KR20110064649A - Refractive index measurement device based on white light interferometry and method thereof - Google Patents

Abstract

PURPOSE: A refraction index measuring device based on white light interferometer and a method are provided to measure the absolute value of the phase refraction index at the wide wavelength area fast and easy and conveniently and thoroughly by not using the complex apparatuses. CONSTITUTION: The refraction index measuring device based on white light interferometer includes: a light source(10); an optical signal distributor(101); a reference arm(110); a sample arm(120); an optical interferometer(100); and an optical spectrum analyzer(20). The light source outputs the optical signal of the multi frequency. The optical signal distributor distributes the optical signal inputted from the light source into 2. The reference arm receives a message one among the optical signal divided through the optical signal distributor. The sample arm receives a message the other one among the optical signal divided through the optical signal distributor and forms the stage passing through by the measurement target luminance sample and rotating the luminance sample. The interferometer optic includes the optical coupler(102). The optical coupler unites the optical signals output through the sample pal and the reference arm and interferes mutually. The optical spectrum analyzer analyzes spectrum after receiving the interfered optical signal from the interferometer optic.

Description

REFRACTIVE INDEX MEASUREMENT DEVICE BASED ON WHITE LIGHT INTERFEROMETRY AND METHOD THEREOF

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus and method for measuring refractive index of optical materials using an interference fringe measurement system. In particular, the present invention relates to a method of measuring refractive index of a phase refractive index in a broad wavelength range easily and quickly without using complicated devices. The present invention relates to an apparatus and method for measuring refractive index of optical materials that can be measured.

Refractive index measurement of optical materials is the most fundamental property measurement technology for the material analysis of all optical devices and photonic devices. Therefore, it is very important to accurately measure the refractive index, which is a major physical property of optical materials, which affects the functions of various optical devices such as various optical communication and optical signal processing.

Until now, various types of refractive index measurement methods have been known, and traditionally, methods using an angle at which light is refracted while passing through a medium or using an interferometer have been used. These methods have limited characteristics, such as the need to prepare a sample in a specific shape, such as a prism shape, a complex measuring device, a complex data analysis method, or a refractive index at a specific wavelength. Hereinafter, various conventional methods for measuring the refractive index and their problems will be described.

First, 1) ellipsometry analysis method of single beam polarization interferometer using reflective film [C. M. Herzinger, et al., J. of Appl. Phys., 83 (6), 3323-3336 (1998)] [J. C. Martinez-Anton and E. Bernabeu, Opt. Commun. 132, 321328 (1996)] is a method of measuring the refractive index by measuring the intensity of reflected light according to the angle of light incident on a thin sample, which is possible only when the thickness of the sample is thin and basically In order to measure the refractive index, it is necessary to measure the wavelength by changing the wavelength in order to obtain the characteristics of various wavelengths. In addition, it is very sensitive to thickness and angle and has a large influence due to the line width of the light source used in the measurement. There is a problem that can be large.

2) Prism coupling method [R. Ulrich and R. Torge, Appl. Opt., 12, 2901 (1973)] places a prism on a sample of a thin film and measures the intensity of the reflected light while varying the angle of incidence of the light on the prism. In this case, the measurement is basically performed on a single wavelength, and the measurement has to be made to find the corresponding conditions while changing the angle. That is, to obtain the characteristics of several wavelengths, it is necessary to perform repeated measurements while changing the wavelength. There is this.

3) Using the minimum deviation angle of light in the sample [D. J. Gettemy, et al., IEEE J. Quantum Electron, 24, 2231 (1988)] [J. F. H. Nicholls, et al., Appl. Opt. 36, 8587 (1997)], in which a minimum deviation angle of light refracted by a change in refraction according to temperature is used to prepare a sample in a specific shape, such as a prism, and measure the angle with the smallest deviation between the incident angle and the refraction angle. It is difficult to prepare a sample and there is a problem in that it is necessary to measure an angle change at a single wavelength.

4) Abbe refractive index method [J. Rheims, et al, Meas. Sci. Technol., 8, 601-605 (1997)] [M. Debenham, et al., Opt. Acta, 26, 1487-1503 (1979)] [G. H. Meeten, Meas. Sci. Technol. 8, 728 (1997)] [S. Singh, Phys. Scr., 65, 167-180 (2002)] is a method of using the total reflection critical angle according to the refractive index of a sample, and the range of measurable refractive index is determined according to the refractive index of the prism, and the total reflection conditions at a given wavelength are searched individually. There is a problem that the refractive index should be measured.

5) Single wavelength interferometer method [M. S. Shumate, Appl. Opt. 5, 327 (1966) [J. F. H. Nicholls, et al., Appl. Opt. 36, 8587 (1997)] [K. Betzler, et al., Rev. Sci. Instrum. 59, 652 (1988)] is a method of measuring the refractive index at a single wavelength while rotating a sample, and the refractive index at a continuous wavelength cannot be seen, but repeated measurements must be made at a fixed monochromatic wavelength while moving the wavelength. As a method, there is a problem that it is difficult to simply measure the change of the refractive index at the continuous wavelength, that is, the chromatic dispersion at once.

6) Low coherence light source interferometer system with wide wavelength band [W. V. Sorin and D. F. Gray, IEEE Photonics Technol. Lett., 4 (1), 105-107 (1992)] [D. F. Murphy and D. A. Flavin, Appl. Opt., 39 (25), 4607-4615 (2000)] [H. Maruyama, et al., Appl. Opt., 41, 13151322 (2002)] [D.-S. Park, et al., Hankook Kwanghak Hoeji (Korean), 20 (1), 29-33 (2009)] [Korean Patent 10-0290086 (2001)] uses the same or similar light source as in the present invention, In the existing technique, the sample is fixed but the one-side mirror is moved to measure the interference peak on the time axis at the wavelength at which the matching condition is satisfied. In this method, there is a problem in that only the group refractive index in the wide wavelength region can be measured instead of the absolute phase refractive index in each wavelength of the sample.

7) Method using diffraction grating [W. Liang, et al., Appl. Phys. Lett., 86, 151122: 1-3 (2005)] [I. Del Villar, et al., Opt. Lett., 30, 2363-2365 (2005)] and 8) Method using surface plasmon resonance [B. Gauvreau, et al., Opt. Express 15, 11413-11426 (2007)], the refractive index measurement range is limited by the grating wavelength range of the diffraction grating and the refractive index of the metal used in the surface plasma, and the diffraction grating or surface rather than measuring the absolute refractive index value for the wavelength. There is a problem in that it is only suitable for use as a sensor for measuring a change in refractive index of a medium such as a liquid or a gas around a plasmon generating element.

9) Method using 'Optical Low-Coherence Tomography' [G. J. Tearney, et al., Opt. Lett., 20 (21), 2258-2260 (1995)] measure only the local refractive index distribution in a sample using the conditions under which interference occurs for light source signals in a wide wavelength range. There is a problem that only group refractive index can be measured in a wide wavelength region, not phase refractive index.

10) Febry-Perot interferometer method using optical fiber [T. Wei, Y. Han, et al., Opt. Express., 16 (8), 5764-5769 (2008)], the absolute phase index of refraction since the core portion of the optical fiber measures the change in refractive index when the sample to be measured is placed in the Fabry-Perot interferometer structure between the etched gaps. The problem is that it is only suitable for sensors for measuring the change in refractive index of liquid or gas samples rather than the measurement of (phase refractive index).

11) Method using a ring resonator [I. M. White, et al., Opt. Lett., 31, 1319-1321 (2006)] [I. M. White and X. Fan, Opt. Express, 16, 1020-1028 (2008)] has a problem that it is difficult to measure the absolute phase refractive index of the sample by measuring the change of the refractive index by changing the resonance conditions by dropping the liquid sample in the ring resonator.

12) Method using cutoff wavelength in photonic crystal [N. Skivesen, et al., Opt. Express, 15, 3169-3176 (2007)] is a change in the light's propagation cutoff condition when the liquid sample is around the photonic crystal, which is not suitable for measuring the refractive index according to the wavelength.

13) Method of measuring the light intensity according to the angle of light incident on the sample [G. Coppola, et al, Appl. Opt., 42 (19), 3882-3887 (2003)] [H. J. Choi, et al., Sae Mulli (The Korean Physical Society, Korean), 53 (6), 489-494 (2006)] [H. J. Choi, et al., J. of the Kor. Phys. Soc., 53 (6), 3197-3200 (2008)] can measure only the index of refraction at a single wavelength by using the condition of constructive cancellation interference of the interferometer according to the degree of change of the optical path length according to the incident angle. It takes a long time due to the large number of measurements, and there are many disadvantages in that an error occurs when fitting a graph of light intensity according to an angle. In addition, continuous refractive index measurement in a wide wavelength range is difficult.

14) Method using confocal microscope [T. Fukano and I. Yamaguchi, Appl. Opt., 38, 40654073 (1999)] In case of [Korean Patent Laid-Open No. 2001-0113146, 10-2006-0066267], a wavelength is measured using a confocal microscope and a wavelength scanning interferometer to simultaneously measure the refractive index and thickness of a sample. A method of measuring the phase shift of an interference fringe on the time axis by adjusting the wavelength of a laser diode with a narrow range of variation. It is possible to measure the refractive index at a given laser diode wavelength, so that it is difficult to measure the absolute phase refractive index in a continuous wide wavelength region. There is a difficult problem.

15) How to use a Fizeau interferometer [D. Bhattacharyya, et al., Opt. Laser Technol., 34, 9396 (2002)] In the case of [Korea Patent Publication 10-2006-0031199], a sample having an inclined surface should be prepared and the characteristics of interference fringes changing in a narrow wavelength region around the wavelength to be measured are measured. Since the refractive index is obtained, it is difficult to measure the absolute phase refractive index in the continuous wide wavelength region even in this method.

16) Method of measuring the distance of the beam deflected from the front and rear of the sample with respect to the inclined incident beam incident on the charge coupler (CCD) camera and the planar sample [Inc. US Patent Publication 0025899 (2003)] It is difficult to measure the phase refractive index of the sample by measuring the distance of the beam deflected from the front and rear of the sample while changing the incident angle.

Finally, 17) using an interference fringe reflected from a thin film [R. Swanepoel, J. Phys. E: Sci. Instrum, 16, 1214-1222 (1983)] [US Pat. No. 4,335,961 (1982)], the method of determining the refractive index and thickness using interference fringes in thin films is quite large, and the error range is quite large. There is a problem that it is necessary.

The present invention has been invented to solve the above problems, a device that can measure the absolute value of the phase refractive index in a continuous and wide wavelength region at a time simply by preparing a simple sample as a relatively simple interferometer composition and principle And to provide a method.

In order to achieve the above object, the refractive index measuring apparatus according to the first and second embodiments of the present invention, the light source 10 for outputting an optical signal of multiple wavelengths; Optical signal distributors 101 and 201 for distributing the optical signal input from the light source 10 into two, reference arms 110 and 210 for receiving any one of the optical signals distributed through the optical signal distributors 101 and 201, and the optical signal Sample arms 120 and 220, the reference arms 110 and 210, and the samples constituting a stage capable of receiving the other of the optical signals distributed through the distributors 101 and 201 and passing them to the optical sample to be measured and rotating the optical sample. An optical interferometer (100,200) including optical signal combiners (102,202) for combining and interfering optical signals output through the arms (120,220); And an optical spectrum analyzer 20 for receiving an optical signal interfered by the optical interferometers 100 and 200 and analyzing the spectrum.

In the refractive index measuring apparatus according to the first embodiment of the present invention, the reference arm 110, an optical signal output collimator for outputting the optical signal received from the optical signal distributor 101 in the air (104); And an optical signal reception collimator 105 for receiving an optical signal output from the optical signal output collimator 104, wherein the optical signal is divided between the optical signal distributor 101 and the optical signal output collimator 104. At least one of a path and an optical path between the optical signal receiving collimator 105 and the optical signal combiner 102 may be formed of an optical fiber. In addition, one of the optical collimators (104, 105) is installed to adjust the optical path length in the reference arm 110 by installing a linear stage to adjust the gap between the two.

The sample arm 120, an optical signal firing collimator 106 for irradiating the optical signal received from the optical signal distributor 101 to the optical sample mounting table 130; And an optical signal receiving collimator 107 which receives the optical signal emitted from the optical signal firing collimator 106 by passing the optical sample on the optical sample mounting table 130. The optical signal splitter 101 includes the optical signal splitter 101. ) And the optical path between the optical signal firing collimator 106 and the optical path between the optical signal receiving collimator 107 and the optical signal combiner 102 may be formed of optical fibers.

In order to increase the visibility of the interference fringes output from the optical interferometer 100, the polarization controller 103 may use an optical path or the number of optical signals between the optical signal splitter 101 and the optical signal output collimator 104. It may be provided between the credit collimator 105 and the optical signal combiner 102 to adjust the polarization direction of the optical signals traveling on these optical paths. The polarization controller 103 may be installed on the path of the sample arm 120 instead of the path of the reference arm 110.

In the refractive index measuring apparatus according to the second exemplary embodiment of the present invention, the reference arm 210 refracts the optical signal distributed from the optical signal splitter 201 to be irradiated to the optical signal combiner 202 and moves the position. It includes; first refractive means (203, 204) for adjusting the optical path length in the reference arm. The sample arm 220 refracts the optical signal distributed from the optical signal distributor 201 so as to pass the optical sample on the optical sample mounting unit 130 to be irradiated to the optical signal combiner 202. Means (205, 206).

In the optical path between the first refraction means 204 and the optical signal combiner 202, a half-wave plate type polarization controller 207 may be provided to adjust the polarization direction of the optical signal. The half-wave plate polarization controller 207 may be installed on the path of the sample arm 220 instead of the path of the reference arm 210.

The sample arms 120 and 220 may include parallel plate-shaped samples on which refractive indices are to be measured.

The sample arms 120 and 220 may include a sample coated with a thin film of a material on which a refractive index is to be measured on a substrate having a refractive index measured in advance.

The sample arms 120 and 220 may include a container capable of containing a liquid made of a material whose refractive index is measured in advance, and a liquid sample contained in the container.

The outer surface of the optical interferometer (100,200) may be provided with a vibration blocking film 30 for blocking the influence of external vibration.

In addition, in order to solve the problems of the existing techniques as described above, the refractive index measuring apparatus according to the third and fourth embodiments of the present invention, the light source 10 for outputting an optical signal of multiple wavelengths; Optical signal distribution / combining means (301, 401) for distributing the optical signal input from the light source 10 into two, combining the two optical signals returned from the distributed direction, and interfering with each other; The other of the reference arms 310 and 410, the distributed optical signal, which reflects and returns to the optical signal distribution / combining means 301 and 401, can be passed through the optical sample on the optical sample mount 130 to be measured and rotate the optical sample. A sample arm (320, 420) constituting a stage, and returning an optical signal to the optical signal distribution / combining means (301, 401) and outputting an interference fringe to the other input of the optical signal distribution / combining means (301, 401). Optical interferometers 300 and 400; And an optical spectrum analyzer 20 for receiving an optical signal interfered with the optical interferometers 300 and 400 and analyzing an optical spectrum for analyzing the spectrum.

In the refractive index measuring apparatus according to the third embodiment of the present invention, the reference arm 310 receives the optical signal from the optical signal distribution / combining means 301 and receives the received optical signal from the first reflector 305. And an optical signal output / receive collimator 303 which receives the optical signal reflected from the first reflector 305 after outputting the optical signal, and the sample arm 320 includes the optical signal distribution / combining means 301. An optical signal connection collimator 304 for outputting an optical signal from the optical sample mounting stand 130 and receiving an optical signal transmitted through the optical sample and reflected by the second reflector 306. And an optical path between the optical signal distributing / combining means 301 and the optical signal output / receiving collimator 303 and between the optical signal distributing / combining means 301 and the optical signal connection collimator 304 One or more of the optical paths are optical islands It may consist.

In order to increase the visibility of the interference fringe output from the optical interferometer 300, a polarization controller 302 is placed on the optical path between the optical signal splitter 301 and the optical signal output / receive collimator 303. It may be configured to adjust the polarization direction of the traveling optical signal. The polarization controller 302 may be installed on the path of the sample arm 320 instead of the path of the reference arm 310.

The first reflector 305 reflects any one of the optical signals distributed from the optical signal distribution / combining means 301 and returns it to the optical signal distribution / combination means 301, and moves the reference back and forth through the positional movement. The optical path length in the arm 310 can be adjusted.

