KR102624542B1 - Automated handling of different form factor devices under test in test cell - Google Patents

Abstract

A system for performing a test using automated test equipment (ATE) is disclosed. The system includes a robot including an end effector operable to pick up and transport a DUT into and out of a test slot within a primitive. The system further includes a system controller including a processor and memory for controlling the robot. In addition, the system includes a test rack including a plurality of primitives, where the primitive is a modular device including a plurality of slots for testing a plurality of DUTs, and the robot uses an end effector to operate the test rack within the test rack. It is configured to automatically access slots within a plurality of primitives.

Description

Automated handling of devices under test with different form factors within a test cell {AUTOMATED HANDLING OF DIFFERENT FORM FACTOR DEVICES UNDER TEST IN TEST CELL}

[Cross-reference to related technologies]

This application is a U.S. patent application filed on March 9, 2017, entitled "DEVICE TESTING USING DUAL-FAN COOLING WITH AMBIENT AIR", inventor Roland Wolff, and Agent Docket No. ATSY-0046-01.01US. This concerns No. 15/455,103. This application is incorporated herein by reference in its entirety for all purposes.

[Technical field]

This disclosure relates generally to the field of automated testing devices, and more particularly to automated handling techniques for such devices.

Automated test equipment (ATE) can be any test assembly that performs testing on a semiconductor wafer or packaged device, such as a die, integrated circuit (IC), circuit board, or solid-state drive (SSD). . ATE assemblies can be used to run automated tests that quickly perform measurements and generate test results that can be analyzed. ATE assemblies include a custom, dedicated computer control system from a computer system coupled to the meter and many different test equipment capable of automatically testing electronic components and/or semiconductor wafers, such as system-on-chip (SOC) testing or integrated circuit testing. It can be anything up to a complex automated test assembly. ATE systems reduce the time spent testing devices to ensure they function as designed and serve as a diagnostic tool to determine the presence of defective components within a given device before it reaches the customer.

When a typical ATE system tests a device (commonly referred to as the device under test or DUT), the ATE system applies a stimulus (e.g., an electrical signal) to the device and evaluates the device's response (e.g., device under test). For example, check the current and voltage). Typically, the final result of the test is a "pass" if the device successfully provides a given predicted response within a preset tolerance, or a "pass" if the device successfully delivers a given expected response within a preset tolerance. If it is not provided, it will “fail”. More sophisticated ATE systems can evaluate a failing device to potentially determine one or more causes of the failure.

It is common for ATE systems to include a computer that directs the operation of the ATE system. Typically, the computer runs one or more dedicated software programs to provide (i) a test development environment and (ii) a device test environment. In a test development environment, users typically create a test program, a software-based structure of one or more files that control various parts of the ATE system. In a device test environment, a user typically provides the ATE system with one or more devices for testing and instructs the ATE system to test each device according to a test program. Users can test additional devices by simply providing them to the ATE system and instructing the ATE system to test the additional devices according to the test program. Therefore, the ATE system allows the user to test many devices in a consistent and automated manner based on a test program.

In a typical prior art test environment, the DUT is placed into a controlled environmental chamber or “oven.” The DUT is connected to the tester slice of the test head. Multiple DUTs can be connected to a single slice, and a single test chamber can contain multiple slices. A slice contains test circuitry that performs tests on the DUT according to the test plan. When inside the oven, the DUT is not accessible to the user so as not to disturb the controlled environment of the chamber. When in the chamber, if some DUT tests end early, they cannot be removed until all tests are complete. Afterwards, the chamber can be accessed.

One of the problems associated with this testing environment is that the interior of the environmental chamber cannot be accessed during testing, causing some tester slices to become idle if the test is being run using active tester slices within the oven. Another problem is that conventional test environments typically require manual insertion and removal of the DUT, which is time-consuming, error-prone, and disadvantageous because the DUT can be damaged during manual handling. Additionally, manual insertion and removal of DUTs in a mass production environment is quite inefficient and error-prone.

Accordingly, there is a need for an automated method of handling DUTs of different form factors within a test cell. Additionally, what is needed is an automated method to use robots to insert DUTs into and remove DUTs from primitives within the test head, eliminating the need for human labor and achieving higher yields in less time. . Additionally, what is needed is a test environment that allows access to the system while tests are running within the environment so that the system can be fully utilized. Using advantageous aspects of the described system, and without corresponding limitations, embodiments of the present invention provide novel solutions for solving these problems.

The disclosed invention utilizes a plurality of primitives and associated DUT interface boards (DIBs) to test a DUT. Each primitive is modular, meaning that it can operate independently of other primitives. Each primitive is connected to a DIB, and the DIB includes multiple slots for multiple DUTs.

Embodiments of the present invention utilize robots to automate the testing process, in part, by automating the insertion of and removal of the DUT from the DIB. The robot, in one embodiment, utilizes interchangeable grippers to handle DUTs of various form factors. The automated process can be programmed so that the robot automatically recognizes what type of device is being tested and selects the appropriate gripper for the form factor of the device being tested. Additionally, in other embodiments, the tester may be programmed so that the robot has the intelligence to determine the orientation (horizontal or vertical) of the device and also the placement of the device within the bin. In additional embodiments, the robot is further programmed to have intelligence to grab the device without damage using cameras and external reference points.

