KR20020049376A - In-Line system for operating ball-mounting and marking in manufacturing process of semiconductor - Google Patents
In-Line system for operating ball-mounting and marking in manufacturing process of semiconductor Download PDFInfo
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- KR20020049376A KR20020049376A KR1020000078533A KR20000078533A KR20020049376A KR 20020049376 A KR20020049376 A KR 20020049376A KR 1020000078533 A KR1020000078533 A KR 1020000078533A KR 20000078533 A KR20000078533 A KR 20000078533A KR 20020049376 A KR20020049376 A KR 20020049376A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67282—Marking devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/741—Apparatus for manufacturing means for bonding, e.g. connectors
- H01L24/742—Apparatus for manufacturing bump connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
- H01L2224/741—Apparatus for manufacturing means for bonding, e.g. connectors
- H01L2224/742—Apparatus for manufacturing bump connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/40—Details of apparatuses used for either manufacturing connectors or connecting the semiconductor or solid-state body
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
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- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Laser Beam Processing (AREA)
Abstract
Description
본 발명은 IC칩과 같은 반도체 소자를 제조하는 공정중에서 여러개의 IC칩이 연결되어서 각각의 IC칩으로 절단되기 전의 상태인 스트립(Strip)을 스트립 수용함체인 매거진(Magazine)으로 부터 하나씩 공급받아 이 스트립 표면에 회사 마크, 규격등을 레이져로 마킹(Marking)한 다음 IC칩의 접점을 형성해지는 공정으로 반도체 IC칩 제조공정이 진행되되 일관 공정으로써 인-라인이 형성되도록 시스템화 한 발명인바, 통상적으로 현재 반도체 조립공정은 리드 프레임(Lead Frame) 혹은 프린트 기판(P,C,B;Printed Circuit Board)에 다이(Die)를 부착한 다음 다이(Die)와 프레임(Frame)의 접점을 연결해 주는 결선(Wire Bonding) 작업후 와이어 및 다이를 보호하기 위하여 콤파운드등으로 충전하는 몰딩(Molding) 또는 켑슐레이션(In Capsulation)을 하게 되는바 통상 와이어 본딩 공정까지를 인-라인 혹은 프론트 라인(Front Line)이라 하며 몰딩(Molding)/인-캡(Incap) 공정을 몰딩공정이라 하는바 상기 몰딩공정이 끝나면 상표 또는 규격등을 표시해 주는 마킹(Marking)공정을 거친다음 보드(Board)에 장착할 수 있도록 IC칩에 접점을 형성해 주는 공정으로 이루어지는데 통상 마킹을 포함한 이후 공정을 백-엔드(Back-End) 또는 엔드라인(End Line) 공정이라 하는데 상기와 같은 종래의 마킹공정과 몰딩 또는 인-캡슐레이션 공정은 각각 별개의 공정으로 작업되도록 하고 있다.In the process of manufacturing a semiconductor device such as an IC chip, the present invention receives a strip, which is a state before a plurality of IC chips are connected and cut into respective IC chips, from a magazine containing strips. This is a process of marking a company mark, a standard, etc. on the surface of a strip with a laser, and then forming a contact point of an IC chip. Currently, the semiconductor assembly process attaches a die to a lead frame or a printed circuit board (P, C, B; printed circuit board), and then connects the connection between the die and the frame. Wire Bonding In order to protect the wire and die after molding, molding or insulation is performed in order to protect the wires and dies. The molding / in-cap process is called a molding process, which is called an in or front line. After the molding process, a marking process is performed to mark a trademark or specification. It is a process of forming a contact point on an IC chip so that it can be mounted on a board. The process including a marking is generally called a back-end or end line process. The over-molding or in-encapsulation process is intended to be a separate process.
