KR20020048026A - Bulit-in Test Time Establishment Method - Google Patents

Bulit-in Test Time Establishment Method Download PDF

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KR20020048026A
KR20020048026A KR1020000077277A KR20000077277A KR20020048026A KR 20020048026 A KR20020048026 A KR 20020048026A KR 1020000077277 A KR1020000077277 A KR 1020000077277A KR 20000077277 A KR20000077277 A KR 20000077277A KR 20020048026 A KR20020048026 A KR 20020048026A
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call
test
built
time
chip
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KR100547698B1 (en
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구성희
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구자홍
엘지전자주식회사
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/50—Testing arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L43/00—Arrangements for monitoring or testing data switching networks
    • H04L43/06—Generation of reports
    • H04L43/065—Generation of reports related to network devices
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W24/00—Supervisory, monitoring or testing arrangements
    • H04W24/02—Arrangements for optimising operational condition
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W76/00—Connection management
    • H04W76/30—Connection release
    • H04W76/34—Selective release of ongoing connections

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Mobile Radio Communication Systems (AREA)

Abstract

PURPOSE: A built-in test time setting method is provided to set and test the wait time automatically when performing the built-in test by using a free block, thereby capable of setting the wait time effectively. CONSTITUTION: When a built-in test is started, a manager checks the chip state of the system(20,21). After checking the chip state, if a call is occupied to the chip, a call source free block is performed(22,23). Thereafter, the accumulated call time and the number of calls are read among the statistical values by the time, the accumulated call time is divided by the number of accumulated calls, the average call time is calculated about one channel and so a timer is operated by the calculated value(24). Thereafter, a call finish is waited for the automatically designated time, when the call is finished naturally, the built-in test is performed(25,26,28). When the call is not finished naturally, a call is finished forcibly and the built-in test is performed(27,28).

Description

빌트인 시험 시점 설정 방법 {Bulit-in Test Time Establishment Method}Built-in test time establishment method {Bulit-in Test Time Establishment Method}

본발명은 시스템의 테스트에 관한것으로, 특히 이동통신시스템의 H/W이상 유무등을 검사하는 빌트인(Built-in) 테스트 시점을 일정한 값을 이용하여 적용하므로써 자동으로 수행하도록 하여 사용자로 하여금 테스트 대기 시간을 효율적으로 설정하도록 한 빌트인 시험 시점(시간) 설정 방법에 관한 것이다.The present invention relates to the test of the system, and in particular, the user waits for the test by automatically performing a built-in test point for checking whether there is a problem with the H / W of the mobile communication system by using a predetermined value. It relates to a built-in test time (time) setting method for setting the time efficiently.

더욱 상세하게는 본 발명은, 이동통신 시스템에서 32개 호자원을 가진 칩구조의 채널 카드 시험시에 프리 블록(Pre-Block)된 채널이 장시간 호를 점유하고 있을때 이를 해제하기 위한 시점(시간)을 자동으로 설정하기 위한 방법이다.More specifically, the present invention provides a time point (time) for releasing a pre-blocked channel when the channel is occupied for a long time in a channel card test having 32 call resources in a mobile communication system. This is the method to set automatically.

상기의 프리 블록이란 칩에 해당하는 호 자원에 블럭을 걸어서 신규(새로운)호가 할당되지 않도록 하는것을 말한다.The above free block means that a new call is not allocated by applying a block to a call resource corresponding to a chip.

일반적으로 종래에 있어서 빌트인 테스트 수행은 운용자(사용자)가 시스템의 호량을 점검한후 운용자 판단에 의해 테스트를 위한 임의의 프리 블록(Pre-block)시간을 설정하여 시험명령을 입력하면, 채널 시험 블럭은 입력된 시험 시간에 따라 대기한후 통화중인 호를 해제하고 시험을 수행한다.In general, in the conventional built-in test, the channel test block is input when the operator (user) checks the volume of the system and inputs a test command by setting an arbitrary pre-block time for the test by the operator's judgment. Waits according to the test time entered and releases the call and performs the test.

