KR20060057780A - Connector - Google Patents

Connector Download PDF

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Publication number
KR20060057780A
KR20060057780A KR1020040096832A KR20040096832A KR20060057780A KR 20060057780 A KR20060057780 A KR 20060057780A KR 1020040096832 A KR1020040096832 A KR 1020040096832A KR 20040096832 A KR20040096832 A KR 20040096832A KR 20060057780 A KR20060057780 A KR 20060057780A
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KR
South Korea
Prior art keywords
connector
connection member
connection
conductive connection
conductive
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KR1020040096832A
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Korean (ko)
Inventor
이승준
Original Assignee
삼성전자주식회사
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Priority to KR1020040096832A priority Critical patent/KR20060057780A/en
Publication of KR20060057780A publication Critical patent/KR20060057780A/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
    • H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • H01R13/42—Securing in a demountable manner
    • H01R13/428—Securing in a demountable manner by resilient locking means on the contact members; by locking means on resilient contact members
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R43/00—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors
    • H01R43/007—Apparatus or processes specially adapted for manufacturing, assembling, maintaining, or repairing of line connectors or current collectors or for joining electric conductors for elastomeric connecting elements

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)

Abstract

본 발명은, 커넥터(1)에 관한 것으로, 상이한 전기적 연결 대상 부품의 단자에 각각 전기적으로 접촉하는 한 쌍의 접속단을 갖는 도전접속부재(20)와; 상기 도전접속부재를 수용 지지하며, 상기 양 접속단을 제외한 타영역에 대해 외부접근이 가능하도록 검사개방부(12)를 갖는 커넥터본체(10)를 포함하는 것을 특징으로 한다. 이에 의해 전기적인 테스트가 용이해진다.The present invention relates to a connector (1), comprising: a conductive connection member (20) having a pair of connection ends electrically contacting terminals of different electrical connection target parts; It characterized in that it comprises a connector body 10 for receiving and supporting the conductive connection member, and having an inspection opening 12 to enable external access to other areas except the connection ends. This facilitates electrical testing.

커넥터, 도전접속부재, 검사개방부, 점퍼케이블Connector, conductive connection member, inspection opening part, jumper cable

Description

커넥터{CONNECTOR}Connector {CONNECTOR}

도 1은 본 발명의 커넥터를 도시한 사시도이고,1 is a perspective view showing a connector of the present invention,

도 2는 도 1의 커넥터의 도전접속부재를 도시한 사시도이고,FIG. 2 is a perspective view illustrating a conductive connection member of the connector of FIG. 1;

도 3은 본 발명의 커넥터를 도시한 측단면도이다.3 is a side cross-sectional view showing the connector of the present invention.

* 도면의 주요 부분에 대한 부호의 설명* Explanation of symbols for the main parts of the drawings

1 : 커넥터본체 12 : 검사개방부 1: connector body 12: inspection opening

14 : 부품수용부 20 : 도전접속부재14: parts receiving portion 20: conductive connecting member

22 : 제1접속단 24 : 제2접속단22: first connection terminal 24: second connection terminal

26 : 탄성물림부 101 : 점퍼케이블26: elastic stitching 101: jumper cable

본 발명은 커넥터에 관한 것으로, 더욱 상세하게는 전기적인 테스트가 용이한 커넥터에 관한 것이다.The present invention relates to a connector, and more particularly to a connector that facilitates electrical testing.

근래에는 전자기기가 소형화·고집적화되고 있으며, 이에 따라 각 장치에 사용되는 소자 또한 소형화되고 고집적화되고 있다. 이러한 소자들에는 IC(INTERGRATED CIRCUIT)기판이나 반도체칩, PCB(PRINTED CIRCUIT BOARD) 등이 있 으며, 전자기기에 있어 이들의 전기적 접속 상태는 매우 중요하다. 따라서 전자기기의 제조 공정에서 이러한 소자들의 전기적 접속 상태를 측정하고 테스트하는 공정을 거치게 된다. 이 때 여러 종류의 소자들을 테스트하기 위해 커넥터가 널리 사용되고 있다.In recent years, electronic devices have been miniaturized and highly integrated. Accordingly, devices used in each device have also been miniaturized and highly integrated. Such devices include IC (Interrupted Circuit) substrates, semiconductor chips, and printed circuit boards (PCBs), and their electrical connections are very important for electronic devices. Therefore, the manufacturing process of the electronic device goes through the process of measuring and testing the electrical connection state of these devices. Connectors are widely used to test different types of devices.

