CN113515420B

CN113515420B - Test method and test system

Info

Publication number: CN113515420B
Application number: CN202110855557.3A
Authority: CN
Inventors: 李尚春
Original assignee: Spreadtrum Semiconductor Chengdu Co Ltd
Current assignee: Spreadtrum Semiconductor Chengdu Co Ltd
Priority date: 2021-07-28
Filing date: 2021-07-28
Publication date: 2022-12-27
Anticipated expiration: 2041-07-28
Also published as: CN113515420A

Abstract

The embodiment of the application discloses a test method and a test system. The system server determines a test strategy corresponding to the test task new establishment instruction according to the input test task new establishment instruction, wherein the test strategy is used for instructing the test terminal to perform function test on the SIM card to be tested by adopting a specified test case. The system server issues one or more test tasks to the test equipment. The test equipment generates a test task queue according to one or more test tasks. And the test equipment sends the associated SIM card information to be tested and the test case information to the test terminal. And the test terminal tests a plurality of SIM card signals output by the SIM card integration board simultaneously according to the associated SIM card information and the test case information, generates a test report and sends the test report to the test equipment. Therefore, the testing method can realize the simultaneous automatic testing of various different SIM cards, the testing resources are not limited by regions, and the sharing of the testing resources can be realized.

Description

Test method and test system

Technical Field

The present application relates to the field of communications technologies, and in particular, to a test method and a test system.

Background

SIM card manufacturers of different SIM (Subscriber Identity Module) cards (also called Subscriber Identity cards) may have different SIM cards, and therefore compatibility of the SIM cards needs to be tested during testing of mobile terminal software. The compatibility test of the SIM card refers to testing the usability of the SIM card on the mobile terminal. Currently, a manual test mode is generally adopted for SIM card compatibility tests, that is, SIM cards are switched in different card slots of a mobile terminal in a manual plugging mode to complete the compatibility test of the same SIM card, and then the compatibility of other SIM cards is tested in the same mode. The SIM card needs to be frequently inserted and pulled, which causes the problems of SIM card damage, accelerated aging of mobile phone hardware, low test efficiency and the like. Moreover, the SIM cards in the test scheme are concentrated in hands of testers, so that resource sharing cannot be achieved, and serious waste of resources is caused.

Disclosure of Invention

The embodiment of the application provides a test method and a test system, which can realize the simultaneous and automatic test of various different SIM cards, and the test resources are not limited by regions, and can realize the sharing of the test resources.

In a first aspect, an embodiment of the present application provides a test method, where the test method is applied to a test system, and the test system includes a system server, a test device, a SIM card integration board, and a test terminal. The system server creates one or more test tasks, and the one or more test tasks comprise testing of a plurality of SIM card signals output by the SIM card integration board simultaneously. The test equipment acquires and analyzes one or more test tasks, and generates a test task queue according to the one or more test tasks, wherein the test task queue comprises test terminal information, SIM card information to be tested and test case information. And the test equipment sends the associated SIM card information to be tested and the test case information to the test terminal. And the test terminal tests a plurality of SIM card signals output by the SIM card integration board simultaneously according to the associated SIM card information and the test case information and generates a test report. And the test terminal sends a test report to the test equipment.

In one embodiment, the system server determines a test strategy corresponding to the test task new creation instruction according to the input test task new creation instruction. And the test strategy is used for indicating the test terminal to adopt the specified test case to carry out the function test on the SIM card to be tested. The system server determines that the one or more test tasks include a test policy.

In one embodiment, the test equipment receives one or more test tasks from the system server, and the test tasks include one or more of an identifier of the test terminal, an identifier of the SIM card to be tested, an identifier of the test case, association information of the test terminal and the SIM card to be tested, and association information of the SIM card to be tested and the test case.

In one embodiment, the test equipment sorts one or more test tasks according to the identifiers of the SIM cards to be tested, and generates a test task queue.

In one embodiment, when the SIM card integration board simultaneously outputs a plurality of SIM card signals to a plurality of test terminals for performing a single card test, respectively, any one of the test terminals tests a to-be-tested SIM card signal associated with the test terminal according to a test policy.

In one embodiment, when the SIM card integration board simultaneously outputs a plurality of SIM card signals to a test terminal for multi-card testing, the test terminal respectively tests the plurality of SIM card signals according to a test strategy.

In one embodiment, when any one of the plurality of test terminals completes the test, the test terminal sends a test completion message to the test equipment. When the test equipment receives the test completion message, the test equipment sends SIM card switching indication information to the system server, and the SIM card switching indication information is used for indicating the system server to inform the SIM card integration board to switch the SIM cards according to the sequence of the SIM card identifications in the test task queue. And when the SIM card integration board finishes the SIM card switching, the test terminal executes the test flow again.

In one embodiment, the system server records the SIM card information in the SIM card integration board in advance.

It can be seen that the test method provided by the first aspect can implement that multiple test terminals test multiple different SIM cards at the same time, and can also implement that one test terminal tests multiple different SIM cards at the same time. And the test case execution test strategy can be automatically screened aiming at different SIM cards.

In a second aspect, an embodiment of the present application provides a test system, where the test system includes a system server, a test device, a SIM card integration board, and a test terminal. The system server is connected with the SIM card integrated board, the SIM card integrated board is connected with the test terminal, the test terminal is connected with the test equipment, and the test equipment is connected with the system server. The system server is used for creating one or more test tasks, and the one or more test tasks comprise testing a plurality of SIM card signals output by the SIM card integration board simultaneously. The test equipment is used for acquiring and analyzing one or more test tasks. The test equipment is also used for generating a test task queue according to one or more test tasks, and the test task queue comprises test terminal information, SIM card information to be tested and test case information. The testing equipment is also used for sending the related SIM card information to be tested and the testing case information to the testing terminal. The test terminal is used for testing a plurality of SIM card signals output by the SIM card integration board simultaneously according to the associated SIM card information and the test case information and generating a test report. The test terminal is also used for sending a test report to the test equipment.