According to embodiments of the invention, device heating is typically generated by a self-operating DUT. Therefore, after operating the device, the setpoint temperature will be achieved. Cooling methods and systems, such as fans within the DIB employed within embodiments of the invention, then efficiently cool the device to maintain the setpoint temperature for testing. Therefore, a temperature controlled environmental chamber is not required to heat the device. Another advantage is that ambient air can be successfully used to cool the DUT without requiring any additional cooling elements other than a fan. Accordingly, the need for expensive environmental chambers is eliminated because the test can be performed in a laboratory environment or at the test site. The solution is low-cost, and the combination of a DUT interface board (DIB) and a test execution module (or primitive) is itself suitable for robotic DUT manipulation and, therefore, requires network cards, graphics cards, chips, microprocessors, and hard disk drives. It is suitable for mass testing of a variety of electronic devices, including but not limited to disk drives (HDDs) and solid state drives (SSDs).

Additionally, because the DUT is not located within an environmental test chamber, it is more easily handled, physically manipulated, and inspected during a robotic test cycle. Additionally, aspects of the electronic circuitry used to test the DUT are modularized (using primitives, as described herein). Therefore, different modules may be performing different tests on different form factors and types of DUTs, or they may be performing different tests on the same type of DUT (since tests no longer need to be run in a lock step). ). This increases overall test efficiency and test flexibility.

In one embodiment, a method of performing a test using automated test equipment (ATE) is disclosed. The method includes finding a device under test (DUT) to be tested. Additionally, this includes recording the presence of the DUT in the database and querying the database to determine whether an empty slot exists in the primitive, wherein the primitive has a plurality of DUTs for accommodating and testing a plurality of DUTs. It is a modular device containing slots. The method also includes using a robot to insert a DUT into an empty slot and reporting to the database that the empty slot has been filled. Finally, the method includes initiating testing on the DUT.

In another embodiment, a system for performing testing using automated testing equipment (ATE) is provided. The system includes a robot including an end effector operable to pick up and transport a DUT into and out of a test slot within the primitive. The system further includes a system controller including a processor and memory for controlling the robot. Additionally, the system includes a test rack including a plurality of primitives, and the robot is configured to access slots within the plurality of primitives within the test rack using an end effector.

In another embodiment, a system for performing testing using automated testing equipment (ATE) is disclosed. The system includes a robot with an end effector operable to automatically grasp, pick up, and transport the DUT into and out of test slots within the primitive. The system further includes an input/output module comprising a plurality of trays and operable to provide the DUT from the plurality of trays to the robot during testing. Additionally, the system includes a system controller that includes a processor and memory to control the robot. Additionally, the system includes a test rack including a plurality of primitives, where the primitives are modular devices including a plurality of slots for testing a plurality of DUTs, and the robot is configured to access slots within the plurality of primitives within the test rack. It is composed.

The detailed description that follows, taken together with the accompanying drawings, will provide a better understanding of the nature and advantages of the invention.

Embodiments of the invention are shown by way of example and not by way of limitation, in the accompanying drawings where like reference numerals represent like elements.
Figure 1 shows a conventional test environment in which a DUT is placed into a controlled environmental chamber.
Figure 2 shows a primitive interfaced with a DUT interface board (DIB) 400 according to an embodiment of the present invention.
FIG. 3A illustrates an automated workcell using a 6-axis industrial robot used to transfer DUT devices (e.g., SSDs) to and from test primitives within a test head in accordance with one embodiment of the present invention. .
3B illustrates a structural weldment used to maintain a test rack in static alignment within a work cell in accordance with one embodiment of the present invention.
Figure 3C shows an input/output module used to provide a DUT to a robot arm during testing according to one embodiment of the present invention.
4 illustrates an automated workcell utilizing a Cartesian 3-axis industrial robot used to transfer DUT devices (e.g., SSDs) to and from test primitives within a test head in accordance with one embodiment of the present invention.
5 shows an end effector connected to the end of a robotic arm and used to capture and transfer a DUT device (e.g., SSD) to and from a test primitive within a test head, according to one embodiment of the present invention. do.
6 shows another end effector connected to the end of a robotic arm and used to capture and transfer a DUT device (e.g., SSD) to and from a test primitive within a test head, according to one embodiment of the present invention. It shows.
Figure 7 shows an SSD DUT on a typical flat plastic tray used in a customer production facility.
Figure 8 shows an SSD DUT placed in a tote at a production site.
Figure 9a shows a 6-axis human model industrial robot mounted on a height-adjustable Z-axis rectangular pedestal according to an embodiment of the present invention.
9B illustrates a scissors lift module of a height-adjustable Z-axis rectangular pedestal in a fully upwardly extending configuration according to one embodiment of the present invention.
Figures 10a, 10b, 10c, 10d and 10e illustrate how a Cartesian robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive according to an embodiment of the present invention.
Figure 11 shows how a workcell is controlled from a PC controller according to one embodiment of the present invention.
Figure 12 shows the overall hardware and software required for operation of the workcell according to one embodiment of the present invention.
Figure 13 shows a flowchart of an exemplary computer-implemented process for executing tests on a DUT within a workcell in accordance with one embodiment of the present invention.
In the drawings, elements with the same reference numerals have the same or similar functions.

DETAILED DESCRIPTION Reference will now be made in detail to various embodiments of the present disclosure, examples of which are shown in the accompanying drawings. When described in conjunction with these embodiments, it will be understood that it is not intended to limit the disclosure to these embodiments. On the contrary, the present disclosure is intended to cover substitutes, modifications, and equivalents that may be included within the spirit and scope of the disclosure as defined by the appended claims. add. In the following detailed description of the disclosure, various specific details are set forth to provide a thorough understanding of the disclosure. However, it will be understood that the present disclosure may be practiced without these specific details. In other instances, well-known methods, procedures, components and circuits have not been described in detail so as not to unnecessarily obscure aspects of the disclosure.

