KR20130024291A - Microscope assembly with vibrational isolation structure - Google Patents

Abstract

PURPOSE: A microscope assembly including an anti-vibration structure is provided to enable a user to easily control a microscope according to the eccentricity of a frame weight. CONSTITUTION: A microscope assembly includes a microscope module and an anti-vibration module(170). The microscope module enables a user to observe a sample. The anti-vibration module prevents vibration generated from the outside to the microscope module and supports the microscope module. The anti-vibration module includes a supporting frame(180) and a magnetic force generation supporter(190). The supporting frame forms a plurality of coupling holes in which are separated along the circumference of the microscope module. A plurality of the magnetic force generation supporters isolates the supporting frame by using a magnetic force by considering the eccentricity of a frame weight.

Description

Microscope assembly with vibrational isolation structure

The present invention relates to a microscope assembly having an anti-vibration structure, and more particularly, to a microscope assembly having an anti-vibration structure including an anti-vibration module that can reduce the focal length change due to vibration when a sample is to be observed for a long time. It is about.

Fluorescence microscopes use a principle that fluoresces when a phosphor absorbs light of a particular wavelength, and then treats the sample with a fluorescent material (fluorescent dye), and then applies the light to the sample at the wavelength of absorption of the fluorescent substance. Refers to a device for observing a sample through irradiation with radiated light emitted from the sample. Fluorescence microscopy is widely used when observing a sample such as a biochip because a clearer image can be obtained than a general optical microscope.

On the other hand, the fluorescence microscope is used to continuously observe the image of the sample in the culture state, when the vibration is applied to the sample in the culture state, it is difficult to observe for a long time because the sample observation site may be moved or the focus may be changed. There is a need to prevent this.

1 is a schematic diagram of a conventional electron microscope having an anti-vibration device.

Referring to FIG. 1, a conventional electron microscope 1 includes a microscope module 2 and an anti-vibration device 3 for preventing vibrations transmitted from the bottom 4 from being transferred back to the microscope module 2 side. do. In addition, through the bottom 4, various vacuum lines 5 are arranged and connected to the microscope module 2 side.

On the other hand, the anti-vibration device 3 of the conventional electron microscope (1) is bent by the inner metal frame bent so that the upper side to support the microscope module (2) and the lower side to be supported by the bottom (4), The vibration transmitted from (4) is made to be absorbed to some extent by the air inside the vibration damping device 3.

However, such a conventional anti-vibration device 3 has only a structure capable of absorbing vibration, and does not have any configuration that can cope with the eccentricity of the center of gravity of the microscope module 2 itself. If the center of gravity of the microscope module 2 is eccentric, there is a problem that does not effectively prevent vibration.

That is, the inside of the microscope module (2) includes a variety of optical devices that the center of gravity of the center of gravity is difficult to be accurately located in the center of the center of gravity of the microscope module (2) ignores the eccentricity of the device as it is If the support through 3) the vibration transmitted from the bottom (4) will not be efficiently absorbed by the vibration damping device (3) will eventually be a problem that is transmitted to most of the microscope module 2 as it is.

On the other hand, there is an eccentricity in the side of the sample called cells, so when the optical portion is inclined, the level of the culture solution in the culture vessel varies depending on the location, which may cause a problem that the environment in which the cells grow is not constant.

In addition, the conventional anti-vibration device 3 has a problem that it is difficult to effectively block the vibration transmitted from the floor 4 as the microscope module 2 and the bottom 4 are connected as it is.

Korean Laid-Open Patent Publication No. 1998-026109

It is an object of the present invention to provide a microscope assembly having an anti-vibration structure including an anti-vibration module that can reduce the focal length change due to vibration when the sample is to be observed for a long time.

According to the present invention, the object is provided with a microscope module provided to observe the sample; And an anti-vibration module that supports the microscope module and prevents vibration generated from the outside from being transmitted to the microscope module side, wherein the anti-vibration module is spaced apart from each other by a predetermined distance along the circumference of the microscope module. A support frame through which a plurality of coupling holes are formed; And selectively coupled along the plurality of coupling holes in consideration of the total weight of the microscope module or the eccentricity of the weight of the support frame on which the microscope module is seated, and supporting the support frame from the bottom, but with magnetic force. It is achieved by a microscope assembly having an anti-vibration structure, characterized in that it comprises a plurality of magnetic force generating support to isolate the support frame using.