In one embodiment, a system server is used to create one or more test tasks, including:

the system server determines a test strategy corresponding to the test task new establishment instruction according to the input test task new establishment instruction, wherein the test strategy is used for indicating the test terminal to carry out function test on the SIM card to be tested by adopting a specified test case;

the system server determines that the one or more test tasks include a test policy.

In one embodiment, the test equipment is used for acquiring and analyzing one or more test tasks, and comprises:

the testing equipment receives one or more testing tasks from the system server, wherein the testing tasks comprise one or more of the identification of the testing terminal, the identification of the SIM card to be tested, the identification of the testing case, the associated information of the testing terminal and the SIM card to be tested, and the associated information of the SIM card to be tested and the testing case.

In one embodiment, the test device is further configured to generate a test task queue according to one or more test tasks, including:

the test equipment sequences one or more test tasks according to the identification of the SIM card to be tested, and generates a test task queue.

In one embodiment, the test terminal is configured to test multiple SIM card signals output by the SIM card integration board simultaneously according to the associated SIM card information and test case information, and includes:

when the SIM card integration board simultaneously outputs a plurality of SIM card signals to a plurality of test terminals for single card test respectively, any one of the test terminals tests the SIM card signal to be tested associated with the test terminal according to a test strategy.

In one embodiment, the test terminal is further configured to send a test completion message to the test device after any one of the plurality of test terminals completes a test;

the test equipment is also used for sending SIM card switching indication information to the system server when the test equipment receives the test completion message, and the SIM card switching indication information is used for indicating the system server to inform the SIM card integration board to switch the SIM cards according to the sequencing of the SIM card identifiers in the test task queue;

the test terminal is also used for executing the test flow again when the SIM card integration board finishes the SIM card switching.

In one embodiment, the testing terminal is configured to test a plurality of SIM card signals output by the SIM card integrated board simultaneously according to corresponding SIM card information and test case information, and includes:

when the SIM card integration board simultaneously outputs a plurality of SIM card signals to one test terminal for multi-card test, the test terminal respectively tests the plurality of SIM card signals according to a test strategy.

In one embodiment, the system server is further configured to pre-record SIM card information in the SIM card integration board.

Therefore, the testing system provided by the second aspect can enable the SIM card resources not to be limited by regions, and testers in different regions can test different SIM cards through the testing system. And the test strategy can be freely customized aiming at different SIM cards, which is beneficial to realizing richer SIM card function tests.

In a third aspect, an embodiment of the present application provides a testing apparatus, where the testing apparatus includes a processor and a memory, where the processor and the memory are connected to each other, where the memory is used to store a computer program, the computer program includes program instructions, and the processor is configured to call the program instructions to execute the testing method in the first aspect and any one of the embodiments thereof.

In a fourth aspect, an embodiment of the present application provides a chip, where the chip includes a processor and a data interface, and the processor reads instructions stored on a memory through the data interface to execute the test method according to the first aspect.

In a fifth aspect, an embodiment of the present application provides a chip module, which includes the chip as described in the fourth aspect.

In a sixth aspect, embodiments of the present application provide a computer-readable storage medium storing a computer program, the computer program comprising program instructions that, when executed by a processor, cause the processor to perform the testing method according to the first aspect.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

Fig. 1 is a schematic structural diagram of a test system according to an embodiment of the present disclosure;

FIG. 2 is a schematic flow chart of a testing method provided in an embodiment of the present application;

FIG. 3 is a schematic flow chart illustrating a testing method applied to the testing system shown in FIG. 1 according to an embodiment of the present disclosure;

FIG. 4 is a flowchart illustrating a tester submitting a new test task creating instruction according to an embodiment of the present application;

fig. 5 is a schematic diagram of a testing apparatus according to an embodiment of the present disclosure.

Detailed Description

The technical solution in the embodiments of the present application will be explained below with reference to the drawings in the embodiments of the present application.

It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, the recitation of a claim "comprising a" 8230a "\8230means" does not exclude the presence of additional identical elements in the process, method, article or apparatus in which the element is incorporated, and further, similarly named components, features, elements in different embodiments of the application may have the same meaning or may have different meanings, the specific meaning of which should be determined by its interpretation in the specific embodiment or by further combination with the context of the specific embodiment.

It should be understood that the presence of "a plurality" herein refers to two or more.

It should be understood that the first, second, etc. descriptions appearing herein are for the purpose of illustration and distinction of objects of description, and are not intended to represent a particular limitation on the number of devices in the embodiments of the present application, and are not intended to constitute any limitation on the embodiments of the present application.

SIM card compatibility testing is also required when testing mobile terminal software, since SIM cards produced by different manufacturers of Subscriber Identity Module (SIM) cards (also called Subscriber Identity modules) may differ. The compatibility test of the SIM card refers to testing the usability of the SIM card on the mobile terminal.

In one implementation manner, a manual testing manner is generally adopted for testing the compatibility of the SIM cards, that is, the SIM cards are switched among different card slots of the mobile terminal in a manual plugging manner to complete the compatibility test of the same SIM card, and then the compatibility of other SIM cards is tested in the same manner. However, the SIM card needs to be frequently plugged and unplugged by adopting the implementation mode, so that the problems of SIM card damage, accelerated aging of mobile phone hardware, low test efficiency and the like are caused. Moreover, the SIM cards in the implementation mode are concentrated in hands of testing personnel, so that resource sharing cannot be achieved, and serious waste of resources is caused.

