KR20090053500A - Actinograph and back light unit therewith - Google Patents

Actinograph and back light unit therewith Download PDF

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Publication number
KR20090053500A
KR20090053500A KR1020070120365A KR20070120365A KR20090053500A KR 20090053500 A KR20090053500 A KR 20090053500A KR 1020070120365 A KR1020070120365 A KR 1020070120365A KR 20070120365 A KR20070120365 A KR 20070120365A KR 20090053500 A KR20090053500 A KR 20090053500A
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KR
South Korea
Prior art keywords
light
integrating sphere
measuring device
emitting diode
integrating
Prior art date
Application number
KR1020070120365A
Other languages
Korean (ko)
Inventor
박기점
유수엽
Original Assignee
주식회사 우영
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Publication date
Application filed by 주식회사 우영 filed Critical 주식회사 우영
Priority to KR1020070120365A priority Critical patent/KR20090053500A/en
Publication of KR20090053500A publication Critical patent/KR20090053500A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G01J1/08—Arrangements of light sources specially adapted for photometry standard sources, also using luminescent or radioactive material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
    • G02B6/0001—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems
    • G02B6/0011—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being planar or of plate-like form
    • G02B6/0066—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings specially adapted for lighting devices or systems the light guides being planar or of plate-like form characterised by the light source being coupled to the light guide
    • G02B6/0073—Light emitting diode [LED]
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1335—Structural association of cells with optical devices, e.g. polarisers or reflectors
    • G02F1/1336—Illuminating devices
    • G02F1/133602—Direct backlight
    • G02F1/133603—Direct backlight with LEDs

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

Light amount measuring apparatus according to an embodiment of the present invention, the hollow spherical at least one integrating sphere; A light inflow portion penetrating into the integrating sphere; And a sensor that senses light inside the integrating sphere.

Integrating sphere, light emitting diode

Description

Light quantity measuring device and backlight unit having the same {Actinograph and back light unit therewith}

The present invention relates to a light quantity measuring device using an integrating sphere and a backlight unit having the same, and more particularly, a light quantity measuring device for measuring a light quantity in a light generating device using a light emitting diode and a light emission having the light quantity measuring device. It relates to a diode type backlight unit.

In general, a light emitting diode (LED) is a semiconductor device that emits light in response to an applied current. The light emitting diode has a spotlight as a next generation lighting device due to its very small size, low power consumption, and very long life compared to a light bulb.

Unlike the well-known semiconductor devices, the light emitting diodes emit light, and thus the method of measuring the characteristics of the light emitting diodes is very different from that of other semiconductor devices. In particular, the process of applying a constant current and measuring the amount of light generated is significantly different from other semiconductor devices.

1 is a configuration diagram illustrating a principle of measuring light quantity of a light emitting diode.

Referring to FIG. 1, the backlight unit 10 includes a plurality of red, green, and blue light emitting diode chips 30 disposed on the substrate 20 and an optical member spaced apart from the light emitting diode chip 30 by a predetermined distance. And 50. The space where the light emitting diode chip 30 and the optical member 50 are disposed at a distance from each other becomes a light mixing space 60, and red, green, and blue light generated by the light emitting diode chip 30 are mutually different. It is mixed to form white light.

Meanwhile, a detector 40 for measuring the amount of light is installed at an adjacent position of the LED chip on the substrate 20. The detector not only senses the brightness of the light in the backlight unit but also senses the color and the intensity of the light to adjust the current flowing through the light emitting diode chip to adjust the brightness of the backlight unit.

At this time, in adjusting the light intensity in the configuration in which the detector 40 is attached, the light intensity is too high near the light emitting diode chip, so that the sensor as the electronic component is saturated and loses its function.

That is, as shown in FIG. 1, the detector 40 detects the light intensity only in the section d of the portion of the optical member 50 disposed at the corresponding position, thereby increasing the light intensity throughout the backlight unit. An error of detecting the intensity of light only in a very local section that cannot be detected and determining it as the intensity of light of the entire backlight unit occurs.

In order to prevent the saturation phenomenon, a method of reducing the intensity of light in the backlight unit has been developed in various ways.

As an example, a method of controlling the amount of light by reducing the size of a hole in a path through which light passes has been proposed. This method can easily adjust the amount of light and has excellent attenuation in the entire band (even if the color is changed, the amount of light attenuation is constant). However, if the passage of the light is made small, the phenomenon that the unevenness of the light generated by the backlight unit such as the pinhole camera is transferred to the optical sensor as it is. Therefore, there is a problem that the uniformity of the product is not constant, such as difficult to detect accurately and the amount of attenuation is different depending on the attachment method.

As another method, a method has been proposed in which a semi-transmissive material is inserted into a passage through which light passes to cause attenuation of light. This method eliminates the pinhole phenomenon and obtains even characteristics, but there is a rare problem that the semi-transparent material has an even attenuation over the whole band. In addition, there is a problem that the change in characteristics is exhibited over time.

Accordingly, the technical problem of the present invention is to solve such a conventional problem, and an object of the present invention is to accurately perform light attenuation, has an even light attenuation function over the entire visible light band, and has a large amount of light measurement interval. It is to provide a measuring device.

It is another object of the present invention to provide a light quantity measuring device in which attenuation of light to be measured is constant and a backlight unit using the same.

Another object of the present invention is to provide a light quantity measuring device capable of obtaining a high light attenuation rate and a backlight unit using the same.

In order to achieve the above object of the present invention, a light quantity measuring device includes: a hollow spherical at least one integrating sphere; A light inflow portion penetrating into the integrating sphere; And a sensor for sensing light inside the integrating sphere.

Here, the light reflection coating is formed on the inner surface of the integrating sphere.

The integrating sphere is provided in plurality, and the integrating spheres are connected to each other in series by an optical path.

The light quantity measuring device further includes a light control unit for controlling the amount of light passing through the light path.

On the other hand, the light control unit further comprises a through groove.

Here, the cross-sectional area of the through groove is smaller than the cross-sectional area of the optical path.

The backlight unit according to an embodiment of the present invention comprises at least one integrating sphere of a hollow sphere; A light inflow portion penetrating into the integrating sphere; And a light sensor for sensing light inside the integrating sphere, and a light source disposed adjacent to the light quantity measuring device.

Here, the light source, the substrate; And a plurality of light emitting diode chips disposed on the substrate.

In the backlight unit, the light emitting diode chip may be a light emitting diode chip that emits red, green, and blue light.

Optionally, the light emitting diode chip may be a light emitting diode chip emitting white light.

Meanwhile, the light source measuring device may be formed inside the substrate.

In such a backlight unit, a light reflection coating is formed on the inner surface of the integrating sphere.

In the backlight unit, a plurality of integrating spheres are provided, and the integrating spheres are connected to each other in series by an optical path.

In such a backlight unit, a light control unit for controlling the amount of light passing through the light path is further provided.

In addition, the light control unit further includes a through groove.

In addition, the cross-sectional area of the through groove is smaller than the cross-sectional area of the optical path.

As described above, according to the light quantity measuring apparatus and the backlight unit according to the present invention, it is possible to effectively measure the light quantity in a wider section in the backlight, the attenuation of the light to be measured is evenly performed in all bands, By connecting the integrating spheres in series, a high light attenuation rate can be obtained.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the present invention is not limited to the embodiments described herein and may be embodied in other forms. Rather, the embodiments introduced herein are provided to ensure that the disclosed subject matter is thorough and complete, and that the scope of the invention to those skilled in the art will fully convey. As described in the drawing, the viewpoint of an observer is explained, and when a part of a layer, a film, an area, a plate, etc. is located on another part, this includes not only the part directly above the part but also another part in the middle. . On the contrary, when a part is directly above another part, it means that there is no other part in the middle.

2 is a block diagram of a backlight unit according to an embodiment of the present invention.

Referring to FIG. 2, the backlight unit 100 according to the present invention includes a light quantity measuring device 130 and a light source disposed adjacent to the light quantity measuring device. The light source includes a substrate 110 and a plurality of light emitting diode chips 120 disposed on the substrate.

The light member 140 is disposed at a distance spaced from the light emitting diode chip 120 at a predetermined interval, and a light mixing space 150 is disposed between the light member 140 and the light emitting diode chip 120. do.

The light emitting diode chip 120 may include at least one of a red light emitting diode chip R, a green light emitting diode chip G, and a blue light emitting diode chip B capable of generating red, green, and blue light, respectively. It includes more. Accordingly, the red, green, and blue light generated in the red, green, and blue LED chips are mixed with each other in the light mixing space 150 to become white light, and the path is controlled or additional light passes through the light member 140. You will go through the mixing process.

Optionally, although not shown in the drawing, an additional light member such as a light guide plate may replace the light mixing space 150. The LED chip 120 may be a white light emitting diode chip in which each LED chip forms white light by itself.

