KR20100076766A - Delay locked loop circuit - Google Patents
Delay locked loop circuit Download PDFInfo
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- KR20100076766A KR20100076766A KR1020080134928A KR20080134928A KR20100076766A KR 20100076766 A KR20100076766 A KR 20100076766A KR 1020080134928 A KR1020080134928 A KR 1020080134928A KR 20080134928 A KR20080134928 A KR 20080134928A KR 20100076766 A KR20100076766 A KR 20100076766A
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- delay
- clock
- signal
- lock
- delay lock
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- 230000003111 delayed effect Effects 0.000 claims description 17
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- 238000012937 correction Methods 0.000 claims description 8
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 6
- 238000012546 transfer Methods 0.000 claims description 6
- 230000004913 activation Effects 0.000 claims description 4
- 238000004904 shortening Methods 0.000 claims 2
- 239000004065 semiconductor Substances 0.000 abstract description 18
- 238000010586 diagram Methods 0.000 description 12
- 230000001360 synchronised effect Effects 0.000 description 12
- 230000008859 change Effects 0.000 description 6
- 101100286980 Daucus carota INV2 gene Proteins 0.000 description 4
- 101100397045 Xenopus laevis invs-b gene Proteins 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 3
- 230000003247 decreasing effect Effects 0.000 description 2
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- 101100508840 Daucus carota INV3 gene Proteins 0.000 description 1
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/406—Management or control of the refreshing or charge-regeneration cycles
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
- G11C11/4076—Timing circuits
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/22—Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management
- G11C7/222—Clock generating, synchronizing or distributing circuits within memory device
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2272—Latency related aspects
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/081—Details of the phase-locked loop provided with an additional controlled phase shifter
- H03L7/0812—Details of the phase-locked loop provided with an additional controlled phase shifter and where no voltage or current controlled oscillator is used
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Abstract
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a delay locked loop circuit of a semiconductor device. A timing pulse generator for generating a timing pulse, a phase comparator for receiving the source clock and a feedback clock at a time defined by the timing pulse, and comparing the phases, and a time defined by the timing pulse The delay amount is adjusted in response to the output signal of the phase comparator, and the phase delay unit receives the source clock to delay the phase and outputs the delay locked clock, and the delay delay of the actual output path. A delay model unit for outputting the feedback clock while reflecting time; and A delay locked loop circuit including an operation control unit for controlling on / off operation of the timing pulse generator, the phase comparator, and the delay model unit in response to a delay lock signal and a refresh period signal is provided.
Description
BACKGROUND OF THE
Synchronous semiconductor memory devices such as DDR SDRAM (Double Data Rate Synchronous DRAM) transfer data with external devices using an internal clock synchronized with an external clock input from an external device such as a memory controller (CTRL).
This is because, in order to stably transfer data between the memory and the memory controller, the time synchronization between the external clock and the data output from the memory is very important.
At this time, the data output from the memory is output in synchronization with the internal clock. When the internal clock is initially applied to the memory, the internal clock is applied in synchronization with the external clock, but is delayed through each component in the memory and output to the outside of the memory. If it does, it is output out of sync with external clock.
Therefore, for stable transmission of data output from the memory, the delayed internal clock is accurately positioned at the edge or center of the external clock applied by the memory controller while passing through each component in the memory transmitting the data. To do this, the time the data is on the bus must be compensated back to the internal clock so that the internal and external clocks are synchronized.
Clock synchronizing circuits that perform this role include a phase locked loop (PLL) circuit and a delay locked loop (DLL) circuit.
Of these, when the frequency of the external clock and the internal clock are different, the frequency-locking function should be used. Therefore, a phase locked loop (PLL) is used. However, when the frequency of the external clock is the same as the frequency of the internal clock, a delayed fixed loop (DLL) circuit that can be implemented in a relatively small area is mainly used compared to the phase locked loop (PLL).
That is, in the case of the semiconductor memory device, since the frequency used is the same, a delay locked loop (DLL) circuit is mainly used as the clock synchronization circuit.
In particular, the semiconductor memory device includes a register for storing a fixed delay value, and when the power is turned off, the fixed delay value is stored in the register, and when the power is applied again, the internal clock is fixed by loading the fixed delay value stored in the register. In this case, the clock synchronization operation can be performed when the phase difference between the internal clock and the external clock is relatively small during the initial operation of the semiconductor memory device, and the delay value of the register according to the phase difference between the internal clock and the external clock even after the initial operation The most widely used register controlled delayed loop circuit is to adjust the fluctuation width to reduce the time it takes for the internal and external clocks to synchronize.
1 is a block diagram showing a general register controlled delay locked loop (DLL) circuit.
Referring to FIG. 1, a
Here, the
Referring to the operation of the register-controlled delayed fixed loop (DLL) circuit according to the prior art based on the above configuration as follows.
First, a state immediately before the delay lock loop (DLL) circuit performs the delay lock operation is performed. In the state based on the source clock CLK_IN, the delay lock clock DLL_CLK sets the source clock CLK_IN to the phase delay unit ( The delay time is delayed by a time corresponding to the initial delay amount of 160, and the feedback clock F_CLK is delayed by the delay lock clock DLL_CLK by the delay time of the actual output path defined in the
In this state, the delay lock operation of the delay lock loop (DLL) circuit for synchronizing the phases of the source clock CLK_IN and the feedback clock F_CLK is performed. It is divided into actions.
First, the initialization delay lock operation is an operation performed when the delay lock loop (DLL) circuit performs the delay lock operation for the first time. Therefore, the reference edge of the source clock CLK_IN-which generally indicates a rising edge and can be a falling edge-is unconditionally located ahead of the reference edge of the feedback clock F_CLK. The phase of the source clock CLK_IN and the feedback clock F_CLK may be synchronized by increasing the delay amount of the
After the initialization, the delay lock operation is performed even if the phases of the source clock CLK_IN and the feedback clock F_CLK are synchronized through the initialization delay lock operation. The source clock CLK_IN and the feedback clock F_CLK may be out of phase again due to a change in the surrounding environment, such as a change in the potential level of the power supply voltage VDD, and the source clock CLK_IN and the feedback are corrected again. This operation is performed to synchronize the phase of the clock F_CLK. Therefore, it is impossible to predict whether the reference edge of the feedback clock F_CLK is located in front of or behind the reference edge of the source clock CLK_IN, and the operation of increasing or decreasing the delay amount of the
Specifically, the components in the delay locked loop (DLL) circuit operate as follows to synchronize the phases of the source clock CLK_IN and the feedback clock F_CLK, whether the initialization delay lock operation or the delay lock operation after initialization is performed as follows.
First, the
In addition, the
At this time, the comparison signal COMPP_SIG of the signals COMPP_SIG and LOCK_STATE output from the
That is, if the delay amount of the
On the other hand, the initialization of the delay locked loop (DLL) circuit is generally performed for the first time when the power is supplied to the semiconductor device, and for resetting the delay locked loop (DLL) circuit. In this case, the self-refreshing operation resets the delay lock loop (DLL) circuit.
On the other hand, after the initialization of the delay locked loop (DLL) circuit, the delay lock operation may be performed by changing the temperature of the semiconductor device or the potential level of the power supply voltage VDD supplied to the semiconductor device according to the operation of the semiconductor device. Since the operation is performed in case the phase of the source clock CLK_IN and the feedback clock F_CLK are changed again due to the change, the operation is always performed in the remaining sections other than the section in which the initialization delay lock operation is performed.
That is, in the case of a semiconductor device including a delay locked loop (DLL) circuit according to the related art, an operation mode for resetting a delay locked loop (DLL) circuit including a self-refresh operation may be performed in a state in which power is supplied. Other than-indicates that either the delay delay operation or the delay lock operation after initialization is performed.
By the way, while the delay lock operation is performed, current is continuously consumed inside the delay lock loop (DLL) circuit, and the long duration of the delay lock operation means that a large amount of current is consumed. .
In particular, in the case of a semiconductor device used in a mobile device, since the current consumption is greater than the performance of the semiconductor device, a delay locked loop (DLL) circuit that maintains a long duration of delay delay operation as in the prior art is used in a mobile device. When included in the semiconductor device to be used, there is a problem that the current consumption of the delayed fixed loop (DLL) circuit is too large compared to the total current consumption of the semiconductor device.
Therefore, there is a problem in that it is difficult to apply a delay locked loop (DLL) circuit as in the prior art to a semiconductor device used in a mobile device.
SUMMARY OF THE INVENTION The present invention has been proposed to solve the above problems in the prior art, and an object thereof is to provide a delay locked loop (DLL) circuit that consumes a relatively small amount of current by performing a delay locked operation only in a predetermined section. .
According to an aspect of the present invention for achieving the above object to be solved, a delay for outputting a delay locked loop clock by comparing the phase of the source clock and the feedback clock to give a delay value that is fixed to the source clock Fixed loop; And a control unit for controlling a delay correction operation of the delay lock loop in response to the refresh period signal after delay lock.
According to another aspect of the present invention for achieving the above object to be solved, the step of comparing the phase of the source clock and the feedback clock to give a delay value that is fixed to the source clock outputting a delay locked loop clock; And controlling the clock path of the delay locked loop to disable the delay correction operation of the delay locked loop during the non-refresh interval after the delay lock.
According to another aspect of the present invention for achieving the above object, a buffering unit for generating a source clock by buffering the clock applied from the outside; A timing pulse generator for generating a timing pulse that is activated at a predetermined number of times at a predetermined time point in response to the source clock at a predetermined time; A phase comparator configured to receive the source clock and the feedback clock at a time defined by the timing pulse and compare phases thereof; A phase delay unit configured to adjust a delay amount corresponding to an output signal of the phase comparison unit at a time point defined by the timing pulse, receive the source clock, delay the phase, and output the delayed clock as a delay locked clock; A delay model unit for receiving the delay lock clock and outputting the delay clock of the actual output path as the feedback clock; And an operation control unit for controlling on / off operation of the timing pulse generator, the phase comparison unit, and the delay model unit in response to the delay lock signal and the refresh period signal.
The present invention described above has the effect of greatly reducing the current consumed in the delay locked loop DLL circuit by controlling the delay locked loop DLL to perform the delay lock operation only in a specific operation mode after the initialization delay lock operation.
Hereinafter, with reference to the accompanying drawings will be described a preferred embodiment of the present invention. However, the present invention is not limited to the embodiments disclosed below, but may be configured in various different forms, only this embodiment is to make the disclosure of the present invention complete and to those of ordinary skill in the art It is provided to fully inform the category.
2 is a block diagram illustrating a register controlled delay locked loop (DLL) circuit according to an embodiment of the present invention.
Referring to FIG. 2, a register-controlled delay locked loop (DLL) circuit according to an embodiment of the present invention compares a phase of a source clock CLK_IN and a feedback clock F_CLK to determine a delay value at which a delay is fixed.
More specifically, the components of the register controlled delay locked loop (DLL) circuit according to an embodiment of the present invention, the
Here, the
FIG. 3A is a circuit diagram illustrating in detail an operation control unit among components of a register controlled delay locked loop (DLL) circuit according to an exemplary embodiment of the present invention illustrated in FIG. 2.
FIG. 3B is a timing diagram illustrating an operation of an operation control unit among components of a register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention shown in FIG. 2.
Referring to FIG. 3A, the first to third
Referring to FIG. 3B, the first and
However, the first and
The first and
The
However, when the refresh period signal REF_FLAG is deactivated to logic 'low' while the delay lock signal LOCK_STATE is activated to logic 'high', the
The
FIG. 4A is a circuit diagram illustrating in detail a refresh section signal generation unit among components of a register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention shown in FIG. 2.
FIG. 4B is a timing diagram illustrating an operation of a refresh period signal generation unit among components of a register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention shown in FIG. 2.
Referring to FIG. 4A, the first inverter INV1 for receiving the refresh command REF_CMD and inverting the phase thereof and receiving the refresh command REF_CMD is delayed for a predetermined time and then inverted and outputted. A delay element DELAY and a second inverter INV2, a refresh period signal REF_FLAG, an output signal of the second inverter INV2, and a reset signal RSTB to receive a negative logic operation The second NAND gate and the second signal for receiving the output signal of the first inverter (INV1) and the output signal of the first NAND gate (NAND1) to perform a negative logic operation to output as a refresh period signal (REF_FLAG) And a NAND gate NAND2.
Referring to FIG. 4B, in response to the refresh command REF_CMD being activated with logic 'High', the refresh period signal REF_FLAG is activated with logic 'High', but the refresh command REF_CMD is logic. The refresh period signal REF_FLAG is not deactivated as logic 'low' even when deactivated to 'low' and remains logic 'high', and the logic 'low' after a predetermined time tD has passed. Deactivated with '(Low)'.
That is, the refresh period signal REF_FLAG is activated at the same time as the refresh command REF_CMD, but becomes a signal for maintaining the activation period for a predetermined time tD, and the predetermined time tD can be changed by the designer. It's time.
The operation of the register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention will be described as follows.
First, a delay lock operation of a register controlled delay lock loop (DLL) circuit according to an embodiment of the present invention is divided into an initialization delay lock operation and a delay lock operation similarly to a register controlled delay lock loop (DLL) circuit according to the prior art.