In another implementation mode, an automatic test mode is adopted to realize the compatibility test of the SIM card, and a computer instruction is used to control the test mobile terminal to perform the compatibility test on one SIM card. And after the SIM card compatibility test is finished, testing the next SIM card until the compatibility test of all the SIM cards to be tested is finished. However, when the implementation method is used for SIM card compatibility testing, only one SIM card can be tested at a time, which results in lower testing efficiency.

In order to solve the above problems, embodiments of the present application provide a test method and a test system, which can implement automatic testing of multiple different SIM cards at the same time, and the test resources are not limited by regions, and can implement sharing of the test resources.

Fig. 1 is a schematic diagram of a test system according to an embodiment of the present disclosure. The test system comprises a system server, test equipment, an SIM card integration board and a test terminal. Optionally, the test system further includes a system client, where the system client provides a test web page entry for receiving a new test task instruction input by a tester.

The connection relationship between each device in the test system is shown in fig. 1, and specifically includes:

the system server is connected with the SIM card integrated board, and specifically, the system server is connected with the SIM card integrated board through a network cable or wireless fidelity (WiFi). Optionally, signaling or data is further transmitted between the system server and the SIM card integrated board through ethernet. For example, the system server and the SIM card integrated board 1 in fig. 1 are connected by a network cable, and signaling or data is transmitted through the ethernet 1.

The SIM card integration board is connected with the test terminal, and specifically, the signal slot of the SIM card integration board is connected with the SIM card slot of the test terminal through a signal slot connecting line. For example, the signal slot in the SIM card integrated board 1 in fig. 1 and the SIM card slot of the test terminal 1 are connected by a signal slot connection line.

The test terminal is connected to the test equipment, and specifically, the test terminal is connected to the test equipment through a Universal Serial Bus (USB). For example, the test terminal 1 in fig. 1 is connected to the test apparatus 1 by USB.

The testing device is connected with the system server, and specifically, the testing device is connected with the system server through a network cable. Optionally, the test device and the system server further transmit signaling or data through an ethernet. For example, the test apparatus 1 and the system server in fig. 1 are connected by a network cable, and transmit signaling or data through the ethernet 2.

The functions of each device in the test system specifically include: the system server is used for controlling the SIM card integration board to output a specified SIM card signal by sending an instruction through WiFi or Ethernet. The test equipment is used for controlling the test terminal to test the specified SIM card signal according to the test task issued by the system server. That is to say, the system server, the testing device, the SIM card integration board and the testing terminal constitute a resource-sharing laboratory, and testers and developers in different regions can implement compatibility tests for different SIM cards through the system server, and can test a plurality of SIM cards simultaneously.

Fig. 2 is a schematic flowchart of a testing method according to an embodiment of the present disclosure. The testing method is realized by interaction among a system server, testing equipment and a testing terminal, and comprises the following steps:

the system server creates one or more test tasks 201, and the one or more test tasks comprise testing a plurality of SIM card signals output by the SIM card integration board simultaneously.

Specifically, the execution process of step 201 includes:

s11, the system server determines a test strategy corresponding to the test task new establishment instruction according to the input test task new establishment instruction, wherein the test strategy is used for instructing the test terminal to perform function test on the SIM card to be tested by adopting an appointed test case;

s12, the system server determines that the one or more test tasks include a test policy.

The testing system in this embodiment further includes a system client, where the system client provides a testing web page entry for receiving a new testing task instruction input by a tester. The system can be understood that different testing accounts are respectively allocated to different testers, and after the testers log in the testing accounts at the system client, new test task establishing instructions can be input according to testing requirements. For example, a tester logs in the test account 1 and inputs a new test task creating instruction in a test web page. Suppose that the new command of the test task is to perform flow function tests on the SIM cards 1 to 4 in the SIM card integrated board 1 respectively.

Correspondingly, the system server receives the test task new establishment instruction, analyzes the test task new establishment instruction, and determines a test strategy corresponding to the test task new establishment instruction. The testing strategy is used for instructing the testing terminal to adopt a specified testing case to carry out function testing on the SIM card to be tested. The test Case refers to a test file (Case) used for performing a function test on the SIM card to be tested, and one Case is used for testing one function. For example, when the test terminal needs to test the traffic function of the SIM card, case 1 may be used to test the SIM card. When the test terminal needs to test the call function of the SIM card, case 2 can be adopted to test the SIM card.

In one implementation mode, when a system server analyzes a new test task instruction, the system server obtains test terminal information and SIM card information to be tested included in the new test task instruction. That is, when a tester inputs a new test task instruction in a test web page, the tester needs to specify a test terminal and an SIM card to be tested. For example, when the new test task instruction is to adopt the test terminal 2 to perform flow function tests on the SIM cards 1 to 4 in the SIM card integrated board 1, the system server parses the new test task instruction to obtain the test terminal information included in the instruction as the information of the test terminal 2, and the SIM card information to be tested included in the instruction is the information of the SIM cards 1 to 4 in the SIM card integrated board 1. And the system server determines one or more test tasks according to the test strategy, the test terminal information and the SIM card information to be tested. Wherein, a test task is generated by the system server according to a new command of the test task. It can be understood that different testers can input different new test task establishment instructions, and the system server can receive multiple new test task establishment instructions to correspondingly generate multiple test tasks. For example, a tester logs in a test account 1 and inputs a test task new creation instruction 1 into a test web page. Suppose that the new test task creation instruction 1 is to perform flow function tests on the SIM cards 1 to 4 in the SIM card integrated board 1 respectively. And (3) logging in the test account 2 by research personnel, and inputting a new test task establishing instruction 2 into a test webpage. The new test task creating instruction 2 is assumed to be used for respectively carrying out call function tests on the SIM cards 1-4 in the SIM card integration board 1. And respectively creating a test task 1 and a test task 2 by the system server according to the test task new-creation instructions 1 and 2. It is understood that the test cases used by test task 1 and test task 2 are different.

