KR20050116488A - A probe and an assembly body of probe with using the above probe - Google Patents

Abstract

The present invention relates to a probe and a probe assembly using the same.

In particular, the first ground end protrudes above one end of the needle plate having a predetermined height, and the second ground end corresponding to the height of the ground end plus the height of the needle plate is added to the lower end of the other end of the needle plate. The first and second ground ends may protrude and have elasticity as predetermined grooves formed in the needle plate.

In addition, to provide a probe assembly consisting of a plurality of probe assembly structure as described above.

Accordingly, the assembly of the probe assembly can be quickly performed to improve productivity as well as to accurately align the probe assembly to improve reliability.

Description

A probe and an assembly body of probe with using the above probe}

The present invention relates to a probe used for inspecting a flat object such as a liquid crystal display panel and a probe assembly using the same. More specifically, a first ground end protrudes from an upper end of a needle plate having a predetermined height. The second ground end corresponding to the height of the ground end plus the height of the needle plate protrudes below the other end of the needle plate, and the first and second ground ends are predetermined recesses formed in the needle plate. Providing a probe and a probe assembly for supporting the probe as a support plate to quickly assemble the assembly of the probe assembly to improve productivity as well as to accurately align the probe assembly to improve the reliability and the probe assembly using the same It is about.

In general, LCDs (liquid crystal displays), which are mainly used as video display devices such as small televisions or notebook computers, have dozens or hundreds of connections for applying electrical signals (video signals, synchronization signals, color signals, etc.) to the edges. Terminals are arranged at high density, and these LCDs are prepared with a probe block to test and test for screen defects by applying test signals before mounting them on the product.

In this way, the conventional probe block for inspecting the LCD is provided with needles in the form of wires, and these needles are bonded and fixed by epoxy resins, so that the outer diameter of the needles is limited. There is no problem.

That is, the mounting surface of the needle holder on which the needle is mounted is limited. If the LCD is highly integrated, the number of terminals is very large and densely formed, so that it is hardly possible to arrange the proper number with the wire type needle.

In order to solve such problems, Patent Publication No. 2003-37279 discloses an LCD inspection probe card, the configuration of which comprises: an assembly holder 10;

A needle holder 30 in which an epoxy 31 is filled in the concave space of the substrate holder 20 and the bottom which are fastened and fixed to the bottom of the assembly holder 10;

A circuit board 40 attached to a bottom surface of the substrate holder 20 and having a drive IC attached to an upper surface thereof;

The upper surface bonded to the bottom surface of the needle holder 30 is formed in a plurality of needle insertion grooves 51 of the long hole is downwardly inclined upwardly uniformly in one direction, both sides of the same horizontal line as the needle insertion groove 51 An alignment groove 53 is formed at an outer end surface, and a guide plate 50 provided at an end of the needle insertion groove 51 so as to penetrate downward;

Inserted downward into the needle insertion groove 51 of the guide plate 50 is formed so that both sides can be bent up and down, and one end is extended downward to penetrate downwardly to the front end of the guide plate 50 The LCD connection end 61 is formed to protrude downwardly from the bottom of the guide plate 50 through the guide hole 52, and the other end thereof protrudes upward from the upper surface of the guide plate 50. 62 is formed, the rear end side upper surface of the needle holder 30 is provided with a latching jaw (63) to be in close contact with the outer surface of the needle holder 30 to protrude upward, and to the upper to support the epoxy Connection tip 64 is made of a configuration including a needle plate 60 protruding.

However, the probe card as described above is arranged in the guide plate 50 of the needle insertion groove 51 at a predetermined interval so that the degree of integration cannot be maximized, and the substrate connection end 62 is to maintain a predetermined elasticity. Since the overall length of the needle plate 60 is increased by being lengthened, there is a concern that the characteristics of the probe may be degraded, and the formation of the guide plate 50 having the needle insertion groove 51 becomes difficult, and the substrate holder 20 and There is a problem in that it can be applied only to the probe card having a predetermined gap between the needle holder (30).

An object of the present invention for solving the above problems is to provide a probe that can be easily assembled at a low cost as well as easy assembly of the probe assembly, to significantly reduce the length of the probe than conventional methods, the material Is made of Be-Cu to minimize resistance as well as to enable accurate signal transmission.

In addition, the present invention allows the assembly of the probe assembly to be quickly performed to improve productivity, the tip of the probe can be reliably in contact with the terminal electrode of the panel, the probe of the probe assembly is always in the correct position to measure It is to provide a probe assembly which is always accurate.

In order to achieve the above object, a first ground end protrudes above one end of the needle plate having a predetermined height, and a height corresponding to the height of the needle end plus the height of the ground end below the other end of the needle plate. The second ground end protrudes, and the first and second ground ends provide a probe having elasticity as a predetermined recess formed in the needle plate.

In addition, the present invention, a probe;

A guide plate having a plurality of slots spaced apart in the longitudinal direction to accommodate the probe, and having a ground end insertion groove interposed between the slots; and

It provides a probe assembly consisting of a configuration including a support plate for supporting the probe on the guide plate.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

As shown in FIG. 3, in the probe 100 of the present invention, the first ground end 130 protrudes from one end of the needle plate 110 having a predetermined width and length, and the needle plate 110 may be formed. The second ground end 150 protrudes to have the same height as the height h1 of the needle plate plus the height h1 of the first ground end below the other end.

The first and second ground ends 130 and 150 are installed to have elasticity as predetermined groove portions 140 and 160 formed at both ends of the needle plate 110, respectively.

In addition, inclined surfaces 140a and 160a are formed in the recesses 140 and 160, respectively.

In addition, the first and second ground ends 130 and 150 are formed in an arc shape so as to prevent damage to the terminal during contact, and are inclined outward toward the top.

On the other hand, the probe 100 according to another embodiment of the present invention, as shown in Figure 7a, the first height having the same height above the one end and the other end of the needle plate 110 having a predetermined width and length The ground end 130 is formed to protrude from each other.

Referring to the operation of the same probe as described above is as follows.

As shown in FIG. 3, the first and second ground ends 130 and 150 are maintained at a predetermined elasticity by predetermined recesses 140 and 160 respectively formed at both ends of the needle plate 110. .

When the first and second ground terminals 130 and 150 are press-fitted through the inclined surfaces 140a and 160a respectively formed in the recesses 140 and 160, the LCD increases the amount of movement thereof and the ground terminal is grounded. Prevent damage to the PCB ground plane.

In addition, the first and second ground ends 130 and 150 have end portions formed in an arc shape so as to prevent damage to the terminals upon contact.

In addition, the first and second ground ends 130 and 150 are formed to be inclined outwardly toward the top to move while having a predetermined stroke when mounted in the slot of the guide plate.

In addition, the probe has a compact arrangement of the needle plate in such a configuration that the second ground end 150 protrudes to have the same height as the height h1 of the needle plate plus the height h2 of the needle plate. It will be possible to improve the density.

On the other hand, the probe 100 of the present invention, as shown in Figure 7a, the first ground end 130 having the same height above the one end and the other end of the needle plate 110 having a predetermined width and length is Each protrudes and can be easily mounted regardless of the direction.

Hereinafter, a probe assembly using the probe of the present invention will be described.

As shown in FIGS. 4 to 8, the probe assembly according to the present invention has a stack structure of the probe 100, the guide plate 200, and the support plate 300.

The assembly holder 10, the needle holder 30, and the substrate holder 20 to which the probe assembly of the present invention is applied have been described using the same reference numerals as before.

The probe 100 has a first ground end 130 protruding from one end of the needle plate 110 having a predetermined width and length, and a lower end of the first ground end of the needle plate 110. The second ground end 150 protrudes to have the same height as the height h1 plus the height h2 of the needle plate.

The first and second ground ends 130 and 150 are installed to have elasticity as predetermined groove portions 140 and 160 formed at both ends of the needle plate 110, respectively.

In addition, inclined surfaces 140a and 160a are formed in the recesses 140 and 160, respectively.

In addition, the first and second ground ends 130 and 150 are formed in an arc shape so as to prevent damage to the terminal during contact, and are inclined outward toward the top.

The guide plate 200, the plate body 250 is formed to have a height equal to or less than the width of the probe 100, the plurality of slots 210 are spaced apart in the longitudinal direction to accommodate the probe 100 The upper and lower through-holes are formed, and the ground end insertion groove 230 is interposed between the slots 210.

In addition, a plurality of guide plates 200 through which the slot 210 and the ground end insertion groove 230 are formed are alternately stacked.

In addition, the guide plate 200, as shown in Figure 7a, a plurality of slots 210 are continuously formed through.

In addition, the guide plate 200, as shown in Figure 8a, the slot 230 which is opened in one direction and the ground end insertion groove 210a which is connected to it while being opened in the other direction are alternately formed at predetermined intervals on both sides. The latching jaw 200a is integrally formed at one side of the slot 230.

The support plate 300 is made of a plate having a predetermined thickness that is bonded to both side surfaces of the guide plate 200, respectively.

Subsequently, the support plate 300 includes a film having the same area as one surface of the guide plate 200 while having the ground end insertion groove 330a inserted thereinto allow the first and second ground ends 130 and 150 to be inserted therein. 330, a way, a ceramic plate, or any one selected.

Referring to the operation of the probe assembly having the same configuration as described above are as follows.

As shown in Figure 4, the present invention, when the probe assembly is fixed to the needle holder 30 supported by the assembly holder 10, the probe at the ground end of the substrate 40 and the LCD plate mounted on the substrate holder 20 The second and first ground terminals 150 and 130 of the 100 are respectively grounded to test the circuit connection state of the LCD.

Then, the probe 100 is first inserted in the upper and lower portions of the plurality of guide plates 200, respectively.

In this case, the guide plate 200 into which the probe 100 is inserted is formed so that the ground end insertion groove 230 and the slot 210 are alternately positioned when they are in close contact with each other to protrude upward from the guide plate 200. The two ground ends 150 penetrate the ground end insertion grooves 230 of the guide plate 200 positioned at the upper portion thereof, and are exposed to the upper portion thereof.

On the contrary, the second ground end 150 of the probe 100 inserted into the upper guide plate 200 is also penetrated through the ground end insertion groove 230 of the guide plate 200 positioned below the lower guide end 200. Will be exposed.

In this case, the first ground end 130 exposed to the upper portion of the upper guide plate and the first ground end 130 exposed to the lower guide plate is a second ground end exposed to the upper portion of the guide plate 200 at one side thereof. It will have the same height as 150.

And, the probe 100 to maintain a predetermined gap by the guide plate 200 is prevented from being separated by the support plate 300 bonded to the upper portion of the guide plate 200.

In this case, the support plate 300 has a smaller area than the guide plate 200 to prevent interference with the first and second ground terminals exposed to one side of the guide plate 200.

In addition, the support plate 300 may be formed of a film 330 having a predetermined ground end insertion groove 330a to be formed in the same area as the guide plate 200 by preventing interference with the guide plate 200. .

Meanwhile, as shown in FIGS. 7A and 7B, the guide plate 200 of the present invention has the same height at one end of the needle plate 110 and the other end of the lower end of the needle plate 110 in a configuration in which the slots 210 penetrate at predetermined intervals. When the first ground end 130 having a probe 100 is mounted protruding, respectively, it can be easily mounted regardless of the mounting direction.

The support plates 300 are mounted on upper and lower sides of the guide plate, respectively, to prevent the probe 100 from being separated, and the support plate 300 includes a film 330 having a predetermined ground end insertion groove 330a. ), The way, ceramic plate is made of any one selected to prevent interference with the guide plate 200.

In addition, in the guide plate 200 of the present invention, as shown in Figure 8a, 8b, the slot 230 opening in one direction and the ground end insertion groove 210a opening in the other direction while being connected thereto have a predetermined interval on both sides. The probes 100 are alternately formed and inserted into the support 100 in one direction.

At this time, the latching jaw 200a formed at one side of the slot 230 prevents one-way detachment of the probe 100, and the depth of the slot and the height of the locking jaw are formed to be the same to expose the first and second ground ends. The height is the same.

In addition, the guide plate 200, the slot 230 and the ground end insertion groove (210a) are formed alternately at both sides with a predetermined interval so that the first and second ground ends alternately protrude from the upper and lower surfaces.

Subsequently, support plates 300 are mounted on upper and lower side surfaces of the guide plate to prevent separation of the probe 100, and the support plate 300 includes a film having a predetermined ground end insertion groove 330a. 330, the way, the ceramic plate is made of any one selected to prevent interference with the guide plate 200.

According to the present invention as described above, the production of the probe assembly at a low cost, the assembly operation of the probe assembly is made quickly, the productivity is improved.

In addition, the tip of the probe is firmly in contact with the terminal electrode of the panel to improve the reliability, by attaching a plurality of probe tip by the film to reduce the weight as well as the cost, the probe of the probe assembly is always in the correct position The measurement is always accurate.

In addition, the alignment of the probes is easy, and a number of calibration operations ensure that the tip is always positioned at the correct position, thereby preventing assembly defects, and other flat plate shapes such as integrated circuits as well as probes and probe assemblies used for inspection of liquid crystal display panels. The present invention can also be applied to probes and probe assemblies used for inspecting a subject.

While the invention has been shown and described with respect to specific embodiments thereof, it will be apparent to those skilled in the art that various changes and modifications can be made without departing from the spirit or scope of the invention as provided by the following claims. I would like to clarify that those who have knowledge of this can easily know.

1 is a perspective view and a sectional view showing a conventional probe card

2A and 2B are perspective views showing a conventional guide plate and a needle plate, respectively.

3 is a perspective view showing a probe according to the present invention.

Figure 4 is a side view showing the installation state of the probe assembly formed by assembling the probe according to the present invention.

5 and 6 are exploded state and bonded state cross-sectional view of the probe assembly according to the present invention, respectively.

Figure 7a, b is an exploded view and a bonded state cross-sectional view of the probe assembly according to another embodiment of the present invention, respectively.

8A and 8B are exploded and coupled state cross-sectional views of the probe assembly according to another embodiment of the present invention, respectively.

* Description of the symbols for the main parts of the drawings *

110 Needle plate 140,160 Grooves

200 ... Guide plate 210 ... Slot

230 ... Ground end insertion groove 300 ... Support plate

330 Film

Claims (12)

The first ground end 130 protrudes above one end of the needle plate 110 having a predetermined width and length, and has a height different from that of the first ground end 130 below the other end of the needle plate 110. The second ground end 150 having a protruding, The first and second ground ends (130) (150) are probes installed to have elasticity as recesses (140) (160) respectively formed at both ends of the needle plate (110). The probe according to claim 1, wherein inclined surfaces (140a) (160a) are formed in the recesses (140) (160), respectively. The second ground terminal 150 of claim 1, wherein the probe has a height equal to the height h1 of the needle plate 110 plus the height h1 of the first ground terminal 130. Probe, characterized in that. The first ground end 130 is protruded to one end up and down and the other end of the needle plate 110 having a predetermined width and length, respectively, The first and second ground ends (130) (150) are probes installed to have elasticity as recesses (140) (160) respectively formed at both ends of the needle plate (110). In the probe assembly to be assembled to the needle holder (30) supported by the assembly holder 10 to sense the circuit state of the LCD, The first ground end 130 protrudes above one end of the needle plate 110 having a predetermined width and length, and has a height different from that of the first ground end 130 below the other end of the needle plate 110. A probe (100) having a second ground end (150) having a protrusion and having recesses (140) (160) respectively installed at both ends of the needle plate (110); A guide in which a plurality of slots 210 are penetrated and spaced apart from each other in the longitudinal direction of the plate body 250 formed to accommodate the probe 100, and a ground end insertion groove 230 is interposed between the slots 210. Plate 200; And, It characterized in that it comprises a support plate 300 is bonded to both sides of the guide plate 200 to prevent the separation of the probe 100 without interference with the first and second ground end (130, 150) Probe assembly. The second ground terminal 150 of claim 5, wherein the probe has a height equal to the height h1 of the needle plate 110 plus the height h1 of the first ground terminal 130. Probe assembly, characterized in that. The probe assembly of claim 5, wherein the guide plate (200) is formed by alternately stacking a plurality of guide plates through which the slot (210) and the ground end insertion groove (230) are formed. The method of claim 5, wherein the support plate 300 is selected from the film 330, the way, the ceramic plate, etc. having the ground end insertion groove 330a so that the first and second ground ends 130 and 150 are inserted. Probe assembly, characterized in that made as one. In the probe assembly to be assembled to the needle holder (30) supported by the assembly holder 10 to sense the circuit state of the LCD, The first ground end 130 protrudes from one end up and down and the other end of the needle plate 110 having a predetermined width and length, and grooves 140 and 160 are formed at both ends of the needle plate 110, respectively. Probes 100 are respectively formed; A guide plate 200 spaced apart in the longitudinal direction of the plate body 250 formed to accommodate the probe 100 and having a plurality of slots 210 therethrough; And, It characterized in that it comprises a support plate 300 is bonded to both sides of the guide plate 200 to prevent the separation of the probe 100 without interference with the first and second ground end (130, 150) Probe assembly. In the probe assembly to be assembled to the needle holder (30) supported by the assembly holder 10 to sense the circuit state of the LCD, The first ground end 130 protrudes above one end of the needle plate 110 having a predetermined width and length, and has a height different from that of the first ground end 130 below the other end of the needle plate 110. Probe 100 having a second ground end 150 is protruding, grooves 140 and 160 are respectively installed on both ends of the needle plate 110 A support plate 200 alternately formed at both sides with a slot 230 which is opened in one direction to receive the probe and a ground end insertion groove 210a which is connected to the slot 230 and penetrates in another direction; It characterized in that it comprises a support plate 300 is bonded to both sides of the guide plate 200 to prevent the separation of the probe 100 without interference with the first and second ground end (130, 150) Probe assembly. The second ground terminal 150 of claim 10, wherein the probe has a height equal to the height h1 of the needle plate 110 plus the height h1 of the first ground terminal 130. Probe assembly, characterized in that. The probe assembly of claim 10, wherein the slot (230) is closed in one direction as a locking jaw (200a) having a predetermined height, and the depth of the slot and the height of the locking jaw are formed to be the same.