일반적으로 커넥터는 기판과 기판, 기판과 소자, 소자와 소자를 전기적으로 상호 연결시키는데 사용되며, PCB를 이용하여 반도체칩이나 IC기판 등을 테스트할 경우에도 사용된다.In general, a connector is used to electrically interconnect a board and a board, a board and a device, a device and a device, and is also used when testing a semiconductor chip or an IC board using a PCB.

전자제품의 제조시 멀티미터(MULTI-METER, 전류 및 전압, 저항 등을 측정하는 계측기)나 오실로스코프(OSCILLOSCOPE, 전자장비를 보수하거나 디자인할 때 사용되는 일종의 계측기) 등을 이용하여 이러한 커넥터핀의 연결여부나 파형을 점검하고 있다.The connection of these connector pins using a multimeter (MULTI-METER), an oscilloscope (OSCILLOSCOPE, a type of instrument used to repair or design electronic equipment) in the manufacture of electronic products. Checking whether or not the waveform.

한국특허공개 제 2001-0044284에 따르면, 반도체소자 테스트소켓은, PCB상에 형성된 패턴과 접촉에 의하여 전기적으로 연결될 수 있도록 소켓의 하부에 접촉형 컨텍터를 구비한다. 반도체소자 테스트소켓은 상기 컨텍터에 의하여 패턴과 접촉되고, 상기 소켓의 측면부에 돌출부가 형성되며, 고정체가 상기 소켓의 돌출부에 끼워져 PCB상에 고정되도록 설치되거나, 상기 고정체가 상기 소켓의 돌출부를 눌러 PCB에 누름 고정하도록 구성된다.According to Korean Patent Laid-Open Publication No. 2001-0044284, the semiconductor device test socket has a contact type contactor at the bottom of the socket to be electrically connected by contact with a pattern formed on a PCB. The semiconductor device test socket is contacted with the pattern by the contactor, and a protrusion is formed at the side surface of the socket, and a fixture is installed to fit on the PCB by being fixed to the protrusion of the socket, or the fixture is a protrusion of the socket. It is configured to press and hold onto the PCB.

종래의 테스트소켓은 워낙에 그 크기가 작기 때문에 테스트를 위해 집게가 달린 계측기 등을 사용하기가 어려우므로, 일단의 피복을 벗긴 얇은 테스트용 케이블을 사용하고 있다. 그러나 이러한 종래의 테스트소켓 등은 테스트용 점퍼케이블 을 접속하는 곳이 없어 납땜을 하여 점퍼케이블을 고정하거나 별도의 접속부를 만들어야 하는 불편함이 있다.Since the conventional test socket is so small, it is difficult to use a measuring instrument with a forceps for testing, and thus a thin test cable with a stripped coating is used. However, such a conventional test socket, there is no place to connect the jumper cable for the test, there is an inconvenience to fix the jumper cable by soldering or to make a separate connection.

본 발명의 목적은, 전기적인 테스트가 용이한 커넥터를 제공하는 것이다.It is an object of the present invention to provide a connector that is easy for electrical testing.

상기와 같은 목적을 달성하기 위하여, 본 발명은, 커넥터에 있어서, 상이한 전기적 연결 대상 부품의 단자에 각각 전기적으로 접촉하는 한 쌍의 접속단을 갖는 도전접속부재와; 상기 도전접속부재를 수용 지지하며, 상기 양 접속단을 제외한 타영역에 대해 외부접근이 가능하도록 검사개방부를 갖는 커넥터본체를 포함하는 것을 특징으로 하는 커넥터에 의해 달성된다.In order to achieve the above object, the present invention provides a connector, comprising: a conductive connection member having a pair of connection ends electrically contacting terminals of different electrical connection target components; It is achieved by a connector that accommodates and supports the conductive connecting member, and includes a connector body having an inspection opening to allow external access to other regions except for the connection ends.

