KR102658169B1 - Multi-cell lighting signal generator for substrate cells composed of multiple pad blocks - Google Patents

Abstract

An embodiment of the present invention discloses a disk lighting signal for cells composed of multiple pad blocks that can efficiently perform lighting tests on the disks of cells composed of multiple pad blocks.
The disclosed disk lighting signal is a multi-cell lighting signal for lighting and inspecting cells with multiple pads implemented on a glass disk in the disk state, and includes a master signal that generates a clock, a synchronization signal, and EL power required by the cells under test. , a plurality of distributors for distributing the signal and power of the master signaler into group-level slave signals, and N slave signals that generate signals for driving the cell under test with the voltage and signal received from the distributor. It provides power and signals so that multiple cells implemented on a glass plate can be driven simultaneously.

Description

{Multi-cell lighting signal generator for substrate cells composed of multiple pad blocks}

The present invention relates to a cell lighting signal for providing driving power and signals necessary for cell array inspection or lighting inspection in the cell inspection process of a flat panel display such as an organic light emitting display (OLED). The present invention relates to a cell lighting signal for further details. More specifically, it relates to a signal lighting signal for a cell composed of multiple pad blocks that can efficiently perform a lighting test on the disks of cells composed of multiple pad blocks.

Generally, flat panel displays (FPD) include liquid crystal displays (LCD), field emission displays (FED), plasma display panels (PDP), and organic light emitting displays. devices (Organic Light Emitting Display: OLED), etc.

Among flat panel displays, organic light emitting diodes (OLEDs) display images using organic light emitting diodes (OLEDs), which emit light by recombination of electrons and holes. These organic light emitting display devices are widely used as next-generation displays because they have a fast response speed and operate with low power consumption.

In the FPD manufacturing process such as OLED or LCD, the state of glass on which TFT (Thin Film Transistor) is patterned is generally referred to as a 'cell'. At the edge of the cell, several pads (PADs) are formed that can apply electrical signals to electronic devices such as TFTs that make up each pixel, and driver ICs are installed on these pads (PADs). ), etc., the state in which circuits are configured and connected is called a 'module'.

In the FPD manufacturing process, there are various processes to check the lighting status by applying an external signal in the cell or module state. One method is to apply the signal in the cell state, and the other is to apply the signal in the module state. The method of applying the signal is different, and the method of applying the signal is also different depending on the FPD size.

Recently, in order to increase the efficiency of the mass production process, array inspection, which inspects electrical defects on a disk-by-plate basis, and lighting inspection, which inspects lighting defects, are performed on small and medium-sized OLED cells used in small and medium-sized organic light emitting display devices. In order to perform tests on a disk-by-plate basis like this, a cell lighting signal device composed of multiple pad blocks that can simultaneously apply a test signal to multiple cells is required.

As shown in FIG. 1, the conventional cell lighting signal device composed of multiple pad blocks consists of a signal device 12, a signal distributor 14, a number of signal selection relays 16, and a number of probe blocks 20. It is possible to apply a driving signal to a plurality of OLED cells to be inspected implemented on the original plate 30.

Referring to FIG. 1, the signal generated by the signal device 12 is separated into four signal groups in the signal distributor 14, and then the signal is applied to multiple cells through eight signal relays 16 and the probe block 20. It is possible to do it.

Since this type of conventional signal machine has a structure that distributes a single source signal that outputs the entire current capacity of the signal using a relay, there is a problem in that the signal is severely distorted due to multiple distribution of the signal.

Meanwhile, in the inspection process based on a glass original, it is desirable to configure the system so that inspection can be performed without replacing the lighting signal or probe block when the display model is changed. For example, when designing a cell, the number of PAD Blocks formed is different depending on the size and resolution, but the number of pins constituting each PAD Block is designed to be the same, and the signal is designed to be connected to the cell ( If the structure is such that the signal to be applied can be flexibly varied depending on the cell model, it is possible to respond to changes in the model of the original plate by changing only the output signal of the signal device without replacing the probe block.

KR 10-2020-0000519 A KR 10-2020-0013187 A

The present invention was proposed to solve the above-described conventional problems, and the problem to be solved by the present invention is to develop a cell composed of multiple pad blocks that can flexibly change the signal when changing the OLED cell of the glass original. It provides a circular lighting signal.

