KR101770186B1 - Apparatus for determining component mounting and method for controlling the same - Google Patents
Apparatus for determining component mounting and method for controlling the same Download PDFInfo
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- KR101770186B1 KR101770186B1 KR1020150182999A KR20150182999A KR101770186B1 KR 101770186 B1 KR101770186 B1 KR 101770186B1 KR 1020150182999 A KR1020150182999 A KR 1020150182999A KR 20150182999 A KR20150182999 A KR 20150182999A KR 101770186 B1 KR101770186 B1 KR 101770186B1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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- G01R31/046—
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
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- Operations Research (AREA)
- Manufacturing & Machinery (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Supply And Installment Of Electrical Components (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The present invention relates to a component mounting detection apparatus, and more particularly, to a component mounting detection apparatus, which includes a three-dimensional image storage unit in which a height value of a pixel of a component to be inspected is stored, A reference height is determined after determining a test area for a test part based on a theoretical area connected to the three-dimensional image storage part and the part location and height storage part, , Binarizing a height value of a pixel existing in a region of interest for the inspection object using the reference height to generate current height binary image data for pixels of the inspection region for the inspection object, Determines the current contour pixel located on the contour of the inspection part by using If the quasi-contour pixel and the current pixel of the contour matching rate set value more than the inspection part and comprising a location determination for determining to be present in the search range for the test component.
Description
BACKGROUND OF THE
In general, when a product is manufactured using Surface Mount Technology (SMT), a solder cream is applied on a printed circuit board (PCB), and then a resistor, a capacitor, and an IC Integrated Chip), and then passes through a reflow to produce a product.
When manufacturing such products, the correct parts must be mounted on the printed circuit board in the correct position. Various inspection items are inspected to confirm this.
In order to inspect various inspection items, first, it is necessary to check whether or not the parts exist in the corresponding positions.
If the part does not exist at the corresponding position, it is judged that the part is not mounted normally, so that it can be judged to be defective without performing any additional inspection of the part.
Accordingly, in order to check whether a component is mounted, conventionally, a two-dimensional image data for a plurality of pixels is acquired using an image data acquisition unit such as a CCD camera (charge coupled device camera) .
However, in the conventional case, since the two-dimensional image data has only the gradation value which is the image data according to the color of the photographed part, the presence or absence of the component is judged using only the gradation value. Therefore, There is no problem.
That is, when a component having the same or similar color as the surface color of the printed circuit board is mounted, the component can be recognized as the surface of the printed circuit board, and it is determined that the component does not exist at the corresponding position. It is not possible to mount the semiconductor device.
SUMMARY OF THE INVENTION Accordingly, the present invention has been made keeping in mind the above problems occurring in the prior art.
According to an aspect of the present invention, there is provided an apparatus for detecting whether a component is mounted, the apparatus including: a three-dimensional image storage unit storing a height value of a pixel of a tested component; a component position / height storage unit, A reference height is set after determining the inspection area for the inspection part on the basis of the theoretical area where the inspection part is to be positioned and connected to the three-dimensional image storage part and the parts position and height storage part, Wherein the controller is configured to binarize a height value of a pixel existing in a region of interest for the inspection object to generate current height binary image data for a pixel of the inspection region for the inspection object, Determining a current contour pixel positioned on the contour line, and comparing the pixel of the reference contour line and the current contour pixel If the matching rate of the line scan pixel equal to or greater than the preset value, the part is determined to include a location that is determined to be present on the test area for the test component.
The position determining unit may determine a pixel whose value of the current height binarized image data changes from '0' to '1' or from '1' to '0' as the current contour pixel.
The apparatus may further include a two-dimensional image storage unit in which image data of different colors are stored and connected to the position determination unit, And generating a short height image by partially mapping the short channel image data to the current height height image data to generate a height height binary image, It is preferable to determine a pixel whose difference in gray level value between adjacent two pixels is equal to or greater than a set value in the height-binarized mapped image as a current outline pixel.
Wherein the position determination unit reads the information on the region of interest of the inspected component to determine a pure base region of interest that does not overlap with another region of interest in the base region of interest for determining the reference position, The reference height of the inspection part can be set to a middle height value of the height value of the pixel existing in the pure base interest area if the height value of the pixel existing in the pure base interest area exists using the height value .
According to another aspect of the present invention, there is provided a method for controlling a component mounting apparatus, the method comprising: determining a test area for a test component based on a theoretical area where the test component is to be positioned; Binarizing a height value of a pixel existing in a region of interest for the inspection object using the reference height to generate current height binary image data for a pixel of the inspection region for the inspection object; Determining a current contour pixel located on an outline of the inspection part using the image data and determining whether the matching ratio between the reference contour pixel and the current contour pixel is equal to or greater than a preset value, And judging that it exists.
