511 A KR 20150006511A
- Authority
- KR
- South Korea
- Prior art keywords
- photodiode array
- mounting
- package
- array biochip
- pivot
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Apparatus Associated With Microorganisms And Enzymes (AREA)
Abstract
Description
The present invention relates to an automatic inspection apparatus having a socket for testing a photodiode array biochip, and a photodiode array biochip test capable of performing electrical and optical tests on the photodiode array biochip without soldering the photodiode array biochip to a substrate. To an automatic inspecting machine having a socket for inserting a socket.
Biochip refers to a biological microchip that can analyze DNA defects, protein distribution, and reaction patterns by combining biological molecules such as DNA and proteins on a small substrate. Such biochips are attracting attention as they are expected to cause innovative changes in fields of science and technology research, new drug development processes, and clinical diagnosis, and are rapidly becoming popular. Particularly in the field of clinical diagnosis, biochips capable of detecting and diagnosing gene mutations related to cancer and AIDS have been developed.
On the other hand, biochips are applied to agriculture, industry, and environmental monitoring fields. These fields are less competitive than clinical diagnosis fields and have many opportunities for commercial success. Development of a device having an electric switching function is considered by reasonably utilizing excellent functions such as the memory ability (DNA etc.) of the biomaterial, the molecular recognition function (enzyme, antibody etc.), the photoreceptive function (rhodopsin etc.) have.
The photodiode array biochip produced by the manufacturing process is mounted in a package and electrical and optical tests are performed. In order to perform such electrical and optical tests, it is necessary to connect the package to a substrate such as a PCB Do. At this time, the package and the substrate are soldered to connect the package to the substrate. However, such soldering is troublesome because electrical and optical testing of the photodiode array biochip must be performed from time to time whenever necessary.
Therefore, there is a problem that the human power is wasted, and the electrical and optical test time is excessively generated.
It is an object of the present invention to provide a photodiode array bio-chip test photodiode which can quickly perform electrical and optical tests by inserting a package equipped with a photodiode array bio- And an automatic inspecting machine having an array biochip test socket.
The automatic inspecting apparatus having a socket for testing a photodiode array biochip according to an embodiment of the present invention includes a mounting unit for providing a mounting space for mounting a package on which a photodiode array biochip is mounted; A lid part covering the photodiode array bio-chip and electrically connecting the photodiode array bio-chip to a substrate on which the package is mounted; And a connecting portion fixedly connected to one side of the seat portion and having a pivot shaft inserted into a pivot hole provided in the lid portion so that the lid portion can rotate about the pivot axis at an upper portion of the seat portion.
Here, the seating portion is formed with an insertion groove into which the package is inserted.
In addition, a mounting groove is formed on the other side of the seat portion, and the lid portion forms a mounting projection on the opposite side of the pivot hole. When the lid portion covers the photodiode array bio-chip, the mounting projection is inserted into the mounting groove, So that the lid part can be closely fixed to the seating part.
The connection unit may include a first body coupled to one end of the seat, and having a first insertion hole; A second body coupled to and fixed to the other end of the seat portion, the second body having a second insertion hole; An intermediate body formed between the first body and the second body and having a third insertion hole formed therein and having a space separated from the first body and the second body; And a pivot shaft inserted into the first insertion hole, the second insertion hole, and the third insertion hole.
The pivot hole may include a first pivot hole and a second pivot hole, the first pivot hole may insert a pivot shaft on a space separated by a space between the first body and the intermediate body, And a pivot shaft on the space between the intermediate body and the second body is inserted.
The distance between the first body and the intermediate body and the distance between the middle body and the second body are the same.
According to the present invention, by inserting a package in which a photodiode array bio-chip is mounted, electrical and optical tests can be performed quickly, there is no need to perform soldering every time the electrical and optical tests of the photodiode array bio-chip are required.
In addition, according to the present invention, there is no waste of labor and excessive time for electrical and optical testing of the photodiode array biochip.
1 is a perspective view illustrating an automatic tester including a socket for testing a photodiode array biochip according to an embodiment of the present invention.
