KR20020035060A - Parallax Radiographic Testing for the Measurement of Flaw Depth - Google Patents

Parallax Radiographic Testing for the Measurement of Flaw Depth Download PDF

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KR20020035060A
KR20020035060A KR1020020018865A KR20020018865A KR20020035060A KR 20020035060 A KR20020035060 A KR 20020035060A KR 1020020018865 A KR1020020018865 A KR 1020020018865A KR 20020018865 A KR20020018865 A KR 20020018865A KR 20020035060 A KR20020035060 A KR 20020035060A
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film
depth
distance
defect
flaw
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KR1020020018865A
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Korean (ko)
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KR100489711B1 (en
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신병철
김정규
배성진
구갑렬
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신병철
김인식
학교법인 동의학원
김홍정
(주)뉴트란
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Priority to KR10-2002-0018865A priority Critical patent/KR100489711B1/en
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
    • G01B15/08—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Toxicology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

PURPOSE: A radiographic non-destructive test capable of measuring depth of flaw is provided to measure depth of the flaw almost without error. CONSTITUTION: A variable K is fixed to compensate distance(K) between a lower end surface of an object. A film(7) is exposed twice as a radiation source(9,10) moves at fixed interval. The depth of a flaw is measured from an image(5) of the flaw on a penetration photograph by an equation H=(B*T)/(A+B)-K where H is the depth of the flaw, A is moving distance of the radiation source, B is moving distance of the flaw, T is distance between the radiation source and the film. A second exposure time is to be twice as longer as a first exposure time to make a moving image of the flaw clear.

Description

결함깊이의 측정이 가능한 방사선투과 비파괴검사법{Parallax Radiographic Testing for the Measurement of Flaw Depth}Parallax Radiographic Testing for the Measurement of Flaw Depth

본 발명은 결함깊이를 측정하기 위한 방사선투과 비파괴검사법에 관한 것으로, 더욱 상세하게는 방사선검사 대상물에 선원을 다른 위치로 이동하여 두 번 노출하되 한장의 필름을 사용하여 두번 노출한 후 그때의 결함상의 이동상태로부터 결함의 위치를 계산하는 결함깊이의 측정이 가능한 방사선투과 비파괴검사법에 관한 것이다.The present invention relates to a radiographic non-destructive testing method for measuring the depth of a defect, and more particularly, to move the source to another location and expose twice the source to the radiographic examination, and then exposed twice using a single film and then The present invention relates to a radiographic nondestructive testing method capable of measuring the depth of a defect that calculates the location of a defect from a moving state.

일반적으로 방사선투과 비파괴검사법으로 대상물의 결함깊이를 측정하기 위해서는 대상물을 여러 각도로 촬영한 후, 이것을 3차원적으로 해석하여 결함의 깊이를 측정하고 있으며, 상기한 바와 같은 종래의 방사선투과 비파괴검사법에 의하면 대상물을 여러 각도로 촬영하기 때문에 필름을 3차원적으로 배열하여야 하나 이와 같은 필름의 배열작업은 사람이 직접하기가 거의 불가능하므로 컴퓨터를 이용한 프로그램이 사용되고 있다.In general, in order to measure the defect depth of the object by radiographic nondestructive testing, the object is photographed at various angles and then analyzed in three dimensions to measure the depth of the defect. According to the present invention, the film is arranged in three dimensions because the object is photographed at various angles. However, such a film arranging operation is almost impossible for a person to directly do, and a computer-based program is used.

그러나, 상기한 바와 같은 프로그램을 사용하기 위해서는 일정 수준의 지식과 비용이 많이 소요되므로 현장에서는 거의 사용을 하지 않고 있다.However, the use of such a program requires a certain level of knowledge and costs, and is therefore rarely used in the field.

또한, 이 검사법은 시편을 촬영할 때 시험편의 확대 비율을 정확히 제어하기가 힘들다. 즉, 결함이 선원쪽에 가까이 위치할수록 결함상이 확대되므로 이것을 이용하여 결함의 위치를 산출하기는 어렵다.In addition, this test method is difficult to accurately control the enlargement ratio of the specimen when photographing the specimen. In other words, as the defect is located closer to the source, the defect image is enlarged, so it is difficult to calculate the position of the defect using this.

