KR20130011032A - Quality inspection appartus of tft lcd module - Google Patents

Abstract

PURPOSE: An image quality inspecting device of a TFT- LCD(Thin film transistor-liquid crystal display) module is provided to enhance the reliability of an image quality inspection result through a total inspection and to improve manufacturing efficiency by simplifying a configuration. CONSTITUTION: An image quality inspecting device of a TFT- LCD module(50) comprises an image control unit(10), an amperemeter(20), and a current check board(30). The image control unit transmits driving signals to the TFT- LCD module so that images are output. The image control unit supplies driving power to the TFT- LCD module. The amperemeter is connected to a power terminal applying power to the TFT- LCD module from the image control unit, thereby measuring the applied current. The current check board receives sink signals which are transmitted from the image control unit to the TFT- LCD module and current detection data measured by the amperemeter. Images are output by assembling the sink signals and current detection data. When the abnormality of the images is generated, the current check board determines the existence of abnormality, thereby outputting normal or abnormal signals. . [Reference numerals] (30) Current check board; (AA) Sync signal and pattern signal; (BB) Drive power; (CC) Sync signal

Description

Quality Inspection Appartus of TFT LCD Module

The present invention relates to an image quality inspection device for inspecting the output image quality for a long time for the product of the TFT-LCD module. More particularly, the present invention relates to image quality through abnormality of current detection data generated at the power supply terminal of the TFT-LCD module. The present invention relates to an image quality inspection apparatus for a TFT-LCD module, which enables operation costs such as installation costs and total inspection by determining whether there is an abnormality.

Before mass production of TFT-LCD, the process of verifying the reliability of the product for a long time by applying various temperature / humidity for 900 hours depending on the model in the quality part for the developed product.

The reliability evaluation is made by visual inspection by an operator or by an inspection method using expensive photographing inspection equipment. In the case of the inspection method through inspection equipment, a burden such as equipment installation space and installation cost is generated and the photographing inspection equipment is Instead of storing the whole during the reliability test time, only one image for each pattern is judged according to the pattern change time (2 seconds) of the TFT-LCD.

In addition, in the case of the visual inspection method, most of the workers can only inspect for a certain period of time during the evaluation of reliability, and abnormal operation occurs at a time when the operator is not inspecting. There is a possibility of finding a good decision without being found.

Therefore, there is a need to reduce the construction cost of the TFT-LCD inspection system and to propose an image quality evaluation apparatus capable of full inspection.

The present invention has been made to solve the above problems, and focuses on the fact that the current applied to the power supply terminal also changes when the image output abnormality occurs according to the pattern signal of the TFT-LCD module. By constructing a current meter to detect current data at the supply stage and a current check board to determine whether there is an image quality abnormality, work costs are greatly reduced, compared to conventional visual inspection and expensive imaging equipment. It is an object of the present invention to provide an image quality inspection apparatus for a TFT-LCD module.

The present invention has the following features to achieve the above object.

The present invention transmits a drive signal including a sink signal and a pattern signal in the form of R, G, and B data to an TFT-LCD module to output an image and supplies a driving power of the TFT-LCD module, and the image controller. The current meter is installed at the power supply terminal applied to the TFT-LCD module and the sink signal transmitted to the TFT-LCD module is transmitted from the image controller, and the current is measured from the current meter. When receiving the data and combining them, if the abnormality of the output image is generated, the current check board to determine whether there is an abnormality and output a normal or abnormal trigger signal.

The current check board includes a current amplifier for amplifying the current detection data received from the current meter, an A / D converter for converting the amplified analog current detection data into digital data, and the A / D converter. Receives the current detection data from the image control unit and receives the sync signal from the image control unit, stores the current data by combining them, compares the combined current data with the reference data, detects any differences, and determines whether there is an image quality abnormality. An error determination unit for outputting a normal or abnormal trigger signal, a microprocessor for storing reference data to transmit reference data to the error determination unit, and performing initialization or operation control of the error determination unit, and data input to the error determination unit. Transfer the latch reference clock signal to the error determiner The sending is done including an oscilloscope.