As shown in FIG. 2, the light quantity measuring device 130 is disposed adjacent to a light source including the light emitting diode chip 120 so that the light generated from the light source is mixed in the light mixing space 150. The amount of light is measured. In this case, the light amount measuring device 130 may measure the light amount of the light reached from the light member 140 through light reflection.

Although the light quantity measuring device 130 is illustrated as being disposed on the substrate 110, the light quantity measuring device 130 is not necessarily limited thereto, and the light quantity measuring device 130 is suitable for measuring the light quantity inside the backlight unit 100. May be placed in position. For example, the light amount measuring device may be disposed at one end of the co-mixing space 150 inside the backlight unit 100 or may be disposed at the light member 140 side.

3 is a partially enlarged view of the light quantity measuring device 130 shown in FIG. 2.

Referring to FIG. 3, the light quantity measuring device 130 includes a hollow spherical integrating sphere 136. The light quantity measuring device 130 includes a light inlet 132 formed at one side of the integrating sphere 136 and penetrating into the integrating sphere. In addition, the light amount measuring device 130 includes a sensor 134 for extracting light from the interior of the integrating sphere 136. The sensor 134 may be disposed outside the integrating sphere to sense light through a light exiting unit (not shown) for extracting light, or may be disposed on an inner surface of the integrating sphere 136.

The inner surface of the starch sphere 136 has a coating surface capable of reflecting light, or is itself formed of a material of reflective material. If the allowable angle of light that can be introduced into the light inlet 132 of the integrating sphere is θ, the distance from the light inlet of the integrating sphere to the light quantity measuring surface is L, and the diameter of the light inlet is d, The relationship of θ = arctan (2L / d) holds. Therefore, as the distance L from the light inlet portion of the integrating sphere to the light quantity measuring surface is closer, the allowable incident angle θ becomes larger.

In order to inject more light into the integrating sphere, the maximum incidence angle θ is preferably large. The larger the size of the hollow space in the integrating sphere, the more uniform the light quantity distribution in the integrating sphere is, and thus the diameter of the light inlet 132 of the integrating sphere 136 can be increased.

In general, since the diameter of the light inlet 132 of the integrating sphere 136 is larger than the diameter of the sensor 134, when the integrating sphere 136 is used, the allowable angle is more allowable than when receiving only the sensor directly as in the prior art. The angle becomes large, and the amount of light in a relatively large area can be measured, so that relatively accurate data can be secured.

4 is a cross-sectional view taken along the line IV-IV of FIG. 3.

Referring to FIG. 4, it can be seen that the integrating sphere 136 is disposed inside the substrate 110, and the sensor 134 is disposed on the inner surface of the integrating sphere 136 to receive light.

5 is a conceptual diagram showing a configuration of another embodiment of the light quantity measuring device of the present invention.

Referring to FIG. 5, a plurality of integrating spheres 200, 300, and 400 are connected in series. An optical path is formed between the integrating spheres so that the light received from the previous integrating sphere passes through the next integrating sphere. That is, a first light path 250 is disposed between the first integrating sphere 200 and the second integrating sphere 300, and a second light is provided between the second integrating sphere 300 and the third integrating sphere 400. A passage 350 is disposed.

Therefore, the light flowing into the light inlet 232 of the first integrating sphere 200 passes through the first light path 250 after the path is changed by reflection several times in the first integrating sphere 200. The integrating sphere 300 is entered. The light in the second integrating sphere 300 is also introduced into the third integrating sphere 400 through the second optical path 350 after the path is changed by reflection several times, and then reflected several times. 434). In this process, the first light control unit 252 and / or the second light control unit 352 may be installed in the first optical path 250 and / or the second optical path 350, respectively. have.

Fig. 6 is a partial cross-sectional view showing a state in which a plurality of integrating spheres shown in Fig. 5 are arranged on a substrate. Referring to Fig. 6, a plurality of integrating spheres are arranged in series in a predetermined extending direction so that one integral In the case of insufficient light attenuation alone, the space can be used efficiently while simultaneously using a plurality of integrating spheres for efficient space use, rather than being arranged in a straight line, as shown in FIGS. It is preferable to arrange | position shiftly.

FIG. 7 is a partial perspective view illustrating a coupling relationship between an integrating sphere and an integrating sphere and an optical control unit disposed in the optical passage. In particular, FIG. 7 is a view showing a connection between the first integrating sphere 200 and the second integrating sphere 300 shown in FIG. 6, and the same configuration is provided between the second integrating sphere 300 and the third integrating sphere 400. Also applies.