Some portions of the detailed description that follows are presented in terms of procedures, logical blocks, processing and other symbolic representations of operations on data bits within a computer memory. These descriptions and representations are means used by those skilled in the art of data processing to most efficiently provide the substance of the work to others skilled in the art. In this application, a procedure, logical block, process or the like is understood as a self-consistent sequence of steps or instructions leading to a desired result. The step is to use physical manipulation of physical quantities. Usually, although not necessarily, these quantities take the form of electrical or magnetic signals that can be stored, transferred, combined, compared, and otherwise manipulated in a computer system. It has sometimes proven convenient to refer to these signals as transactions, bits, values, elements, symbols, characters, samples, pixels or the like, primarily for reasons of general use.

However, it should be borne in mind that all of these and similar terms relate to suitable physical quantities and are merely convenient labels applied to such quantities. Unless specifically stated otherwise, as will be apparent from the discussion that follows, the terms "configuring," "updating," "testing," and "polling" are used throughout this disclosure. )" or similar refer to the operations and processes of a computer system or similar electronic computing device or processor (e.g., flow chart 1300 of FIG. 13). A computer system or similar electronic computing device manipulates and transforms data represented as physical (electronic) quantities within computer system memory, registers, or other such information storage, transmission, or display devices.

Embodiments described herein may be discussed generally in connection with computer-executable instructions residing on some form of computer-readable storage medium, such as program modules, to be executed by one or more computers or other devices. By way of example, and not limitation, computer-readable storage media may include non-transitory computer-readable storage media and communication media; Non-transitory computer-readable media includes all computer-readable media other than transient radio signals. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform specific tasks or implement specific abstract data types. The functions of program modules may be combined or distributed as required in various embodiments.

Computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storage of information such as computer-readable instructions, data structures, program modules or other data. Computer storage media may include random access memory (RAM), read only memory (ROM), electrically erasable programmable ROM (EEPROM), flash memory or other memory technology, compact disk ROM (CD-ROM), digital versatile disks (DVD), or This includes, but is not limited to, other optical storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and that can be accessed to retrieve that information.

Communication media may embody computer-executable instructions, data structures, and program modules and includes any information delivery medium. By way of example, and not limitation, communication media includes wired media such as a wired network or direct-wired connection, and wireless media such as acoustic, radio frequency (RF), infrared, and other wireless media. Combinations of any of the above may also be included within the scope of computer-readable media.

AUTOMATED HANDLING OF DIFFERENT FORM FACTOR DEVICES UNDER TEST IN TEST CELL

1 shows a conventional test environment in which the DUT is placed into a controlled environment chamber 10 or “oven”. The DUT is connected to the tester slice of the test head (20). Many DUTs can be connected to a single tester slice 40. The tester slice contains test circuitry that performs tests on the DUT according to the test plan. There may be many tester slices per test head 20. The DUT is placed into the tray 30 when inserted into the oven 10. When within the oven 10, the DUT is typically inaccessible to the user so as not to disturb the controlled environment of the chamber 10. In a typical environmental chamber, multiple tester slices operate in lock step executing the same test plan on multiple DUTs. Additionally, the test head is typically controlled by a single controller computer system (not shown) connected directly to the test head, and in this way controls all slices of the test head 20.

One of the problems associated with this test environment is that the interior of the environmental chamber cannot be accessed during the test, leaving the entire tester slice or an empty slot within the tester slice idle if the test is being run using a different tester slice within the test head. It means making it happen. Another problem is that conventional test environments typically require manual insertion and removal of the DUT from the test slice, which is time-consuming, error-prone, and disadvantageous because the DUT can be damaged during manual handling. Additionally, manual insertion and removal of DUTs in a mass production environment is quite inefficient.

Embodiments of the present invention provide an automated method for handling devices under test with different form factors within a test cell. Embodiments of the present invention provide an automated method for inserting and removing a DUT from a primitive in a test head using a robot, thereby eliminating the need for human labor and achieving higher yields in less time. achieve. Additionally, embodiments of the present invention allow access to the interior of the chamber while a test is being performed within the chamber so that the chamber can be fully utilized at the same time.

According to embodiments of the invention, device heating is typically generated by a self-operating DUT. Therefore, after operating the device, the setpoint temperature will be achieved. Cooling methods and systems, such as fans inside the DIB employed within embodiments of the invention, will then efficiently cool the device to maintain the setpoint temperature for testing. Therefore, a temperature controlled environmental chamber is not required to heat the device.

Another advantage is that ambient air can be successfully used to cool the DUT without requiring any additional cooling elements other than a fan. Therefore, the need for expensive environmental chambers is eliminated. The solution is low-cost, and the combination of a DUT interface board (DIB) and a test execution module (or primitive) is itself suitable for robotic DUT manipulation, and thus can be used to control network cards, graphics cards, chips, microprocessors, and hard disk drives. It is suitable for mass testing of a variety of electronic devices, including but not limited to disk drives (HDDs) and solid state drives (SSDs).

Additionally, because the DUT is not located within an environmental test chamber, it is more easily handled, physically manipulated, and inspected during a robotic test cycle. Additionally, aspects of the electronic circuitry used to test the DUT are modularized (using primitives, as described herein). Therefore, different modules can perform different tests on different or even DUT types with the same form factor. This increases overall test efficiency and test flexibility.

As indicated above, advantageously, embodiments of the present invention utilize robots to automate the testing process, in part by automating the insertion of and removal of the DUT from the DIB. In one embodiment, the robot utilizes interchangeable grippers to handle DUTs of various form factors. The automated process allows robots to have the intelligence, flexibility and strength to automatically recognize what type of device is being tested and can be programmed to select the appropriate gripper for the form factor of the device being tested. Additionally, in other embodiments, the tester may also be programmed so that the robot has the intelligence to determine the orientation (horizontal or vertical) and placement of the device within a bin. In additional embodiments, the robot is further programmed to have the intelligence to grab the device without damage by using cameras and external reference points.

