KR20010066811A - Manufacturing method of actuator for ink jet printer head - Google Patents
Manufacturing method of actuator for ink jet printer head Download PDFInfo
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- KR20010066811A KR20010066811A KR1020000030246A KR20000030246A KR20010066811A KR 20010066811 A KR20010066811 A KR 20010066811A KR 1020000030246 A KR1020000030246 A KR 1020000030246A KR 20000030246 A KR20000030246 A KR 20000030246A KR 20010066811 A KR20010066811 A KR 20010066811A
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- silicon
- forming
- chamber
- diaphragm
- actuator
- Prior art date
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 54
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 54
- 239000010703 silicon Substances 0.000 claims abstract description 54
- 238000005530 etching Methods 0.000 claims abstract description 40
- 239000002210 silicon-based material Substances 0.000 claims abstract description 30
- 238000000034 method Methods 0.000 claims description 31
- 238000010438 heat treatment Methods 0.000 claims description 18
- 239000000463 material Substances 0.000 claims description 15
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims description 6
- 229910010271 silicon carbide Inorganic materials 0.000 claims description 5
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 4
- 229920005591 polysilicon Polymers 0.000 claims description 3
- 238000005304 joining Methods 0.000 abstract description 4
- 230000010354 integration Effects 0.000 abstract description 2
- 238000009413 insulation Methods 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 36
- 238000001039 wet etching Methods 0.000 description 7
- 238000001312 dry etching Methods 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 229910052814 silicon oxide Inorganic materials 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 3
- 229910052581 Si3N4 Inorganic materials 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 238000003825 pressing Methods 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 229910052709 silver Inorganic materials 0.000 description 2
- 239000004332 silver Substances 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 229910001020 Au alloy Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- -1 alloys of gold (Au) Chemical class 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000005121 nitriding Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/015—Ink jet characterised by the jet generation process
- B41J2/04—Ink jet characterised by the jet generation process generating single droplets or particles on demand
- B41J2/045—Ink jet characterised by the jet generation process generating single droplets or particles on demand by pressure, e.g. electromechanical transducers
- B41J2/04501—Control methods or devices therefor, e.g. driver circuits, control circuits
- B41J2/04581—Control methods or devices therefor, e.g. driver circuits, control circuits controlling heads based on piezoelectric elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/015—Ink jet characterised by the jet generation process
- B41J2/02—Ink jet characterised by the jet generation process generating a continuous ink jet
- B41J2/025—Ink jet characterised by the jet generation process generating a continuous ink jet by vibration
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/14—Structure thereof only for on-demand ink jet heads
- B41J2/14016—Structure of bubble jet print heads
- B41J2/14032—Structure of the pressure chamber
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/14—Structure thereof only for on-demand ink jet heads
- B41J2/14016—Structure of bubble jet print heads
- B41J2/14088—Structure of heating means
- B41J2/14112—Resistive element
- B41J2/14129—Layer structure
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/14—Structure thereof only for on-demand ink jet heads
- B41J2/14201—Structure of print heads with piezoelectric elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1607—Production of print heads with piezoelectric elements
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/005—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
- B41J2/01—Ink jet
- B41J2/135—Nozzles
- B41J2/16—Production of nozzles
- B41J2/1621—Manufacturing processes
- B41J2/1626—Manufacturing processes etching
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B41—PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
- B41J—TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
- B41J2/00—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
- B41J2/315—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material
- B41J2/32—Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by selective application of heat to a heat sensitive printing or impression-transfer material using thermal heads
- B41J2/335—Structure of thermal heads
- B41J2/33505—Constructional details
- B41J2/3351—Electrode layers
Abstract
Description
본 발명은 액츄에이터에 관한 것으로, 보다 상세하게는 잉크젯 프린터 헤드에 사용하기 위한 액츄에이터의 제조방법에 관한 것이다.TECHNICAL FIELD The present invention relates to actuators, and more particularly, to a method of manufacturing an actuator for use in an inkjet printer head.
압전체를 이용한 잉크젯 프린터 헤드의 액츄에이터는 일반적으로 진동판과 챔버로 이루어진 하부구조와, 진동판의 상부에 결합되어 전원이 인가되면 기계적 변형을 일으키는 압전/전왜막과, 압전/전왜막에 전원을 전달하는 전극들로 구성된다.An actuator of an inkjet printer head using a piezoelectric body generally has a lower structure composed of a diaphragm and a chamber, a piezoelectric / electric strainer which is coupled to an upper portion of the diaphragm to cause mechanical deformation when power is applied, and an electrode that transmits power to the piezoelectric / electric strainer. It consists of
액츄에이터의 압전체는 전원이 인가되면 폴링(poling)되는 성질이 있다. 폴링된 압전체의 상단과 하단에 형성된 상부전극과 하부전극에 전원이 인가되면 전극사이에 위치한 압전체가 변형과 복원을 반복하면서 진동을 하거나 기계적 변형을 하게 된다.The piezoelectric body of the actuator has a property of being polled when power is applied. When power is applied to the upper and lower electrodes formed on the top and bottom of the polled piezoelectric material, the piezoelectric elements located between the electrodes vibrate or deform while repeating deformation and restoration.
잉크젯 프린터 헤드에서는 이러한 액츄에이터의 압전체가 진동을 하면 진동판이 두께방향으로 기계적 변형을 일으키게 되어 잉크가 기록매체에 분사되게 된다.In the inkjet printer head, when the piezoelectric body of the actuator vibrates, the diaphragm causes mechanical deformation in the thickness direction, and ink is injected onto the recording medium.
따라서 잉크젯 프린터 헤드에서 챔버와 진동판으로 구성된 액츄에이터의 하부구조가 액츄에이터의 작동에 중요한 인자가 되고 있다.Therefore, the substructure of the actuator composed of the chamber and the diaphragm in the inkjet printer head has become an important factor in the operation of the actuator.
압전체를 이용한 액츄에이터의 하부구조를 형성하기 위하여, 금속을 재료로 사용하는 경우에는 주로 습식에칭법에 의한 하프에칭(half etching)으로 챔버 및 진동판을 형성하고, 세라믹을 재료로 사용하는 경우에는 펀칭된 시트와 진동판시트를 소결압착하여 3차원 구조체를 형성하는 것이 일반적이다.In order to form the substructure of the actuator using the piezoelectric body, the chamber and the diaphragm are formed by half etching by wet etching method mainly when the metal is used as the material, and punched when the ceramic is used as the material. It is common to form a three-dimensional structure by sintering and pressing the sheet and the diaphragm sheet.
그러나 금속을 하프에칭에 의하여 액츄에이터의 하부구조를 형성하는 경우에는 에칭속도 및 시간을 조절하여 원하는 두께의 진동판을 얻는 것이 어려우며, 세라믹을 펀칭 및 소결압착하여 액츄에이터의 하부구조를 형성하는 경우에는 가공단계에서 정밀도 및 수율이 낮아지는 문제점이 있다.However, when forming the substructure of the actuator by half-etching metal, it is difficult to obtain a diaphragm having a desired thickness by adjusting the etching rate and time, and in the case of forming the substructure of the actuator by punching and sintering and pressing ceramics There is a problem in that precision and yield are lowered.
상기의 문제점을 해결하기 위한 본 발명은 실리콘계 물질로 이루어진 진동판과 챔버판을 실리콘 직접 접합에 의하여 접합함으로써 잉크젯 프린터 헤드용 액츄에이터를 제조하는 방법을 제공하는 것을 목적으로 한다.An object of the present invention for solving the above problems is to provide a method for manufacturing an actuator for an inkjet printer head by bonding a diaphragm and a chamber plate made of a silicon-based material by direct silicon bonding.
도 1 내지 도 11은 본 발명의 방법의 일실시예를 나타낸 공정도,1 to 11 is a process diagram showing an embodiment of the method of the present invention,
도 12 내지 도 23은 본 발명의 방법의 다른 실시예를 나타낸 공정도,12-23 is a process diagram showing another embodiment of the method of the present invention;
도 24 내지 도 34는 본 발명의 방법의 다른 실시예를 나타낸 공정도,24 to 34 are process diagrams showing another embodiment of the method of the present invention;
도 35 내지 도 46은 본 발명의 방법의 다른 실시예를 나타낸 공정도.35-46 are process diagrams illustrating another embodiment of the method of the present invention.
<도면의 주요부분에 대한 부호의 설명><Description of the symbols for the main parts of the drawings>
10, 30, 50, 70 : 실리콘웨이퍼 12, 32, 52, 72 : 에칭중지층10, 30, 50, 70: silicon wafer 12, 32, 52, 72: etching stop layer
14, 34, 54, 74 : 진동판 16, 36, 56, 76 : 챔버판14, 34, 54, 74: diaphragm 16, 36, 56, 76: chamber plate
18, 38, 58, 78 : 챔버 79 : 유로18, 38, 58, 78: chamber 79: euro
20, 40, 60, 80 : 하부전극 22, 42, 62, 82 : 압전/전왜막20, 40, 60, 80: lower electrode 22, 42, 62, 82: piezoelectric / electric strain film
24, 44, 64, 84 : 상부전극24, 44, 64, 84: upper electrode
상기의 목적을 달성하기 위한 본 발명은 실리콘웨이퍼를 제공하는 단계; 상기 실리콘웨이퍼의 하부에 에칭중지층을 형성하는 단계; 실리콘계 물질로 이루어진 진동판을 형성하는 단계; 열처리에 의하여, 상기 에칭중지층의 하부에 상기 진동판을 접합시키는 단계; 실리콘계 물질로 이루어진 챔버판을 형성하는 단계; 상기 챔버판을 풀에칭하여 상기 챔버판에 챔버를 형성하는 단계; 열처리에 의하여, 상기 챔버가 형성된 챔버판을 상기 진동판의 하부에 접합시키는 단계; 상기 실리콘웨이퍼를 제거함으로써 액츄에이터의 하부구조를 완성하는 단계; 상기 하부구조의 상부에 하부전극을 형성하는 단계; 상기 하부전극의 상부에 일정한 패턴으로, 전원이 인가되면 액츄에이팅을 하는 압전/전왜막을 형성하는 단계; 및 상기 압전/전왜막의 상부에 상부전극을 형성하는 단계를 포함하는 잉크젯 프린터 헤드용 액츄에이터의 제조방법에 관한 것이다.The present invention for achieving the above object comprises the steps of providing a silicon wafer; Forming an etch stop layer under the silicon wafer; Forming a diaphragm made of a silicon-based material; Bonding the diaphragm to a lower portion of the etch stop layer by a heat treatment; Forming a chamber plate made of a silicon-based material; Full etching the chamber plate to form a chamber in the chamber plate; Bonding the chamber plate on which the chamber is formed to a lower portion of the diaphragm by heat treatment; Completing the undercarriage of the actuator by removing the silicon wafer; Forming a lower electrode on the upper portion of the lower structure; Forming a piezoelectric / electric distortion film in a predetermined pattern on the lower electrode and actuating when power is applied; And forming an upper electrode on an upper portion of the piezoelectric / electric distortion film.
또한 본 발명은 실리콘웨이퍼를 제공하는 단계; 상기 실리콘웨이퍼의 하부에 에칭중지층을 형성하는 단계; 실리콘계 물질로 이루어진 진동판을 형성하는 단계; 열처리에 의하여, 상기 에칭중지층의 하부에 상기 진동판을 접합시키는 단계; 실리콘계 물질로 이루어진 챔버판을 형성하는 단계; 상기 챔버판을 에칭하여 상기 챔버판에 챔버를 형성하는 단계; 상기 챔버의 하부에 남은 상기 챔버판을 에칭하여, 상기 챔버의 하부에 유로를 형성하는 단계; 열처리에 의하여, 상기 챔버 및 유로가 형성된 챔버판을 상기 진동판의 하부에 접합시키는 단계; 상기 실리콘웨이퍼를 제거함으로써 액츄에이터의 하부구조를 완성하는 단계; 상기 하부구조의 상부에 하부전극을 형성하는 단계; 상기 하부전극의 상부에 일정한 패턴으로, 전원이 인가되면 액츄에이팅을 하는 압전/전왜막을 형성하는 단계; 및 상기 압전/전왜막의 상부에 상부전극을 형성하는 단계를 포함하는 잉크젯 프린터 헤드용 액츄에이터의 제조방법에 관한 것이다.The present invention also provides a silicon wafer; Forming an etch stop layer under the silicon wafer; Forming a diaphragm made of a silicon-based material; Bonding the diaphragm to a lower portion of the etch stop layer by a heat treatment; Forming a chamber plate made of a silicon-based material; Etching the chamber plate to form a chamber in the chamber plate; Etching the chamber plate remaining in the lower part of the chamber to form a flow path in the lower part of the chamber; Bonding the chamber plate on which the chamber and the flow path are formed by a heat treatment to a lower portion of the diaphragm; Completing the undercarriage of the actuator by removing the silicon wafer; Forming a lower electrode on the upper portion of the lower structure; Forming a piezoelectric / electric distortion film in a predetermined pattern on the lower electrode and actuating when power is applied; And forming an upper electrode on an upper portion of the piezoelectric / electric distortion film.
