KR101779960B9 - 엘이디 조명의 오류 및 변화 감지를 위한 장치 및 방법 - Google Patents

엘이디 조명의 오류 및 변화 감지를 위한 장치 및 방법

Info

Publication number
KR101779960B9
KR101779960B9 KR1020120089265A KR20120089265A KR101779960B9 KR 101779960 B9 KR101779960 B9 KR 101779960B9 KR 1020120089265 A KR1020120089265 A KR 1020120089265A KR 20120089265 A KR20120089265 A KR 20120089265A KR 101779960 B9 KR101779960 B9 KR 101779960B9
Authority
KR
South Korea
Prior art keywords
change
led light
detecting error
error
detecting
Prior art date
Application number
KR1020120089265A
Other languages
English (en)
Other versions
KR20140023474A (ko
KR101779960B1 (ko
Inventor
김유진
강태규
김대호
김현석
김현종
임상규
장일순
정진두
김인수
박성희
Original Assignee
한국전자통신연구원
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 한국전자통신연구원 filed Critical 한국전자통신연구원
Priority to KR1020120089265A priority Critical patent/KR101779960B1/ko
Priority to US13/939,705 priority patent/US20140052390A1/en
Publication of KR20140023474A publication Critical patent/KR20140023474A/ko
Application granted granted Critical
Publication of KR101779960B1 publication Critical patent/KR101779960B1/ko
Publication of KR101779960B9 publication Critical patent/KR101779960B9/ko

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/44—Testing lamps
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/16576—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 comparing DC or AC voltage with one threshold
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
    • G01R23/15—Indicating that frequency of pulses is either above or below a predetermined value or within or outside a predetermined range of values, by making use of non-linear or digital elements (indicating that pulse width is above or below a certain limit)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/06—Measuring depth of modulation
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/30—Driver circuits
    • H05B45/37—Converter circuits
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B45/00—Circuit arrangements for operating light-emitting diodes [LED]
    • H05B45/50—Circuit arrangements for operating light-emitting diodes [LED] responsive to malfunctions or undesirable behaviour of LEDs; responsive to LED life; Protective circuits

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Nonlinear Science (AREA)
  • Circuit Arrangement For Electric Light Sources In General (AREA)
KR1020120089265A 2012-08-16 2012-08-16 엘이디 조명의 오류 및 변화 감지를 위한 장치 및 방법 KR101779960B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020120089265A KR101779960B1 (ko) 2012-08-16 2012-08-16 엘이디 조명의 오류 및 변화 감지를 위한 장치 및 방법
US13/939,705 US20140052390A1 (en) 2012-08-16 2013-07-11 Apparatus and method for detecting error and variation in light-emitting diode lightting

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020120089265A KR101779960B1 (ko) 2012-08-16 2012-08-16 엘이디 조명의 오류 및 변화 감지를 위한 장치 및 방법

Publications (3)

Publication Number Publication Date
KR20140023474A KR20140023474A (ko) 2014-02-27
KR101779960B1 KR101779960B1 (ko) 2017-09-21
KR101779960B9 true KR101779960B9 (ko) 2022-07-06

Family

ID=50100647

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020120089265A KR101779960B1 (ko) 2012-08-16 2012-08-16 엘이디 조명의 오류 및 변화 감지를 위한 장치 및 방법

Country Status (2)

Country Link
US (1) US20140052390A1 (ko)
KR (1) KR101779960B1 (ko)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11149926B2 (en) 2016-07-29 2021-10-19 Labyrinth Technologies, Llc Luminaire control device with universal power supply
USD928987S1 (en) 2019-02-21 2021-08-24 Labyrinth Technologies, Llc Municipal infrastructure pole
US11204156B2 (en) 2016-07-29 2021-12-21 Labyrinth Technologies, Llc Systems and methods for aggregating edge signals in a mesh network
USD957039S1 (en) 2020-01-13 2022-07-05 Labyrinth Technologies, Llc Enclosure with extension
US10893598B2 (en) * 2019-01-25 2021-01-12 Osram Sylvania Inc. Transmission of luminaire maintenance information
JP7218212B2 (ja) * 2019-03-05 2023-02-06 株式会社東芝 半導体装置

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CA2521973C (en) * 2004-09-29 2013-12-10 Tir Systems Ltd. System and method for controlling luminaires
WO2006079199A1 (en) * 2005-01-25 2006-08-03 Tir Systems Ltd. Method and apparatus for illumination and communication
ES2365553T3 (es) * 2007-12-03 2011-10-06 Sirio Panel S.P.A. Configuración de circuito para generar una señal modulada en anchura de pulsos, para accionar cargas eléctricas.
US8471496B2 (en) * 2008-09-05 2013-06-25 Ketra, Inc. LED calibration systems and related methods
US8773336B2 (en) * 2008-09-05 2014-07-08 Ketra, Inc. Illumination devices and related systems and methods
US9509525B2 (en) * 2008-09-05 2016-11-29 Ketra, Inc. Intelligent illumination device
US20120299480A1 (en) * 2009-11-06 2012-11-29 Neofocal Systems, Inc. System And Method For Current Modulated Data Transmission
KR101038852B1 (ko) * 2009-12-09 2011-06-03 삼성전기주식회사 에러 검출 기능을 갖는 ｌｅｄ 구동 회로
KR20120071928A (ko) * 2010-12-23 2012-07-03 한국전자통신연구원 조명 제어 장치 및 방법
US9066381B2 (en) * 2011-03-16 2015-06-23 Integrated Illumination Systems, Inc. System and method for low level dimming
US8797766B2 (en) * 2011-04-06 2014-08-05 Bose Corporation Power supply with tickle pulse injection
KR20130116406A (ko) * 2012-03-12 2013-10-24 한국전자통신연구원 가시광무선통신을 기반으로 한 ｌｅｄ 조명 제어장치 및 그 방법

Also Published As

Publication number Publication date
KR20140023474A (ko) 2014-02-27
US20140052390A1 (en) 2014-02-20
KR101779960B1 (ko) 2017-09-21

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Legal Events

Date Code Title Description
A201 Request for examination
G170 Re-publication after modification of scope of protection [patent]