그래서 현장에서는 여러장의 필름을 사용하여 촬영해야하기 때문에 번거롭고 방사선에 피폭될 가능성이 높고, 정확하게 제어하기가 어렵기 때문에 두께측정에 대한 오차가 크므로 사용되지 않고 있다.Therefore, it is not used because it is cumbersome and likely to be exposed to radiation because it is necessary to photograph with several films in the field, and because the error for thickness measurement is large because it is difficult to control accurately.

본 발명은 상기와 같은 문제점을 해소하기 위해 대상물을 한 장의 필름에 X선 초점 즉 선원을 일정 간격만큼 이동하여 두 번을 노출시키고, 그때 투과사진의 결함 상에서 이동한 거리, 선원 이동거리, 선원-필름간 거리의 비례식으로 결함의 깊이를 구하되, 필름과 시편의 밀착율을 높여 깊이에 비례적으로 영향을 미치는 변수(대상물과 필름간의 거리 ; K)를 고정시키고, 상의 이동거리를 0.1mm까지 정확히 읽을 수 있는 게이지를 이용하여 정확히 측정하고, 선원의 이동거리와 선원-필름간 거리를 정확하게 제어하여 오차가 거의 없는 결함깊이의 측정이 가능한 방사선투과 비파괴검사 방법을 제공하는데 목적이 있는 것이다.In order to solve the above problems, the present invention exposes an object twice to X-ray focal point, that is, a source, by a predetermined interval, to expose the object twice, and then the distance moved on the defect of the transmission photograph, source moving distance, source- Depth of defect is calculated by proportionality of distance between films, but it improves adhesion rate between film and specimen, and fixes variable (distance between object and film; K) which affects depth proportionally, and moves the phase up to 0.1mm The purpose of the present invention is to provide a radiographic non-destructive inspection method that can accurately measure using a readable gauge and accurately control the moving distance of the source and the distance between the source and the film so that the defect depth can be measured with little error.

도 1은 시험편과 필름의 단면도1 is a cross-sectional view of a test piece and a film

도 2는 결함깊이를 측정하기 위한 시험편과 필름의 배치도2 is a layout view of the test piece and the film for measuring the depth of the defect

도 3은 결함깊이를 측정하기 위한 방사선투과 장치와 시험편의 구조도3 is a structural diagram of a radiographic apparatus and a test piece for measuring the depth of the defect

*도면의 주요부분에 대한 부호의 설명** Description of the symbols for the main parts of the drawings *

T : 선원과 필름간의 거리T: distance between source and film

K, 22 : 시험편 하단면으로부터 필름까지의 거리K, 22: distance from the bottom surface of the test piece to the film

