KR20200027608A - Automated handling of different form factor devices under test in test cell - Google Patents

Abstract

Disclosed is a system for performing a test using automated test equipment (ATE). The system comprises a robot including an end effector operable to pick up and transfer a DUT into and out of a test slot in a primitive. The system further includes a processor and a memory for controlling the robot. In addition, the system includes a test rack including a plurality of primitives, and the primitives are modular devices which include a plurality of slots for testing a plurality of DUTs. The robot is configured to automatically access slots in the plurality of primitives within the test rack using the end effector.

Description

Automated handling of devices under test with different form factors in the test cell {AUTOMATED HANDLING OF DIFFERENT FORM FACTOR DEVICES UNDER TEST IN TEST CELL}

[Cross reference to related technology]

This application is filed on March 9, 2017, and the title of the invention is "DEVICE TESTING USING DUAL-FAN COOLING WITH AMBIENT AIR", the inventor Roland Wolff, the agent patent number is ATSY-0046-01.01US 15 / 455,103. This application is hereby incorporated by reference in its entirety for all purposes.

[Technical field]

The present disclosure relates generally to the field of automated testing devices, and more particularly to automated handling techniques for such devices.

An automated test equipment (ATE) can be any test assembly that performs tests on a semiconductor wafer or a packaged device such as a die, integrated circuit (IC), circuit board, or solid-state drive (SSD). . The ATE assembly can be used to quickly perform measurements and run automated tests that produce test results that can be analyzed. The ATE assembly includes an on-demand dedicated computer control system from a computer system coupled to the meter and many different test equipment that can automatically test electronic components and / or semiconductor wafers such as system-on-chip (SOC) testing or integrated circuit testing. It can be anything from complex automated test assemblies that can be done. The ATE system reduces the time spent on the test device to ensure that it functions as designed, and serves as a diagnostic tool to determine the presence of defective parts within a given device before reaching the customer.

When a typical ATE system tests a device (commonly referred to as the device under test or device under test (DUT)), the ATE system applies a stimuli (eg electrical signal) to the device and responds to the device (eg For example, check current and voltage). Typically, the end result of the test is a “pass” if the device successfully provides a predetermined predicted response within a preset tolerance, or the device successfully succeeds a predetermined predicted response within a preset tolerance. If not provided, it becomes "fail". More sophisticated ATE systems can evaluate a defective device to potentially determine one or more causes of the defect.

It is common for an ATE system to include a computer that directs the operation of the ATE system. Typically, a computer executes one or more dedicated software programs to provide (i) a test development environment and (ii) a device test environment. In a test development environment, users typically create a software infrastructure of test programs, ie one or more files that control various parts of the ATE system. In a device test environment, a user typically provides an ATE system with one or more devices for testing, and instructs the ATE system to test each device according to a test program. The user can test the additional device by simply providing the additional device to the ATE system and instructing the ATE system to test the additional device according to the test program. Thus, the ATE system allows the user to test many devices in a consistent and automated manner based on the test program.

In a typical prior art test environment, the DUT is placed into a controlled environment chamber or “oven”. The DUT is connected to a tester slice of the test head. Multiple DUTs can be connected to a single slice, and a single test chamber can contain multiple slices. The slice includes a test circuit section that performs tests on the DUT according to the test plan. When in the oven, the DUT is not user-accessible so as not to interfere with the chamber's controlled environment. When in the chamber, if some DUT tests end early, they cannot be removed until all tests are complete. Thereafter, the chamber can be accessed.

One of the problems associated with this test environment is that the interior of the environment chamber cannot be accessed during the test, causing a given tester slice to idle if the test is being run using a tester slice active in the oven. Another problem is that conventional test environments typically require manual insertion and removal of the DUT, which is disadvantageous because it is time consuming and error prone and the DUT can be damaged during manual handling. In addition, manual insertion and removal of DUTs in mass production environments is quite inefficient and error prone.

Accordingly, there is a need for an automated method of handling DUTs of different form factors within a test cell. What is also needed is an automated method that eliminates the need for human labor and achieves higher yields in less time, using robots to insert DUTs into primitives within the test head and remove DUTs from primitives. . What is also needed is a test environment that allows access to the system while the test is running within the environment so that the system can be fully utilized. Using the beneficial aspects of the described system, without corresponding limitations, embodiments of the present invention provide novel solutions to address these problems.

The disclosed invention utilizes a plurality of primitives and associated DUT interface boards (DIBs) to test DUTs. Each primitive is modular, meaning that it can operate independently of other primitives. Each primitive is connected to a DIB, and the DIB includes multiple slots for multiple DUTs.

Embodiments of the present invention utilize robots to automate the testing process, in part by automating the insertion of the DUT into the DIB and the removal of the DUT from the DIB. The robot, in one embodiment, utilizes an exchangeable gripper to handle DUTs of various form factors. The automated process can be programmed to allow the robot to automatically recognize which type of device is being tested and select a suitable gripper for the form factor of the device being tested. Further, in other embodiments, the tester may be programmed such that the robot has intelligence to also determine the orientation (horizontal or vertical) of the device within the bin and the placement of the device. In a further embodiment, the robot is further programmed to have intelligence to hold the device without damage using a camera and external reference points.