An embodiment of the present invention discloses a circular lighting signal of a cell composed of multiple pad blocks.

The disclosed disk lighting signal is a multi-cell lighting signal for lighting and inspecting cells with multiple pads implemented on a glass disk in the disk state, and includes a master signal that generates a clock, a synchronization signal, and EL power required by the cells under test. , a plurality of distributors for distributing the signal and power of the master signaler into group-level slave signals, and N slave signals that generate signals for driving the cell under test with the voltage and signal received from the distributor. It is characterized by providing power and signals to simultaneously drive multiple cells implemented on a glass plate.

The master signal is connected to the inspection operation PC through Ethernet and includes a main controller for controlling the overall operation, a clock generator for generating a clock signal required by the cell to be inspected under the control of the main controller, and the main controller. A synchronization signal generator for generating the synchronization signal required by the cell under inspection under the control of the controller, a switching mode power supply (SMPS) that receives alternating current power and supplies stable direct current power, and the switching mode power supply ( The EL Power unit receives power from the SMPS and receives information such as voltage and timing from the main controller to generate two independent types of EL Power, and the signal and power of the master signal are connected to a plurality of devices. It includes a group distribution unit for distributing slave signals to groups.

The distributor includes a clock distributor for distributing and transmitting the clock received from the master signal to n slave signals, and a synchronization signal distribution unit for distributing and transmitting the synchronization signal received from the master signal to n slave signals. , an EL power distribution unit for distributing the EL power received from the master signaler to n slave signals, and a communication control unit for providing communication between the master and the slaves.

The slave signal receives a synchronization signal (Clock±) and a clock (Sync±) from the distributor, is connected to the distributor through a communication port, and executes the control command of the master signal received through the distributor to output EL power. An EL power control unit consisting of a slave control unit that controls the control, processes logic for generating a driving signal, and performs voltage measurement control, and a relay circuit for controlling the EL power output according to the control of the slave control unit, and control of the slave control unit. Accordingly, it monitors the EL power and driving signal output in real time in conjunction with the driving signal generation unit to generate AC and DC driving signals and the slave control unit, performs a correction function for accuracy of the output voltage, and short circuits when the cell lights up. It includes a voltage measuring unit that checks whether or not.

Preferably, the slave control unit improves pattern switching speed by implementing digital/analog converter (D/A converter) control using FPGA (Field Programmable Gate Array).

According to an embodiment of the present invention, even if cells of various sizes (models) are configured on a glass original, the number of pins constituting the pad block is designed to be the same, and the signal is designed to be the same according to the cell model. By allowing the signal to be applied to be flexibly varied, there is an advantage in being able to respond to changes in the model of the original plate by changing only the output signal of the signal device without replacing the probe block.

In addition, according to an embodiment of the present invention, in order to minimize pattern switching time, I ² C (Inter-Integrated Circuit) or SPI (SCSI Parallel Interface) control that controls the D/A converter and A/D converter is controlled by FPGA logic. ), which has the effect of reducing the tact time of the panel inspection process by enabling control about 10 times faster than technology using existing MCUs.

Figure 1 is a schematic diagram showing a cell lighting test configuration using a conventional lighting signal composed of multiple pads;
Figure 2 is an example of implementing multiple OLED cells on a glass original to which the present invention can be applied;
3 is a schematic diagram showing an OLED cell lighting test configuration with multiple pads according to an embodiment of the present invention;
Figure 4 is a detailed block diagram of the master signal shown in Figure 3;
Figure 5 is a detailed block diagram of the distributor shown in Figure 3;
Figure 6 is a detailed block diagram of the slave signal shown in Figure 3;
Figure 7 is a detailed block diagram of the driving signal generator shown in Figure 6;
8 is an example of a driving signal waveform according to an embodiment of the present invention,
Figure 9 is a detailed block diagram of the voltage measuring unit shown in Figure 6;
Figure 10 is a flowchart showing a lighting test procedure for an OLED cell composed of multiple pads according to an embodiment of the present invention.

