KR101760031B1 - Optical gas sensor with the improvement of sensitivity and reliability - Google Patents
Optical gas sensor with the improvement of sensitivity and reliability Download PDFInfo
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- KR101760031B1 KR101760031B1 KR1020150076656A KR20150076656A KR101760031B1 KR 101760031 B1 KR101760031 B1 KR 101760031B1 KR 1020150076656 A KR1020150076656 A KR 1020150076656A KR 20150076656 A KR20150076656 A KR 20150076656A KR 101760031 B1 KR101760031 B1 KR 101760031B1
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- infrared
- reflector
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- reflectors
- light source
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- 230000035945 sensitivity Effects 0.000 title claims abstract description 18
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- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- 239000010931 gold Substances 0.000 description 4
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 3
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- 238000009833 condensation Methods 0.000 description 3
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- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
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- 102100022002 CD59 glycoprotein Human genes 0.000 description 1
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Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
- G01J1/0407—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
- G01J1/0414—Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using plane or convex mirrors, parallel phase plates, or plane beam-splitters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N21/03—Cuvette constructions
- G01N21/0303—Optical path conditioning in cuvettes, e.g. windows; adapted optical elements or systems; path modifying or adjustment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/444—Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/063—Illuminating optical parts
- G01N2201/0636—Reflectors
Abstract
An optical gas sensor for improving sensitivity and reliability is disclosed. A reflector disposed at an arbitrary angle and having the same size; A concave reflecting mirror disposed on a surface corresponding to the reflecting mirror; An infrared light source having a parabolic reflector below the concave reflector; An infrared ray detection sensor disposed on both sides of the concave reflector; And a fourth reflector for transmitting a part of the light emitted from the infrared light source to the infrared detection sensor. Therefore, by providing two infrared detection sensors (reference wavelength, measurement wavelength), it is possible to smoothly perform the function of correction for the intensity change due to the temporal change of the infrared light source, thereby securing long-term reliability.
Description
The present invention relates to an optical gas sensor, and more particularly, to an optical gas sensor for improving sensitivity and reliability.
FIG. 1 shows a representative embodiment disclosed in Korean Patent Registration No. 10-1088360. As shown in FIG. 1, light emitted from the
3, which is shown in Korean Patent Registration No. 10-1108544 and Korean Patent Registration No. 10-0944273, which are shown in FIG. 2, includes an
3, the output of the
4 is a view showing the features of Korean Patent Registration No. 10-0694635. In this patent, infrared rays emitted from a
5 is a view showing the structure of Korean Patent Laid-Open No. 10-2013-0082482. The structure shown in FIG. 5 shows optical structures by two collimated and opposed two
In addition, the Korean Patent Registration No. 10-0959611 as shown in FIG. 6 has an advantage of improving the sensitivity of the sensor by efficiently condensing the light to the
On the other hand, the Korean Patent Registration No. 10-1108495 shown in FIG. 7 has an advantage that a light intensity can be improved by adopting a lens in front of the
When the internal reflector of the optical gas sensor using all of the optical structures described above is operated in a high humidity region, that is, the ambient temperature is constant at 25 degrees, the gas to be measured contains a large amount of water vapor and the temperature of the introduced gas is 35 degrees The water vapor contained in the gas is condensed in the inner reflector of the optical structure to cause irregular reflection of the infrared rays to be irradiated, thereby causing reduction of light energy reaching the infrared sensor. In addition, since the optical path of the optical gas sensor known to date is about several centimeters to several tens centimeters, there is a limit to improvement in the measurement accuracy in low-concentration measurement.
It is an object of the present invention to solve the above problems and to provide a method and apparatus for improving the sensitivity and reliability of accurately measuring the concentration of gas while preventing the condensation of water vapor to the utmost when the gas containing steam having a temperature significantly higher than the ambient temperature is introduced And to provide an optical gas sensor.
According to an aspect of the present invention, there is provided an optical system including two reflectors having the same size and arranged at an arbitrary angle on the same plane; A concave reflector disposed on the surface corresponding to the two reflectors so as to be spaced apart by a predetermined distance R; An infrared light source disposed under the one concave reflector and having a parabolic reflector;
A first infrared ray detection sensor disposed on the one concave reflector and having the light emitted from the infrared ray source reflected through the two reflectors and the concave reflector and arriving with a long optical path; A second infrared ray detection sensor disposed below the infrared ray source; And a fourth reflector disposed between the second infrared ray detection sensor and the two reflectors for transmitting a part of the light emitted from the infrared ray source to the infrared ray detection sensor,
The two reflectors, the one concave reflector, and the fourth reflector have a substrate formed to have a specific radius of curvature; A reflection film formed on one side of the substrate and reflecting the infrared rays; And a thick film including an insulating film formed on the other side of the substrate and a heating element formed on the insulating film.
Here, there are two reflectors and one concave reflector.
At this time, the light emitted from the infrared light source is transmitted to the infrared ray detection sensor through the fourth reflector, the reflector, and the concave reflector.
At this time, the infrared detection sensor has the absorption wavelength of the gas to be measured.