The magnetic force generating support, the support body is accommodated therein the first magnet; And a coupling body having an upper end coupled to the coupling hole and inserted into the support body such that the lower end is linearly moved up and down along the inside of the support body, and a second magnet is mounted on the lower side. The magnet may be provided with a surface opposite to the first magnet to have the same polarity as that of the first magnet to generate a repulsive force so that the coupling body always faces upward.

The support body, the main body of the hollow cylindrical shape; A first magnet and a first magnet receiving groove protruding from the upper surface of the first flange to be smaller than the diameter of the first flange and fitted to the lower side of the main body, the first magnet is accommodated therein A support having a first accommodation part formed; And a second receiving portion protruding from a lower surface of the second flange and fitted to the upper side of the main body so as to have a second flange and a diameter smaller than the diameter of the second flange, wherein the coupling body is penetrated therein. It may include a cover portion is formed through holes for.

The coupling body, the coupling sphere coupled to the coupling hole; A connection part extending downward from the lower end of the coupler and having a diameter smaller than the diameter of the through hole so as to be inserted into the through hole and move upward and downward; And a flange portion protruding stepped outwardly from the lower end portion of the connection portion to limit an upward movement range of the connection portion, and having a second magnet receiving groove formed therein for receiving the second magnet therein. Can be.

Female threads are formed on the inner circumferential surface of the coupling hole, and male threads corresponding to the female threads are formed on the outer circumferential surface of the coupling portion so that the coupling body and the support frame may be mutually coupled in a screwing manner.

The microscope module, the incubation chamber accommodates the incubator containing the sample is provided to be movable in the X-axis and Y-axis direction, respectively; At least one light source unit irradiating light to the sample side; And it may include an observation unit provided to observe the image of the sample.

The incubation chamber includes a pair of exhaust ports and an inlet formed to be connected to the carbon dioxide concentration control unit for controlling the amount of carbon dioxide supplied to the incubator; And a pair of sensor connector and a heater connector respectively formed to be connected to a temperature control part for controlling the internal temperature of the incubation chamber.

According to the present invention, in consideration of the total weight of the microscope module or the eccentricity of the weight of the support frame on which the microscope module is mounted, a magnetic force generating support which can easily adjust the horizontality of the support frame is focused by vibration when the sample is to be observed for a long time. It is possible to provide a microscope assembly having an anti-vibration structure that can reduce the distance change.

1 is a schematic diagram of a conventional electron microscope having an anti-vibration device.
2 is a perspective view of a microscope assembly having an anti-vibration structure according to an embodiment of the present invention.
3 is a perspective view of the microscope assembly having the antivibration structure of FIG. 2 viewed from the opposite side of FIG. 2.
4 is a perspective view of an anti-vibration module of the microscope assembly having the anti-vibration structure of FIG. 2.
FIG. 5 is an exploded perspective view of the magnetic force generating support of the anti-vibration module of FIG. 4.
6 is a cross-sectional view of the magnetic force generating support of FIG.
7 is a perspective view illustrating a method of using the microscope assembly having the anti-vibration structure of FIG. 2.
FIG. 8 is a schematic diagram illustrating a principle of observing a fluorescence image by using a second light source unit of the microscope assembly having the anti-vibration structure of FIG. 2.
9 is a perspective view of a microscope assembly having an anti-vibration structure according to another embodiment of the present invention applied to a light weight microscope module.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings. In the following description of the present invention, the well-known functions or constructions are not described in order to simplify the gist of the present invention.

2 is a perspective view of a microscope assembly having an anti-vibration structure according to an embodiment of the present invention, Figure 3 is a perspective view of the microscope assembly having the anti-vibration structure of Figure 2 seen from the opposite side of Figure 2, Figure 4 2 is a perspective view of the anti-vibration module of the microscope assembly having the anti-vibration structure of FIG. 2, FIG. 5 is an exploded perspective view of the magnetic force generating support of the anti-vibration module of FIG. 4, and FIG. 6 is a cross-sectional view of the magnetic force generating support of FIG. 5.

Referring to these drawings, the microscope assembly (100, hereinafter referred to as "microscope assembly 100") having a vibration preventing structure according to an embodiment of the present invention and the microscope module 110 is provided to observe the sample; , Anti-vibration module 170 for supporting the microscope module 110.