이하 본 발명의 잉크젯 프린터 헤드용 액츄에이터를 제조하는 방법에 대하여 상세하게 설명한다.EMBODIMENT OF THE INVENTION Hereinafter, the method of manufacturing the actuator for inkjet printer head of this invention is demonstrated in detail.
먼저 진동판을 접합시킬 실리콘웨이퍼를 준비한다. 실리콘웨이퍼는 100-500㎛의 두께의 것을 사용하는 것이 바람직하며, 실리콘웨이퍼는 이후 공정에서 진동판을 고정하는 역할을 한다.First, prepare a silicon wafer to bond the diaphragm. It is preferable to use a silicon wafer having a thickness of 100-500 μm, and the silicon wafer serves to fix the diaphragm in a subsequent process.
준비된 실리콘웨이퍼의 하부에는 에칭중지층을 형성한다. 에칭중지층으로는 실리콘산화막(SiO2) 또는 실리콘질화막(Si3N4)을 형성하는 것이 바람직하다. 실리콘산화막은 실리콘웨이퍼의 하부를 열처리하여 형성하고, 실리콘질화막은 실리콘웨이퍼의 하부를 질화처리하여 형성하는 것이 일반적이다. 형성된 실리콘산화막 또는 실리콘질화막은 진동판과 접합하는 접합계면이 되며, 후공정에서 실리콘웨이퍼를 에칭할 때 에칭중지층으로서의 기능을 한다.An etching stop layer is formed below the prepared silicon wafer. It is preferable to form a silicon oxide film (SiO 2 ) or a silicon nitride film (Si 3 N 4 ) as the etching stop layer. The silicon oxide film is generally formed by heat treating a lower portion of a silicon wafer, and the silicon nitride film is generally formed by nitriding a lower portion of a silicon wafer. The formed silicon oxide film or silicon nitride film serves as a junction interface to be bonded to the diaphragm, and functions as an etch stop layer when etching the silicon wafer in a later step.
실리콘웨이퍼에 접합시킬 진동판은 별도로 형성한다. 진동판의 재료로는 실리콘(Si), 탄화규소(SiC), 폴리실리콘(poly-Si) 등의 실리콘계 물질을 사용한다. 진동판은 5-10㎛의 두께로 형성하는 것이 바람직하다.The diaphragm to be bonded to the silicon wafer is formed separately. As the material of the diaphragm, silicon-based materials such as silicon (Si), silicon carbide (SiC), and polysilicon (poly-Si) are used. The diaphragm is preferably formed to a thickness of 5-10 μm.
진동판의 두께를 얇게 형성하기 어려운 경우에는 두꺼운 진동판을 실리콘웨이퍼에 접합한 후 래핑(lapping) 및 폴리싱(polishing)하여 원하는 두께의 진동판을 형성할 수도 있다.When it is difficult to form a thin thickness of the diaphragm, a thick diaphragm may be bonded to a silicon wafer and then wrapped and polished to form a diaphragm having a desired thickness.
에칭중지층이 형성된 실리콘웨이퍼와 진동판을 접합시킨다. 이때 실리콘웨이퍼의 하부에 형성된 에칭중지층이 진동판과 접합되도록 한다.The diaphragm and the silicon wafer on which the etching stop layer is formed are bonded. At this time, the etching stop layer formed on the lower portion of the silicon wafer is bonded to the diaphragm.