In the refractive index measuring apparatus according to the fourth embodiment of the present invention, the reference arm 410 sends the optical signal distributed from the optical signal distribution / combining means 401 to the first reflector 403 to be reflected and returned. The optical path length of the reference arm is adjusted by moving the position of the first reflector 403. The sample arm 420 sends the other optical signal distributed from the optical signal distribution / combining means 401 through the optical sample on the optical sample mount 130 to the second reflector 404 for reflection and returning. To come.

A half-wave plate polarization controller 402 may be provided in the optical path between the optical signal distribution / combining means 401 and the first reflector 403 to adjust the polarization direction of the optical signal. The half-wave plate polarization controller 402 may be installed on the path of the sample arm 420 instead of the path of the reference arm 410.

The sample arms 320 and 420 may include parallel plate-shaped samples on which refractive indices are to be measured.

The sample arms 320 and 420 may include a sample coated with a thin film of a material on which a refractive index is to be measured on a substrate having a refractive index measured in advance.

The sample arms 320 and 420 may include a container capable of containing a liquid made of a material whose refractive index is measured in advance, and a liquid sample contained in the container.

The outer surface of the optical interferometer (300, 400) may be provided with a vibration blocking film 30 for blocking the influence of external vibration.

In addition, in order to solve the above problems, the refractive index measuring method according to the first embodiment of the present invention is output through the optical interferometer while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample A reference spectrum obtaining step of measuring a spectrum and converting a wavelength into a frequency to obtain a frequency spectrum; Obtaining a reference interference pattern for normalizing the spectrum by using a fast Fourier transform and a Hilbert transform to obtain an interference pattern spectrum; A reference phase difference calculation step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference fringe spectrum obtained in the reference interference fringe acquisition step; Contrast interference which measures the spectrum passing through the optical interferometer while the optical sample is rotated, goes through the same process as the reference interference fringe acquiring step, obtains the frequency spectrum by converting the wavelength to frequency, and then normalizes to obtain the interference fringe spectrum Pattern acquisition step; A contrast phase difference calculating step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern obtaining step; A fitting function determining step of determining a fitting function by fitting a phase difference value to each of the reference phase difference calculating step and the control phase difference calculating step; And a reference phase difference value and a contrast phase difference value at a frequency corresponding to an arbitrary wavelength using the fitting functions determined in the fitting function determination step, and the difference between the reference phase difference value and the control phase difference value and the following equation 17: It includes; a refractive index calculation step of calculating the refractive index using.

In addition, the refractive index measuring method according to the second embodiment of the present invention in order to solve the problems as described above, passing through the optical interferometer in a state where the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample A reference spectrum obtaining step of measuring the output spectrum and converting the wavelength into a frequency to obtain a frequency spectrum; In the same manner as in the reference spectrum acquisition step, the light is blocked by alternately blocking only one of the two arms of the optical interferometer while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample. A reference interference fringe acquiring step of obtaining an interference fringe spectrum by normalizing these spectra without excluding these spectra from the spectrum obtained in the reference spectrum acquiring step; A reference phase difference calculation step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference fringe spectrum obtained in the reference interference fringe acquisition step; Contrast interference which measures the spectrum passing through the optical interferometer while the optical sample is rotated, goes through the same process as the reference interference fringe acquiring step, obtains the frequency spectrum by converting the wavelength to frequency, and then normalizes to obtain the interference fringe spectrum Pattern acquisition step; A contrast phase difference calculating step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern obtaining step; A fitting function determining step of determining a fitting function by fitting a phase difference value to each of the reference phase difference calculating step and the control phase difference calculating step; And a reference phase difference value and a control phase difference value at a frequency corresponding to an arbitrary wavelength using the fitting functions determined in the fitting function determination step, and a difference value between the reference phase difference value and the control phase difference value and Equation 17 below. It includes; a refractive index calculation step of calculating the refractive index by.

And a transmission length adjusting step of adjusting an optical signal transmission length of the reference arm before the reference spectrum obtaining step or the control spectrum obtaining step.

The transmission length adjusting step may adjust the optical signal transmission length of the reference arm so that the visibility of the interference fringe is the largest.

Adjusting the polarization of the optical signal irradiated to the optical sample and the optical signal transmission length of the reference arm when the optical sample has a birefringence; An interpolation step of interpolating the spectra obtained in the reference spectrum acquisition step and the control spectrum acquisition step to obtain a spectrum of constant intervals; And an interference fringe discrimination step of distinguishing the interference fringes for the normal and abnormal refractive beams from the interpolated spectrum by using the Fourier transform, the filtering, and the inverse Fourier transform process.

In another preferred embodiment of the present invention, a method for measuring a refractive index of a thin film sample may include: measuring a substrate refractive index using a method for measuring the refractive index (in the case of a substrate that is already well known); Coating a thin film sample on the substrate; Obtaining a difference value between a reference phase difference value and a control phase difference value of the thin film sample using the refractive index measurement method of the thin film sample; Refractive index of the thin film which calculates the refractive index of the thin film by using the refractive index calculation formula (Equation 17 or 18) of the present invention using the difference between the refractive index of the substrate, the reference phase difference value and the control phase difference value of the thin film sample A calculating step.

Method for measuring the refractive index of the liquid sample according to a preferred embodiment of the present invention, the liquid sample mount refractive index measurement step using the refractive index measurement method (can be omitted if the refractive index of the material of the liquid sample mount is already known) ; Obtaining a difference value between a reference phase difference value and a control phase difference value of the thin film sample by placing a liquid sample in the liquid sample mount and performing a refractive index measurement method on the thin film sample; Using the difference between the refractive index of the liquid sample mount and the reference phase difference value and the control phase difference value of the liquid sample to calculate the refractive index of the thin film using the refractive index calculation formula (Equation 17 or 18) of the present invention Calculating the refractive index of the liquid sample; It includes.

In a method of measuring refractive index of a birefringent sample according to an exemplary embodiment of the present invention, a light source for outputting an optical signal of multiple wavelengths, a reference arm and a light sample to be measured are divided by dividing the optical signal output from the light source into two. An optical spectrum analyzer for analyzing a spectrum by receiving an optical interferometer for supplying each seated sample arm and then interfering with each other by combining the optical signal output through the reference arm and the sample arm and the interference of the optical signal from the optical interferometer A method for measuring the refractive index of a birefringent sample using a method, the optical sample is measured perpendicular to the optical axis of the beam going to the sample to measure the spectrum output through the interferometer, and the spectrum is fast Fourier transform Spectrum due to ordinary refractive index, filtering, and inverse Fourier transform A spectral separation step of separating the spectrum by extraordinary refractive index; Obtaining a reference interference fringe to normalize each of the separated spectra using a Hilbert transform; A reference phase difference calculation step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength by using the interference pattern spectrum obtained in the reference interference pattern acquisition step; In the state in which the optical sample is rotated, the spectrum passing through the interferometer is measured, and the spectrum due to the normal refractive index and the spectrum due to the extraordinary refractive index are subjected to the same process as the reference spectrum obtaining step. Spectral separation step; Obtaining an interference fringe spectrum by normalizing the separated spectrum to obtain an interference fringe spectrum; A contrast phase difference calculation step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern acquisition step; A fitting function determining step of fitting a phase difference value to each of the reference phase difference calculating step and the control phase difference calculating step to determine respective fitting functions; Obtaining a reference phase difference value and a control phase difference value at any wavelength using the fitting functions determined in the fitting function determination step; A refractive index calculation step of calculating a refractive index using a difference value between the reference phase difference value and the control phase difference value at each wavelength and the refractive index calculation formula (Equation 17 or 18) of the birefringent sample presented in the present invention; It includes.

According to the refractive index measuring apparatus and method based on the white light interferometer according to the present invention as described above, it is possible to quickly and accurately measure the refractive index according to the wavelength of the solid sample, liquid sample, bulk sample, thin film sample, and birefringent material There is.

In addition, the reference value prepared in advance is not required, and since it is not influenced by the state of the sample, not only the limitation of the conventional measurement in the prior art, but also the need for processing the sample in a specific form, there is an effect capable of quick and easy measurement.

In addition, since there are few additional elements other than the basic interferometer, a very simple structure is possible. Particularly, in the case of a birefringent material, a device such as a polarizer is not required, so the structure is simple and the measurement is very quick and simple.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. First, it should be noted that the same components or parts in the drawings represent the same reference numerals as much as possible. In describing the present invention, detailed descriptions of related well-known functions or configurations are omitted in order not to obscure the gist of the present invention.

1 is a block diagram of a refractive index measuring apparatus according to a first embodiment of the present invention, Figure 2 is a block diagram of a refractive index measuring apparatus according to a second embodiment of the present invention. More specifically, FIG. 1 is a configuration diagram of a refractive index measurement apparatus using an optical fiber element, and FIG. 2 is a configuration diagram of a refractive index measurement device composed of a prism, which is a bulk optical element.

The refractive index measuring apparatus according to the first and second embodiments of the present invention uses a Mach-Zehnder interferometer, as shown in FIGS. 1 and 2, the light source 10, the optical interferometer 100, 200, and the optical spectrum analyzer 20. ) And the vibration shielding film 30.

The light source 10 outputs an optical signal of multiple wavelengths. Since the refractive index measuring apparatus according to the present invention is different from the conventional method in that the refractive index at a wide range of wavelengths can be measured at a time, it is preferable that the light source 10 is a multi-wavelength light source.

First, the measurement apparatus according to the first embodiment of the present invention has a basic configuration of the light source 10, the optical interferometer 100 and the optical spectrum analyzer 20.

Here, the optical interferometer 100 further includes an optical signal splitter 101, a reference arm 110, a sample arm 120, and an optical signal combiner 102.

The optical signal splitter 101 distributes the optical signal input from the light source 10 into two. That is, the optical signal splitter 101 divides the optical signal from the light source 10 into the reference arm 110 and the sample arm 120.

The optical signal combiner 102 combines optical signals output through the reference arm 110 and the sample arm 120 to mutually interfere with each other. That is, the optical signal combiner 102 combines the optical signals divided into the reference arm 110 and the sample arm 120 again through the optical signal splitter 101 to interfere with each other.

The optical spectrum analyzer 20 receives the optical signal interfered by the optical interferometer 100 and analyzes the spectrum. That is, the optical spectrum analyzer 20 analyzes the spectral information by receiving the signal coupled and mutually interfered by the optical signal combiner 102.

The reference arm 110 receives any one of the optical signals distributed through the optical signal distributor 101. In more detail, the reference arm 110 includes a polarization controller 103 for adjusting the polarization of the optical signal to increase the visibility of the interference fringe, and two optical collimators 104 for transmitting the optical signal into the air. , 105). In this case, a green lens may be used as the optical collimator. The two optical collimators may be further divided into an optical signal output collimator 104 and an optical signal reception collimator 105.

At this time, the optical signal output collimator 104 outputs the optical signal received from the optical signal splitter 101 into the air, and the optical signal reception collimator 105 outputs from the optical signal output collimator 104. The received optical signal. At this time, one of the two optical collimators (104, 105) should be installed in a straight stage to adjust the length of the optical path in the reference arm 110 by adjusting the spacing between the strings. This allows the thickness of the sample to be measured (W. V. Sorin and D. F. Gray, IEEE Photonics Technol. Lett., 4 (1), 105-107, 1992).

 Meanwhile, at least one of the optical path between the optical signal splitter 101 and the optical signal output collimator 104 and the optical path between the optical signal receiving collimator 105 and the optical signal combiner 102 may be an optical fiber. It can be formed as.

The sample arm 120 receives a different one of the optical signals distributed through the optical signal splitter 101, passes through the optical sample to be measured and rotates the optical sample. 120 includes an optical signal firing collimator 106, an optical sample mount 130, and an optical signal receiving collimator 107.

At this time, the optical sample mounting unit 130 should be formed of a rotating stage and a sample holder so that the sample can be rotated.

Here, the optical signal firing collimator 106 irradiates the optical signal received from the optical signal splitter 101 to the optical sample mounting table 130, the optical signal receiving collimator 107 is the optical sample mounting table ( Passes the optical sample on the 130 and serves to receive the optical signal emitted from the optical signal firing collimator 160.

Meanwhile, at least one of the optical path between the optical signal splitter 101 and the optical signal firing collimator 106 and the optical path between the optical signal receiving collimator 107 and the optical signal combiner 102 is optical. It can be formed into a fiber.

Hereinafter, a method of measuring the refractive index of a sample using the refractive index measuring apparatus according to the first embodiment of the present invention will be described.

Refractive index measurement method according to a first embodiment of the present invention is the reference spectrum acquisition step (S110), the reference interference pattern acquisition step (S120), the reference phase difference calculation step (S130), the contrast interference pattern acquisition step (S140), the contrast phase difference calculation Step S150, fitting function determination step S160, and refractive index calculation step S170 are included.

First, in the reference spectrum acquisition step (S110), the spectrum output through the optical interferometer is measured while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample, and the wavelength is changed to frequency to obtain a frequency spectrum. .

In the reference interference fringe acquiring step (S120), the spectrum is normalized by using a fast Fourier transform and a Hilbert transform to obtain an interference fringe spectrum. In another method of normalizing the reference interference fringe acquiring step (S120), the optical interferometer is positioned in the same manner as the reference spectrum acquiring step (S110) with the angle of the optical sample positioned perpendicular to the optical axis of the beam proceeding to the sample. Blocks the passage of light by alternately blocking only one of the two arms, measures the spectrum of the unblocked arm, and then excludes these spectra from the spectrum obtained in the reference spectrum obtaining step (S120) to obtain a normalized interference pattern spectrum. Can be obtained.

In the reference phase difference calculation step (S130), a phase difference value according to frequency conversion is calculated from a frequency corresponding to a predetermined reference wavelength using the interference fringe spectrum obtained in the reference interference fringe acquisition step (S120).

In the contrast interference fringe acquisition step (S140), after measuring the spectrum passing through the optical interferometer in the state in which the optical sample is rotated, and after the same process as the reference interference fringe acquisition step to change the wavelength to frequency to obtain a frequency spectrum Next, normalize the interference fringe spectrum.

In the contrast phase difference calculation step (S150), the phase difference value according to the frequency change is calculated from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern acquisition step (S140).

In the fitting function determining step (S160), a phase difference value is data-fitted to each of the reference phase difference calculating step (S130) and the control phase difference calculating step (S150) to determine each fitting function.

Finally, in the refractive index calculation step S170, the reference phase difference value Φ (f) and the contrast phase difference at a frequency f corresponding to an arbitrary wavelength using the fitting function determined in the fitting function determination step S160. The value Ψ (f) is obtained, and the refractive index is calculated using the difference value Φ (f) -Ψ (f) between the reference phase difference value and the control phase difference value and Equation 17 below.

The measuring device according to the second embodiment of the present invention also has a basic configuration similar to the first embodiment of the light source 10, the optical interferometer 200, and the optical spectrum analyzer 20.

However, the measuring apparatus according to the second embodiment of the present invention has a structure using a bulk optical system instead of using an optical fiber element and an optical fiber path, and its basic configuration is similar to that of the first embodiment.

On the other hand, the measuring apparatus according to the second embodiment of the present invention may use a beam splitter as the optical signal splitter 201 for distributing the optical signal, and the beam combiner as the optical signal combiner 202 for combining the optical signals. Can be used.

The reference arm 210 includes a first rear reflector 203 for adjusting an optical path, a first refraction means 204 and a half-wave plate polarization controller 207 for adjusting polarization, and the sample arm 220 And a second rear reflector 205, a second refractive means 206, and a sample mount 130 for adjusting the optical path, and the first and second refractive means 204, 205 may be mirrors. .

In addition, one of the first and second rear reflectors 204 and 205 may be provided with a straight stage to change the position of the optical path and to measure the sample thickness.

Here, the first refraction means 204 refracts the optical signal distributed from the optical signal splitter 201 to be irradiated to the optical signal combiner 202, and adjusts the optical path length in the reference arm by moving the position. do.

The second refraction means 206 refracts the optical signal distributed from the optical signal distributor 201 to be irradiated to the optical signal combiner 202 through the optical sample on the optical sample mount 130.

Hereinafter, a method of measuring the refractive index of a sample using the refractive index measuring apparatus according to the second embodiment of the present invention will be described.

