KR20030008413A - 디지탈 엑스레이 디텍터 - Google Patents
디지탈 엑스레이 디텍터 Download PDFInfo
- Publication number
- KR20030008413A KR20030008413A KR1020010043047A KR20010043047A KR20030008413A KR 20030008413 A KR20030008413 A KR 20030008413A KR 1020010043047 A KR1020010043047 A KR 1020010043047A KR 20010043047 A KR20010043047 A KR 20010043047A KR 20030008413 A KR20030008413 A KR 20030008413A
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- South Korea
- Prior art keywords
- ray
- visible light
- rays
- image
- rod lens
- Prior art date
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- 238000006243 chemical reaction Methods 0.000 claims abstract description 8
- 239000000835 fiber Substances 0.000 claims description 10
- 238000004519 manufacturing process Methods 0.000 claims description 6
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 4
- 238000000151 deposition Methods 0.000 claims 2
- 239000011248 coating agent Substances 0.000 claims 1
- 238000000576 coating method Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 9
- 230000009466 transformation Effects 0.000 abstract description 2
- 230000037406 food intake Effects 0.000 abstract 1
- 238000003384 imaging method Methods 0.000 description 6
- 230000005855 radiation Effects 0.000 description 6
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000001514 detection method Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 229910052693 Europium Inorganic materials 0.000 description 2
- 229910052771 Terbium Inorganic materials 0.000 description 2
- TZCXTZWJZNENPQ-UHFFFAOYSA-L barium sulfate Chemical compound [Ba+2].[O-]S([O-])(=O)=O TZCXTZWJZNENPQ-UHFFFAOYSA-L 0.000 description 2
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- UBXAKNTVXQMEAG-UHFFFAOYSA-L strontium sulfate Chemical compound [Sr+2].[O-]S([O-])(=O)=O UBXAKNTVXQMEAG-UHFFFAOYSA-L 0.000 description 2
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 2
- YZANRISAORXTHU-UHFFFAOYSA-N 1,2-dichloro-4-(4-chlorophenyl)benzene Chemical compound C1=CC(Cl)=CC=C1C1=CC=C(Cl)C(Cl)=C1 YZANRISAORXTHU-UHFFFAOYSA-N 0.000 description 1
- 229910052692 Dysprosium Inorganic materials 0.000 description 1
- VQTNXYYKWUONCR-UHFFFAOYSA-N FCl.[Ba].[Ba] Chemical compound FCl.[Ba].[Ba] VQTNXYYKWUONCR-UHFFFAOYSA-N 0.000 description 1
- 239000005083 Zinc sulfide Substances 0.000 description 1
- HUVSVEZKLBFKTA-UHFFFAOYSA-N [Ca].[W] Chemical compound [Ca].[W] HUVSVEZKLBFKTA-UHFFFAOYSA-N 0.000 description 1
- MCVAAHQLXUXWLC-UHFFFAOYSA-N [O-2].[O-2].[S-2].[Gd+3].[Gd+3] Chemical compound [O-2].[O-2].[S-2].[Gd+3].[Gd+3] MCVAAHQLXUXWLC-UHFFFAOYSA-N 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000002860 competitive effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 201000010099 disease Diseases 0.000 description 1
- 208000037265 diseases, disorders, signs and symptoms Diseases 0.000 description 1
- KBQHZAAAGSGFKK-UHFFFAOYSA-N dysprosium atom Chemical compound [Dy] KBQHZAAAGSGFKK-UHFFFAOYSA-N 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000010339 medical test Methods 0.000 description 1
- 230000029052 metamorphosis Effects 0.000 description 1
- 238000009659 non-destructive testing Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
- 229910052984 zinc sulfide Inorganic materials 0.000 description 1
- DRDVZXDWVBGGMH-UHFFFAOYSA-N zinc;sulfide Chemical compound [S-2].[Zn+2] DRDVZXDWVBGGMH-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/413—Imaging sensor array [CCD]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/421—Imaging digitised image, analysed in real time (recognition algorithms)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/50—Detectors
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- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measurement Of Radiation (AREA)
Abstract
Description
Claims (4)
- 2개 이상의 이미치 칩과 로드렌즈, Phosphor Screen을 구비하는 엑스레이 이미지 센서에 있어서,2개 이상의 광전센서를 인접하여 배치하고 센서 상단에 로드렌즈의 일측이 이미지칩의 면적보다 크거나 같게 함으로써 수광하지 못하는 부분이 없도록 조치할 수 있고 광전센서의 수를 증가시킴으로써 넓은 면적을 수광할 수 있는 것을 특징으로 하는 엑스레이 이미지 디텍터및 그 제조방법.
