KR101731369B1 - Handler including freezing prevention device for shaft of precooling chamber - Google Patents
Handler including freezing prevention device for shaft of precooling chamber Download PDFInfo
- Publication number
- KR101731369B1 KR101731369B1 KR1020150181828A KR20150181828A KR101731369B1 KR 101731369 B1 KR101731369 B1 KR 101731369B1 KR 1020150181828 A KR1020150181828 A KR 1020150181828A KR 20150181828 A KR20150181828 A KR 20150181828A KR 101731369 B1 KR101731369 B1 KR 101731369B1
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- KR
- South Korea
- Prior art keywords
- air
- block
- shaft
- heating
- handler
- Prior art date
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2865—Holding devices, e.g. chucks; Handlers or transport devices
- G01R31/2867—Handlers or transport devices, e.g. loaders, carriers, trays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2877—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to cooling
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B2214/00—Aspects relating to resistive heating, induction heating and heating using microwaves, covered by groups H05B3/00, H05B6/00
- H05B2214/02—Heaters specially designed for de-icing or protection against icing
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- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a handler device used for inspecting semiconductor devices, and more particularly, to a device for preventing freezing of a shaft when driving a pre-cooling chamber of a handler device.
In general, memory or non-memory semiconductor devices and integrated circuit modules that circuitly configure them on a substrate are shipped after various testing processes after production. The term " handler " refers to a device used for electrically connecting such a semiconductor device or an integrated circuit module to an external test device for inspection.
(Patent Document 1) KR 10-0560729 B
On the other hand, the handler device can perform not only a general performance test in which a semiconductor device or an integrated circuit module to be inspected is performed at a normal temperature, but also a normal function in an environment of high temperature and low temperature using an electrothermal heater and liquefied nitrogen in a closed test chamber To test whether it is possible to perform the test.
Normally, such a handler apparatus includes a preheating / preheating chamber for preheating and preheating an object to be inspected, a test chamber for performing a test, and a deep-roasting chamber for returning to a normal temperature.
Referring to FIG. 1, a process of moving from the preheating /
On the other hand, the conditions required for such semiconductor devices are becoming severe, and in recent years, it has been examined whether the semiconductor device performs normal performance under extreme conditions at minus 30 degrees Celsius (° C) to 55 degrees Celsius. In this case, there arises a problem that freezing occurs in the
The present invention relates to a handler apparatus for inspecting semiconductor devices, and more particularly to a handler apparatus for inspecting semiconductor devices by freezing a shaft for conveying a plurality of trays in a pre- Which is capable of preventing the occurrence of a defrosting phenomenon in the pre-cooling chamber of the handler device.
The objects of the present invention are not limited to the above-mentioned objects, and other objects not mentioned can be clearly understood from the following description.
The present invention relates to an apparatus for preventing freezing of a shaft for a pre-cooling chamber of a handler apparatus, comprising: an air jet opening which is arranged so as to surround an outer side of a shaft for transporting a plurality of trays in the pre- And an air compressor for injecting air into the heating block.
Here, when the pre-cooling chamber includes a plurality of shafts, it is preferable that a plurality of the air ejection openings are fastened to each of the plurality of shafts.
The apparatus may further include a distributor for distributing heated air supplied from the heating block to each of the plurality of air injection openings, and further disposed between the heating block and the air compressor Gt; filter < / RTI > Here, the filter may be a filter that removes moisture or dust from the air supplied from the air compressor.
Furthermore, it is preferable that the air jet opening has at least one jet hole for injecting heated air into the inner side surface through which the shaft passes.
In addition, the heating block may include a metal block formed of a metal having a high thermal conductivity and having an air flow path formed therein, and a heating rod heating the metal block. The metal blocks may include a first block and a second block which are connected to each other. In this case, the first block and the second block are coupled to each other on one side of the first block and the second block, As shown in Fig. In addition, it is preferable that the air flow path formed in the metal block is formed in a zigzag shape.
Conventionally, as a result of icing on a shaft that is pulled in and pulled out by a pre-cooling chamber which is a low-temperature environment at a low temperature of about minus 55 degrees Celsius, test operation time by the handler device is reduced, The durability of the shaft was deteriorated by the stress caused by the temperature difference. However, by using the apparatus for preventing freezing of the shaft according to the present invention, it is possible not only to sufficiently secure the operation time for inspecting the semiconductor element by the handler, but also to maintain the durability of the shaft. Further, as the pre-cooling chamber is smoothly driven to a cryogenic environment, the product family of semiconductor devices that can be tested through the handler device can be further diversified.
FIG. 1 is a schematic view of a main part of a conventional handler device. FIG. 1 is a view illustrating a process in which a preheated or precooled tray is sequentially drawn into a test chamber through a preheating / preheating chamber.
