KR20070053396A - Control method of auto socket off - Google Patents

Abstract

The present invention relates to a method for controlling an automatic socket off, and in the case of a conventional test facility, the automatic socket off is collectively set regardless of the state of the test socket, so that the test socket which has not reached the end of its life can also be turned off together. And because of the problem of the test facility itself, there may be test sockets that do not turn off the test sockets that should be turned off by automatic socket off, but could not screen them.

The present invention is to solve the above problems, the present invention (a) according to the test start signal of the tester, the step of sending the socket reference information to the server, and (b) the server based on the socket reference information, the test socket Calculating socket-off reference information by simulating the lifetime of the module; (c) transmitting the socket-off reference information to the handler; and (d) the handler contacts the semiconductor package to the test socket of the tester to proceed with the test. And (e) the handler determines whether there is a test socket corresponding to the socket off criterion information every time the test is terminated in the test socket. At this time, in step (e), the handler turns off the test socket corresponding to the socket-off reference information. The server receives the socket off status, compares the difference between the socket off reference information, detects the presence of a test socket that is not automatically turned off, and enables the processing of the test socket that is not turned off.

Socket off, handler, simulation, baseline information, lifetime

Description

Control method of auto socket off

1 is a block diagram showing an automatic socket off control system according to the present invention.

2 is a flowchart illustrating an automatic socket off control method according to an embodiment of the present invention of the control system of FIG. 1.

3 is a flowchart illustrating an operation of calculating socket off reference information of FIG. 2.

Description of the main parts of the drawing

10: tester

20: test socket

30: handler

40: server

100: automatic socket off control system

The present invention relates to a semiconductor package test method, and more particularly, to an automatic socket off control method capable of automatically controlling a test socket off during a test process.

In general, a semiconductor package manufactured by a semiconductor package manufacturing process is subjected to various tests in order to confirm the reliability of the product after manufacturing. The test connects all the input and output terminals of the semiconductor package with the test signal generating circuit to check the normal operation and disconnection, and connects some input and output terminals such as the power input terminal of the semiconductor package with the test signal generating circuit. There is a burn-in test that checks the lifetime and bonding of semiconductor packages by applying stress at high temperatures, voltages and currents.

Usually, the above reliability test is carried out with a semiconductor package mounted in a test socket. In general, the shape of the test socket is basically determined according to the shape of the semiconductor package, and serves as a medium for connecting the semiconductor package and the tester by mechanical contact between the external connection terminal of the semiconductor package and the socket lead.

However, as the number of mechanical contacts with the semiconductor package increases, the test socket increases in contact resistance and ages, thereby increasing retesting and lowering equipment efficiency.

To suppress this, set the auto socket off in the handler to automatically turn off the test socket. However, since the conventional automatic socket off is collectively set regardless of the state of the individual test sockets, the test sockets which have not reached their end of life are also turned off together, and the cause of deterioration of equipment efficiency remains.

And there may be test sockets in which the test sockets to be turned off by automatic socket off are not off due to a test fixture problem, but this could not be screened. This leads to an increase in retesting and a reduction in equipment efficiency since the test process proceeds intact in the test socket to be turned off.

Therefore, the first object of the present invention is to be able to automatically turn off the test socket according to the state of the test socket.

A second object of the present invention is to grasp the current state of the test socket is turned off so that the test process can be suppressed from proceeding in the test socket to be off.

In order to achieve the above object, the present invention comprises the steps of (a) the handler transmits the socket reference information to the server according to the test start signal of the tester, and (b) the server simulates the life of the test socket based on the socket reference information Calculating socket-off reference information, (c) transmitting the socket-off reference information to the handler, and (d) the processor contacts the test package of the tester with the semiconductor package to terminate the test; (e) The handler provides an automatic socket off control method including determining whether there is a test socket corresponding to the socket off criterion information each time a test is terminated in the test socket. At this time, in step (e), the handler turns off the test socket corresponding to the socket-off reference information.

In the automatic socket off control method according to the present invention, the socket reference information may include test socket number, test tray number, test cycle (test step), semiconductor package number and yield information.

The automatic socket off control method according to the present invention includes the steps of (f) the tester transmitting the socket off status to the server, and (g) the server is not automatically turned off by comparing the difference between the socket off status and the socket off reference information. Detecting whether there is a test socket, and (h) the server transmits the detection information to the handler so that processing for the test socket that is not turned off can be performed.

Hereinafter, with reference to the accompanying drawings will be described in detail an embodiment of the present invention.

1 is a block diagram illustrating an automatic socket off control system 100 in accordance with the present invention. Referring to FIG. 1, the automatic socket off control system 100 includes a tester 10 and a handler 30 performing a test process for a semiconductor package, and based on socket reference information transmitted from the handler 30. The server 40 is configured to automatically control the off of the test socket 20 by calculating the socket off reference information. The tester 10, the handler 30, and the server 40 are connected online via a network line.

Hereinafter, the automatic socket off control system 100 according to the present invention will be described in detail.

