KR20010056399A - Impact Tester - Google Patents

Impact Tester Download PDF

Info

Publication number
KR20010056399A
KR20010056399A KR1019990057852A KR19990057852A KR20010056399A KR 20010056399 A KR20010056399 A KR 20010056399A KR 1019990057852 A KR1019990057852 A KR 1019990057852A KR 19990057852 A KR19990057852 A KR 19990057852A KR 20010056399 A KR20010056399 A KR 20010056399A
Authority
KR
South Korea
Prior art keywords
impact
shock
tester
specimen
test
Prior art date
Application number
KR1019990057852A
Other languages
Korean (ko)
Other versions
KR100334513B1 (en
Inventor
이상설
김홍배
문상무
우성현
이주진
Original Assignee
장근호
한국항공우주연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 장근호, 한국항공우주연구원 filed Critical 장근호
Priority to KR1019990057852A priority Critical patent/KR100334513B1/en
Publication of KR20010056399A publication Critical patent/KR20010056399A/en
Application granted granted Critical
Publication of KR100334513B1 publication Critical patent/KR100334513B1/en

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/30Investigating strength properties of solid materials by application of mechanical stress by applying a single impulsive force, e.g. by falling weight
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M7/00Vibration-testing of structures; Shock-testing of structures
    • G01M7/08Shock-testing

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)

Abstract

PURPOSE: A shock tester is provided to selectively perform a direct shock test or an indirect shock test with one shock tester, thereby resolving troblesomeness and economical problem. CONSTITUTION: In a shock tester measuring numerical value of shock by falling a test piece fixing block(2) in which a test piece(3) is fixed and absorbing shock between impact tips(4,5) in the test piece(3), the shock tester includes a force transducer(10) detachably attached to the upper impact tip and obtaining shock degree to enable a direct shock test, and a fixing element(20) detachably attached to the lower impact tip to fix the test piece.

Description

충격 시험기{Impact Tester}Impact Tester {Impact Tester}

본 발명은 하나의 충격시험기로 직ㆍ간접충격시험을 선택적으로 실시할 수 있도록 한 충격시험기에 관한 것이다.The present invention relates to an impact tester capable of selectively performing direct and indirect impact tests with one impact tester.

종래의 충격시험기는 단순 충격량을 직접시편에 가하는 임팩트형식의 직접시험기와 임팩트부분의 재질과 형상을 달리하여 시편치구에 전달되는 충격의 형태를제어할 수 있도록 된 간접시험기로 구분된다.Conventional impact tester is divided into impact type direct tester which applies simple impact amount directly to specimen and indirect tester which can control the shape of impact delivered to specimen fixture by changing material and shape of impact part.

이러한 직ㆍ간접충격시험기는 각기 정해진 충격시험에만 사용할 수 있게 되므로써 호환성이 뒤떨어져 두가지 형태의 시험을 실시하기 위해서는 반드시 두종류의 시험기가 구비되어야만 하는 것이었다.Since these direct and indirect impact testers can only be used for the specified impact tests, they are incompatible and two types of test machines must be provided to perform the two types of tests.

즉, 직접시험기의 경우 정해진 웨이트(weight)를 일정한 높이에서 떨어뜨려 충격을 가하는 것으로, 간접충격시험기를 이용할 경우 떨어뜨리는 웨이트의 제한(간접충격시험기의 시편고정용 블록은 정해진 무게를 가짐)으로 인해 저충격량의 시험에는 사용할 수 없는 것이었다.That is, in the case of the direct tester, the predetermined weight is dropped at a certain height, and the impact is applied.In the case of using the indirect impact tester, the weight is dropped (the specimen fixing block of the indirect impact tester has a predetermined weight). It could not be used for low-impact tests.

또한 간접시험기(1)는 도 1 에 도시된 바와 같이 시편고정블록(2)위에 시편(3)을 고정하고 원하는 위치에서 떨어뜨려 임팩트팁(4)(5)끼리 충돌시켜 이때 이들 사이의 충격형태가 시편고정블록(2)을 통해 시편(3)에 전달되는 과정을 통해 시험하고자 하는 충격환경이 제대로 전달되었는가를 확인하는 것으로 상기 시편고정블록(2)은 이미 정해진 무게를 가지며, 이것을 떨어뜨리는 높이를 조절하여 그 충격량을 조절하게 된다.In addition, the indirect tester (1) is fixed to the specimen (3) on the specimen fixing block (2) as shown in Figure 1 and dropped from the desired position to impact the impact tip (4) (5) between the impact form between them The specimen fixing block (2) has a predetermined weight, and the dropping height of the specimen fixing block (2) to ensure that the shock environment to be tested is properly transmitted through the process delivered to the specimen (3) To adjust the impact amount.