Optionally, the system server records SIM card information in the SIM card integration board in the system in advance before creating one or more test tasks. For example, the system server records information of multiple SIM cards in the SIM card integration boards 1 to 3 shown in fig. 1 in advance, which is beneficial to allocating test resources to different SIM cards.

202, the test equipment acquires and parses one or more test tasks.

Wherein the system server generates one or more test tasks according to step 201. When the test device obtains the one or more test tasks, the test device may receive the one or more test tasks from the system server. Specifically, the test task includes one or more of the following information: the SIM card testing system comprises a testing terminal identification, an SIM card to be tested identification, a testing case identification, the associated information of the testing terminal and the SIM card to be tested, the associated information of the SIM card to be tested and the testing case and the like.

The identification of the test terminal is used for indicating the test terminal executing the test task. For example, the test terminals in fig. 1 are respectively identified as test terminal 1, test terminal 2, and the like. The identity of the SIM card to be tested is used to distinguish different SIM cards to be tested. For example, assuming that the testing task is to test the SIM cards 1 to 4 in the SIM card integration board 1, the identifiers of the SIM cards to be tested are SIM card 1_1, SIM card 1_2, SIM card 1_3, and SIM card 1_4, respectively. The identification of the test case is used for distinguishing different test cases. For example, case 1 represents a test Case for performing a traffic test, and Case 2 represents a test Case for performing a voice test.

The associated information of the test terminal and the SIM card to be tested represents that the appointed test terminal tests the appointed SIM card. For example, assuming that the testing task is to test the SIM cards 1 to 4 in the SIM card integrated board 1 through the testing terminal 1, the association information between the testing terminal and the SIM card to be tested is that the testing terminal 1 is associated with the SIM card 1_1. And the correlation information of the SIM card to be tested and the test case indicates that the specified SIM card is tested by adopting the specified test case. For example, assuming that the testing task is to perform traffic function testing on the SIM cards 1 to 4 in the SIM card integration board 1, the association information of the SIM cards to be tested and the test cases includes that SIM card 1_1 is associated with Case 1, SIM card 1 _2is associated with Case 1, SIM card 1 _3is associated with Case 1, and SIM card 1 _4is associated with Case 1.

The test equipment generates a test task queue according to one or more test tasks 203.

Specifically, the test equipment sequences one or more test tasks according to the identifier of the SIM card to be tested, and generates a test task queue. For example, the step of obtaining the test task 1 by the test equipment is to perform flow function tests on the SIM cards 1 to 4 in the SIM card integrated board 1 by using the test terminal 1. The test task 2 is to adopt the test terminal 2 to respectively perform the call function test on the SIM cards 1 to 4 in the SIM card integrated board 1. The test equipment sequences according to the identifiers of the to-be-tested SIM cards in the test task 1 and the test task 2, and generates a test task queue. Table 1 is a test task queue including the test task 1 and the test task 2, and the test tasks are sorted according to the identifier of the SIM card to be tested.

Table 1: test task queue

Serial number	Identification of SIM card to be tested	Identification of test terminal	Test case
					1	SIM card 1 u 1	Test terminal 1	Case 1
2	SIM card 1 u 1	Test terminal 2	Case 2
				3	SIM card 1_2	Test terminal 1	Case 1
4	SIM card 1 u 2	Test terminal 2	Case 2
				5	SIM card 1_3	Test terminal 1	Case 1
6	SIM card 1 u 3	Test terminal 2	Case 2
				7	SIM card 1_4	Test terminal 1	Case 1
8	SIM card 1 u 4	Test terminal 2	Case 2

According to the description in table 1, the test task queue includes test terminal information, SIM card information to be tested, and test case information. Specifically, the test terminal information includes an identifier of the test terminal and a state of the test terminal. For example, when the current state of the test terminal 1 is an online state and an idle state, the test terminal 1 may perform a test task. Otherwise, when the current state of the test terminal 1 is an online state but a busy state, the test terminal 1 cannot currently execute the test task. The test equipment instructs other test terminals to continue to execute the corresponding test tasks in the test task queue in sequence. The SIM card information to be tested comprises the SIM card identification to be tested and also comprises the state of the SIM card to be tested. For example, when SIM card 1_1 is in a valid state, then SIM card 1_1 can be tested. When SIM card 1_1 is in a disabled state, then SIM card 1_1 is no longer tested. The test equipment instructs the test terminal to continue to execute the corresponding test tasks in the test task queue in sequence.

204, the testing equipment sends the associated SIM card information to be tested and the testing case information to the testing terminal.

Specifically, the test equipment sends the associated to-be-tested SIM card information and test case information to the test terminals in the test task queue respectively according to the test task queue. Correspondingly, the test terminal receives the associated SIM card information to be tested and the test case information.

And 205, the test terminal tests a plurality of SIM card signals output by the SIM card integration board at the same time according to the associated SIM card information and the test case information, and generates a test report.