In accordance with embodiments of the present invention, device heating is generally generated by a self-acting DUT. Thus, after operating the device, a setpoint temperature will be achieved. The cooling method and system, for example, a fan inside the DIB employed within the embodiments of the present invention, effectively cools the device to maintain the setpoint temperature for testing. Thus, a temperature controlled environmental chamber is not required to heat the device. Another advantage is that the ambient air can be successfully used to cool the DUT without requiring additional cooling elements other than fans. Thus, the need for an expensive environmental chamber is eliminated, as the test can be performed in a laboratory environment or on a test site. The solution is low cost, and the combination of the DUT interface board (DIB) and the test execution module (or primitive) itself is suitable for robotic DUT operation, and thus, network cards, graphics cards, chips, microprocessors, hard disk drives (hard disk drives) It is suitable for mass testing of various electronic devices, including but not limited to disk drives (HDDs) and solid state drives (SSDs).

In addition, since the DUT is not located in the environmental test chamber, during the test cycle with the robot, it is more easily handled, physically manipulated, and inspected. In addition, aspects of the electronic circuitry used to test the DUT are modularized (using primitives, as described herein). Thus, different modules may be performing different tests on different form factors and DUT types, or different tests on the same DUT type (because the test is no longer needed to be run in the lock step). ). This increases the overall test efficiency and test flexibility.

In one embodiment, a method for performing a test using automated test equipment (ATE) is disclosed. The method includes finding a device under test (DUT) to be tested. In addition, this includes writing the existence of the DUT to the database, and querying the database to determine if an empty slot exists in the primitive, and the primitive includes a plurality of DUTs to accommodate and test. It is a modular device that includes a slot. The method also includes using the robot to insert the DUT into the empty slot, and reporting to the database that the empty slot is filled. Finally, the method includes initiating a test for the DUT.

In another embodiment, a system for performing a test using an automated test device (ATE) is provided. The system includes a robot that includes an end effector operable to pick up and transfer the DUT into and out of the test slot in the primitive. The system further includes a system controller including a processor and memory for controlling the robot. In addition, the system includes a test rack that includes a plurality of primitives, and the robot is configured to access slots in the plurality of primitives within the test rack using an end effector.

In another embodiment, a system for performing a test using an automated testing device (ATE) is disclosed. The system includes a robot that includes an end effector operable to automatically grab, pick up, and transport the DUT into and out of the test slot within the primitive. The system further includes an input / output module that includes a plurality of trays and is operable to provide a DUT from the plurality of trays to the robot during the test. Additionally, the system includes a system controller including a processor and memory for controlling the robot. In addition, the system includes a test rack that includes a plurality of primitives, the primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and the robot can access slots within the plurality of primitives within the test rack. It is composed.

The following detailed description together with the accompanying drawings will provide a better understanding of the nature and advantages of the present invention.

In the accompanying drawings, in which like reference numerals indicate similar elements, embodiments of the present invention are shown by way of example and not limitation.
1 shows a conventional test environment in which the DUT is placed into a controlled environmental chamber.
2 illustrates a primitive interfaced with a DUT interface board (DIB) 400 according to an embodiment of the present invention.
3A shows an automated workcell using a six-axis industrial robot used to transfer and transfer DUT devices (eg, SSDs) to test primitives within a test head according to one embodiment of the present invention. .
3B shows a structural weldment used to keep a test rack in a static positional alignment within a work cell in accordance with one embodiment of the present invention.
3C shows an input / output module used to provide a DUT to a robot arm during a test in accordance with one embodiment of the present invention.
4 illustrates an automated work cell using a Cartesian 3-axis industrial robot used to transfer and transfer a DUT device (eg, SSD) to a test primitive in a test head according to one embodiment of the present invention.
5 illustrates an end effector used to transfer to and from a test primitive in a test head by connecting to the end of a robot arm and holding a DUT device (eg, SSD) in accordance with one embodiment of the present invention. do.
6 is another end effector used to transfer to and from a test primitive in a test head by connecting to the end of a robot arm and holding a DUT device (eg, SSD) in accordance with one embodiment of the present invention. City.
7 shows an SSD DUT on a typical flat plastic tray used in a customer production facility.
8 shows an SSD DUT placed in a production site tote.
9A shows a 6-axis human body model industrial robot mounted on a height-adjustable Z-axis rectangular base according to an embodiment of the present invention.
9B shows a scissors lift module of a height-adjustable Z-axis rectangular pedestal in a fully extended configuration according to one embodiment of the present invention.
10A, 10B, 10C, 10D, and 10E illustrate how a Cartesian robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive according to one embodiment of the present invention.
11 illustrates a method in which a work cell is controlled from a PC controller according to an embodiment of the present invention.
12 illustrates overall hardware and software necessary for operation of a work cell according to an embodiment of the present invention.
13 shows a flow chart of an exemplary computer-implemented process for executing a test on a DUT in a work cell in accordance with one embodiment of the present invention.
In the drawings, elements having the same reference numbers have the same or similar functions.

Reference will now be made in detail to various embodiments of the present disclosure, with examples shown in the accompanying drawings. When described in conjunction with these embodiments, it will be understood that it is not intended to limit the present disclosure to these embodiments. Conversely, the present disclosure is intended to include substitutes, modifications and equivalents that may be included within the technical spirit and scope of the present disclosure as defined by the appended claims. add. In the following detailed description of the disclosure, various specific details are set forth to provide a thorough understanding of the disclosure. However, it will be understood that the present disclosure may be practiced without these specific details. In other instances, well-known methods, procedures, components and circuits have not been described in detail so as not to unnecessarily obscure aspects of the present disclosure.

