KR20140047418A - Metal plating device - Google Patents

Metal plating device Download PDF

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KR20140047418A
KR20140047418A KR1020120113696A KR20120113696A KR20140047418A KR 20140047418 A KR20140047418 A KR 20140047418A KR 1020120113696 A KR1020120113696 A KR 1020120113696A KR 20120113696 A KR20120113696 A KR 20120113696A KR 20140047418 A KR20140047418 A KR 20140047418A
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South Korea
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plating
electrodes
metal
plated
pulse rectifier
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KR1020120113696A
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KR101420865B1 (en
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박병준
오상봉
박동관
정오곤
김재환
정우철
이선형
우경한
허욱환
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주식회사 익스톨
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    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1619Apparatus for electroless plating
    • C23C18/1628Specific elements or parts of the apparatus
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1619Apparatus for electroless plating
    • C23C18/1632Features specific for the apparatus, e.g. layout of cells and of its equipment, multiple cells
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1655Process features
    • C23C18/1664Process features with additional means during the plating process
    • C23C18/1671Electric field
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1655Process features
    • C23C18/1664Process features with additional means during the plating process
    • C23C18/1673Magnetic field
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1635Composition of the substrate
    • C23C18/1639Substrates other than metallic, e.g. inorganic or organic or non-conductive
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1635Composition of the substrate
    • C23C18/1639Substrates other than metallic, e.g. inorganic or organic or non-conductive
    • C23C18/1642Substrates other than metallic, e.g. inorganic or organic or non-conductive semiconductor
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/002Cell separation, e.g. membranes, diaphragms
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/007Current directing devices
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D17/00Constructional parts, or assemblies thereof, of cells for electrolytic coating
    • C25D17/10Electrodes, e.g. composition, counter electrode
    • C25D17/12Shape or form
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/18Electroplating using modulated, pulsed or reversing current
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/54Electroplating of non-metallic surfaces
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25DPROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
    • C25D5/00Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
    • C25D5/60Electroplating characterised by the structure or texture of the layers
    • C25D5/605Surface topography of the layers, e.g. rough, dendritic or nodular layers
    • C25D5/611Smooth layers

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  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Electroplating Methods And Accessories (AREA)

Abstract

The present invention relates to a metal plating device which is provided to use a pulse rectifier to plate a workpiece with metal and which comprises: a plating cell having electrodes on both sided thereof; a membrane for partitioning the plating cell into an electrolyzing chamber in which an electrolyte is contained and a plating chamber in which a plating solution is contained; and the pulse rectifier which alternately applies positive (+) and negative (-) charges. [Reference numerals] (130) Pulse rectifier

Description

금속 도금장치{Metal Plating Device}[0001] The present invention relates to a metal plating apparatus,

본 발명은 펄스 정류기를 이용하여 도금 대상물에 금속 도금을 할 수 있도록 형성된 금속 도금장치에 관한 것이다.BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a metal plating apparatus which is configured to perform metal plating on an object to be plated using a pulse rectifier.

일반적으로, 도금 대상물에 장식효과 및 도전성을 부여할 목적으로 금속 도금피막을 형성함에 있어서는 무전해도금에 의해 금속 도금피막을 형성 하거나, 절연소재 표면에 무전해도금 후에 그 표면에 재차 전기도금을 하여 금속 도금피막을 형성하여 그 표면에 형성될 패턴을 에칭방법으로 금속 도금피막을 형성하였다. In general, in forming a metal plating film for imparting a decorative effect and conductivity to a plating object, a metal plating film is formed by electroless plating, or electroless plating is performed on the surface of the insulating material, A metal plating film was formed, and a pattern to be formed on the surface of the metal plating film was etched to form a metal plating film.

그러나, 이러한 방법은 작업공정이 복잡하며 아울러 절연소재 표면에 무전해도금을 형성하면 도금탕 내의 액온이 높아 절연소재의 변형이 발생할 수 있으며 가격이 고가이어서 경제성이 떨어지는 단점이 있었다.However, this method has a disadvantage in that the working process is complicated and the electroless plating is formed on the surface of the insulating material, the insulating material may be deformed due to a high liquid temperature in the plating bath, and the cost is low and the cost is low.

이러한 문제로 인해 전기로 도금할 수 있는 전해도금장치(전기 도금장치)를 개발하였으나, 종래의 전해도금장치는 복잡한 기계적 구조와 여기에 사용되는 용액의 많은 제약 조건과 더불어 도금 대상물이 전기가 통하는 도체이어야만 되므로 도금 대상에 대한 제약이 있었다. However, the conventional electroplating apparatus has a complicated mechanical structure and a large number of restricting conditions of the solution used therein. In addition, the electroplating apparatus (electroplating apparatus) There was a restriction on the object to be plated.

또한, 도금 대상물의 용액 내의 위치에 따라 도금두께의 편차가 심하고, 도금된 금속의 조직이 커서 리플로우 후에 피트(pit)나 휘스커(Whisker) 등의 발생위험이 높은 문제가 있었다. In addition, there is a problem that the thickness of the plating varies greatly depending on the position in the solution of the object to be plated, and there is a high risk of occurrence of pits, whiskers, etc. after reflow of the plated metal.

아울러, PCB기판, 회로기판, Wafer 등과 같이 회로가 연결되어있지 않아도 경우에는 전해도금으로 도금이 어려워, PVD와 CVD같은 증착법이나 무전해도금으로 도금하여야만 하는 제약이 있었다.In addition, when the circuit is not connected, such as a PCB substrate, a circuit substrate, and a wafer, plating is difficult due to electrolytic plating, and there is a restriction that plating should be performed by a deposition method such as PVD and CVD or electroless plating.

공개특허공보 제10-2011-0048737(2011.05.12 공개)Open Patent Publication No. 10-2011-0048737 (published May 12, 2011)

본 발명의 과제는 펄스 정류기를 이용하여 전해실에 (+)극과 (-)극을 교대로 인가함으로써, 도금실에 들어 있는 도금 대상물의 전체 면을 균일하게 도금하고, 회로가 연결되어 있지 않은 전자기판들을 전기적 힘을 가해 도금할 수 있도록 하는 금속 도금장치를 제공함에 있다.(+) Pole and (-) pole are alternately applied to an electrolysis chamber using a pulse rectifier to uniformly coat the entire surface of the object to be plated contained in the plating chamber, And to provide a metal plating apparatus capable of plating electronic substrates by applying an electric force.

상기의 과제를 달성하기 위한 본 발명에 따른 금속 도금장치는 양측면에 전극들이 형성된 도금 셀과, 상기 도금 셀을 전해액이 들어있는 전해실과 도금액이 들어있는 도금실로 구획하는 멤브레인을 포함하는 전기 도금장치에 있어서, 상기 전극들에 대해 (+)극과 (-)극을 교대로 인가하는 펄스(Pulse) 정류기를 더 포함한다.According to an aspect of the present invention, there is provided a metal plating apparatus comprising: a plating cell having electrodes on both sides thereof; and a membrane for dividing the plating cell into an electrolysis chamber containing an electrolytic solution and a plating chamber containing a plating solution, And further includes a pulse rectifier for alternately applying positive (+) and negative (-) poles to the electrodes.

본 발명에 따르면, 펄스 정류기를 이용하여 전해실에 (+)극과 (-)극을 교대로 인가함으로써, 도금실에 들어 있는 도금 대상물의 전체 면을 고르게 도금할 수 있게 된다.According to the present invention, by alternately applying the (+) electrode and the (-) electrode to the electrolytic chamber using the pulse rectifier, the entire surface of the object to be plated contained in the plating chamber can be uniformly plated.

특히, 전극들을 중앙에서 양측면으로 갈수록 두께가 더 두꺼워지도록 형성하거나, 전극들과 도금 대상물 사이에 전도체를 더 추가함으로써 도금두께의 편차를 줄일 수 있다.Particularly, it is possible to form the electrodes to be thicker from the center toward both sides, or to reduce the variation in the thickness of the plating by further adding a conductor between the electrodes and the object to be plated.

또한, 펄스 정류기의 펄스 타임과 리버스 타임, 오프타임 및 전류량을 적절히 조절하여 도금을 함으로써, 도금시 표면의 금속조직을 작고 조밀하게 하여 피트(pit) 및 휘스커(Whisker)를 방지할 수 있다.Also, by adjusting the pulse time, the reverse time, the off time, and the current amount of the pulse rectifier appropriately, the metal structure on the surface during plating can be made small and dense to prevent pits and whiskers.

아울러, PCB기판, 회로기판, Wafer 등과 같이 회로가 연결되어있지 않아 증착법 및 무전해도금으로 도금하는 전자기판을 전기적 힘을 가해 금속도금을 할 수 있게 된다.In addition, since circuits such as PCB substrate, circuit substrate, and wafer are not connected, the electronic substrate to be plated by vapor deposition and electroless plating can be subjected to metal plating by an electric force.

도 1은 본 발명의 일 실시예에 따른 금속 도금장치를 도시한 도면.
도 2는 도 1에 있어서, 펄스 정류기의 전류인가 방식을 나타낸 도면.
도 3은 도 1에 있어서, 온 타임과 리버스 타임, 오프타임 및 전류량을 각각 다르게 하여 도금한 실험한 표.
도 4는 도 3의 도금방법에 따라 도금된 기판들의 표면 SEM 사진.
도 5는 종래의 전기 도금방법으로 금속 도금된 기판의 표면 SEM 사진.
도 6은 본 발명의 일실시예에 따른 도금방법으로 도금된 기판의 표면 SEM 사진.
도 7은 도 6 있어서, 펄스 및 리버스 상태에서 전자의 흐름 및 금속이온의 흐름을 도시한 도면.
도 8 도 1에 있어서, 도금 대상물에 작용하는 전극들의 전기력선을 도시한 도면.
도 9내지 도 11은 본 발명의 다른 실시예에 따른 금속 도금장치들 및 도금 대상물에 작용하는 전극들의 전기력선을 도시한 도시한 도면.
도 12는 종래의 정전류 형태의 금속 도금장치로 도금한 경우와, 본 발명 및 실시예들의 금속도금 장치로 도금한 경우의 도금두께의 균일도를 비교한 표.
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a view of a metal plating apparatus according to an embodiment of the present invention; FIG.
Fig. 2 is a view showing a current application method of the pulse rectifier in Fig. 1; Fig.
FIG. 3 is an experimental table of FIG. 1 in which on-time, reverse-time, off-time, and current amounts are different from each other.
Figure 4 is a SEM image of the surface of the plated substrates according to the plating method of Figure 3;
5 is a SEM photograph of a surface of a metal-plated substrate by a conventional electroplating method.
6 is a SEM image of a surface of a substrate plated by a plating method according to an embodiment of the present invention.
FIG. 7 is a view showing the flow of electrons and the flow of metal ions in the pulse and reverse states, in FIG. 6; FIG.
8 is a view showing an electric force line of electrodes acting on a plating object in Fig. 1; Fig.
9 to 11 are views showing lines of electric force of metal plating apparatuses and electrodes that act on a plating object according to another embodiment of the present invention.
FIG. 12 is a table comparing the uniformity of the thickness of the plating in the case of plating with a conventional constant current type metal plating apparatus and the case of plating with the metal plating apparatus of the present invention and the embodiments.

이하 첨부된 도면을 참조하여, 바람직한 실시예에 따른 본 발명을 상세히 설명하기로 한다. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

도 1은 본 발명의 일 실시예에 따른 금속 도금장치를 도시한 도면이다.1 is a view illustrating a metal plating apparatus according to an embodiment of the present invention.

도 1에 도시된 바와 같이, 금속 도금장치(100)는 도금 대상물(10)에 장식효과 및 도전성을 부여할 목적으로 도금 대상물(10)에 금속 도금피막을 형성하여 주는 장치로, 도금 셀(110)과 멤브레인(120) 및 펄스 정류기(130)를 포함한다.1, the metal plating apparatus 100 is a device for forming a metal plating film on the object to be plated 10 for the purpose of imparting decorative effect and conductivity to the object 10 to be plated, A membrane 120, and a pulse rectifier 130.

도금 셀(110)의 양측면에는 전극(140)들이 형성되어 있으며, 멤브레인(120)에 의해서 전해액(20)이 들어있는 전해실(111)과 도금액(30)이 들어 있는 도금실(112)로 구획된다. 따라서, 도금실(112)의 도금액(30) 속으로 도금 대상물(10)을 넣은 다음 양 전극(140)들에 전원을 통하게 하면 도금액(30) 속의 금속 이온들이 환원되면서 도금 대상물(10)이 도금된다. 이때, 전극(140)들은 금속이온을 용해할 수 있는 금속이온 용해전극과 단순히 전자만을 공급하는 불용성 전극 중 적어도 하나로 이루어질 수 있다.Electrodes 140 are formed on both sides of the plating cell 110. The electrolytic chamber 111 containing the electrolytic solution 20 by the membrane 120 and the plating chamber 112 containing the plating solution 30 are partitioned do. Therefore, when the plating object 10 is inserted into the plating liquid 30 of the plating chamber 112 and power is supplied to both electrodes 140, the metal ions in the plating liquid 30 are reduced and the plating object 10 is plated do. At this time, the electrodes 140 may include at least one of a metal ion dissolution electrode capable of dissolving metal ions and an insoluble electrode simply supplying only electrons.

한편, 도금 셀(110)의 형상은 예시된 바에 한정되지 않으며, 도금 대상물(10)의 형상 및 표면상태에 따라 달라질 수 있다.The shape of the plating cell 110 is not limited to the illustrated example, and may vary depending on the shape and surface condition of the object 10 to be plated.

멤브레인(120)은 전자만을 통과 시키고 수용액과 전해액(20)의 섞임을 방지할 수 있을 정도의 공극을 가진 것으로, 도금 셀(110) 내부에 설치되어 전해액(20)이 들어있는 전해실(111)과 도금액(30)이 들어 있는 도금실(112)로 구획하여 준다. 따라서, 양 전극(140)들에 전원이 통하면, 전자(e)는 멤브레인(120)을 통과하여 (-)전극 쪽으로 이동하게 된다.The membrane 120 has an air gap enough to pass only electrons and prevent mixing of the aqueous solution and the electrolytic solution 20. The membrane 120 has an electrolytic chamber 111 provided inside the plating cell 110 and containing the electrolytic solution 20, And a plating chamber 112 containing a plating liquid 30. Therefore, when power is supplied to both the electrodes 140, the electrons e pass through the membrane 120 and move toward the negative electrode.

여기서, 멤브레인(120)은 도금 셀(110) 내부에 각각 두 개를 설치하여 양측에 두 개의 전해실(111)과 중앙에 한 개의 도금실(112)을 구비하도록 형성하는 것이 바람직하나, 이는 실시자의 필요에 따라 달라질 수 있다.Here, it is preferable that the membrane 120 is formed to have two electrolysis chambers 111 on both sides and one plating chamber 112 in the center in the plating cell 110, It depends on the needs of the person.

전극(140)들은 상기 전극(140)들에 대해 (+)극과 (-)극을 교대로 인가하는 펄스(Pulse) 정류기를 더 포함한다. 이와 같이, 펄스 정류기(130)에 의해 각각의 전해실(111)에 (+)극과 (-)극이 교대로 인가되면서 도금실(112)에 들어 있는 도금 대상물(10)의 전체 면이 도금액(30)에 의해 도금된다.The electrodes 140 further include a pulse rectifier for alternately applying positive and negative poles to the electrodes 140. As described above, the positive rectifier and the negative electrode are alternately applied to the respective electrolytic chambers 111 by the pulse rectifier 130 so that the entire surface of the object to be plated 10 contained in the plating chamber 112 is filled with the plating liquid (30).

한편, 도금액(30)은 무전해 도금액으로 이루어질 수 있다. 무전해 도금액은 외부로부터 전기에너지를 공급받지 않고, 자기 촉매적으로 환원시켜 도금 대상물(10)의 표면 위에 금속을 석출시키는 것으로, 도체뿐만 아니라 플라스틱이나 유기체 같은 다양한 도금 대상물(10)에 대해서 적용할 수 있는 장점이 있다. On the other hand, the plating liquid 30 may be formed of an electroless plating solution. The electroless plating solution is a method of autocatalytically reducing the metal to be deposited on the surface of the object to be plated 10 without being supplied with electric energy from the outside, and it is applicable to various objects 10 to be plated such as plastic or organic as well as conductor There are advantages to be able to.

