KR102439150B1 - Method for detecting defect pixel of organic light emitting display and organic light emitting display using the same - Google Patents

Abstract

The present invention relates to a method for detecting bad pixels in an organic light emitting display device and an organic light emitting display device using the same. It has been proposed to solve the problem of the prior art that there was no choice but to sense whether the
Accordingly, according to the present invention, by setting two or more blocks having a plurality of adjacent gate lines as one block and applying a scan signal in block units, it is possible to quickly detect defective TFTs through sensing in units of blocks. It can provide advantages such as

Description

Method for detecting bad pixels of an organic light emitting display device and an organic light emitting display device using the same

The present invention relates to a method for detecting a bad pixel of an organic light emitting display device and an organic light emitting display device using the same, and more particularly, to a method for quickly detecting a bad pixel generated due to a malfunction of a sensing TFT, etc. The present invention relates to a method for detecting a bad pixel, and to an organic light emitting diode display configured using the same.

The active mattress type organic light emitting display device includes an organic light emitting diode (hereinafter referred to as 'OLED') that emits light by itself, and has advantages of fast response speed, luminous efficiency, luminance and viewing angle.

OLED, which is a self-luminous device, includes an anode electrode and a cathode electrode, and an organic compound layer (HIL, HTL, EML, ETL, EIL) formed therebetween. The organic compound layer includes a hole injection layer (HIL), a hole transport layer (HTL), an emission layer (EML), an electron transport layer (ETL) and an electron injection layer (Electron Injection Layer); EIL). When a driving voltage is applied to the anode electrode and the cathode electrode, holes passing through the hole transport layer (HTL) and electrons passing through the electron transport layer (ETL) are moved to the light emitting layer (EML) to form excitons, and as a result, the light emitting layer (EML) is It emits visible light.

The organic light emitting display device arranges pixels each including OLEDs in a matrix form, and adjusts the luminance of the pixels according to the gray level of video data. Each of the pixels includes a driving TFT (Thin Film Transistor) that controls the driving current flowing through the OLED according to the voltage (Vgs) applied between its gate electrode and the source electrode, and is displayed as the amount of light emitted by the OLED proportional to the driving current Adjust the gradation (luminance).

Various sensing technologies or compensation technologies are being developed to improve the image quality of OLEDs.

For example, in general, an OLED has a deterioration characteristic in which the operating point voltage (threshold voltage) of the OLED increases and the luminous efficiency decreases as the emission time elapses. Since the accumulated current applied to the OLED of each pixel is proportional to the accumulated grayscale implemented in the corresponding pixel, the degree of degradation of the OLED may vary for each pixel.

The OLED deterioration deviation between these pixels causes a luminance deviation, and if this is intensified, an image sticking phenomenon may occur.

In order to compensate for OLED degradation, various compensation schemes have been proposed in which OLED degradation is sensed and video data is modulated in an external circuit based on the sensed value. In this external compensation method, the data driving circuit directly receives a sensing voltage from each pixel through a sensing line, converts the sensing voltage into a digital sensing value, and transmits it to the timing controller.

The timing controller compensates for the deterioration deviation of the OLED by modulating the digital video data based on the digital sensed value.

As described above, since the external compensation method applied to the OLED TV supports sensing for each pixel, it is possible to detect an abnormal pixel that causes a point defect or a line defect.

That is, if the sensed pixel value is lower than the average value, it is determined as a dark spot and the compensation data can be increased. On the contrary, when the detected pixel value is higher than the average value, the compensation value is lowered to improve the uniformity of image quality.

However, the detection method for this determination is different from the method of sensing and determining the TFT characteristic or the OLED characteristic described above. In other words, it is necessary to apply the sensing method to extract the characteristics of TFT or OLED before shipment of the product, and then separately apply the sensing method to detect pixel abnormalities. In this case, additional work time (Tact Time) is required.