Some portions of the detailed description that follows are presented in terms of procedures of operations on data bits in computer memory, logical blocks, processing, and other code representations. These descriptions and representations are the means used by those skilled in the data processing arts to most effectively provide the essence of the work to others skilled in the art. In the present application, a procedure, logic block, process, or the like is understood as a self-consistent sequence of steps or instructions leading to a desired result. The step is to use physical manipulation of physical quantities. Usually, though not necessarily, these quantities take the form of electrical or magnetic signals that can be stored, transported, combined, compared, or otherwise manipulated in a computer system. It has proven convenient at times, often for reasons of general use, to refer to this signal as a transaction, bit, value, element, sign, character, sample, pixel or similar.

However, it should be borne in mind that all of these and similar terms are associated with suitable physical quantities and are merely convenient labels applied to these quantities. Unless specifically stated otherwise in the following discussion, throughout the present disclosure, "configuring", "updating", "testing", "polling" ) ”Or similar, refer to the operation and process of a computer system or similar electronic computing device or processor (eg, flow chart 1300 of FIG. 13). A computer system or similar electronic computing device manipulates and transforms data represented as physical (electronic) quantities in computer system memory, registers or other such information storage devices, transmission devices or display devices.

Embodiments described herein may be discussed in general association with computer-executable instructions residing on some form of computer-readable storage media, such as program modules, being executed by one or more computers or other devices. By way of example, and not limitation, computer-readable storage media may include non-transitory computer-readable storage media and communication media; Non-transitory computer readable media includes all computer readable media except for transient radio signals. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The functions of the program modules may be combined or distributed as required in various embodiments.

Computer storage media includes volatile and nonvolatile removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Computer storage media includes random access memory (RAM), read only memory (ROM), electrically erasable programmable ROM (EEPROM), flash memory or other memory technology, compact disk ROM (CD-ROM), digital versatile disks (DVD), or Other optical storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage devices, or any other medium that can be used to store desired information and can be accessed to retrieve the information.

Communication media may embody computer-executable instructions, data structures, and program modules, and include any information delivery media. By way of example, and not limitation, communication media includes wired media such as a wired network or direct wired connection, and wireless media such as acoustic, radio frequency (RF), infrared and other wireless media. Also, any combination of the above can be included within the scope of computer readable media.

Automated handling of devices under test with different form factors in the test cell (AUTOMATED HANDLING OF DIFFERENT FORM FACTOR DEVICES UNDER TEST IN TEST CELL)

1 shows a conventional test environment in which a DUT is placed into a controlled environment chamber 10 or “oven”. The DUT is connected to the tester slice of the test head 20. Many DUTs can be connected to a single tester slice 40. The tester slice includes a test circuitry that performs tests on the DUT according to the test plan. There may be many tester slices per test head 20. The DUT is placed into the tray 30 when inserted into the oven 10. When in the oven 10, the DUT is typically not accessible by the user so as not to interfere with the controlled environment of the chamber 10. In a typical environmental chamber, multiple tester slices operate in a lock step that executes the same test plan on multiple DUTs. In addition, the test head is typically controlled by a single controller computer system (not shown) directly connected to the test head, and in this way, all slices of the test head 20 are controlled.

One of the problems associated with this test environment is that the interior of the environment chamber cannot be accessed during the test, so if the test is being run using a different tester slice in the test head, the entire tester slice or empty slot in the tester slice is idle. To do it. Another problem is that the conventional test environment is typically disadvantageous because it requires manual insertion and removal of the DUT from the test slice, which is time consuming and error prone and the DUT can be damaged during manual handling. In addition, manual insertion and removal of DUTs in a mass production environment is quite inefficient.

Embodiments of the present invention provide an automated method of handling devices under test with different form factors within a test cell. Embodiments of the present invention provide an automated method of inserting a DUT primitively from a test head using a robot and removing the DUT from the primitive, thereby eliminating the need for human labor and higher yields in a shorter time. To achieve. In addition, embodiments of the present invention allow access inside the chamber while the test is being performed in the chamber so that the chamber can be fully utilized simultaneously.

In accordance with embodiments of the present invention, device heating is generally generated by a self-acting DUT. Thus, after operating the device, a setpoint temperature will be achieved. Next, a cooling method and system, for example a fan inside the DIB employed within the embodiments of the present invention, will effectively cool the device to maintain the setpoint temperature for testing. Thus, a temperature controlled environmental chamber is not required to heat the device.

Another advantage is that the ambient air can be successfully used to cool the DUT without requiring additional cooling elements other than fans. Thus, the need for an expensive environmental chamber is eliminated. The solution is low cost, and the combination of the DUT interface board (DIB) and the test execution module (or primitive) itself is suitable for robotic DUT operation, and thus, network cards, graphics cards, chips, microprocessors, hard disk drives (hard disk drives) It is suitable for mass testing of various electronic devices, including but not limited to disk drives (HDDs) and solid state drives (SSDs).

In addition, since the DUT is not located in the environmental test chamber, during the test cycle with the robot, it is more easily handled, physically manipulated, and inspected. In addition, aspects of the electronic circuitry used to test the DUT are modularized (using primitives, as described herein). Thus, different tests can be performed on different types of DUTs with different modules or even with the same form factor. This increases the overall test efficiency and test flexibility.

As indicated above, advantageously, embodiments of the present invention utilize a robot to automate the testing process, in part by automating the insertion of the DUT into the DIB and the removal of the DUT from the DIB. In one embodiment, the robot utilizes interchangeable grippers to handle DUTs of various form factors. The automated process can be programmed to select a suitable gripper for the form factor of the device under test, with intelligence, flexibility and strength for the robot to automatically recognize which device is being tested. Further, in other embodiments, the tester can also be programmed to have the robot have intelligence to determine the orientation (horizontal or vertical) of the device within the bin and the placement of the device. In a further embodiment, the robot is further programmed to have the intelligence to hold the device without damage by using a camera and external reference points.