도 2는 도 1에 있어서, 펄스 정류기의 전류인가 방식을 나타낸 도면이다.Fig. 2 is a diagram showing a current application method of the pulse rectifier in Fig.

도 2에 도시된 바와 같이, 펄스 정류기(130)는 전류를 (+)극과 (-)극으로 급격하게 변화시켜 공급하는 장치로, 펄스 정류기(130)의 전류인가시간을 펄스 타임(Pulse Time)이라 하고, 역전류인가시간을 리버스 타임(Reverse Time)이라 한다. 또한, 펄스 타임에 흐르는 전류량을 Ep라 하며, 리버스 타임에 흐르는 전류량을 Er이라 한다.As shown in FIG. 2, the pulse rectifier 130 is a device for rapidly changing the current to the (+) and (-) poles and supplies the current application time of the pulse rectifier 130 to the pulse time ), And the reverse current application time is referred to as a reverse time. The amount of current flowing in the pulse time is referred to as Ep and the amount of current flowing in the reverse time is referred to as Er.

여기서, 펄스 타임과 리버스 타임 및 전류량을 적절히 조절하여 도금을 하면, 도금 대상물(10)의 전체면을 고르게 도금할 수 있을 뿐만 아니라 전면 또는 후면만 따로 도금이 가능해진다. 예를 들어, Ep를 크게 하고, 펄스 타임을 길게 적용하면 도금 대상물(10) 전면의 도금두께가 두꺼워지며, 반대로 Er을 크게 하고 리버스 타임을 길게 하면 도금 대상물(10) 후면의 도금두께가 두꺼워지게 된다.Here, if plating is performed by appropriately adjusting the pulse time, the reverse time and the amount of current, not only the entire surface of the object 10 to be plated can be uniformly coated but also the front surface or the back surface can be plated separately. For example, increasing the Ep and increasing the pulse time may increase the plating thickness on the entire surface of the object to be plated 10, while increasing Er and increasing the reverse time may increase the thickness of the plating on the rear surface of the object 10 do.

도 3은 도 1에 있어서, 펄스 타임과 리버스 타임, 오프 타임 및 전류량을 각각 다르게 하여 도금한 실험한 표이다. 그리고, 도 4는 도 3의 도금방법에 따라 도금된 기판들의 표면 SEM 사진이다.FIG. 3 is an experimental table of FIG. 1 in which pulse time, reverse time, off time, and current amount are different from each other. 4 is a SEM image of the surface of the plated substrates according to the plating method of FIG.

도 3 및 도 4에 도시된 바와 같이, sample1 내지 sample5를 비교해 보면 전류가 약하고, 오프 타임이 길수록 도금시 금속조직이 작고 조밀한 것을 확인할 수 있다. 또한, 펄스 정류기(130)의 주기가 짧을수록, 즉, 펄스 타임(Pulse Time)과 리버스 타임(Reverse Time) 및 오프 타임(Off-Time)을 합한 시간이 짧을수록 도금시 금속조직이 작고 조밀한 것을 확인할 수 있다.As shown in FIG. 3 and FIG. 4, when the samples 1 to 5 are compared, it can be confirmed that the current is weak and the metal structure is small and dense at the time of plating as the off time is longer. In addition, the shorter the period of the pulse rectifier 130, that is, the shorter the combined time of Pulse Time, Reverse Time, and Off-Time, the smaller and denser the metal structure during plating. You can see that.

도 5는 종래의 금속 도금방법으로 금속 도금된 기판의 표면 SEM 사진이다. 그리고, 도 6은 본 발명의 일실시예에 따른 도금방법으로 도금된 기판의 표면 SEM 사진이다. 그리고, 도 7은 도 6 있어서, 펄스 및 리버스 상태에서 전자의 흐름 및 금속이온의 흐름을 도시한 도면이다.5 is a SEM image of a surface of a metal-plated substrate by a conventional metal plating method. 6 is a SEM photograph of a surface of a substrate plated by a plating method according to an embodiment of the present invention. FIG. 7 is a view showing the flow of electrons and the flow of metal ions in the pulse and reverse states in FIG.