The test method of the embodiment can simultaneously test a plurality of SIM card signals. The plurality of SIM card signals comprise the following two conditions:

the first condition is as follows: a SIM card integrated board can simultaneously output the signals of a plurality of SIM cards respectively through a plurality of signal slots, and the signals of the SIM cards respectively are tested by a plurality of test terminals.

Case two: a plurality of signals of the same SIM card can be simultaneously output by one SIM card integration board through a plurality of signal slots, and the plurality of signals of the same SIM card are subjected to multi-card test through one test terminal.

That is, the two situations are different test scenarios, and the test terminal will also execute the test procedure according to the two different test scenarios.

In one implementation, the test terminal executes a test procedure for case one as follows:

s21, when the SIM card integration board simultaneously outputs a plurality of SIM card signals to a plurality of test terminals for single card testing, respectively, any one of the test terminals tests the SIM card signal to be tested associated with the test terminal according to the test strategy;

s22, when any one of the plurality of test terminals finishes the test, the test terminal sends a test finish message to the test equipment;

s23, when the test equipment receives the test completion message, the test equipment sends SIM card switching indication information to the system server, wherein the SIM card switching indication information is used for indicating the SIM card integration board to switch the SIM cards according to the sequence of the SIM card identifiers in the test task queue;

and s24, when the SIM card integration board completes the SIM card switching, the test terminal indicated by the test task queue executes the test flow again.

For example, the test task queue includes:

1) The SIM card integrated board 1 shown in fig. 1 simultaneously outputs two SIM card signals, i.e., SIM card 1_1 and SIM card 1_2, and the signal of SIM card 1_1 is output to the test terminal 1 for performing a traffic function test, and the signal of SIM card 1_2 is output to the test terminal 2 for performing a call function test.

2) The SIM card integrated board 1 shown in fig. 1 simultaneously outputs two SIM card signals, i.e., SIM card 1_3 and SIM card 1_4, and the signal of SIM card 1_3 is output to the test terminal 1 for performing a traffic function test, and the signal of SIM card 1_4 is output to the test terminal 2 for performing a call function test.

The test device first sends the information of SIM card 1_1 and the information of Case 1 to the test terminal 1, and sends the information of SIM card 1_2 and the information of Case 2 to the test terminal 2. The test terminal 1 acquires the signal of the SIM card 1_1 output by the SIM card integration board 1, performs a flow function test on the signal of the SIM card 1 _u1 by adopting the Case 1, and generates a test report. The test terminal 2 acquires the signal of the SIM card 1_2 output by the SIM card integration board 1, performs a call function test on the signal of the SIM card 1 _u2 by adopting Case 2, and generates a test report. And after the test of the test terminal 1 and the test terminal 2 is finished, respectively sending a test finishing message to the test equipment. When the test equipment receives the test completion message, the test equipment sends SIM card switching indication information to the system server, wherein the SIM card switching indication information is used for indicating the SIM card integration board 1 to switch the SIM card to be tested from the SIM card 1 _1and the SIM card 1 _2to the SIM card 1 _3and the SIM card 1_4. When the SIM card integration board 1 completes the SIM card switching, the test terminal 1 and the test terminal 2 continue to execute the test flow according to the sequencing of the test task queue, and the specific implementation manner refers to the foregoing test flow, which is not described herein again. Therefore, the testing process realizes that the plurality of testing terminals test the signals of the plurality of SIM cards simultaneously output by the SIM card integrated board, improves the testing efficiency and realizes resource sharing.

In another implementation manner, the test terminal executes the test procedure for the case two as follows: when the SIM card integration board simultaneously outputs a plurality of SIM card signals to a test terminal for multi-card test, the test terminal respectively tests the plurality of SIM card signals according to a test strategy.

For example, the test task queue includes:

1) The SIM card integrated board 1 shown in fig. 1 simultaneously outputs a plurality of signals of the SIM card 1_1, and the plurality of signals of the SIM card 1_1 are respectively output to the test terminal 1 for performing a traffic function test and output to the test terminal 2 for performing a call function test.

2) The SIM card integration board 1 shown in fig. 1 simultaneously outputs a plurality of signals of the SIM card 1_2, and the plurality of signals of the SIM card 1_2 are respectively output to the test terminal 1 for performing a traffic function test and output to the test terminal 2 for performing a call function test.

The test device first sends the information of SIM card 1_1 and the information of Case 1 to the test terminal 1, and sends the information of SIM card 1_1 and the information of Case 2 to the test terminal 2. The test terminal 1 acquires the signal of the SIM card 1_1 output by the SIM card integration board 1, performs a traffic function test on the signal of the SIM card 1_1 by using the Case 1, and generates a test report. The test terminal 2 acquires the signal of the SIM card 1_1 output by the SIM card integration board 1, performs a call function test on the signal of the SIM card 1_1 by adopting Case 2, and generates a test report. And after the test of the test terminal 1 and the test terminal 2 is finished, respectively sending a test finishing message to the test equipment. When the test equipment receives the test completion message, the test equipment sends SIM card switching indication information to the system server, wherein the SIM card switching indication information is used for indicating the SIM card integration board 1 to switch the SIM card to be tested from the SIM card 1_1 to the SIM card 1_2. When the SIM card integration board 1 completes the SIM card switching, the test terminal 1 and the test terminal 2 continue to execute the test flow according to the sequencing of the test task queue, and the specific implementation manner refers to the foregoing test flow, which is not described herein again. Therefore, the test process realizes that one test terminal tests a plurality of signals of one SIM card output by the SIM card integration board at the same time, so that one test terminal can automatically test more SIM card signals.

206, the test terminal sends a test report to the test equipment.