That is, the external compensation method of OLED can be largely divided into Power On compensation, Driving RT compensation, Power Off compensation, and the like. However, in the case of real-time driving compensation, since an image is being displayed, it is difficult to detect a bad pixel. If it is performed at power-on, the loading time increases, and when the power is off, the off-time increases. There is a problem that occurs.

In other words, in order to detect defective pixels caused by defects in the sensing TFT, scan signals are sequentially input to all gate lines to sense defects one by one. In addition, there is a problem in that it is difficult to perform normal defect detection after product shipment.

SUMMARY OF THE INVENTION An object of the present invention is to provide a method for detecting a bad pixel for quickly detecting a bad pixel generated due to a malfunction of a sensing TFT.

That is, the present invention relates to the defect detection process of the sensing TFT, which was difficult to apply to shipped products due to problems such as the time required because scan signals were sequentially input to all gate lines to sense the defects one by one. , a method of supporting rapid detection of bad pixels by configuring two or more blocks with a plurality of adjacent gate lines and performing sensing in units of corresponding blocks.

Another object of the present invention is to provide an organic light emitting display device to which the above-described bad pixel detection method is applied.

The present invention relates to a method for detecting a bad pixel in an organic light emitting display device and an organic light emitting display device using the same. was proposed to do.

In other words, according to the present invention, in order to detect defective pixels caused by defects in the conventional sensing TFT, scan signals are sequentially input to all gate lines to sense the defects one by one. This is to solve problems such as difficulty in performing normal defect detection after product shipment.

Accordingly, according to the present invention, by setting two or more blocks using a plurality of adjacent gate lines as one block and applying a scan signal to each block to detect the bad pixels, it is possible to quickly detect the bad pixels. It can provide advantages such as allowing

For this reason, in the case of an organic light emitting diode display to which the present invention is applied, it is possible to quickly inspect defective pixels before shipment of the product, and to support continuous image quality improvement by applying a power-on compensation method after shipment of the product. Various advantages such as

The present invention has an advantage in that a plurality of adjacent gate lines are set as blocks to detect defects in the sensing TFTs provided in each pixel, and the defective TFTs can be quickly detected through sensing in units of blocks.

Accordingly, there are effects such as being able to dramatically reduce the tact time required for detecting defects in the sensing TFT.

In addition, since the work time for detecting defects in the sensing TFT can be greatly reduced, there is an advantage that a sensing TFT defect detection process can be added to the automatic correction function applied to shipped products.

That is, according to the present invention, it is possible to provide an organic light emitting display device having a function of quickly detecting a sensing TFT malfunctioning due to a defect, etc. can provide various effects such as being able to support continuous image quality improvement by applying a power-on compensation method.

1 is a circuit diagram illustrating a pixel structure of an organic light emitting diode display.
2 is an explanatory diagram illustrating a method for detecting a bad pixel of an organic light emitting diode display according to the related art.
3 is a conceptual diagram illustrating a method for detecting a bad pixel of an organic light emitting diode display according to an exemplary embodiment of the present invention.
4 is a driving timing diagram illustrating a method of detecting a bad pixel of an organic light emitting diode display according to an exemplary embodiment.
5 is a flowchart illustrating a method of detecting a bad pixel of an organic light emitting diode display according to an exemplary embodiment.
6 is an explanatory diagram illustrating an organic light emitting display device to which the bad pixel detection method of FIGS. 4 and 5 is applied.

The above-described objects, features and advantages will be described below in detail with reference to the accompanying drawings, and accordingly, those skilled in the art to which the present invention pertains will be able to easily implement the technical idea of the present invention. In describing the present invention, if it is determined that a detailed description of a known technology related to the present invention may unnecessarily obscure the gist of the present invention, the detailed description will be omitted. Hereinafter, preferred embodiments according to the present invention will be described in detail with reference to the accompanying drawings. In the drawings, the same reference numerals are used to indicate the same or similar components.

1 is a circuit diagram for explaining a pixel structure of an organic light emitting diode display, and illustrates the structure of one pixel of an organic light emitting diode display having an external compensation structure.