The technical problems achieved by the present invention and its implementation will become clearer through preferred embodiments of the present invention described below. The following examples are merely illustrative for illustrating the present invention and are not intended to limit the scope of the present invention.

Figure 2 is an example of implementing multiple OLED cells on a glass original to which the present invention can be applied, (a) is an example of implementing 4 x 4 multiple cells, and (b) is an example of implementing 5 x 5 multiple cells. , (c) is an example of implementing 8

Referring to FIG. 2, panel generations are generally classified according to the size of the glass original plate 30. For example, the 6th generation glass original plate 30 has a size of 1500 × 1850 mm, and the 8th generation glass original plate 30 has a size of 2200 mm. It has a size of ×2500 mm. Then, a number of cells are patterned on the glass original plate (30), each cell is cut, and each cell is inspected. The size of each cell made up of the glass original plate (30) is used for cell phones, tablets, laptops, etc. It is designed in various ways depending on the purpose, and the inspection signal must be applied differently depending on its size and resolution.

In addition, a pad (PAD) 32 is formed in each cell (C1 to C4) to apply a lighting signal, and a signal application module called a probe block (20) is contacted to the pad (PAD). Perform a lighting test. At this time, the probe block (Probe Block) 20 is composed of a PCB and a contact probe (Probe) that receives the signal from the lighting signal 100 and routes it according to the pin map (Pinmap) of the corresponding pad (PAD) 32.

In Figure 2, (a) is a case where one cell (C1) has four pad blocks (32-1 to 32-4), and (b) is a case where one cell (C2) has three pad blocks (32-1 to 32-4). 1 to 32-3), (c) is a case where one cell (C3) has two pad blocks (32-1, 32-2), and (d) is a case where one cell (C4) This is an example of having one pad block 32. In this way, even if cells (C1 to C4) of different sizes are configured on a single glass plate 30, the number of pins constituting the pad block is designed to be the same, and the signal 100 is designed to be the same as the cell. (Cell) When the structure is such that the signal to be applied can be flexibly varied depending on the model, the four types of glass disks 30 shown in FIG. 5 are formed with 16 probe blocks (20-1 to 20-16). All can be inspected.

Figure 3 is a schematic diagram showing an OLED cell lighting test configuration with multiple pads according to an embodiment of the present invention, Figure 4 is a detailed block diagram of the master signal shown in Figure 3, and Figure 5 is shown in Figure 3. This is a detailed block diagram of the distributor.

First, in the embodiment of the present invention, as shown in (a) of FIG. 2, a 4 It shows an example of a lighting test configuration when 4) is implemented.

As shown in FIG. 3, the cell lighting signal 100 composed of a multi-pad block according to an embodiment of the present invention is a master that generates the clock, synchronization signal, and EL power required by the cells under test (C1 to C4). A signal machine 110, a distributor (120-1 to 120-3) for distributing the signal and power of the master signal machine to slave signals in groups, and a cell to be tested (C1 to C4) with the voltage and signal received from the distributor. It is possible to test the lighting of multiple OLED cells on a disk implemented as 4 x 4 cells, including N slave signals (130-1 to 130-16) that generate signals to drive.

Referring to FIG. 3, the inspection target cells C1 to C4 applied to the embodiment of the present invention can be any display cells for a flat panel display (FPD), but in the embodiment of the present invention, the glass original plate 30 ), an OLED cell (C1) of 4 x 4 is implemented, and four pad blocks (32-1 to 32-4) are formed in each cell (C1). In this case, in order to test the lighting of 4 cells, a total of 16 slave signals (130-1 to 130-16) are required per distributor, and a total of 64 slave signals are required for the entire glass disk 30.

In order to drive multiple OLED cells (C1 to C4) to be inspected, EL Power, Drive Power, Digital Signal, and RGB Signal are required as shown in Table 1 below. do.

In Table 1 above, the EL Power is the power to apply current to the OLED device and requires two power supplies indicated by ELVDD and ELVSS, and the Drive Power is the initialization voltage and various power supplies for driving the TFT circuit. It is a power supply group required for reference voltage, etc. Digital signal is a signal group used for gate signal and synchronization signal for TFT switching, and RGB signal is a signal group for controlling the color and brightness of the lighting screen. am.