After the test of the test terminal is completed, a test report can be generated by capturing logs and the like, so that the test equipment and the system server can acquire the execution condition of the test flow.

The embodiment of the application provides a test method, which is realized by interaction among a system server, test equipment and a test terminal. The system server determines a test strategy corresponding to the test task new establishment instruction according to the input test task new establishment instruction, wherein the test strategy is used for instructing the test terminal to perform function test on the SIM card to be tested by adopting a specified test case. The system server determines that the one or more test tasks include a test policy. The test equipment acquires and resolves one or more test tasks. The test equipment generates a test task queue according to one or more test tasks. And the test equipment sends the associated SIM card information to be tested and the test case information to the test terminal. And the test terminal tests a plurality of SIM card signals output by the SIM card integration board simultaneously according to the associated SIM card information and the test case information, generates a test report and sends the test report to the test equipment. Therefore, the testing method can realize the simultaneous automatic testing of various different SIM cards, the testing resources are not limited by regions, and the sharing of the testing resources can be realized.

The following describes a specific test flow when the test method in the embodiment of fig. 2 is applied to the test system shown in fig. 1. Fig. 3 is a schematic specific flowchart of a testing method applied to the testing system shown in fig. 1 according to an embodiment of the present application, including the following steps:

1) The system server obtains a test task new establishment instruction, determines a test strategy corresponding to the test task new establishment instruction, and establishes one or more test tasks according to the test strategy. The step of creating the test task by the system server refers to the description of step 201 in the embodiment of fig. 2, and is not described herein again.

2) The test equipment detects the state of the test terminal connected with the test equipment at regular time. For example, the test apparatus 1 in fig. 1 periodically detects whether the states of the test terminal 1 and the test terminal 2 are online and idle, and if so, adds the test terminal 1 and the test terminal 2 into an idle test terminal resource pool.

3) And the test equipment acquires the information of the idle test terminal from the idle test terminal resource pool. The information of the idle test terminal includes an identifier of the idle test terminal, a serial number (SN number) of the idle test terminal, and other information.

4) The test device acquires one or more test tasks. For example, the test device may obtain a corresponding test task according to a serial number of an idle test terminal.

5) The test equipment analyzes the one or more test tasks and generates a test task queue according to the one or more test tasks. The specific implementation manner refers to the descriptions in steps 202 and 203 in the embodiment of fig. 2, and is not described herein again.

6) And the test equipment sends the associated SIM card information to be tested and the test case information to the test terminal. The specific implementation manner refers to the description in step 204 in the embodiment of fig. 2, and is not described herein again.

7) And the SIM card integration board performs state check on the SIM card to be tested. When the SIM card to be tested is in a valid state, the SIM card integration board outputs a signal of the SIM card to a corresponding test terminal. When the SIM card to be tested is in a failure state, the SIM card integration board informs the testing equipment that the SIM card to be tested is unavailable through the system server.

8) And when the SIM card to be tested is in a valid state, the test terminal runs the test case, tests the signal output by the SIM card to be tested and generates a test report. The test terminal may generate the test report by capturing a log and generating the test report from the recorded log. Specifically, the specific step of the testing terminal testing the SIM card to be tested refers to step 205 in the embodiment of fig. 2, and is not described herein again.

9) And after the test of the test terminal is finished, the test terminal sends a test report to the test equipment.

10 When the test equipment receives the test report, the test equipment queries the test task queue and notifies the corresponding test terminal to execute the next test task.

11 When all the test tasks in the test task queue are completed, the test equipment determines to end the test tasks and releases system resources.

In one implementation mode, the process of the system server acquiring a test task new establishment instruction, determining a test strategy corresponding to the test task new establishment instruction, and establishing one or more test tasks according to the test strategy comprises the process of the test task new establishment instruction submitted by a tester at a system client. Fig. 4 is a flowchart of a new instruction for a tester to submit a test task according to an embodiment of the present application, including the following steps:

1) And logging in a test account at the system client by a tester, and entering a test task to create a webpage.

2) And the tester starts to create the test task at the test task creation webpage.

3) And the system server judges whether the test account is associated with the test strategy or not according to the information of the test account. For example, if the test account is a historical user account, the system server determines that the test account has an associated test policy, and may query a historical test record of the test account to obtain the test policy associated with the test account. And if the test account is a new user account, the system server pushes a test strategy selection page to the system client. And the tester clicks to enter a test strategy selection page to select a test strategy. And if the testing personnel need to modify the testing strategy, executing the step 4). If the tester does not need to modify the test strategy, step 8) is performed.

4) The tester selects the test terminal.

5) The tester selects the SIM card to be tested.

6) The tester chooses whether to specify a test case for the SIM card. And if the tester needs to specify a test case for the SIM card, selecting the specific test case for the specific SIM card. And if the test cases do not need to be specified for the SIM cards, determining that all the SIM cards select the same test case.

7) The tester will also choose whether to save or update the test strategy. For example, when the test account is a new user account, the system server will save the test account and its associated test policy.

8) The tester submits a test strategy, and the system server creates a test task according to the test strategy.

Fig. 5 is a schematic diagram of a testing apparatus according to an embodiment of the present disclosure. The test device includes: the processor 501 and the memory 502, the processor 501 and the memory 502 being connected by one or more communication buses.

