KR20080113394A - Exposure apparatus - Google Patents
Exposure apparatus Download PDFInfo
- Publication number
- KR20080113394A KR20080113394A KR1020087024076A KR20087024076A KR20080113394A KR 20080113394 A KR20080113394 A KR 20080113394A KR 1020087024076 A KR1020087024076 A KR 1020087024076A KR 20087024076 A KR20087024076 A KR 20087024076A KR 20080113394 A KR20080113394 A KR 20080113394A
- Authority
- KR
- South Korea
- Prior art keywords
- exposure
- light
- substrate
- area
- blocking member
- Prior art date
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2002—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
- G03F7/2008—Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image characterised by the reflectors, diffusers, light or heat filtering means or anti-reflective means used
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70425—Imaging strategies, e.g. for increasing throughput or resolution, printing product fields larger than the image field or compensating lithography- or non-lithography errors, e.g. proximity correction, mix-and-match, stitching or double patterning
- G03F7/70433—Layout for increasing efficiency or for compensating imaging errors, e.g. layout of exposure fields for reducing focus errors; Use of mask features for increasing efficiency or for compensating imaging errors
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
Abstract
When performing pattern exposure by carrying out the relative movement of a board | substrate and a mask, the exposure apparatus which can shield a non-exposed area | region appropriately is provided.
During exposure of the exposure area, by moving the blind member 20 to the upstream side with respect to the exposure light EL, irrespective of the number of exposure areas, one blind member 20 is used to expose the non-exposed areas. Can be avoided.
Description
BACKGROUND OF THE INVENTION Field of the Invention The present invention relates to an exposure apparatus and, for example, relates to an exposure apparatus suitable for exposure-transferring a mask pattern of a mask onto a substrate of a large flat panel display such as a liquid crystal display or a plasma display.
A large flat panel display such as a liquid crystal display or a plasma display used in a large-sized thin TV or the like is manufactured by carrying out proximity exposure transfer of a pattern of a mask on a substrate by a split sequential exposure method. As a conventional dividing sequential exposure apparatus of this kind, for example, a mask smaller than the substrate as the exposed material is used, the mask is held at the mask stage, the substrate is held at the work stage, and both are disposed to face each other in close proximity, By moving the work stage with respect to the mask in this state and irradiating the substrate with light for pattern exposure from the mask side for each step, the plurality of mask patterns drawn on the mask are exposed and transferred onto the substrate so that a plurality of displays or the like can be applied to one substrate. It is known to manufacture. In particular, in the technique of
Patent Document 1: Japanese Patent Application Laid-Open No. 11-237744
Disclosure of the Invention
Problems to be Solved by the Invention
By the way, when a plurality of panels are cut out from the large glass substrate, the exposure pattern is exposed and transferred to the region on the glass substrate corresponding to the panel, but the region corresponding to the adjacent panels is a non-exposure region in which exposure light should not be irradiated. to be. Therefore, it is conceivable to form a light blocking member between the light source and the glass substrate so as to cover the non-exposed area so that the exposure light does not reach the non-exposed area. By the way, when the kind and number of panels cut out from one glass substrate differ, it is necessary to form the light-shielding member of many various shapes accordingly, and there exists a problem of cost increase and space increase.
Therefore, in view of the problems of the prior art, an object of the present invention is to provide an exposure apparatus capable of properly shielding a non-exposed area using a light shielding member when performing pattern exposure by relatively moving a substrate and a mask. do.
Means to solve the problem
The object mentioned above is achieved by the following structures.
(1) an irradiation unit for irradiating light for exposure,
A substrate driver which holds a substrate having an exposed area and a non-exposed area, and moves the substrate in a predetermined direction across the exposure light emitted from the irradiation part;
A first light blocking member disposed between the irradiation section and the substrate and extending in a direction crossing the predetermined direction to shield light;
A first driving unit for moving the first light blocking member to a position to block the light for exposure emitted from the irradiation unit;
A second light blocking member disposed between the irradiation section and the substrate and extending in a direction crossing the predetermined direction to shield light;
A second driving part for holding the second light blocking member and moving the light blocking member independently of the first light blocking member to a position for blocking light for exposure;
The first driving part drives the first light blocking member so as to traverse light from the irradiation part and move in a direction opposite to the predetermined direction at least once while irradiating light to the exposure area from the irradiation part. ,
And the second driving unit drives the second light blocking member in accordance with the operation of the first light blocking member.
