KR20150004838A - 멀티-컴포넌트 3d 모델에 대한 에러 메트릭을 추정하기 위한 방법 및 장치 - Google Patents

멀티-컴포넌트 3d 모델에 대한 에러 메트릭을 추정하기 위한 방법 및 장치 Download PDF

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KR20150004838A
KR20150004838A KR1020147031935A KR20147031935A KR20150004838A KR 20150004838 A KR20150004838 A KR 20150004838A KR 1020147031935 A KR1020147031935 A KR 1020147031935A KR 20147031935 A KR20147031935 A KR 20147031935A KR 20150004838 A KR20150004838 A KR 20150004838A
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model
component
determining
error
point
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타오 루오
웬페이 지앙
캉잉 차이
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톰슨 라이센싱
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three-dimensional [3D] modelling for computer graphics
    • G06T17/20—Finite element generation, e.g. wire-frame surface description, tesselation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T17/00—Three-dimensional [3D] modelling for computer graphics

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  • Theoretical Computer Science (AREA)
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  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
KR1020147031935A 2012-04-19 2012-12-29 멀티-컴포넌트 3d 모델에 대한 에러 메트릭을 추정하기 위한 방법 및 장치 Withdrawn KR20150004838A (ko)

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CNPCT/CN2012/074370 2012-04-19
CN2012074370 2012-04-19
PCT/CN2012/087936 WO2013155858A1 (en) 2012-04-19 2012-12-29 Method and apparatus for estimating error metrics for multi-component 3d models

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US (1) US20150084953A1 (enExample)
EP (1) EP2839438A4 (enExample)
JP (1) JP2015517154A (enExample)
KR (1) KR20150004838A (enExample)
CN (1) CN104246830A (enExample)
WO (1) WO2013155858A1 (enExample)

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EP3098734A1 (en) * 2015-05-28 2016-11-30 Dassault Systèmes Querying a database with likeness criterion
US11043042B2 (en) * 2016-05-16 2021-06-22 Hewlett-Packard Development Company, L.P. Generating a shape profile for a 3D object
EP3264286B1 (en) 2016-06-28 2020-11-18 Dassault Systèmes Querying a database with morphology criterion
US11281824B2 (en) 2017-12-13 2022-03-22 Dassault Systemes Simulia Corp. Authoring loading and boundary conditions for simulation scenarios
CN109101741B (zh) * 2018-08-27 2023-07-21 武汉大学 一种基于三角网格简化的复杂曲面检测自适应采样方法
US11816798B1 (en) * 2020-03-17 2023-11-14 Apple Inc. 3D surface representation refinement
US11947335B2 (en) * 2020-12-30 2024-04-02 Divergent Technologies, Inc. Multi-component structure optimization for combining 3-D printed and commercially available parts
US12100102B2 (en) * 2021-07-13 2024-09-24 Tencent America LLC Image based sampling metric for quality assessment
US12548260B2 (en) * 2024-04-23 2026-02-10 Adobe Inc. Techniques for triangle-level rejection sampling in three-dimensional object meshes

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JPH09270025A (ja) * 1996-03-29 1997-10-14 Sumitomo Metal Ind Ltd 有限要素解析におけるリゾーニング方法
US6771261B2 (en) * 2001-08-30 2004-08-03 Intel Corporation Error metric for mesh simplification processing
JP2005242651A (ja) * 2004-02-26 2005-09-08 Hokkaido Univ 高品質メッシュモデルの生成システムおよび生成プログラム
CN101084498A (zh) * 2004-12-31 2007-12-05 富士通株式会社 三维模型的检索方法和装置
CN101446980B (zh) * 2008-12-26 2011-09-14 北京大学 一种基于彩色旋转图像的三维部分形状匹配和检索方法
CN101877147B (zh) * 2010-06-29 2012-10-03 浙江大学 三维三角形网格模型的简化算法
WO2012000132A1 (en) * 2010-06-30 2012-01-05 Thomson Broadband R & D (Beijing) Co., Ltd. Method and apparatus for detecting repetitive structures in 3d mesh models
US20120029882A1 (en) * 2010-07-30 2012-02-02 David Bommes System and method for generating quadrangulations
KR101730217B1 (ko) * 2010-09-30 2017-04-25 톰슨 라이센싱 기하학적 패턴의 인코딩 방법 및 장치, 기하학적 패턴의 디코딩 방법 및 장치

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JP2015517154A (ja) 2015-06-18
EP2839438A1 (en) 2015-02-25
US20150084953A1 (en) 2015-03-26
EP2839438A4 (en) 2016-04-20
WO2013155858A1 (en) 2013-10-24
CN104246830A (zh) 2014-12-24

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Patent event date: 20141113

Patent event code: PA01051R01D

Comment text: International Patent Application

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WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid