KR20080078330A - Jig for measuring an end length of substrate - Google Patents
Jig for measuring an end length of substrate Download PDFInfo
- Publication number
- KR20080078330A KR20080078330A KR1020070018292A KR20070018292A KR20080078330A KR 20080078330 A KR20080078330 A KR 20080078330A KR 1020070018292 A KR1020070018292 A KR 1020070018292A KR 20070018292 A KR20070018292 A KR 20070018292A KR 20080078330 A KR20080078330 A KR 20080078330A
- Authority
- KR
- South Korea
- Prior art keywords
- substrate
- measuring
- base plate
- ruler
- jig
- Prior art date
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/02—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness
- G01B5/04—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
- G01B5/043—Measuring arrangements characterised by the use of mechanical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving for measuring length
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- A Measuring Device Byusing Mechanical Method (AREA)
Abstract
The measuring jig has a first surface facing the robot hand supporting the substrate and a second surface perpendicular to the first surface, the base plate having a ruler on the second surface, and moving along the base plate. And a measuring bar for coupling with the connecting member and the connecting member and for measuring the scale of the ruler along the second surface.
Description
1 is a schematic diagram illustrating a method of using a measuring jig according to an embodiment of the present invention.
2 is a plan view showing a measuring jig according to an embodiment of the present invention.
Figure 3 is a side view showing a measuring jig according to an embodiment of the present invention.
4 is a perspective view showing a measuring jig according to an embodiment of the present invention.
Explanation of symbols on the main parts of the drawings
10: substrate 11: robot hand
12: exhaust hole 100: jig for measurement
110: base plate 111: first side
112: second side 113: insertion groove
115: guide groove 120: ruler
130: fixing plate 132: screw
200: connecting member 212: screw groove
300: measuring bar 312: coupling screw
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a measuring jig, and more particularly, to a measuring jig capable of measuring the end length of a flat substrate for manufacturing a flat panel display device such as a liquid crystal display device.
Recently, information processing devices have been rapidly developed to have various types of functions and faster information processing speeds. This information processing apparatus has a display device for displaying the operated information. BACKGROUND With the rapid development of semiconductor technology, the use of flat panel displays that are light in weight and small in space is rapidly increasing.
In general, a glass substrate for a display device has a thin film layer made of a photoresist coating liquid, a photosensitive polyamide resin, a color filter chromosome, and the like formed on a main surface of the substrate, and the substrates are loaded in a substrate transfer device and moved in one direction. While going through a post-treatment process, for example, a chemical solution applying process, a washing process and a drying process.
As the demand for flat panel displays increases, its manufacturing facilities are increasingly mass-produced. For example, in-line processing of at least one substrate processing process during a process of moving a substrate using a transport track. type) manufacturing equipment is used.
During the manufacturing process of the in-line flat panel display device, the substrate to be processed is transferred to process chambers that perform each of these processes, and a substrate transfer robot is used to transfer the substrate.
For example, the substrate is transported by vacuum suction while being mounted on the robot hand of the substrate transfer robot. In particular, a substrate coated with a photoresist such as a photoresist is transferred to a chamber for the baking process.
When the substrate is mounted on the robot hand, inaccurate seating may occur due to a slight inclination of the robot hand. In addition, incorrect loading of the substrate may occur due to mechanical errors of the substrate transfer robot or a user's position setting mistake.
Since there is no device for detecting that the substrate is incorrectly loaded in the conventional baking apparatus, the next fixing is performed in a state where a defect is generated in the substrate, thereby reducing the overall yield. Therefore, the position where the substrate is seated on the robot hand is measured in advance, and the substrate transfer robot is controlled using the measured position to prevent defects.
However, conventionally, there is a problem that accuracy is lowered as the user visually measures using a ruler to measure the position or length of the substrate seated on the robot hand.
Embodiments of the present invention to provide a measuring jig that can accurately measure the end length of the substrate.
In order to achieve the object of the present invention, the measuring jig according to the present invention has a first surface facing the robot hand supporting the substrate and a second surface perpendicular to the first surface, and on the second surface. And a base plate having a ruler, a connecting member moving along the base plate, and a measuring bar for engaging with the connecting member and measuring the scale of the ruler along the second surface.
According to one embodiment of the invention, the base plate has a guide groove formed on the opposite surface of the second surface, one end of the connection member is inserted into the guide groove can be moved sliding. In addition, one end of the measurement bar may be screwed with the other end of the connection member.