FIG. 2 shows a primitive 410 interfaced with a DUT interface board (DIB) 400 according to an embodiment of the present invention. Similar to the tester slice 40 shown in Figure 2, the primitive in Figure 4 is a type of individual test module that fits into the test head 20 and includes test circuitry to perform tests on the DUT according to the test plan. am. The primitive is an improvement over the tester slice 40 of Figure 1, in part because it includes an enclosure 450, inside which all various electronic devices are housed, for example site modules, power sources, etc. am. DIB 400 may include a plurality of DUTs 420 using custom connectors sized for the DUTs 420 . Additionally, DIB 400 includes an enclosure 470. DIB 400 is interfaced to the universal backplane of primitive 410 through a load board (not shown) to obtain high-speed signals and power. The primitive 410 includes a test circuit for performing a test plan for the DUT 420. Primitive 410 can operate independently of any other primitive and is connected to a control server.

Embodiments of the present invention utilize multiple primitives (similar to the primitives shown in Figure 2) and associated DIBs to test the DUT. Each primitive is modular, meaning that it can operate independently of other primitives. Accordingly, a plurality of primitives installed in a rack may each operate under a different test plan.

U.S. Patent Application No. 15/455,103, filed March 9, 2017, entitled "DEVICE TESTING USING DUAL-FAN COOLING WITH AMBIENT AIR" (herein referred to as the "Dual Fan Cooling Application"), which is incorporated herein by reference. As described above, in one embodiment, if a test system uses the primitives shown in FIG. 4, it is possible to test the DUT associated with a rack of primitives because the primitives are designed to be partitioned in an efficient manner. When, the environmental chamber is no longer needed.

Dual Fan Cooling As mentioned in the application, the advantage of dual fan cooling using an ambient air system is that ambient air can be efficiently and successfully implemented to cool the device under test (DUT) without requiring additional cooling elements other than the fans. It will happen. The need for an environmental chamber is eliminated using the primitive shown in Figure 4 as heat generated from the DUT itself is used to reach the test temperature set point. The fan then maintains its set point. Additionally, dual fan cooling using ambient air is low cost, compatible with robotic DUT (device under test) manipulation, and, as indicated above, is well suited for high-volume testing of different types of devices (or DUTs).

In this embodiment, the enclosure 450 of Figure 2 of the present application for primitives allows heat from the DUT to be kept inside the enclosure, thus eliminating the need for a separate heating chamber. As a result, direct user manipulation of the DUT and primitives is permitted at any time. In other words, the DUT supplies the heat needed to test the DUT at higher temperatures (when powered for longer periods within the enclosure). Additionally, fans and/or vents allow air to circulate inside the primitive to cool the DUT, ultimately lowering the internal temperature of the primitive.

A typical test head includes multiple primitives and an associated DUT Interface Board (DIB) to test the DUT. Each primitive is modular, meaning that it can operate independently of other primitives. Each primitive is connected to the DIB 400, and the DIB includes a plurality of slots for a plurality of DUTs 420. Test modules 410 can be modularized and inserted into a rack supporting multiple modules with communication and power signals conveyed from the back of the modules to one or more central control computers or test stations (not shown). Individual DUT test primitives 410 and DIBs 400 can be inserted into corresponding rack slots to form customizable racks of columns and rows in an ambient air environment (e.g., test site or laboratory), creating an environmental test chamber. eliminates the need for

As described above in the dual fan cooling application, primitives 410 are operable to perform tests on a DUT 420 by communicating power, commands, signals, data, test results and/or information to the DUT 420. . The test execution module 410 includes processing, communication, and storage circuitry for performing tests on the DUT 420. Additionally, the primitive or test execution module 410 controls cooling of the DUT 420 by receiving input signals from temperature sensors near the DUT 420 and by adjusting the rotational speed of the appropriate lower and upper fans. Test execution module 410 also includes an air conduit 490 to discharge air flow from DIB 400 into the surrounding environment.

FIG. 3A shows an automated workcell using a 6-axis industrial robot used to transport a DUT device (e.g., SSD) to and from a test primitive within a test head in accordance with one embodiment of the present invention.

Industrial robots can have various axis configurations. Typically, most articulated robots feature six axes, also known as six degrees of freedom. Six-axis robots allow for greater flexibility and can perform a wider variety of applications than robots with fewer axes.

FIG. 3A shows a six-axis robot 310 used to transport a DUT device (e.g., SSD) to and from a test primitive during performance and functional testing of the drive. Figure 3A also shows an overall automated workcell comprising five racks 320 and six primitives 330 per rack. Robot 310 works in the center of the cell. Although the example in FIG. 3A includes 5 racks with 6 primitives per rack, the work cells can be scaled to include any number of racks and primitives, and can be scaled to have as many work cells on the manufacturing floor. Pay attention to the point. Accordingly, embodiments of the present invention can advantageously achieve higher yields in less time by automating the insertion of devices into or removal of devices from primitives. Additionally, robotic arms can reach higher than the average human, and thus embodiments of the present invention allow primitives within a workcell to be stacked higher compared to configurations using manual labor.

Additionally, the automated workcell may include a large aluminum plate 311 that is placed on the floor of the production floor and provides a single foundation for all hardware components. In one embodiment, the aluminum plate may include a 1-inch thick aluminum slab that is machined and drilled to accommodate steel weldments and bolt-downs of the test rack.