The tester 10 is provided with at least one test socket 20 for mediating electrical connection with the semiconductor package. The tester 10 inputs a test signal to a semiconductor package mechanically contacted with the test socket 20, and receives an output signal corresponding to the test signal to test the defect of the semiconductor package.

The handler 30 sequentially moves the semiconductor package from the supply test tray 50 to the test socket 20 to proceed with the test process by the tester 10. The handler 30 classifies the semiconductor package in which the test process is completed according to a defective quantity and stores the semiconductor package in the storage test tray 60.

The server 40 has a built-in program that calculates the socket-off reference information by simulating the life of the test socket 20 based on the socket reference information. The server 40 transmits the calculated socket off criterion information to the handler 30. The handler 30 receiving the socket off reference information determines whether there is a test socket 20 corresponding to the socket off reference information whenever the test process ends, and the corresponding test socket 20 turns off the socket.

In addition, the server 40 receives the socket off status from the tester 10 and compares the socket off reference information to detect whether there is a test socket that is not automatically turned off. The server 40 transmits the detected information to the handler 30 so that the processing for the test socket 20 that is not socketed off may be performed.

Meanwhile, the server 40 includes a socket storing reference information and a database storing the socket off reference information corresponding thereto. Therefore, when the socket reference information transmitted to the server 40 is the same as the socket reference information stored in the server 40, the handler 30 extracts the stored socket off reference information corresponding to the socket reference information transmitted without simulation from the database. Can be sent to.

The automatic socket off control method using the control system 100 will be described with reference to FIGS. 2 and 3 as follows. 2 is a flowchart illustrating an automatic socket off control method according to an embodiment of the present invention of the control system of FIG. 1. 3 is a flowchart illustrating an operation of calculating socket off reference information of FIG. 2.

The automatic socket off control method according to the present embodiment starts from the step in which the test start signal 71 is transmitted to the handler 30 in the tester 10.

Next, the handler 30 transmits the socket reference information to the server 40 while starting operation 72. The socket reference information includes information related to the life of the test socket, and may include, for example, the number of test sockets, the number of test trays for supply, the test cycle (test step), the number of semiconductor packages, and the yield information.

In operation 73, the server 40 calculates the socket-off reference information through simulation. That is, the server 40 calculates the service life of the test socket based on the received socket reference information 73a (73b) and calculates the socket off reference information (73c).

Next, the server 40 transmits the calculated socket-off reference information to the handler 30.

Next, the handler 30 mechanically contacts the semiconductor package to the test socket connected to the tester 10 to proceed with the test and ends (74 and 75). The test process described above proceeds sequentially.

Next, the handler 30 determines whether there is a test socket corresponding to the socket off criterion information every time the test is terminated in the test socket (76). At this time, the handler 30 sockets off the test socket corresponding to the socket-off reference information (77), and proceeds the test process (71, 74, 75) for the next semiconductor package sequentially.

In addition, the tester 10 transmits the socket off status to the server 40 (78). The server 40 compares the difference between the socket off status and the socket off reference information and detects whether there is a test socket that is not automatically turned off. The server 40 transmits the detection information to the handler 30 so that the processing for the test socket that is not turned off can be performed. For example, a warning sound, an alarm light or a display window can be notified by a message so that the operator can recognize the detection information, or the test socket which is not automatically turned off can be socketed off again.

On the other hand, the embodiments of the present invention disclosed in the specification and drawings are merely presented specific examples to aid understanding, and are not intended to limit the scope of the present invention. In addition to the embodiments disclosed herein, it is apparent to those skilled in the art that other modifications based on the technical idea of the present invention may be implemented.

Therefore, according to the present invention, by automatically calculating the socket-off reference information based on the socket reference information, and determining whether there is a test socket corresponding to the socket-off reference information every time the test process for the semiconductor package is finished, The socket can be turned off automatically according to the state of the socket.

In addition, the server may detect whether there is a test socket that is not automatically turned off by receiving the socket off status information and comparing it with the socket off reference information. By sending this detection information to the handler so that the processing for the test socket that is not turned off can be suppressed, the test process can be suppressed from being performed in the off test socket.

Claims (3)

(a) in response to the test start signal of the tester, the handler sending socket reference information to the server; (b) the server calculating socket off reference information by simulating the life of a test socket based on the socket reference information; (c) sending the socket off criteria information to the handler; (d) contacting the semiconductor package to the test socket of the tester to proceed with the test and terminate; (e) the handler determining whether there is a test socket corresponding to the socket off criterion information each time a test is terminated in the test socket; And the test socket corresponding to the socket off reference information in the step (e) is socketed off. The method of claim 1, wherein the socket reference information includes test socket number, test tray number, test cycle (test step), semiconductor package number, and yield information. The method according to claim 1 or 2, (f) the tester sending a socket off status to the server; (g) comparing, by the server, the difference between the socket off status and the socket off reference information and detecting whether a test socket is not automatically turned off; (h) the server further transmitting the detection information to the handler to allow processing for a test socket that is not off.

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