According to one embodiment of the invention, the base plate may have an insertion groove formed in the second surface so that the ruler is seated.
The end length measuring jig of the substrate according to the present invention configured as described above includes a connecting member moving along the base plate and a measuring bar coupled to the connecting member, and the ruler seated on the base plate indicated by the measuring bar. The scale can be used to measure the length of the substrate exposed from one end of the robot hand.
Hereinafter, a measuring jig according to an embodiment of the present invention will be described in detail with reference to the accompanying drawings. As the inventive concept allows for various changes and numerous embodiments, particular embodiments will be illustrated in the drawings and described in detail in the text. However, it is not intended to limit the present invention to the specific disclosed form, it should be understood to include all modifications, equivalents, and substitutes included in the spirit and scope of the present invention. In describing the drawings, similar reference numerals are used for similar elements. In the accompanying drawings, the dimensions of the structures are shown in an enlarged scale than actual for clarity of the invention.
The terminology used herein is for the purpose of describing particular example embodiments only and is not intended to be limiting of the present invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. In this application, the terms "comprise" or "have" are intended to indicate that there is a feature, number, step, action, component, part, or combination thereof described in the specification, and one or more other features. It is to be understood that the present invention does not exclude the possibility of the presence or the addition of numbers, steps, operations, components, parts, or combinations thereof.
Unless defined otherwise, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art. Terms such as those defined in the commonly used dictionaries should be construed as having meanings consistent with the meanings in the context of the related art and shall not be construed in ideal or excessively formal meanings unless expressly defined in this application. Do not.
1 is a side view showing a method of using a measuring jig according to an embodiment of the present invention. 2 is a plan view showing a measuring jig according to an embodiment of the present invention. 3 is a cross-sectional view showing a measuring jig according to an embodiment of the present invention. 4 is a perspective view showing a measuring jig according to an embodiment of the present invention.
1 to 4, the
The
The
For example, the
According to an embodiment of the present invention, the
The
The measuring
According to one embodiment of the invention, one end of the
According to an embodiment of the present invention, the
The
For example, the substrate may be a flat substrate. In addition, the flat substrate may be a liquid crystal display (LCD), a plasma display (PDP), a vacuum fluorescent display (VFD), a field emission display (FED), or a field emission display. It may be a substrate for manufacturing an electro luminescence display (ELD).
The length of the
Thereafter, the user may perform setting or calibration of the substrate transfer robot using the length measured using the measuring
As described above, the end length measuring jig of the substrate according to the preferred embodiment of the present invention includes a connecting member moving along the base plate and a measuring bar coupled to the connecting member, and the base indicated by the measuring bar is indicated. The scale of the substrate exposed from one end of the robot hand can be measured using the scale of the ruler seated on the plate.
While the foregoing has been described with reference to preferred embodiments of the present invention, those skilled in the art will be able to variously modify and change the present invention without departing from the spirit and scope of the invention as set forth in the claims below. It will be appreciated.
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070018292A KR20080078330A (en) | 2007-02-23 | 2007-02-23 | Jig for measuring an end length of substrate |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020070018292A KR20080078330A (en) | 2007-02-23 | 2007-02-23 | Jig for measuring an end length of substrate |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20080078330A true KR20080078330A (en) | 2008-08-27 |
Family
ID=39880539
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020070018292A KR20080078330A (en) | 2007-02-23 | 2007-02-23 | Jig for measuring an end length of substrate |
Country Status (1)
Country | Link |
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KR (1) | KR20080078330A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101011826B1 (en) * | 2009-09-02 | 2011-02-07 | 김권중 | A jig for woodworking |
CN105571449A (en) * | 2015-12-11 | 2016-05-11 | 中国航空工业标准件制造有限责任公司 | Caliper for measuring riveting height of blind rivet |
-
2007
- 2007-02-23 KR KR1020070018292A patent/KR20080078330A/en not_active Application Discontinuation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101011826B1 (en) * | 2009-09-02 | 2011-02-07 | 김권중 | A jig for woodworking |
CN105571449A (en) * | 2015-12-11 | 2016-05-11 | 中国航空工业标准件制造有限责任公司 | Caliper for measuring riveting height of blind rivet |
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WITN | Withdrawal due to no request for examination |