도 5 도시된 바와 같이, 종래의 도금방법(Semi-Electro 도금)으로 도금을 한 경우에는 조직이 크게 성장하여 피트(pit) 및 휘스커(Whisker)의 방지가 어려웠는데, 펄스 정류기(130)를 사용하여 도금한 본 발명에 따르면, 도 6 도시된 바와 같이, 도금시 표면의 금속조직이 작고 조밀하여 피트 및 휘스커를 방지할 수 있다.As shown in FIG. 5, when the plating is performed by a conventional plating method (Semi-Electro plating), it is difficult to prevent pits and whiskers due to the large growth of the structure. The pulse rectifier 130 is used According to the present invention, as shown in Fig. 6, the metal structure on the surface during plating is small and dense to prevent pits and whiskers.

이는, 도 7 도시된 바와 같이, 본 발명이 펄스 정류기(130)를 사용하여 전자를 공급하므로 펄스 상태에서 성장한 조직이 리버스 상태가 되면 펄스 상태에서 성장한 조직 중 음극에 가까운 조직이 다른 금속조직보다 빠르게 녹아나가면서 표면의 금속결정이 잘게 쪼개져 작고 조밀한 조직을 형성하기 때문이다.As shown in FIG. 7, since the present invention supplies electrons using the pulse rectifier 130, when a tissue grown in a pulse state becomes a reverse state, tissues grown in a pulsed state and tissues close to the cathode are faster than other metal tissues As it melts, the metal crystals on the surface are finely divided to form a small, dense structure.

도 8은 도 1에 있어서, 도금 대상물에 작용하는 전극들의 전기력선을 도시한 도면이다. 그리고, 도 9 내지 도 11은 본 발명의 다른 실시예에 따른 금속 도금장치들 및 도금 대상물에 작용하는 전극들의 전기력선을 도시한 도시한 도면이다.Fig. 8 is a view showing an electric force line of electrodes acting on the object to be plated in Fig. 1; 9 to 11 are views showing electric force lines of the metal plating apparatuses according to another embodiment of the present invention and electrodes acting on the object to be plated.

도금 대상물(10)에 미치는 전기장의 세기가 일정할수록 도금두께의 편차는 줄어들게 되는데, 도 8에 도시된 바와 같이, 전극(140)들이 일직선으로 형성되면 전기력선이 도금 대상물(10)의 중앙에 몰리면서 중앙 쪽의 도금두께가 양 측면보다 두꺼워지게 된다.As shown in FIG. 8, when the electrodes 140 are formed in a straight line, the electric force lines are pushed to the center of the object to be plated 10 The plating thickness at the center becomes thicker than both sides.

이를 해결하기 위해, 아래와 같이 금속 도금장치(100)의 구성을 변화시킬 수 있다. 본 실시예에서는 앞서 설명한 실시예와 차이가 있는 내용을 중심으로 설명하기로 한다.
To solve this problem, it is possible to change the configuration of the metal plating apparatus 100 as follows. In the present embodiment, the differences from the above-described embodiment will be mainly described.

[[ 실시예Example 1] 전극들의 형상 변화 1] Shape change of electrodes

도 9에 도시된 바와 같이, 금속 도금장치(200)는 전극(240)들을 중앙에서 양측면으로 갈수록 두께가 더 두꺼워지도록 형성할 수 있다. 이와 같이, 전극(240)들의 양측면이 중앙보다 더 두꺼워지면 도금액(30)의 두께가 얇게 형성되는 양측면의 전극(240)들이 도금 대상물(10)에 가깝게 위치하므로 도금 대상물(10)의 전체 면들을 균일한 두께로 도금할 수 있게 된다.
As shown in FIG. 9, the metal plating apparatus 200 can be formed such that the thickness of the electrodes 240 increases from the center toward both sides. When both sides of the electrodes 240 are thicker than the center, the electrodes 240 on both sides where the thickness of the plating liquid 30 is thin are positioned close to the object to be plated 10, It becomes possible to perform plating with a uniform thickness.