도 1은 종래의 빌트인 시험시간 설정방법의 실시예 흐름도이다.1 is a flow chart of an embodiment of a conventional built-in test time setting method.

이동통신시스템에서, 운용자가 입력한 빌트인 지정시간이 되어 빌트인 시험이 시작되면 시스템의 칩상태를 검사하게 된다. (단계 10,11).In the mobile communication system, when the built-in test is started by the built-in designated time input by the operator, the chip state of the system is checked. (Steps 10, 11).

상기 칩 상태 체크후 칩에 호가 점유되어 있는가를 판단하여, 만약 칩에 호가 점유되어 있으면 호자원 프리블록을 수행한다. (단계 12,13).After the chip state check, it is determined whether the call is occupied by the chip. If the call is occupied by the chip, the call resource preblock is performed. (Step 12,13).

상기 호자원 프리블록후에 운용자가 지정한 시간동안 호 종료를 대기하다가, 상기 지정한 시간내에 호가 자연 종료되면 빌트인 시험을 수행한다. (단계 14,15,17).After the call resource preblocking, the operator waits for a call termination for a designated time, and if the call is naturally terminated within the designated time, a built-in test is performed. (Steps 14,15,17).

만약 상기 단계 15에서 운용자가 지정한 시간동안에 호가 자연종료 되지 않으면 운용자는 호 강제종료를 실행하여 빌트인 시험(Test)을 수행한다. (단계 16,17).If the call does not end naturally during the time specified by the operator in step 15, the operator performs the forced termination of the call to perform a built-in test. (Steps 16,17).

만약 상기 단계 12에서, 칩에 호가 점유되지 않은 경우에는 바로 빌트인 시험을 수행한다. (단계 12,17).In step 12, if the chip is not occupied, the built-in test is performed immediately. (Step 12,17).

그런데 종래의 기술에서는 프리블록시의 호 해제 설정시간을 각각의 칩에 대해 운용자가 통계 데이타를 확인한후, 직접 입력하는 비효율적인 작업이 요구된다.However, in the related art, an inefficient task of directly inputting a call release setup time at the time of preblocking after checking the statistical data for each chip is required.

따라서 본 발명은 상기와 같은 문제점을 해결하기 위해, 프리블록을 이용하여 빌트인 시험을 할 경우에 자동으로 대기시간을 설정하여 시험할 수 있도록 한다.Therefore, in order to solve the above problems, when the built-in test using the free block is to be set automatically to set the waiting time to be tested.

이를 위해 빌트인 수행이전의 시간당 통계값중에서 누적 통화시간과 누적 호 개수를 읽어와 누적통화시간을 누적 호 개수로 나누어 한 채널에 대한 평균 통화시간을 산출하여 상기 산출된 값을 가지고 타이머를 구동한다.To this end, the cumulative call time and the cumulative call number are read from the hourly statistics before the built-in execution, and the average talk time for one channel is calculated by dividing the cumulative call time by the cumulative call number.

따라서 상기한 방법에 의하면 자동으로 대기시간을 설정하여 빌트인 시험을 할 수 있다.Therefore, according to the method described above, a built-in test can be performed by automatically setting a waiting time.

도 1은 종래의 빌트인 시험시간 설정방법의 실시예 흐름도1 is a flow chart of an embodiment of a conventional built-in test time setting method

도 2는 본 발명의 빌트인 시험시간 설정방법의 실시예 흐름도Figure 2 is a flow chart of an embodiment of a built-in test time setting method of the present invention

본 발명의 이동통신시스템의 상태를 검사하는 빌트인 시험을 하는데 있어서,In the built-in test for checking the state of the mobile communication system of the present invention,

빌트인 시험을 요구시 칩상태를 체크하고 칩에 호가 점유되어 있는가를 판단하는 단계와; 칩에 해당하는 호자원에 블럭을 걸어서 새로운 호가 할당되지 않도록 하기 위한 프리블록을 하는 단계와; 한채널에 대한 평균통화시간을 산출하여 타이머를 구동하는 단계와; 상기 설정된 타이머 값을 이용하여 빌트인 시험을 수행하는 단계를 포함하는 것을 특징으로 한다.Checking the chip state and determining whether the call is occupied by the chip when requesting a built-in test; Performing a preblock to block a new call from allocating a block to a call resource corresponding to a chip; Calculating a mean talk time for one channel to drive a timer; And performing a built-in test using the set timer value.