3B illustrates a structural weldment used to maintain a test rack in static alignment within a work cell in accordance with one embodiment of the present invention. Structural weldments 312 maintain the rack in a static positional alignment, as shown in FIG. 3B, so that the rack is not subject to vibration or movement associated with pushing and pulling the DUT while being placed or extracted from the tester slot. It is used. The structural weldment may consist of a vertical steel structural weldment rigidly fixed to the slab base plate 311. Additionally, each work cell includes crossbars that provide support for each rack within the cell.

3C shows an input/output module used to provide a DUT to a robot arm during testing according to one embodiment of the present invention. The input/output module is a self-contained system that provides a sliding tray/tote 391 that slides in through the module on the operator side and out on the other side to present the DUT to the robot for pickup. Multiple slides can be programmed for various input or sort categories at any given time. In one embodiment, there is a display controlled by a microcontroller to show the operator which totes are being loaded or unloaded. In operation, the operator places the tote or tray on a slide provided thereon that is pressed down. The operator then presses a flashing key button to allow the slide to move inward into the module enclosure. On the opposite side, within the robot's work envelope, a slide whose tray or tote needs to be accessed by the robot during its pick and place is slid out into the robot's work envelope for access. When the robot picks up or places the DUT, the slide quickly moves back into the module cabinet. In this way, only the slides required for access by the robot at any given moment are allowed to enter the robot's operating range. As shown in FIG. 3C, the input/output module may be located next to a test rack with primitives 330 populated with DUTs (e.g., SATA SSDs). This input/output module uses a double ended drawer slide driven by a stepper motor at each station connected to a rack and pinion to slide the table surface outward toward the operator or inward into the robot's work envelope.

4 illustrates an automated workcell using a Cartesian 3-axis industrial robot used to transfer DUT devices (e.g., SSDs) to and from test primitives within a test head, in accordance with one embodiment of the present invention. do. The workcell of Figure 4 includes a single rack 497 with five primitives 496.

A Cartesian coordinate robot (also called a linear robot) 495, shown in Figure 4, is an industrial robot in which the three main control axes are linear (e.g., they move in a straight line rather than rotate) and are aligned at right angles to each other. It's a robot. Three sliding joints correspond to moving the wrist up and down, in and out, and forward and backward. In certain production environments that require a low-cost workcell, this can be used as an alternative to a 6-axis robot. The Cartesian robot 495 can be programmed to move along three linear axes (x, y, and z) to retrieve the DUT from the tray 498 and transfer the DUT into a slot in the DIB associated with the primitive 496.

Figure 5 shows an end effector connected to the end of a robotic arm and used to transfer a DUT device (e.g., SSD) to and from a test primitive within a test head, according to one embodiment of the present invention. . The end effector 510 is a device or tool connected to the end of the robot arm where the hand will be positioned. The end effector is the part of the robot that interacts with the DUT 505. In other words, the end effector is a gripper used to grab the DUT using the gripper fingers 520 and move it to and from the slot within the primitive.

In one embodiment of the invention, the robot arm (for both 6-axis robots and Cartesian robots) has interchangeable grippers. The gripper used is determined by the form factor of the device, e.g. SATA 2.5, M.2 driver, etc. The robotic arm is programmed to approach the tray, pull one or more DUTs from the tray using a gripper, and then push one or more DUTs into test slots of the desired primitives. Different types of DUTs have different specifications and form factors, and grippers can be selected to accommodate differences in size, shape, and geometry. Additionally, the robot arm can be programmed so that the gripper can hold the DUT at a desired location. For example, a robotic arm can be programmed so that the gripper can grasp the DUT in a position and manner that is less likely to damage the DUT.

In one embodiment, the gripper needs to have adequate strength and flexibility to detect the device format. Depending on the type of DUT being tested, the robot or tester can be programmed to have the intelligence to recognize which gripper needs to be selected, select the appropriate device gripper, and pick up the DUT and insert it into the appropriate slot.

In other embodiments, the robot or tester is further programmed to use a gripper to determine the placement of the device or the orientation of the DUT within the tray. For example, the DUT can be in a vertical or horizontal orientation within the tray. The robot or tester, in this embodiment, will be programmed to recognize in which orientation the DUT is placed within the tray and pick up the device at the appropriate contact point based on the determined orientation. For example, a robot can be programmed to access a DUT tray at a location where the gripper has dents for access by a human finger to pick up the DUT, inserting and extracting primitives into and out of test slots. The gripper can be further programmed to hold the DUT at the edge of the device while holding the device.

6 shows another end effector connected to the end of a robotic arm and used to transfer a DUT device (e.g., SSD) to and from a test primitive within a test head, according to one embodiment of the invention.

The end effector shown in FIG. 6 includes a custom mechanical assembly including a gripper 610 and the necessary mechanisms for operation in the workcell. The gripper may include a position sensor to detect motion and an optical sensor to detect the presence of the DUT.

The end effector in FIG. 6 includes a laser transducer 630 to measure depth of movement, for example. Additionally, the transducer can be used during automated position reference calibration. The robot orientation and mechanical registration feature is the ability to precisely measure the distance of the robot's end effector from a primitive, allowing the robot to use this for self-calibration of its positional reference.

The end effector further includes a camera 640 that is used to enable proper placement of the gripper over the DUT. Cameras are used during pickup and placement of DUTs into and out of totes and trays to obtain precise positional references. Additionally, it can be used to read and interpret all serial numbers and barcodes from the DUT.

The gripper 610 moves the gripper fingers 660 that hold the DUT 620 to be moved. Camera 640 can be used by the tester to capture the DUT at precise contact points to avoid damaging the DUT. The tester has the intelligence to use signals from cameras and predetermined reference points to pick up the DUT without damaging the device. Additionally, the camera 640 can also be used to determine the orientation and placement of the DUT within the tray. Additionally, the laser transducer 630 can be used with a camera to determine how the DUT needs to be picked up from the tray, and to insert and remove the DUT from slots within the primitive.