As shown in FIG. 4, the master signal 110 is connected to the inspection operation PC 102 through Ethernet, and the main controller 111 to control the overall operation, and the inspection target according to the control of the main controller 111. A clock generator 112 for generating the clock signals required by the cells (C1 to C4) and a synchronization signal required by the cells to be inspected (C1 to C4) under the control of the main controller 111. A switching mode power supply (SMPS; 114) that receives alternating current power and supplies stable direct current power, receives power from the SMPS (114) and supplies voltage, timing, etc. from the main controller (111). An EL power unit (EL Power) 115 that receives information and generates two independent types of EL power, and a slave control unit (116) for controlling the slave signal 130 by communicating with the slave signal. , It consists of a group distribution unit 117 for distributing the signal of the master signaler 110 to four slave signal groups.

Referring to FIG. 4, the main controller (Main Controller) 111 is composed of an MCU and peripheral circuits and communicates with the test operation PC 102 via Ethernet, according to the test target cell model set in the test signal setting step. Controls the clock generator 112, synchronization signal generator 113, SMPS (114), EL Power (115), etc.

The clock generator 112 is for generating clock signals required by the cells to be inspected (C1 to C4) under the control of the main controller 111, and the synchronization signal generator 113 is the main controller 111. This is to generate the synchronization signal required by the cells to be inspected (C1 to C4) according to control.

SMPS (114) is a power supply device to supply power to the entire system. It supplies variable power to generate EL power, driver power, power to generate digital signal, RGB signal, and system power for system operation. You can.

The EL power unit (EL Power) 115 receives power from the SMPS 114 and receives information such as voltage and timing according to the cell model from the main controller 111 to generate two independent types of EL Power.

The group distribution unit 117 distributes the power and signals of the master signal unit 110 into four groups of slave signal groups and transmits them to the distributors 120-1 to 120-4.

As shown in FIG. 5, each distributor (120-1 to 120-4) divides the clock received from the master signaler 110 into n (16 in the embodiment of the present invention) slave signals (130-1 to 130-). 16), a clock distribution unit 122 for distribution and transmission, distributes the synchronization signal received from the master signaler 110 to n (16 in the embodiment of the present invention) slave signals 130-1 to 130-16. a synchronization signal distribution unit 123 for transmission, and an EL signal for distributing the EL power received from the master signaler 110 to n (16 in the embodiment of the present invention) slave signals 130-1 to 130-n. It consists of a power distribution unit 124 and a communication control unit 125 to provide communication between the master and the slave.

Referring to FIG. 5, the clock distribution unit 122 is a block that distributes and transmits the clock received from the master signaler 110 to 16 slave signals (130-~130-16), and the synchronization signal distribution unit 123 is a block that distributes and transmits the synchronization signal received from the master signaler (110) to 16 slave signals (130-1 to 130-16).

The MCU 121 is connected to the master signal 110 via RS232C and controls the EL power distribution unit 124 and the communication control unit 125. The EL power distribution unit 124 distributes the EL power received from the master signal 110. This is a block that distributes and transmits (ELVDD, ELVSS) to 16 slave signals (130-1~130-16), measures the EL power consumption current consumed by each slave signal (130-1~130-16), and blocks overcurrent. Performing the function, the communication control unit 125 connects the master signal and each slave signal through RS232C communication to control EL Power's current consumption collection and overcurrent blocking functions.

FIG. 6 is a detailed block diagram of the slave signal shown in FIG. 3, FIG. 7 is a detailed block diagram of the drive signal generator shown in FIG. 6, and FIG. 8 is an example of a drive signal waveform generated by the drive signal generator. , and FIG. 9 is a detailed block diagram of the voltage measuring unit shown in FIG. 6.