B : 결함이 이동한 거리 5 : 결함상B: Distance traveled by defect 5: Defective

6 : 시험편상 7, 13, 20 : 필름6: 7, 13, 20: film on test piece

8, 23 : 시험편 9, 10 : 선원8, 23: test piece 9, 10: seaman

A : 선원의 이동거리 12: 투과도계A: Moving distance of the source 12: Transmittance meter

14 : 리드와이어 15 : 명암도계14: lead wire 15: contrast meter

16 : ID marKer 17, 18 : 시험편16: ID marKer 17, 18: test piece

19 : 비닐 카세트 21 : Pb 스크린19 vinyl cassette 21 Pb screen

이와 같은 목적을 달성하기 위한 본 발명의 특징은 방사선투과 비파괴검사 방법에 있어서, 대상물 하단면으로부터 필름면까지의 거리를 보정하기위해 변수 K값을 고정시키고, 한 장의 필름에 선원을 일정 간격만큼 이동하여 두 번을 노출하되, 결함의 이동상을 선명하게 나타낼 수 있게 1회 노출 후 2회 노출 시에 노출시간을 2배로 주며, Thomson산란이나 Compton산란을 방지하기 위하여 그리드(Grid)를 사용하며, 투과사진의 결함상으로부터 하기의 수학식 1에 따라 결함의 깊이를 측정하는 방사선투과 비파괴검사방법을 제공하는 데 있다.In order to achieve the above object, a feature of the present invention is a radiographic non-destructive inspection method, in which a variable K value is fixed to correct a distance from the bottom surface of an object to a film surface, and the source is moved by a predetermined distance on a single film Two exposures, but double exposure time after one exposure so that the mobile phase of defects can be clearly displayed, and a grid is used to prevent Thomson scattering or Compton scattering. It is to provide a radiographic nondestructive inspection method for measuring the depth of a defect in accordance with the following equation (1) from a photographic defect image.

이때, 상기 K값을 고정하는 것은 대상물 하단면으로부터 필름까지의 간격을 여러번의 실험을 통해 일정한 오차범위를 측정한 후 특정한 값을 구하는 것으로, K값이 고정되지 않으면 측정시에 K값이 비닐카세트의 두께, 시험편과 필름간의 밀착상태 등, 보정하기 힘든 외부인자로 인해 정확한 결함깊이를 측정하기가 불가능해져서 많은 오차를 가지게 되므로 이러한 오차를 최소화하기 위해 깊이 측정에 영향을 미칠 수 있는 K변수를 고정시켜 모든 시험편에 대해 동일하게 변수가 적용되어 고정 정수로써의 역할을 하도록 한 것이다.At this time, fixing the K value is to obtain a specific value after measuring a certain error range through a number of experiments the distance from the bottom surface of the object to the film, if the K value is not fixed, the K value is a vinyl cassette at the time of measurement Because it is impossible to measure the exact defect depth due to external factors such as the thickness of the sample, the adhesion state between the specimen and the film, etc., it is impossible to measure the exact defect depth. Therefore, to minimize the error, fix the K variable that may affect the depth measurement. The same parameters were applied to all specimens to serve as fixed integers.

상기 수학식 1에서 H는 결함의 깊이를 나타내고, A는 선원의 이동거리, B는 결함의 이동거리, T는 선원과 필름간의 거리, K는 대상물의 하단면으로부터 필름까지의 거리를 나타낸다.In Equation 1, H represents a depth of a defect, A represents a moving distance of the source, B represents a moving distance of the defect, T represents a distance between the source and the film, and K represents a distance from the bottom surface of the object to the film.

상기한 바와 같이 구성된 본 발명의 실시예를 하기에서 도 1내지 도 3을 참조하여 보다 상세하게 살펴본다.An embodiment of the present invention configured as described above will be described in more detail with reference to FIGS. 1 to 3.

방사선검사 대상물(이하 시험편)과 필름간의 거리(보정정수, K)의 오차를 줄이기 위해 도 1과 같이 필름(20)면상에 Pb 스크린(21)과 비닐 카세트(19) 및 시험편(23)을 수직으로 올려놓고, 시험편(23)의 하면으로부터 필름(20)사이의 틈(22)을 여러번의 실험을 통해 일정한 오차범위(평균오차)를 측정하여 특정한 값(시험편의 하면과 필름사이의 간격 평균값)을 구하여 K값을 설정한다.In order to reduce the error of the distance between the radiographic object (hereinafter referred to as the test piece) and the film (correction constant, K), the Pb screen 21, the vinyl cassette 19, and the test piece 23 are perpendicular to the film 20 surface as shown in FIG. On the other hand, the gap 22 between the film 20 from the lower surface of the test piece 23 was measured through a number of experiments to measure a certain error range (average error), and then to determine a specific value (the average value of the gap between the lower surface of the test piece and the film). Obtain K and set K value.