At this time, the infrared detection sensor includes an infrared thermopile having an amplifier, a filtering circuit, and a DC voltage output function.
At this time, at least one of the fourth reflector, the reflector, and the concave reflector includes a heating element that is heated to a temperature higher than the ambient temperature on the rear surface.
At this time, at least one of the fourth reflector, the reflector, and the concave reflector is a plated film for infrared reflection; An insulating film deposited on the rear surface; A heating element formed on the insulating film; And a temperature sensor for measuring the temperature of the heating element.
When the optical gas sensor for improving the sensitivity and reliability according to the present invention as described above is used, since there are two infrared detection sensors (reference wavelength, measurement wavelength), the function of correcting the intensity change with time of the infrared light source It is possible to secure a long-term reliability since the structure can be smoothly performed.
Further, there is an advantage in that the sensitivity can be improved by using the output of the infrared sensor part having a long optical path in the structure using the output voltage ratio of the two infrared sensor.
In addition, the inner reflector of the optical gas sensor is manufactured through compression molding or glass molding of metal, and when a metal is used as a reflector, heat is generated through an insulating film and a heating body metal, or when the glass is molded into a reflecting mirror, There is an advantage that deterioration in sensitivity due to condensation of water vapor can be prevented when the high humidity gas reaches the measurement chamber by forming the anti-use gold / nickel plating and the patterning of the heating element metal.
Further, since the reflector is spaced apart from the reflector and is not completely sealed as seen from the conventional optical structure, it is possible to ensure a state where gas diffusion is easy.
In addition, an optical gas sensor can be fabricated with a structure that can minimize the sensitivity change of the gas sensor due to the improvement of the sensitivity, the securing of the reliability, and the light scattering due to the high humidity.
1 to 7 are prior art drawings.
FIG. 8 shows a white-cell structure (1942, Journal of Optical Society of America) using three concave reflectors.
9 shows the path of light emitted from the center of the light source when the incident angle is 10 degrees, the angle between the two lenses is 4 degrees, the length of the right reflector is 4 cm, and the distance between the three concave reflectors is 8 cm.
Fig. 10 shows an optical structure using three concave reflectors based on Fig.
11 is a view showing a state in which the light emitted from the infrared light source is reflected by the fourth concave reflector d and the three concave reflectors a, b, c a predetermined number of times, This is the result of tracking.
12 is an exemplary view showing a configuration of a reflector.
Hereinafter, preferred embodiments according to the present invention will be described in detail with reference to the accompanying drawings.
The Beer-Lambert law, which is extensively applied to the fabrication and application of infrared gas sensors, can be expressed as Equation (1)
I0 is the initial light intensity, a is the light absorption coefficient of the specific gas, x is the gas concentration, and 1 is the light path.
In order to improve the output of the infrared gas sensor, Park and S.H. As shown in Equation (2) as presented in Yi's Sensors and Materials (2011 paper), incident light arriving at the infrared sensor is more effective to follow the condensed shape than the initial light pattern.
Where ξ is a proportional constant, ri is the radius of the initial light pattern, and rd is the radius of the light pattern at the sensor end.
As shown in the above-mentioned equations, there are some considerations to be considered in the fabrication of the optical gas sensor: 1) The light source capable of emitting infrared rays has a problem in that the light intensity is reduced due to aging of the self filament, 2) When measuring long gas wavelengths, the light emitted from the infrared light source is high-performance sensor that can sufficiently detect the light because of its low strength, or to improve the light intensity (3) and (3) the sensitivity of the infrared gas sensor must be long enough to generate a high output voltage difference at the same concentration, so that an optical structure should be manufactured with a long possible path, Minimizing the reflection in the structure minimizes the amount of absorption in the reflection at the structure You need to ensure that you can.
In order to fabricate an optical gas sensor, the structure should be equipped with 1) structure that can improve the measurement reliability by automatically correcting the output change of the gas sensor by observing the aging of the infrared light source, 2) 3) a structure in which the optical path is long, the reflection inside is to be minimized, a structure in which high-humidity gas is prevented from condensing in the optical reflector when the gas is introduced, 4) a structure in which infrared rays The incident light arriving at the sensor should have the feature of being collected at the center of the infrared sensor at the smallest possible radius.
Therefore, the present invention is characterized in the structure of an optical gas sensor and the arrangement of a light source and an optical sensor that can satisfy the above-described requirements.
The present invention is characterized by the structure of an optical gas sensor and the arrangement of a light source and an optical sensor which can satisfy most of the above-mentioned matters.
FIG. 8 shows a white-cell structure (1942, Journal of Optical Society of America) using three concave reflectors. By controlling the angle of incidence of the incident light to the reference line, the angle between the two reflectors on the same side of the left side (θ), the length of the right reflector (L), and the distance between the three reflectors (R) The optical path can be maximized through a plurality of light reflections.