Referring to FIG. 1 , it can be seen that one pixel includes an organic light emitting diode (OLED), a driving TFT (DT), a storage capacitor (Cst), a first switch TFT (ST1), and a second switch TFT (ST2). have.

The OLED includes an anode electrode connected to the second node N2, a cathode electrode connected to the input terminal of the low potential driving voltage EVSS, and an organic compound layer positioned between the anode electrode and the cathode electrode. A parasitic capacitor may be generated in the OLED by the anode electrode, the cathode electrode, and a plurality of insulating layers present therebetween.

The driving TFT DT controls the amount of current input to the OLED according to the gate-source voltage Vgs. The driving TFT DT includes a gate electrode connected to the first node N1 , a drain electrode connected to the input terminal of the high potential driving voltage EVDD, and a source electrode connected to the second node N2 .

The storage capacitor Cst is connected between the first node N1 and the second node N2 .

The first switch TFT ST1 applies the data voltage Vdata on the data line to the first node N1 in response to the scan control signal SCAN transmitted through the gate line. The first switch TFT ST1 includes a gate electrode connected to the gate line, a drain electrode connected to the data line, and a source electrode connected to the first node N1 .

The second switch TFT ST2 switches the current flow between the second node N2 and the sensing line in response to the sensing control signal SENSE, and will be described as a second switch TFT or sensing TFT in the present invention.

The second switch TFT ST2 also includes a gate electrode connected to a gate line, a drain electrode connected to a sensing line, and a source electrode connected to the second node N2 .

At this time, FIG. 1 discloses a configuration in which the scan control signal SCAN and the sensing control signal SENSE are respectively supplied to the first switch TFT ST1 and the second switch TFT ST2 using a single gate line, It goes without saying that a configuration in which the scan control signal SCAN and the sensing control signal SENSE are supplied to each of the switch TFTs ST1 and ST2 through separate signal lines spaced apart from each other may also be provided.

Hereinafter, in describing a method for detecting a bad pixel of an organic light emitting diode display according to the prior art and an embodiment of the present invention, reference will be made to the pixel structure of FIG. 1 .

2 is an explanatory diagram illustrating a method for detecting a bad pixel of an organic light emitting diode display according to the related art.

Referring to FIG. 2 , in the method of detecting a bad pixel of an organic light emitting diode display according to the related art, a scan signal is sequentially supplied through a plurality (n) gate lines provided in a panel P, and a pulse of the scan signal is supplied. It can be confirmed that this is done through the process of supplying a data signal to correspond to .

That is, by performing sensing on each gate line during a sensing period (SP) formed between a scan signal supply time of one gate line and a scan signal supply time of the next gate line, Enables detection of abnormal operation.

Therefore, in the case of a UHD panel having a structure of data lines 3840 × gate lines 2160, a process of detecting bad pixels by supplying scan signals along 2160 gate lines is required. In other words, in order to detect abnormal pixels due to defects in the sensing TFT through the conventional method, it is necessary to supply 2160 scan signals, which physically requires a lot of time. It leads to the problem that it is difficult to apply the sensing algorithm.

A bad pixel detected through this process may be detected in the form of a point defect (PD) as shown in FIG. 2 .

3 is a conceptual diagram illustrating a method for detecting a bad pixel of an organic light emitting diode display according to an exemplary embodiment of the present invention.

Referring to FIG. 3 , in the method of detecting a bad pixel of an organic light emitting diode display according to an embodiment of the present invention, the panel P is divided into two or more blocks including a plurality of adjacent gate lines, and then each block is It may have a configuration to supply the same scan signal as .

For example, as in the example of FIG. 3 , one panel P is set as four blocks A, B, C, and D based on the gate line, and then the same scan signal is supplied to each block, so that the corresponding scan During the sensing period SP between the signal and the next scan signal, the abnormal signal sensing within the entire block may be performed.

