KR102298218B1 - Method for inspecting the quality of imprinting of parts and devices therefore - Google Patents

Abstract

According to various embodiments, disclosed is a quality inspection device for inspecting engraving quality formed in a component according to one aspect. The present invention comprises: a support unit supporting the component to enable one side surface of the component to face a predetermined direction; a lamp unit irradiating light to the component supported by the support unit by at least one incident angle; and a quality inspection unit controlling a light quantity of the lamp unit to obtain an image of the component, and analyzing the obtained image to inspect the quality of the component. Disclosed is the quality inspection device for inspecting the engraving quality formed in the component according to one aspect, wherein the lamp unit comprises a first lamp, a second lamp, a third lamp facing the first lamp, and a fourth lamp facing the second lamp.

Description

Method for inspecting the quality of imprinting of parts and devices therefore}

The present invention relates to a method and apparatus for inspecting the quality of laser engraving on mobile phone parts.

In general, various patterns or symbols are formed on parts to be mounted on various electronic products such as mobile phones, digital cameras, and telephones by laser, etc., and the material of the parts may also be made of various materials such as plastics, metals, ceramics, and the like. Even if a required pattern or engraving is formed on the surface of such a part, a pattern or engraving that is not appropriate to the standard required for the part may be formed, and defects including scratches or dents may occur during production and transportation. have. As such, when a defect in the engraving or pattern of the part occurs, the reliability in the operation of the part or the performance of the part may be greatly reduced. Therefore, an engraving inspection process for inspecting whether defects in the pattern or engraving formed on the part occurs is required, and in general, the appearance inspection can be performed through the naked eye. However, visual inspection not only deteriorates workability, but also may overlook defects due to mistakes.

Furthermore, the inspection of the quality of the laser engraving on the part can be performed using a lighting device and a camera. However, the engraving formed to a minute depth may not be photographed by the photographing apparatus according to the incident angle of the lighting apparatus. In particular, the conventional engraving quality inspection apparatus may not be able to photograph some of the patterns of the engraving of the parts depending on the position and direction of the parts according to the incident angle of limited illumination. In addition, in the conventional imprinting quality inspection apparatus, even if the light amount and the incident angle of the lighting device are adjusted, the pattern or shape of the imprint is not exposed to the photographing device or is faintly exposed depending on the depth of the imprinting.

On the other hand, the above-mentioned background art is technical information that the inventor possessed for the derivation of the present invention or acquired in the process of derivation of the present invention, and it cannot be said that it is necessarily a known technique disclosed to the general public before the filing of the present invention. .

The problem to be solved by the present invention is to provide a lighting device in an appropriate position to secure the optimal angle of incidence and light quantity of the light, so that it is possible to clearly photograph the engraving of the part without being affected by the location and direction where the part is placed. To provide an inspection method and an apparatus therefor.

The technical problems to be achieved in the present invention are not limited to the technical problems mentioned above, and other technical problems not mentioned will be clearly understood by those of ordinary skill in the art to which the present invention belongs from the following description. will be able

A quality inspection apparatus for inspecting the quality of an engraving formed on a part according to one side is a support part for supporting the part so that one side of the part faces a predetermined direction, and light on the part supported on the support part at at least one incident angle a lighting unit irradiating the light, and a quality inspection unit configured to obtain an image of the component by controlling the amount of light of the illumination unit, and analyze the obtained image to inspect the quality of the component, wherein the illumination unit includes a first illumination, a second It may include illumination, a third illumination facing the first illumination, and a fourth illumination facing the second illumination.

Alternatively, the quality inspection unit is characterized by independently controlling the amount of light and the incident angle of the first to the fourth illumination.

Alternatively, the quality inspection unit sequentially operates at least one illumination among the first illumination to the fourth illumination to obtain images of the parts, and based on the acquired images, the first illumination to the fourth illumination. It is characterized in that the reference illumination is determined among the illuminations.

Alternatively, the quality inspection unit increases the amount of light of the reference light among the first to fourth lights and decreases the light amount for the remaining lights.

Alternatively, the quality inspection unit is characterized in that by operating only the reference illumination from the first to the fourth illumination to obtain an image of the part.

Alternatively, the quality inspection unit includes a photographing device connected to a camshaft and an LM guide (Linear motion Guide), and a processor for evaluating the quality of the engraving of the part based on the image obtained from the photographing device, wherein the processor includes the and driving the camshaft based on a distance between the photographing device and the component to control a position of the photographing device.