상기와 같이 종래 IC칩 반도체 생산 공정중의 하나인 마킹공정과 몰딩공정이 별개로 되어 있고, 몰딩공정이 완료된 반도체 칩인 스트립(Strip)은 다시 스트립 수용함체인 매거진에 수용되어 마킹 작업을 하기 위하여 마킹공정으로 이동하면 몰딩된 스트립 배면에 마킹을 하기 위하여 스트립을 뒤집어 매거진에 다시 수용한 다음(앞공정의 특성상 스트립을 뒤집을 수 없음) 마킹 머신(Marking Machine)에 로딩 마킹, 마킹 불량 유무검사, 매거진에 재수용등의 공정을 거쳐 마킹 공정을 마치게 되고, 마킹공정이 완료되면 다음공정인 볼마운팅(Ball Mounting)을 하기 위하여 다시 스트립을 뒤집어 매거진에 수용한 다음 볼마운터 머신(Ball Mounter Machine)에 공급하여 플럭싱(Fluxing), 볼 마운팅 불량 여부검사등의 공정을 거친후 다음공정으로 이동하게 되므로서, 이런 불합리한 여러가지의 공정을 거침으로 인하여 스트립 손상의 우려와 아울러 스트립을 뒤집어 주는 인력의 낭비 혹은 다른 장비(스트립을 뒤집어서 매거진에 장입하는 장비)가 필요하게 되어, 세가지 종류의 장비를 구비하여야 함에 따라 설비비의 상승과 아울러 설치공간의 확대로 인한 생산원가 상승으로 작용하게 되어 기업이윤의 축소 또는 가격 경쟁력 상실로 이어지게 된다.As described above, the marking process and the molding process, which are one of the conventional IC chip semiconductor production processes, are separate from each other, and a strip, which is a semiconductor chip, in which the molding process is completed, is again accommodated in a magazine, which is a strip housing, for marking. When moving to the process, the strips are flipped over and placed back into the magazine for marking on the back of the molded strip (the strip cannot be reversed due to the characteristics of the previous process), then loading marking on the marking machine, inspection for marking defects, and After the marking process is completed, the marking process is completed, and after the marking process is completed, the strip is turned upside down and accommodated in a magazine for ball mounting, which is the next process, and then supplied to a ball mounter machine. This is because the product moves to the next process after a process such as fluxing and ball mounting defect inspection. Due to the various processes, there is a risk of damage to the strip, waste of manpower to turn the strip over, or other equipment (equipment to turn the strip into the magazine). In addition to the increase, the cost of production will increase due to the expansion of installation space, which will lead to a reduction in corporate profit or loss of price competitiveness.
도 1은 본 발명상으로 실시되는 마킹과 볼 마운팅 작업을 순차적으로 하기 위한 인-라인 시스템을 도식화한 블럭도1 is a block diagram schematically illustrating an in-line system for sequentially performing marking and ball mounting operations according to the present invention.
도 2는 도 1상으로 실시되는 마킹과 볼 마운팅 작업을 순차적으로 하기 위한 인-라인 시스템을 도시한 라인 전체 사시도FIG. 2 is a full line perspective view of an in-line system for sequentially performing marking and ball mounting operations performed in FIG. 1; FIG.
도 3은 각각의 IC칩이 되기전 다수개의 IC칩이 연결된 일정 길이의 IC칩의 스트립(Strip)에 마킹(Marking) 작업이 완료되고 다음 공정으로 이동하는 이송 장치의 사시도3 is a perspective view of a transfer apparatus in which a marking operation is completed on a strip of an IC chip having a plurality of lengths connected to a plurality of IC chips before each IC chip is moved to the next process;
<도면의 주요부분에 대한 부호설명><Code Description of Main Parts of Drawing>
1. 사각 기대 2. 스트립(Strip)1. Square Expectation 2. Strip
3. 매거진(Magazine) 4. 안내로3. Magazine 4. Information
5. 이송장치 6. 레이져 마킹 머신(Laser marking M/C)5. Conveyer 6. Laser marking M / C
7. 마킹 불량 감식기 8. 접착제 도포 장치7. Bad marking machine 8. Glue application device
9. 볼 마운팅 머신 10. 불,량 감식기9. Ball Mounting Machine
11. 피커(Picker) 12. 불량품 처리장11. Picker 12. Defective Treatment Plant
30. 진공 흡인 이동장치 31. 공압 엑츄에이터30. Vacuum suction mover 31. Pneumatic actuator
32. 작동간 32a. 흡반32. Between operations 32a. Sucker
32b. 힌지 33. 상부 플레이트32b. Hinge 33. Top Plate
33a. 하부 플레이트 34. 스크류 축33a. Lower plate 34. Screw shaft
35. 가이드 포스트35. Guide Post
본 발명은 상기와 같이 몰딩, 마킹 작업이 별도로 이루어짐으로 인하여 발생되는 문제점을 제거하고 보다 양질의 제품을 보다 신속 정확하게 생산하기 위하여 인-라인 시스템(In-Line System)으로 일관 작업할 수 있도록 라인을 형성한 발명으로서, 이를 첨부한 도면 도 1에 의거하여 상술하면 다음과 같다.The present invention eliminates the problems caused by the separate molding and marking work as described above, and the line to work consistently with the in-line system (In-Line System) in order to produce better quality products more quickly and accurately. As the invention formed, it will be described in detail with reference to Figure 1 attached as follows.
