KR20050068086A - Apparatus and method for diagnosing lcd module - Google Patents

Abstract

The present invention relates to a method and apparatus for inspecting an LCD module for accurately identifying a defective state by inspecting a dot-by-dot constituting an LCD module and generating a clustered area composed of a plurality of dots and inspecting the clustered area. In the LCD module inspection method comprising the image quality visual inspection process is performed for each unit process during the process, the first reference data which is the reference luminance value for each dot, the second reference data and the luminance value for each first cluster region by photographing the good LCD A reference data generation process of generating and storing third reference data which is a luminance value for each of the two clustered regions; A calibration process of digitizing and capturing an image signal of an inspection LCD captured by a camera; And converting the captured image signal into a digital signal, extracting luminance values for each dot to generate first comparison data, extracting luminance values for each first cluster region, and generating second comparison data; After extracting the luminance value for each region to generate third comparison data, the luminance deviation for determining whether the first, second and third comparison values are compared with the first, second and third reference data registered in advance. The value is calculated as the first, second, and third luminance deviation reference values, and the LCD module failure status is analyzed by comparing the calculated first, second, and third luminance deviation reference values with the measured luminance level difference. Characterized in that it consists of a failure state analysis process that outputs.

Description

Apparatus and method for diagnosing LCD module

The present invention relates to an LCD module inspection method and apparatus.

More specifically, the LCD module inspection to accurately identify the defective state for each type caused by various causes by inspecting each dot area constituting the LCD module and a cluster area composed of a plurality of dots and inspecting the cluster area. A method and apparatus are disclosed.

In general, LCD module defects come in many forms and various assembly processes cause defects such as foreign objects, stains, and cracks.

Most LCD modules are visually inspected by the inspector. After fixing the LCD panel to the inspection fixture, the LCD panel is irradiated with light with a predetermined brightness, and the visual position of the inspector is changed little by little to determine whether there is a defect on the LCD panel. Depending on the reprocessing or disposal decision.

As described above, when the LCD module is manufactured, defects caused by foreign matters or stains during the process of each process are minute, so there is a problem in that it is not easy to discriminate with the eyes of the inspector.

Accordingly, the present invention has been made to solve the problems of the prior art as described above, the object of the present invention is to generate a clustered area consisting of a plurality of dots and the inspection by dots constituting the LCD module to inspect by the clustered region The present invention provides an LCD module inspection method and apparatus for accurately identifying a defective state.

One embodiment of the present invention for achieving the above object, by taking a good LCD, the first reference data which is the reference luminance value for each dot, the second reference data and the second cluster region for each luminance value of each first cluster region A reference data generation process of generating and storing third reference data which is a luminance value; A calibration process of digitizing and capturing an image signal of an inspection LCD captured by a camera; And converting the captured image signal into a digital signal, extracting luminance values for each dot to generate first comparison data, extracting luminance values for each first cluster region, and generating second comparison data; After generating luminance comparison values for each region to generate third comparison data, the LCD module failure status is analyzed by comparing the first, second, and third comparison values with pre-registered first, second, and third reference data. And, characterized in that consisting of a failure state analysis process for outputting the analysis results.

In addition, the failure state analysis process, if the result of the comparison of the first comparison data and the first reference data, if the luminance level difference is determined to be greater than the first data allowance deviation so that the screen indicating that the failure due to the dot failure or the inclusion of foreign matters is output. Characterized in that.

In addition, the failure state analysis process, when the result of comparing the second comparison data and the second reference data, if the difference in the luminance level is determined to be greater than the second data allowance deviation, the screen indicating that the defect due to color abnormalities or unevenness as defect information is outputted It is characterized by that.

In addition, the failure state analysis process, if the result of the comparison between the third comparison data and the third reference data, if it is determined that the luminance level difference is greater than the third data allowable deviation so that the screen indicating that the defect due to the stain or bleeding is output.

In addition, another embodiment of the present invention, the camera is fixedly installed; The first reference data, which is the reference luminance value for each dot, the second reference data, which is the luminance value for the first clustered region, and the third reference data, which is the luminance value for the second clustered region, are stored. A storage unit for storing a state; A calibration unit which quantizes and captures an image signal input from the camera; An image signal processor converting the captured image signal into a digital signal; Receives the digital signal, extracts luminance values for each dot to generate first comparison data, extracts luminance values for each first cluster region, generates second comparison data, and extracts luminance values for each second cluster region After generating third comparison data, the first, second, and third comparison values are compared with the first, second, and third reference data registered in advance to output a defective state, and the defective state is displayed in the LCD module. A control unit matching the information and storing the information in the storage unit; And an output unit for outputting the defective state on a screen according to the control of the controller.

The controller may output a screen indicating that a dot defect or a defect due to the inclusion of foreign matters is determined as a result of the comparison between the first comparison data and the first reference data and the luminance level difference is greater than or equal to the first data allowable deviation. It is done.

The controller may be further configured to output a screen indicating that a color abnormality or a defect is defective when it is determined that the luminance level difference is greater than or equal to a second data deviation as a result of comparing the second comparison data with the second reference data. do.

The controller may be further configured to output a screen indicating that the image is defective due to spots or smears when it is determined that the luminance level difference is greater than or equal to the third data allowance as a result of the comparison between the third comparison data and the third reference data. .

Hereinafter, exemplary embodiments of the present invention will be described with reference to the accompanying drawings.

As shown in FIG. 1, the camera 10 fixedly installed, first reference data which is a reference luminance value for each dot, second reference data that is a luminance value for each first cluster region, and luminance for each second cluster region are installed. A storage unit 20 that stores the third reference data, which is a value, and stores the defective state by matching the LCD module information for inspection, and a calibration unit that quantizes and captures an image signal input from the camera 10; 30), an image signal processing unit 40 for converting the captured image signal into a digital signal, and receiving the digital signal to extract luminance values for each dot to generate first comparison data, and for each first cluster region. After generating the second comparison data by extracting the luminance value, and generating the third comparison data by extracting the luminance value for each second cluster region, the first, second, and third comparison values are pre-registered. 2nd, 3rd reference data And a controller 50 for outputting a defective state to the LCD module information and storing the defective state in the storage unit, and outputting the defective state on the screen under the control of the controller 50. The display unit 60 and a keypad 70 for allowing the inspector to adjust the inspection apparatus and to input the inspection conditions of the inspection LCD module 80.

The reason for testing by dividing LCD module into each dot and clustering area is that it is possible to detect the dot defect by the dot unit and to detect the difference in luminance, but it is not easy to be seen such as spots and smudges, and in case of a wide range of defects This is because there is a limit, and the inspection of the cluster area can identify the defect state more precisely.

Referring to the inspection reference area in more detail, as shown in FIG. 2, reference numeral 100 denotes a dot region for inspecting each of R, G, and B regions, and reference numeral 110 denotes a first cluster region. In this case, the first clustered area is a group consisting of four groups using RGB as a group, and reference numeral 120 denotes a second grouped area, and the second grouped area is a grouped group with RGB as one group. It is set to. The reference region as described above may be changed as necessary.

Accordingly, when the first comparison data and the first reference data are compared, the controller 50 outputs a screen indicating a failure due to dot defects or foreign matters when the luminance level difference is determined to be greater than or equal to the first data allowable deviation. .

In addition, the controller 50 outputs a screen indicating that a color abnormality or a defect is defective when it is determined that the luminance level difference is greater than the second data allowable deviation as a result of comparing the second comparison data with the second reference data.

In addition, the control unit 50 outputs a screen indicating that the defect is caused by smudges or smears when the result of comparing the third comparison data with the third reference data determines that the luminance level difference is greater than or equal to the third data allowable deviation.

Referring to the operation of the LCD module inspection device configured as described above are as follows.

3A and 3B are flowcharts illustrating the LCD module test method according to the present invention.

2, the good LCD module is first mounted on the inspection equipment (S100), the good LCD module is photographed by the camera 10, and the photographed image signal is input to the calibration unit 30. FIG.

Then, the calibration unit 30 quantizes and captures an image signal input from the camera 10, and outputs the captured image to the image signal processing unit 40.

Then, the image signal processing unit 40 converts the captured image into a digital signal (S110) and outputs it to the control unit 50, and the control unit 40 uses the digital signal generated by photographing the good LCD module to reference each dot. The first reference data, which is the luminance value, the second reference data, which is the luminance value for each first cluster region, and the third reference data, which is the luminance value for each second cluster region, are generated and stored in the storage unit 20 (S120). In this case, the controller 50 sets a reference point, sets an area to be inspected at the reference point, generates reference data based on an inspection condition input by the inspector, and then generates comparison data under the same condition.

Then, when the inspector replaces the good quality LCD module with the inspection LCD module 80, the inspection LCD module 80 is photographed by the camera 10, and the photographed image signal is input to the calibration unit 30.

Then, the calibration unit 30 quantizes and captures an image signal input from the camera 10, and outputs the captured image to the image signal processing unit 40.

Then, the image signal processor 40 converts the captured image into a digital signal (S140) and outputs the converted image to the controller 50, and the controller 50 extracts the luminance value of each dot by using the input digital signal, and then outputs the first signal. After generating the comparison data, and extracting the luminance value for each first cluster region to generate the second comparison data, and generating the third comparison data by extracting the luminance value for each second cluster region (S150), the first, The second and third comparison data are compared with the first, second, and third reference data registered in advance, and the defective state known in accordance with the comparison result is output to the display unit 60.

That is, the controller 50 compares the first comparison data with the first reference data (S160), and when it is determined that the luminance level difference for each dot is greater than or equal to the first data allowable deviation (S170). Alternatively, the screen indicating that the defect is caused by the inclusion of foreign matter is output through the display unit 60 (S180).