The apparatus for inspecting engraving quality of mobile phone parts according to various embodiments can secure the optimal angle of incidence and amount of light by providing lighting devices at appropriate positions, and accordingly, the parts are not affected by the location and direction in which the parts are placed. By shooting the engraving clearly, it is possible to quickly and efficiently inspect the quality of the engraving.

The effects obtainable in the present invention are not limited to the above-mentioned effects, and other effects not mentioned may be clearly understood by those of ordinary skill in the art to which the present invention belongs from the following description. will be.

BRIEF DESCRIPTION OF THE DRAWINGS The drawings accompanying this specification are intended to provide an understanding of the present invention, and represent various embodiments of the present invention, and together with the description of the specification, serve to explain the principles of the present invention.
1 is a diagram schematically illustrating a part that is engraved by a laser.
2 is a view for explaining a method related to obtaining an image of an engraving formed on a part.
3 is a diagram schematically illustrating a component quality inspection apparatus according to an exemplary embodiment.
4 is a flowchart illustrating a method of inspecting component quality according to an exemplary embodiment.
5 and 6 are diagrams schematically illustrating a part quality inspection device for adjusting a position of the imaging device based on a gaze distance between the part and the imaging device.

Since the present invention can apply various transformations and can have various embodiments, specific embodiments are illustrated in the drawings and described in detail in the detailed description. Effects and features of the present invention, and a method of achieving them, will become apparent with reference to the embodiments described below in detail in conjunction with the drawings. However, the present invention is not limited to the embodiments disclosed below and may be implemented in various forms. In the following embodiments, terms such as first, second, etc. are used for the purpose of distinguishing one component from another, not in a limiting sense. Also, the singular expression includes the plural expression unless the context clearly dictates otherwise. In addition, terms such as include or have means that the features or components described in the specification are present, and do not exclude in advance the possibility that at least one other feature or component will be added. In addition, in the drawings, the size of the components may be exaggerated or reduced for convenience of description. For example, since the size and thickness of each component shown in the drawings are arbitrarily indicated for convenience of description, the present invention is not necessarily limited to the illustrated bar.

1 is a diagram schematically illustrating a part that is engraved by a laser.

Referring to FIG. 1 , parts 120a , 120b , 120c , and 120d on which engraving quality inspection is performed are shown.

The parts 120a, 120b, 120c, and 120d are formed with pre-configured patterns or engravings 123a, 123b, 123c, and 123d of a shape for functional expression. Each of the components 120a, 120b, 120c, and 120d may be a component of a mobile phone made of a material such as metal, plastic, or PCB. Each of the parts 120a, 120b, 120c, and 120d may have various shapes according to specifications of manufacturers of finished products such as mobile phones. Each of the parts 120a, 120b, 120c, and 120d may be engraved with a predetermined pattern or shape on at least one side thereof. For example, each of the components 120a, 120b, 120c, and 120d may be an antenna module capable of receiving an external wireless signal from a mobile phone or the like or transmitting a wired signal to the outside.

The imprints 123a, 123b, 123c, and 123d must be formed on each of the parts 120a, 120b, 120c, and 120d in a pattern or shape corresponding to a predetermined pattern or shape in order to express the above-described pre-configured function. The imprints 123a, 123b, 123c, and 123d are formed by cutting to a predetermined depth by a surface cutting tool such as a laser. The imprints 123a, 123b, 123c, and 123d are regions in which a conductive material may be plated or laminated in a subsequent process. In other words, the engravings 123a, 123b, 123c, and 123d are regions in which at least one surface of the component 120 is cut by a laser or the like for plating or lamination of conductive materials. Here, in the proposed invention, the imprints (123a, 123b, 123c, 123d) may be subject to quality inspection, and the proposed invention is the shape, pattern, or uniformity of the imprints (123a, 123b, 123c, 123d). An image or image related to the etc. may be acquired, and the quality of the imprints 123a, 123b, 123c, 123d may be evaluated or analyzed based on the acquired image or image.

Specifically, the engravings 123a, 123b, 123c, and 123d may be configured in various shapes or patterns depending on the purpose for one side of the part. For example, the engravings 123a, 123b, 123c, and 123d are areas in which the surface of each of the parts 120a, 120b, 120c, and 120d is cut to a predetermined depth using a laser or the like. In particular, as described above, a conductive material may be plated on the regions of the imprints 123a, 123b, 123c, and 123d, and a specific function may be expressed according to the plating. For example, the imprints 123a, 123b, 123c, and 123d may be regions on which a conductive material to form an antenna, such as an antenna panel or an antenna array, is plated.

Accordingly, the quality of each of the parts 120a, 120b, 120c, 120d may be determined according to the quality of the formed imprint. That is, when the quality of each of the engravings 123a, 123b, 123c, and 123d does not satisfy the desired quality, the performance of the part may be greatly reduced. In the end, whether the inscriptions 123a, 123b, 123c, 123d formed on the part have a predetermined pattern, a shape and a pattern corresponding to the shape, and whether the formed pattern or shape is uniformly formed to a desired depth is determined by the part. It may be an essential procedure for quality inspection of

2 (a) is a view illustrating a case in which the photographing device 30 obtains an image of the component 25 by irradiating light with the illumination 1 (21), and FIG. 2 (b) is the photographing apparatus 30 It is a diagram illustrating a case in which an image of the component 25 is obtained by irradiating light with the illumination 2 23 .

2 (a) and 2 (b), the imaging device 30 only when light is incident in a specific direction by the characteristic of the engraving formed on the part 25 or the characteristic of the part 25 It is possible to obtain a clear image for the engraving formed on the . In other words, whether the imprint formed on the part 25 is exposed to a photographing device for photographing the imprint may vary according to the angle of the incident light.

For example, when light is irradiated to the component 25 at the first incident angle by the illumination 1 21 , the imaging device 30 is irradiated to the component 25 at the second incidence angle by the illumination 2 23 . It is possible to obtain an image of the inscription formed on the part 25 with a higher sharpness than the case. Alternatively, the photographing device 30 may acquire an image of the imprint formed on the component 25 only when light is irradiated to the component 25 at the first incident angle by the illumination 1 21 .

That is, the imaging device can acquire an image for the imprint formed on the part 25 when light is irradiated from a specific direction, and does not acquire an image for the imprint formed on the part 25 when irradiated with light from a different direction. can't This may be the result of a combination of factors such as the material of the part 25 and/or the manner in which the engraving is formed on the part 25 .

For example, the engraving formed on the part 25 is a region in which the part 25 is cut to a predetermined depth, and a step with the periphery may be formed. The step may affect a reflection angle or a scattering angle of light irradiated to the component 25 . The difference between the angle of reflection or scattering between the imprint and the periphery of the imprint may be an obstacle to obtaining a clear image of the imprint in the photographing device 30 . Alternatively, the photographing device 30 can accurately acquire the image for the imprint only when the incident angle of the light of the lighting unit is within a specific angular range, and when the incident angle of the light of the illumination is outside the specific angular range, You may not be able to acquire images. That is, the light reflected from the engraving may be collected by the imaging device 30 only for light incident in a specific direction due to the material of the engraving of the part 25 , the engraving method, or the depth of the engraving. In other words, the part quality inspection apparatus 10 may acquire a clear image of the engraving formed on the part 25 only when light is incident within a specific range of angles.

Therefore, in the following, in order to perform an accurate quality inspection of the engravings, a component quality inspection apparatus capable of incident lighting in various directions may be required.

3 is a diagram schematically illustrating a component quality inspection apparatus according to an exemplary embodiment.

Specifically, FIG. 3 (a) is a view showing the positional relationship between the lighting unit 110 and the component 120 as viewed from the gaze direction of the imaging device of the component quality inspection device 10, and FIG. 3 (b) is the component It is a view showing the positional relationship between the lighting unit 110 and the component 120 from the side of the engraving inspection device (10).

Referring to FIGS. 3 ( a ) and ( b ), the component engraving inspection apparatus 10 may include a quality inspection unit 100 , a lighting unit 110 , a support unit 123 , and a component 120 .

The support 123 may hold the component 120 so that one side of the component faces in a predetermined direction. The support part 123 may rotate the component 120 in at least one direction, and may rotate the front, back, or side surfaces of the component 120 to be positioned at the photographing position of the quality inspection unit 100 . The support part 123 holds the component 120 so that any one of the long side surfaces of the component 120 faces the photographing unit, or holds so that any one of the short side surfaces of the component faces the photographing unit can do. Here, the hold may mean physical fixation between the support part 123 and the component 120 , or may mean physical contact between the support part 123 and the component 120 .