이 경우 간접충격시험기(1)의 낙하 높이가 제한되므로 고충격량의 직접충격시험기는 사용할 수 없는 것이었다.In this case, since the drop height of the indirect impact tester 1 is limited, the high impact direct impact tester cannot be used.

따라서 저충격시험 및 고충격량시험이 동시에 수행되기 위해서는 반드시 두종류의 충격시험기가 구비되어야만 하는 번거로움 및 경제적인 문제점이 야기되고 있는 것이었다.Therefore, in order to simultaneously perform the low impact test and the high impact test, the troublesome and economical problems that must be provided with two kinds of impact testers were caused.

본 발명은 두종류의 충격시험기 구비에 따른 번거로움 및 경제적인 문제점을 개선하기 위해 하나의 장비로 기존의 간접충격시험기의 기능과 함께 직접충격시험기의 기능이 동시에 발휘될 수 있게 함을 목적으로 한다.The purpose of the present invention is to enable the function of the direct impact tester together with the function of the existing indirect impact tester as a single equipment to improve the inconvenience and economical problems of the two types of impact tester. .

이를 위해 본 발명은 시편이 고정된 시편고정블록을 일정높이에서 떨어뜨려 임팩트팁사이의 충격이 시편에 흡수됨을 통해 충격치를 측정하는 충격시험기에 있어서, 직접충격시험이 가능하게 상부 임팩트팁에 충격정도를 획득하는 포스트랜스듀셔를 탈착가능케 부착하고, 하부 임팩트팁에 시편이 고정되는 고정수단을 탈착가능케 형성시키므로써 이루어지는 것이다.To this end, the present invention in the impact tester for measuring the impact value by dropping the specimen fixing block in which the specimen is fixed at a certain height to absorb the impact between the impact tip to the specimen, the impact degree on the upper impact tip to enable a direct impact test It is made by attaching a detachable post-lance dusher to obtain, and forming a detachable fixing means for fixing the specimen to the lower impact tip.

도 1 은 종래 간접충격시험기의 일예시도1 is an exemplary view of a conventional indirect impact tester

도 2 는 본 발명 일실시예에 의한 고충격량 시험 상태도Figure 2 is a high shock test state diagram according to an embodiment of the present invention

도 3 은 본 발명 일실시예에 의한 저충격량 시험 상태도Figure 3 is a low shock test state diagram according to an embodiment of the present invention

도 4 는 간접충격시험시 웨이트(weight)의 장착상태 단면도Figure 4 is a cross-sectional view of the mounting state of the weight (in weight) indirect impact

[도며의 주요부분에 대한 부호의 설명][Explanation of symbols on the main parts of the drawings]

1 : 간접충격시험기 2 : 시편고정블록1: Indirect impact tester 2: Specimen fixing block

3 : 시편 4,5 : 임팩트팁3: Psalm 4,5: Impact Tip

10 : 포스트랜스듀서(Force Transducer) 20 : 고정수단10: Force Transducer 20: Fixing means

30 : 스프링 40 : 웨이트(weight)30: spring 40: weight

본 발명의 구성을 첨부된 도면에 의거 상세하게 설명하면 다음과 같다.Referring to the configuration of the present invention in detail based on the accompanying drawings as follows.