The current contour pixel determination step may determine that the current contour pixel is a pixel whose value of the current height binarized image data changes from '0' to '1' or from '1' to '0'.
Wherein the current contour pixel determination step includes the steps of generating short channel image data by extracting image data of a set color from image data of different colors stored in the two-dimensional image storage unit, And partially mapping the short channel image data to generate a height binary mapping image.
The step of setting the reference height includes the steps of determining a pure base interest region that does not overlap with another interest region in a base interest region for determining a reference position by reading information about a region of interest of the inspected component, Determining whether there is a height value of a pixel existing in the pure base interest region using a height value stored in the pure base interest region, and if a height value of a pixel existing in the pure base interest region exists, And setting a reference height of the inspection part as a middle height value of a height value of the pixel existing in the inspection area.
According to this aspect, when the presence or absence of the inspection component is determined, the reference position, that is, the bottom position of the substrate on which the inspection component is positioned is accurately detected by using the height value of the pixels belonging to the pure base region of interest, Is more accurately determined.
In addition, in the effective pixels of the Height Thresholded Binary Image or Height Thresholded Binary Image obtained from the 3D image data based on a specific height, The position of the component to be inspected is determined using the pattern information or the outline information of the height-binarized image obtained by mapping one of the components.
1 is a block diagram of a component mounting detection apparatus according to an embodiment of the present invention.
2 is a flowchart illustrating an operation of the method for detecting whether a component is mounted according to an embodiment of the present invention.
FIG. 3 is a flow chart of the operation of the reference height setting step in FIG. 2
Fig. 4 is an operation flowchart of an example of the step of determining whether the inspection part exists in the inspection area for the inspection part in Fig.
5 is a view showing an example of the structure of image data photographed in the photographing operation of the image obtaining unit according to an embodiment of the present invention.
Fig. 6 is a view for explaining an operation for determining an inspection area for inspection parts based on the inspection parts in Fig. 4; Fig.
FIG. 7 is a view illustrating an example of a screen in which a region of interest is displayed in an inspection area for a component to be inspected in the component mounting apparatus according to an embodiment of the present invention. FIG.
Fig. 8 is an operational flowchart of another example of the step of determining whether the inspection part exists in the inspection area for the inspection part in Fig. 2;
9 is a view showing an example of a height binary image in the component mounting detection apparatus according to an embodiment of the present invention.
10 is a diagram illustrating an example of a height binary mapping image in the component mounting detection apparatus according to an embodiment of the present invention.
BRIEF DESCRIPTION OF THE DRAWINGS The above and other features and advantages of the present invention will become more apparent by describing in detail exemplary embodiments thereof with reference to the attached drawings in which: FIG. The present invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In order to clearly illustrate the present invention, parts not related to the description are omitted, and similar parts are denoted by like reference characters throughout the specification.
It is to be understood that when an element is referred to as being "connected" or "connected" to another element, it may be directly connected or connected to the other element, but it should be understood that there may be other elements in between do.
Hereinafter, a component sensing apparatus and a control method thereof according to an embodiment of the present invention will be described with reference to the accompanying drawings.
In the following, a component sensing apparatus and a control method thereof for detecting whether or not a component is present at a corresponding position of a printed circuit board are described as one embodiment. However, the present invention is not limited thereto, But it is also applicable to detect the presence of a component at a corresponding position of another device or a substrate.
1, a part sensing apparatus according to an embodiment of the present invention includes a two-dimensional
The two-dimensional image data is a two-dimensional image data composed of red image data, green image data, and red image data obtained by the operation of the image data acquisition unit such as a camera when one of red light, green light, 2D) color image data.
When a light of a corresponding color (e.g., red light, green light, or blue light) is irradiated to a corresponding region of the printed circuit board to be inspected, the image data obtaining unit photographs the corresponding region and obtains red image data, Or blue image data, and stores the acquired color image data in the
Accordingly, the two-dimensional
Here, n and m are positive natural numbers, (PXn, m) are pixels located in the nth row and mth column, and the image data are image data of different colors, for example, red image data, Image data and blue image data, and each pixel PXn, m may be a pixel having image data of different colors, for example, a red pixel having red image data, a green pixel having green image data, And may be one of blue pixels having blue image data.
The three-dimensional image data is obtained by extracting image data of each pixel (PXnm) obtained from the corresponding region by photographed operation of the image data acquiring unit when the laser light or the like is irradiated to the corresponding region of the printed circuit board, Is a height value for the corresponding area (i.e., each pixel PXn, m existing in the corresponding area).
Accordingly, the three-dimensional image storage unit 12 stores height values corresponding to the respective pixels PXn, m corresponding to the corresponding printed circuit board.
