KR101726067B1 - Magnetic particle testing apparatus - Google Patents

Magnetic particle testing apparatus Download PDF

Info

Publication number
KR101726067B1
KR101726067B1 KR1020150116513A KR20150116513A KR101726067B1 KR 101726067 B1 KR101726067 B1 KR 101726067B1 KR 1020150116513 A KR1020150116513 A KR 1020150116513A KR 20150116513 A KR20150116513 A KR 20150116513A KR 101726067 B1 KR101726067 B1 KR 101726067B1
Authority
KR
South Korea
Prior art keywords
magnetic particle
core portions
magnetic
core
particle inspection
Prior art date
Application number
KR1020150116513A
Other languages
Korean (ko)
Other versions
KR20170022049A (en
Inventor
강수동
Original Assignee
강수동
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 강수동 filed Critical 강수동
Priority to KR1020150116513A priority Critical patent/KR101726067B1/en
Publication of KR20170022049A publication Critical patent/KR20170022049A/en
Application granted granted Critical
Publication of KR101726067B1 publication Critical patent/KR101726067B1/en

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/83—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields
    • G01N27/84—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws by investigating stray magnetic fields by applying magnetic powder or magnetic ink
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6447—Fluorescence; Phosphorescence by visual observation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8803—Visual inspection
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F13/00—Apparatus or processes for magnetising or demagnetising

Landscapes

  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Abstract

In the present invention, a magnetic particle inspection apparatus is used to inspect a defective portion of a test object by a magnetic particle inspection method, and subsequently, the magnetic force remaining on the test object is removed by removing magnetic force, So that the magnetic particle inspection method can be carried out quickly and easily regardless of the type and size of the object to be inspected.

Description

{MAGNETIC PARTICLE TESTING APPARATUS} MAGNETIC PARTICLE TESTING APPARATUS USING MAGNETIC PARTICLE TESTING APPARATUS

The present invention relates to a magnetic particle inspection apparatus and method, which is one of non-destructive inspection methods for detecting defects in an industrial machine or a production part. More particularly, the present invention relates to a magnetic particle inspection apparatus and method, The present invention relates to a method for inspecting a magnetic particle test using a magnetic particle combiner and a demagnetizing machine.

As is well known, non-destructive inspection methods are generally used to confirm the presence or absence of defects in a subject without destroying general industrial machinery or production parts (hereinafter referred to as "subject"). There are various test methods such as test method, ultrasonic test method, visual test method, and magnetic particle test method.

Magnetic particle inspection is a method for detecting discontinuities on the surface or under the surface of a test object by magnetizing the test object and applying magnetic particles to the defect portion of the test object so that the shape of the defect (that is, The position, size, shape and height at which the outline of the discontinuous portion is formed due to the impurities) is visually inspected to confirm the defect of the inspection object. Such magnetic particle inspection is widely used in manufacturing inspection, in-service inspection or final quality control in all industrial fields such as forging products, casting products, welded parts, and finished products since defect detection is easy and simple.

FIG. 1 is a conceptual view showing the operation principle of a magnetic particle inspection apparatus according to the prior art. Referring to FIG. 1, in a conventional magnetic particle inspection apparatus, a magnetic field is generated when a coil 2 is wound around both ends of an iron core 1 in the form of a letter, and a magnetic field is generated in the interior of the subject Infiltrate. At this time, if there is a defect in the subject, different stimuli are generated in the subject due to the gap or space of the defect, so that a distorted phenomenon occurs that the magnetic field can not pass immediately and the stimulus is divided into two And the defects in the vicinity of the surface or the surface of the object are detected.

The magnetic particle inspection can be divided into a linear magnetization and a circular magnetization according to a magnetization method. The linear magnetization includes a yoke method and a coil method. The circular magnetization furnace includes a prod method (Prod) (Head Shot), and a central conductor method (Central Coil). Such magnetic particle inspection is suitable for surface group heat inspections, and it is quick, simple, and it is possible to observe the defect shape directly on the surface and to observe it with naked eyes, it does not depend on the size and shape of the object and does not require precise pretreatment Etc., it is widely used in the field of product quality evaluation of industrial sites and diagnosis of facilities all over the world at present.