2 illustrates a primitive 410 that interfaces with a DUT interface board (DIB) 400 according to an embodiment of the present invention. Similar to the tester slice 40 shown in FIG. 2, the primitive of FIG. 4 is a type of individual test module that fits into the test head 20 and includes test circuitry to perform tests on the DUT according to the test plan. to be. The primitive is an improvement over the tester slice 40 of FIG. 1, in part because it includes an enclosure 450 in which various electronic devices, such as, for example, a site module, power source, etc., are all accommodated. to be. The DIB 400 may include a plurality of DUTs 420 using a custom connector having a size for the DUT 420. In addition, DIB 400 includes enclosure 470. The DIB 400 is interfaced to the universal backplane of the primitive 410 through a load board (not shown) to obtain high speed signals and power. The primitive 410 includes test circuitry for performing a test plan for the DUT 420. The primitive 410 can operate independently of any other primitive and is connected to the control server.

Embodiments of the present invention utilize multiple primitives (similar to the primitives shown in Figure 2) and associated DIBs to test the DUT. Each primitive is modular, meaning that it can operate independently of other primitives. Thus, multiple primitives installed in a rack can each operate under different test plans.

United States Patent Application No. 15 / 455,103 filed March 9, 2017, incorporated herein by reference and entitled "DEVICE TESTING USING DUAL-FAN COOLING WITH AMBIENT AIR" (herein referred to as "dual fan cooling application") (In this case), in one embodiment, if the test system uses the primitives shown in FIG. 4, the DUT associated with the rack of primitives will be tested because the primitives are designed to be partitioned in an efficient manner. When the environment chamber is no longer needed.

As mentioned in the dual fan cooling application, the advantage of dual fan cooling with an ambient air system is that the ambient air is efficiently and successfully implemented to cool the device under test (DUT) without requiring additional cooling elements in addition to the fan. It is. The need for an environmental chamber is eliminated using the primitive shown in Figure 4 as heat generated from the DUT itself is used to reach the test temperature setpoint. Then the fan maintains that set point. In addition, dual fan cooling using ambient air is low cost, compatible with robotic DUT (device under test) operation, and as indicated above, is well suited for mass testing of different types of devices (or DUTs).

In this embodiment, the enclosure 450 of FIG. 2 of the present application for the primitive allows heat from the DUT to be maintained inside the enclosure, thus eliminating the need for a separate heating chamber. As a result, direct user manipulation is allowed at any time for DUTs and primitives. In other words, the DUT supplies the heat required to test the DUT at a higher temperature (when powered up for a longer period in the enclosure). In addition, fans and / or vents allow air to circulate inside the primitive to cool the DUT, and consequently lower the internal temperature of the primitive.

A typical test head includes a plurality of primitives and associated DUT interface boards (DIBs) to test the DUT. Each primitive is modular, meaning that it can operate independently of other primitives. Each primitive is connected to the DIB 400, and the DIB includes a plurality of slots for the plurality of DUTs 420. The test module 410 is modular and can be inserted into a rack supporting multiple modules using communication and power signals returned from one rear of the module to one or more central control computers or test stations (not shown). Individual DUT test primitives 410 and DIB 400 can be inserted into corresponding rack slots to form a rack of columns and rows that are customizable in an ambient air environment (eg, a test site or laboratory), so that an environmental test chamber Eliminates the need for.

As described above in the dual fan cooling application, primitive 410 is operable to perform tests on DUT 420 by communicating power, commands, signals, data, test results and / or information with DUT 420. . The test execution module 410 includes processing, communication, and storage circuitry for performing tests on the DUT 420. In addition, the primitive or test execution module 410 controls the cooling of the DUT 420 by receiving input signals from temperature sensors near the DUT 420 and by adjusting the rotational speeds of suitable lower and upper fans. In addition, the test execution module 410 includes an air conduit 490 to discharge air flow from the DIB 400 to the surrounding environment.

3A illustrates an automated work cell using a 6-axis industrial robot used to transfer and transfer a DUT device (eg, SSD) to a test primitive in a test head according to one embodiment of the present invention.

Industrial robots can have various axial configurations. Typically, most articulated robots feature six axes, also called six degrees of freedom. The six-axis robot allows greater flexibility and can perform more diverse applications than robots with fewer axes.

FIG. 3A shows a six-axis robot 310 used to transfer and transfer DUT devices (e.g., SSDs) to test primitives during drive performance and functional testing. In addition, FIG. 3A shows an overall automated work cell comprising five racks 320 and six primitives 330 per rack. The robot 310 works in the center of the cell. Although the example in FIG. 3A includes five racks with six primitives per rack, the work cell can be scaled to include any number of racks and primitives, and many work cells can be scaled to be on the shop floor. Notice the point. Thus, embodiments of the present invention can advantageously achieve higher yields in a shorter time by automating the insertion of the device into the primitive or removal of the device therefrom. In addition, the robot arm can reach higher than the average human, and thus embodiments of the present invention allow primitives in the work cell to be stacked higher than configurations using manual labor.

In addition, the automated work cell may include a large aluminum plate 311 placed on the floor of the production site and providing a single foundation for all hardware components. In one embodiment, the aluminum plate may include a 1 inch thick aluminum slab machined and drilled to accommodate steel weldments and bolt-down of the test rack.

3B shows a structural weldment used to keep a test rack in a static positional alignment within a work cell in accordance with one embodiment of the present invention. The structural weldment 312 maintains the rack in a static positional alignment, as shown in FIG. 3B, so that it is not subject to vibrations or movements associated with pushing and pulling the DUT while the rack is being placed or extracted from the tester slot. Is used. The structural weldment may be made of a vertical steel structure weldment rigidly fixed to the slab base plate 311. In addition, each working cell includes crossbars that provide support for each rack within the cell.

3C shows an input / output module used to provide a DUT to a robot arm during a test in accordance with an embodiment of the present invention. The input / output module is a standalone system that provides a sliding tray / tote 391 that slides in through the module from the operator side and slides out to the other side to provide the DUT to the robot for pickup. Multiple slides can be programmed for various input or sort categories at any given time. In one embodiment, there is a display controlled by the microcontroller to show the operator which tote is loading or unloading. During operation, the operator is pressed to place the tote or tray on the slide provided thereon. The operator then presses a shiny key button to allow the slide to move inwards into the module enclosure. On the opposite side, within the robot's work envelope, slides that the tray or tote needs to access by the robot during its pick and place slide out into the robot's working range for access. When the robot picks up or places the DUT, the slide quickly moves back and forth back into the module cabinet. In this way, only the slides necessary for access by the robot at a given moment are allowed to enter the robot working range. As shown in FIG. 3C, the input / output module can be placed after a test rack with a primitive 330 filled with a DUT (eg, SATA SSD). This input / output module uses a double ended drawer slide driven by a stepper motor at each station connected to the rack and pinion to slide the table surface out towards the operator or inward into the robot working range.

FIG. 4 illustrates an automated work cell using a Cartesian 3-axis industrial robot used to transfer and transfer a DUT device (eg, SSD) to a test primitive in a test head according to one embodiment of the present invention. do. The work cell of FIG. 4 includes a single rack 497 with five primitives 496.

The Cartesian coordinate robot shown in FIG. 4 (also called a linear robot) 495 has three main control axes linear (eg, it moves in a straight line rather than rotating) and is aligned at right angles to each other with respect to each other. It is a robot. The three sliding joints correspond to moving the wrist up, down, in and out and back and forth. In certain production environments requiring low cost work cells, this can be used as an alternative to a 6 axis robot. The Cartesian robot 495 can be programmed to move along three linear axes (x, y and z) to retrieve the DUT from the tray 498 and transport the DUT into the slot of the DIB associated with the primitive 496.

FIG. 5 shows an end effector used to transfer to and from a DUT device (e.g., SSD) to a test primitive in a test head connected to the end of a robot arm in accordance with one embodiment of the present invention. . The end effector 510 is a device or tool that is connected to the end of the robot arm where the hand will be located. The end effector is the part of the robot that interacts with the DUT 505. In other words, the end effector is a gripper used to grip the DUT using the gripper finger 520 and move it from inside to inside of the primitive and into the slot.

In one embodiment of the invention, the robot arm (for both 6-axis robots and Cartesian robots) has an exchangeable gripper. The gripper used is determined by the form factor of the device, for example SATA 2.5, M.2 driver. The robotic arm is programmed to access the tray, pull one or more DUTs from the trays using a gripper, and then push one or more DUTs into the test slots of the desired primitives. Different types of DUTs have different specifications and form factors, and the gripper can be selected to accommodate differences in size, shape and shape. In addition, the robot arm can be programmed to allow the gripper to hold the DUT at the desired position. For example, the robot arm can be programmed to hold the DUT in a position and manner where the gripper is less likely to damage the DUT.

In one embodiment, the gripper needs to have strength and flexibility suitable for detecting the device format. Depending on the type of DUT being tested, the robot or tester can be programmed to recognize which gripper needs to be selected, select the appropriate device gripper, and have the intelligence to pick up the DUT and insert it into the appropriate slot.

In other embodiments, the robot or tester is further programmed to use a gripper to determine the orientation of the DUT in the tray or the placement of the device. For example, the DUT can be in a vertical or horizontal orientation within the tray. The robot or tester, in this embodiment, will be programmed to recognize in which orientation the DUT is placed in the tray and pick up the device at a suitable contact point based on the determined orientation. For example, the robot can be programmed such that the gripper accesses the DUT tray at a location where a dent for access of the human finger is present to pick up the DUT, and inserts and extracts into and out of the primitive test slot. While the gripper can be further programmed to hold the DUT at the edge of the device.

6 illustrates another end effector connected to the end of a robot arm and used to transfer a DUT device (eg, SSD) to and from a test primitive in a test head in accordance with one embodiment of the present invention.

The end effector shown in FIG. 6 includes an on-demand mechanical assembly including a gripper 610 and a mechanism necessary for operation in a work cell. The gripper may include a position sensor for detecting motion and an optical sensor for detecting the presence of the DUT.

The end effector of FIG. 6 includes, for example, a laser transducer 630 for measuring the depth of movement. In addition, the transducer can be used during automated position reference calibration. Features of robot orientation and mechanical registration The couple is the ability to precisely measure the distance of a robot end effector from a primitive and use it for self-calibration of a position reference.

The end effector further includes a camera 640 that is used to enable proper placement of the gripper over the DUT. The camera is used during pickup and placement of the DUT into and out of the tote and tray to obtain a precise position reference. In addition, it can be used to read and interpret all serial numbers and barcodes from the DUT.