The microscope module 110 is provided to observe an observation object such as cells (hereinafter referred to as a 'sample'), and includes an incubation chamber 120 in which a culture dish (CD) containing a sample is accommodated, and a sample side. The light source unit 130 is provided to adjust light, and the observation unit 160 is provided to observe an image of the sample.

The incubation chamber 120 is configured to provide a space for accommodating the incubator (CD) containing the sample. As shown in FIG. 2, the incubation chamber 120 accommodates an incubator accommodating groove H1 for accommodating the incubator CD having a circular cross-sectional shape and an incubator accommodating groove H1 for easy insertion or removal. Grip grooves H2 provided on both sides of the groove H1 are formed.

The worker can be placed in the incubator accommodating groove (H1) as it is, while holding the incubator (CD) can be facilitated for work. That is, through the grip grooves (H2) formed on both sides of the incubator receiving groove (H1) so that the incubator (CD) can be easily placed in the incubation chamber (120) or separated from the incubation chamber (120) without using a special tool. Will be.

On the other hand, the incubation chamber 120 of the present embodiment is configured to move the position little by little in the X and Y-axis direction. That is, the incubation chamber 120 is moved by adjusting the X-axis handle 120a shown in FIG. 2 to move the incubation chamber 120 in the X-axis direction or the -X-axis direction, or by adjusting the Y-axis handle 120b. It can be moved in the Y-axis direction or the -Y axis direction.

Through such fine adjustment in the X and Y-axis directions, the light emitted from the light source unit 130 can be accurately transmitted to the sample side.

On the other hand, the objective lens (OR) is connected to the Z-axis handle (120c), by adjusting it to move in the Z-axis direction or -Z axis direction to focus on the sample.

On the other hand, the microscope assembly 100 of the present embodiment is connected to the carbon dioxide concentration control unit (not shown) and the temperature control unit (not shown) provided to the outside to cultivate the sample efficiently, for this purpose of the incubation chamber 120 On one side, a pair of exhaust port 121 and inlet 122, a pair of sensor connector 123 and a heater connector 124 are formed, respectively.

The exhaust port 121 and the inlet 122 are connected to the carbon dioxide concentration control unit, respectively, so that carbon dioxide (CO ₂ ) delivered through the carbon dioxide concentration control unit may be supplied into the incubation chamber 120 or discharged to the outside. A temperature sensor (not shown) is connected to the connector 123 to periodically check the temperature inside the incubation chamber 120, and when the temperature inside the incubation chamber 120 is low, a temperature controller connected through the heater connector 124 is provided. It is operated to increase the internal temperature of the incubation chamber 120.

On the other hand, the light source unit 130 is provided to observe the image of the sample through the observation unit 160 by irradiating a constant light (light) toward the sample side, the first light source unit 140 provided above the incubation chamber 120 ) And a second light source unit 150 provided on the side of the incubation chamber 120.

The first light source unit 140 is configured to observe a bright field image of a sample, and the first light source frame 141 disposed above the incubation chamber 120 to be parallel to the incubation chamber 120. And a first light source 142 coupled to one end of the first light source frame 141 and a first light source frame to reflect the first light emitted from the first light source 142 to the sample side. The first reflecting mirror 143 coupled to the other end of the first side 141, the first condensing lens 144 interposed between the first light source 142 and the first reflecting mirror 143, and the first light source 142. And a diffusion filter 145 interposed between the first condenser lens 144.

The first light source frame 141 is a configuration that provides a plate surface to which the configuration of the first light source 142 and the like may be coupled. A slit 141a having a predetermined width is formed along the longitudinal direction of the first light source frame 141, and a configuration of the first light source 142 or the like along the slit 141a forms the first light source frame 141. Therefore, the relative movement is combined.

The first light source 142 is configured as a white light source so as to irradiate the first light, which is white light, to the sample side and is coupled to one end of the first light source frame 141. In the present embodiment, the first light source 142 is provided using a white light emitting diode (LED), among other white light sources. Of course, according to another embodiment of the present invention, the first light source 142 may be provided using a general tungsten halogen lamp.

The first reflection mirror 143 is configured to switch the irradiation direction of the first light to the sample side so that the first light irradiated from the first light source 142 can be transmitted to the sample side. The conventional microscope has a structure in which a light source, a condenser lens, and a diffusion filter are vertically disposed on an upper side of a sample, and thus the overall height of the microscope is inevitably increased, resulting in a space constraint for disposing the microscope.

Accordingly, the microscope module 110 of the present exemplary embodiment arranges the first light source 142 in parallel with the incubation chamber 120 and changes the irradiation direction of the first light through the first reflecting mirror 143. By doing so, it has the advantage that it can be used easily even in places where the height is limited.

The first condensing lens 144 is a configuration for concentrating the first light emitted from the first light source 142 by collecting them in one place, and the diffusion filter 145 is observed through the observation unit 160. The first light is diffused to a certain degree so that the image of the sample can be seen uniformly. That is, the first light irradiated from the first light source 142 is diffused to some extent through the diffusion filter 145 and then concentrated through a first condensing lens 144 in one place, thereby providing the observation unit 160. This ensures that bright field images of samples observed are clearly and accurately identified.

On the other hand, the second light source unit 150 is configured to observe the fluorescent image (Fluorescent Image) of the sample, the second light source frame 151 coupled to the side of the incubation chamber 120, and the second light source frame ( A second light source 152 coupled to one end of the 151, and a filter cube 153 for reflecting the second light emitted from the second light source 152 to the sample side.

The second light source frame 151 is provided by fixing four bars on the side of the incubation chamber 120. Of course, the scope of the present invention is not limited by the embodiment of the second light source frame 151 and the second light source frame 151 may be provided using a plate-like metal like the first light source frame 141. .

The second light source 152 is provided as an ultraviolet (UV) or colored light source so as to generate fluorescence such as blue light, green light, or red light from the sample, and the second light source frame It is a structure coupled to one end of 151.

That is, the second light source 152 is provided with a UV light source or a blue light source or a yellow light source corresponding to the blue fluorescent image or the green fluorescent image or the red fluorescent image according to the sample to be observed. .

The filter cube 153 allows the second light emitted from the second light source 152 to be reflected to the sample side, and at the same time, filters the unnecessary wavelength of light mixed with the second light to observe the observation unit ( 160 to clarify the fluorescence image of the sample observed through. The principle that the second light is transmitted to the sample side through the filter cube 153 will be described in detail in the use example of the present invention.

The observation unit 160 is a configuration for observing a bright field image or a fluorescent image of a sample using light emitted through the light source unit 130.

Observation unit 160 of the present embodiment is provided with a charge-coupled device (CCD) image sensor (camera) or a complementary metal oxide semiconductor (CMOS) image sensor.

Here, the CCD image sensor is read-out register line by line from the bottom row of the CCD to read the charge stored in each photosite after the CCD is exposed to light. It is an image sensor that reads information from the bottom row to the top row by copying the information and converting the copied value back to a number through an amplifier and an analog-to-digital converter. .

In addition, the CMOS image sensor refers to a solid-state imaging device using a complementary metal oxide semiconductor (CMOS), which uses a photodiode in the same way as a CCD image sensor, but differs in manufacturing process and signal reading method.

Observation unit 160 of the present embodiment may be provided using a CMOS image sensor in consideration of the improvement of integration and power consumption, or may be provided using a CCD image sensor in consideration of the noise level and noise processing process and the quality of the image itself. Can be. That is, the observation unit 160 of the present embodiment is prepared in advance by adopting an appropriate image sensor in consideration of the specifications of the microscope module 110 required, the scope of the present invention is not limited by the type of the image sensor.

On the other hand, the anti-vibration module 170 is configured to have a constant anti-vibration structure so that the above-described microscope module 110 is seated and at the same time the vibration generated from the outside is not transmitted to the microscope module 110 side.

The anti-vibration module 170 includes a support frame 180 on which the microscope module 110 is seated, and a magnetic force generating support 190 selectively coupled to a coupling hole 180a formed along the circumference of the support frame 180. do.

Here, the term "selective" means a plurality of coupling holes formed in the support frame 180 in consideration of the total weight of the microscope module 110 or the eccentricity of the weight of the support frame 180 on which the microscope module 110 is seated. It means that it can be coupled to only some of the coupling holes (180a) or all of the coupling holes (180a) (180a) and is the same below.

The support frame 180 is a plate-shaped metallic member on which the microscope module 110 is seated and through which a plurality of coupling holes 180a spaced apart from each other at regular intervals are formed therethrough. After the microscope module 110 is seated on the upper surface of the support frame 180 is fixed integrally by a method such as bolting.

The magnetic force generating support 190 is selectively coupled to a plurality of coupling holes 180a penetrating along the circumference of the support frame 180 to support the weight of the microscope module 110, and the vibration transmitted from the outside is a microscope module ( 110 is to isolate the support frame 180 so as not to be transmitted back to the side.

4 to 6, the magnetic force generating support 190 is a support body 191 for supporting the support frame 180 from the bottom, and the relative linear motion in the vertical direction along the interior of the support body 191 The coupling body 196 is coupled to be able to.

The support body 191 is configured to support the support frame 180 on which the microscope module 110 is disposed from the bottom, and has a hollow cylindrical main body 192 and a support coupled to the lower side of the main body 192. 193 and a cover 195 coupled to the upper side of the main body 192.

The main body 192 is a configuration having a hollow cylindrical shape so that the coupling body 196 inserted through the cover 195 can linearly move in the vertical direction.

The support unit 193 is configured to directly support the support frame 180 in direct contact with the bottom, and has a first flange 193a having a circular cross-sectional shape and a first flange (193a) having a diameter smaller than the diameter of the first flange 193a. It includes a first receiving portion (193b) protruding from the upper surface of the 193a is fitted to the lower side of the main body (192).

The first flange 193a is provided to have a diameter substantially the same as the diameter of the main body 192, and the first accommodating part 193b has a first magnet accommodating groove 193c formed therein to form a first magnet ( M1) is fitted to the lower side of the main body 192 in a coupled state.

The cover 195 has a configuration in which a through hole 191a is formed to allow the coupling body 196 to be penetrated therein, and has a diameter larger than that of the second flange 195a having a circular cross-sectional shape and the diameter of the second flange 195a. It includes a second receiving portion (195b) protruding from the lower surface of the second flange (195a) to have a small diameter and fitted to the upper side of the main body (192).

According to this configuration, the support unit 193 and the cover unit 195 can be simply fitted at the lower side and the upper side of the main body 192, respectively, and the first magnet M1 is fixed to the support unit 193. Be prepared.

On the other hand, the coupling body 196 has a configuration in which the upper end is coupled to the coupling hole 180a of the support frame 180 and the lower end is inserted into the support body 191, and the coupling sphere coupled to the coupling hole 180a ( 197, a connecting portion 198 extending downward from the lower end of the coupler 197, and a flange portion 199 protruded outwardly outward from the lower end of the connecting portion.

Coupling member 197 is a protrusion configuration that is inserted into the coupling hole (180a) of the support frame 180 is a male thread corresponding to the female thread formed along the inner peripheral surface of the coupling hole (180a) along the outer peripheral surface is formed. . Accordingly, the coupling sphere 197 is coupled to the support frame 180 by the screw coupling method can achieve a firm coupling between the two. Of course, according to another embodiment of the present invention, the coupler 197 may be coupled to the coupling hole 180a in an interference fit type.

The connecting portion 198 extends downward from the lower end of the coupler 197 and vertically extends through the hollow portion of the through hole 191a and the main body 192 of the cover portion 195 constituting the support body 191. It is a component inserted to allow linear movement. To this end, the diameter of the connecting portion 198 is provided to be slightly smaller than the diameter of the through hole 191a.

The flange portion 199 is configured to protrude stepwise outward from the lower end of the connecting portion 198.

The flange 199 is subject to a certain range of motion of the connection 198. That is, the coupling body 196 is always subjected to a constant magnetic force directed upward as described below, the limit of the upper movement range is the flange portion 199 is caught by the second receiving portion 195b of the cover portion 195 To become a point. In addition, a second magnet receiving groove 199a for inserting the second magnet M2 is formed below the flange portion 199.

The second magnet M2 is provided such that the surface opposite to the first magnet M1 has the same polarity as that of the first magnet M1, thereby generating a repulsive force for the coupling body 196 to always face upward. To do that.

Now, the method of using the microscope assembly 100 of the present embodiment will be briefly described.

7 is a perspective view illustrating a method of using the microscope assembly having the anti-vibration structure of FIG. 2, and FIG. 8 is a schematic view illustrating a principle of observing a fluorescence image using the second light source unit of the microscope assembly having the anti-vibration structure of FIG. 2. 9 is a perspective view of a microscope assembly having an anti-vibration structure according to another embodiment of the present invention applied to a microscope module having a light weight.

First, as shown in Figure 7, after fixing the microscope module 110 suitable for observation of the sample to the support frame 180, the operator supports the leveler (HD) for determining the horizontality of the support frame 180 It is mounted on the frame 180. At this time, if the support frame 180 is exactly horizontal, no special measures need to be taken, but if the support frame 180 on which the microscope module 110 is mounted is not exactly horizontal and its center of gravity is eccentric to one side, There is a separate task to make adjustments.

That is, as shown in FIG. 7, when the entire center of gravity of the support frame 180 on which the microscope module 110 is mounted is eccentric to the X side, the operator may have the magnetic force generating support 190 disposed at the X side corner portion T. By subtracting one we balance the entire center of gravity.

The magnetic force generating support 190 is designed to receive the repulsive force of the coupling body 196 always upwards according to the interaction of the first magnet M1 and the second magnet M2, the X-side edge portion T Subtracting one of the magnetic force generating support 190 disposed in the retraction force is reduced that much can be simply leveling the support frame 180.

Of course, the microscope assembly 100 of the present embodiment has been described on the assumption that the magnetic force generating support 190 is arranged in each of the X, Y direction by five, but by increasing the number it is possible to enable more accurate horizontal adjustment It will be self explanatory.

After leveling the support frame 180 as described above, the light is irradiated onto the sample using the light source unit 130, and the image of the sample is continuously observed through the observation unit 160.

When the bright field image of the sample is to be observed, white light is irradiated to the sample side by using the first light source unit 140. The white light emitted from the first light source 142 is a diffusion filter 145 and a first condensing lens ( 144 is transmitted to the first reflective mirror 143, and the path is bent at a right angle by the first reflective mirror 143 to pass through the sample. Of course, the filter cube 153 is previously separated in the -Y direction of FIG.

The white light transmitted through the sample is transmitted to the second reflecting mirror RM side of the microscope module 110 through the objective lens OR, and the path is bent at a right angle by the second reflecting mirror RM, so that the tube lens TR After the focal length is adjusted through the observation unit 160 can be observed.

On the other hand, if you want to observe the fluorescent image of the sample is to irradiate UV or blue or yellow light to the sample side using the second light source unit 150, UV or blue or yellow light irradiated from the second light source 152 The light is transferred to the filter cube 153 through the second condensing lens F (hereinafter, 'blue light' is described as an example).

The blue light transmitted to the inside of the filter cube 153 passes through the excitation filter E1 (see FIG. 8) with the optical noise removed, and the blue light passes through the excitation filter E1. It is reflected through a dichroic mirror (D, dichroic mirror (see FIG. 8)) disposed obliquely to be adjacent to and transmitted to the sample side through the objective lens (OR).

The blue light transmitted to the sample side temporarily excites the energy of the sample, and then the sample emits absorbed energy and returns to a stable state, and emits green fluorescence light.

That is, as is well known, a sample that receives blue light emits fluorescence at a wavelength (relatively longer than blue light) shifted slightly 'green' while emitting excited energy. This so-called Stokes Shift phenomenon is already well known and thus a detailed description thereof will be omitted.

The fluorescence emitted by the sample is again transferred to the second reflection mirror RM through the objective lens OR, and the path is bent at a right angle by the second reflection mirror RM and then returned to the interior of the filter cube 153. Delivered. The fluorescence transmitted to the inside of the filter cube 153 passes through the dichroic mirror D as it is, and then optically through an emission filter E2 (Emission Filter, FIG. 8) disposed adjacent to the dichroic mirror D. FIG. After the noise is removed once more, it is transmitted to the observer 160.

Thus, the observation unit 160 can accurately observe the fluorescent image of the sample.

On the other hand, the microscope assembly 100 of the present embodiment, even if the vibration is generated from the outside is transmitted to the microscope module 110 side, the support body 191 and the coupling body 196 is not integrally coupled to some extent by magnetic force As it is configured to be spaced apart and coupled, the vibration can be absorbed.

That is, the microscope assembly 100 of the present embodiment can minimize the vibration transmitted from the outside by isolating the support frame 180 from the floor by using a magnetic force, thereby affecting the sample according to the vibration Will be minimized.

The microscope assembly 100 of the present embodiment is a magnetic force capable of easily adjusting the horizontal of the support frame 180 in consideration of the total weight of the microscope module 110 or the eccentricity of the weight of the support frame 180 on which the microscope module 110 is seated. By including the generating support 190 has an advantage that can effectively prevent the vibration generated from the outside and transmitted to the microscope module 110 side.

In addition, as shown in Figure 9, the microscope assembly (110a) according to another embodiment of the present invention, when the light microscope module (110a) is seated on the support frame 180, the number of the magnetic force generating support 190 easily By reducing the number of components can be easily adjusted.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, It is obvious to those who have. Accordingly, it should be understood that such modifications or alterations should not be understood individually from the technical spirit and viewpoint of the present invention, and that modified embodiments fall within the scope of the claims of the present invention.

100: microscope assembly 110: microscope module
120: incubation chamber 130: light source unit
140: first light source unit 150: second light source unit
160: observation unit 170: vibration prevention module
180: support frame 190: magnetic force generating support
191: support body 196: combined body
M1: first magnet M2: second magnet

Claims (7)

A microscope module provided to observe a sample; And
To support the microscope module, including an anti-vibration module for preventing the vibration generated from the outside to be transmitted to the microscope module side,
The anti-vibration module,
A support frame on which the microscope module is seated and formed with a plurality of coupling holes spaced apart from each other by a predetermined distance along a circumference; And
It is selectively coupled along the plurality of coupling holes in consideration of the weight of the entirety of the microscope module or the weight of the support frame on which the microscope module is seated, and supports the support frame from the bottom but maintains the magnetic force. Microscope assembly having an anti-vibration structure, characterized in that it comprises a plurality of magnetic force generating support to isolate the support frame using. The method of claim 1,
The magnetic force generating support,
A support body having a first magnet housed therein; And
An upper end is coupled to the coupling hole and the lower end includes a coupling body inserted into the support body so that the relative linear movement in the vertical direction along the inside of the support body and the second magnet is mounted on the lower side,
The second magnet is provided with a surface opposite to the first magnet to have the same polarity as that of the first magnet to generate a repulsive force so that the coupling body is always directed upwards. Microscope assembly having a. The method of claim 2,
The support body,
A hollow cylindrical main body;
A first magnet and a first magnet receiving groove protruding from the upper surface of the first flange to be smaller than the diameter of the first flange and fitted to the lower side of the main body, the first magnet is accommodated therein A support having a first accommodation part formed; And
A second flange and a second receiving portion protruding from the lower surface of the second flange so as to have a diameter smaller than the diameter of the second flange is fitted to the upper side of the main body for receiving the coupling body therein Microscope assembly having an anti-vibration structure, characterized in that it comprises a cover portion is formed through holes. The method of claim 3,
The coupling body,
A coupling sphere coupled to the coupling hole;
A connection part extending downward from the lower end of the coupler and having a diameter smaller than the diameter of the through hole so as to be inserted into the through hole and move upward and downward; And
It includes a flange portion protruding stepped outwardly from the lower end of the connecting portion to limit the upward movement range of the connecting portion, the second magnet receiving groove is formed therein for receiving the second magnet therein. Microscope assembly having an anti-vibration structure characterized in that. 5. The method of claim 4,
A female thread is formed on an inner circumferential surface of the coupling hole, and a male thread corresponding to the female thread is formed on an outer circumferential surface of the coupling portion, wherein the coupling body and the support frame are mutually coupled in a screwing manner. Microscope assembly having a. The method of claim 1,
The microscope module,
An incubation chamber which accommodates the incubator containing the sample and is provided to be movable in the X-axis and Y-axis directions, respectively;
At least one light source unit irradiating light to the sample side; And
Microscope assembly having an anti-vibration structure, characterized in that it comprises an observation unit provided to observe the image of the sample. The method according to claim 6,
The incubation chamber,
A pair of exhaust ports and inlets formed to be connected to the carbon dioxide concentration control unit for controlling the amount of carbon dioxide supplied to the incubator; And
And a pair of sensor connectors and heater connectors each formed to be connected to a temperature control unit for controlling the internal temperature of the incubation chamber.

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