However, in the magnetic particle inspection apparatus of the related art constructed as described above, the magnetic force is removed by magnetizing the object to be inspected, defects are detected, and then the magnetism remaining on the object is removed to remove the magnetic force. Generally, It is necessary to align the workpiece before demagnetization in order to complete demagnetization. However, since the material which is not demagnetized is not well aligned, there is a problem in that it is difficult to perform a complete demagnetization.

Conventionally, two devices, specifically a magnetic particle detection device and a demagnetizing device, must be separately formed for inspecting an object to be inspected and for demagnetizing. In the case of a material which is not magnetized well, very high electric power is required for magnetization In addition, since it is mostly a contact type, continuous operation is impossible and productivity has been disadvantageously deteriorated.

Particularly, conventionally, since the polarity is formed by the DC voltage fixed in the longitudinal direction of the object to be inspected, the N and S poles approach to the center line of the object to be examined, The poles gradually move away from each other and the magnetic particle test fails to be performed. In the end, in order to solve this problem, in the past, high electric power has to be supplied, so that it is inevitably required to supply electricity by directly contacting the object to be inspected. As the high fixed DC voltage flows in only one direction as described above, the fixation of the atoms of the object under test becomes more severe, so that the disassembly operation becomes more difficult.

Registered Utility Model Registration No. 20-0281305 (Name of Design: Magnetic Particle Inspection Apparatus. Date of Notification: July 13, 2002) Patent Publication No. 10-1996-0014933 (entitled Magnetic Particle Detection Magnetizing Apparatus, Published Date: May 22, 1996) Publication No. 10-2014--0048414 (Magnetic particle inspection apparatus with a plurality of variable magnetization coils) Publication date: Apr. 24, 2014 Open No. 10-2004-0088504 (entitled "Fluorescent Magnetic Particle Inspection Device and Fluorescent Magnetic Particle Detection Method") Published Oct. 16, 2004

The present invention has been made in order to solve the problems of the conventional art as described above, and it is an object of the present invention to provide a magnetic particle inspection apparatus and a magnetic particle inspection apparatus, which can detect magnetic particles in a defective portion of a subject, And to provide a magnetic particle inspection method using a common demagnetizer.
It is another object of the present invention to provide a magnetic particle inspection method using a magnetic particle detector and a demagnetizer capable of inspecting a defective portion of a test object by a magnetic particle test even with a low power source.

delete

The present invention relates to a fluorescence analyzer comprising a fluorescence analyzer for inspecting a fluorescent substance fraction on a surface of a subject, a core for generating a magnetic force on the subject, a test light for inspecting a defect portion of the subject passing through the core, An AC supply switch for supplying an AC voltage to the core portion; a switch for supplying an AC voltage to the core portion; And a converter for continuously supplying the converted DC to the core portion.

According to another aspect of the present invention, there is provided a method of manufacturing a semiconductor device, comprising: transferring an object to be inspected through a conveyor to a core portion; continuously supplying a direct current to the core portion in response to switching of a DC supply switch to generate a magnetic force in the object; A step of inspecting a cadaver for a defective portion by a magnetic particle inspection method, a step for conveying the object to be inspected to the core portion side by reversing the conveyor, and a step for supplying AC electric power to the core portion by switching the AC supply switch, And removing the remaining magnetic force.

A magnetic particle inspection apparatus for inspecting a defective portion of a subject by a magnetic particle inspection method quickly and accurately using a magnetic particle inspection apparatus, and capable of continuously demagnetizing a magnetic force remaining on a subject after magnetic particle inspection .

In this way, continuous operation is possible, magnetic analysis can be carried out even at low power without high power in magnetization, and frequency and voltage can be changed irrespective of the type and size of the object, There is a synergistic effect that the defective portion of the object can be accurately inspected and demagnetized.

FIG. 1 is a conceptual view illustrating an operation principle of a magnetic particle inspection apparatus according to the related art.
2 is a view showing a mechanical configuration of a magnetic particle inspection apparatus in which magnetic particle inspection and dematching operations are continuously performed according to a preferred embodiment of the present invention.
Fig. 3 is a circuit diagram showing the circuit configuration of the magnetic particle inspection apparatus shown in Fig. 2. Fig.
FIG. 4 is a view showing a method of inspecting a defective portion of a test object by a magnetic particle inspection method using the magnetic particle inspection apparatus shown in FIG. 2. FIG.
FIGS. 5A and 5B are views showing the magnetic particle testing method shown in FIG. 4 in detail.
FIG. 6 is a view showing a method of continuously demagnetizing a subject after magnetic particle inspection using the magnetic particle inspection apparatus shown in FIG. 2. FIG.

Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. In the following detailed description, one exemplary embodiment of the present invention will be described in order to accomplish the above-mentioned technical problems. And other embodiments which may be presented by the present invention are replaced by descriptions in the constitution of the present invention.
In the present invention, a magnetic particle inspection apparatus is used to inspect a defective portion of a test object by a magnetic particle test even with a low power source, and then the magnetic force remaining on the test object is removed by removing magnetic force, And a voltage can be converted so that a magnetic particle inspection method can be quickly and easily performed irrespective of the type of an object to be inspected.

FIG. 2 and FIG. 3 are views showing a configuration of a magnetic particle inspection apparatus for performing a demagnetizing operation successively after magnetic particle inspection of an object to be inspected according to a preferred embodiment of the present invention. The magnetic particle inspection apparatus according to the present invention does not separately constitute the magnetic particle detector and the demagnetizer as in the prior art but inspects the defective portion of the subject using one magnetic particle inspection apparatus as shown in FIG. So that it is possible to carry out a demagnetizing operation. In the following, I will present this in detail.
Referring to FIGS. 2 and 3, the magnetic particle inspection apparatus 10 according to the present invention constitutes a conveyor 12 for conveying the test object A in the longitudinal direction. The conveyor 12 serves to transfer the test object A to the core portions 16 and 18 and the test light 20 when inspecting the defective portion of the test object A by the magnetic particle analysis method, And transfers the subject A in the opposite direction (that is, backward) to remove the magnetic force remaining on the subject A after the flaw detection inspection. Such operation of the conveyor 12 can be operated in a forward / reverse direction using a normal motor.
The conveyor 12 is installed at the upper end of the frame 11 as shown in FIG. 2 and is provided on the bottom of the frame 11 so as to freely move the magnetic particle inspection apparatus 10 of the present invention. A caster can be installed. Further, the conveyor 12 can be configured to rotate the subject A freely (for example, 360 degrees) during magnetic particle inspection or demagnetization.
In the center of the conveyor 12 described above, a removable magnet corresponding to an essential component of the present invention is installed. Specifically, a core (not shown) for inspecting the test subject A by a magnetic particle inspection method, (16, 18), respectively. The core portions 16 and 18 are formed in a rectangular shape and installed at the upper and lower ends, respectively. That is, as shown in FIG. 5A, the core portions 16 and 18 are formed by forming an iron core 16a in the central portion and winding the coil 16b on the iron core 16a. In the coil portion 16b, Voltage or alternating voltage is supplied.
At this time, when the converted DC voltage is supplied from the outside, the core portions 16 and 18 generate a magnetic field to inspect defective portions of the object A passing through the core portions 16 and 18 by a magnetic particle analysis method, When the AC voltage is supplied after the magnetic particle inspection, the generated magnetic field is removed, and at the same time, the demagnetizing operation for removing the magnetic force remaining in the object (A) passing through the core portions (16, 18) is performed. The specific operation of the core portions 16 and 18 will be easily understood by the detailed description of FIGS. 4 to 6 to be described later.
On the other hand, on both sides of the above-described core portions 16 and 18, a normal fluorescent material portion inspecting portion 14 is provided. The fluorescent material inspecting portion 14 forms a fluorescent material magnetic particle test liquid on the surface of the magnetized subject A It plays a role of injecting. Here, the fluorescence analyzer 14 is a method applied to a conventional magnetic particle inspection. Specifically, in general, the magnetic particle inspection uses a fluorescence method using a magnetic material coated with a fluorescent material and a magnetic material coated with a general coating material And the fluorescence method is a method of searching for a defect position and a distribution of an object by irradiating ultraviolet rays to emit a fluorescent material, and the non-fluorescent method is a method of illuminating a general illumination device to search for a defect position and a distribution of the object to be inspected . The fluorescence analyzer 14 according to the present invention is a magnetic particle test applied to the fluorescence method.
A normal test light 20 is provided at one side of the core portions 16 and 18 and the test light 20 is irradiated with a fluorescent light so as to determine whether there is a defective portion such as a crack in the test object A, Inspection. This is also a typical component of the magnetic particle inspection apparatus, so the technical structure of the test beam 20 will not be described in detail in the description of the present invention.
In the magnetic particle inspection apparatus 10 according to the present invention, technical configurations and operational states of core parts 16 and 18 corresponding to essential components will be described in detail with reference to FIGS. 3 and 4 to 6 I want to.
The core portions 16 and 18 according to the present invention are each formed by winding a coil 16b around a bobbin (or an iron core) 16a, and are installed at regular intervals above / below. The core portions 16 and 18 generate a magnetic force or break a magnetic force by the electric circuit diagram shown in FIG. 3. Specifically, when the DC voltage is supplied, a magnetic force is generated to magnetize the subject A, When the AC voltage is supplied, the magnetic force is broken to remove the strong magnetic force remaining on the object (A).
3, when a DC voltage is supplied from the outside, the converter (converter) 50 continuously sends conversion signals to the IGBT 1 and IGBT 2, and the IGBT 1 and the IGBT 2 supply a conversion DC to the coil sections 16 and 18 (That is, supplying while continuously changing '+' and '-').
The IGBT 1 and the IGBT 2 are connected to two switches. Specifically, the IGBT 1 and the IGBT 2 are provided with a DC supply switch MC 1 for supplying a DC voltage to the core units 16 and 18, Is connected to an AC supply switch (MC2: 54) for supplying a voltage. The DC supply switch (MC1: 52) supplies a DC voltage from the outside to continuously flow an alternating current through the core portions (16, 18) so as to form a strong magnetic force, thereby passing through the core portions And magnetizes the object (A) to be inspected. The AC supply switch MC2 54 supplies an AC voltage from the outside to generate an inductive current in the core portions 16 and 18 to generate an induced current in the subject A passing through the core portions 16 and 18, It breaks down the magnetic force and makes it extinguish.
Hereinafter, the operation of the present invention, preferably magnetic particle inspection and demagnetization, will be described in detail with reference to Figs. 4 to 6. Fig.
2 to 5A, a method of inspecting a defective portion of an object to be inspected A by magnetic particle inspection will be described.
The object to be inspected A is conveyed toward the core portions 16 and 18 by the conveyor 12 and the core units 16 and 18 are supplied with converted DC Uniform and strong magnetic force is generated in the core portions 16 and 18 and the subject A passing through the core portions 16 and 18 is magnetized due to a strong and uniform magnetic force . At this time, the subject (A) passes through the core portions (16, 18) while the fluorescent material injected through the fluorescent material analyzer (14) is on the surface. Thereafter, the object (A) passed through the core portions (16, 18) is inspected for defective portions through the test light (20).
At this time, as shown in FIGS. 5A and 5B, DC voltages are alternately supplied to the core portion 16, and more specifically, '+' and '-' are continuously supplied to the core portions 16 and 18, Continuous conversion to pole and S pole produces strong magnetic force. That is, the converted DC current is supplied to the core portions 16 and 18 so that the N / S poles in the both core portions are continuously converted at the intersection. Thus, the converted DC current And the polarity is formed. Therefore, the object to be inspected A is narrowed uniformly and tightly as a whole, so that the magnetic particle can be detected with a low power supply. In order to prevent the one-way fixation of the atoms by the intersecting DC voltage during the magnetic particle test, it is possible to complete the demagnetization afterwards.
Next, the inspected object A having undergone the magnetic particle inspection is reversed in the reverse direction by the conveyor 12. At this time, when the AC supply switch MC2 54 shown in FIG. 3 is switched on, As shown in the drawing, the AC power is supplied to the core portions 16 and 18, so that an induced current is generated in the core portions 16 and 18, and the subject A passing through the core portions 16 and 18 The demagnetization is performed.
As described above, according to the present invention, a defective portion of the object (A) is inspected by the magnetic particle method using one magnetic particle inspection apparatus, and the strong magnetic force remaining in the object (A) is continuously removed.
In the present invention, as shown in FIG. 4, it is preferable to vary the intensity of the magnetic force according to the type of the object A when continuously supplying the direct current to the core portions 16 and 18. For this purpose, Thereby constituting a frequency converter 22. That is, the direct current frequency converter 22 is composed of a frequency conversion dial 24 and a voltage conversion dial 26. By varying the dials 24 and 26, It can be inspected by the inspection method. In the following Table 1, the frequency value and the current value are specifically shown according to the type of the object (A).
The type of the object (A) to be inspected Voltage value (V) Frequency value (Hz) Small Gear Products 60 40 Small shaft products 65 45 Medium Gear Products 100 70 Medium Shaft Products 105 75 Large Gear Products 150 100 Large shaft products 160 150

