KR102310054B1 - 이미지 센서에 대한 판독 어레인지먼트, 이미지 센서를 판독하기 위한 이미지 센서 시스템 및 방법 - Google Patents

이미지 센서에 대한 판독 어레인지먼트, 이미지 센서를 판독하기 위한 이미지 센서 시스템 및 방법 Download PDF

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KR102310054B1
KR102310054B1 KR1020197024226A KR20197024226A KR102310054B1 KR 102310054 B1 KR102310054 B1 KR 102310054B1 KR 1020197024226 A KR1020197024226 A KR 1020197024226A KR 20197024226 A KR20197024226 A KR 20197024226A KR 102310054 B1 KR102310054 B1 KR 102310054B1
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image sensor
memory
values
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KR20190107111A (ko
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젠스 되제
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프라운호퍼 게젤샤프트 쭈르 푀르데룽 데어 안겐반텐 포르슝 에. 베.
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    • H04N5/3456—
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/44—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array
    • H04N25/445—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by partially reading an SSIS array by skipping some contiguous pixels within the read portion of the array
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/47—Image sensors with pixel address output; Event-driven image sensors; Selection of pixels to be read out based on image data
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/61—Noise processing, e.g. detecting, correcting, reducing or removing noise the noise originating only from the lens unit, e.g. flare, shading, vignetting or "cos4"
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/75—Circuitry for providing, modifying or processing image signals from the pixel array
    • H04N5/378—

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Image Input (AREA)
  • Facsimile Heads (AREA)
KR1020197024226A 2017-01-18 2018-01-18 이미지 센서에 대한 판독 어레인지먼트, 이미지 센서를 판독하기 위한 이미지 센서 시스템 및 방법 Active KR102310054B1 (ko)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
EP17152077 2017-01-18
EP17152077.8 2017-01-18
EP17152299 2017-01-19
EP17152299.8 2017-01-19
PCT/EP2018/051231 WO2018134317A1 (de) 2017-01-18 2018-01-18 Ausleseanordnung für einen bildsensor, bildsensor-system und verfahren zum auslesen eines bildsensors

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KR20190107111A KR20190107111A (ko) 2019-09-18
KR102310054B1 true KR102310054B1 (ko) 2021-10-08

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US (1) US11115613B2 (https=)
EP (2) EP3571836B1 (https=)
JP (1) JP7113830B2 (https=)
KR (1) KR102310054B1 (https=)
CN (1) CN110431839B (https=)
WO (1) WO2018134317A1 (https=)

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US11514294B2 (en) 2017-02-24 2022-11-29 Untether Ai Corporation System and method for energy-efficient implementation of neural networks
US20230229450A1 (en) * 2018-02-23 2023-07-20 Untether Ai Corporation Computational memory
WO2019175734A1 (en) * 2018-03-14 2019-09-19 Insightness Ag Event-based vision sensor with direct memory control
JP2020030873A (ja) * 2018-08-21 2020-02-27 キオクシア株式会社 メモリシステム
US10638075B1 (en) * 2019-05-17 2020-04-28 Omnivision Technologies, Inc. Counter design with various widths for image sensor
JP7322552B2 (ja) * 2019-07-01 2023-08-08 株式会社リコー 光電変換装置、ラインセンサ、画像読取装置、及び画像形成装置
CN111464764B (zh) * 2020-03-02 2022-10-14 上海集成电路研发中心有限公司 一种基于忆阻器的图像传感器及其进行卷积运算的方法
US11303838B2 (en) * 2020-05-07 2022-04-12 Shenzhen GOODIX Technology Co., Ltd. Using pixel readout reordering to reduce pattern noise in image sensor
JP7583562B2 (ja) * 2020-09-11 2024-11-14 キヤノン株式会社 光電変換装置及び撮像システム
CN115318682A (zh) * 2022-08-01 2022-11-11 泉州市汉威机械制造有限公司 一种次品分类剔除控制方式
CN118839603B (zh) * 2024-07-04 2025-02-28 中国船舶集团有限公司第七一九研究所 一种多次冲击下复合材料结构风险评估方法及装置

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US20160092735A1 (en) 2014-09-30 2016-03-31 Qualcomm Incorporated Scanning window in hardware for low-power object-detection in images
US20160094800A1 (en) 2014-09-30 2016-03-31 Qualcomm Incorporated Feature computation in a sensor element array

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US5909026A (en) * 1996-11-12 1999-06-01 California Institute Of Technology Integrated sensor with frame memory and programmable resolution for light adaptive imaging
JP3846572B2 (ja) * 2001-09-20 2006-11-15 ソニー株式会社 固体撮像装置
GB2438693B (en) * 2005-03-30 2009-07-08 Micron Technology Inc High density row ram for column parallel CMOS image sensors
KR102009165B1 (ko) * 2013-01-24 2019-10-21 삼성전자 주식회사 이미지 센서, 멀티 칩 패키지, 및 전자 장치
US9453730B2 (en) 2013-03-20 2016-09-27 Cognex Corporation Machine vision 3D line scan image acquisition and processing
FR3010603A1 (fr) * 2013-09-10 2015-03-13 Commissariat Energie Atomique Dispositif d'acquisition compressive d'une image
US9386220B2 (en) * 2013-12-06 2016-07-05 Raytheon Company Electro-optical (EO)/infrared (IR) staring focal planes with high rate region of interest processing and event driven forensic look-back capability
US9489750B2 (en) * 2014-06-26 2016-11-08 Qualcomm Incorporated Exposure metering based on background pixels
US9635325B2 (en) * 2015-05-29 2017-04-25 Semiconductor Components Industries, Llc Systems and methods for detecting ultraviolet light using image sensors

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US20160092735A1 (en) 2014-09-30 2016-03-31 Qualcomm Incorporated Scanning window in hardware for low-power object-detection in images
US20160094800A1 (en) 2014-09-30 2016-03-31 Qualcomm Incorporated Feature computation in a sensor element array
JP2017533640A (ja) 2014-09-30 2017-11-09 クアルコム，インコーポレイテッド 画像内の低電力物体検出のためのハードウェアにおけるスキャニングウィンドウ

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JP7113830B2 (ja) 2022-08-05
EP3571836A1 (de) 2019-11-27
US11115613B2 (en) 2021-09-07
US20190342513A1 (en) 2019-11-07
CN110431839B (zh) 2022-07-05
WO2018134317A1 (de) 2018-07-26
EP3571836B1 (de) 2023-09-27
KR20190107111A (ko) 2019-09-18
EP4283983A2 (de) 2023-11-29
JP2020507957A (ja) 2020-03-12
EP4283983A3 (de) 2024-02-21
CN110431839A (zh) 2019-11-08

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