[[ 실시예Example 2] 전도체의 추가 2] Addition of conductors

도 10에 도시된 바와 같이, 금속 도금장치(300)의 전극(340)들과 도금 대상물(10) 사이에는 전도체(310)를 더 포함할 수 있다. 전도체(310)는 도금실(112) 내부에서 전류가 보다 더 잘 통할 수 있도록 해주는 물질로, 도금 대상물(10)의 양측면상에 위치하게 하면 전기력선이 도금 대상물(10)의 중앙에 몰리지 않고 양측면으로 고르게 퍼지면서, 전기력선이 균일하게 도금 대상물에 분포할 수 있다. As shown in FIG. 10, a conductor 310 may further be provided between the electrodes 340 of the metal plating apparatus 300 and the object to be plated 10. The conductor 310 is a material that allows a current to flow more easily in the plating chamber 112. When the conductor 310 is positioned on both sides of the object 10 to be plated, the electric force lines do not reach the center of the object 10 to be plated, The electric force lines can uniformly be distributed to the object to be plated while spreading evenly.

따라서, 전극(340)들을 중앙에서 양측면으로 갈수록 두께가 더 두꺼워지도록 형성하지 않아도 도금 대상물(10)의 전체 면들을 균일한 두께로 도금할 수 있게 된다.Therefore, it is possible to uniformly coat the entire surfaces of the object 10 without forming the electrodes 340 to be thicker from the center toward both sides.

또한, PCB기판, 회로기판, Wafer 등과 같이 회로가 연결되어있지 않은 경우에도 전기적 힘을 가해 금속도금을 할 수 있으며, 무전해 도금보다 빠른 속도로 금속피막을 형성할 수 있게 된다.
In addition, even when circuits are not connected to each other, such as a PCB substrate, a circuit board, and a wafer, an electric force can be applied to metal plating, and metal coating can be formed at a higher rate than electroless plating.

[[ 실시예Example 3] 전도체의 위치변화 3] Change of position of conductor

도 11에 도시된 바와 같이, 금속 도금장치(400)는 전도체(410)를 도금 대상물(10)의 길이방향의 양 측면에 전극(440)들의 길이만큼 연장시킬 수 있다. 따라서, 도금이 잘 되지 않는 측면까지도 다른 면들과 균일한 두께도 도금을 할 수 있게 된다.As shown in FIG. 11, the metal plating apparatus 400 may extend the conductor 410 by the length of the electrodes 440 on both sides in the longitudinal direction of the object to be plated 10. Therefore, plating can be performed even on the side where the plating is not performed even with other surfaces.

여기서, 전도체(410)의 위치는 도금액이 잘 입혀지지 않는 부분의 근처에 두어 미도금 되는 부분을 줄이는 것이 가장 바람직하며, 실시자의 필요에 따라 그 위치는 달라질 수 있다.
Here, it is most preferable that the position of the conductor 410 is located near the portion where the plating liquid is hardly coated, thereby reducing the unplated portion, and the position may be changed according to the needs of the practitioner.

도 12는 종래의 정전류 형태의 금속 도금장치로 도금한 경우와, 본 발명 및 실시예들의 금속도금 장치로 도금한 경우의 도금두께의 균일도를 비교한 표이다.  FIG. 12 is a table comparing the uniformity of the thickness of the plating in the case of plating with a metal plating apparatus of the conventional constant current type and the case of plating with the metal plating apparatus of the present invention and the embodiments.

본 실험은 도금시 18cm×19cm×60cm의 사각 도금 셀에서 Immersion TIN 도금액과, 20%의 전해액을 사용하였으며, 20분동안 1A의 전류를 인가하였고, 펄스 정류기는 2초마다 전극을 변화시켰다. 또한, 전극은 Pt/Ti 그물망 형태의 불용성 전극을 사용하였으며, 도금액의 온도는 70도로 셋팅하였다.In this experiment, immersion TIN plating solution and 20% electrolytic solution were used in a 18 cm × 19 cm × 60 cm square plating cell, and a current of 1A was applied for 20 minutes. The pulse rectifier changed the electrode every 2 seconds. In addition, an insoluble electrode of a Pt / Ti network type was used as the electrode, and the temperature of the plating liquid was set at 70 degrees.