상기 도전접속부재는 반복 절곡되어 상기 검사개방부를 통해 삽입되는 검사부재의 단부와 맞물리는 탄성물림부를 포함할 수 있다.The conductive connecting member may be repeatedly bent to include an elastic grip portion engaged with the end of the inspection member inserted through the inspection opening.

이하에서는 커넥터를 본 발명의 일실시예로 하고, 본 발명에 대해 첨부 도면을 참조하여 상세히 설명하기로 한다.Hereinafter, the connector will be described as an embodiment of the present invention, and the present invention will be described in detail with reference to the accompanying drawings.

도 1은 본 발명의 커넥터를 도시한 사시도이고, 도 2는 도 1의 커넥터의 도전접속부재를 도시한 사시도이고, 도 3은 본 발명의 커넥터를 도시한 측단면도이다.1 is a perspective view showing a connector of the present invention, Figure 2 is a perspective view showing a conductive connection member of the connector of Figure 1, Figure 3 is a side cross-sectional view showing a connector of the present invention.

도 1 및 도 2에 도시된 바와 같이, 본 발명의 커넥터(1)는 반도체칩 등과 같은 전기적 연결 대상 부품의 단자(14a)에 각각 전기적으로 연결되는 도전접속부재(20)와, 도전접속부재(20)를 수용 지지하며 검사개방부(12)를 갖는 커넥터본체(10) 를 포함하여 구성된다.As shown in FIGS. 1 and 2, the connector 1 of the present invention includes a conductive connection member 20 electrically connected to a terminal 14a of a component to be electrically connected, such as a semiconductor chip, and a conductive connection member ( 20 is configured to include a connector body (10) for receiving and supporting the inspection opening 12.

커넥터본체(10)는 플라스틱 등과 같은 절연성 소재로 만들어진다. 커넥터본체(10)는 내부에 도전접속부재(20)를 수용하여 그 일부를 커넥터본체(10)의 외부로 노출시킨다. 커넥터본체(10)의 측면에는 도전접속부재(20)의 일영역을 노출시키는 검사개방부(12)가 형성된다. The connector body 10 is made of an insulating material such as plastic. The connector body 10 accommodates the conductive connection member 20 therein and exposes a portion thereof to the outside of the connector body 10. An inspection opening 12 is formed on the side surface of the connector body 10 to expose a region of the conductive connection member 20.

검사개방부(12)는 작은 창 형태로, 후술할 도전접속부재(20)의 탄성물림부(26)의 위치에 각각 대응하여 복수개로 마련된다. The inspection opening part 12 has a small window shape, and is provided in plural in correspondence with the positions of the elastic claws 26 of the conductive connection member 20 to be described later.

또한 커넥터본체(10)의 상면에는 전기적으로 연결되는 각종 부품의 단자(14a)를 수용할 수 있는 부품수용부(14)가 마련된다. 부품수용부(14)를 통해 삽입된 부품단자(14a)는 도전접속부재(20)에 접촉되어 전기적으로 연결된다.In addition, the upper surface of the connector body 10 is provided with a component receiving portion 14 that can accommodate the terminals (14a) of various components that are electrically connected. The component terminal 14a inserted through the component accommodating part 14 is in contact with the conductive connecting member 20 and electrically connected thereto.

도전접속부재(20)는 알루미늄 등과 같은 도전성 재질로, 얇은 판 형상으로 만들어진다. 도전접속부재(20)의 일단은 반복 절곡되어 제1접속단(22)을 형성하며, 타단은 절곡되어 제2접속단(24)을 형성한다. 제1접속단 및 제2접속단(24)은 각각 전기적 소자나 부품, 기판 등과 전기적으로 연결된다. 커넥터본체(10)의 부품수용부(14)를 통해 삽입된 부품단자(14a)가 접촉되는 부분은 절곡된 부분의 후방 영역인 제2접속단(24)이다(도 2 참고). 제1접속단(22)과 제2접속단(24)을 제외한 도전접속부재(20)의 다른 영역은 탄성물림부(26)를 형성한다(도 2 및 도 3 참고).The conductive connecting member 20 is made of a conductive material such as aluminum, and is made in a thin plate shape. One end of the conductive connection member 20 is repeatedly bent to form the first connection end 22, and the other end is bent to form the second connection end 24. The first connection end and the second connection end 24 are electrically connected to an electrical element, a component, a substrate, and the like, respectively. The part where the component terminal 14a inserted through the component receiving portion 14 of the connector body 10 comes into contact with is the second connection terminal 24 which is a rear region of the bent portion (see FIG. 2). Other regions of the conductive connecting member 20 except for the first connecting end 22 and the second connecting end 24 form the elastic stitching portion 26 (see FIGS. 2 and 3).