The gripper 610 moves the gripper finger 660 holding the DUT 620 to be moved. The camera 640 can be used by a tester to hold the DUT at precise contact points so as not to damage the DUT. The tester has the intelligence to use signals from the camera and a predetermined reference point to pick up the DUT without damaging the device. In addition, the camera 640 can also be used to determine the orientation and placement of the DUT in the tray. In addition, the laser transducer 630 can be used with a camera to determine how the DUT needs to be picked up from the tray, and to insert and remove the DUT from slots in the primitive.

In one embodiment, the end effector is electronic, which allows the gripping power of the gripper finger to be adjusted. The gripper finger 660 may have custom gripping to allow the robot to pick up DUTs of different types and form factors. The parallel gripper of the end effector, in a typical embodiment, is designed to hold one DUT form factor at a time. In other embodiments, the end effector is pneumatic. In one embodiment, the end effector may include a pneumatic vacuum suction cup to pick up a DUT that lies flat within the tray.

In one embodiment, the gripper can be designed to accept snap in and bolt down gripper fingers to accommodate different types of form factors. This entails the use of an automated gripper exchange mechanism, which allows the robot to insert a parallel robot gripper into the exchange station, and the robot gripper for a particular product type can be exchanged for grippers of different product types within seconds. . As mentioned above, the tester can be programmed to determine the type of gripper needed and to have the intelligence to perform this exchange without user intervention.

In one embodiment, the end effector is a dual end effector capable of reverting the DUT currently in the gripper and then immediately and quickly capturing another DUT in the similar gripper. To direct the gripper to another DUT, the robot simply needs to turn its wrist 180 °. This results in almost twice the throughput of a single gripper. In one embodiment, there is a series of 1 to 2 suction cups as part of the end effector that the robot can place on a DUT that lies flat on a flat plastic input tray. Once it has acquired the DUT, it is placed on a temporary fixed exchange station, twisted at its last robot joint, and picked up again by the gripper required for placement into and out of the primitive.

In one embodiment, a fixed and stable gripper exchange station is located on a steel post in front of the robot. The exchange station includes an automated quick change mechanism and various grippers needed to handle a particular product. In operation, the robot simply pushes the existing gripper into the station, and the gripper exchange mechanism captures the gripper and removes it from the pneumatic (or electric) parallel device. The robot then extracts the basic gripper components and pushes them into different exchange stations to pick up grippers of different product types needed for the next transfer. In one embodiment, the exchange station may also include a fixed mounted barcode scanner that reads the DUT barcode label when the DUT is stable inside the gripper. In addition, the robot can scan the DUT as it passes over the barcode reader. In other words, when the device is being held at this station, the barcode scanner can read the device's serial number while it is stationary, or it can determine the device's serial number by having the robot scan a device that passes through the barcode scanner without stopping. Can read In one embodiment, the DUT already has a serial number stored internally in RAM memory, so the serial number can be read electronically (as opposed to using a barcode reader).

In one embodiment, the stationary exchange station has a number of devices for interfacing with end effectors, which are mainly used to transfer the DUT from a vacuum cup to a parallel gripper and vice versa. In addition, the stationary exchange station handles both removal of one type of product gripper and attachment of the other type of product gripper within seconds of robot motion.

7 shows an SSD DUT on a typical flat plastic tray used in a customer production facility. The tray shown in FIG. 7 can be soft, easily bendable and bendable. This keeps the DUT in a flat orientation. The robot of the present invention can advantageously be programmed to recognize the flat orientation of the DUT, and the end effector can use a vacuum cup to pick up the DUT from the tray at a location that minimizes the risk of damage to the DUT.

8 shows an SSD DUT placed on a production site tote. It consists of an antistatic cardboard carton or rigid plastic. This will be split to arrange the DUT with the connector facing down, so that the robot gripper can access the end of the drive where contact is allowed at the corner.

Accordingly, the end effector illustrated in FIG. 6 can perform various functions. For example, the end effector can pick up a flat DUT from the tray or put the same DUT flat on the outgoing tray (as shown in Figure 7). In addition, the end effector can use a parallel gripper to capture the device standing perpendicular to the tote slot (as shown in Figure 8). Additionally, the end effector can use a parallel gripper to push the DUT into the primitive slot position or grab and extract the DUT from the primitive. After picking up the DUT using a vacuum cup, for example, the end effector can place the DUT into a parallel gripper at the exchange station. While in the gripper at the exchange station, the barcode serial number can be read by a fixed barcode scanner at the exchange station.

9A shows a 6-axis human body model industrial robot mounted on a height-adjustable Z-axis rectangular base according to an embodiment of the present invention. In order to place the robot in the correct orientation relative to the articles in the work cell, the robot 901 will actually be mounted on a rectangular pedestal, a height-adjustable Z-axis motion device 902. Motion device 902 consists of a precision scissors lift with its high torque stepper motor and associated electronics. The Caesars lift can carry the entire robot upwards to access a higher optional rack height. The six-axis robot 901 has a long reach, and since it can be mounted on a height-adjustable Z-axis rectangular pedestal 902, advantageously the robot is at a height that a typical human worker cannot reach. Can be accessed.

9B shows a scissor lift module of a Z-axis rectangular pedestal height-adjustable in a fully extended configuration in accordance with an embodiment of the present invention. The Caesars lift can be heavy and is therefore constructed with its own steel weldment structure. Caesars lift modules have their own built-in electronics, which primarily require power and Ethernet connectivity. Caesars Lift works as its own independent module. It simply transports the robot up and down to the designated location commanded by the system controller via local Ethernet. Caesars' active operation is due to the high-torque stepper motor driving a thick tight-pitch linear screw that can handle the extremes in the required weight shift at the bottom of the motion. Both the top and bottom use linear slides to accommodate the necessary motion for Caesar's operation. There is a clutch and brake built into the stepper motor assembly to stop any downward creep or any motion during power loss, especially when an emergency power off situation is required. There is an optical laser transducer that measures the height of the Caesars platform relative to the base to ensure that the required motion has been achieved. The electronics for the lift consist of a fanless Windows-based embedded PC and a stepper motor indexer.

10A to 10E illustrate how a Cartesian robot retrieves a DUT from a tray and inserts the DUT into a slot of a primitive under computer control according to one embodiment of the present invention. 10A shows a Cartesian robot moving in the x, y and z planes to access a DUT arranged in a vertical orientation in a production site tote. The robot will typically be programmed to have intelligence to determine the location of the tote and the orientation of the DUT placed therein. In one embodiment, the position of the tote (eg, x, y and z coordinates) can be programmed into the tester. As noted above, the DUT will be positioned with the connector facing down, so the robot gripper can access the end of the driver where contact is allowed at the corner.

10B shows an end effector accessing two DUTs simultaneously using two parallel grippers. The robot can move up and down (in the z direction) to access the tray and pick up two DUTs at a time. In one embodiment, each gripper is loaded at a separate time. In other embodiments, both grippers can be loaded simultaneously. 10C shows a Cartesian robot rotating around pivot point 1002 to allow the robot arm to move in the x-y plane to insert the DUT into the primitive slot. Finally, FIGS. 10D and 10E show another view of the end effector inserting two DUTs into an open slot in a primitive.

11 illustrates a method in which a work cell is controlled from a PC controller according to an embodiment of the present invention. In one embodiment, the system controller 1102, which may be a standard PC, may be configured to manage and execute all operations within the entire work cell. In one embodiment, a dedicated monitor 1104 in each cell can be used to interact with the system controller 1102. In one embodiment, the touch screen monitor 1104 is used to observe and control the direct operation of automation, and is useful for debugging or further programming for continuous improvement.

The system controller determines where all the DUTs are currently, prioritizes and optimizes pick and place status, and then sends these instruction commands to the robot controller 1106 that controls the robot and gripper 1108. After the robot controller executes the motion and the sensor confirms that the motion has been completed successfully, it sends the newly updated location and status information over the network to the SQL database.

In one embodiment, the SQL database is configured to receive SQL commands and queries from the robot controller or primitive. It is formatted as a series of tables representing each of the primitive, rack and all tester socket locations. The information is filled with its current state or presence of the DUT, appropriate serial number and test result information, and any other information that can be used to determine the current state of the plant site. The SQL database at that moment provides a main interface for primitives to understand what the robot is accomplishing and the state of every DUT in the factory floor. Robotic test cell automation stores data in this database about the current state in the robotic test cell, and reads the information placed there by primitives during operation. This enables completely asynchronous and independent communication between all items on the factory floor.

As shown in FIG. 11, in one embodiment, the system controller includes a recipe file 1120 including all parameters and configuration values necessary to operate the work cell with the required performance. The system controller also includes an archive log file 1122 that contains a record of all operations in the work cell. In addition, the log file contains all serial number interactions with the DUT and all interactions with the SQL database.

12 illustrates overall hardware and software required for operation of a work cell according to an embodiment of the present invention. System controller 1102 and monitor 1104 can be used to interact with primitives in a rack. The monitor and system controller can be directly connected to the rack electronics for local control and debugging. The monitor can include an interface 1124 that allows the user to interact directly with the primitives in the rack.

Additionally, the monitor 1104 can include an interface 1226 to an automated package with the robot controller 1106. In addition, the monitor can provide control and debugging capabilities. Additionally, the monitor may include an HTML web interface 1228 for system control and configuration, monitoring, maintenance and debugging. This interface will typically be used at the production site and inside the factory, and operations can be performed through the intranet 1236.

The monitor is an HTML web interface 1230 for system control and configuration, monitoring, maintenance, and debugging that can be used outside the facility where a user can log in from a remote location to perform operations on the work cell via the Internet 1236. It may include. Additionally, the monitor may include an HTML web interface 1232 for monitoring the system running on the mobile device.

The SQL database 1234 discussed above is installed by the customer and can be used to maintain an internal security protocol at the customer's test site.

13 shows a flow chart of an exemplary computer-implemented process for executing a test on a DUT in a work cell in accordance with one embodiment of the present invention. However, the invention is not limited to the description provided by flowchart 1300. Rather, it will be apparent to those skilled in the relevant art that other functional flows are within the scope and spirit of the present invention from the teachings provided herein. Flowchart 1300 will continue to be described with reference to the exemplary embodiment described above, but the method is not limited to this embodiment.

In step 1302, the automated test system finds the input DUT and records the existence of the new DUT in the SQL database. In one embodiment, the serial number for the DUT can be scanned at the exchange station.

In step 1304, the robot prepares to load the DUT into the test rack. The automated test system queries the SQL database to determine if an empty slot is available inside the primitive. In addition, the automated system ensures that the configuration is correct, the tester is correct for the particular product being tested, and the selected slot is online and available.

In step 1306, the robot loads the DUT into the selected slot. In addition, the test system makes available the DUT table location information in the SQL database and its status to enable the tester to start the test process.