As shown in FIG. 6, the slave signals (130-1 to 130-16) receive the synchronization signal (Clock±) and clock (Sync±) from the distributors (120-1 to 120-4) and use a communication port. It is connected to the distributor (120-1 to 120-4) and executes the control command of the master signal device (110) received through the distributor (120-1 to 120-4) to control the output of EL power and generate a driving signal. EL power consisting of an FPGA (Field Programmable Gate Array) control unit 131 that processes logic for voltage measurement control, etc. and provides a serial communication port for the touch driver IC, and a relay circuit for controlling EL power output. The control unit 132, the driving signal generator 133 for generating various AC/DC signals under the control of the FPGA control unit 131, monitors the EL power and driving signal output in real time and ensures accuracy of the output voltage. It consists of a voltage measuring unit 134 that performs a correction function and checks whether a short circuit occurs when the cell is turned on.

Referring to FIG. 6, the FPGA control unit 131 is implemented as an FPGA (Field Programmable Gate Array) and performs control commands of the master signal 110 received through distributors 120-1 to 120-4, and EL power It regulates the output of the control unit 132 and performs logic for generating a driving signal, voltage measurement control, etc.

The EL power control unit 132 is composed of a relay circuit for controlling the EL power output, and the driving signal generator 133 is a D/A Converter (133) for generating various AC or DC signals as shown in FIG. 7. -1), analog mux (133-2), OP-AMP (133-3), and analog switch (133-4). In this way, the driving signal of the slave signal 130 must be able to output AC and DC signals flexibly.

Referring to FIG. 7, the DA converter 133-1 is connected to the FPGA control unit 131 through a serial communication line (I ² C or SPI) and generates two voltages (V1, V2) for the AC driving signal. At this time, in the embodiment of the present invention, I ² C or SPI control for D/A Converter control is implemented with FPGA logic in order to minimize pattern switching time, and the technology using FPGA is approximately less expensive than the technology using existing MCU. It has the advantage of enabling control more than 10 times faster. This control speed is directly related to the tact time of the panel inspection process and is a very important factor.

As shown in FIG. 8, the analog mux 133-2 selects and outputs only one voltage, V1, when generating a DC signal, and outputs only one voltage, V1, when generating an AC signal, as shown in FIG. 8 according to the select signal of the FPGA control unit 131. V2 selects two voltages and outputs them to OP Amp (133-3). The Op Amp (133-3) receives the output of the analog mux (133-2) as shown in FIG. 8 and amplifies the voltage/current to precisely set the desired voltage and secure sufficient current for driving. The analog switch (Analog switch 133-4) opens and closes the final output according to the On/Off control of the FPGA control unit 131.

Referring to FIG. 8, (A) is an example in which the select signal is low and only the V1 voltage is output to generate a DC signal, and (B) is an example in which the V1 voltage and V2 voltage are alternately selected according to the select signal. This is an example of generating an AC signal.

As shown in FIG. 9, the voltage measuring unit 134 includes a voltage dividing unit 134- for receiving signals output from the slave signals to monitor all signals generated from the slave signals 130-1 to 130-16. 1), an analog mux (134-2) for selecting the output of the voltage divider (134-1), and an analog-to-digital converter (134) for converting the analog signal selected by the analog mux (134-2) into digital. -3) It monitors EL power and driving signal output voltage in real time and performs a correction function to ensure accuracy of the output voltage.

Referring to FIG. 9, the voltage measuring unit 134 checks whether the EL Power voltage generated by the slave signals 130-1 to 130-16 and the voltage of the driving signal match the set value, and measures the accuracy of the output voltage. It eliminates the inconvenience of using manual measuring instruments during calibration work and allows automatic acquisition of calibration values. In addition, when inspecting the panel, it is possible to check whether the contact part of the panel is short, and the voltage divider (134-1) lowers the voltage at a certain rate for each input signal to connect the analog mux (134-2) and A/ It matches the interface standard of D Converter (134-3). The Analog Mux (134-2) selects one of multiple input signals and applies it to the A/D Converter (134-3), and the A/D Converter (134-3) converts the input analog signal voltage into a digital signal. Convert it to a value so that it can be read by the FPGA control unit 131. The FPGA control unit 131 approaches the A/D Converter (134-3) using the I ² C or SPI communication standard, acquires the voltage value of the currently input Analog signal, and sends the A/D Converter control signal to the FPGA logic. By implementing this, the voltage value is acquired by sequentially switching multiple values at high speed.