(2) The exposure apparatus according to the exposure apparatus (1), wherein the first light shielding member has one band-shaped light shielding portion, and the second light shielding member has two band-shaped shielding portions.
(3) The exposure apparatus according to (1), wherein the first light blocking member has a variable width in the predetermined direction.
(4) The exposure apparatus according to (1), wherein the first light blocking member forms an edge in accordance with the intermediate imaging region.
(5) The exposure apparatus according to (1), wherein part of the light directed from the irradiator to the exposure area is shielded according to the speed or acceleration of the first light blocking member.
(6) The exposure apparatus according to (1), wherein the first and second driving units drive the first and second light blocking members so that the exposure amount in the exposure area of the substrate is constant.
(7) The exposure area of the substrate has a crossing portion that is shielded by moving the first light blocking member while traversing light from the irradiation part while irradiating light from the irradiation part to the exposure area,
The said 1st and 2nd drive part drives the said 1st and 2nd light shielding members so that the exposure amount in the said exposure area may be equivalent to the exposure amount in the crossing part, The exposure apparatus as described in (6) characterized by the above-mentioned. .
Effects of the Invention
According to the exposure apparatus of the present invention, the first drive unit is configured to move in a direction opposite to the predetermined direction at least once while traversing light from the irradiation unit while irradiating light to the exposure area from the irradiation unit. Since the first light blocking member is driven, only the single first light blocking member can appropriately shield the exposure light so that it does not reach, regardless of the width or number of the non-exposed areas. Moreover, since it is a compact and lightweight structure, simplification and compactness of the whole exposure apparatus can be aimed at. In addition, since the second driving part drives the second light blocking member in accordance with the operation of the first light blocking member, for example, the first light blocking member crosses the light from the irradiation part and is opposite to the predetermined direction. By moving so as to block a part of the light from the irradiation section, it is possible to suppress the unevenness of the exposure dose.
It is preferable that the first light shielding member has one band-shaped light shielding portion, and the second light shielding member has two band-shaped light shielding portions. The second light blocking member may have an inverted c-shape or a w-shape.
If the width | variety in the said predetermined direction is made variable, the said 1st light-shielding member can implement appropriate light-shielding regardless of the width | variety of a non-exposure area. Moreover, if the width is made small when crossing the light from the irradiation section and moving in the direction opposite to the predetermined direction, the decrease in the exposure amount in the exposure area can also be suppressed.
The first light shielding member is preferable because an edge is formed in accordance with the intermediate image forming region, since the blurring of the boundary can be suppressed.
According to the speed or acceleration of the first light blocking member, if a part of the light from the irradiation part toward the exposure area is shielded, the reduction of the exposure amount when crossing the light from the irradiation part and moving in the direction opposite to the predetermined direction is suppressed. can do.
1 is a top view of the exposure apparatus according to the first embodiment.
2 is a side view illustrating a state at the time of exposure of the exposure apparatus according to the present embodiment.
3 is a perspective view showing a blind, an aperture member, and a substrate.
4 is a view of the blind 20, the
5 is a flowchart showing an exposure operation.
6 is a time chart diagram of the movement of the
7 is a view of the substrate W viewed in the Z axis direction.
8 is a time chart diagram of blind 20 movement according to a modification.
9 is a time chart diagram of blind 20 movement according to a modification.
10 is a time chart diagram of blind 20 movement according to a modification.
11 is a time chart diagram of blind 20 movement according to a modification.
12 is a time chart diagram of blind 20 movement according to a modification.
FIG. 13: is the figure which looked at the blind 20 which concerns on another modified example to the Y-axis direction.
FIG. 14: is the figure which looked at the blind 20 which concerns on another modified example to the Y-axis direction.
Explanation of the sign
1: Base
2: substrate chuck
2a: rail
10: holding device
11: arm
12: holding part
13: Z axis moving device
14: θ axis moving device
15: Y axis moving device
20: blind
20a-20d: wing member
21, 22: Plate
30: absence of aperture
31, 32: vertical member
33, 34: horizontal member
35: connecting member
EG: edge
EL: Light for exposure
ER1: exposure area
ER2: exposure area
ER3: exposure area
FP: intermediate imaging position
GS1: Guide Rail
GS2: Guide Rails
L: mask conveying line
LM1, LM2: Linear Motor
LS: Light source
M: Mask
NR1: non-exposed area
NR2: non-exposed area
NR3: non-exposed area
NR4: non-exposed area
OPU: Exposure Unit
Implement the invention Best form for
EMBODIMENT OF THE INVENTION Hereinafter, preferred embodiment of this invention is described with reference to drawings. 1 is a top view of the exposure apparatus according to the present embodiment, and FIG. 2 is a side view illustrating a state during exposure of the exposure apparatus according to the present embodiment. In the following embodiments, the horizontal plane is defined in the X axis direction and the Y axis direction, and the Z axis direction defines the vertical direction.