도 12에 도시된 바와 같이, 종래의 정전류 형태의 도금방식의 경우 도금두께는 높으나, 도금 두께의 편차가 큰 단점이 있다. 그러나, 이를 해결하기 위해 본 발명과 같이 전류들의 형태를 펄스식으로 바꾸면 두께편차가 0.037로 줄어드는 것을 확인 할 수 있다. 또한, 실시예 1 내지 3으로 도금하였을 경우에는, 본 발명으로 도금하였을 경우보다 도금두께가 두껍게 형성되며, 도금 두께의 편차가 줄어드는 것을 확인할 수 있다. As shown in FIG. 12, in the case of the plating method of the conventional constant current type, there is a disadvantage that the thickness of the plating is high, but the deviation of the thickness of the plating is large. However, in order to solve this problem, it is confirmed that the thickness variation is reduced to 0.037 when the currents are changed to pulse form as in the present invention. In addition, when plating was performed in Examples 1 to 3, it was confirmed that the thickness of the plating was thicker than that of the plating of the present invention, and the deviation of the plating thickness was reduced.

본 발명은 첨부된 도면에 도시된 일 실시예를 참고로 설명되었으나 이는 예시적인 것에 불과하며, 당해 기술분야에서 통상의 지식을 가진 자라면 이로부터 다양한 변형 및 균등한 타 실시예가 가능하다는 점을 이해할 수 있을 것이다. 따라서, 본 발명의 진정한 보호 범위는 첨부된 청구 범위에 의해서만 정해져야 할 것이다.While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is clearly understood that the same is by way of illustration and example only and is not to be taken by way of limitation and that those skilled in the art will recognize that various modifications and equivalent arrangements may be made therein. It will be possible. Accordingly, the true scope of protection of the present invention should be determined only by the appended claims.

10.. 도금 대상물 20.. 전해액
30.. 도금액 110.. 도금 셀
111.. 전해실 112.. 도금실
120.. 멤브레인 130.. 펄스 정류기
140, 240, 340, 440.. 전극 310, 410.. 전도체
10 .. Plating object 20 .. electrolyte
30 .. Plating solution 110 .. Plating cell
111 .. electrolytic chamber 112 .. plated chamber
120 .. Membrane 130 .. Pulse rectifier
140, 240, 340, 440. Electrodes 310, 410.

Claims (5)

양측면에 전극들이 형성된 도금 셀과,
상기 도금 셀을 전해액이 들어있는 전해실과 도금액이 들어있는 도금실로 구획하는 멤브레인을 포함하는 전기 도금장치에 있어서,
상기 전극들에 대해 (+)극과 (-)극을 교대로 인가하는 펄스(Pulse) 정류기를 더 포함하는 것을 특징으로 하는 금속 도금장치.
A plating cell having electrodes formed on both sides thereof,
An electroplating apparatus including an electrolytic chamber containing an electrolytic solution and a membrane separating the electrolytic chamber containing the electrolytic solution and a plating chamber containing a plating solution,
And a pulse rectifier for alternately applying a positive electrode and a negative electrode to the electrodes.
제1항에 있어서,
상기 전극들은 중앙에서 양측면으로 갈수록 두께가 더 두꺼워지도록 형성된 것을 특징으로 하는 금속 도금장치.
The method of claim 1,
Wherein the electrodes are formed to be thicker from the center toward both sides.
제1항에 있어서,
상기 전극들과 상기 도금 대상물 사이에는 전도체를 더 포함하는 것을 특징으로 하는 금속 도금장치.
The method of claim 1,
And a conductor between the electrodes and the plating object.
제1항에 있어서,
상기 도금액은 무전해 도금액인 것을 특징으로 하는 금속 도금장치.
The method of claim 1,
Wherein the plating solution is an electroless plating solution.
제1항에 있어서,
상기 전극들은 금속이온 용해전극과 불용성 전극 중 적어도 하나로 이루어진 것을 특징으로 하는 금속 도금장치.
The method of claim 1,
Wherein the electrodes comprise at least one of a metal ion dissolution electrode and an insoluble electrode.
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