본 발명은 종래의 간접 충격시험기(1)에 직접충격시험기의 기능이 발휘될 수 있도록 접목시킨 것으로 시편(3)이 고정된 시편고정블록(2)을 일정높이에서 떨어뜨려 임팩트팁(4)(5) 사이의 충격이 시편(3)에 흡수됨을 통해 충격치를 측정하는 충격시험기(1)에 있어서,The present invention is to combine the conventional indirect impact tester (1) so that the function of the direct impact tester can be exhibited by dropping the specimen fixing block (2) in which the specimen (3) is fixed at a certain height impact tip (4) ( In the impact tester (1) for measuring the impact value through the shock between the 5) is absorbed by the specimen (3),

도 2 에 도시된 바와 같이 직접충격시험시 충격정도를 획득할 수 있도록 탈착가능한 포스트랜스듀서(Force Transducer)(10)를 상부 임팩트팀(4)에 부착하고 하부 임팩트팁(5)에는 시편(3)이 고정될 수 있도록 고정수단(20)을 형성시킨다.As shown in FIG. 2, a detachable post transducer (10) is attached to the upper impact team (4) and the specimen (3) is attached to the lower impact tip (5) so as to obtain the degree of impact during the direct impact test. The fixing means 20 is formed to be fixed.

시편(3)을 고정시키기 위한 고정수단(20)은 탈부착 가능한 것으로 하부 임팩트(5) 상부에 놓여지는 시편(3)을 상부에서 눌러 지지시키는 지지판(21)과 상기 지지판(21)과 하부 임팩트팁(5) 사이에 연결되어 지지판(21)을 고정시키는고정구(22)로 구성된다.The fixing means 20 for fixing the test piece 3 is detachable, and the support plate 21 and the support plate 21 and the lower impact tip for pressing and supporting the test piece 3 placed on the upper side of the lower impact 5 from above. It is composed of a fixture 22 which is connected between (5) to fix the support plate 21.

이때 지지판(21)은 포스트랜스듀서(10)가 시편(3)에 직접 부딪칠 수 있도록 중앙이 개방된 형태를 취하여야 한다.At this time, the support plate 21 should take the form of the center is open so that the post-transducer 10 can directly hit the specimen (3).

이러한 본 발명은 직접충격시험이 가능한 것으로 시편고정블록(2)과 상부지지대(6)를 스프링(30)으로 연결하므로써 스프링(30)의 탄성력을 이용하여 임팩트되는 순간속도를 제어하여 충격량을 조절하므로써 저충격량의 시험에 사용할 수 있게 된다.This invention is a direct impact test is possible by connecting the specimen fixing block (2) and the upper support (6) by the spring (30) by controlling the amount of impact by controlling the instantaneous speed of impact using the elastic force of the spring (30) It can be used for low-impact tests.

상기 스프링(30)은 탄성계수가 다른 종류의 것을 사용하므로써 다양한 저충격량의 시험을 수행할 수 있게 된다.The spring 30 is capable of performing various low-impact tests by using a different type of elastic modulus.

또한 고충격량의 시험시 도 4 에 도시된 바와 같이 시편고정블록(2) 상부의 시편고정구멍(2a)에 필요한 중량의 웨이트(40)를 부착시키므로써 고충격량의 시험을 수행할 수 있게 된다.In addition, when the test of high impact amount, as shown in Figure 4 by attaching the weight 40 of the required weight to the specimen fixing hole (2a) of the upper part of the specimen fixing block (2) it is possible to perform a test of high impact amount.

한편 상기와 같이 직접충격시험이 이루어지고 필요에 따라 간접충격시험이 이루어질 경우에는 포스트랜스듀셔(10)와 시편(3) 고정수단(20)을 탈부착시킨 후 시편고정블록(2)에 시편(3)을 고정시키고 간접시험을 수행할 수 있게 된다.On the other hand, when the direct impact test is made as described above and the indirect impact test is performed as necessary, the specimen (3) is attached to the specimen fixing block (2) after detaching and attaching the post-lance dusher 10 and the specimen 3 fixing means 20. ) And the indirect test can be performed.

본 발명은 하나의 충격시험기로 직ㆍ간접충격시험을 선택적으로 실시하게 되므로써 두종류의 충격시험기 구비에 따른 번거로움 및 경제적인 문제점을 해소할 수 있는 효과가 있게 된다.The present invention is effective to solve the trouble and economic problems of the two types of impact tester by selectively performing the direct and indirect impact test with one impact tester.