The lighting unit 110 may irradiate light to one side of the component 120 at at least two or more incident angles. One side of the component 120 to which the light of the lighting unit 110 is irradiated may correspond to a gaze direction or a photographing surface of the photographing device (30 of FIG. 2 ) included in the quality inspection unit 100 . As shown in FIG. 3A , the lighting unit 110 may include first to fourth lights 111 , 113 , 115 , and 117 . Each of the first to fourth lights (111, 113, 115, 117) may be spaced apart from each other at a predetermined angle, and the first light (111) and the third light (115) are configured to face each other, The second light 113 and the fourth light 117 may also be configured to face each other. That is, the first to fourth lights 111 , 113 , 115 , and 117 may be configured to allow light to be incident on the component at different angles of incidence. On the other hand, the component quality inspection device 10 only needs to be configured such that the first to fourth lights 111, 113, 115, and 117 form different incident angles, and is not arranged as shown in Fig. 3 (a). don't have to

Alternatively, each of the first to fourth lights 111, 113, 115, and 117 may be composed of LED lights or lamp lights. Each of the first to fourth lights 111 , 113 , 115 , and 117 may include one light or a plurality of lights. For example, each of the first to fourth lights 111 , 113 , 115 , 117 may be composed of at least one LED light.

Alternatively, each of the first to fourth lights 111 , 113 , 115 , and 117 may be fixed at a predetermined specific angle, or the incident angle may be changed by the control of the quality inspection unit 100 . Alternatively, each of the first to fourth lights 111 , 113 , 115 , and 117 may have the amount of light adjusted in a plurality of steps. Specifically, each of the first to fourth lights 111 , 113 , 115 , 117 controls the amount of light by adjusting the number of LEDs generating light among the plurality of LED lights, or to the plurality of LED lighting units. The amount of light may be adjusted according to an applied voltage.

Alternatively, the lighting unit 110 may radiate light in first to fourth directions using the first to fourth lights 111 , 113 , 115 , and 117 . The first to fourth lights 111 , 113 , 115 , and 117 may incident light on the component 120 at different angles. Specifically, the first illumination 111 injects light into the component 120 in a first direction, the second illumination 113 injects light into the component 120 in a second direction, and the third illumination Reference numeral 115 may cause light to be incident on the component 120 in a third direction, and the fourth illumination 117 may inject light in a fourth direction. Here, the first direction and the third direction may be directions toward the long side of the component 120 , and the second direction and the fourth direction may be directions toward the short side of the component 120 .

Alternatively, the lighting unit 110 may independently operate each of the first to fourth lights 111 , 113 , 115 , and 117 under the control of the quality inspection unit 100 . Alternatively, the illumination unit 110 may independently control the amount of light of each of the first to fourth illuminations 111 , 113 , 115 , and 117 according to the control of the quality inspection unit 100 .

In addition, each of the first to fourth illuminations 111 , 113 , 115 , and 117 may be composed of illuminations that form patterned light. For example, each of the first to fourth lights 111 , 113 , 115 , and 117 may irradiate patterned light forming a grid line or grid point. Alternatively, each of the first to fourth lights 111 , 113 , 115 , and 117 may be configured with a plurality of LED light sources in a circular shape. Alternatively, each of the first to fourth illumination sets 111, 113, 115, and 117 may be irradiated with white light, red light, green light, blue light, ultraviolet light, infrared light, or the like.

The quality inspection unit 100 may control the lighting unit 110 to obtain an image of the appearance of the component 120 . The quality inspection unit 100 may analyze the pattern, shape, etc. of the engraving formed on the part 120 from the image of the appearance of the part 120 to determine whether the engraving formed on the part 120 is defective. Alternatively, the quality inspection unit 100 controls the lighting unit 110 to receive the reflected light reflected from the component, and through the image acquired from the photographing device and the image obtained from the engraved shape or pattern formed on the part, the shape of the parts, It may include a processor for detecting and analyzing the boundaries of the imprint.

Here, the photographing device may include various image acquisition devices such as a CCD camera and a high-performance CMOS camera such as a sCMOS (Scientific CMOS) camera. Also, the processor may be referred to as a controller, a microcontroller, a microprocessor, or a microcomputer. One or more processors 102, 202 may be implemented by hardware, firmware, software, or a combination thereof. For example, one or more Application Specific Integrated Circuits (ASICs), one or more Digital Signal Processors (DSPs), one or more Digital Signal Processing Devices (DSPDs), one or more Programmable Logic Devices (PLDs), or one or more Field Programmable Gate Arrays (FPGAs) may be included in one or more processors.