Refractive index measurement method according to a second embodiment of the present invention is a reference spectrum acquisition step (S210), a reference interference pattern acquisition step (S220), a reference phase difference calculation step (S230), a contrast interference pattern acquisition step (S240), a contrast phase difference It includes a calculation step (S250), fitting function determination step (S260) and refractive index calculation step (S270).

First, in the reference spectrum acquisition step (S210), the spectrum outputted through the optical interferometer is measured while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample, and the frequency is changed to a frequency to obtain a frequency spectrum. .

In the reference interference fringe acquisition step (S220), the reference spectrum is normalized using fast Fourier transform and Hilbert transform to obtain an interference fringe spectrum. As another method of normalizing in the reference interference fringe acquiring step (S220), the optical interferometer is disposed in a state in which the angle of the optical sample is perpendicular to the optical axis of the beam proceeding to the sample as in the reference spectrum acquiring step (S210). Blocks the passage of light by alternately blocking only one of the two arms, measures the spectrum of the unblocked arm, and then excludes these spectra from the spectrum obtained in the reference spectrum acquiring step (S210). Can be obtained.

The reference phase difference calculation step (S230) calculates a phase difference value according to frequency conversion from a frequency corresponding to a predetermined reference wavelength using the interference fringe spectrum obtained in the reference interference fringe acquisition step (S220).

In the contrast interference pattern acquisition step (S240), after measuring the spectrum passing through the optical interferometer in the state in which the optical sample is rotated, and after passing the same process as the reference interference pattern acquisition step to change the wavelength to frequency to obtain a frequency spectrum Next, normalize the interference fringe spectrum.

In the contrast phase difference calculation step (S250), the phase difference value according to the frequency change is calculated from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern acquisition step (S240).

In the fitting function determination step (S260), a phase difference value is data-fitted to each of the reference phase difference calculation step (S230) and the control phase difference calculation step (S250) to determine each fitting function.

Finally, in the refractive index calculation step (S270), a reference phase difference value and a contrast phase difference value at a frequency corresponding to a certain wavelength are obtained using the fitting functions determined in the fitting function determination step (S260), and the reference phase difference value and the The refractive index is calculated by the difference value between the control phase difference values and the following equation (17).

3 is a block diagram of a refractive index measuring apparatus according to a third embodiment of the present invention, Figure 4 is a block diagram of a refractive index measuring apparatus according to a fourth embodiment of the present invention. In more detail, FIG. 3 is a configuration diagram of a refractive index measurement apparatus of a Michelson interferometer structure using an optical fiber, and FIG. 4 is a configuration diagram of a refractive index measurement apparatus of a bulk Michelson interferometer structure.

The refractive index measuring apparatus according to the third and fourth embodiments of the present invention uses a Michelson interferometer, and as shown in FIGS. 3 and 4, the light source 10, the optical interferometers 300, 400, And an optical spectrum analyzer 20 and a vibration shielding film 30.

The optical interferometers 300 and 400 distribute optical signals from the reference arms 310 and 410 and the sample arms 320 and 420, and combine the two or more optical signals returned from the divided direction to mutually interfere with each other. / Coupling means 301, 401, which differs from the first and second embodiments described above in this respect.

First, the measurement apparatus according to the third embodiment of the present invention has a basic configuration of the light source 10, the optical interferometer 300 and the optical spectrum analyzer 20.

Here, the optical interferometer 300 further includes an optical signal distribution / combining means 301, a reference arm 310, and a sample arm 320.

The optical signal distribution / combining means 301 distributes the optical signals input from the light source 10 into two, and combines the two optical signals returned from the distributed direction to mutually interfere with each other.

The reference arm 310 reflects any one of the two divided optical signals and returns them to the optical signal distribution / combining means 301.

To this end, the reference arm 310 receives the optical signal from the optical signal distribution / combining means 301, outputs the received optical signal to the first reflector 305, and then from the first reflector 305. And an optical signal output / receive collimator 303 for receiving the reflected optical signal.

The sample arm 320 passes through the other one of the distributed optical signals to the optical sample on the optical sample mounting table 130 to be measured, and constitutes a page for rotating the optical sample, and distributes the optical signal to the optical signal. Return to the combining means 301, and output an interference fringe to the other input of the optical signal distribution / combining means 301.

To this end, the sample arm 320 outputs an optical signal from the optical signal distribution / combining means 301 as an optical sample on the optical sample mounting unit 130, and is transmitted through the optical sample and transmitted to the second reflector 306. The optical signal connection collimator 304 receives the optical signal reflected by the).

That is, in the refractive index measuring apparatus according to the third embodiment of the present invention, an optical fiber coupler may be used as the optical signal distribution / coupling means 301, and each of the first arms at the ends of the reference arm 310 and the sample arm 320 may be used. And second reflectors 305 and 306 are provided. In this embodiment, the optical signal from the light source 10 is divided into two signals through the optical fiber coupler, and each signal enters the reference arm 310 and the sample arm 320. At this time, two collimators 303 and 304, that is, an optical signal output / receive collimator 303 and an optical signal connection collimator 304, are used at the ends of the optical fiber in each arm, where a parallel beam exits into the air. Each beam is reflected back by the two reflectors at each end of the arm, namely the first reflector 305 and the second reflector 306, through the optical collimator again to the optical signal distribution / combining means 301 or optical fiber Return to the coupler to form an interfering optical signal. In this case, the beam passes through the air in the reference arm 310, and the sample arm 320 passes through the sample in the sample mounting unit 130 that can rotate. In the optical interferometer 300 of the refractive index measuring apparatus according to the third embodiment of the present invention, one of the two reflectors, that is, the first and second reflectors 305 and 306, has a straight stage for adjusting the optical path and measuring the thickness of the sample. Install. In addition, a polarization controller 302 is provided to increase the visibility of the interference fringe. At this time, the polarization controller 302 is preferably a half-wave plate polarization controller is used.

Hereinafter, a method of measuring the refractive index of a sample using the refractive index measuring apparatus according to the third embodiment of the present invention will be described.

Refractive index measurement method according to a third embodiment of the present invention is the reference spectrum acquisition step (S310), the reference interference pattern acquisition step (S320), the reference phase difference calculation step (S330), the contrast interference pattern acquisition step (S340), the contrast phase difference calculation A step S350, a fitting function determination step S360, and a refractive index calculation step S370 are included.

First, the reference spectrum acquisition step (S310) measures the spectrum output through the optical interferometer while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample, and the frequency spectrum is changed by changing the wavelength to frequency Get

In the reference interference fringe acquisition step (S320), the spectrum is normalized by using a fast Fourier transform and a Hilbert transform to obtain an interference fringe spectrum.

In the reference phase difference calculation step (S330), a phase difference value according to frequency conversion is calculated from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the reference interference pattern acquisition step (S320).

In the contrast interference fringe acquiring step (S340), the spectrum passing through the optical interferometer is measured while the optical sample is rotated, and after passing through the same process as the reference interference fringe acquiring step (S320), the wavelength is changed to frequency. Obtain the frequency spectrum and then normalize to find the interference fringe spectrum.

In the contrast phase difference calculation step (S350), a phase difference value according to a frequency change is calculated from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern acquisition step (S340).

The fitting function determining step (S360) determines a fitting function by fitting a phase difference value to each of the reference phase difference calculating step (S330) and the control phase difference calculating step (S350).

Lastly, in the refractive index calculation step S370, a reference phase difference value and a control phase difference value at a frequency corresponding to an arbitrary wavelength are obtained using the fitting functions determined in the fitting function determination step S360, and the reference phase difference value and The refractive index is calculated using the difference value between the control phase difference values and Equation 18 below.

The measuring device according to the fourth embodiment of the present invention also has a basic configuration similar to the third embodiment of the light source 10, the optical interferometer 400, and the optical spectrum analyzer 20.

However, instead of using the optical fiber element and the optical fiber path, the measuring device according to the fourth embodiment of the present invention has a bulk Michelson interferometer structure and its basic configuration is similar to that of the third embodiment.