Claims (3)

시편(3)이 고정된 시편고정블록(2)을 일정높이에서 떨어뜨려 임팩트팁(4)(5)사이의 충격이 시편(3)에 흡수됨을 통해 충격치를 측정하는 충격시험기(1)에 있어서,In the impact tester (1) for measuring the impact value by dropping the specimen fixing block (2) on which the specimen (3) is fixed at a certain height so that the impact between the impact tip (4) (5) is absorbed by the specimen (3) , 직접충격시험가능하게 상부 임팩트팁(4)에 충격정도를 획득하는 포스트랜스듀셔(10)를 탈착가능케 부착하고,Detachable attachment of the post lance dusher 10 to obtain the degree of impact on the upper impact tip (4) to enable a direct impact test, 하부 임팩트팁(5)에 시편(3)이 고정되는 고정수단(20)을 탈착가능케 형성시킨 것을 특징으로 하는 충격 시험기.Impact tester, characterized in that to form a detachable fixing means (20) to which the specimen (3) is fixed to the lower impact tip (5). 청구항 1 에 있어서,The method according to claim 1, 시편고정블록(2)은 상부지지대(6)에 스프링(30)으로 연결하여 임팩트 순간속도를 제어하므로써 저충격량 시험이 가능한 것을 특징으로 하는 충격 시험기.Specimen fixing block (2) is connected to the upper support (6) by a spring (30) by controlling the impact instantaneous speed impact tester, characterized in that low-impact test is possible. 청구항 1 에 있어서,The method according to claim 1, 시편고정블록(2) 상부의 시편고정구멍(2a)에 웨이트(40)를 부착시키므로써 고충격량 시험이 가능한 것을 특징으로 하는 충격 시험기.Impact tester, characterized in that the high impact test is possible by attaching the weight (40) to the specimen fixing hole (2a) of the upper part of the specimen fixing block (2).
KR1019990057852A 1999-12-15 1999-12-15 Impact Tester KR100334513B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1019990057852A KR100334513B1 (en) 1999-12-15 1999-12-15 Impact Tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019990057852A KR100334513B1 (en) 1999-12-15 1999-12-15 Impact Tester

Publications (2)

Publication Number Publication Date
KR20010056399A true KR20010056399A (en) 2001-07-04
KR100334513B1 KR100334513B1 (en) 2002-04-26

Family

ID=19625989

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019990057852A KR100334513B1 (en) 1999-12-15 1999-12-15 Impact Tester

Country Status (1)

Country Link
KR (1) KR100334513B1 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101362552B1 (en) * 2012-05-29 2014-02-14 성균관대학교산학협력단 Apparatus for testing with impact-proof means of repeated drop impact

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101362552B1 (en) * 2012-05-29 2014-02-14 성균관대학교산학협력단 Apparatus for testing with impact-proof means of repeated drop impact

Also Published As

Publication number Publication date
KR100334513B1 (en) 2002-04-26

Similar Documents

Publication Publication Date Title
JP5158887B2 (en) Tensile testing machine
JP3867594B2 (en) Vibration damping device performance evaluation apparatus and performance evaluation method
CN208331684U (en) A kind of support device of environment detector
KR100334513B1 (en) Impact Tester
KR20000065322A (en) A system for assessing static and dynamic strength of glass plate
KR20040093760A (en) Impact tester use in a shock absorber
US4425786A (en) Method and apparatus for impact testing of bend specimen
CN207036425U (en) A kind of engine performance measuring device
KR20090048967A (en) Semi-auto loading device
JPH08264603A (en) Semiconductor tester
JP2009004776A (en) Probe card assembly
KR100501349B1 (en) Pile drop test device
US4862746A (en) Vibration tester for screws
CN208468141U (en) A kind of adjustable fixed device
CN107631862B (en) Centrifugal test fixture for Y-waveguide device with optical fiber
CN206362650U (en) A kind of ceramic package pin fatigue strength testing device
CN219737031U (en) Universal testing machine protection device
CN215640094U (en) Durable testboard of back lock
CN109188239A (en) The sustainable failure analysis method of chip
CN209485890U (en) A kind of impact tensile property test device based on pendulum impact test platform
JPH06207894A (en) Bending static fatigue tester for ceramics
CN117419842A (en) Winding tension testing method
CN217358303U (en) Gauge for measuring three-pin shaft inner hole runout relative to three-shaft radial center line
JP3806411B2 (en) Test hammer tester
CN216449615U (en) Fixing part and test platform

Legal Events

Date Code Title Description
A201 Request for examination
E701 Decision to grant or registration of patent right
GRNT Written decision to grant
FPAY Annual fee payment

Payment date: 20060328

Year of fee payment: 5

LAPS Lapse due to unpaid annual fee