In step 1308, the primitive in the rack continuously polls the SQL DUT table to determine if the socket is full. When the socket is full, the tester sets the state in the SQL database to "testing" and starts a normal test cycle.

In step 1310, the tester updates the status of the DUT in the SQL database to pass / fail and other information, such as a sort category, upon completion of the test cycle.

In step 1312, the automated test system polls the SQL database to receive test results for the DUT. When the tester receives the response, it can remove the DUT from the primitive and place it in a specific output bin based on the received information, e.g., information about the sorted category,

The foregoing description has been described with reference to specific embodiments for purposes of explanation. However, the above-described exemplary discussion is not intended to be exhaustive or to limit the invention to the precise form disclosed. Many modifications and variations are possible in terms of the teachings described above. The embodiments have been selected and described to best illustrate the principles of the invention, thereby enabling other skilled artisans to best utilize the various embodiments with various modifications to suit the invention and the particular application contemplated. .

Claims (27)

A method for performing a test using automated test equipment (ATE),
Finding and holding a device under test (DUT) to be tested;
Recording the existence of the DUT in a database;
Querying the database to determine if an empty slot exists in a primitive, the primitive being a modular device comprising a plurality of slots for testing a plurality of DUTs;
Using a robot to automatically position and insert the DUT into the empty slot;
Reporting to the database that the empty slot is filled; And
Initiating a test for the DUT
Containing,
How to perform a test using ATE. According to claim 1,
The DUT is a solid state drive (SSD),
How to perform a test using ATE. According to claim 1,
The primitive is one of a plurality of primitives in a test rack, and the robot is operable to access slots in the plurality of primitives in the test rack,
How to perform a test using ATE. According to claim 1,
Further comprising updating the status of the DUT in the database based on the results of the test,
How to perform a test using ATE. According to claim 4,
Using the robot to automatically retrieve the DUT from the primitive and return the DUT to a tray,
How to perform a test using ATE. According to claim 1,
The robot is a six-axis robot,
How to perform a test using ATE. According to claim 1,
The robot is a Cartesian robot,
How to perform a test using ATE. According to claim 1,
The robot includes an end effector operable to hold and transport the DUT in and out of a test slot in the primitive,
How to perform a test using ATE. The method of claim 8,
The robot further comprises a camera operable to enable accurate pickup and placement of the DUT,
How to perform a test using ATE. The method of claim 9,
The robot further comprises a laser transducer operable to measure the depth of movement of the end effector,
How to perform a test using ATE. In a system for performing tests using automated test equipment (ATE),
A robot comprising an end effector operable to automatically pick up and transfer the DUT into and out of a test slot in a primitive;
A system controller including a processor and a memory for controlling the robot; And
Test rack containing multiple primitives
Including,
Each primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and the robot is configured to automatically access slots in the plurality of primitives within the test rack using the end effector,
A system that performs tests using ATE. The method of claim 11,
The robot further comprises a camera operable to enable accurate pickup and placement of the DUT,
A system that performs tests using ATE. The method of claim 12,
The robot further comprises a laser transducer operable to measure the depth of movement of the end effector,
A system that performs tests using ATE. The method of claim 11,
The robot is a six-axis robot,
A system that performs tests using ATE. The method of claim 11,
The robot is a Cartesian robot,
A system that performs tests using ATE. The method of claim 11,
Further comprising a monitor connected to the system controller, the monitor is used to observe and control the operation of the robot and to debug the problem of the robot,
A system that performs tests using ATE. The method of claim 11,
It further comprises an exchange station comprising a plurality of end effectors, the robot being automatically recognized the form factor of the DUT and programmed to exchange end effectors at the exchange station according to the form factor of the DUT. Operational,
A system that performs tests using ATE. In a system for performing tests using automated test equipment (ATE),
A robot comprising an end effector operable to automatically grab and pick up and transfer the DUT into and out of a test slot in a primitive;
An input / output module including a plurality of trays and operable to provide a DUT from the plurality of trays to the robot during a test;
A system controller including a processor and a memory for controlling the robot; And
Test rack containing multiple primitives
Including,
Each primitive is a modular device comprising a plurality of slots for testing a plurality of DUTs, and the robot is configured to automatically access slots within the plurality of primitives within the test rack,
A system that performs tests using ATE. The method of claim 18,
The robot is operable to automatically access the DUT directly from a tray in the input / output module before inserting the DUT into a slot in a designated primitive,
A system that performs tests using ATE. The method of claim 19,
The robot is operable to be programmed to retrieve the DUT after the test is run from the slot and return it to the tray in the input / output module.
A system that performs tests using ATE. The method of claim 18,
The robot further comprises a camera operable to enable accurate pickup and placement of the DUT,
A system that performs tests using ATE. The method of claim 21,
The robot further comprises a laser transducer operable to measure the depth of movement of the end effector,
A system that performs tests using ATE. The method of claim 22,
The robot further comprises a vacuum cup operable to pick up the DUT lying flat from the tray or to lay the DUT flat with an outgoing tray,
A system that performs tests using ATE. The method of claim 18,
The robot is a six-axis robot,
A system that performs tests using ATE. The method of claim 18,
The robot is a Cartesian robot,
A system that performs tests using ATE. The method of claim 18,
A plurality of structural welds are operable to maintain the test rack in a static position alignment in a workcell,
A system that performs tests using ATE. The method of claim 26,
The plurality of structural weldments secure the robot and the input / output module to the test rack,
A system that performs tests using ATE.

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