In FIG. 1, on the
Each holding |
In the exposure operation | movement performed using the exposure apparatus of this embodiment, the board | substrate W is moved from left to right with the board |
When the exposure light EL is projected from the light source LS in the upper exposure unit (irradiation unit: OPU) while moving the substrate W to a predetermined position, the exposure light EL is held by the holding
By the way, when cutting out several panel from the board | substrate W, an exposure pattern is exposed-transferred to the area | region on the board | substrate W corresponding to a panel, but the area | region corresponding between adjacent panels should not irradiate exposure light. It becomes a non-exposed area. Therefore, in this embodiment, the blind 20 and the
3 is a perspective view illustrating the blind, the aperture member, and the substrate, and a mask and the like are omitted. In the following description, the substrate has only one row of exposure areas for easy understanding, but there are actually multiple rows. In FIG. 3, the
On the other hand, the substantially W-shaped
Next, the operation | movement of the
FIG. 4A illustrates the relationship between the shape and relative positions of the
Here, when the substrate W moves in the X-axis direction (right side in the drawing) toward the irradiation area (shown by the dashed-dotted line) of the light EL for exposure, first, the first non-exposed area NR1 is the light EL for exposure. Access to the survey area. Therefore, as shown in FIG. 4 (b), the
By further moving the substrate W in the moving direction, the exposure area ER1 approaches the irradiation area of the light EL for exposure. At this time, if the
As the substrate W further moves in the moving direction, as shown in FIG. 4E, the exposure of the exposure region ER1 approaches the end, and the non-exposed region NR2 is the irradiation region of the exposure light EL. Approach At this time, since the
By further moving the substrate W in the moving direction, the exposure area ER2 approaches the irradiation area of the exposure light EL. By moving the
By the way, in the state in which the
More specifically, as shown in Fig. 4 (h) and Fig. 4 (i), while exposing the exposure area ER2, the
As the substrate W further moves in the moving direction, as shown in Fig. 4 (j), the exposure of the exposure area ER2 approaches the end, and the non-exposed area NR3 is the irradiation area of the light EL for exposure. Approach At this point of time, since the
By further moving the substrate W in the moving direction, the exposure area ER3 approaches the irradiation area of the exposure light EL. As described above, the
In addition, as shown in Fig. 4 (l), the
In the case where the exposure area is 4 or more, after the exposure of all the exposure areas is completed by repeating the same operation (step S108 in FIG. 5), as shown in FIG. 4 (m), the
According to this embodiment, one
By the way, in exposure area | region (ER2 etc.) which the
FIG. 6 is a time chart showing the positions of the
First, at time t1 in FIG. 6, the non-exposed region is shielded by the
At the time t4, since the
At time t6, the exposure of the exposure area ER2 is started. At the time t7, the
Here, since the point E (cross-section part) in the center of exposure area ER2 is shielded by the
8-12 are charts similar to FIG. 6 concerning another embodiment, and code | symbol a-e corresponds to the dimension shown to FIG. 4 (a). In addition, in the example of FIGS. 8-11, the
The amount of protrusions Δ before and after can be obtained by the following equation.
Lm = Lb × (Vw / (Vw + Vb)) (1)
Lu = Lb × (Vw / (Vw + Vb)) (2)
only,
Lm: total shading length (mm)
= Protrusion amount Δ of the
Lu: rear shading length (mm)
= Protrusion amount Δ of the
Vw: work movement speed (mm / s)
Vb: Blind member return speed (mm / s)
Lb: blind member return width (mm)
First, in the example of FIG. 8, the width | variety of the X-axis direction of the irradiation area | region of exposure light EL is made 50 mm, and the width | variety of the
In the example of FIG. 9, the width | variety of the X-axis direction of the irradiation area of the exposure light EL is 50 mm, and the width | variety of the
In the example of FIG. 10, the width | variety of the X-axis direction of the irradiation area of the exposure light EL is 50 mm, and the width | variety of the
In the example of FIG. 11, the width | variety of the X-axis direction of the irradiation area of the exposure light EL is 50 mm, and the width | variety of the
In the example of FIG. 12, the
FIG. 13: is the figure which looked at the blind 20 which concerns on a modification in the Y-axis direction. The blind 20 shown in FIG. 13 has four
FIG. 14: is the figure which looked at the blind 20 which concerns on another modified example to the Y-axis direction. The blind 20 shown in FIG. 14 has the shape which bent one board | plate material. As shown in FIG. 14, the light shielding range SR can be adjusted to arbitrary lengths by changing the bending angle (theta). In addition, the blind 20 can perform exposure with high resolution by matching the edge EG which determines both ends in an X-axis direction with the intermediate | middle imaging position FP of an exposure apparatus in a Z-axis direction.