이와 같이 K변수를 고정한 후 도 2에 나타내는 바와 같이 시험편(17)(18) 두개의 절단면을 서로 밀착시켜 인공적인 용입부족을 만든 후 도 2와 같은 배치로 위치시키고, 투과사진의 상질을 평가하기 위해 투과도계(12)를 사용하고 투과사진 상의 결함의 이동거리와 비교하고 K값 고정으로 인해 발생하는 오차(평균오차)를 보정하기 위해 선원 쪽에 1.2mm 두께의 납으로 된 리드와이어(Lead Wire ; 14)를 결함에서 10mm 떨어진 위치의 모재에 테이프로 고정시킨다.After fixing the K-parameter as described above, as shown in FIG. 2, two test pieces (17) and (18) were cut into close contact with each other to create an artificial penetration deficiency, and then placed in the arrangement as shown in FIG. A lead wire made of 1.2 mm thick lead wire on the side of the source in order to use the permeability meter 12, to compare the moving distance of defects on the transmission picture, and to correct an error (average error) caused by fixing the K value. 14) with tape to the base material 10 mm away from the defect.

상기 도 2에서 미설명부호 13은 필름, 15는 명암도계(Consrastmeter), 16은 ID marKer를 나타낸다.In FIG. 2, reference numeral 13 denotes a film, 15 denotes a contrast meter, and 16 denotes an ID marKer.

그리고, 도 3에 나타내는 바와 같이 방사선이 필름에 대해 수직하게 입사하도록 선원과 필름(7)을 배치하고 필름(7)의 하면에는 후방산란을 방지하기위하여 Pb스크린(미도시)을 배치하며, 상기 필름(7)이 평평하게 놓이게 바닥면을 고르게 유지한다.3, the source and the film 7 are disposed so that the radiation is incident perpendicularly to the film, and a Pb screen (not shown) is disposed on the lower surface of the film 7 to prevent backscattering. The bottom surface is evenly held so that the film 7 lies flat.

이과정에서 X선 발생장치는 최대 관전압 260KVp, 관전류 5mA 고정, 초점 크기 2.5mm의 장비를 사용하고, 기하학적 불선명도(Geometric Unsharpness, Us)를 최소화하기 위해 선원-필름간 거리(T)를 780mm로 설정하고, 또한 선원(9)(10)에서 발생한 1차 X선이 시험체를 투과하면서 Thomson산란이나 Compton산란하여 시험체내에서 방향을 바꾼 2차 X선 발생을 억제하기 위해 그리드(Grid ; 미도시)를 사용한다.In this process, the X-ray generator uses equipment with a maximum tube voltage of 260KVp, a fixed tube current of 5mA, and a focal size of 2.5mm, and a source-film distance (T) of 780mm to minimize geometric unsharpness (Us). In order to suppress the generation of secondary X-rays in which the primary X-rays generated from the source 9 and 10 penetrate the test specimens and change direction in the test specimens by Thomson scattering or Compton scattering, Grid (not shown) Use

이와 같은 촬영배치가 끝나면 한 장의 필름(7)에 X선을 두번노출하여 결함상을 촬영하게 되는데, 첫번째 노출시간에 대하여 두번째 노출시간을 배로하여 선원을 9에서 10으로 A만큼 이동시켜 노출을 한다.After the photographing arrangement is finished, X-rays are exposed twice on a single film (7) to photograph a defect image. The exposure time is shifted from 9 to 10 A by doubling the second exposure time for the first exposure time. .

여기에서 두 번째 노출을 많이 설정한 이유는 선원이 이동하면서 시험편(8)에 입사하는 각도의 변화로 방사선이 투과해야 하는 두께가 증가했기 때문에 방사선이 수직 입사할 때와 같은 농도를 나타내기 위해서는 두께증가에 대한 노출조건의 보정을 해 주어야 한다. 즉, 2차 X선의 영향으로 대조도나 선명도에 영향을 주지 않는 범위에서 노출조건을 설정해야 하므로 X선 노출도표를 작성하여 농도가 2.0이 되도록 조정하여 노출시간을 결정하는데, 이와 같은 조건을 만족시켜 촬영된 투과사진의 농도는 1.3에서 3.2 범위로 나타나며 KS B 0845의 규정농도 범위를 만족하기 위한 것이다.The reason why many second exposures are set here is because the thickness through which radiation is transmitted due to the change in the angle of incidence to the test piece 8 as the source moves is increased so that the thickness can be the same as when the radiation is vertically incident. Correction of exposure conditions for increases should be made. In other words, the exposure conditions should be set within the range that does not affect the contrast or sharpness due to the influence of secondary X-rays, so that the exposure time is determined by preparing an X-ray exposure chart and adjusting the concentration to 2.0. The concentration of the photographed transmission photographs ranges from 1.3 to 3.2 and is intended to satisfy the specified concentration range of KS B 0845.