또한 본 발명의 이동통신시스템의 상태를 검사하는 빌트인 시험을 하는데 있어서, 빌트인 수행이전의 누적 통화시간를 누적 호 개수로 나누어 평균통화시간을 산출하는것을 특징으로 한다.In the built-in test for checking the state of the mobile communication system of the present invention, the average talk time is calculated by dividing the accumulated talk time before the built-in performance by the cumulative number of calls.

본 발명의 다른 목적, 특징들은 첨부한 도면을 참조한 실시예들의 상세한 설명을 통해 명백해질 것이다.Other objects and features of the present invention will become apparent from the detailed description of the embodiments with reference to the accompanying drawings.

이하 첨부된 도면을 참조하여 본 발명에 따른 데이터 재전송 장치 및 방법을 설명한다.Hereinafter, an apparatus and method for retransmitting data according to the present invention will be described with reference to the accompanying drawings.

도 2는 본 발명의 빌트인 시험시간 설정방법의 실시예 흐름도이다.2 is a flow chart of an embodiment of a built-in test time setting method of the present invention.

먼저 개괄적으로 설명하면, 빌트인 시험중에서 칩내 호의 자연적인 종료를 일정시간 기다리다가 시험하고, 일정시간 이후에도 호가 있으면 강제 종료하고 시험하는 경우일때, 호 해제시간을 통계값을 이용하여 자동적으로 계산하여 설정하는 방법이다.First of all, during the built-in test, it waits for a certain time for the natural termination of the in-chip call, and if there is a call after a certain time, forcibly terminates and tests the call release time by automatically calculating and setting the call release time. Way.

이동통신시스템에서, 운용자가 입력한 빌트인 지정시간이 되어 빌트인 시험이 시작되면 시스템의 칩상태를 검사하게 된다. (단계 20,21).In the mobile communication system, when the built-in test is started by the built-in designated time input by the operator, the chip state of the system is checked. (Steps 20,21).

상기 칩 상태 체크후 칩에 호가 점유되어 있는가를 판단하여, 만약 칩에 호가 점유되어 있으면 호자원 프리블록을 수행한다. (단계 22,23).After the chip state check, it is determined whether the call is occupied by the chip. If the call is occupied by the chip, the call resource preblock is performed. (Steps 22, 23).

상기 호자원 프리블록후에 빌트인 수행이전의 시간당 통계값중에서 누적 통화시간과 호 개수를 읽어와 누적통화시간을 누적 호 개수로 나누어 한 채널에 대한 평균 통화시간을 산출하여 상기 산출된 값을 가지고 타이머를 구동한다.(단계 24).After the call resource preblocking, the cumulative call time and the number of calls are read from the hourly statistics before the built-in execution. The cumulative call time is divided by the cumulative number of calls to calculate the average talk time for one channel. Drive (step 24).

상기 자동으로 지정된 시간동안 호 종료를 대기하다가, 상기 지정한 시간내에 호가 자연 종료되면 빌트인 시험을 수행한다. (단계 25,26,28).While waiting for the call to end automatically for the designated time, if the call is naturally terminated within the specified time, the built-in test is performed. (Steps 25, 26, 28).

만약 상기 단계 26에서 운용자가 지정한 시간동안에 호가 자연종료 되지 않으면 운용자는 호 강제종료를 실행하여 빌트인 시험(Test)을 수행한다. (단계 27,28).If the call does not end naturally during the time designated by the operator in step 26, the operator performs a forced test termination to perform a built-in test. (Step 27,28).

만약 상기 단계 22에서, 칩에 호가 점유되지 않은 경우에는 바로 빌트인 시험을 수행한다. (단계 22,28).In step 22, if the chip is not occupied, the built-in test is performed immediately. (Steps 22,28).