The Processor 501 may be a Central Processing Unit (CPU), and may also be other general purpose processors, digital Signal Processors (DSP), application Specific Integrated Circuits (ASIC), field-Programmable Gate arrays (FPGA) or other Programmable logic devices, discrete Gate or transistor logic devices, discrete hardware components, and so on. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory may be either volatile memory or nonvolatile memory, or may include both volatile and nonvolatile memory. The non-volatile Memory may be a Read-Only Memory (ROM), a Programmable ROM (PROM), an Erasable PROM (EPROM), an Electrically Erasable PROM (EEPROM), or a flash Memory. Volatile Memory can be Random Access Memory (RAM), which acts as external cache Memory. By way of example, but not limitation, many forms of Random Access Memory (RAM) are available, such as Static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double Data Rate SDRAM (Double Data Rate SDRAM, DDR SDRAM), enhanced SDRAM (ESDRAM), sync-link DRAM (SLDRAM), and Direct Rambus RAM (DR RAM)

The processor 501 is configured to support the access network device to perform corresponding functions in the method described in fig. 2. The memory 502 may include read-only memory and random access memory, and provides computer programs and data to the processor 501. A portion of the memory 502 may also include non-volatile random access memory.

When the processor 501 calls the computer program, it is configured to:

creating one or more test tasks, wherein the one or more test tasks comprise testing a plurality of SIM card signals output by the SIM card integration board simultaneously;

acquiring and analyzing one or more test tasks, and generating a test task queue according to the one or more test tasks, wherein the test task queue comprises test terminal information, SIM card information to be tested and test case information;

sending the associated SIM card information to be tested and the test case information to a test terminal;

testing a plurality of SIM card signals output by the SIM card integration board at the same time according to the associated SIM card information and the test case information, and generating a test report;

and sending a test report to the test equipment.

In one embodiment, the processor 501, when invoking the computer program, is configured to perform:

determining a test strategy corresponding to the test task new establishment instruction according to the input test task new establishment instruction; the test strategy is used for indicating the test terminal to adopt a specified test case to carry out function test on the SIM card to be tested;

determining the one or more test tasks includes testing a policy.

and receiving one or more test tasks from the system server, wherein the test tasks comprise one or more of the identification of the test terminal, the identification of the SIM card to be tested, the identification of the test case, the associated information of the test terminal and the SIM card to be tested, and the associated information of the SIM card to be tested and the test case.

and sequencing one or more test tasks according to the identification of the SIM card to be tested to generate a test task queue.

and when the SIM card integration board simultaneously outputs a plurality of SIM card signals to a plurality of test terminals for single card test respectively, testing the SIM card signals to be tested associated with the test terminals according to the test strategy.

In one embodiment, the processor 501, when calling the computer program, is configured to perform:

when the SIM card integrated board simultaneously outputs a plurality of SIM card signals to a test terminal for multi-card testing, the SIM card integrated board respectively tests the plurality of SIM card signals according to a test strategy.

when any one of the plurality of test terminals finishes testing, sending a test finishing message to the test equipment;

when the test equipment receives the test completion message, sending SIM card switching indication information to the system server, wherein the SIM card switching indication information is used for indicating the system server to inform the SIM card integration board to switch the SIM cards according to the sequence of the SIM card identifiers in the test task queue;

and when the SIM card integration board finishes the SIM card switching, executing the test flow again.

and pre-recording the SIM card information in the SIM card integration board.

The embodiment of the application provides a chip. The chip includes: a processor and a memory. The number of processors may be one or more, and the number of memories may be one or more. The processor may perform the testing methods described above with reference to fig. 2-4, and the steps performed by the related embodiments, by reading the instructions and data stored in the memory.

The embodiment of the present application further provides a chip module, which includes the above chip, and can execute the testing method shown in fig. 2 to 4 and the steps executed by the related embodiments.

The embodiment of the application also provides a computer readable storage medium. The computer readable storage medium stores a computer program comprising program instructions that, when executed by a processor, perform the testing method shown in fig. 2 to 4 and the steps performed by the related embodiments.

The computer readable storage medium may be an internal storage unit of the device (including the system server, the test device, and the test terminal) according to any of the foregoing embodiments, for example, a hard disk or a memory of the device. The computer readable storage medium may also be an external storage device of the device according to any of the foregoing embodiments, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like, provided on the device. Further, the computer readable storage medium may also include both an internal storage unit and an external storage device of the device described in any of the foregoing embodiments. The computer-readable storage medium is used for storing the computer program and other programs and data required by the apparatus of any of the preceding embodiments. The computer readable storage medium may also be used to temporarily store data that has been output or is to be output. The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server, data center, etc. that contains one or more collections of available media. The usable medium may be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium. The semiconductor medium may be a solid state disk.

The above-described embodiments may be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, the above-described embodiments may be implemented in whole or in part in the form of a computer program product. The computer program product comprises one or more computer instructions or computer programs. The procedures or functions according to the embodiments of the present application are wholly or partially generated when the computer instructions or the computer program are loaded or executed on a computer. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored in a computer readable storage medium or transmitted from one computer readable storage medium to another computer readable storage medium, for example, the computer instructions may be transmitted from one website, computer, server, or data center to another website, computer, server, or data center by wire or wirelessly.

It should be understood that, in the various embodiments of the present application, the sequence numbers of the above-mentioned processes do not mean the execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may be physically included alone, or two or more units may be integrated into one unit. The integrated unit can be realized in a form of hardware, or in a form of hardware plus a software functional unit.

The integrated unit implemented in the form of a software functional unit may be stored in a computer-readable storage medium. The software functional unit is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute some steps of the methods described in the embodiments of the present application.

It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. The storage medium may be a magnetic disk, an optical disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), or the like.

While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made without departing from the spirit and scope of the invention as defined by the appended claims.