In one embodiment, the end effector is electronic, allowing the gripping power of the gripper fingers to be adjusted. Gripper fingers 660 can have custom gripping that allows the robot to pick up DUTs of several different types and form factors. The end effector's parallel gripper, in a typical embodiment, is designed to hold one DUT form factor at a time. In another embodiment, the end effector is pneumatic. In one embodiment, the end effector may include a pneumatic vacuum suction cup to pick up a DUT lying flat within a tray.

In one embodiment, the gripper can be designed to accept snap in and bolt down gripper fingers to accommodate different types of form factors. This entails the use of an automated gripper exchange mechanism, which allows the robot to insert a parallel robotic gripper into an exchange station, where a robot gripper for a particular product type can be exchanged for a gripper of a different product type within seconds. . As mentioned above, the tester can be programmed to have the intelligence to determine the type of gripper needed and perform this exchange without user intervention.

In one embodiment, the end effector is a dual end effector that can return a DUT currently in a gripper and then immediately and quickly capture another DUT in a similar gripper. To point the gripper at another DUT, the robot simply needs to turn its wrist 180°. This nearly doubles the throughput of a single gripper. In one embodiment, there is a series of one or two suction cups as part of the end effector that the robot can place on the DUT lying flat on a flat plastic input tray. Once it has acquired the DUT, it places it on a temporary stationary exchange station, twists its last robotic joint, and picks up the DUT again using the grippers required for placement into and out of the primitive.

In one embodiment, a fixed and stable gripper changing station is located on a steel post at the front of the robot. The exchange station includes an automated quick change mechanism and various grippers required to handle specific products. In operation, the robot simply pushes the existing gripper into the station, and the gripper exchange mechanism captures the gripper and removes it from the pneumatic (or electric) parallel device. The robot then extracts the bare gripper components and pushes them into different exchange stations to pick up grippers for the different product types needed for the next transfer. In one embodiment, the exchange station may also include a fixedly mounted barcode scanner that reads the DUT barcode label as the DUT is stabilized within the gripper. Additionally, the robot can scan the DUT as it passes over a barcode reader. In other words, when a device is held at this station, the barcode scanner can read the device's serial number while stationary, or it can read the device's serial number by having the robot scan a device that passes the barcode scanner without stopping. Readable. In one embodiment, the DUT already has a serial number stored internally within RAM memory, so the serial number can be read electronically (as opposed to using a barcode reader).

In one embodiment, the stationary exchange station has a number of devices for interfacing with the end effector, primarily used to transfer the DUT from the vacuum cup to the parallel gripper and vice versa. Additionally, the stationary exchange station handles both the removal of one type of product gripper and the attachment of another type of product gripper within a few seconds of robot motion.

Figure 7 shows an SSD DUT on a typical flat plastic tray used in a customer production facility. The tray shown in Figure 7 can be fragile and can bend and bend easily. This maintains the DUT in a flat orientation. The robot of the present invention can advantageously be programmed to recognize a flat orientation of the DUT, and the end effector can use a vacuum cup to pick the DUT from the tray in a position that minimizes the risk of damage to the DUT.

Figure 8 shows an SSD DUT placed in a production tote. It consists of an anti-static cardboard carton or hard plastic. This will be split to arrange the DUT with the connector facing down, allowing the robot gripper to access the end of the drive allowing contact at the corners.

Accordingly, the end effector shown in FIG. 6 can perform various functions. For example, the end effector can pick up a DUT lying flat from a tray or place the same DUT flat on an outgoing tray (as shown in Figure 7). Additionally, the end effector may use a parallel gripper to capture the device standing perpendicular to the tote slot (as shown in Figure 8). Additionally, the end effector can use parallel grippers to push the DUT into the primitive slot position or to grab and extract the DUT from the primitive. After picking up the DUT using a vacuum cup, for example, an end effector can place the DUT into a parallel gripper at an exchange station. While within the gripper at the redemption station, the barcode serial number can be read by a barcode scanner stationary at the redemption station.

Figure 9a shows a 6-axis human model industrial robot mounted on a height-adjustable Z-axis rectangular pedestal according to an embodiment of the present invention. In order to position the robot in the correct orientation relative to the article within the workcell, the robot 901 will be mounted on a rectangular stand that is actually a height-adjustable Z-axis motion device 902. Motion device 902 consists of a precision scissors lift with its own high torque stepper motor and associated electronics. The scissor lift can carry the entire robot upward to access higher optional rack heights. The six-axis robot 901 has a long reach, and because it can be mounted on a height-adjustable Z-axis rectangular base 902, advantageously the robot can reach heights that a typical human operator may not be able to reach. You can access it.

9B illustrates a scissor lift module on a height-adjustable Z-axis rectangular pedestal in a fully upwardly extended configuration according to one embodiment of the present invention. Scissor lifts can be heavy and therefore consist of their own steel weldments. Scissor lift modules have their own built-in electronics that primarily require power and Ethernet connectivity. Scissor lifts work as their own independent modules. It simply transports the robot up and down to designated locations commanded by the system controller via local Ethernet. The active motion of the scissors results from high-torque stepper motors driving thick, tight-pitch linear screws that can handle the extremes in weight transfer required at the bottom of the motion. Both the upper and lower sections use linear slides to accommodate the necessary motion for scissor operation. There are clutches and brakes built into the stepper motor assembly to stop any downward creep or any motion at all during a power loss, especially when an emergency power-off situation is required. There is an optical laser transducer that measures the height of the scissor platform relative to the base to ensure that the required motion has been achieved. The electronics for the lift consist of a fanless Windows-based embedded PC and a stepper motor indexer.