According to an example, the component quality inspection apparatus 10 may operate all of the first to fourth lights 111 , 113 , 115 , and 117 included in the lighting unit to inject light at a plurality of incident angles. The component quality inspection apparatus 10 may acquire an image for the engraving by incident light at various angles of incidence through the lighting unit. However, in this case, it may be difficult to obtain a clear image for the engraving due to light interference or excessive amount of light between the first to fourth lights 111 , 113 , 115 , and 117 . Accordingly, the component quality inspection device 10 needs to operate some of the first to fourth lights 111 , 113 , 115 , and 117 , or to control the amount of light.

According to an embodiment, the quality inspection unit 100 independently controls each of the first to fourth lights 111 , 113 , 115 , 117 to view the image for the part 120 or the engraving formed on the part 120 . can be obtained The quality inspection unit 100 may take a plurality of images of the component 120 by sequentially operating at least one of the first to fourth lights 111 , 113 , 115 , and 117 .

For example, the quality inspection unit 100 operates only the first light 111 to take an image of the component, and then operates only the second light 113 to photograph the image of the component 120 . Thereafter, the quality inspection unit 100 operates only the third light 115 to take an image of the component, and then operates only the fourth light 117 to photograph the image of the component 120 .

Alternatively, the quality inspection unit 100 operates only the first light 111 to take an image of the part, and then operates only the third light 115 facing the first light 111 for the component 120 . You can take an image. After that, the quality inspection unit 100 operates only the second light 113 to take an image of the part, and then operates only the fourth light 117 facing the second light 113 to give the component 120. You can take an image for

Alternatively, the quality inspection unit 100 may determine an order to sequentially operate each of the first to fourth lights 111, 113, 115, and 117 based on a user input for the type of part or a preset lighting operation sequence. have.

The quality inspection unit 100 may take a plurality of images of the component 120 by sequentially adjusting the light amount of at least one of the first to fourth lights 111 , 113 , 115 , and 117 . The quality inspection unit 100 can determine the incident angle of the illumination from which the engraving formed on the component 120 is clearly derived through the plurality of images taken, and is formed on the clearer part by increasing the amount of light corresponding to the determined incident angle. You can acquire an image or an image for the engraving. For example, the quality inspection unit 100 compares and analyzes a plurality of images, selects an image with high sharpness for engraving, and corresponds to the image selected from among the first to fourth lights 111, 113, 115, and 117. The lighting may be determined as the reference lighting.

On the other hand, in the image of the engraving formed on the component 120, the sharpness of the engraving may vary according to the incident angle and the amount of light of the lighting unit. For example, when the light amount of the lighting unit is less than a specific light amount, the quality inspection unit 100 can easily obtain an image in which defects such as voids in the imprint are clearly revealed from the photographed image for the imprint, but on the image The boundaries of the imprint may be unclear. Alternatively, when the light quantity of the lighting unit is equal to or greater than the specific light quantity, the boundary of the imprint may be clearly seen, but defects such as voids in the imprint may be difficult to see.

Accordingly, the component quality inspection apparatus 10 needs to control the light amount of the reference light and the light amount of the remaining lights in order to obtain an image or image for a clearer engraving.

According to an example, the component quality inspection apparatus 10 may control the determined amount of light for the reference lighting to have a relatively higher amount of light than the amount of light for the other lights. Specifically, the component quality inspection apparatus 10 may increase the amount of light of the reference illumination among the first to fourth lights 111 , 113 , 115 , and 117 and decrease the light amount of the remaining lights. In this case, the part quality inspection device 10 increases the amount of light for the light most helpful for obtaining the image of the imprint while erasing or reducing the light quantity for the lights that are not helpful in obtaining the image of the imprint. It is possible to minimize the effect of image sharpness due to excessive light quantity while minimizing unnecessary interference.

For example, when the component quality inspection device 10 determines the reference light as the third light 115 among the first to fourth lights 111 , 113 , 115 and 117 , the third light 115 is An image of the component 120 may be acquired after adjusting the amount of light to be greater than or equal to the predetermined amount of light, and adjusting the amount of light for the remaining lights to be less than the predetermined amount of light.