도 2 및 도 3에 도시된 바와 같이, 탄성물림부(26)는, 제1접속단(22)의 단부가 제1 및 제2 접속단()을 제외한 일영역에 탄성적으로 접촉함으로써 만들어진다. 탄성물림부(26)는 테스트용 점퍼케이블(101)이 삽입될 수 있을 정도의 탄성력을 가 지도록 만들어진다.As shown in FIGS. 2 and 3, the elastic stitching portion 26 is made by elastically contacting one end of the first connection end 22 with one area except for the first and second connection ends. The elastic stitching portion 26 is made to have an elastic force enough to insert the test jumper cable 101.

점퍼케이블(101)은 일종의 테스트 케이블로, 단부의 피복을 벗겨내어 사용하는 케이블이다. 점퍼케이블(101)의 일단은 본 발명의 커넥터(1)에 형성된 검사개방부(12)에 삽입하여 도전접속부재(20)의 탄성물림부(26)에 물림 결합된다. 점퍼케이블(101)이 접촉된 상태에서 테스트할 부품이 커넥터본체(10)의 부품수용부(14)에 삽입된다. The jumper cable 101 is a kind of test cable, and is a cable used by peeling off an end covering. One end of the jumper cable 101 is inserted into the inspection opening 12 formed in the connector 1 of the present invention and is bittenly coupled to the elastic stitching portion 26 of the conductive connection member 20. The part to be tested while the jumper cable 101 is in contact is inserted into the component receiving portion 14 of the connector body 10.

이러한 구성에 의한 본 발명의 일실시예에 따른 커넥터에 있어서, 커넥터의 작동과정에 대해 보다 상세하게 설명하면 다음과 같다.In the connector according to an embodiment of the present invention by such a configuration, the operation of the connector will be described in more detail as follows.

도 1 및 도 2에 도시된 바와 같이, 먼저 커넥터본체(10)에 도전접속부재(20)가 삽입된다. 도전접속부재(20)의 일단은 반복 절곡되어 부품단자(14a)가 접촉되는 제1접속단(22)을 형성하며, 제1접속단(22)이 커넥터본체(10)의 부품수용부(14)를 향하도록 커넥터본체(10)에 삽입된다. 부품수용부(14)를 통해 삽입된 부품단자(14a)가 제1접속단(22)에 접촉하여 전기적으로 연결된다. 도전접속부재(20)의 타단은 절곡되어 인쇄회로기판 등에 접속되는 제2접속단(24)을 형성한다. 제2접속단(24)은 커넥터본체(10)의 저면을 통해 노출된다. 제1접속단(22)의 절곡된 단부는 제1접속단(22) 및 제2접속단(24)을 제외한 도전접속부재(20)의 일영역에 탄성적으로 접촉하여 탄성물림부(26)를 형성한다. 커넥터본체(10)의 검사개방부(12)를 통해 도전접속부재(20)의 탄성물림부(26)가 노출된다. 1 and 2, first, the conductive connection member 20 is inserted into the connector body 10. One end of the conductive connecting member 20 is repeatedly bent to form a first connecting end 22 to which the component terminal 14a is in contact, and the first connecting end 22 is a part accommodating part 14 of the connector body 10. It is inserted into the connector body 10 to face the (). The component terminal 14a inserted through the component accommodating part 14 contacts the first connection terminal 22 and is electrically connected thereto. The other end of the conductive connection member 20 is bent to form a second connection end 24 connected to a printed circuit board or the like. The second connection end 24 is exposed through the bottom surface of the connector body 10. The bent end of the first connection end 22 is elastically contacted with one region of the conductive connection member 20 except for the first connection end 22 and the second connection end 24 so as to be elastically elastic part 26. To form. The elastic engagement portion 26 of the conductive connection member 20 is exposed through the inspection opening portion 12 of the connector body 10.