일정한 넓이를 가진 사각 기대(1)가 일정한 높이의 위치에 구비되고 그 좌측 저면에 다수개의 스트립(2)이 적층 수용된 매거진(3)이 안내로(4)를 따라 이동하여 사각 기대(1) 길이 방향으로 형성되어 있는 벨트 콘베이어등의 이송장치(5)의 좌측선단에서 상승하게 하고, 이 좌측 선단에서 일정거리로 이격하여 레이져 마킹 머신(6)이 이송장치(5) 상측에 위치 고정되게 장치하며, 이 레이져 마킹머신(6) 하단에는 이송장치(5)에 재치된 스트립(2)을 공압 엑츄에이터(31)에 의하여 힌지(32b) 결합되어 180°정역 회전하되 그 선단 배면에 다수개의 흡반(32a)이 착설된 작동간(32)이 별도의 상부 플레이트(33) 상면에 구비되는 진공 흡인 이동장치(30)가 구비되되, 이 이동장치(30)는 하부에 별도로 위치되는 플레이트(33a)의 중도부에 수직으로 축설된 스크류축(34)에 의하여 상부 플레이트(33)가 상하 이동되게 하되 상부 플레이트(33)의 상하 이동시 가이드 포스트(35)에 수평 지지된 상태에서 상하 이동 될 수 있게 하며 레이져 마킹머신(6)에서 우측으로 일정거리로 이격한 이송장치(5) 상면에는 마킹 불량 감식기(7)를 하향되게 위치 고정하여 구비되고, 이 마킹 불량 감식기(7)에서 우측으로 일정거리로 이격된 이송장치(5) 상면에 접착제 도포장치(Flux Dotting)(8)가 위치되고 이 접착제 도포장치(8)의 우측에 볼 마운팅 머신(9)이 위치되며 볼 마운팅 머신(9) 우측에볼 마운팅 상태의 불량 여부를 감식하는 감식기(10)가 장치되며 이 감식기(10)의 감식에 따라 스트립(2)을 클램핑하여 감식 결과 양호한 스트립은 다음 공정으로 이동시키거나 별도의 매거진(3a)에 적층 수용하고 불량품은 불량품 처리장(12)으로 이동시키는 피커(11)를 장착하여서, 본 발명상으로 실시되는 레이져 마킹과 볼 마운팅 작업을 인-라인 시스템으로 일관 작업 할 수 있게 한다.A rectangular base 1 having a constant width is provided at a constant height and a magazine 3 having a plurality of strips 2 stacked on the left bottom thereof is moved along the guide path 4 so that the rectangular base 1 has a length. Raise from the left end of the conveying device (5), such as belt conveyor formed in the direction, spaced apart from the left end by a certain distance so that the laser marking machine (6) is fixed to the upper position of the conveying device (5) At the lower end of the laser marking machine 6, the strip 2 mounted on the conveying apparatus 5 is hinged by a pneumatic actuator 31 to be rotated 180 °, and a plurality of suckers 32a are rotated 180 °. Is equipped with a vacuum suction moving device (30) provided on the upper surface of the separate upper plate (33) is installed, the moving device (30) is a midway of the plate (33a) located separately in the lower portion By screw shaft 34 arranged perpendicularly to the The sub-plate 33 is moved up and down, but can be moved up and down while being horizontally supported by the guide post 35 during the vertical movement of the upper plate 33, and the distance spaced to the right from the laser marking machine (6) at a certain distance The upper surface of the device (5) is provided by fixing the marking failure recognizer (7) downwardly, the adhesive application device (Flux Dotting) on the upper surface of the conveying device (5) spaced at a certain distance to the right from the marking failure recognition machine (7) (8) is positioned and the ball mounting machine (9) is located on the right side of the adhesive applying device (8), and the right side of the ball mounting machine (9) is equipped with a sensitizer (10) to recognize whether the ball mounting state is bad or not. The picker 11 clamps the strip 2 according to the identification of the condenser 10 so that the good strip can be moved to the next process or stacked in a separate magazine 3a and the defective product is moved to the defective treatment plant 12. Mounting Come on, the laser marking and ball mounting operations that are performed by the present invention allows the assembly lines in the system.