As mentioned above, although this invention was demonstrated with reference to embodiment, it should be understood that this invention is not limited to the said embodiment, and can be changed and improved suitably. For example, the number of exposed areas and non-exposed areas is arbitrary. In addition, when a plurality of blinds are provided together, the exposure unevenness can be made less noticeable by changing the timing of returning the blinds. In addition, the width of the blind member may be fixed, not variable, and may be replaced with a blind member having a corresponding width in accordance with the non-exposed area of the substrate.
This application is based on the JP Patent application (Japanese Patent Application No. 2006-136591) of an application on May 16, 2006, The content is taken in here as a reference.
Claims (7)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JPJP-P-2006-00136591 | 2006-05-16 | ||
JP2006136591A JP2007310007A (en) | 2006-05-16 | 2006-05-16 | Exposure apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20080113394A true KR20080113394A (en) | 2008-12-30 |
Family
ID=38693711
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020087024076A KR20080113394A (en) | 2006-05-16 | 2007-04-12 | Exposure apparatus |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2007310007A (en) |
KR (1) | KR20080113394A (en) |
CN (1) | CN101416115B (en) |
WO (1) | WO2007132610A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9316923B2 (en) | 2010-07-19 | 2016-04-19 | Samsung Display Co., Ltd. | Exposure apparatus and exposure method using the same |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009265244A (en) * | 2008-04-23 | 2009-11-12 | Nsk Ltd | Scanning exposure device and scanning exposure method |
JP2009295950A (en) * | 2008-05-09 | 2009-12-17 | Nsk Ltd | Scan exposure equipment and scan exposure method |
JP5164007B2 (en) * | 2008-10-09 | 2013-03-13 | 株式会社ブイ・テクノロジー | Proximity exposure equipment |
CN102402122B (en) * | 2010-09-07 | 2013-09-18 | 无锡华润上华半导体有限公司 | Mask aligner light leakage detection method and system |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5473410A (en) * | 1990-11-28 | 1995-12-05 | Nikon Corporation | Projection exposure apparatus |
JP2691319B2 (en) * | 1990-11-28 | 1997-12-17 | 株式会社ニコン | Projection exposure apparatus and scanning exposure method |
KR0145147B1 (en) * | 1994-10-21 | 1998-08-17 | 김주용 | Blocking method of light in stepper |
JP2001125284A (en) * | 1999-10-29 | 2001-05-11 | Nsk Ltd | Split successive approximation aligner |
JP4273679B2 (en) * | 2001-06-12 | 2009-06-03 | 日本精工株式会社 | Split sequential proximity exposure system |
FR2831765B1 (en) * | 2001-10-31 | 2004-02-13 | Automa Tech Sa | DEVICE FOR INSOLATING A FACE OF A PANEL |
JP2004062079A (en) * | 2002-07-31 | 2004-02-26 | Nsk Ltd | Proximity exposure device |
JP2004349494A (en) * | 2003-05-22 | 2004-12-09 | Nsk Ltd | Work stage and method for measuring its position, and exposure device equipped with this |
-
2006
- 2006-05-16 JP JP2006136591A patent/JP2007310007A/en active Pending
-
2007
- 2007-04-12 WO PCT/JP2007/058111 patent/WO2007132610A1/en active Application Filing
- 2007-04-12 KR KR1020087024076A patent/KR20080113394A/en active IP Right Grant
- 2007-04-12 CN CN200780012149XA patent/CN101416115B/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9316923B2 (en) | 2010-07-19 | 2016-04-19 | Samsung Display Co., Ltd. | Exposure apparatus and exposure method using the same |
Also Published As
Publication number | Publication date |
---|---|
CN101416115A (en) | 2009-04-22 |
JP2007310007A (en) | 2007-11-29 |
CN101416115B (en) | 2011-03-02 |
WO2007132610A1 (en) | 2007-11-22 |
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