4 is a flowchart illustrating a method of inspecting component quality according to an exemplary embodiment.

Referring to FIG. 4 , the part quality inspection device 10 sequentially operates at least one of the first to fourth lights, and based on the acquired images, among the first to fourth lights, It is possible to determine the reference illumination (S901). For example, the part quality inspection apparatus 10 may determine an image having the highest sharpness of the boundary of the engraving formed on the part from among the plurality of images, and select the illumination corresponding to the determined image from among the first to fourth illumination. It can be determined by reference lighting.

Next, the component quality inspection apparatus 10 may control the amount of light of the first to fourth illuminations based on the reference illumination ( S903 ). Specifically, the component quality inspection apparatus 10 may adjust the amount of light of the first illumination to be relatively higher than that of the remaining lights. For example, the component quality inspection apparatus 10 may increase the amount of light of the first illumination to a preset light amount or more, or reduce the light amount of the remaining lights to less than the preset light amount. Hereinafter, various methods for controlling a specific amount of light will be described.

According to an embodiment, the component quality inspection device 10 controls the light quantity for the determined reference illumination to have a relatively higher light quantity than the light quantity for the other illuminations, but the light quantity of the illumination facing the reference illumination is the It can be controlled to have a relatively lower light amount than the light amount for the other lights. For example, when the component quality inspection device 10 determines the reference illumination as the second illumination among the first to fourth illuminations, the light quantity for the third illumination is adjusted to a predetermined quantity or more, and the remaining illuminations Adjust the amount of light to be less than a predetermined amount of light, but among the remaining lights, the light amount of the fourth light facing the second light may be adjusted to be lower than the light amount of the first light and the third light, or it may be turned off altogether.

According to an example, the part quality inspection apparatus 10 may adjust the light amount of each of the first to fourth lights included in the lighting unit to increase the sharpness of the image for the engraving formed on the part. Specifically, when the image in the engraving is not clear, the part quality inspection apparatus 10 may reduce the amount of light of the lighting unit to increase the sharpness of defects such as voids in the engraving. Alternatively, when the boundary of the engraving is not clear in the part, the part quality inspection apparatus 10 may increase the amount of light of the lighting unit to increase the sharpness of the boundary of the engraving. In this case, the part quality inspection apparatus 10 may combine an image with a clear image in the imprint and an image with a clear boundary between the imprint to generate an optimal image for quality analysis of the imprint.

According to an example, the component quality inspection device 10 determines the illumination having an optimal incident angle through the images taken by sequentially operating the first to fourth lights included in the lighting unit, and the determined reference illumination It is possible to increase the amount of light and minimize the amount of light from the rest of the lights. Next, the component quality inspection apparatus 10 may acquire various images while adjusting only the light amount of the reference illumination to various light amounts. The part quality inspection apparatus 10 may select an image having the highest sharpness of the boundary of the engraving and an image having the highest sharpness of the inside of the engraving from among the various images. Next, the part quality inspection apparatus 10 may combine the two images to generate an image including optimal information about the engraving.

According to an example, the component quality inspection apparatus 10 may adjust the amount of light of the lighting unit based on the weight of the component. The component quality inspection apparatus 10 may reduce the overall light quantity of the lighting unit when the weight of the component positioned on the support exceeds a predetermined weight. Specifically, if the weight of the component positioned on the support is less than the predetermined weight, the light amount and operation of the lighting unit according to the above-described method may be controlled based on the preset first reference light amount. When the weight of the component positioned on the support is greater than or equal to a predetermined weight, the light amount and operation of the lighting unit may be controlled based on the second reference light amount preset for the light amount of the lighting unit.

Here, the second reference light amount may be a light amount lower than the first reference light amount, and the predetermined weight may be a material or a reference for distinguishing the material of the component. For example, the predetermined weight may be a reference weight for distinguishing a metallic component from a non-metallic component. When the component quality inspection apparatus 10 detects a component having a weight greater than or equal to the predetermined weight, the component may be estimated that the component is a metallic material or material to lower the light quantity of the lighting unit. This is because, in the case of metal parts, the reflectance is high, so even if the amount of light is reduced, the sharpness is maintained. That is, the component quality inspection apparatus 10 can save power that is unnecessarily consumed by adjusting the amount of light of the lighting unit based on a preset weight.

According to another embodiment, the component quality inspection apparatus 10 may transmit a signal including an image obtained from components through a base station and an LTE-based wireless connection through a Physical Uplink Shared Channel (PUSCH). In addition, the component quality inspection apparatus 10 may adjust the amount of light of the lighting unit based on control information included in a Physical Downlink Shared Channel (PDSCH) received from the base station. The parts quality inspection apparatus 10 may transmit information on the parts located in the support to the base station, and receive a control signal of the amount of light of the lighting unit determined based on the information on the parts from the base station, and the The light amount of the lighting unit may be controlled according to the received light amount control signal. Alternatively, the base station may transmit control information on the amount of light of the lighting unit to the component quality inspection apparatus 10 through the time density of a separate PT-RS. For example, the component quality inspection apparatus 10 may adjust the amount of light of the lighting unit based on the time density of a phase tracking reference signal (PT-RS) received from the base station.

Next, the part quality inspection apparatus 10 may evaluate the quality of the engraving formed on the part based on a plurality of images acquired through independent control of each of the first to fourth lights (S905) . Specifically, the part quality inspection device 10 analyzes and combines a plurality of images acquired through independent control of each of the first to fourth lights to generate an image with high clarity of the engraving formed on the part and may perform quality analysis and evaluation of the engraving based on the generated image.

As described above. The part quality inspection apparatus 10 may acquire a high-definition image for the engraving formed on the part through the light amount control of the lighting unit based on the above-described methods, and perform quality evaluation and analysis of the engraving with high accuracy based on the acquired image can do.

On the other hand, in the part quality inspection device 10, the sharpness of the image for the engraving formed on the part may decrease according to the mismatch between the gaze distance and the focal length between the part and the imaging device, and below, the gaze distance between the part and the imaging device and the A configuration and method that can minimize the mismatch between focal lengths is described.

5 and 6 are diagrams schematically illustrating a part quality inspection device for adjusting a position of the imaging device based on a gaze distance between the part and the imaging device.

Referring to Figure 5 (a), (b), (c), the component quality inspection apparatus 10 may rotate the support for the quality inspection of the engraving located on the other side of the component (120). In this case, the position of the component 120 attached to the support may be changed. In this case, the focal length between the photographing device and the component may vary, and accordingly, the sharpness of the image of the component 120 may be rapidly reduced. In order to solve this problem, the component quality inspection apparatus 10 may position the component at the focal length of the photographing apparatus 30 by adjusting the position of the photographing apparatus 30 based on the distance from the component 120 .

Specifically, referring to FIG. 6 , the imaging device 30 included in the quality inspection unit 100 may be attached to a linear motion (LM) guide 140 driven by the camshaft 150 . Here, the LM guide 140 is a device including a rail and a bearing designed to make a linear rolling motion of a specific material, and specifically, it may be of a configuration in which a ball bearing is driven in a point-contact manner on a straight rail. . In this case, the position of the photographing device 30 may be changed in a vertical direction (a direction away from or closer to the part) along the LM guide 140 by driving the camshaft 150 . Alternatively, the support part may be attached to the LM guide 140 driven by the camshaft 150 , so that the support part, not the photographing device, may perform a linear motion up and down along the LM guide 140 .

According to an embodiment, the component quality inspection apparatus 10 may continuously monitor the gaze distance between the imaging device 30 and the component 120 so that the gaze distance corresponds to a preset focal length. The camshaft 150 may be driven. Specifically, the part quality inspection apparatus 10 measures the gaze distance through a separate sensor or a laser distance measuring device, or estimates the gaze distance based on pre-stored information on the step change according to the rotation of the part. can Alternatively, the component quality inspection apparatus 10 may estimate the distance to the component 120 based on the image acquired by the imaging apparatus 30 .

Next, the part quality inspection apparatus 10 may drive the camshaft 150 to move the imaging apparatus 30 in a corresponding direction based on the measured or estimated gaze distance. For example, the part quality inspection apparatus 10 may drive the camshaft 150 so that the imaging device 30 moves away from the part 120 when the gaze distance is shorter than the focal length. Alternatively, the component quality inspection apparatus 10 may drive the camshaft 150 so that the imaging device 30 approaches the component 120 when the gaze distance is longer than the focal length. By adjusting the position of the imaging device 30 as described above, in this case, the component quality inspection device 10 can always maintain the focal length and the corresponding gaze distance.

The embodiments described above are those in which elements and features of the present invention are combined in a predetermined form. Each component or feature should be considered optional unless explicitly stated otherwise. Each component or feature may be implemented in a form that is not combined with other components or features. It is also possible to configure embodiments of the present invention by combining some elements and/or features. The order of operations described in the embodiments of the present invention may be changed. Some features or features of one embodiment may be included in another embodiment, or may be replaced with corresponding features or features of another embodiment. It is obvious that claims that are not explicitly cited in the claims can be combined to form an embodiment or included as a new claim by amendment after filing.

Embodiments according to the present invention may be implemented by various means, for example, hardware, firmware, software, or a combination thereof. In the case of implementation by hardware, an embodiment of the present invention provides one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), FPGAs ( field programmable gate arrays), a processor, a controller, a microcontroller, a microprocessor, and the like.

In the case of implementation by firmware or software, an embodiment of the present invention may be implemented in the form of a module, procedure, function, etc. that perform the functions or operations described above. The software code may be stored in the memory unit and driven by the processor. The memory unit may be located inside or outside the processor, and may transmit and receive data to and from the processor by various known means.

The specific implementations described in the present invention are only examples and do not limit the scope of the present invention in any way. For brevity of the specification, descriptions of conventional electronic components, control systems, software, and other functional aspects of the systems may be omitted. In addition, the connections or connecting members of lines between the components shown in the drawings are illustrative examples of functional connections and/or physical or circuit connections, and in an actual device, various functional connections, physical connections that are replaceable or additional may be referred to as connections, or circuit connections. In addition, unless there is a specific reference such as 'essential' or 'importantly', it may not be a necessary component for the application of the present invention.

Therefore, the spirit of the present invention should not be limited to the above-described embodiments, and the scope of the spirit of the present invention is not limited to the scope of the scope of the present invention. will be said to belong to In addition, it will be apparent to those skilled in the art that the present invention may be embodied in other specific forms without departing from the characteristics of the present invention. Accordingly, the above detailed description should not be construed as restrictive in all respects but as exemplary. The scope of the present invention should be determined by a reasonable interpretation of the appended claims, and all modifications within the equivalent scope of the present invention are included in the scope of the present invention.

10: Part quality inspection device
30: shooting device
100: quality inspection unit
110: lighting unit
111, 113, 115, 117: 1st illumination, 2nd illumination, 3rd illumination, 4th illumination
120: parts
123: support
140: LM guide
150: camshaft

Claims (6)

In the quality inspection apparatus for inspecting the quality of the engraving formed on the part,
a support part for supporting the part so that one side of the part faces a predetermined direction;
an illumination unit irradiating light to the component supported by the support unit at at least one incident angle; and
A quality inspection unit for controlling the amount of light of the lighting unit to obtain an image of the part, and analyzing the acquired image to inspect the quality of the part;
The support unit measures the weight of the component, and the quality inspection unit controls the light amount of the lighting unit based on a first reference light amount when the measured weight of the component is less than a preset weight, and the weight of the component is set in advance. When the weight is greater than or equal to the set weight, the light amount of the lighting unit is controlled based on the second reference light amount,
The first reference light amount is a light amount higher than the second reference light amount,
The lighting unit includes a first light, a second light, a third light facing the first light, and a fourth light facing the second light, quality inspection device. According to claim 1,
The quality inspection unit, the quality inspection apparatus, characterized in that for independently controlling the amount of light and the incident angle of each of the first illumination to the fourth illumination. According to claim 1,
The quality inspection unit sequentially operates at least one of the first to fourth lights to obtain images of the parts, and based on the obtained images, among the first to fourth lights A quality inspection device, characterized in that determining a reference illumination. 4. The method of claim 3,
The quality inspection unit increases the amount of light of the reference illumination among the first illumination to the fourth illumination and decreases the quantity of light for the remaining illumination, the quality inspection device. According to claim 1,
The quality check unit receives a Physical Downlink Shared Channel (PDSCH) from a base station through a Long Term Evolution (LTE)-based wireless communication system, and based on the time density of a phase tracking reference signal (PT-RS) included in the received PDSCH to control the amount of light of the lighting unit, a quality inspection device. According to claim 1,
The quality inspection unit includes a camshaft and a LM guide (Linear motion Guide) connected to the imaging device, and a processor for evaluating the quality of the engraving of the part based on the image acquired from the imaging device,
The processor drives the camshaft based on a distance between the imaging device and the component to control a position of the imaging device.

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