- 청구항 1에서 로드렌즈 어레이 대신 화이버 옵틱을 이용한 엑스레이 이미지 센서및 그 제조방법.
- 청구항 1, 2 에서,로드렌즈 혹은 화이버 옵틱의 일측에 엑스레이를 가시광선으로 변환시키는 변환층을 도포, 증착하는 것을 특징으로 하는 엑스레이 이미지 센서및 그 제조방법.
- 청구항 1, 2 에서 로드렌즈(33) 어레이 혹은 화이버 옵틱을 사용하지않고 엑스레이 Capillary를 이용하여 엑스레이를 이미지 칩쪽의 일측까지 엑스레이광을 도광하고 그 일측에 Phosphor Screen을 위치시키거나 엑스레이를 가시광선으로 변환시키는 변환층을 도포, 증착하는 것을 특징으로 하는 엑스레이 이미지 센서및 그 제조방법.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020010043047A KR20030008413A (ko) | 2001-07-18 | 2001-07-18 | 디지탈 엑스레이 디텍터 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020010043047A KR20030008413A (ko) | 2001-07-18 | 2001-07-18 | 디지탈 엑스레이 디텍터 |
Publications (1)
Publication Number | Publication Date |
---|---|
KR20030008413A true KR20030008413A (ko) | 2003-01-29 |
Family
ID=27715466
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020010043047A KR20030008413A (ko) | 2001-07-18 | 2001-07-18 | 디지탈 엑스레이 디텍터 |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR20030008413A (ko) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101039042B1 (ko) * | 2010-07-22 | 2011-06-03 | 강명석 | 말뚝의 보강구조물 |
CN115389538A (zh) * | 2022-08-09 | 2022-11-25 | 深圳市埃芯半导体科技有限公司 | X射线分析装置及方法 |
KR20230153843A (ko) | 2022-04-29 | 2023-11-07 | (주)아이스트 | 차폐부가 적용된 엑스레이 디텍터 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5617463A (en) * | 1995-02-20 | 1997-04-01 | Siemens Aktiengesellschaft | X-ray diagnostic installation |
JPH09229877A (ja) * | 1996-02-20 | 1997-09-05 | Konica Corp | X線−光変換部材用粒状度測定方法及び装置 |
JP2000235079A (ja) * | 1999-02-17 | 2000-08-29 | Konica Corp | 放射線画像撮像装置 |
JP2000298175A (ja) * | 1999-02-12 | 2000-10-24 | Konica Corp | 放射線画像検出器及び放射線画像形成システム |
JP2001074847A (ja) * | 1999-07-08 | 2001-03-23 | Canon Inc | 放射線撮像装置および放射線撮像システム |
-
2001
- 2001-07-18 KR KR1020010043047A patent/KR20030008413A/ko not_active Application Discontinuation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5617463A (en) * | 1995-02-20 | 1997-04-01 | Siemens Aktiengesellschaft | X-ray diagnostic installation |
JPH09229877A (ja) * | 1996-02-20 | 1997-09-05 | Konica Corp | X線−光変換部材用粒状度測定方法及び装置 |
JP2000298175A (ja) * | 1999-02-12 | 2000-10-24 | Konica Corp | 放射線画像検出器及び放射線画像形成システム |
JP2000235079A (ja) * | 1999-02-17 | 2000-08-29 | Konica Corp | 放射線画像撮像装置 |
JP2001074847A (ja) * | 1999-07-08 | 2001-03-23 | Canon Inc | 放射線撮像装置および放射線撮像システム |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101039042B1 (ko) * | 2010-07-22 | 2011-06-03 | 강명석 | 말뚝의 보강구조물 |
KR20230153843A (ko) | 2022-04-29 | 2023-11-07 | (주)아이스트 | 차폐부가 적용된 엑스레이 디텍터 |
CN115389538A (zh) * | 2022-08-09 | 2022-11-25 | 深圳市埃芯半导体科技有限公司 | X射线分析装置及方法 |
CN115389538B (zh) * | 2022-08-09 | 2023-12-29 | 深圳市埃芯半导体科技有限公司 | X射线分析装置及方法 |
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