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

delete

10: magnetic particle inspection apparatus 12: conveyor
14: fluorescence analyzer 16, 18: core
20: test light 22: DC frequency converter
24: frequency conversion dial 26: voltage conversion dial

Claims (2)

delete (16) for generating a magnetic force in the subject (A), and a core portion (16, 18) for generating a magnetic force in the subject (A) A test light 20 for inspecting a defective portion of the inspection object A that has passed through the core portions 16 and 18, a conveyor 12 for conveying the inspection object A, An AC supply switch 54 for supplying an AC voltage to the core units 16 and 18 and a DC voltage supply switch 54 for supplying AC voltage to the core units 16 and 18 in accordance with switching of the DC supply switch 52. [ The defective portion of the object (A) is inspected by a magnetic particle method using a magnetic particle counter and a demagnetizer configured to continuously supply a DC converted to the core portions (16, 18) (A), the method comprising:
Conveying the object (A) to the core portions (16, 18) through the conveyor (12);
The DC current is continuously supplied to the core portions 16 and 18 in accordance with the switching of the DC supply switch 52 to continuously convert the core portions 16 and 18 to the N and S poles, Generating a magnetic force in the magnetic field (A);
Inspecting the defective portion of the object (A) by magnetic particle analysis;
Moving the conveyor (12) backward to convey the subject (A) toward the core portions (16, 18);
The AC power is supplied to the core portions 16 and 18 in accordance with the switching of the AC supply switch 54 to generate induction currents in the core portions 16 and 18 to pass through the core portions 16 and 18 And removing the magnetic force remaining on the object (A) to be inspected.
KR1020150116513A 2015-08-19 2015-08-19 Magnetic particle testing apparatus KR101726067B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020150116513A KR101726067B1 (en) 2015-08-19 2015-08-19 Magnetic particle testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020150116513A KR101726067B1 (en) 2015-08-19 2015-08-19 Magnetic particle testing apparatus

Publications (2)

Publication Number Publication Date
KR20170022049A KR20170022049A (en) 2017-03-02
KR101726067B1 true KR101726067B1 (en) 2017-04-26

Family

ID=58426505

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020150116513A KR101726067B1 (en) 2015-08-19 2015-08-19 Magnetic particle testing apparatus

Country Status (1)