Meanwhile, in the fourth embodiment, an optical splitter is used as the optical signal distribution / combining means 401, and two reflectors, that is, the third reflector 403 and the fourth, at the ends of the reference arm 410 and the sample arm 420. Reflector 404 is provided. In the fourth embodiment, the optical signal from the light source 10 is divided into two signals through an optical splitter, and each signal enters the reference arm 410 and the sample arm 420. The beams are reflected back by two reflectors at the ends of both arms, i.e., the third reflector 403 and the fourth reflector 404, thereby interfering with each other through the optical splitter to form an interfering optical signal. At this time, the beam passes through the air in the reference arm 410, and the sample arm 420 passes through the sample in the sample mounting unit 130 that can be rotated. In the fourth embodiment, one of the third and fourth reflectors 403 and 404 is provided with a straight stage for adjusting the optical path and measuring the thickness of the sample. In addition, a plate wavelength polarization controller 402 is provided to increase the visibility of the interference fringe. The interference fringes thus generated can be analyzed using the optical spectrum analyzer 20.

Hereinafter, a method of measuring the refractive index of a sample using the refractive index measuring apparatus according to the fourth embodiment of the present invention will be described.

Refractive index measurement method according to a fourth embodiment of the present invention is the reference spectrum acquisition step (S410), the reference interference pattern acquisition step (S420), the reference phase difference calculation step (S430), the contrast interference pattern acquisition step (S440), the contrast phase difference calculation Step S450, fitting function determination step S460 and refractive index calculation step S470 are included.

First, the reference spectrum acquisition step (S410) measures the spectrum output through the optical interferometer in a state where the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample, and the frequency spectrum is changed by changing the wavelength to frequency Get

In the reference interference fringe acquiring step (S420), as in the reference spectrum acquiring step (S410), only one of two arms of the optical interferometer is positioned in a state in which the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample. After blocking alternately to block the passage of light and measuring the spectrum of the unblocked arm, these spectra are normalized by excluding these spectra from the spectra obtained in the reference spectrum acquisition step to obtain an interference fringe spectrum.

The reference phase difference calculation step S430 calculates a phase difference value according to frequency conversion from a frequency corresponding to a predetermined reference wavelength using the interference fringe spectrum obtained in the reference interference fringe acquisition step S420.

The contrast interference fringe acquisition step (S440) measures the spectrum passing through the optical interferometer in the state that the optical sample is rotated, and after the same process as the reference interference fringe acquisition step (S420), the wavelength as a frequency In turn, the frequency spectrum is obtained and then normalized to obtain an interference fringe spectrum.

The contrast phase difference calculating step (S450) calculates a phase difference value according to a frequency change from a corresponding frequency at a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern acquisition step (S440).

The fitting function determining step (S460) determines a fitting function by fitting a phase difference value to each of the reference phase difference calculating step (S430) and the control phase difference calculating step (S450).

Finally, the refractive index calculation step (S470) calculates a reference phase difference value and a control phase difference value at a frequency corresponding to a certain wavelength by using the fitting functions determined in the fitting function determination step (S460), and the reference phase difference value and The refractive index is calculated by the difference value between the control phase difference values and the following equation (18).

5 to 7 show a detailed illustration of the sample mounting table 130, which shows the structure according to the type of sample and the optical path in the sample.

In more detail, FIG. 5 is a diagram illustrating an optical path in a sample in the case of a bulk single solid optical sample, and FIG. 6 is a diagram illustrating an optical path in a substrate and a thin film optical sample in the case of a thin film optical sample, and FIG. In the case of a liquid sample, it is a figure for demonstrating the optical path in a liquid container and a liquid optical sample.

In the case of the bulk sample of FIG. 5, in FIG. 5, the points 130-1 and 130-2, the sample 130-3, and the optical path 130-in the sample indicate arbitrary positions in the air before and after the sample. 4) and symbols for physical quantities required for calculation.

In the case of FIG. 6, a material on which a refractive index is to be measured is coated with a thin film on a substrate (Substrate) already known or measured in advance.

Here, the structure is used when measuring the refractive index of the thin film, the coating material (130-7), the substrate (130-8), the optical path (130-5) in the coating material, the optical path (130-6) in the substrate ) And the symbols used for physical quantities are indicated.

In FIG. 7, a container capable of containing a liquid made of a material that is already known or measured in advance of refractive index and a liquid refractive index measuring structure of a liquid sample contained in the container are shown. In particular, as the structure for measuring the refractive index of the liquid is shown the container material (130-9, 130-11) containing the liquid and the liquid (130-10) in the container, the symbol used as a physical fragrance is also shown.

Hereinafter, a method of measuring refractive index of an optical sample according to the present invention will be described in more detail by using the following equations. Hereinafter, based on the Mach-Zehnder interferometer of the refractive index measuring apparatus according to the first embodiment of the present invention shown in FIG.

First, the intensity of the optical signal measured by the optical spectrum analyzer 20 in which the optical signal emitted from the light source 10 has passed through the reference arm 110 and the sample arm 120 of the optical interferometer 100 is It can be expressed as Equation 1 below.

Here, E _A and E _B represent the magnitude of the electric field according to the wavelength of the optical signals passing through the reference arm 110 and the sample arm 120, respectively. In addition, E _O represents the electric field amplitude of the optical signal traveling to the reference arm 110, a a of the optical signal proceeding to the sample arm 120 for the electric field amplitude of the optical signal proceeding to the reference arm 110 It represents the relative ratio of the electric field amplitude.

On the other hand, the phase difference (Φ) of the optical signals passing through each arm can be expressed as shown in Equation 2 below.

Where OPL _{R .A.} And OPL _{S .A.} Are the optical path lengths of the reference and sample arms, respectively. In particular, the optical path length of the sample arm is influenced by the angle at which the beam is incident on the sample, and the length can be expressed by Equation 3 below.

Here, the symbols are shown in Figure 5, where d 'represents the optical path length in the sample, labeled 130-4, and n _o represents the refractive index of air. In addition, in the case of measuring the refractive index of the thin film OPL _{S .A.} Can be expressed as Equation 4 below.

Here, the symbols are shown in FIG. 6, and d ' _c and d' _s are denoted by 130-5 and 130-6, respectively. In addition, n _c and n _s represent the refractive index of the thin film and the refractive index of the substrate.

In addition, in the case of FIG. 7 for measuring the refractive index of the liquid, the order of the layers does not affect the result, so the liquid layer 130-10 is positioned in front of the thin film. Consider by assumption. In this case, since 130-9 and 130-11 are the same material, it can be regarded as one layer and calculated, and the same as in the case of a thin film. On the other hand, as shown in Equation 4, the optical path length can be expressed as shown in Equation 5 below.

Here, symbols are shown in FIG. 7, and d ' ₁ , d' ₂ , and d ' ₃ correspond to thicknesses of 130-9, 130-10, and 130-11, respectively. In addition, n _1, n _x represents a refractive index of each of the liquid container with liquid.

First, in the case of FIG. 5, Equation 3 is summarized using Snell's law. In this case, Snell's law can be expressed as Equation 6 below.

Here, n _o represents the refractive index of the air, Equation 6 may be represented by Equation 7 below, and d 'and D may be expressed as Equation 8 and Equation 9 below.

Here, the following equation (10) can be obtained by substituting the equation (8) and the equation (9) into the equation (3).

In this case, when the angle of the sample is changed from θ ₁ to θ ₂ , the optical path length is changed. As a result, the phase difference between the reference arm and the sample arm is changed to change the interference fringe. In this case, the amount of change in the optical path length may be expressed by Equation 11 below.

Similarly, in the case of FIG. 6, the optical path length may be expressed by Equation 12.

Here, since the part related to the substrate is a constant, it was replaced with C. In this case, the amount of change in the length of the optical path may be represented by Equation 13 below.

7, the length of the optical path may be expressed by Equation 14 below, and the amount of change in the optical path length may be expressed by Equation 15 below. Almost the same.

Here, since the container portion containing the liquid is a constant, it is replaced with C. In this case, the amount of change in the optical path length may be expressed by Equation 15 below.

On the other hand, the change in the optical path length in Equations 11, 13 and 15 changes the phase difference of the interferometer. In this case, when the phase when θ ₁ is Φ and the phase when θ ₂ is Ψ, and the phase difference is expressed using the amount of change in the optical path length, it can be expressed by Equation 16 below.

Where C ₁ And C ₂ may be 0 in FIG. 5, and d may be a thickness of a bulk sample or a thickness of a thin film and a thickness of a liquid sample. If Equation 16 is summarized with respect to the refractive index n, it may be expressed as Equation 17 below.

