KR20100073779A - Metal line of semiconductor device and fabricating method thereof - Google Patents
Metal line of semiconductor device and fabricating method thereof Download PDFInfo
- Publication number
- KR20100073779A KR20100073779A KR1020080132539A KR20080132539A KR20100073779A KR 20100073779 A KR20100073779 A KR 20100073779A KR 1020080132539 A KR1020080132539 A KR 1020080132539A KR 20080132539 A KR20080132539 A KR 20080132539A KR 20100073779 A KR20100073779 A KR 20100073779A
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- South Korea
- Prior art keywords
- film
- copper
- forming
- via hole
- barrier
- Prior art date
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76843—Barrier, adhesion or liner layers formed in openings in a dielectric
- H01L21/76846—Layer combinations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76841—Barrier, adhesion or liner layers
- H01L21/76853—Barrier, adhesion or liner layers characterized by particular after-treatment steps
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76838—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
- H01L21/76877—Filling of holes, grooves or trenches, e.g. vias, with conductive material
- H01L21/76883—Post-treatment or after-treatment of the conductive material
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
The embodiment relates to metallization of a semiconductor device and a method of manufacturing the same. In the method of manufacturing a metallization of a semiconductor device according to an embodiment, forming an insulating film on a substrate, forming a via hole and a trench connected to the via hole in the insulating film, a first Ti on the entire surface of the substrate on which the via hole and the trench are formed Forming a film, forming a barrier film on the first Ti film, forming a copper film in the via hole and the trench where the barrier film is formed, forming a second Ti film on the copper film, and forming the second Ti film; Polishing the copper film to expose the top surface of the insulating film. The embodiment can prevent problems such as an adhesion problem or voids occurring at the interface of the copper wirings using a Ti film, and oxygen at the copper film interface is diffused along the copper grain boundary to be combined with Ta of the diffusion barrier. It can be minimized.
Description
The embodiment relates to metallization of a semiconductor device and a method of manufacturing the same.
In general, in semiconductor devices, electronic devices, and the like, a conductor film such as aluminum (Al) or tungsten (W) is deposited on an insulating film as a wiring forming technique, and then the conductor film is subjected to a conventional photolithography process and a dry method. A technology of forming a wiring by patterning through a dry etching process has been established and widely used in this field. In particular, in recent years, a low resistivity metal such as copper (Cu) instead of aluminum (Al) or tungsten (W) as a part of reducing RC delay time centering on logic devices that require high speed among semiconductor devices. Has been studied to use a wire as a wiring.
However, in the wiring forming step using copper (Cu), a diffusion barrier film is formed between the insulating film and the copper wiring to prevent the copper particles from diffusing the insulating film.
In recent years, reliability problems have arisen in the interconnection structure using copper because the continuous flow of copper is interrupted by the diffusion barrier in the copper interconnect structure, and voids are formed in the diffusion barrier. .
In particular, problems such as poor adhesion and coverage of the diffusion barrier film occur at the interface between the lower copper wire and the upper copper wire, and TaO generation by combining Ta of the diffusion barrier film with oxygen on the surface of the copper film Problem occurs.
These problems can potentially cause problems such as electromigration (EM), stress induced voiding (SIV), stress migration (SM), etc., which not only degrades the performance of the overall device but can also cause reliability. .
The embodiment provides a metal wiring of a semiconductor device and a method of manufacturing the same, which can prevent voids and defects in copper wiring using a Ti film in a semiconductor device having a copper interconnection structure.
In the method of manufacturing a metallization of a semiconductor device according to an embodiment, forming an insulating film on a substrate, forming a via hole and a trench connected to the via hole in the insulating film, a first Ti on the entire surface of the substrate on which the via hole and the trench are formed Forming a film, forming a barrier film on the first Ti film, forming a copper film in the via hole and the trench where the barrier film is formed, forming a second Ti film on the copper film, and forming the second Ti film; Polishing the copper film to expose the top surface of the insulating film.
The metal wiring of the semiconductor device according to the embodiment may be formed on a substrate, and may include an insulating film having via holes and trenches connected to the via holes, a first Ti film formed along inner walls of the via holes and trenches, and a first stacked Ti layer on the first Ti film. And a copper wiring formed on the first barrier film, the second barrier film, and the second barrier film, and formed in the via hole and the trench.
The embodiment can prevent problems such as an adhesion problem or voids occurring at the interface of the copper wirings using a Ti film, and oxygen at the copper film interface is diffused along the copper grain boundary to be combined with Ta of the diffusion barrier. There is an effect that can be minimized.
The embodiment has the effect of improving the characteristics of the copper diffusion barrier of the copper metal wiring in the semiconductor device.
The embodiment has an effect of preventing the electron migration (EM) by adding a Ti film to the diffusion barrier formed on the copper metal wiring.
With reference to the accompanying drawings will be described in detail a metal wiring and a method of manufacturing the semiconductor device according to the embodiments. Hereinafter, when referred to as "first", "second", and the like, this is not intended to limit the members but to show that the members are divided and have at least two. Thus, when referred to as "first", "second", etc., it is apparent that a plurality of members are provided, and each member may be used selectively or interchangeably. In addition, the size (dimensions) of each component of the accompanying drawings are shown in an enlarged manner to help understanding of the invention, the ratio of the dimensions of each of the illustrated components may be different from the ratio of the actual dimensions. In addition, not all components shown in the drawings are necessarily included or limited to the present invention, and components other than the essential features of the present invention may be added or deleted. In the description of an embodiment according to the present invention, each layer (film), region, pattern or structure is "on / above / over / upper" of the substrate, each layer (film), region, pad or patterns or In the case described as being formed "down / below / under / lower", the meaning is that each layer (film), region, pad, pattern or structure is a direct substrate, each layer (film), region, It may be interpreted as being formed in contact with the pad or patterns, or may be interpreted as another layer (film), another region, another pad, another pattern, or another structure being additionally formed therebetween. Therefore, the meaning should be determined by the technical spirit of the invention.
1 to 7 are cross-sectional views illustrating a method of forming metal wires in a semiconductor device according to an embodiment.
Here, the
The embodiment is a copper interconnection structure, and the
As shown in FIG. 1, a
The
The
The
An
The
The
As illustrated in FIG. 2, via holes and
The via hole is formed through the
The trench may be connected to the via hole in a width wider than that of the via hole and formed to a predetermined depth in the
The via hole and the
In brief, a photoresist pattern is formed on the
Dual damascene made of a process as described above may be formed in various processes in addition to the above process, single damascene may also be included in the present invention. A portion of the exposed
As shown in FIG. 3, a
First, the first
The first
The first
A second
The second
The second
A third
The third
The third
The first
The first
Thereafter, a copper seed layer may be deposited on the entire surface of the
As shown in FIG. 4, the
The
Thereafter, a first annealing is performed to stabilize the
In a typical annealing process, oxygen (O) diffuses downward through a copper grain boundary in CuOx formed on a copper surface and combines with Ta, which is a third barrier metal film formed below, to form TaOx. Since TaOx thus formed deteriorates the SIV characteristic, in this embodiment, the annealing process is limited to the following conditions.
In the first annealing process for stabilizing copper according to the embodiment, the annealing is performed at 160 to 240 ° C. for 16 to 24 minutes.
Subsequently, as shown in FIG. 5, a capping
The capping
The capping
The capping
The capping
In addition, the capping
As illustrated in FIG. 6, the capping
In the second annealing process, annealing is performed at 350 to 450 ° C. for 20 to 40 minutes in a nitrogen atmosphere.
As illustrated in FIG. 7, a portion of the capping
As a result, first to third barrier
Thereafter, the entire surface of the interlayer insulating
The embodiment can prevent problems such as an adhesion problem or voids occurring at the interface of the copper wirings using a Ti film, and oxygen at the copper film interface is diffused along the copper grain boundary to be combined with Ta of the diffusion barrier. There is an effect that can be minimized.
The embodiment has the effect of improving the characteristics of the copper diffusion barrier of the copper metal wiring in the semiconductor device.
The embodiment has an effect of preventing the electron migration (EM) by adding a Ti film to the diffusion barrier formed on the copper metal wiring.
In addition, the embodiment has the effect of improving the performance and reliability of the overall device by solving the problems of electro migration (EM), stress induced voiding (SIV), stress migration (SM), etc. as a copper interconnect structure. have.
Although described above with reference to the embodiments, which are merely examples and are not intended to limit the present invention. Those skilled in the art to which the present invention pertains are not exemplified above without departing from the essential characteristics of the present invention. It will be appreciated that many variations and applications are possible. For example, each component specifically shown in the embodiments of the present invention can be modified and implemented. And differences relating to such modifications and applications will have to be construed as being included in the scope of the invention defined in the appended claims.
1 to 7 are cross-sectional views illustrating a method of forming metal wires in a semiconductor device according to an embodiment.
Claims (9)
Priority Applications (1)
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KR1020080132539A KR20100073779A (en) | 2008-12-23 | 2008-12-23 | Metal line of semiconductor device and fabricating method thereof |
Applications Claiming Priority (1)
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KR1020080132539A KR20100073779A (en) | 2008-12-23 | 2008-12-23 | Metal line of semiconductor device and fabricating method thereof |
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KR20100073779A true KR20100073779A (en) | 2010-07-01 |
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KR1020080132539A KR20100073779A (en) | 2008-12-23 | 2008-12-23 | Metal line of semiconductor device and fabricating method thereof |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013126458A1 (en) * | 2012-02-24 | 2013-08-29 | Skyworks Solutions, Inc. | Improved structures, devices and methods releated to copper interconnects for compound semiconductors |
-
2008
- 2008-12-23 KR KR1020080132539A patent/KR20100073779A/en not_active Application Discontinuation
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013126458A1 (en) * | 2012-02-24 | 2013-08-29 | Skyworks Solutions, Inc. | Improved structures, devices and methods releated to copper interconnects for compound semiconductors |
US8878362B2 (en) | 2012-02-24 | 2014-11-04 | Skyworks Solutions, Inc. | Copper interconnects having a titanium—titanium nitride assembly between copper and compound semiconductor |
US9443803B2 (en) | 2012-02-24 | 2016-09-13 | Skyworks Solutions, Inc. | Devices and methods related to a sputtered titanium tungsten layer formed over a copper interconnect stack structure |
US9553049B2 (en) | 2012-02-24 | 2017-01-24 | Skyworks Solutions, Inc. | Copper interconnects having a titanium-platinum-titanium assembly between copper and compound semiconductor |
US9576906B2 (en) | 2012-02-24 | 2017-02-21 | Skyworks Solutions, Inc. | Methods related to a sputtered titanium tungsten layer formed over a copper interconnect stack structure |
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