BRIEF DESCRIPTION OF THE DRAWINGS The objectives, specific advantages and novel features of the present invention will become more apparent from the following detailed description taken in conjunction with the accompanying drawings, in which: FIG. It should be noted that, in the present specification, the reference numerals are added to the constituent elements of the drawings, and the same constituent elements are assigned the same number as much as possible even if they are displayed on different drawings. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS In the following description of the present invention, detailed description of related arts which may unnecessarily obscure the gist of the present invention will be omitted.
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.
1 is a perspective view illustrating an automatic tester including a socket for testing a photodiode array biochip according to an embodiment of the present invention. Referring to FIG. 1, an automatic tester including a photodiode array biochip testing socket according to an embodiment of the present invention includes a
The
The
The
The first pivot hole of the
In addition, with respect to mounting the package with the photodiode array biochip inserted into the
Meanwhile, with respect to an automatic inspection apparatus having a socket for testing a photodiode array biochip according to an embodiment of the present invention, since soldering has to be performed every time when electrical and optical testing of a photodiode array biochip is required, There is a problem that the human power is wasted and the electrical and optical test time is excessively generated. However, in an embodiment of the present invention, the package mounting the photodiode array biochip can be inserted through the automatic inspection device having the socket for testing the photodiode array biochip to perform the electrical and optical tests quickly, There is no need to repeatedly perform soldering every time electrical and optical testing of the photodiode array biochip is required and there is no waste of manpower and excessive time for electrical and optical testing of the photodiode array biochip.
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not to be limited to the disclosed embodiments, but, on the contrary, It is obvious that the improvement is possible.
It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims.
100:
110: seating space
120a, 120b: insertion groove
130: mounting groove
200:
210: Mounting projection
300: connection
310: first body
320: second body
330: intermediate body
340:
400: Automatic Inspection
Claims (6)
A lid part covering the photodiode array bio-chip and electrically connecting the photodiode array bio-chip to a substrate on which the package is mounted; And
A connecting portion that is connected to and fixed to one side of the seat portion and has a pivot shaft inserted into a pivot hole provided in the lid portion so that the lid portion can rotate about the pivot axis at an upper portion of the seat portion;
And a photodiode array bio-chip test socket.
Wherein the mounting portion is formed with an insertion groove into which the package is inserted.
Wherein the mounting recess is formed on the other side of the mounting portion and the lid portion forms mounting protrusions on the opposite side of the pivotal hole, and when the lid portion covers the photodiode array biochip, the mounting projection is inserted into the mounting groove, Wherein the socket is fixed to the mounting part by being fixed to the mounting part of the photodiode array.
The connecting portion
A first body fixedly connected to one end of the seat portion and having a first insertion hole;
A second body coupled to and fixed to the other end of the seat portion, the second body having a second insertion hole;
An intermediate body formed between the first body and the second body and having a third insertion hole formed therein and having a space separated from the first body and the second body; And
A pivot shaft inserted into the first insertion hole, the second insertion hole, and the third insertion hole;
And a photodiode array bio-chip test socket.
Wherein the pivot hole includes a first rotating hole and a second pivot, the first pivoting hole inserting a pivoting axis in a spaced-apart space between the first body and the intermediate body, And a rotation axis on a space between the first body and the second body is inserted into the second body.
Wherein the distance between the first body and the middle body and the distance between the middle body and the second body are the same.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020130079678A KR20150006511A (en) | 2013-07-08 | 2013-07-08 | Automatic tester with socket for test of photo diode array biochip |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020130079678A KR20150006511A (en) | 2013-07-08 | 2013-07-08 | Automatic tester with socket for test of photo diode array biochip |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20150006511A true KR20150006511A (en) | 2015-01-19 |
Family
ID=52569816
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020130079678A KR20150006511A (en) | 2013-07-08 | 2013-07-08 | Automatic tester with socket for test of photo diode array biochip |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20150006511A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115993469A (en) * | 2023-03-22 | 2023-04-21 | 深圳市鲁光电子科技有限公司 | Diode device self-test device |
-
2013
- 2013-07-08 KR KR1020130079678A patent/KR20150006511A/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115993469A (en) * | 2023-03-22 | 2023-04-21 | 深圳市鲁光电子科技有限公司 | Diode device self-test device |
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