Referring to FIG. 7, the first light control unit 252 is inserted and mounted in a direction perpendicular to the axial direction of the first optical path 250 connecting the first integrating sphere 200 and the second integrating sphere 300. do. The first light control unit 252 preferably has a plate shape. The through hole 254 penetrates the surface of the first light control unit 252. Therefore, the light amount passing through the first light path 250 is controlled by the through hole 254 of the first light control unit 252. In order to reduce the amount of light passing through the light path to serve as an aperture, the diameter of the through hole 254 is preferably smaller than the diameter of the first light path 250. By adjusting the size of the diameter of the through hole 254, it is possible to accurately control the amount of light in the system.

The present invention can be used in the technical field regarding the backlight unit and the light quantity measuring device.

1 is a configuration diagram illustrating a light quantity measuring principle in a conventional light emitting diode type backlight unit.

2 is a configuration diagram illustrating a light quantity measuring principle of a light emitting diode type backlight unit using an integrating sphere according to an embodiment of the present invention.

3 is a partially enlarged view of the light quantity measuring device of FIG. 2.

4 is a cross-sectional view taken along line IV-IV of FIG. 3.

It is a block diagram explaining the light quantity measuring device in which the several integrating sphere was used.

6 is a partial perspective exploded view of the light quantity measuring device of FIG. 5.

7 is a partially exploded perspective view illustrating a coupling relationship between the light control unit and the light path of FIG. 6.

* Description of the main parts of the drawings *

100: backlight unit 110: substrate

120: light emitting diode chip 130: light quantity measuring device

132: light inlet 134: sensor

136: integrating sphere 140: light member

150: light mixing space 200: first integrating sphere

250: First light path 252: First light control unit

300: second integrating sphere 350: second light path

352: second light control unit 400: third integrating sphere

434: sensor

Claims (16)

At least one integrating sphere of a hollow sphere; A light inflow portion penetrating into the integrating sphere; And And a sensor for sensing light inside the integrating sphere. The method of claim 1, A light amount measuring device, characterized in that the light reflection coating is formed on the inner surface of the integrating sphere. The method of claim 2, And a plurality of integrating spheres, and the integrating spheres are connected to each other in series by an optical path. The method of claim 3, wherein And a light control unit for controlling the amount of light passing through the light path. The method of claim 4, wherein The light amount measuring device further comprises a through groove. The method of claim 5, wherein And a cross-sectional area of the through groove is smaller than that of the optical path. At least one integrating sphere of a hollow sphere; A light inflow portion penetrating into the integrating sphere; And A light quantity measuring device including a sensor detecting a light inside the integrating sphere; And a light source disposed adjacent to the light quantity measuring device. The method of claim 7, wherein The light source is, Board; And And a plurality of light emitting diode chips disposed on the substrate. The method of claim 8, The light emitting diode chip is a light emitting diode chip for emitting red, green, blue light. The method of claim 9, And the light emitting diode chip is a light emitting diode chip emitting white light. The method of claim 8, And the light source measuring device is formed inside the substrate. The method of claim 7, wherein And a light reflection coating is formed on the inner surface of the integrating sphere. The method of claim 12, And a plurality of integrating spheres, and the integrating spheres are connected in series with each other by an optical path. The method of claim 13, And a light control unit for controlling the amount of light passing through the optical path. The method of claim 14, The light control unit further comprises a through groove. The method of claim 15, The cross-sectional area of the through groove is smaller than the cross-sectional area of the light path.
KR1020070120365A 2007-11-23 2007-11-23 Actinograph and back light unit therewith KR20090053500A (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10551312B2 (en) 2017-12-29 2020-02-04 Samsung Electronics Co., Ltd. Optical sensor, and apparatus and method for measuring absorbance using the same
CN116295820A (en) * 2023-05-19 2023-06-23 中国科学院长春光学精密机械与物理研究所 Cascade integrating sphere light source

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10551312B2 (en) 2017-12-29 2020-02-04 Samsung Electronics Co., Ltd. Optical sensor, and apparatus and method for measuring absorbance using the same
CN116295820A (en) * 2023-05-19 2023-06-23 中国科学院长春光学精密机械与物理研究所 Cascade integrating sphere light source
CN116295820B (en) * 2023-05-19 2023-08-08 中国科学院长春光学精密机械与物理研究所 Cascade integrating sphere light source

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