In addition, the controller 50 compares the second comparison data with the second reference data (S190), and when it is determined that the luminance level difference is greater than or equal to the second data allowable deviation (S200), the color is determined as defect information. The screen indicating that the abnormality or the stain is defective is output through the display unit 60 (S2100).

Then, the controller 50 compares the third comparison data with the third reference data (S220), and when the result of the comparison determines that the luminance level difference is greater than or equal to the second data allowance deviation (YES in S230) The screen indicating that the failure is caused to be output to the display unit 60 (S220).

On the other hand, if the luminance level difference is not more than the first data tolerance, not more than the second data tolerance, or more than the third data tolerance, as a result of the determination in S230, the control unit 50 may check the LCD module 80 for inspection. It is determined that the good (S250).

On the other hand, if it is determined that the inspection LCD module 80 is good or defective, it is checked whether another inspection LCD is to be inspected (S260). If there is another LCD module to be checked as a result of the check, the controller 50 repeats the process from the step S130.

Accordingly, the present invention has an effect of accurately identifying a defective state by generating a dot-by-dot inspection constituting the LCD module and a clustered region composed of a plurality of dots and inspecting each clustered region.

The present invention is not limited only to the above embodiments, and it is apparent that many modifications are possible by those skilled in the art within the technical spirit of the present invention.

1 is a block diagram for explaining the configuration of the LCD module inspection apparatus according to the present invention;

2 is a view for explaining an inspection area when inspecting an LCD module;

3A to 3B are flowcharts illustrating an LCD module test method according to the present invention;

*** Explanation of main parts of drawing ***

10: camera 20: storage

30: calibration unit 40: video signal processing unit

50: control unit 60: display unit

70: keypad 80: inspection LCD module

Claims (8)

In the LCD module inspection method comprising the image quality visual inspection process for each unit process of the manufacturing process of the display device, A process of generating reference data by photographing a good LCD and generating and storing first reference data, which is a reference luminance value for each dot, second reference data, which is luminance value for each first cluster region, and third reference data, which is luminance value for each second cluster region. ; A calibration process of digitizing and capturing an image signal of an inspection LCD captured by a camera; And After converting the captured image signal into a digital signal, the luminance value of each dot is extracted to generate first comparison data, the luminance value of each first cluster region is extracted to generate second comparison data, and the second cluster region. After generating the third comparison data by extracting the luminance value of each star, the first, second and third comparison values are compared with the first, second and third reference data registered in advance to analyze the defective state of the LCD module. A failure state analysis process for outputting an analysis result; LCD module inspection method, characterized in that consisting of. The method of claim 1, wherein the failure state analysis process, When the first comparison data and the first reference data comparison result, the luminance level difference is determined to be greater than the first data allowance deviation, LCD screen inspection method characterized in that the screen indicating that the defect due to the dot failure or the inclusion of foreign matters . The method of claim 1, wherein the failure state analysis process, And comparing the second comparison data with the second reference data and outputting a screen indicating that a dot or a pixel is in a bad state when the luminance level difference is determined to be greater than or equal to the second data deviation. The method of claim 1, wherein the failure state analysis process, And comparing the third comparison data with the third reference data and outputting a screen indicating that the image is defective due to spots or smears when the luminance level difference is determined to be greater than or equal to the third data allowable deviation. A camera fixedly installed; The first reference data, which is the reference luminance value for each dot, the second reference data, which is the luminance value for the first clustered region, and the third reference data, which is the luminance value for the second clustered region, are stored. A storage unit for storing a state; A calibration unit which quantizes and captures an image signal input from the camera; An image signal processor converting the captured image signal into a digital signal; Receives the digital signal, extracts luminance values for each dot to generate first comparison data, extracts luminance values for each first cluster region, generates second comparison data, and extracts luminance values for each second cluster region After generating third comparison data, the first, second, and third comparison values are compared with the first, second, and third reference data registered in advance to output a defective state, and the defective state is displayed in the LCD module. A control unit matching the information and storing the information in the storage unit; And An output unit for outputting the defective state on a screen according to the control of the controller; LCD module inspection device, characterized in that consisting of. The method of claim 5, wherein the control unit, When the first comparison data and the first reference data comparison results, if the luminance level difference is determined to be greater than the first data deviation, the LCD module inspection apparatus characterized in that the screen indicating that the defect due to the dot failure or the inclusion of foreign matters . The method of claim 5, wherein the control unit, And as a result of comparing the second comparison data with the second reference data, when it is determined that the luminance level difference is greater than or equal to the second data deviation, the LCD module inspecting device outputting a screen indicating that a dot or pixel is defective. The method of claim 5, wherein the control unit, When it is determined that the luminance level difference is greater than the first data allowable deviation as a result of comparing the third comparison data with the third reference data, the LCD module inspects to display a screen indicating that the defect is defective due to staining or smearing. Device.