상기한 바와 같이 본 발명에서는 프리블록을 이용하여 빌트인 시험을 할 경우에 자동으로 대기시간을 설정하여 시험할 수 있도록 하기 위해 빌트인 수행이전의 시간당 통계값중에서 누적 통화시간과 누적 호 개수를 읽어와 누적통화시간을 누적 호 개수로 나누어 한 채널에 대한 평균 통화시간을 산출하여 상기 자동으로 산출된 값을 가지고 타이머를 구동하여 호 종료 대기를 수행한다.As described above, in the present invention, when the built-in test is performed using the free block, the cumulative communication time and the cumulative number of calls are read and accumulated from the hourly statistical values before the built-in performance so that the test time can be set automatically. The average talk time for one channel is calculated by dividing the talk time by the cumulative number of calls, and the timer is driven using the automatically calculated value to perform call termination waiting.

이상에서 본 발명의 바람직한 실시예를 설명하였으나, 본 발명은 다양한 변화와 변경 및 균등물을 사용할 수 있다. 본 발명은 상기 실시예를 적절히 변형하여 동일하게 응용할 수 있음이 명확하다.Although the preferred embodiment of the present invention has been described above, the present invention may use various changes, modifications, and equivalents. It is clear that the present invention can be applied in the same manner by appropriately modifying the above embodiments.

따라서 상기 기재 내용은 하기 특허청구범위의 한계에 의해 정해지는 본 발명의 범위를 한정하는 것이 아니다.Accordingly, the above description does not limit the scope of the invention as defined by the limitations of the following claims.

본 발명은 종래의 문제점인 프리 블록(Pre-block)시의 호 해제 설정시간을 각각의 칩에 대해 운용자가 직접 입력하는 방식을 개선하기 위해, 프리블록을 이용하여 빌트인 시험을 할 경우에, 빌트인 수행이전의 시간당 통계값중에서 누적 통화시간과 호 개수를 읽어와 누적통화시간을 누적 누적 호 개수로 나누어 한 채널에 대한 평균 통화시간을 산출하여 상기 산출된 값을 가지고 자동으로 대기시간을 설정 하므로써 효율적인 빌트인 시험을 수행할 수 있다.In order to improve the method of directly inputting a call release setup time for each chip, which is a conventional problem in the pre-block, a built-in test is performed when a built-in test is performed using the free block. It is effective to read the cumulative talk time and the number of calls from the hourly statistics before execution, divide the cumulative talk time by the cumulative cumulative call number, calculate the average talk time for one channel, and automatically set the standby time with the calculated value. Built-in tests can be performed.

Claims (2)

이동통신시스템의 상태를 검사하는 빌트인 시험을 하는데 있어서,In the built-in test to check the state of the mobile communication system, 빌트인 시험을 요구시 칩상태를 체크하고 칩에 호가 점유되어 있는가를 판단하는 단계와; 칩에 해당하는 호자원에 블럭을 걸어서 새로운 호가 할당되지 않도록 하기 위한 프리블록을 하는 단계와; 한채널에 대한 평균통화시간을 산출하여 타이머를 구동하는 단계와; 상기 설정된 타이머 값을 이용하여 빌트인 시험을 수행하는 단계를 포함하는 것을 특징으로 하는 빌트인 시험 시점 설정 방법.Checking the chip state and determining whether the call is occupied by the chip when requesting a built-in test; Performing a preblock to block a new call from allocating a block to a call resource corresponding to a chip; Calculating a mean talk time for one channel to drive a timer; And a built-in test step using the set timer value. 제 1항에 있어서, 상기 평균 통화시간은 빌트인 수행이전의 누적 통화시간를 누적 호 개수로 나눈값으로 하는것을 특징으로 하는 빌트인 시험 시점 설정 방법.The method of claim 1, wherein the average talk time is a value obtained by dividing the accumulated talk time before the built-in performance by the cumulative number of calls.
KR1020000077277A 2000-12-15 2000-12-15 How to set a built-in test point KR100547698B1 (en)

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