KR20130139287A - 웨브-기반의 재료의 가변성 검출을 위한 불균일성 심각도의 연속 차트화 - Google Patents

웨브-기반의 재료의 가변성 검출을 위한 불균일성 심각도의 연속 차트화 Download PDF

Info

Publication number
KR20130139287A
KR20130139287A KR1020137012508A KR20137012508A KR20130139287A KR 20130139287 A KR20130139287 A KR 20130139287A KR 1020137012508 A KR1020137012508 A KR 1020137012508A KR 20137012508 A KR20137012508 A KR 20137012508A KR 20130139287 A KR20130139287 A KR 20130139287A
Authority
KR
South Korea
Prior art keywords
training
image
training image
web
software
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR1020137012508A
Other languages
English (en)
Korean (ko)
Inventor
에반 제이 리브닉
데이비드 엘 호펠트
데렉 에이치 저스티스
귈레르모 사피로
Original Assignee
쓰리엠 이노베이티브 프로퍼티즈 컴파니
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 쓰리엠 이노베이티브 프로퍼티즈 컴파니 filed Critical 쓰리엠 이노베이티브 프로퍼티즈 컴파니
Publication of KR20130139287A publication Critical patent/KR20130139287A/ko
Withdrawn legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H43/00—Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/213—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods
    • G06F18/2137—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods based on criteria of topology preservation, e.g. multidimensional scaling or self-organising maps
    • G06F18/21375—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods based on criteria of topology preservation, e.g. multidimensional scaling or self-organising maps involving differential geometry, e.g. embedding of pattern manifold
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G06V10/443—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components by matching or filtering
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/758—Involving statistics of pixels or of feature values, e.g. histogram matching
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/7715—Feature extraction, e.g. by transforming the feature space, e.g. multi-dimensional scaling [MDS]; Mappings, e.g. subspace methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Databases & Information Systems (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Data Mining & Analysis (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
KR1020137012508A 2010-10-19 2011-10-04 웨브-기반의 재료의 가변성 검출을 위한 불균일성 심각도의 연속 차트화 Withdrawn KR20130139287A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US39465510P 2010-10-19 2010-10-19
US61/394,655 2010-10-19
PCT/US2011/054673 WO2012054225A2 (en) 2010-10-19 2011-10-04 Continuous charting of non-uniformity severity for detecting variability in web-based materials

Publications (1)

Publication Number Publication Date
KR20130139287A true KR20130139287A (ko) 2013-12-20

Family

ID=45975802

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020137012508A Withdrawn KR20130139287A (ko) 2010-10-19 2011-10-04 웨브-기반의 재료의 가변성 검출을 위한 불균일성 심각도의 연속 차트화

Country Status (8)

Country Link
US (1) US20130208978A1 (enExample)
EP (1) EP2630473A2 (enExample)
JP (1) JP2013541779A (enExample)
KR (1) KR20130139287A (enExample)
CN (1) CN103180724A (enExample)
BR (1) BR112013008307A2 (enExample)
SG (1) SG189226A1 (enExample)
WO (1) WO2012054225A2 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160109716A (ko) * 2015-03-12 2016-09-21 한국전자통신연구원 응급 정신상태 예측 장치 및 방법
KR20180044198A (ko) * 2016-10-21 2018-05-02 텍스마그 게엠베하 베르트리에브스게셀스차프트 소재 웹 관찰 및 소재 웹 검사를 위한 방법 및 장치