Here again, C ₁ and C ₂ become 0 in the case of FIG. 5.

On the other hand, in the case of a birefringent sample, the same result as in Equation 17 is obtained. However, as described above, some pretreatment is required. In this case, when the beam polarization state incident on the sample does not exactly coincide with the birefringence axis, the spectrum due to the normal refractive index and the abnormal refractive index appears at the same time. The previous method measures the spectrum by matching the polarization of the beam to each axis by using a polarizer, but the present invention proposes a structure that can measure the two refractive indices in a simple measurement by not using a polarizer. .

In this method, a fast Fourier transform and an inverse transform are used. When the fast Fourier transform is taken, two oscillation periods for a double interference fringe according to birefringence can be obtained. Each of the double interference fringes is separated using a band pass filter, and a set of spectra of the normal refractive index before rotation and a set of the normal refractive index after the rotation is also set as one set. do.

Each of these sets is substituted into Equation 17 to calculate the normal refractive index and the abnormal refractive index. Here, C ₁ and C ₂ also become 0 in the case of FIG.

In the above, the case of the Mach-Zehnder interferometer of FIGS. 1 and 2 has been described, and modified equations are required in the case of the Michelson interferometer of FIGS. 3 and 4. The Michelson interferometer doubles the path of the beam in the sample compared to the Mach-Zehnder interferometer. Therefore, deformation of the above equations occurs, and the equation regarding the optical path length in the sample may be changed twice. Accordingly, Equation 17 may be expressed as Equation 18 below.

Here, C ₁ and C ₂ become 0 in the case of FIG.

As described above with reference to the drawings illustrating a refractive index measuring apparatus and method based on a white light interferometer according to the present invention, the present invention is not limited by the embodiments and drawings disclosed herein, of the present invention Of course, various modifications may be made by those skilled in the art within the scope of the technical idea.

1 is a block diagram of a refractive index measuring apparatus according to a first embodiment of the present invention.

2 is a block diagram of a refractive index measuring apparatus according to a second embodiment of the present invention.

3 is a block diagram of a refractive index measuring apparatus according to a third embodiment of the present invention.

4 is a configuration diagram of an apparatus for measuring refractive index according to a fourth embodiment of the present invention.

FIG. 5 is a view for explaining an optical path in a sample in the case of a bulk single solid optical sample, FIG. 6 is a view for explaining an optical path in a substrate and a thin film optical sample in the case of a thin film optical sample, and FIG. This is for explaining the optical path in the liquid container and the liquid optical sample.

8 and 9 are graphs showing examples of the interference fringe spectrum measured by the refractive index measurement apparatus according to the first embodiment of the present invention and normalized by using the fast Fourier transform and the Hilbert transform.

10 is a graph illustrating an example of refractive index measurements of optical samples measured using the refractive index measuring apparatus according to the first embodiment of the present invention.

Claims (26)

A light source 10 for outputting an optical signal of multiple wavelengths; Optical signal distributors 101 and 201 for distributing the optical signals input from the light source 10 into two, reference arms 110 and 210 for receiving any one of the optical signals distributed through the optical signal distributors 101 and 201, and the optical signal Sample arms 120 and 220, the reference arms 110 and 210, and the samples constituting a stage capable of receiving the other of the optical signals distributed through the distributors 101 and 201 and passing them to the optical sample to be measured and rotating the optical sample. An optical interferometer (100,200) including optical signal combiners (102,202) for combining and interfering optical signals output through the arms (120,220); And Refractive index measuring apparatus characterized in that it comprises an optical spectrum analyzer (20) for analyzing the spectrum by receiving the optical signal interfered by the optical interferometer (100,200). The method according to claim 1, The reference arm 110, An optical signal output collimator (104) for outputting the optical signal received from the optical signal distributor (101) into the air; And An optical signal receiving collimator (105) for receiving an optical signal output from the optical signal output collimator (104); Including; At least one of the optical path between the optical signal splitter 101 and the optical signal output collimator 104 and the optical path between the optical signal receiver collimator 105 and the optical signal combiner 102 is formed of optical fibers. Refractive index measuring device characterized in that. The method according to claim 2, The sample arm 120, An optical signal firing collimator (106) for irradiating the optical signal received from the optical signal distributor (101) to the optical sample mounting table (130); And An optical signal receiving collimator 107 which receives the optical signal emitted from the optical signal firing collimator 106 by passing the optical sample on the optical sample mounting table 130; Including; At least one of the optical path between the optical signal splitter 101 and the optical signal firing collimator 106 and the optical path between the optical signal receiving collimator 107 and the optical signal combiner 102 is an optical fiber. Refractive index measuring device, characterized in that formed. The method of claim 3, An optical path provided between the optical signal splitter 101 and the optical signal output collimator 104 or between the optical signal receiving collimator 105 and the optical signal combiner 102 and traveling on these optical paths A refractive index measuring device, characterized in that the polarization controller 103 for adjusting the polarization direction of the signal is provided. The method according to claim 1, The reference arm 210 refracts the optical signal distributed from the optical signal distributor 201 to be irradiated to the optical signal combiner 202, and adjusts the optical path length in the reference arm by moving the position. Means 204; Including, The sample arm 220 refracts the optical signal distributed from the optical signal splitter 201 so as to irradiate the optical signal combiner 202 through the optical sample on the optical sample mounting unit 130. 206; Refractive index measuring apparatus comprising a. The method according to claim 5, A half-wave plate polarization controller (207) for adjusting the polarization direction of the optical signal in the optical path between the first refractive means (204) and the optical signal combiner (202). The method according to claim 1, The sample arm (120, 220) is a refractive index measuring device, characterized in that it comprises a sample coated with a thin film of the material to be measured on the refractive index pre-measured substrate. The method according to claim 1, The sample arm (120, 220) is a refractive index measuring device, characterized in that it comprises a container that can contain a liquid consisting of a material whose refractive index is measured in advance and the liquid sample contained in the container. The method according to claim 1, Refractive index measurement apparatus characterized in that the outer surface of the optical interferometer (100,200) is provided with a vibration blocking film 30 for blocking the influence of external vibration. A light source 10 for outputting an optical signal of multiple wavelengths; Optical signal distribution / combining means (301, 401) for distributing the optical signal input from the light source 10 into two, combining the two optical signals returned from the distributed direction, and interfering with each other; The other of the reference arms 310 and 410, the distributed optical signal, which reflects and returns to the optical signal distribution / combining means 301 and 401, can be passed through the optical sample on the optical sample mount 130 to be measured and rotate the optical sample. A sample arm (320, 420) constituting a stage, and returning an optical signal to the optical signal distribution / combining means (301, 401) and outputting an interference fringe to the other input of the optical signal distribution / combining means (301, 401). Optical interferometers 300 and 400; And An optical spectrum analyzer 20 for receiving an optical signal interfered with the optical interferometer (300, 400) and analyzing an optical spectrum for analyzing a spectrum; Refractive index measuring apparatus comprising a. The method according to claim 10, The reference arm 310 receives an optical signal from the optical signal distribution / combining means 301, outputs the received optical signal to the first reflector 305, and then reflects the optical signal from the first reflector 305. An optical signal output / receive collimator 303 for receiving the received optical signal, The sample arm 320 outputs an optical signal from the optical signal distribution / combining means 301 as an optical sample on the optical sample mounting unit 130, is transmitted through the optical sample and transmitted to the second reflector 306. An optical signal connection collimator 304 which receives the optical signal reflected by Optical path between the optical signal distribution / combining means 301 and the optical signal output / receiving collimator 303 and optical path between the optical signal distribution / combining means 301 and the optical signal connection collimator 304 At least one of the refractive index measuring apparatus characterized in that consisting of optical fibers. The method of claim 11, Refractive index measurement, characterized in that the polarization controller 302 for adjusting the polarization direction of the optical signal traveling on the optical path between the optical signal splitter 301 and the optical signal output / reception collimator 303 is provided. Device. The method according to claim 12, The first reflector 305 reflects any one of the optical signals distributed from the optical signal distributing / combining means 301 and returns it to the optical signal distributing / combining means 301, and moves the reference arm through positional movement. Refractive index measuring apparatus characterized in that for adjusting the optical path length at (310). The method according to claim 10, The sample arms 320 and 420 may include a sample coated with a thin film of a material on which a refractive index is to be measured on a substrate having a refractive index measured in advance. The method according to claim 10, The sample arm (320, 420) is a refractive index measuring device characterized in that it comprises a container that can contain a liquid consisting of a material whose refractive index is measured in advance and the liquid sample contained in the container. The method according to claim 10, Refractive index measurement apparatus characterized in that the outer surface of the optical interferometer (300, 400) is provided with a vibration blocking film 30 for blocking the influence of external vibration. A reference spectrum obtaining step of measuring a spectrum output through an optical interferometer and converting a wavelength into a frequency to obtain a frequency spectrum while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample; Obtaining a reference interference pattern for normalizing the spectrum by using a fast Fourier transform and a Hilbert transform to obtain an interference pattern spectrum; A reference phase difference calculation step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference fringe spectrum obtained in the reference interference fringe acquisition step; Contrast interference which measures the spectrum passing through the optical interferometer while the optical sample is rotated, goes through the same process as the reference interference fringe acquiring step, obtains the frequency spectrum by converting the wavelength to frequency, and then normalizes to obtain the interference fringe spectrum Pattern acquisition step; A contrast phase difference calculating step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern obtaining step; A fitting function determining step of determining a fitting function by fitting a phase difference value to each of the reference phase difference calculating step and the control phase difference calculating step; And The reference phase difference value and the control phase difference value at a frequency corresponding to an arbitrary wavelength are obtained by using the fitting functions determined in the singer fitting function determination step, and the difference between the reference phase difference value and the control phase difference value and Equation 17 below. A refractive index calculating step of calculating a refractive index by using; Refractive index measurement method based on a white light interferometer comprising a. [Equation 17]