In addition, the image control unit inputs the number of pattern signals to the TFT-LCD module and repeats the input of the pattern signal. The reference data is a microprocessor error in the combination current data of the error determining unit according to the input of the number of initial pattern signals of the image control unit. The error determination unit receives the reference data from the microprocessor and determines whether the combined current data is abnormal when the pattern signal is repeatedly inputted and stored after being received from the determination unit.

In addition, a management terminal for transmitting reference data for each pattern signal and an operation control signal of the error determining unit to the microprocessor according to the pattern signal applied from the image control unit to the TFT-LCD module.

According to the present invention, it is possible to perform the whole inspection, which was impossible in the conventional visual inspection method or the inspection method through expensive photographing equipment, and thus, the reliability of the image quality inspection result is greatly improved.

In addition, the image quality inspection apparatus according to the present invention has a relatively simple configuration, the operation cost required for image quality inspection is significantly reduced than the conventional visual inspection or photographing inspection method has the effect of increasing the production efficiency of the producer.

1 is a schematic configuration diagram of an image quality inspection apparatus according to the present invention.
2 is a schematic configuration diagram of a current check board according to the present invention.
3 is a diagram illustrating a process of calculating abnormal current data according to the present invention.

Hereinafter, the image quality inspection apparatus according to the present invention will be described in detail with the accompanying drawings.

1 is a schematic configuration diagram of an image quality inspection apparatus according to the present invention, FIG. 2 is a schematic configuration diagram of a current check board according to the present invention, and FIG. 3 is a view illustrating a process of calculating abnormal current data according to the present invention. to be.

Referring to the drawings, the image quality evaluation apparatus according to the present invention transmits a driving signal including a sink signal and a pattern signal in the form of R, G, and B data to the TFT-LCD module 50 so that an image is outputted and the TFT-LCD. An image controller 10 for supplying driving power to the module 50 and a current meter 20 for measuring current applied to a power terminal applied from the image controller 10 to the TFT-LCD module 50. And a sync signal transmitted from the image controller 10 to the TFT-LCD module 50 together, and receiving current detection data measured from the current meter and combining them, resulting in an abnormality of the output image. In this case, the current check board 30 outputs a trigger signal by determining whether there is an abnormality.

Here, the image controller 10 supplies a plurality of pattern signals for the image quality inspection to the TFT-LCD module 50 so as to output an image on the screen of the TFT-LCD module 50, and transmits a sync signal to the TFT-LCD module 50. And a current to the check board 30 is provided.

The pattern signal is a standard test drive signal in the form of R, G, B data, and the quantity of the pattern signal is preferably 20 to about 100, and when the quantity of the pattern signal is 40, the data is transmitted from 1 to 40 and then from 1 again. Repeated transmission to 40.

In addition, the image controller 10 supplies driving power for driving the TFT-LCD module 50, and a current measuring device 20 to be described later is installed at the power supply terminal.

One of the greatest features of the present invention is to determine whether there is an image quality abnormality by measuring the current value of the power supply terminal. When an image quality abnormality occurs on the TFT-LCD module 50, the time of occurrence of abnormality in the power supply terminal During this time, the current value is different from the existing reference current value.

When the abnormal current value is stored in the current check board 30 which will be described later, the test inspector can know whether or not an abnormality occurs even when the abnormality is not detected, thereby enabling a full inspection.

Since the abnormal current value detection configuration of the power supply stage is much simpler than the existing expensive image detection equipment, not only the installation cost is simple, but also a full inspection can be performed, thereby inducing the reliability and cost reduction of the image quality inspection.

In addition, the driving power supply to the TFT-LCD module 50 through the image control unit 10 may be applied to the TFT-LCD module 50 by having a separate power supply device instead of the image control unit 10. In this case, the current meter 20 is connected to a power supply terminal between the power supply and the TFT-LCD module 50 to detect the applied current.