상기한 바와 같은 노출에 의하여 필름(7)에 촬영된 결함(5)의 이동 거리(B), 선원 이동거리(A), 선원-필름간 거리(T)를 측정하여 상기 수학식 1을 이용하여 결함의 깊이를 구함으로써, 결함깊이를 정확하게 측정할 수 있도록 하는 것이다.The moving distance B, the source moving distance A, and the source-film distance T of the defect 5 photographed on the film 7 by the exposure as described above were measured to use Equation 1 By finding the depth of the defect, the defect depth can be measured accurately.

한편, 도 3에서 미설명부호 6은 시험편의 상을 나타낸다.In FIG. 3, reference numeral 6 denotes an image of a test piece.

이상에서 상술한 바와같이 본 발명은 방사선을 이용하여 시험체를 한 장의 필름에 선원을 일정 간격만큼 이동하여 최적의 노출조건을 적용하여 두 번을 노출하여 결함의 정보를 삼차원적인 형상으로 나타내여 결함깊이를 측정함은 물론이고 기존의 큰 오차율을 줄여서 자동이송장치에 놓여진 제품에 대해 연속적으로 결함의 깊이에 대한 정보를 검출함으로써 제품의 신뢰도 향상에 기여할 수 있도록 하였다.As described above, the present invention uses a radiation to move the source to a single film by a predetermined interval and exposes twice by applying an optimal exposure condition to expose the defect information in a three-dimensional shape to reveal the depth of the defect. In addition to measuring the error, the existing large error rate was reduced to continuously improve the reliability of the product by detecting the information on the depth of the defect on the product placed in the automatic feeder.

Claims (4)

방사선투과 비파괴검사 방법에 있어서,In the radiographic nondestructive testing method, 대상물 하단면으로부터 필름면까지의 거리를 보정하기위해 변수 K값을 고정시키고, 한 장의 필름에 선원을 일정 간격만큼 이동하여 두번을 노출하여, 투과사진의 결함상으로부터 상기의 수학식 1에 따라 결함의 깊이를 측정하는 것을 특징으로 하는 결함깊이의 측정이 가능한 방사선투과 비파괴검사방법.In order to correct the distance from the bottom surface of the object to the film surface, the variable K value is fixed, and the source is moved twice by a predetermined distance on one film to expose twice. Non-destructive testing method capable of measuring the depth of the defect, characterized in that for measuring the depth of the. 제 1항에 있어서, 대상물을 X선에 노출하는 과정에서 결함의 이동상을 선명하게 나타낼 수 있게 1회 노출 후 2회 노출 시에 노출시간을 1회에 대하여 2배로 주는 것을 특징으로 하는 결함깊이의 측정이 가능한 방사선투과 비파괴검사방법.The method according to claim 1, wherein the exposure time is doubled for one time in two exposures after one exposure so as to clearly display the moving phase of the defect in the process of exposing the object to X-rays. Non-destructive testing method that can be measured. 제 1항에 있어서, X선 노출시에 그리드(Grid)를 사용하는 것을 특징으로 하는 결함깊이의 측정이 가능한 방사선투과 비파괴검사방법.The radiographic non-destructive inspection method according to claim 1, wherein a grid is used during X-ray exposure. 제 1항에 있어서, 상기 K값을 고정하는 과정은 대상물 하단면으로부터 필름까지의 간격을 여러번의 실험을 통해 일정한 오차범위를 측정한 후 특정한 값을 구하는 것을 특징으로 하는 결함깊이의 측정이 가능한 방사선투과 비파괴검사방법.The method of claim 1, wherein the fixing of the K value comprises measuring a predetermined error range through a plurality of experiments to determine a specific value of the distance from the bottom surface of the object to a film, and then obtaining a specific value of the radiation depth. Transmission nondestructive testing method.
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