Figure 9 is a flowchart showing an OLED cell lighting test procedure according to an embodiment of the present invention.

Referring to FIG. 9, in the original/cell size identification step (S101), the size of the glass original on which the cell to be tested is implemented, the cell size, and the number of pad blocks per cell are identified, and in the signal and probe block installation step (S102), After installing the jig and slave signals (130-1 to 130-N) at the inspection process site of the manufacturing line, connect the cells to be inspected (30) to the jig, and connect the master signal (110) and slave signals (130-1 to 130). -N) connect each with a cable.

In the inspection operation PC connection step (S103), the master signal 110 and the inspection operation PC 102 are connected and then an application program for lighting inspection is executed. Next, in the test signal setting step (S104), the test signal to be applied to each probe block is set on the application program GUI screen of the test operation PC. At this time, the inspection signal is set according to the model of the test target cell (C1 to C4) identified in the original/cell size identification step (S101).

Afterwards, when the test starts, a master signal is generated, the signal is distributed, and a slave drive signal is generated (S105 to S108). Then, the cell lighting signal is applied to the probe block, the lighting test data is acquired, the test process is repeated, and the test ends when all lighting tests are completed (S109~S111).

In the above, the present invention has been described with reference to an embodiment shown in the drawings, but those skilled in the art will understand that various modifications and other equivalent embodiments are possible therefrom.

30: Original plate to be inspected 32,32-1~32-4: Multiple pads
100: disc lighting signal 102: inspection operation PC
110: Master signal 120-1~120-4: Distributor
130-1~130-16: Slave signal

Claims (5)

In the multi-cell lighting signal device for lighting and inspecting cells having multiple pads implemented on a glass original in the original state,
A master signaler that generates the clock, synchronization signal, and EL power required by the cells under test;
a plurality of distributors for distributing the signal and power of the master signal unit to slave signals in groups; and
N slave signals corresponding to the number of pads of the cell, which generate signals for driving the cell under test with the voltage and signal received from the distributor,
The master signal is,
A main controller connected to the test operation PC via Ethernet and controlling the overall operation, a clock generator for generating clock signals required by the cell under test under the control of the main controller, and a clock generator for controlling the main controller. Accordingly, a synchronization signal generator for generating the synchronization signal required by the cell under test, a switching mode power supply (SMPS) for receiving AC power and supplying stable direct current power, and power from the switching mode power supply (SMPS) The EL Power unit receives information such as voltage and timing from the main controller and generates two types of independent EL Power, and divides the signals and power of the master signal into a plurality of slave signal groups. It includes a group distribution unit for distribution, and outputs a variable signal to be applied through the slave signal depending on the model of the cell,
A signal that turns on the cell's disk, which consists of multiple pad blocks that provide power and signals to simultaneously drive multiple cells implemented on a glass disk. delete The method of claim 1, wherein the distributor
a clock distribution unit for distributing and transmitting the clock received from the master signal to n slave signals;
a synchronization signal distribution unit for distributing and transmitting the synchronization signal received from the master signal to n slave signals;
an EL power distribution unit for distributing the EL power received from the master signaler to n slave signals;
A circular lighting signal for a cell composed of multiple pad blocks including a communication control unit to provide communication between master and slave. The method of claim 1, wherein the slave signal is
It receives the synchronization signal (Clock±) and clock (Sync±) from the distributor, connects to the distributor through a communication port, executes the control command of the master signal received through the distributor, controls the output of EL power, and drives it. A slave control unit that processes logic for signal generation and performs voltage measurement control,
An EL power control unit consisting of a relay circuit for controlling EL power output according to the control of the slave control unit,
a driving signal generator for generating AC and DC driving signals under the control of the slave controller;
The original plate of the cell is composed of multiple pad blocks, including a voltage measuring unit that monitors EL power and driving signal output in real time in conjunction with the slave control unit, performs a correction function for accuracy of the output voltage, and checks for short circuit when the cell is turned on. Lighting beacon. The method of claim 4, wherein the slave control unit
A circular lighting signal of a cell composed of multiple pad blocks, characterized by improved pattern switching speed by implementing digital/analog converter (D/A Converter) control with FPGA (Field Programmable Gate Array).