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140031964A1 (en) * 2012-07-27 2014-01-30 Geoffrey Rajay Sidhu Method and system for manufacturing an article
US9923892B1 (en) * 2013-06-14 2018-03-20 Whitehat Security, Inc. Enhanced automatic response culling with signature generation and filtering
TWI506461B (zh) * 2013-07-16 2015-11-01 Univ Nat Taiwan Science Tech 人體動作的辨識方法與裝置
WO2015065726A1 (en) * 2013-10-31 2015-05-07 3M Innovative Properties Company Multiscale uniformity analysis of a material
US9778973B2 (en) * 2015-10-28 2017-10-03 International Business Machines Corporation Early diagnosis of hardware, software or configuration problems in data warehouse system utilizing grouping of queries based on query parameters
GB201519801D0 (en) * 2015-11-10 2015-12-23 Rolls Royce Plc Pass fail sentencing of hollow components
US10181185B2 (en) * 2016-01-11 2019-01-15 Kla-Tencor Corp. Image based specimen process control
US12380553B2 (en) * 2016-01-15 2025-08-05 Instrumental, Inc. Method for predicting defects in assembly units
US10482091B2 (en) * 2016-03-18 2019-11-19 Oath Inc. Computerized system and method for high-quality and high-ranking digital content discovery
CN110944950B (zh) * 2017-05-31 2023-04-04 尼普洛株式会社 玻璃容器的评价方法
TWI649659B (zh) * 2017-10-27 2019-02-01 財團法人工業技術研究院 自動光學檢測影像分類方法、系統及含有該方法之電腦可讀取媒體
CN108227664A (zh) * 2018-02-05 2018-06-29 华侨大学 基于样本数据训练的产品质量控制设备及质量控制方法
US11315231B2 (en) 2018-06-08 2022-04-26 Industrial Technology Research Institute Industrial image inspection method and system and computer readable recording medium
GB202013714D0 (en) * 2020-09-01 2020-10-14 Nicoventures Trading Ltd An apparatus and method for manufacturing a comsumalbe for an aerosol provision system

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6539106B1 (en) * 1999-01-08 2003-03-25 Applied Materials, Inc. Feature-based defect detection
CN100428277C (zh) * 1999-11-29 2008-10-22 奥林巴斯光学工业株式会社 缺陷检查系统
US6999614B1 (en) * 1999-11-29 2006-02-14 Kla-Tencor Corporation Power assisted automatic supervised classifier creation tool for semiconductor defects
JP2003344300A (ja) * 2002-05-21 2003-12-03 Jfe Steel Kk 表面欠陥判別方法
JP4118703B2 (ja) * 2002-05-23 2008-07-16 株式会社日立ハイテクノロジーズ 欠陥分類装置及び欠陥自動分類方法並びに欠陥検査方法及び処理装置
JP2008175588A (ja) * 2007-01-16 2008-07-31 Kagawa Univ 外観検査装置
JP5255953B2 (ja) * 2008-08-28 2013-08-07 株式会社日立ハイテクノロジーズ 欠陥検査方法及び装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20160109716A (ko) * 2015-03-12 2016-09-21 한국전자통신연구원 응급 정신상태 예측 장치 및 방법
KR20180044198A (ko) * 2016-10-21 2018-05-02 텍스마그 게엠베하 베르트리에브스게셀스차프트 소재 웹 관찰 및 소재 웹 검사를 위한 방법 및 장치

Also Published As

Publication number Publication date
WO2012054225A2 (en) 2012-04-26
JP2013541779A (ja) 2013-11-14
BR112013008307A2 (pt) 2019-09-24
US20130208978A1 (en) 2013-08-15
CN103180724A (zh) 2013-06-26
SG189226A1 (en) 2013-05-31
EP2630473A2 (en) 2013-08-28
WO2012054225A3 (en) 2012-07-05

Similar Documents

Publication Publication Date Title
KR20130139287A (ko) 웨브-기반의 재료의 가변성 검출을 위한 불균일성 심각도의 연속 차트화
KR101800057B1 (ko) 트레이닝 영상에 등급을 배정하는 방법 및 장치
KR20140031201A (ko) 웨브 기반 재료 내의 불균일성의 검출 시스템
JP5912125B2 (ja) ウェブベース材料における不均一性の高速処理と検出
TWI751376B (zh) 識別在一晶圓上偵測到之缺陷中之損害及所關注缺陷
US10115040B2 (en) Convolutional neural network-based mode selection and defect classification for image fusion
KR20170005379A (ko) 검사를 위한 고해상도 전체 다이 이미지 데이터의 사용
CN114913346A (zh) 一种基于产品颜色及形状识别的智能分拣系统及方法
Medina et al. Automated visual classification of frequent defects in flat steel coils
CN112668365A (zh) 一种物料入库识别方法、装置、设备及存储介质
CN120369635A (zh) 基于人工智能的晶圆表面缺陷检测方法及系统
Abyasa et al. YOLOv8 for Product Brand Recognition as Inter-Class Similarities
CN120429934B (zh) 基于立柱轴线动态跟踪的钢结构安装调节方法及系统
US20240311698A1 (en) Measurement method and apparatus for semiconductor features with increased throughput
US20250224343A1 (en) Defect offset correction for examination of semiconductor specimens
CN120235814A (zh) 一种纺织物表面瑕疵检测方法、装置、设备和介质

Legal Events

Date Code Title Description
PA0105 International application

Patent event date: 20130515

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid