KR20050104574A - Method for repairing of lcd - Google Patents

Abstract

The present invention discloses a repair method of a liquid crystal display device for recovering pixel defects due to open defects. In the repair method of the present invention, the tape is placed in a state in which a tape having a sample of the same material adhered to the open defect occurrence point on the thin film transistor array substrate is placed on the thin film transistor array substrate. Annealing and re-bonding the open defect with the same material.

Description

Repair method of liquid crystal display device {Method for repairing of LCD}

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a liquid crystal display device, and more particularly, to a repair method for recovering a pixel defect caused by an open defect.

Liquid crystal displays (hereinafter, LCDs) are used for terminals or video devices of various information devices in place of the CRT (Cathod-ray tube) because they have characteristics such as light weight, thinness, and low power consumption. In particular, a TFT-LCD equipped with a thin film transistor (TFT) as a switching element for each pixel is not only excellent in response characteristics but also suitable for high pixel number, so that a display device of high quality and large size comparable to the CRT can be obtained. Can be realized.

Such a TFT-LCD includes a TFT array substrate, a color filter substrate, and a liquid crystal layer interposed between the substrates.

Meanwhile, in fabricating the TFT array substrate, defects are frequently generated in pixel ITO electrodes due to process problems. Such pixel defects may be divided into short defects and open defects. The short defects may be easily recovered through laser repair, while the open defects may be easily recovered. Defects are not easy to repair.

By the way, when a pixel defect occurs due to the opening of the pixel ITO electrode, a bright spot type defect in which the pixel does not operate and dies is caused. As a result, the display characteristic of the TFT-LCD is caused.

Therefore, conventionally, the above-described open defects are solved by separating the bonding defects and then bonding the separated defects with another metal material.

However, such a conventional repair method requires not only equipment for depositing a bonding material, for example, sputtering equipment and a corresponding equipment, but also equipment for patterning the bonding material, and thus a process addition has to be made. Not efficient.

In particular, the above-mentioned conventional repair method may be possible, but the contact resistance is inevitably increased with respect to the contact between two different metal materials, which degrades the electrical characteristics of the liquid crystal display.

Accordingly, an object of the present invention is to provide a repairing method of a liquid crystal display device, which is designed to solve the problems of the prior art and which can easily recover a pixel defect caused by opening of a pixel ITO electrode.

In addition, another object of the present invention is to provide a repair method of a liquid crystal display device which can increase the efficiency of the repair itself.

In addition, the present invention provides a repair method of a liquid crystal display device that can easily recover a pixel defect by opening the pixel ITO electrode and at the same time improve the efficiency of the repair itself, thereby improving display characteristics and product reliability. There is this.

In order to achieve the above object, the present invention is a repair method of a liquid crystal display device for recovering a pixel defect due to the open defect, the present invention is made of the same material as the material of the member in which the open defect is generated under the adhesive on the substrate The present invention provides a repairing method for a liquid crystal display device, wherein the tape is attached to the open material by laser annealing in a state in which a tape on which a sample is attached is disposed at an open defect occurrence point on a thin film transistor array substrate.

Here, the substrate is made of glass or plastic material, the adhesive is made of a material that reacts to heat or light.

The sample has a square or rectangular wiring width and is made of any one of a gate metal, a source / drain metal, or an ITO metal.

In the repairing method of the liquid crystal display according to the present invention described above, after the laser annealing, the cleaning process is further performed.

In addition, in order to achieve the above object, the present invention is a repair method of a liquid crystal display device for recovering a pixel defect caused by the open defect of the pixel ITO electrode, the sample of the ITO material on the substrate under the adhesive; The present invention provides a repairing method for a liquid crystal display device, wherein the tape is reannealed to the same ITO by laser annealing the tape while the attached tape is disposed at an open defect occurrence point on the thin film transistor array substrate.

(Example)

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

First, the technical principle of the present invention will be briefly described. In the present invention, a sample of an ITO material of the same material is disposed on a member having an open defect, for example, a pixel ITO electrode, at the open failure occurrence point. In an embodiment, the open defect of the pixel ITO electrode is recovered by laser annealing and rebonding the ITO sample.

That is, according to the present invention, an ITO sample is disposed on a pixel ITO electrode having an open defect and another pixel ITO electrode adjacent thereto, and then the pixel ITO electrode having an open defect is formed by laser annealing and melting the ITO sample. The open defect is recovered by bonding with another neighboring pixel ITO electrode.

In this way, there is no need to deposit and pattern a separate metal film for repair, thereby solving the inefficiency caused by the addition of a metal film deposition apparatus and a metal film pattern process, and also repairing with the same material as the open material. It is possible to solve the problem of increasing the contact resistance and deteriorating electrical characteristics of the liquid crystal display.

In detail, FIGS. 1 and 2 are views for explaining a repair method according to the present invention.

First, as shown in FIG. 1, the present invention provides a repair tape 10 having a sample 3 of ITO made of the same material as the pixel ITO electrode attached to the substrate 1 with an adhesive 2 interposed therebetween. . Here, the substrate 1 is made of glass or plastic, and the adhesive 2 is made of a material that reacts to heat or light. The ITO sample 3 is provided to have a square or rectangular wiring width as an ITO pattern.

Next, as shown in FIG. 2, the repair tape 10 described above is disposed at an open failure occurrence point of the TFT array substrate 20. FIG. In this case, the repair tape 10 may be disposed so as to be positioned on the corresponding pixel ITO electrode where the open failure occurs and other pixel ITO electrodes adjacent thereto. In this state, laser annealing is applied to the repair tape 10, and through this, the ITO sample 3 is melted, thereby joining the pixel ITO electrode where the open defect has occurred to another neighboring pixel ITO electrode. The defective open of the pixel ITO electrode is recovered.

Thereafter, a cleaning process is performed on the TFT array substrate on which the laser annealing is performed to complete the repair of the pixel ITO electrode.

Here, since the repair of the pixel ITO electrode is made of the same material, that is, ITO, there is no increase in contact resistance, and therefore, no electrical deterioration in the completed liquid crystal display device is caused, and thus, the liquid crystal display device. It is possible to improve the display characteristics of.

In addition, since the repair of the pixel ITO electrode is not performed by depositing and patterning a separate metal film, the efficiency degradation due to the addition of equipment and processes is not caused.

Meanwhile, in the above-described embodiment of the present invention, the pixel ITO electrode has been described as an example of the repair failure of the open defect, but the repair tape and the repair method using the same may be applied to the failure of the gate bus line and the data bus line. have. At this time, when repairing an open defect of the gate bus line and the data bus line, the sample on the repair tape is replaced with a gate metal or a source / drain metal.

In addition, although the laser is used as a heat source for melting the repair tape in the embodiment of the present invention described above, it is also possible to use an electron beam.

As described above, since the present invention recovers the open defect by laser annealing a repair tape having a sample of the same material as the member having the open defect, there is no need for a separate metal film deposition and patterning for the repair itself. In addition to increasing efficiency, pixel defects can be easily removed.

In addition, since the present invention repairs with the same material as the member in which the open defect has occurred, it is possible to prevent an increase in contact resistance and the like, thereby improving the electrical characteristics of the liquid crystal display device.

In addition, the present invention can eliminate pixel defects and can prevent the deterioration of electrical characteristics during repair, thereby improving the display characteristics of the liquid crystal display device as well as product reliability.

In addition, this invention can be implemented in various changes in the range which does not deviate from the summary.

1 is a cross-sectional view for explaining a repair tape according to the present invention.

2 is a view for explaining a repair method according to the present invention.

Explanation of symbols on the main parts of the drawings

1 substrate 2 bonding agent

3: sample 10: repair tape

20: array substrate

Claims (8)

A repair method of a liquid crystal display device for recovering a pixel defect caused by an open failure, Laser-annealed the tape in a state in which a tape having a sample of the same material as the material of the member in which the open failure occurred through the adhesive on the substrate was disposed at an open failure occurrence point on the thin film transistor array substrate. Repairing method of a liquid crystal display device, characterized in that the re-bonding. The method of claim 1, wherein the substrate is made of glass or plastic. The method of claim 1, wherein the adhesive is made of a material that reacts with heat or light. The method of claim 1, wherein after the laser annealing is performed, a cleaning process is further performed. The method of claim 1, wherein the sample has a square or rectangular wiring width. The method of claim 1, wherein the sample is one selected from the group consisting of a gate metal, a source / drain metal, and an ITO metal. A repair method of a liquid crystal display device for recovering a pixel defect caused by an open failure of a pixel ITO electrode, Characterized by re-bonding the open defects to the same ITO by laser annealing the tape in a state in which a tape having an ITO material attached thereto is placed on a substrate at an open defect occurrence point on the thin film transistor array substrate. Repair method of liquid crystal display device. 8. The method of claim 7, wherein the laser annealing is performed to re-join the open defect, and then a cleaning process is further performed.