9 shows the path of light emitted from the center of the light source when the incident angle is 10 degrees, the angle between the two lenses is 4 degrees, the length of the right reflector is 4 cm, and the distance between the three concave reflectors is 8 cm. As shown in FIG. 9, it can be seen that the light incident on the center axis shown in FIG. 8 and having an inclination of about 10 degrees is emitted to the lower right side through the reflection of 16 times in the three concave reflectors. At this time, the path of the light is approximately 1.2 m, and the incident light is radiated to the lower right after 15 reflections inside. At this time, it can be expected that about 60 of the incident light is emitted when the reflectance of the reflective surface is 0.97 (reflectance when gold is plated).
On the other hand, FIG. 10 shows an optical structure using three concave reflectors based on FIG. As shown, the two reflectors b and c having the same size are arranged at an arbitrary angle, one concave reflector a is placed on the corresponding surface, and a parabolic reflector (Electro Optical Technologies MIRL 17-900) having a first reflector and a fourth reflector so as to reach a position near a radiated position of the emitted light, The results of simulated analysis of the optical path reaching the sensor portion according to the incident light by disposing the detection sensor are shown in Fig.
11 is a view showing a state in which the light emitted from the infrared light source is reflected by the fourth concave reflector d and the three concave reflectors a, b, c a predetermined number of times, As a result of the tracking, it can be seen that the light reflected from the fourth concave reflector reaches directly to the detecting unit 2, and the infrared rays reflected through the three concave reflectors reach the detecting
In addition, the infrared thermopile for the gas to be measured is placed in the infrared ray detection unit (1) after passing through a long optical path, thereby causing a large voltage change with respect to the same gas concentration change as the optical path length becomes longer The output voltage ratio of the
On the other hand, when three concave reflectors having a predetermined thickness and a heating element are mounted on the rear surface of the fourth reflector and heated to about 30 to 40 degrees higher than the ambient temperature, a structure capable of preventing condensation of water vapor due to high- can do.
12 is a view for explaining the three concave reflectors and the fourth reflector according to FIG.
12, the concave reflector and the fourth reflector include a
The
Further, the
The insulating
In order to increase the optical efficiency, a structure capable of improving the sensitivity by increasing the output voltage by attaching a lens capable of transmitting and collecting the infrared light to the front of the
It will be apparent to those skilled in the art that various modifications and variations can be made in the present invention without departing from the spirit or scope of the present invention as defined by the following claims It can be understood that
111, 112: oval reflector 120: light source
130: optical sensor unit 210: optical sensor
310: primary light source 320: reference light source
330: infrared sensor 410: oval domed reflector
420: light source 430: light sensor
510, 520: Portion 610: Lens
620: Sensor 710: Structure
720: reflector 730: sensor
810: substrate 820: reflective film
830: thick film 831: insulating film
832: Heating element 833: Temperature sensor
Claims (7)
A concave reflector disposed on the surface corresponding to the two reflectors so as to be spaced apart from each other by a predetermined distance R;
An infrared light source disposed below the one concave reflector and having a parabolic reflector;
A first infrared ray detecting sensor disposed on the one concave reflector, the first infrared ray detecting sensor having the light emitted from the infrared ray source reflected through the two reflectors and the concave reflector and arriving with a long optical path;
A second infrared ray detection sensor disposed below the infrared ray source; And
And a fourth reflector disposed between the second infrared detection sensor and the two reflectors for directly transmitting a part of the light emitted from the infrared light source to the infrared detection sensor,
The two reflectors, the one concave reflector, and the fourth reflector,
A substrate formed to have a specific radius of curvature;
A reflection film formed on one side of the substrate and reflecting the infrared rays;
And a thick film including an insulating film formed on the other side of the substrate and a heating element formed on the insulating film.
Optical gas sensor for improved sensitivity and reliability.
The first and second infrared ray detection sensors may include:
An optical gas sensor for improved sensitivity and reliability, including an infrared thermopile with amplifier, filtering circuit and direct voltage output.
Wherein,
Optical gas sensor for improved sensitivity and reliability formed by Au / Ti or Au / Ni plated film.
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001027596A1 (en) | 1999-10-12 | 2001-04-19 | Nok Corporation | Co sensor |
JP2007322385A (en) * | 2006-06-05 | 2007-12-13 | Toyota Motor Corp | Gas analyzer, and sensor unit in gas analyzer |
JP4715759B2 (en) * | 2006-04-25 | 2011-07-06 | 株式会社島津製作所 | Moisture meter |
KR101088360B1 (en) | 2010-06-04 | 2011-12-01 | (주) 인바이런먼트 리딩 테크놀러지 | Optical wave guide having multiple independent optical path and ndir gas sensor using that |
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2015
- 2015-05-29 KR KR1020150076656A patent/KR101760031B1/en active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2001027596A1 (en) | 1999-10-12 | 2001-04-19 | Nok Corporation | Co sensor |
JP4715759B2 (en) * | 2006-04-25 | 2011-07-06 | 株式会社島津製作所 | Moisture meter |
JP2007322385A (en) * | 2006-06-05 | 2007-12-13 | Toyota Motor Corp | Gas analyzer, and sensor unit in gas analyzer |
KR101088360B1 (en) | 2010-06-04 | 2011-12-01 | (주) 인바이런먼트 리딩 테크놀러지 | Optical wave guide having multiple independent optical path and ndir gas sensor using that |
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