즉, 작업이 최초로 개시되면 스트립(2)이 스트립 이동장치(5)에 재치, 이동되어 레이져 마킹 머신(6) 하부에 도착하면 이송장치(5)가 정지함과 동시에 진공 흡인 이동장치(30)의 상부 플레이트(33) 좌측에 구비된 작동간(32)이 미리 스트립(2) 바로 위에 대기하고 있다가 작동간선단의 흡반(32a)이 스트립(2)을 흡인함과 동시에 작동간(32)을 공압 엑츄에이터(31)에 의하여 힌지(32b)를 축으로 180°회전하여 정지하면 진공 흡인 장치(30)가 장착된 상부 플레이트(33)가 상승하여 스트립(2) 상면에 상표등을 레이져로 마킹한 다음 진공 흡인 이동장치(30)를 도면 도 2의 상태로 우측으로 이동하여 작동간(32)을 다시 역 180°회전시켜 작동간(32)의 흡반(32a)이 흡착하고 있던 스트립(2)을 이동장치(5)의 상면에 다시 재치하게 하여 스트립(2) 이송장치(5) 라인을 따라 접착제 도포 장치(8), 볼 마운팅 머신(9), 감식기(10), 피커(11)등의 여러 공정을 거치도록 본 발명상으로 실시되는 인-라인 시스템이 가동하게 되어 불량 여부를 철저하게 체크하여 정확히 감식하여 분리작업이 이루어진다.That is, when the work is started for the first time, when the strip 2 is placed on the strip moving device 5 and moved to the lower portion of the laser marking machine 6, the transfer device 5 stops and the vacuum suction moving device 30 is stopped. The operating rod 32 provided on the left side of the upper plate 33 of the upper plate 33 is waiting directly on the strip 2 beforehand, and the suction plate 32a at the tip of the operating rod sucks the strip 2 and simultaneously the operating rod 32. When the hinge 32b is rotated 180 ° about the shaft by the pneumatic actuator 31 to stop, the upper plate 33 on which the vacuum suction device 30 is mounted rises to mark the label on the upper surface of the strip 2 with a laser. Then, the vacuum suction moving device 30 is moved to the right in the state shown in FIG. 2, and the operating space 32 is rotated again by 180 ° so that the suction plate 32a of the operating interval 32 is adsorbed. On the upper surface of the moving device (5) so that the adhesive application sheet along the strip (2) feeder (5) line The in-line system implemented according to the present invention operates through various processes such as the tooth 8, the ball mounting machine 9, the condenser 10, the picker 11, etc. Identification and separation work takes place.
상기와 같이 인-라인 시스템으로 일관 작업이 행하여 지므로 공장의 기계 설치공간이 줄어들고 연속작업이 가능해지므로 제품 생산 수율이 높아지고 제품의 공정이동에 따르는 불량 가능률이 현저하게 줄어드는등의 효과가 있다.As the above-described in-line system is a consistent work is performed, the machine installation space of the factory is reduced and the continuous work is possible, so that the product production yield is increased and the probability of defects due to the process movement of the product is significantly reduced.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020000078533A KR100362364B1 (en) | 2000-12-19 | 2000-12-19 | In-Line system for operating ball-mounting and marking in manufacturing process of semiconductor |
Applications Claiming Priority (1)
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KR1020000078533A KR100362364B1 (en) | 2000-12-19 | 2000-12-19 | In-Line system for operating ball-mounting and marking in manufacturing process of semiconductor |
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KR20020049376A true KR20020049376A (en) | 2002-06-26 |
KR100362364B1 KR100362364B1 (en) | 2002-11-23 |
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KR1020000078533A KR100362364B1 (en) | 2000-12-19 | 2000-12-19 | In-Line system for operating ball-mounting and marking in manufacturing process of semiconductor |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100929637B1 (en) * | 2008-01-02 | 2009-12-03 | 주식회사 하이닉스반도체 | Equipment connection device and in-line semiconductor device with same |
CN115165925A (en) * | 2022-08-05 | 2022-10-11 | 深圳市华研天创检测设备有限公司 | PCB detection device with marking function, marking method, equipment and medium |
-
2000
- 2000-12-19 KR KR1020000078533A patent/KR100362364B1/en not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100929637B1 (en) * | 2008-01-02 | 2009-12-03 | 주식회사 하이닉스반도체 | Equipment connection device and in-line semiconductor device with same |
CN115165925A (en) * | 2022-08-05 | 2022-10-11 | 深圳市华研天创检测设备有限公司 | PCB detection device with marking function, marking method, equipment and medium |
Also Published As
Publication number | Publication date |
---|---|
KR100362364B1 (en) | 2002-11-23 |
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