각종 부품을 테스트하기 위해서 본 발명의 커넥터를 사용할 때, 도 3에 도시된 바와 같이, 커넥터본체(10)의 부품수용부(14)에 테스트가 필요한 부품이 삽입되 어 제1접속단(22)과 연결되고, 제2접속단(24)은 인쇄회로기판 등에 연결된다. 그리고 테스트용 점퍼케이블(101)이 커넥터본체(10)의 검사개방부(12)를 통해 도전접속부재(20)의 탄성물림부(26)에 접촉된다. 따라서 삽입 부품의 전기적 연결상태가 점퍼케이블(101)에 의해 계측될 수 있다.When the connector of the present invention is used to test various parts, as shown in FIG. 3, a part to be tested is inserted into the part accommodating part 14 of the connector body 10, so that the first connection end 22 is inserted. The second connection terminal 24 is connected to a printed circuit board or the like. The test jumper cable 101 is in contact with the elastic portion 26 of the conductive connection member 20 through the inspection opening 12 of the connector body 10. Therefore, the electrical connection state of the insert can be measured by the jumper cable 101.

이에 의해 도전접속부재에 외부접근이 용이하므로 전기적인 테스트가 용이해진다.This facilitates external access to the conductive connecting member, thereby facilitating electrical testing.

전술한 실시예에서 커넥터의 형상은 본 발명의 실시범위 내에서 연결되는 부품 및 소자 등에 의해 변형될 수 있다.In the above-described embodiment, the shape of the connector may be modified by components and elements connected within the scope of the present invention.

또한 전술한 실시예에서 도전접속부재는 반복 절곡되어 탄성물림부를 형성한다고 하였으나, 일단이 원형으로 감겨 탄성물림부를 만들 수도 있다.In addition, in the above-described embodiment, the conductive connection member is repeatedly bent to form an elastic portion, but one end may be wound in a circular shape to make the elastic portion.

전술한 실시예에서 제2접속단에는 삽입되는 부품이 접속되고, 제1접속단에는 인쇄회로기판이 접속된다고 하였으나, 제1 및 제2 접속단에 테스트가 필요한 부품이나 인쇄회로기판 중 어느 것이 접속되어도 무방하다.In the above-described embodiment, although the component to be inserted is connected to the second connection end and the printed circuit board is connected to the first connection end, either the part or the printed circuit board that requires the test is connected to the first and second connection ends. It may be.

이상 설명한 바와 같이, 본 발명의 일실시예에 따른 커넥터에 있어서, 검사개방부가 마련된 커넥터가 제공되어 도전접속부재에 외부접근이 용이하므로 전기적인 테스트가 용이해진다.As described above, in the connector according to the exemplary embodiment of the present invention, a connector provided with an inspection opening is provided to facilitate external access to the conductive connection member, thereby facilitating an electrical test.

Claims (2)

커넥터에 있어서,In the connector, 상이한 전기적 연결 대상 부품의 단자에 각각 전기적으로 접촉하는 한 쌍의 접속단을 갖는 도전접속부재와;A conductive connection member having a pair of connection ends that are in electrical contact with terminals of different electrical connection target parts, respectively; 상기 도전접속부재를 수용 지지하며, 상기 양 접속단을 제외한 타영역에 대해 외부접근이 가능하도록 검사개방부를 갖는 커넥터본체를 포함하는 것을 특징으로 하는 커넥터.And a connector body accommodating and supporting the conductive connection member, the connector body having an inspection opening to allow external access to other regions except for the connection ends. 제1항에 있어서,The method of claim 1, 상기 도전접속부재는 반복 절곡되어 상기 검사개방부를 통해 삽입되는 검사부재의 단부와 맞물리는 탄성물림부를 포함하는 것을 특징으로 하는 커넥터.The conductive connection member is a connector, characterized in that it comprises a resilient engaging portion that is repeatedly bent and engaged with the end of the inspection member inserted through the inspection opening.
KR1020040096832A 2004-11-24 2004-11-24 Connector KR20060057780A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008062980A1 (en) * 2006-11-20 2008-05-29 Leeno Industrial Inc. Independent module socket by using clip and probe

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008062980A1 (en) * 2006-11-20 2008-05-29 Leeno Industrial Inc. Independent module socket by using clip and probe

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