In this process, if an abnormality is detected in any one block (block B in the case of FIG. 3 ), then a scan signal for each sub-block is supplied again to only the corresponding block to reduce the target block, and to target the selected sub-block again. Through repetition of the process of supplying the scan signal for each sub-block, it may be possible to limit the scan signal for each line to a range that can be supplied. Thereafter, a pixel in which an abnormality has occurred is specified by supplying a scan signal for each line.

In detail, when four blocks are configured to be configurable as shown in the drawing, a timing controller or a separate processor configures four equal blocks for all gate lines based on the number of gate lines. Thereafter, if an abnormality is detected in any one of the four blocks, the process of composing the corresponding block into four equal blocks based on the number of gate lines is repeated. In this way, the process of repeatedly setting the sub-blocks will be referred to as a step-by-step sub-block repeat setting process.

Through such a step-by-step sub-block setting process, if an abnormality is detected in the corresponding sub-block when the number of gate lines included in a sub-block is 3 or less, the timing controller or a separate processor performs an additional sub-block Blocks cannot be constructed. This is because it is no longer possible to set two or more blocks including a plurality of gate lines.

Accordingly, in this case, it is possible to directly detect the gate line in which the abnormality has occurred through individual sensing for each gate line. For reference, in the case of FIG. 3, an example of directly performing line sensing without additional block configuration for the last four gate lines is shown. It may be desirable to be adjustable.

That is, when the same scan signal is supplied in units of blocks and whether an abnormality occurs through a sensing line is checked, defects can be detected in all pixels sharing the sensing line, and thus, as shown in FIG. An abnormality may be detected in the form of a line defect (LD). However, even in this case, as shown in the drawing, the result of detecting an abnormality by supplying a scan signal for each line at the end can be displayed in the form of a point defect (PD).

When bad pixels are detected for the UHD panel through the configuration as shown in FIG. 3, 2160 gate lines are continuously set to 4 blocks, and line detection is performed through 4 gate lines at the end. If there is one sensing TFT defective, the defective pixel may be detected only by supplying a scan signal approximately 10 times (6(log ₄ 2160 − 6) + 4).

4 is a driving timing diagram illustrating a method of detecting a bad pixel of an organic light emitting diode display according to an exemplary embodiment.

Referring to FIG. 4 , a configuration in which a plurality of (n) scan lines is set as a block of a predetermined unit and a scan signal is simultaneously supplied to the same block can be confirmed. In other words, it can be confirmed that the same scan signal is simultaneously applied to unit blocks such as block L, block M, and block N.

After the scan signal is applied to one block, until the scan signal is supplied to the next block, for example, the scan signal is supplied to the block L and the scan signal is supplied to the next block M It corresponds to the sensing period (SP) of block L.

While the scan signal is being supplied, the data signal is supplied to the corresponding block. In this case, it may be preferable that the maximum value (Max) of the data signal is supplied.

In addition, the number of scan lines constituting each block may be preferably set in consideration of the maximum voltage value that can be supplied through the gate supply unit. That is, even if a scan signal is supplied through several gate lines at once, the block may be set so that the scan signal is simultaneously supplied to as many gate lines as possible within a range in which there is no abnormality in driving. However, the present invention is not necessarily limited thereto, and the size of each block may be configured to be variably set by reflecting various situations and conditions. That is, it may be desirable to adjust such a setting through an optional function related to the above-described block setting configuration.

Therefore, it is preferable that the setting of the block for the panel is suitable for each case in consideration of the configuration conditions of the panel and the like.

With reference to the following drawings, a method of detecting a bad pixel of an organic light emitting diode display according to an exemplary embodiment of the present invention described so far will be described in more detail.

5 is a flowchart illustrating a method of detecting a bad pixel of an organic light emitting diode display according to an exemplary embodiment.

Referring to FIG. 5 , the method for detecting a bad pixel of an organic light emitting diode display according to an embodiment of the present invention includes the steps of setting a block ( S510 ), searching for a block ( S520 ), and checking whether or not a defect is detected. (S530) and the storage step (S590), it can be confirmed that the configuration is included.

The block setting step S510 refers to a process of setting two or more blocks using a plurality of adjacent gate lines as one block. It has been described above that the block can be set in consideration of the output voltage of the gate driver.

The block search step S520 is a process for checking whether the sensing TFT is defective or the like by simultaneously applying the same scan signal for each block to each block set through the block setting step S510 .

When a defect is detected (S530) through the block search step (S520), it is recorded (S535) and it is checked whether the next block exists (S540). That is, if the next block exists (S540), the next block is searched (S545), but when the corresponding block is the last block, the block search is not performed any more, and whether a defect detection record exists It is confirmed (S550).

In other words, if no defects are detected even after the searches (S520 and S545) are completed up to the last block, the process of detecting bad pixels is ended after the corresponding contents are saved (S590). If the defect detection record exists (S550), it is checked whether a sub-block for the block in which the defect is detected exists (S560).

Accordingly, when the block in which the defect is detected includes the sub-block, a search (S565) is performed again for each sub-block, and in this process, the block in which the defect is detected (S530) is recorded (S535) and Search continues until the last block.

Through the above process, when all searches up to the last block that no longer contain sub-blocks are completed (S560), that is, the process of repeatedly setting sub-blocks step by step and performing defect detection for each sub-block When all is completed ( S560 ), a pixel in which a defect is generated may be finally detected ( S580 ) by performing a line search for gate lines constituting the last sub-block in which the defect is detected ( S570 ). That is, in a situation in which additional block setting is no longer possible using the gate line in the sub-block in which the defect is detected (for example, when there are only three or less gate lines in the sub-block), the line search (S570) is performed. The defective pixel may be finally detected ( S580 ).

When the detection of the defect ( S580 ) is completed in this way, the contents are stored and the bad pixel detection process is ended. When the storage of the defect detection information ( S590 ) is completed, the defect information of the corresponding pixel may be continuously managed through the memory of the timing controller or the like.

Accordingly, in the subsequent bad pixel detection process, when a defect with respect to the stored pixel is detected again through the storage step S590, the next step is continuously performed without executing a new writing step S535, etc. This may be possible.

Here, in the case of a block including defects searched for through the block search ( S520 , S545 , and S565 ), the detection is performed in the form of a line defect (LD), and the final defect pixel searched for through the line search (S570) is In this case, it has been described above that the detection is performed in the form of a point defect (PD).

And, when the detection of the bad pixel is performed through the above process, assuming that a 4-block search is performed for a UHD panel having 2160 scan lines, only about 10 scan signals are supplied. It has been confirmed that accurate defect detection is possible.

6 is an explanatory diagram illustrating an organic light emitting display device to which the bad pixel detection method of FIGS. 3 to 5 is applied.

Referring to FIG. 6 , an organic light emitting display device according to an embodiment of the present invention includes a display panel 610 , a timing controller 620 , a data driving circuit 630 , a gate driving circuit 640 , and a memory 650 . You can check availability.

A plurality of data lines DL and sensing lines SL and a plurality of gate lines GL cross each other in the display panel 610 , and pixels P are arranged in a matrix form in each crossed area.

Each pixel P is connected to any one of the data lines DL, to any one of the sensing lines SL, and to any one of the gate lines GL.

Each pixel P is electrically connected to the data line DL in response to a gate pulse input through the gate line GL, receives a data voltage from the data line DL, and receives a data voltage through the sensing line SL. Outputs a sensing signal.

Here, the sensing line SL may be independently connected to each of the horizontally adjacent pixels, or may be commonly connected to at least two or more horizontally adjacent pixels. That is, the sensing line SL may be independently connected to every pixel, or the horizontally adjacent R, W, G, and B pixels may be configured to share the same sensing line SL. may be

The pixel P receives a high potential driving voltage EVDD and a low potential driving voltage EVSS from a power supply unit (not shown). It has been previously described with reference to FIG. 1 that each pixel P may include an OLED, a driving TFT DT, first and second switch TFTs ST1 and ST2, and a storage capacitor Cst.

The TFTs constituting the pixel P may be implemented as p-type or n-type. In addition, the semiconductor layer of the TFTs constituting the pixel P may include amorphous silicon or polysilicon or oxide.

Each pixel P may operate differently during normal driving for image implementation and sensing driving for obtaining a sensed value. That is, the sensing driving may be performed for a predetermined time prior to the normal driving or may be performed in vertical blank periods during the normal driving.

The normal driving may be performed by one operation of the data driving circuit 630 and the gate driving circuit 640 under the control of the timing controller 620 . The sensing driving may be performed by different operations of the data driving circuit 630 and the gate driving circuit 640 under the control of the timing controller 620 .

An operation of deriving compensation data for compensation for deviation based on a sensing result according to a sensing driving operation and an operation of modulating digital video data using the compensation data may be performed by the timing controller 620 .

The data driving circuit 630 includes at least one data driver IC (SDIC). The data driver IC may include a plurality of digital-to-analog converters (DAC) connected to each data line (DL) and a plurality of sensing units connected to the sensing lines (SL) through sensing channels.

The DAC of the data driver IC converts the digital video data RGB into a data voltage for image realization according to the data timing control signal DDC applied from the timing controller 620 during normal driving and supplies it to the data lines DL. .

Meanwhile, the DAC of the data driver IC generates a data voltage for sensing according to the data timing control signal DDC applied from the timing controller 620 during sensing driving and supplies it to the data lines DL.

The gate driving circuit 640 generates a gate pulse for image display based on the gate control signal GDC during normal driving, and then sequentially supplies it to the gate lines GL in a row-sequential manner.

The gate driving circuit 640 generates a sensing gate pulse based on the gate control signal GDC during sensing driving, and then sequentially supplies it to the gate lines GL in a row-sequential manner. At this time, in the case of the organic light emitting display device to which the bad pixel detection method according to the embodiment of the present invention is applied, the display panel 610 is divided into two or more blocks set by a plurality of gate lines GL adjacent to each other, and the block sequential method is used. may be configured to supply a sensing gate pulse to the gate lines GL. And, when a situation arises in which block configuration is no longer possible, a defect of a specific pixel may be detected through line sensing.

Accordingly, it is possible to detect defects in all pixels within a significantly shorter time compared to the conventional method in which signals are sequentially supplied to all the gate lines GL. It can be very usefully applied to a process such as detecting a bad pixel caused by .

That is, in the external compensation method of OLED that can be divided into power-on compensation, real-time driving (driving RT) compensation, and power-off compensation, the present invention is particularly applicable to the power-on compensation process, An organic light emitting diode display having a function of detecting a bad pixel due to a sensing TFT may be provided.

However, the present invention is not necessarily limited thereto, and it is natural that the bad pixel detection method of the present invention may be supported through power-off compensation or other compensation methods using various times.

On the other hand, the gate pulse may include the scan control signal SCAN and the sensing control signal SENSE, in this case, the scan control signal SCAN and the sensing control signal SENSE are implemented in the same way, or each individual It has been described above that it can be implemented as a signal.

That is, when the scan control signal SCAN and the sensing control signal SENSE are implemented identically, the scan control signal SCAN and the sensing control signal SENSE are formed as a single signal through the same gate line GL, respectively. It may be applied to the pixel P, and effects such as reducing the number of signal wirings may be provided. On the other hand, when the scan control signal SCAN and the sensing control signal SENSE are implemented differently, the scan control signal and the sensing control signal may be applied to each pixel P through different gate lines.

The timing controller 620 controls the data driving circuit 630 based on timing signals such as the vertical sync signal Vsync, the horizontal sync signal Hsync, the dot clock signal DLCK, and the data enable signal DE. A data control signal DDC for controlling the operation timing and a gate control signal GDC for controlling the operation timing of the gate driving circuit 640 are generated.

The timing controller 620 divides the normal driving and the sensing driving based on a predetermined reference signal (eg, a driving power enable signal, a vertical sync signal, a data enable signal, etc.), A gate control signal GDC is generated.