In the initialization delay lock operation, since the delay lock signal LOCK_STATE output from the
As such, when the first to
That is, the
However, in the delay lock operation after initialization, since the delay lock signal LOCK_STATE output from the
First, when the refresh period signal REF_FLAG is activated as logic 'high' in the delay lock operation after initialization, the source clock CLK_IN and the delay input from the first to
On the other hand, when the refresh period signal REF_FLAG is deactivated to logic 'low' in the delay lock operation after initialization, the source clock CLK_IN and the delay input from the first to
That is, when a signal fixed to a predetermined value is output regardless of the source clock CLK_IN and the delay lock clock DLL_CLK input from the first to
Therefore, the value of the signal DLY <0: N> output from the
Therefore, the phase difference between the source clock CLK_IN and the delay lock clock DLL_CLK whose phase difference is determined by the
In conclusion, the delay locked loop (DLL) circuit according to the embodiment of the present invention, the delay after the initialization is performed after the initialization delay lock operation is completed and the delay lock signal (LOCK_STATE) is activated to the logic 'High' In the fixed operation, the phase of the source clock CLK_IN and the feedback clock F_CLK are synchronized only in a section in which the refresh section signal REF_FLAG is activated with logic 'high'.
That is, even after delay initialization operation, the phase of the source clock CLK_IN and the feedback clock F_CLK are synchronized only in a section in which the refresh section signal REF_FLAG is activated with logic 'high'. In the period where the refresh period signal REF_FLAG is logic 'low', the phase of the source clock CLK_IN and the feedback clock F_CLK are not synchronized, thus consuming current. I never do that.
At this time, the refresh period signal REF_FLAG is a signal that is activated at the time when the refresh command REF_CMD is activated and maintains the activation period for a predetermined time, and the refresh command REF_CMD is always in a state where power is supplied to the semiconductor memory device. Since the signal should be activated with a certain period, the operation of synchronizing the phases of the source clock CLK_IN and the feedback clock F_CLK may also be performed periodically.
As described above, according to the embodiment of the present invention, after the delay lock loop DLL performs the initialization delay lock operation, the phases of the source clock CLK_IN and the feedback clock F_CLK are synchronized once, After the delay lock signal LOCK_STATE is activated, the delay lock loop DLL may be synchronized with the phase of the source clock CLK_IN and the feedback clock F_CLK only when the refresh period signal REF_FLAG is activated. The current consumed in the circuit can be greatly reduced.
The present invention described above is not limited to the above-described embodiments and the accompanying drawings, and various substitutions, modifications, and changes are possible in the art without departing from the technical spirit of the present invention. It will be apparent to those of ordinary skill.
For example, in the above-described embodiment, the phase of the source clock CLK_IN and the feedback clock F_CLK are synchronized in response to the refresh period signal REF_FLAG corresponding to the refresh command REF_CMD in the delay lock operation after initialization. Although it is said that the control is controlled, it is included in the scope of the present invention even when a signal which is periodically activated like the refresh command REF_CMD is used instead of the refresh period signal REF_FLAG corresponding to the refresh command REF_CMD.
In addition, the logic gate and the transistor illustrated in the above embodiment should be implemented in different positions and types depending on the polarity of the input signal.
1 is a block diagram showing a general register controlled delay locked loop (DLL) circuit.
2 is a block diagram illustrating a register controlled delay locked loop (DLL) circuit in accordance with an embodiment of the present invention.
FIG. 3A is a circuit diagram showing in detail an operation control unit among components of a register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention shown in FIG.
FIG. 3B is a timing diagram showing the operation of the operation control unit among the components of the register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention shown in FIG. 2; FIG.
4A is a circuit diagram illustrating in detail a refresh section signal generation unit among components of a register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention shown in FIG.
4B is a timing diagram illustrating an operation of a refresh section signal generation unit among components of a register controlled delay locked loop (DLL) circuit according to the embodiment of the present invention shown in FIG.
DESCRIPTION OF THE REFERENCE NUMERALS
100, 200: buffering unit 120, 220: timing pulse generator
140, 240:
180, 280:
164, 264: delay control unit 210: first operation control unit
230: second operation control unit 270: third operation control unit
290: refresh section signal generator
Claims (15)
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KR1020080134928A KR20100076766A (en) | 2008-12-26 | 2008-12-26 | Delay locked loop circuit |
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KR1020080134928A KR20100076766A (en) | 2008-12-26 | 2008-12-26 | Delay locked loop circuit |
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KR20100076766A true KR20100076766A (en) | 2010-07-06 |
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KR1020080134928A KR20100076766A (en) | 2008-12-26 | 2008-12-26 | Delay locked loop circuit |
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