JP2013541779A - ウェブベースの材料のばらつきを検出するための、不均一性の厳しさ度の連続的なチャート化 - Google Patents

ウェブベースの材料のばらつきを検出するための、不均一性の厳しさ度の連続的なチャート化 Download PDF

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JP2013541779A
JP2013541779A JP2013534933A JP2013534933A JP2013541779A JP 2013541779 A JP2013541779 A JP 2013541779A JP 2013534933 A JP2013534933 A JP 2013534933A JP 2013534933 A JP2013534933 A JP 2013534933A JP 2013541779 A JP2013541779 A JP 2013541779A
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software
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JP2013541779A5 (enExample
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ジェイ．リブニック エバン
エル．ホッフェルト デイビッド
エイチ．ジャスティス デレク
サピロ ギラーモ
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3M Innovative Properties Co
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65H—HANDLING THIN OR FILAMENTARY MATERIAL, e.g. SHEETS, WEBS, CABLES
    • B65H43/00—Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/21—Design or setup of recognition systems or techniques; Extraction of features in feature space; Blind source separation
    • G06F18/213—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods
    • G06F18/2137—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods based on criteria of topology preservation, e.g. multidimensional scaling or self-organising maps
    • G06F18/21375—Feature extraction, e.g. by transforming the feature space; Summarisation; Mappings, e.g. subspace methods based on criteria of topology preservation, e.g. multidimensional scaling or self-organising maps involving differential geometry, e.g. embedding of pattern manifold
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G06V10/443—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components by matching or filtering
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/74—Image or video pattern matching; Proximity measures in feature spaces
    • G06V10/75—Organisation of the matching processes, e.g. simultaneous or sequential comparisons of image or video features; Coarse-fine approaches, e.g. multi-scale approaches; using context analysis; Selection of dictionaries
    • G06V10/758—Involving statistics of pixels or of feature values, e.g. histogram matching
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/70—Arrangements for image or video recognition or understanding using pattern recognition or machine learning
    • G06V10/77—Processing image or video features in feature spaces; using data integration or data reduction, e.g. principal component analysis [PCA] or independent component analysis [ICA] or self-organising maps [SOM]; Blind source separation
    • G06V10/7715—Feature extraction, e.g. by transforming the feature space, e.g. multi-dimensional scaling [MDS]; Mappings, e.g. subspace methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/20—Special algorithmic details
    • G06T2207/20081—Training; Learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30124—Fabrics; Textile; Paper

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Multimedia (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Software Systems (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Databases & Information Systems (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Biochemistry (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Textile Engineering (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Data Mining & Analysis (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
JP2013534933A 2010-10-19 2011-10-04 ウェブベースの材料のばらつきを検出するための、不均一性の厳しさ度の連続的なチャート化 Ceased JP2013541779A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US39465510P 2010-10-19 2010-10-19
US61/394,655 2010-10-19
PCT/US2011/054673 WO2012054225A2 (en) 2010-10-19 2011-10-04 Continuous charting of non-uniformity severity for detecting variability in web-based materials

Publications (2)

Publication Number Publication Date
JP2013541779A true JP2013541779A (ja) 2013-11-14
JP2013541779A5 JP2013541779A5 (enExample) 2014-10-30

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JP2013534933A Ceased JP2013541779A (ja) 2010-10-19 2011-10-04 ウェブベースの材料のばらつきを検出するための、不均一性の厳しさ度の連続的なチャート化

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US (1) US20130208978A1 (enExample)
EP (1) EP2630473A2 (enExample)
JP (1) JP2013541779A (enExample)
KR (1) KR20130139287A (enExample)
CN (1) CN103180724A (enExample)
BR (1) BR112013008307A2 (enExample)
SG (1) SG189226A1 (enExample)
WO (1) WO2012054225A2 (enExample)

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US20140031964A1 (en) * 2012-07-27 2014-01-30 Geoffrey Rajay Sidhu Method and system for manufacturing an article
US9923892B1 (en) * 2013-06-14 2018-03-20 Whitehat Security, Inc. Enhanced automatic response culling with signature generation and filtering
TWI506461B (zh) * 2013-07-16 2015-11-01 Univ Nat Taiwan Science Tech 人體動作的辨識方法與裝置
WO2015065726A1 (en) * 2013-10-31 2015-05-07 3M Innovative Properties Company Multiscale uniformity analysis of a material
KR102333992B1 (ko) * 2015-03-12 2021-12-02 한국전자통신연구원 응급 정신상태 예측 장치 및 방법
US9778973B2 (en) * 2015-10-28 2017-10-03 International Business Machines Corporation Early diagnosis of hardware, software or configuration problems in data warehouse system utilizing grouping of queries based on query parameters
GB201519801D0 (en) * 2015-11-10 2015-12-23 Rolls Royce Plc Pass fail sentencing of hollow components
US10181185B2 (en) * 2016-01-11 2019-01-15 Kla-Tencor Corp. Image based specimen process control
US12380553B2 (en) * 2016-01-15 2025-08-05 Instrumental, Inc. Method for predicting defects in assembly units
US10482091B2 (en) * 2016-03-18 2019-11-19 Oath Inc. Computerized system and method for high-quality and high-ranking digital content discovery
DE102016220757A1 (de) * 2016-10-21 2018-04-26 Texmag Gmbh Vertriebsgesellschaft Verfahren und Vorrichtung zur Materialbahnbeobachtung und Materialbahninspektion
CN110944950B (zh) * 2017-05-31 2023-04-04 尼普洛株式会社 玻璃容器的评价方法
TWI649659B (zh) * 2017-10-27 2019-02-01 財團法人工業技術研究院 自動光學檢測影像分類方法、系統及含有該方法之電腦可讀取媒體
CN108227664A (zh) * 2018-02-05 2018-06-29 华侨大学 基于样本数据训练的产品质量控制设备及质量控制方法
US11315231B2 (en) 2018-06-08 2022-04-26 Industrial Technology Research Institute Industrial image inspection method and system and computer readable recording medium
GB202013714D0 (en) * 2020-09-01 2020-10-14 Nicoventures Trading Ltd An apparatus and method for manufacturing a comsumalbe for an aerosol provision system

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6539106B1 (en) * 1999-01-08 2003-03-25 Applied Materials, Inc. Feature-based defect detection
CN100428277C (zh) * 1999-11-29 2008-10-22 奥林巴斯光学工业株式会社 缺陷检查系统
US6999614B1 (en) * 1999-11-29 2006-02-14 Kla-Tencor Corporation Power assisted automatic supervised classifier creation tool for semiconductor defects
JP2003344300A (ja) * 2002-05-21 2003-12-03 Jfe Steel Kk 表面欠陥判別方法
JP4118703B2 (ja) * 2002-05-23 2008-07-16 株式会社日立ハイテクノロジーズ 欠陥分類装置及び欠陥自動分類方法並びに欠陥検査方法及び処理装置
JP2008175588A (ja) * 2007-01-16 2008-07-31 Kagawa Univ 外観検査装置
JP5255953B2 (ja) * 2008-08-28 2013-08-07 株式会社日立ハイテクノロジーズ 欠陥検査方法及び装置

Also Published As

Publication number Publication date
WO2012054225A2 (en) 2012-04-26
BR112013008307A2 (pt) 2019-09-24
US20130208978A1 (en) 2013-08-15
CN103180724A (zh) 2013-06-26
SG189226A1 (en) 2013-05-31
EP2630473A2 (en) 2013-08-28
KR20130139287A (ko) 2013-12-20
WO2012054225A3 (en) 2012-07-05

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