A reference spectrum obtaining step of measuring a spectrum output through the optical interferometer and obtaining a frequency spectrum by converting a wavelength into a frequency while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample; In the same manner as in the reference spectrum acquisition step, the light is blocked by alternately blocking only one of the two arms of the optical interferometer while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample. A reference interference fringe acquiring step of obtaining an interference fringe spectrum by normalizing the spectrum after removing the spectra from the spectra obtained in the reference spectrum acquiring step; A reference phase difference calculation step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference fringe spectrum obtained in the reference interference fringe acquisition step; Contrast interference which measures the spectrum passing through the optical interferometer while the optical sample is rotated, goes through the same process as the reference interference fringe acquiring step, obtains the frequency spectrum by converting the wavelength to frequency, and then normalizes to obtain the interference fringe spectrum Pattern acquisition step; A contrast phase difference calculating step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern obtaining step; A fitting function determining step of determining a fitting function by fitting a phase difference value to each of the reference phase difference calculating step and the control phase difference calculating step; And Using the fitting functions determined in the fitting function determination step, a reference phase difference value and a control phase difference value at a frequency corresponding to an arbitrary wavelength are obtained, and the difference between the reference phase difference value and the control phase difference value and the following equation (17): Refractive index calculation step of calculating the refractive index by; Refractive index measurement method based on a white light interferometer comprising a. [Equation 17]

The method according to claim 17 or 18, A transmission length adjusting step of adjusting an optical signal transmission length of a reference arm before the reference spectrum obtaining step or the control spectrum obtaining step; Refractive index measurement method based on a white light interferometer, characterized in that it further comprises. The method of claim 19, The transmission length adjusting step is a refractive index measurement method based on a white light interferometer, characterized in that for adjusting the optical signal transmission length of the reference arm so that the visibility of the interference fringe is the greatest. The method of claim 20, If the optical sample has a birefringence, Adjusting the polarization of the optical signal irradiated to the optical sample and the optical signal transmission length of the reference arm so that the double interference fringe is measured; An interpolation step of interpolating the spectra obtained in the reference spectrum acquisition step and the control spectrum acquisition step to obtain a spectrum of constant intervals; An interference fringe discrimination step of dividing the interference fringes for the normal and abnormal refractive beams from the interpolated spectrum by using Fourier transform, filtering, and inverse Fourier transform processes; Refractive index measurement method based on a white light interferometer, characterized in that it further comprises. A reference spectrum obtaining step of measuring a spectrum output through an optical interferometer in a state where the angle of the optical sample is perpendicular to the optical axis of the beam proceeding to the sample, and converting the wavelength into a frequency to obtain a frequency spectrum; Obtaining a reference interference pattern for normalizing the spectrum by using a fast Fourier transform and a Hilbert transform to obtain an interference pattern spectrum; A reference phase difference calculation step of calculating a phase difference value according to frequency conversion from a frequency corresponding to a predetermined reference wavelength by using the interference pattern spectrum obtained in the reference interference fringe obtaining step; The spectrum is measured by passing through the optical interferometer in the state in which the optical sample is rotated, and after the same process as the reference interference fringe acquisition step, the wavelength is changed to frequency to obtain a frequency spectrum and then normalized to obtain the interference fringe spectrum Interference pattern obtaining step; A contrast phase difference calculation step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern acquisition step; A fitting function determining step of fitting the phase difference values to each of the reference phase difference calculating step and the control phase difference calculating step to determine respective fitting functions; And Using the fitting functions determined in the fitting function determination step, a reference phase difference value and a control phase difference value at a frequency corresponding to a certain wavelength are obtained, and the difference between the reference phase difference value and the control phase difference value and the following Equation 18 A refractive index calculating step of calculating a refractive index by using; Refractive index measurement method based on a white light interferometer comprising a. Equation 18

A reference spectrum obtaining step of measuring a spectrum output through an optical interferometer in a state where the angle of the optical sample is perpendicular to the optical axis of the beam proceeding to the sample, and converting the wavelength into a frequency to obtain a frequency spectrum; As in the step of obtaining the reference spectrum, while the angle of the optical sample is located perpendicular to the optical axis of the beam proceeding to the sample, only one of the two arms of the optical interferometer is alternately blocked to block the light passage, A reference interference fringe acquisition step of obtaining an interference fringe spectrum by normalizing the spectrum after removing the spectrum from the spectrum obtained in the reference spectrum acquisition step after measuring the spectrum of the arm; A reference phase difference calculation step of calculating a phase difference value according to frequency conversion from a frequency corresponding to a predetermined reference wavelength by using the interference pattern spectrum obtained in the reference interference fringe obtaining step; After measuring the spectrum passing through the optical interferometer in the state that the optical sample is rotated, and after the same process as the step of obtaining the reference interference fringe, the frequency spectrum is obtained by changing the wavelength to frequency and then normalized to obtain the interference fringe spectrum Contrast interference fringe acquisition step; A contrast phase difference calculating step of calculating a phase difference value according to a frequency change from a frequency corresponding to a predetermined reference wavelength using the interference pattern spectrum obtained in the contrast interference pattern obtaining step; A fitting function determining step of fitting the phase difference values to each of the reference phase difference calculating step and the control phase difference calculating step to determine respective fitting functions; And Using the fitting functions determined in the fitting function determination step, a reference phase difference value and a contrast phase difference value at a frequency corresponding to an arbitrary wavelength are obtained, and a difference value between the reference phase difference value and the control phase difference value and A refractive index calculating step of calculating a refractive index by; Refractive index measurement method based on a white light interferometer comprising a. Equation 18

The method according to claim 22 or 23, A transmission length adjusting step of adjusting an optical signal transmission length of a reference arm before the reference spectrum obtaining step or the control spectrum obtaining step; Refractive index measurement method based on a white light interferometer, characterized in that it further comprises. 27. The method of claim 24, The transmission length adjusting step is a refractive index measurement method based on a white light interferometer, characterized in that for adjusting the optical signal transmission length of the reference arm so that the visibility of the interference fringe is the greatest. 27. The method of claim 24, If the optical sample has a birefringence, Adjusting the polarization of the optical signal irradiated to the optical sample and the optical signal transmission length of the reference arm so that the double interference fringe is measured; An interpolation step of interpolating the spectra obtained in the reference spectrum acquisition step and the control spectrum acquisition step to obtain a spectrum of constant intervals; An interference fringe discrimination step of dividing the interference fringes for the normal and abnormal refractive beams from the interpolated spectrum by using Fourier transform, filtering, and inverse Fourier transform processes; Refractive index measurement method based on a white light interferometer, characterized in that it further comprises.

Images