2 is a schematic view of a shaft anti-freezing apparatus for a pre-cooling chamber of a handler device according to the present invention.
3 and 4 are a perspective view and a partial cross-sectional view showing a state in which an air nozzle is mounted on a shaft in a shaft anti-freezing apparatus for a pre-cooling chamber of a handler device according to the present invention.
5 is a perspective view showing an embodiment of an air ejection opening usable in the apparatus for preventing ice formation in a preheating chamber of a handler apparatus according to the present invention.
6 is a perspective view showing an embodiment of a heating block usable in a shaft anti-freezing device for a pre-cooling chamber of a handler device according to the present invention.
7 is a cross-sectional view showing an embodiment of a distributor usable in a shaft anti-freeze apparatus for a pre-cooling chamber of a handler apparatus according to the present invention.
While the present invention has been described in connection with certain exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, is intended to cover various modifications and similarities. It should be understood, however, that the invention is not intended to be limited to the particular embodiments, but includes all modifications, equivalents, and alternatives falling within the spirit and scope of the invention.
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, the present invention will be described in detail with reference to the accompanying drawings. In addition, numerals (e.g., first, second, etc.) used in the description of the present invention are merely an identifier for distinguishing one component from another.
Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
2 to 3, the apparatus for preventing freezing of a shaft for a pre-cooling chamber of a handler apparatus according to the present invention is configured to surround the outside of a
More specifically, the air injected from the
3 and 4 are a perspective view and a partial cross-sectional view showing a state in which the
Next, the normal-temperature air supplied by the
The heated air passing through the
In addition, a
Conventionally, as a result of icing on a shaft that is pulled in and pulled out by a pre-cooling chamber which is a low-temperature environment at a low temperature of about minus 55 degrees Celsius, test operation time by the handler device is reduced, The durability of the shaft was deteriorated by the stress caused by the temperature difference. However, by using the apparatus for preventing freezing of the shaft according to the present invention, it is possible not only to sufficiently secure the operation time for inspecting the semiconductor element by the handler, but also to maintain the durability of the shaft. Further, as the pre-cooling chamber is smoothly driven to a cryogenic environment, the product family of semiconductor devices that can be tested through the handler device can be further diversified.
While the present invention has been particularly shown and described with reference to exemplary embodiments thereof, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the invention. It is therefore to be understood that the embodiments of the invention described herein are to be considered in all respects as illustrative and not restrictive, and the scope of the invention is indicated by the appended claims rather than by the foregoing description, Should be interpreted as being included in.
Claims (8)
And a plurality of shafts which are drawn into and pulled out from the pre-cooling chamber to transport a plurality of trays in the pre-cooling chamber,
A plurality of air ejection openings arranged outside the pre-cooling chamber so as to surround the outside of each of the plurality of shafts; A heating block for supplying heated air to each of the plurality of air ejection openings; And an air compressor for injecting air into the heating block,
Wherein each of the plurality of air jetting openings is formed with at least one jetting hole for jetting warmed air to the outer surface of each of the plurality of shafts.
Wherein the shaft anti-icing device further comprises a distributor for distributing the warmed air supplied from the heating block to each of the plurality of air ejection openings.
Wherein the shaft anti-icing device further comprises a filter disposed between the heating block and the air compressor and adapted to remove moisture or dust from the air supplied from the air compressor.
In the heating block,
A metal block formed of a metal having excellent thermal conductivity and having an air flow path formed therein; And
A heating rod for heating the metal block;
The handler device comprising:
Wherein the metal block includes a first block and a second block which are interconnected with each other,
Wherein the first block and the second block are coupled to each other on one side of the first block and the second block so as to be coupled to each other to form an air flow passage.
Wherein the air flow path is formed in a zigzag shape.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020150181828A KR101731369B1 (en) | 2015-12-18 | 2015-12-18 | Handler including freezing prevention device for shaft of precooling chamber |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150181828A KR101731369B1 (en) | 2015-12-18 | 2015-12-18 | Handler including freezing prevention device for shaft of precooling chamber |
Publications (1)
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KR101731369B1 true KR101731369B1 (en) | 2017-04-28 |
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Family Applications (1)
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KR1020150181828A KR101731369B1 (en) | 2015-12-18 | 2015-12-18 | Handler including freezing prevention device for shaft of precooling chamber |
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Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100993877B1 (en) * | 2009-07-16 | 2010-11-11 | 손한봉 | Heater |
JP2012112875A (en) * | 2010-11-26 | 2012-06-14 | Orion Mach Co Ltd | Environmental test device |
-
2015
- 2015-12-18 KR KR1020150181828A patent/KR101731369B1/en active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100993877B1 (en) * | 2009-07-16 | 2010-11-11 | 손한봉 | Heater |
JP2012112875A (en) * | 2010-11-26 | 2012-06-14 | Orion Mach Co Ltd | Environmental test device |
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