10A to 10E illustrate how a Cartesian robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive under computer control according to an embodiment of the present invention. Figure 10A shows a Cartesian robot moving in the x, y and z planes to access a DUT arranged in a vertical orientation in a production tote. The robot will typically be programmed to have the intelligence to determine the location of the tote and the orientation of the DUT placed within it. In one embodiment, the tote's location (e.g., x, y and z coordinates) can be programmed into the tester. As mentioned above, the DUT will be positioned with the connector facing down so the robot gripper can access the end of the driver allowing contact at the corners.

Figure 10b shows an end effector accessing two DUTs simultaneously using two parallel grippers. The robot can access the tray and move up and down (in the z-direction) to pick up two DUTs at a time. In one embodiment, each gripper is loaded at a separate time. In other embodiments, both grippers may be loaded simultaneously. FIG. 10C shows a Cartesian robot rotating around a pivot point 1002 to allow the robot arm to move in the x-y plane to insert a DUT into a primitive slot. Finally, Figures 10D and 10E show another view of the end effector inserting two DUTs into open slots in the primitive.

Figure 11 shows how a workcell is controlled from a PC controller according to one embodiment of the present invention. In one embodiment, system controller 1102, which may be a standard PC, may be configured to manage and execute all operations within the entire workcell. In one embodiment, a dedicated monitor 1104 in each cell may be used to interact with the system controller 1102. In one embodiment, a touchscreen monitor 1104 is used to observe and control the direct operation of the automation, useful for debugging or additional programming for continuous improvement.

The system controller determines where all DUTs are currently, prioritizes and optimizes the pick and place status, and then sends these directive commands to the robot controller 1106, which controls the robot and gripper 1108. After the robot controller executes the motion and the sensors confirm that the motion has been completed successfully, it sends the newly updated position and status information to the SQL database over the network.

In one embodiment, the SQL database is configured to receive SQL commands and queries from robot controllers or primitives. This is formatted as a series of tables representing each of the primitives, racks, and locations of all tester sockets. The information is populated with its current status or existence, the appropriate serial number and test result information, and any other information that the factory floor can use to determine its current status. The SQL database provides the main interface for primitives to understand what the robot is accomplishing at the moment and the status of all DUTs on the factory floor. Robotic test cell automation stores data in this database about the current state within the robotic test cell and reads the information placed there by primitives during operation. This enables completely asynchronous and independent communication between all items on the factory floor.

As shown in FIG. 11 , in one embodiment, the system controller includes a recipe file 1120 that contains all parameters and configuration values necessary to operate the workcell at the required performance. The system controller also includes an archive log file 1122 that contains a record of all operations within the workcell. Additionally, the log file contains all serial interactions with the DUT and all interactions with the SQL database.

Figure 12 shows the overall hardware and software required for operation of the workcell according to one embodiment of the present invention. System controller 1102 and monitor 1104 may be used to interact with primitives within the rack. Monitors and system controllers can be connected directly to the rack electronics for local control and debugging. The monitor may include an interface 1124 that allows the user to directly interact with primitives within the rack.

Monitor 1104 may also include an interface 1226 to an automation package with robot controller 1106. Additionally, the monitor can provide control and debugging capabilities. Additionally, the monitor may include an HTML web interface 1228 for system control and configuration, monitoring, maintenance, and debugging. This interface will typically be used on the production floor and within the factory, and operations may be performed via an intranet 1236.

The monitor has an HTML web interface 1230 for system control and configuration, monitoring, maintenance and debugging that can be used outside the facility where a user can log in from a remote location to perform operations on the workcell via the Internet 1236. may include. Additionally, the monitor may include an HTML web interface 1232 for system monitoring running on a mobile device.

The SQL database 1234 discussed above may be installed by the customer and used to maintain internal security protocols at the customer's test site.

Figure 13 shows a flowchart of an exemplary computer-implemented process for executing tests on a DUT within a workcell in accordance with one embodiment of the present invention. However, the present invention is not limited to the description provided by flowchart 1300. Rather, from the teachings provided herein, it will be apparent to those skilled in the art that other functional flows are within the scope and spirit of the present invention. Flowchart 1300 will continue to be described with reference to the example embodiments described above, but the method is not limited to these embodiments.

At step 1302, the automated test system finds the input DUT and records the existence of the new DUT in the SQL database. In one embodiment, the serial number for the DUT may be scanned at the switching station.

At step 1304, the robot prepares to load the DUT into the test rack. The automated testing system queries the SQL database to determine if an empty slot is available inside the primitive. Additionally, the automated system ensures that the configuration is correct, the tester is accurate for the specific product being tested, and the selected slot is online and available.

At step 1306, the robot loads the DUT into the selected slot. In addition, the test system makes the DUT table location information and its status in the SQL database available for the tester to start the test process.

At step 1308, primitives in the rack continuously poll the SQL DUT table to determine if the socket is full. If the socket is filled, the tester sets the status in the SQL database to "Testing" and begins the normal test cycle.

At step 1310, the tester updates the DUT's status in the SQL database with pass/fail and other information, such as sort categories, upon completion of the test cycle.

At step 1312, the automated test system polls the SQL database to receive test results for the DUT. When the tester receives the response, it can remove the DUT from the primitive and place it in a specific output bin based on the information received, for example, information about the sorted categories.