에칭중지층과 진동판의 접합은 열처리에 의하여 행하며, 재료물질들이 실리콘계 물질이므로 1,000℃ 이상의 고온에서의 열처리가 필요하다. 이때 접합을 용이하게 하기 위하여 열처리시 압력을 가해줄 수도 있다. 또한 고온에서의 열처리공정이 어려운 경우, 접합시 상하 웨이퍼에 800VDC 이하의 직류전계를 걸어주어 열처리온도를 400-500℃ 정도로 낮출 수 있다.Bonding of the etch stop layer and the diaphragm is performed by heat treatment. Since the material materials are silicon-based materials, heat treatment at a high temperature of 1,000 ° C. or higher is required. In this case, pressure may be applied during heat treatment to facilitate bonding. In addition, when the heat treatment process at a high temperature is difficult, by applying a DC field of 800VDC or less to the upper and lower wafers during bonding, the heat treatment temperature can be lowered to about 400-500 ° C.
이때 에칭중지층과 진동판은 모두 실리콘계 물질로 이루어져 있으므로 실리콘원자간의 직접적인 결합에 의하여 접합하게 된다.At this time, since both the etch stop layer and the diaphragm are made of a silicon-based material, they are joined by direct bonding between silicon atoms.
챔버판은 별도로 형성한다. 챔버판의 재료로는 실리콘, 탄화규소 등의 실리콘계 물질을 사용하며, 웨이퍼형태로 제조하여 사용하는 것이 바람직하다.The chamber plate is formed separately. As the material of the chamber plate, silicon-based materials such as silicon and silicon carbide are used, and it is preferable to manufacture the wafer in a wafer form.
이때 챔버 만이 형성된 챔버판을 형성할 수도 있으나, 챔버와 유로가 일체로 형성된 챔버판을 형성할 수도 있다.In this case, the chamber plate may be formed in which only the chamber is formed, but may also form a chamber plate in which the chamber and the flow path are integrally formed.
챔버 만을 형성하는 경우에는 챔버판이 되는 웨이퍼 형태의 실리콘계 물질을건식 또는 습식에칭에 의한 풀에칭을 하여 챔버판에 챔버를 형성한다. 건식에칭을 하는 경우에는 챔버의 단면이 수직형태로 형성되는 장점이 있으며, 습식에칭을 하는 경우에는 챔버의 단면이 경사진 형태로 형성되므로 잉크젯 프린터 헤드의 하부구조와 접착시킬 때 챔버판과 하부구조의 접착면적을 증가시킬 수 있는 장점이 있다. 또한 진동판의 신축에 의한 잉크의 압력이 유로방향으로 가압이 되므로 잉크토출에 유리한 장점이 있다.In the case of forming only the chamber, the chamber-type silicon is formed by performing a full etching of the wafer-type silicon-based material, which becomes the chamber plate, by dry or wet etching. In the case of dry etching, the cross section of the chamber has the advantage of being formed in a vertical shape. In the case of wet etching, the cross section of the chamber is formed in an inclined shape. There is an advantage that can increase the adhesive area of the. In addition, since the pressure of the ink due to the expansion and contraction of the diaphragm is pressurized in the flow direction, there is an advantage in ejecting the ink.
챔버와 유로를 일체로 형성하고자 하는 경우에는 챔버판이 되는 웨이퍼 형태의 실리콘계 물질을 먼저 에칭하여 챔버를 형성한 다음, 챔버의 하부에 남은 챔버판을 에칭하여 챔버의 하부에 유로를 형성한다. 이때 챔버를 에칭하는 방법으로는 습식 및 건식에칭을 모두 사용할 수 있으나 습식에칭에 의하여 형성하는 것이 바람직하고, 유로는 건식에칭에 의하여 형성하는 것이 바람직하다. 이와 같이 챔버와 유로를 일체로 형성하는 경우에는 챔버판과 유로판을 별도로 접착하는 경우에 발생할 수 있는 배열오차 및 접착불량을 없앨 수 있다.When the chamber and the flow path are to be integrally formed, a silicon-based material in the form of a wafer to be a chamber plate is first etched to form a chamber, and then the remaining chamber plate is etched to form a flow path at the bottom of the chamber. In this case, both wet and dry etching may be used as a method of etching the chamber, but it is preferable to form the liquid by wet etching, and the flow path is preferably formed by dry etching. As such, when the chamber and the flow path are integrally formed, arrangement errors and adhesion failures that may occur when the chamber plate and the flow path plate are separately bonded may be eliminated.