Claims

1. The test method is characterized by being applied to a test system, wherein the test system comprises a system server, test equipment, an SIM card integrated board and a test terminal; the method comprises the following steps:

the system server creates one or more test tasks, wherein the one or more test tasks comprise testing a plurality of SIM card signals output by the SIM card integration board simultaneously;

the test equipment acquires and analyzes the one or more test tasks;

the test equipment generates a test task queue according to the one or more test tasks, wherein the test task queue comprises test terminal information, SIM card information to be tested and test case information;

the test equipment sends the associated SIM card information to be tested and test case information to the test terminal; the related information of the SIM card to be tested and the test case information represent that the appointed SIM card is tested by adopting an appointed test case;

the test terminal adopts a specified test case to test a plurality of SIM card signals output by the SIM card integrated board at the same time and generate a test report;

and the test terminal sends the test report to the test equipment.

2. The method of claim 1, wherein the system server creates one or more test tasks comprising:

the system server determines a test strategy corresponding to a test task new establishment instruction according to the input test task new establishment instruction, wherein the test strategy is used for indicating the test terminal to adopt a specified test case to perform function test on the SIM card to be tested;

the system server determines that the one or more test tasks include the test policy.

3. The method of claim 1, wherein the test device obtains and parses the one or more test tasks, comprising:

4. The method of claim 3, wherein the test device generates a test task queue based on the one or more test tasks, comprising:

and the test equipment sequences the one or more test tasks according to the identification of the SIM card to be tested, and generates the test task queue.

5. The method according to any one of claims 1 to 4, wherein the testing terminal tests a plurality of SIM card signals output by the SIM card integration board simultaneously according to the associated SIM card information and test case information, and comprises:

when the SIM card integration board simultaneously outputs a plurality of SIM card signals to a plurality of test terminals for single card test respectively, any one of the test terminals tests the SIM card signal to be tested associated with the any one test terminal according to a test strategy.

6. The method according to any one of claims 1 to 4, wherein the testing terminal tests a plurality of SIM card signals output by the SIM card integration board simultaneously according to corresponding SIM card information and test case information, and comprises:

when the SIM card integration board simultaneously outputs a plurality of SIM card signals to one test terminal for multi-card testing, the test terminal respectively tests the plurality of SIM card signals according to a test strategy.

7. The method of claim 1, further comprising:

after the test of the test terminal is finished, the test terminal sends a test finishing message to the test equipment;

when the test equipment receives the test completion message, the test equipment sends SIM card switching indication information to the system server, wherein the SIM card switching indication information is used for indicating the SIM card integration board to switch the SIM cards according to the sequence of the SIM card identifiers in the test task queue;

and when the SIM card integration board finishes the SIM card switching, the test terminal indicated by the test task queue executes the test flow again.

8. The method of claim 1, wherein prior to the system server creating one or more test tasks, the method further comprises:

and the system server records the SIM card information in the SIM card integration board in advance.

9. A test system is characterized by comprising a system server, test equipment, an SIM card integrated board and a test terminal; the system server is connected with the SIM card integration board, the SIM card integration board is connected with the test terminal, the test terminal is connected with the test equipment, and the test equipment is connected with the system server; wherein, the first and the second end of the pipe are connected with each other,

the system server is used for creating one or more test tasks, and the one or more test tasks comprise testing a plurality of SIM card signals output by the SIM card integration board simultaneously;

the test equipment is used for acquiring and analyzing the one or more test tasks;

the test equipment is also used for generating a test task queue according to the one or more test tasks, wherein the test task queue comprises test terminal information, SIM card information to be tested and test case information;

the test equipment is also used for sending the associated SIM card information to be tested and the test case information to the test terminal; the associated information of the SIM card to be tested and the test case information represent that the appointed SIM card is tested by adopting an appointed test case;

the test terminal is used for testing a plurality of SIM card signals output by the SIM card integration board at the same time by adopting a specified test case and generating a test report;

the test terminal is also used for sending the test report to the test equipment.

10. The system of claim 9, wherein the system server is configured to create one or more test tasks, comprising:

11. The system of claim 9, wherein the test device is configured to obtain and parse the one or more test tasks, comprising:

12. The system of claim 11, wherein the testing device is further configured to generate a test task queue based on the one or more test tasks, comprising:

and the testing equipment sequences the one or more testing tasks according to the identification of the SIM card to be tested, and generates the testing task queue.

13. The system according to any one of claims 9 to 12, wherein the test terminal is configured to test a plurality of SIM card signals output by the SIM card integration board simultaneously according to the associated SIM card information and test case information, and includes:

14. The system according to any one of claims 9 to 12, wherein the test terminal is configured to test a plurality of SIM card signals output by the SIM card integration board simultaneously according to corresponding SIM card information and test case information, and includes:

15. The system of claim 9, wherein the test terminal is further configured to send a test complete message to the test equipment after the test of the test terminal is completed;

the test equipment is further used for sending SIM card switching indication information to the system server when the test equipment receives the test completion message, wherein the SIM card switching indication information is used for indicating the SIM card integration board to switch the SIM cards according to the sequence of the SIM card identifiers in the test task queue;

and the test terminal in the test task queue is also used for executing the test flow again when the SIM card integration board finishes the SIM card switching.

16. The system of claim 9, wherein the system server is further configured to pre-record SIM card information in the SIM card integration board.

17. A chip, characterized in that it comprises a processor and a data interface, the processor reading instructions stored on a memory through the data interface to execute the method according to any one of claims 1 to 8.

18. A chip module, characterized in that it comprises a chip as claimed in claim 17.

19. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program comprising program instructions that, when executed by a processor, cause the processor to carry out the method according to any one of claims 1 to 8.