The timing controller 620 may transmit digital data corresponding to the data voltage for sensing to the data driving circuit 630 during sensing driving. The timing controller 620 detects OLED deterioration of each pixel P, defective driving TFT or malfunctioning sensing TFT, etc. based on the sensing data SD transmitted from the data driving circuit 630 during sensing driving, and responds accordingly. compensation can be performed.

According to the present invention as described above, a plurality of adjacent gate lines are set as a block for defective detection of a sensing TFT provided in each pixel, and a fast detection of a defective TFT is possible through sensing in units of blocks, Accordingly, there are effects such as being able to dramatically reduce the tact time required for detecting defects in the sensing TFT.

Accordingly, since the work time for detecting defects in the sensing TFT can be greatly reduced, it is possible to provide advantages such as being able to add a sensing TFT defect detection process to an automatic correction function applied to shipped products.

For those of ordinary skill in the art to which the present invention pertains, various substitutions, modifications and changes are possible within the scope of the present invention without departing from the technical spirit of the present invention. is not limited by

610: display panel
620: timing controller
630: data driving circuit
640: gate driving circuit
650: memory

Claims (10)

(a) setting two or more blocks using a plurality of adjacent gate lines as one block;
(b) sequentially performing block-by-block defect detection for two or more blocks set through step (a);
With respect to the block in which the defect is detected through step (b), repeatedly setting sub-blocks step by step until configuration of additional sub-blocks is impossible, and performing defect detection for each sub-block ( c); and
organic including; (d) detecting a defective pixel through a line search for each gate line constituting the corresponding block when it is impossible to construct an additional sub-block through step (c); A method for detecting bad pixels in a light emitting display device.
The method of claim 1,
If the defect is not detected as a result of sequentially performing block-by-block defect detection through step (b), the corresponding information is stored, or a bad pixel in which the defect is detected is detected through step (d). case, storing the corresponding information (e);
3. The method of claim 2,
A method for detecting a bad pixel in an organic light emitting diode display device, wherein the pixel corresponding to the detection information on the bad pixel stored in step (e) is excluded from the subsequent bad pixel detection process.
4. The method according to any one of claims 1 to 3,
The defect detected through step (b) or step (c) is a line defect, and the defect detected through step (d) is a point defect. bad pixel detection method.
5. The method of claim 4,
The number of gate lines constituting each block set through step (a) is set in consideration of a maximum voltage value that can be supplied through a gate supply unit.
5. The method of claim 4,
Each process according to steps (a) to (d) is a method of detecting a bad pixel of an organic light emitting diode display, which is performed in a power-on period of the organic light emitting diode display.
a display panel for displaying an image;
a gate circuit unit for supplying a gate signal to the display panel through a gate line, and for supplying a gate signal for detecting defects sequentially in block units to gate line blocks;
a data circuit unit configured to supply a data signal to the display panel through a data line to correspond to the gate signal and the defect detection gate signal; and
and a control circuit unit for supplying a control signal to the gate circuit unit and the data circuit unit, and for setting two or more gate line blocks including a plurality of gate lines adjacent to the gate line as one block.
8. The method of claim 7,
The control circuit unit repeatedly sets sub-blocks step by step until it is impossible to configure additional sub-blocks for the block in which the defect is detected, and performs defect detection for each sub-block,
An organic light emitting diode display that detects a defective pixel through a line search for each gate line constituting a corresponding block when it is impossible to configure an additional sub-block.
9. The method according to claim 7 or 8,
When the control circuit unit sets two or more gate line blocks including a plurality of adjacent gate lines as one block for all gate lines, the number of the gate lines constituting each block may be supplied through the gate supply unit. An organic light emitting display device that is set in consideration of the maximum voltage value.
10. The method of claim 9,
and a memory for storing and managing the detected bad pixel information;
The bad pixel corresponding to the bad pixel information stored and managed through the memory is excluded from the bad pixel detection process later.

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