실리콘웨이퍼에 접합된 진동판을 별도로 형성한 챔버판과 접합시킨다. 진동판과 챔버판의 접합은 열처리에 의하여 행하며, 재료물질들이 실리콘계 물질이므로 1,000℃ 이상의 고온에서의 열처리가 필요하다. 이때에도 접합을 용이하게 하기 위하여 열처리시 압력을 가해줄 수 있으며, 접합시 상하 웨이퍼에 800VDC 이하의 직류전계를 걸어주어 열처리온도를 400-500℃ 정도로 낮출 수 있다.The diaphragm bonded to the silicon wafer is bonded to the chamber plate formed separately. Joining of the diaphragm and the chamber plate is performed by heat treatment. Since the material materials are silicon-based materials, heat treatment at a high temperature of 1,000 ° C. or higher is required. In this case, in order to facilitate the bonding, pressure may be applied during the heat treatment, and a heat treatment temperature may be lowered to about 400-500 ° C. by applying a DC field of 800 VDC or less to the upper and lower wafers during the bonding.
이때 진동판과 챔버판도 모두 실리콘계 물질로 이루어져 있으므로 실리콘원자간의 직접적인 결합에 의하여 진동판과 챔버판이 접합하게 된다.At this time, since both the diaphragm and the chamber plate are made of a silicon-based material, the diaphragm and the chamber plate are joined by direct coupling between silicon atoms.
진동판과 챔버판을 접합시킨 후에는 실리콘웨이퍼를 제거한다. 실리콘웨이퍼는 래핑 또는 에칭에 의하여 제거하거나, 래핑한 후 에칭하여 제거한다. 에칭을 하는 경우, 실리콘웨이퍼의 하부에 형성된 에칭중지층에서 에칭이 중단되므로 에칭정도를 조절할 수 있다.After bonding the diaphragm and chamber plate, the silicon wafer is removed. The silicon wafer is removed by lapping or etching, or after lapping and etching. In the case of etching, since the etching is stopped in the etching stop layer formed under the silicon wafer, the degree of etching can be controlled.
상기 과정에 의하여 잉크젯 프린터 헤드용 액츄에이터의 하부구조가 완성된다.By the above process, the substructure of the actuator for the inkjet printer head is completed.
형성된 진동판의 상부에는 하부전극을 형성한다. 하부전극의 재료로는 금(Au), 은(Ag), 백금(Pt), 알루미늄(Al), 니켈(Ni), 구리(Cu), 은/팔라듐(Pd)의 합금 등의 도전성 금속을 사용하며, 진공증착, 스퍼터링 또는 스크린 프린팅 등의 방법을 사용하여 형성한다.A lower electrode is formed on the formed diaphragm. Conductive metals such as alloys of gold (Au), silver (Ag), platinum (Pt), aluminum (Al), nickel (Ni), copper (Cu) and silver / palladium (Pd) are used as materials for the lower electrode. It is formed using a method such as vacuum deposition, sputtering or screen printing.
하부전극의 상부에는 전원이 인가될 때 액츄에이팅을 하는 압전/전왜막을 형성한다. 압전/전왜막은 일반적인 방법들에 의하여 형성할 수 있으며, 대표적인 방법으로는 압전/전왜 세라믹분말을 페이스트의 형태로 만들어 스크린 프린팅 등의 방법으로 막을 성형한 후 열처리하여 형성하는 방법이나 박판형태의 압전/전왜막을 접착시킨 후 에칭하여 패터닝하는 방법 등이 있다.An upper portion of the lower electrode is provided with a piezoelectric / electric distortion film that actuates when power is applied. Piezoelectric / electric warp film can be formed by common methods, and typical methods include piezoelectric / electric warp ceramic powder in the form of a paste and forming a film by screen printing, etc., followed by heat treatment or thin piezoelectric / And a method of etching and patterning the electrodeposited film.
압전/전왜막의 상부에는 일정한 패턴으로 상부전극을 형성한다. 상부전극은 상기 하부전극과 동일한 재료 및 방법에 의하여 형성한다. 상부전극을 형성함으로써 전체 액츄에이터가 완성된다.The upper electrode is formed in a predetermined pattern on the piezoelectric / distortion film. The upper electrode is formed by the same material and method as the lower electrode. By forming the upper electrode, the entire actuator is completed.