On the other hand, the current meter 20 is installed in the power supply terminal is applied to the TFT-LCD module 50 from the image control unit 10 is provided to measure the applied current, the current detection data is measured in the form of analog data As a result, the error determination unit 33 of the current check board 30 receives the data and converts it into digital data.

In addition, the current check board 30 receives the sink signal and the current detection data from the image controller 10 and the current meter 20, respectively, and generates a combination of the current data and compares it with the reference data to determine whether there is an abnormality. It is provided to.

This means that the abnormal current generation section is not generated in the current detection data received from the current meter 20 when the image output is in a normal state. However, the abnormal current generation section is generated in the current detection data when the image output is abnormal. Therefore, abnormal trigger signal is output as much as abnormal current generating section.

The current check board 30 includes a current amplifier 31 for amplifying the current detection data received from the current meter 20 and A / A for converting the amplified analog current detection data into digital data. Receives the current detection data from the D converter 32 and the A / D converter 32, receives the sink signal from the image controller 10, stores the current data by combining them, and compares the combined current data with the reference data. If there is a difference between the error determination unit 33 to determine whether there is an image quality abnormality and output a normal or abnormal trigger signal according to the abnormality, and to store the reference data and the reference data to the error determination unit 33 A microprocessor 34 for transmitting and performing initialization or operation control of the error determining unit 33 and latching of data input to the error determining unit 33. It consists of the oscilloscope 35 to transfer a given clock signal to an error determination unit (33).

Here, the current amplifier 31 amplifies the current detection value input from the current meter 20 as shown in FIG. 2 and transfers it to the A / D converter 32, and the A / D converter 32 does this. The data is converted into a digital value and transmitted to the error determining unit 33.

In addition, the error determining unit 33 generates current data by adding the sync signal received from the image control unit 10 and the current detection data in digital form received from the A / D converter 32.

The current data (lead data) generated in this way is compared with reference data generated in advance by the error determining unit 33, that is, a section having a different pattern is detected in comparison with the standard current data in a steady state.

In this case, when a different section is detected, the error determining unit 33 outputs an abnormal trigger signal to the outside, and outputs a normal trigger signal when the section is not a different section.

If necessary, by installing a separate control means may be configured to send a drive signal to a call means such as a buzzer or a warning light when receiving the abnormal trigger signal from the error determination unit 33.

Meanwhile, reference data for determining whether an abnormality is transmitted to the error determining unit 33 may be generated in various ways. The reference data according to an embodiment of the present invention is a pattern signal at the time of inputting a pattern signal from the image controller 10. After applying as much as the quantity is repeated and applied again, in this case, the combination current data of the error determination unit 33 according to the input of the amount of the first pattern signal received from the error determination unit 33, the microprocessor 34 receives and stores Thereafter, when the pattern signal repetition is input, the error determining unit 33 receives the reference data from the microprocessor 34.

For example, when the number of pattern signals is 40, when the first 40 pattern signals are input, the combined current data generated by the error determining unit 33 is received by the microprocessor 34 and stored as reference data. The current data and the reference data according to the corresponding pattern signal input are compared to determine whether there is an abnormal section.

Meanwhile, as reference data according to another embodiment of the present invention, as shown in FIG. 2, a separate management terminal 40 is provided so that reference data values for each model and pattern of the TFT-LCD module 50 are stored in advance in the management terminal. By doing so, the error determining unit 33 receives the reference data through the microprocessor 34 during the image quality test.

In addition, as shown in FIG. 3, the error determining unit 33 adds a current detection data value according to a sync signal to generate a final combined current data value, compares it with reference data, and then determines whether there is an abnormality. It can be configured in various forms to determine the abnormality by calculating the current data value.

In one embodiment of the present invention, the current detection data appearing in one period between the sink signal and the next sink signal is divided into 10 or 50 sections, and the final value obtained by adding up the current detection data in the divided sections as the combined current data. After the calculation, the combined current data is compared with the previously calculated reference data.

Therefore, if it is out of the range of 1 ~ 5% of the reference data value according to the setting, it is determined that this is the section in which an abnormality occurs and outputs an abnormal trigger signal.

In addition, the combination current data may be tabulated for each divided section to be compared in more detail, and the graph may be used to determine whether there is an abnormality through a numerical graph of the combination current data.

The combined current data shown in FIG. 3 represents a divided section in the one sink section, and the sum of the current detection data calculated for each divided section for one section is the final combined current data value.

In addition, in the combination current data, the combination means that the current detection data for each sync section is calculated in synchronization.

In addition, the management terminal 40 may control the operation of the error determination unit 33 through the microprocessor 34 in addition to the remote.

In addition, the microprocessor 34 may store reference data to transmit reference data to the error determining unit 33 and perform initialization or operation control of the error determining unit 33.

In addition, the oscilloscope 35 is provided to generate a latch reference clock signal of the data input to the error determining unit 33 and transmits it to the error determining unit 33, such a clock signal is preferably configured to be around 10Mhz.

While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to those precise embodiments, and many alternatives, modifications, and variations will be apparent to those skilled in the art. I will understand.

Accordingly, the true scope of the present invention should be determined by the technical idea of the appended claims.

10: image control unit 20: current measuring instrument
30: current check board 31: current amplifier
32: A / D converter 33: Error judging unit
34 microprocessor 35 oscilloscope
40: management terminal 50: TFT-LCD module

Claims (4)

The image control unit 10 transmits a driving signal including a sync signal and a pattern signal in the form of R, G, and B data to the TFT-LCD module 50 to output an image, and supplies driving power to the TFT-LCD module 50. ), A current measuring device 20 connected to a power terminal applied from the image control unit 10 to the TFT-LCD module 50 and measuring current applied thereto, and the TFT-LCD module from the image control unit 10. Receives a sync signal transmitted to the (50) together, and receives the current detection data measured from the current meter 20 and combines it to determine if there is an abnormality in the output image to determine whether there is an abnormal or normal trigger Image quality inspection apparatus for a TFT-LCD module comprising a current check board for outputting a signal (30).
The method of claim 1,
The current check board 30 is
A current amplifier 31 for amplifying the current detection data received from the current meter 20, an A / D converter 32 for converting the amplified analog current detection data into digital data, and the A Receives current detection data from the / D converter 32, receives the sink signal from the image controller 10, stores the current data by combining them, and compares the combined current data with the reference data to detect the difference and detects the image quality. An error determining unit 33 which determines whether there is an abnormality and outputs a normal or abnormal trigger signal according to the abnormality, and stores reference data to transmit reference data to the error determining unit 33, and the error determining unit 33 The microprocessor 34 which performs initialization or operation control of the data, and the error determination unit 33 receives the latch reference clock signal of the data input to the error determination unit 33. Transport oscilloscope 35, the image quality inspection apparatus of the TFT-LCD module, comprising the a.
The method according to claim 2, wherein
The image controller 10 inputs the number of pattern signals to the TFT-LCD module 50 and then inputs them repeatedly, and the reference data is an error determining unit according to the input of the number of initial pattern signals of the image controller 10. The combination current data of (33) is received by the microprocessor 34 from the error determination unit 33, and when the pattern signal repetition is input, the error determination unit 33 receives the reference data from the microprocessor 34. The image quality inspection apparatus of the TFT-LCD module, characterized in that it is made to determine whether there is an abnormality of the combined current data.
The method of claim 2,
A management terminal for transmitting reference data for each pattern signal and an operation control signal of the error determining unit 33 to the microprocessor 34 according to a pattern signal applied from the image controller 10 to the TFT-LCD module 50. The image quality inspection apparatus of the TFT-LCD module, characterized in that it further comprises (40).

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