The foregoing description has been described with reference to specific embodiments for purposes of explanation. However, the foregoing illustrative discussion is not intended to be exhaustive or to limit the invention to the precise form disclosed. Many modifications and variations are possible in light of the foregoing teachings. The embodiments have been selected and described so as to best illustrate the principles of the invention and thereby enable others skilled in the art to best utilize the various embodiments of the invention and various modifications that may be adapted to the particular application contemplated. .

Claims (27)

In a method of performing a test using automated test equipment (ATE),
Finding and capturing the device under test (DUT) to be tested;
recording the existence of the DUT in a database;
querying the database to determine whether an empty slot exists in a primitive, where the primitive is a modular device including a plurality of slots for testing a plurality of DUTs;
Using a robot to automatically position and insert the DUT into the empty slot;
reporting to the database that the empty slot has been filled; and
Initiating testing of the DUT
Including,
During the test, the required slide among the plurality of slides (i) slides toward the operator so that the operator can place the tray on which the DUT is placed on the required slide, or (ii) the robot moves the DUT from the tray. sliding towards the robot to pick up or place the DUT on the tray,
How to conduct a test using ATE. According to paragraph 1,
The DUT is a solid state drive (SSD),
How to conduct a test using ATE. According to paragraph 1,
wherein the primitive is one of a plurality of primitives in a test rack, and the robot is operable to access a slot within the plurality of primitives in the test rack,
How to conduct a test using ATE. According to paragraph 1,
Further comprising updating the status of the DUT in the database based on the results of the test,
How to conduct a test using ATE. According to paragraph 4,
further comprising using the robot to automatically retrieve the DUT from the primitive and return the DUT to the tray.
How to conduct a test using ATE. According to paragraph 1,
The robot is a 6-axis robot,
How to conduct a test using ATE. According to paragraph 1,
The robot is a Cartesian robot,
How to conduct a test using ATE. According to paragraph 1,
The robot includes an end effector operable to hold and transport the DUT into and out of a test slot within the primitive.
How to conduct a test using ATE. According to clause 8,
The robot further includes a camera operable to enable accurate pickup and placement of the DUT.
How to conduct a test using ATE. According to clause 9,
The robot further comprises a laser transducer operable to measure the depth of movement of the end effector,
How to conduct a test using ATE. In a system that performs a test using automated test equipment (ATE),
A robot including an end effector operable to automatically pick up and transport a DUT into and out of a test slot within a primitive;
a system controller including a processor and memory to control the robot; and
A test rack containing multiple primitives
Including,
Each primitive is a modular device including a plurality of slots for testing a plurality of DUTs, and the robot is configured to automatically access the slots in the plurality of primitives within the test rack using the end effector,
During the test, the required slide among the plurality of slides (i) slides toward the operator so that the operator can place the tray on which the DUT is placed on the required slide, or (ii) the robot moves the DUT from the tray. configured to slide toward the robot to pick up or place the DUT on the tray,
A system that performs testing using ATE. According to clause 11,
The robot further includes a camera operable to enable accurate pickup and placement of the DUT.
A system that performs testing using ATE. According to clause 12,
The robot further comprises a laser transducer operable to measure the depth of movement of the end effector,
A system that performs testing using ATE. According to clause 11,
The robot is a 6-axis robot,
A system that performs testing using ATE. According to clause 11,
The robot is a Cartesian robot,
A system that performs testing using ATE. According to clause 11,
Further comprising a monitor connected to the system controller, wherein the monitor is used to observe and control the operation of the robot and debug problems with the robot.
A system that performs testing using ATE. According to clause 11,
Further comprising an exchange station including a plurality of end effectors, wherein the robot is programmed to automatically recognize the form factor of the DUT and exchange the end effector at the exchange station according to the form factor of the DUT. operable,
A system that performs testing using ATE. In a system that performs a test using automated test equipment (ATE),
A robot including an end effector operable to automatically grasp, pick up, and transport a DUT into and out of a test slot within a primitive;
an input/output module comprising a plurality of trays placed on a plurality of slides, the input/output module operable to provide DUTs placed on the plurality of trays from the plurality of trays to the robot during testing;
a system controller including a processor and memory to control the robot; and
A test rack containing multiple primitives
Including,
Each primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, wherein the robot is configured to access the slots within the plurality of primitives within the test rack,
The input/output module causes a required slide among the plurality of slides to (i) slide toward the operator so that the operator can place a tray among the plurality of trays on the required slide, or (ii) cause the robot to move from the tray to the operator. configured to slide toward the robot to pick up the DUT or place the DUT on the tray,
A system that performs testing using ATE. According to clause 18,
wherein the robot is operable to automatically access the DUT directly from a tray within the input/output module prior to inserting the DUT into a slot within a designated primitive,
A system that performs testing using ATE. According to clause 19,
The robot is operable to be programmed to retrieve the DUT and return it to a tray within the input/output module after a test has been executed from the slot.
A system that performs testing using ATE. According to clause 18,
The robot further includes a camera operable to enable accurate pickup and placement of the DUT.
A system that performs testing using ATE. According to clause 21,
The robot further comprises a laser transducer operable to measure the depth of movement of the end effector,
A system that performs testing using ATE. According to clause 22,
The robot further includes a vacuum cup operable to pick up a flatly placed DUT from a tray or place the DUT flatly onto an outgoing tray,
A system that performs testing using ATE. According to clause 18,
The robot is a 6-axis robot,
A system that performs testing using ATE. According to clause 18,
The robot is a Cartesian robot,
A system that performs testing using ATE. According to clause 18,
a plurality of structural weldments operable to maintain the test rack in static position alignment in a workcell,
A system that performs testing using ATE. According to clause 26,
The plurality of structural weldments secure the robot and the input/output module to the test rack,
A system that performs testing using ATE.