완성된 액츄에이터는 그대로 사용할 수도 있으며, 실리콘계 물질을 열산화시켜 표면에 실리콘산화막을 형성함으로써 잉크와 접촉하는 진동판과 챔버판의 표면에 친수성을 부여할 수도 있다.The completed actuator may be used as it is, and by providing a silicon oxide film on the surface by thermally oxidizing the silicon-based material, hydrophilicity may be imparted to the surfaces of the vibrating plate and the chamber plate in contact with the ink.
이하 도면을 참조하여 본 발명의 실시예를 설명한다. 그러나 다음의 실시예는 본 발명을 예시하는 것으로서 본 발명의 범위를 한정하는 것은 아니다.Hereinafter, embodiments of the present invention will be described with reference to the drawings. However, the following examples are intended to illustrate the invention and not to limit the scope of the invention.
도 1 내지 도 11은 본 발명의 방법의 일실시예의 공정을 나타낸 것이다.1-11 illustrate the process of one embodiment of the method of the present invention.
실리콘웨이퍼(10)의 하부에 에칭중지층(12)을 형성한다. 별도로 형성한 실리콘계 진동판(14)을 에칭중지층(12)의 하부에 접합시킨다.An etching stop layer 12 is formed under the silicon wafer 10. The silicon diaphragm 14 formed separately is bonded to the lower part of the etch stop layer 12.
실리콘계 물질로 챔버판(16)을 형성한 후 습식에칭에 의한 풀에칭을 하여 챔버(18)를 형성한다. 챔버(18)가 형성된 챔버판(16)을 진동판(14)의 하부에 접합시킨다. 진동판(14)과 챔버판(16)을 접합시킨 후 실리콘웨이퍼(10)를 에칭에 의해 제거함으로써 하부구조를 완성한다.After the chamber plate 16 is formed of a silicon-based material, the chamber 18 is formed by full etching by wet etching. The chamber plate 16 on which the chamber 18 is formed is bonded to the lower part of the diaphragm 14. After the diaphragm 14 and the chamber plate 16 are bonded together, the silicon wafer 10 is removed by etching to complete the substructure.
완성된 하부구조의 상부에 하부전극(20), 압전/전왜막(22) 및 상부전극(24)을 형성하여 액츄에이터를 완성한다.An actuator is completed by forming a lower electrode 20, a piezoelectric / electric strain film 22, and an upper electrode 24 on the completed lower structure.
도 12 내지 도 23은 본 발명의 방법의 다른 실시예의 공정을 나타낸 것이다.12-23 illustrate a process of another embodiment of the method of the present invention.
실리콘웨이퍼(30)의 하부에 에칭중지층(32)을 형성한다. 실리콘계 진동판(34)을 에칭중지층(32)의 하부에 접합시킨다. 접합된 진동판(34)을 래핑하고 폴리싱하여 원하는 두께의 진동판을 형성한다.An etching stop layer 32 is formed under the silicon wafer 30. The silicon diaphragm 34 is bonded to the lower portion of the etch stop layer 32. The bonded diaphragm 34 is wrapped and polished to form a diaphragm of the desired thickness.
실리콘계 물질로 챔버판(36)을 형성한 후 습식에칭에 의한 풀에칭을 하여 챔버(38)를 형성한다. 챔버(38)가 형성된 챔버판(36)을 진동판(34)의 하부에 접합시킨다. 진동판(34)과 챔버판(36)을 접합시킨 후 실리콘웨이퍼(30)를 에칭에 의해 제거함으로써 하부구조를 완성한다.After the chamber plate 36 is formed of a silicon-based material, the chamber 38 is formed by full etching by wet etching. The chamber plate 36 on which the chamber 38 is formed is bonded to the lower portion of the diaphragm 34. After the diaphragm 34 and the chamber plate 36 are bonded to each other, the silicon wafer 30 is removed by etching to complete the substructure.
완성된 하부구조의 상부에 하부전극(40), 압전/전왜막(42) 및 상부전극(44)을 형성하여 액츄에이터를 완성한다.An actuator is completed by forming a lower electrode 40, a piezoelectric / electric strain film 42, and an upper electrode 44 on the completed lower structure.