Since the pixel position of all the parts to be mounted at each position of the PCB and the height value which is the height information of each pixel are stored in the component position and size storage unit 13, The position of the theoretical region, which is the area where the inspection component is to be mounted on the printed circuit board, and the height information that the inspection component should have, can be known using the stored data of the size storage unit 13. [
The
To this end, the
The region of interest includes a base region of interest for determining the reference position, a region of interest for the component to inspect the mounting state, a pad region of interest for testing the pad's attachment state, a solder region of interest for testing the soldering condition, A lift region of interest for determining the lifting degree of the component, and the like, and the ROI is determined according to the inspection items of the inspection component.
At this time, since the mounting position, the pad position, the mounting method, and the like are different for each inspection part, the types and the number of the ROIs determined according to the types of the inspection parts are different.
Then, the
If there is a height value for the pure base interest region, the
Then, a height threshold is set with reference to the reference height and the height of the inspection component, and the three-dimensional image data of the inspection region of the component is binarized on the basis of the height threshold, (Hereinafter referred to as " current height binarized image data ") for the pixels of the current frame TRG.
For example, the current height may be binarized so that the value of the three-dimensional image data has a pixel value of 255 for a pixel higher than the height threshold value and the pixel value of the pixel having the value of the three- (See Fig. 9), and this current height-binarized image data is made up of 8 bits.
Then, the
The
The
The
Next, the operation of the
First, when the power source necessary for the operation of the parts sensing apparatus is supplied and the operation of the parts sensing apparatus is started, the operation of the
As shown in FIG. 4, the two-dimensional
In Fig. 5, hatched portions represent pixels corresponding to the portions on which the components are mounted, and blank space portions represent pixels corresponding to portions on which the components are not mounted.
The
Information on the
At this time, the theoretical area THRG for the
For example, in FIG. 5, when the part located on the upper part of the printed circuit board is the
Therefore, the rectangular region formed by vertices of these pixels [(PX 10 , 7 ), (PX 10 , 12 ), (PX 12 , 7 ), (PX 12 , 12 )] becomes the theoretical region THRG.
When the theoretical area THRG for the
As an example for determining the inspection region for inspection parts TRG, the
Then, the
6, after the theoretical region THRG for the inspected
When the inspection region TRG for the
This reference height setting operation will be described below with reference to Fig.
When the operation of the
In the example shown in Fig. 7, the region of interest displayed in the inspection region for inspection parts TRG through the
Next, the
Then, the
The
If there is no height value corresponding to the pure base interest area IBRG (S135), the
However, if the height value corresponding to the pure base interest region IBRG exists in the three-dimensional image storage unit 12 (S135), the
For example, assuming that there are seven pixels existing in the pure base interest area IBRG and that a height value exists for each pixel, the operation of the
The
For example, seven height values (z1, z2, z3, z4, z5, z6, z7) is present and the position of the pixel having these height values, respectively (PX 1,2), (PX 1 , 3), (PX 1, 4), ( PX 2, 1), (PX 2, 2), when the (PX 3,1) and (PX 3, 3), arranged in a line of seven height values (z1-z7) Z2-z3-z4-z5-z6-z7, the height value z4 of the middle pixel [(PX 2 , 1 )] is the middle height value.
When the intermediate height value in the pure base attention area IBRG is determined as described above, the
2, when the reference height is determined by using the height value of the pixel located in the pure base interest area IBRG, the
For the height binarization processing of the three-dimensional image data of the pixels existing in the inspection region for inspection parts TRG, the
By this height binarization operation, the binarization value for the pixel where the
Next, the
Next, referring to Fig. 4, an example of an operation of determining whether the
As shown in FIG. 4, the
In this example, the
Then, the
The
In this example, the reference contour pixel is a contour pixel calculated through the operation up to step S151 in Figs. 2 to 4 when the same part , And is used as a reference pixel for determining whether the
If the position matching rate of the two contour pixels is equal to or larger than the set ratio (S153), the
However, if the position matching rate of the two contour pixels is less than the set ratio, the
According to this embodiment, when determining whether or not the
In the case of using only two-dimensional (2D) image data having no height value for each pixel and having only a tone value for each pixel, when there exists a part having the same color as the bottom color, A problem has occurred.
However, in the case of this embodiment, as described above, after determining the bottom position, the presence or absence of the inspection part is determined according to whether or not the height value is equal to or higher than the set ratio with reference to the bottom position. Thus, in this example, the presence of the inspection part is determined more accurately regardless of the bottom color and the color of the inspection part.
Next, referring to FIG. 8, after the height binary processing for the height value of the pixel existing in the inspection region for inspection parts TRG is completed and the current height binary image data is generated, 100) will now be described.
In this example, the
The height binary mapping image is an image created by replacing a pixel having a pixel value of a height binarized image of 255 with a pixel value of one of the three channel data of a color image. FIG. 10 shows an example of this height binary mapping image / RTI >
As described above, since the two-dimensional image data is for displaying a color image, each pixel is one of a red pixel having red image data, a green pixel having green image data, and a blue pixel having blue image data, Pixels having these different colors (red, green, and blue) are positioned adjacent to each other.
Accordingly, the colors determined by the respective tone values of the red pixel, the green pixel, and the blue pixel, which are a plurality of pixels located adjacent to each other with different colors, are displayed. In this example, a plurality of pixels (for example, red pixels, green pixels, and blue pixels) having different colors and located adjacent to each other are referred to as one pixel group.
After generating the current height binarized image data, the
Then, the
At this time, in order to partially map the short channel image data to the height binary image data, the
Therefore, the
To this end, the
Then, the
The
In this example, the reference contour pixel is calculated using the height-thresholded binary image in the same manner as described above when the target part, which is the same part as the
If the matching rate of the two contour pixels is not less than the set ratio (S1525), the
However, if the position matching rate of the two contour pixels is less than the set ratio, the
In this case, since the outline position of the
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed exemplary embodiments, It belongs to the scope of right.
11: two-dimensional image storage unit 12: three-dimensional image storage unit
13: part position and height storage unit 20: position determination unit
21: Storage part THRG: Theoretical area
TRG: Inspection area for inspection parts IBRG: Base area of interest
ROI11, RO121, ROG122, ROG311, ROG312: ROI
Claims (8)
A three-dimensional image storage unit for storing height values of pixels of the inspection part;
A component position and height storage unit for storing positional information and height values of the mounted component;
A reference height is set after determining the inspection area for the inspection part based on the theoretical area to which the inspection part is to be positioned and connected to the three-dimensional image storage part and the part location and height storage part, The control unit generates a current height binarized image data for a pixel in the inspection region for the inspection object by binarizing a height value of a pixel existing in the interest region for the inspection object, And judges that the inspection component exists in the inspection component inspection area if the matching rate of the reference contour pixel and the current contour pixel is equal to or larger than a set value; And
And an output unit for outputting an image corresponding to the image data output from the position determining unit,
Wherein the position determining unit extracts image data of a predetermined color from the image data of different colors to generate short channel image data, and partially maps the short channel image data to the current height binarized image data to generate a height binary mapping image And a pixel having a difference in gray level value between adjacent two pixels in a textured height thresholded binary image is determined as a current contour pixel. Sensing device.
Wherein the position determining unit determines a pixel whose value of the current height binarized image data changes from '0' to '1' or from '1' to '0' as the current contour pixel.
Wherein the position determination unit reads the information on the region of interest of the inspected component to determine a pure base region of interest that does not overlap with another region of interest in the base region of interest for determining the reference position, And setting a reference height of the inspection part as a middle height value of a height value of a pixel existing in the pure base interest area if a height value of the pixel existing in the pure base interest area exists using the height value Features of component mounting detection.
Setting a reference height for the inspection area for the inspection part;
Binarizing a height value of a pixel existing in a region of interest for the inspection object using the reference height to generate a current height of the pixel of the inspection region for the inspection object;
Determining a current contour pixel located on an outline of the inspection part using the current height binarized image data; And
And determining that the inspection component exists in the inspection component inspection area if the matching rate of the reference contour pixel and the current contour pixel is equal to or greater than a set value,
Wherein the determining of the current contour pixel comprises:
Generating short channel image data by extracting image data of a set color from image data of different colors stored in the two-dimensional image storage unit; And
And generating a height-binarized image by partially mapping the short-channel image data to the current height-binarized image data to generate a height-binarized image.
Wherein the current contour pixel determination step determines a pixel whose value of the current height binarized image data changes from '0' to '1' or from '1' to '0' as the current contour pixel. Whether the control method of the sensing device.
Wherein the setting of the reference height comprises:
Determining a pure base region of interest that does not overlap with another region of interest in a base region of interest for reading information about a region of interest of the inspected component to determine a reference position;
Determining whether a height value of a pixel existing in the pure base interest region exists using a height value stored in the three-dimensional image storage unit; And
And setting a reference height of the inspection part as a middle height value of a height value of a pixel existing in the pure base interest area if a height value of the pixel existing in the pure base interest area is present A control method of the component mounting detection device.
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JP2002303590A (en) * | 2001-04-05 | 2002-10-18 | Matsushita Electric Ind Co Ltd | Inspection method and inspection device for mounted component |
JP2010230421A (en) * | 2009-03-26 | 2010-10-14 | Nakanihon Highway Engineering Nagoya Kk | Method of dividing region of concrete image |
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JP2002303590A (en) * | 2001-04-05 | 2002-10-18 | Matsushita Electric Ind Co Ltd | Inspection method and inspection device for mounted component |
JP2010230421A (en) * | 2009-03-26 | 2010-10-14 | Nakanihon Highway Engineering Nagoya Kk | Method of dividing region of concrete image |
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