KR102510104B1 - 피크에 대한 각도를 통한 제품의 품질 검사방법 - Google Patents

피크에 대한 각도를 통한 제품의 품질 검사방법 Download PDF

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Publication number
KR102510104B1
KR102510104B1 KR1020210117544A KR20210117544A KR102510104B1 KR 102510104 B1 KR102510104 B1 KR 102510104B1 KR 1020210117544 A KR1020210117544 A KR 1020210117544A KR 20210117544 A KR20210117544 A KR 20210117544A KR 102510104 B1 KR102510104 B1 KR 102510104B1
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KR
South Korea
Prior art keywords
connection line
angle
peak
line
product
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Application number
KR1020210117544A
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English (en)
Korean (ko)
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KR20230034600A (ko
Inventor
이영규
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(주)아이티공간
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Application filed by (주)아이티공간 filed Critical (주)아이티공간
Priority to KR1020210117544A priority Critical patent/KR102510104B1/ko
Priority to PCT/KR2022/013121 priority patent/WO2023033569A1/fr
Publication of KR20230034600A publication Critical patent/KR20230034600A/ko
Application granted granted Critical
Publication of KR102510104B1 publication Critical patent/KR102510104B1/ko

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0262—Confirmation of fault detection, e.g. extra checks to confirm that a failure has indeed occurred
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Programme-control systems
    • G05B19/02—Programme-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/41875—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by quality surveillance of production
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0232—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on qualitative trend analysis, e.g. system evolution
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0283—Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
  • General Factory Administration (AREA)
KR1020210117544A 2021-09-03 2021-09-03 피크에 대한 각도를 통한 제품의 품질 검사방법 KR102510104B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020210117544A KR102510104B1 (ko) 2021-09-03 2021-09-03 피크에 대한 각도를 통한 제품의 품질 검사방법
PCT/KR2022/013121 WO2023033569A1 (fr) 2021-09-03 2022-09-01 Procédé pour tester la qualité d'un produit en utilisant l'angle d'un pic

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020210117544A KR102510104B1 (ko) 2021-09-03 2021-09-03 피크에 대한 각도를 통한 제품의 품질 검사방법

Publications (2)

Publication Number Publication Date
KR20230034600A KR20230034600A (ko) 2023-03-10
KR102510104B1 true KR102510104B1 (ko) 2023-03-14

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Application Number Title Priority Date Filing Date
KR1020210117544A KR102510104B1 (ko) 2021-09-03 2021-09-03 피크에 대한 각도를 통한 제품의 품질 검사방법

Country Status (2)

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KR (1) KR102510104B1 (fr)
WO (1) WO2023033569A1 (fr)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017150049A1 (fr) * 2016-02-29 2017-09-08 三菱重工業株式会社 Procédé de diagnostic de dégradation de performance d'élément de machine, et système associé

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101043146B1 (ko) * 2007-12-20 2011-06-20 두산디에스티주식회사 구동전류 측정을 이용한 기어박스 불량위치 판별 장치 및방법
KR102316472B1 (ko) * 2019-06-25 2021-10-22 (주)아이티공간 제어 출력신호를 통한 기기의 건전성 지수 검출방법
KR102316520B1 (ko) * 2019-10-15 2021-10-22 (주)아이티공간 분포도를 통한 기기의 건전성 지수 검출방법
KR102344464B1 (ko) * 2019-12-05 2021-12-29 (주)아이티공간 인공지능을 통한 기기의 이상 부위 학습 검출방법

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017150049A1 (fr) * 2016-02-29 2017-09-08 三菱重工業株式会社 Procédé de diagnostic de dégradation de performance d'élément de machine, et système associé

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Publication number Publication date
KR20230034600A (ko) 2023-03-10
WO2023033569A1 (fr) 2023-03-09

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