도 24 내지 도 34는 본 발명의 방법의 다른 실시예의 공정을 나타낸 것이다.Figures 24-34 show the process of another embodiment of the method of the present invention.
실리콘웨이퍼(50)의 하부에 에칭중지층(52)을 형성한다. 별도로 형성한 실리콘계 진동판(54)을 에칭중지층(52)의 하부에 접합시킨다.An etching stop layer 52 is formed under the silicon wafer 50. The silicon diaphragm 54 formed separately is bonded to the lower portion of the etching stop layer 52.
실리콘계 물질로 챔버판(56)을 형성한 후 건식에칭에 의한 풀에칭을 하여 챔버(58)를 형성한다. 챔버(58)가 형성된 챔버판(56)을 진동판(54)의 하부에 접합시킨다. 진동판(54)과 챔버판(56)을 접합시킨 후 실리콘웨이퍼(50)를 래핑 및 에칭에 의하여 제거한다. 실리콘웨이퍼(50)를 제거함으로써 하부구조를 완성한다.After the chamber plate 56 is formed of a silicon-based material, full etching is performed by dry etching to form the chamber 58. The chamber plate 56 on which the chamber 58 is formed is bonded to the lower part of the diaphragm 54. After the diaphragm 54 and the chamber plate 56 are bonded to each other, the silicon wafer 50 is removed by lapping and etching. The substructure is completed by removing the silicon wafer 50.
진동판(54)의 상부에 하부전극(60), 압전/전왜막(62) 및 상부전극(64)을 형성하여 액츄에이터를 완성한다.An actuator is completed by forming the lower electrode 60, the piezoelectric / electric strain film 62, and the upper electrode 64 on the diaphragm 54.
도 35 내지 도 46은 본 발명의 방법의 다른 실시예의 공정을 나타낸 것이다.35-46 illustrate a process of another embodiment of the method of the present invention.
실리콘웨이퍼(70)의 하부에 에칭중지층(72)을 형성한다. 별도로 형성한 실리콘계 진동판(74)을 에칭중지층(72)의 하부에 접합시킨다.An etching stop layer 72 is formed under the silicon wafer 70. The silicon diaphragm 74 formed separately is bonded to the lower portion of the etching stop layer 72.
챔버판(76)를 습식에칭하여 챔버(78)를 형성하고, 그 하부를 다시 건식에칭하여 유로(79)를 형성한다. 챔버(78)와 유로(79)가 형성된 챔버판(76)을 진동판(74)의 하부에 접합시킨다. 진동판(74)과 챔버판(76)을 접합시킨 후 실리콘웨이퍼(70)를 에칭에 의해 제거함으로써 하부구조를 완성한다.The chamber plate 76 is wet-etched to form the chamber 78, and the lower portion thereof is dry-etched again to form the flow path 79. The chamber plate 76 on which the chamber 78 and the flow path 79 are formed is bonded to the lower portion of the diaphragm 74. After the diaphragm 74 and the chamber plate 76 are joined, the silicon wafer 70 is removed by etching to complete the substructure.
완성된 하부구조의 상부에 하부전극(80), 압전/전왜막(82) 및 상부전극(84)을 형성하여 액츄에이터를 완성한다.An actuator is completed by forming a lower electrode 80, a piezoelectric / electric strain film 82, and an upper electrode 84 on the completed lower structure.
상기와 같은 본 발명은 실리콘 직접 접합에 의하여 구조를 형성하므로 공정이 간단하고, 진동판으로 실리콘계 물질을 사용함으로써 별도의 절연층 형성공정이 필요없어 공정이 단순해지며, 친수화처리가 용이한 효과가 있다.The present invention as described above forms a structure by direct silicon bonding, the process is simple, and by using a silicon-based material as a diaphragm, a separate insulating layer forming process is not necessary, the process is simplified, and the effect of hydrophilization is easy. have.
또한 재료물질로 실리콘계 물질을 사용하므로 고온에서의 공정이 가능하고 내산화성이 우수하며 가공정밀도, 즉 집적도를 높일 수 있고, 친수화처리가 용이하다.In addition, since a silicon-based material is used as the material, it can be processed at a high temperature, has excellent oxidation resistance, can increase processing accuracy, that is, increase the degree of integration, and is easy to hydrophilize.
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