Country Link
KR (1) KR101726067B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102387445B1 (en) * 2022-02-11 2022-04-18 유영검사 주식회사 Magnetization device for non-destructive testing provided with heat deformation prevention structure of insulation housing

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003344359A (en) 2002-05-28 2003-12-03 Sumitomo Metal Ind Ltd Method and apparatus for magnetic particle inspection
KR100634591B1 (en) 2004-04-08 2006-10-16 현대자동차주식회사 Apparatus for automatically testing fluorescent magnetic powder for forgings
JP2007033043A (en) 2005-07-22 2007-02-08 Nippon Denji Sokki Kk Portable-type magnetic particle flaw detector

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08110322A (en) 1994-10-11 1996-04-30 Eishin Kagaku Kk Magnetic powder flaw detection magnetizing apparatus
KR100667141B1 (en) 2002-02-19 2007-01-12 신닛뽄세이테쯔 카부시키카이샤 Fluorescent magnetic flaw detector and fluorescent magnetic flaw detecting method
KR200281305Y1 (en) 2002-03-27 2002-07-13 세안기술 주식회사 Magnetic inspection tester

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003344359A (en) 2002-05-28 2003-12-03 Sumitomo Metal Ind Ltd Method and apparatus for magnetic particle inspection
KR100634591B1 (en) 2004-04-08 2006-10-16 현대자동차주식회사 Apparatus for automatically testing fluorescent magnetic powder for forgings
JP2007033043A (en) 2005-07-22 2007-02-08 Nippon Denji Sokki Kk Portable-type magnetic particle flaw detector

Also Published As

Publication number Publication date
KR20170022049A (en) 2017-03-02

Similar Documents

Publication Publication Date Title
EP2455752B1 (en) Equipment for detection of defects in rotary metal bodies by a magnetic powder method
JPH01203965A (en) Inspector for material to be inspected made of non-ferromagnetic metal
KR200492382Y1 (en) Dual Type Magnetic Particle Detection Inspection System
CN105758932A (en) Magnetic powder flaw detection technology
KR20150138751A (en) Method and Magnetic Particle Inspection Equipment
US8575923B1 (en) Method and apparatus for special end area inspection
Gao et al. Multidirectional magneto-optical imaging system for weld defects inspection
KR101726067B1 (en) Magnetic particle testing apparatus
CN103424467B (en) A kind of steel pipe magnetic flaw detection automatic testing method and device
EP3821989A1 (en) Online automation measurement system for claw-pole overall magnetic property
CN113068448B (en) Magnetic powder inspection method and device for inner surface of aircraft cylinder part
CN215005118U (en) Vertical two-in-one magnetic powder inspection equipment for large bearing ring
CN103698392A (en) Pull rivet resultant magnetization grouping flaw detection method and pull rivet resultant magnetization grouping flaw detection device
US10151729B2 (en) Apparatus and method for detection of imperfections by detecting changes in flux of a magnetized body
JP2015203622A (en) Portable interpole-type magnetic particle flaw detector and operation method thereof
CN103207233A (en) Magnetizer of large gear ring workpiece magnetic particle flaw detector
US9349516B2 (en) Multidirectional magnetic particle inspection system
US4482865A (en) Apparatus for the automatic inducement of a magnetic field in an elongated article under test
WO2009123847A1 (en) Apparatus and method for non-destructive testing of ferromagnetic workpieces
CN203148895U (en) Magnetizing device of magnetic particle flaw detector for big gear ring workpieces
US2401467A (en) Method of and apparatus for magnetic testing
US2428471A (en) Magnetic testing method and apparatus
JPH06174696A (en) Magnetizer for detecting flaw using magnetic powder
CN201927450U (en) Circumferential and longitudinal full sensing composite magnetizing system for train wheel and axle
CN210015079U (en) Three-dimensional rotating magnetic field magnetizing device for integral flaw detection of bogie frame

Legal Events

Date Code Title Description
AMND Amendment
X701 Decision to grant (after re-examination)
GRNT Written decision to grant