KR101689521B1 - Test socket - Google Patents
Test socket Download PDFInfo
- Publication number
- KR101689521B1 KR101689521B1 KR1020150120138A KR20150120138A KR101689521B1 KR 101689521 B1 KR101689521 B1 KR 101689521B1 KR 1020150120138 A KR1020150120138 A KR 1020150120138A KR 20150120138 A KR20150120138 A KR 20150120138A KR 101689521 B1 KR101689521 B1 KR 101689521B1
- Authority
- KR
- South Korea
- Prior art keywords
- plate
- intermediate plate
- test
- engaging
- product
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Connecting Device With Holders (AREA)
Abstract
The present invention relates to a test method for preventing a test failure of a product to be tested by the magnetic force or preventing a decrease in the test precision of a product by temporarily testing the product to be tested including a permanent magnet, The test socket comprising: a first plate having a first hinge portion and a product seating portion on which the test product is mounted; A second plate having a second hinge portion and including a pin block connected to a connection terminal of the test product; A hinge pin coupled to the first and second hinge portions to rotate the first plate and the second plate; An intermediate plate interposed between the first and second plates and including a third hinge portion coupled to the hinge pin, the intermediate plate covering at least a portion of the test article; And an engaging portion for engaging the intermediate plate with the first plate.
Description
The present invention relates to a test socket.
In general, portable communication devices such as a smart phone, a tablet PC, and a game machine are equipped with an ultra-small camera module for taking a picture or a moving picture.
The recently developed ultra-small camera module includes a voice coil motor (VCM) mounted on an image sensor and an image sensor for converting external incident light into an image or a moving image and performing an auto focusing function and an anti-shake function.
In particular, the voice coil motor (VCM) includes a lens actuator that performs a focusing operation by operating a lens and a lens, and the lens actuator includes a bobbin having a lens mounted thereon, a coil wound around the bobbin to generate an electromagnetic force, A permanent magnet and a leaf spring for elastically supporting the bobbin.
In a very small camera module having a very small size, a test is performed after assembling a plurality of parts.
Generally, in order to test an ultra-small camera module, a test socket such as Korean Registered Patent No. 10-1199018 and a test socket for a camera module (registered on Nov. 1, 2012) is used.
A test socket for a camera module disclosed in Korean Patent No. 10-1199018 discloses a technique in which an intermediate cover is further included between a base frame and a cover frame.
A test socket for a camera module disclosed in Korean Patent No. 10-1199018 is a test socket for a camera module in which a product to be tested is fixed to a cover frame, a middle cover is fixed to a magnet mounted on the cover frame, The test is performed after being rotated by the base frame.
However, in the test socket for camera module disclosed in Korean Patent No. 10-1199018, the intermediate cover and the cover frame are fixed by the magnetic force by the magnet.
When fixing the middle cover and the cover frame with magnets, the permanent magnet of the voice coil motor (VCM) built in the ultra-small camera module to be tested is placed in contact with the voice coil motor (VCM) The lens can be tilted from a designated position, which may cause a test failure of the ultra-small camera module.
In the test socket for a camera module disclosed in Korean Patent No. 10-1199018, the lens of the ultra-small camera module is arranged to face the inner side of the cover frame, and the connection terminal connected to the camera module is also placed facing the inner side of the cover frame do.
When the connection terminal connected to the camera module is arranged to face the inner surface of the cover frame, the test socket for the camera module disclosed in Korean Patent No. 10-1199018 requires that the circuit board and the circuit board are included in the cover frame And it is necessary to use two circuit boards, so that the configuration of the test socket becomes complicated and the manufacturing cost of the test socket increases.
In addition, when the operator manually inserts the lens portion of the camera module into the receiving groove formed in the cover frame for testing, when the lens of the camera module touches the cover frame due to the operator's mistake, Scratches are generated on the lens portion, thereby causing defective appearance of the good camera module.
The present invention relates to a test method for preventing a test failure of a product to be tested by the magnetic force or preventing a decrease in the test precision of a product by temporarily testing the product to be tested including a permanent magnet, Socket.
The present invention relates to a test socket for preventing scratches from being generated in a product by preventing a part which is likely to be scratched from being brought into contact with a test performing part during testing, to provide.
The present invention provides a test socket which improves the terminal arrangement of the parts to be tested so that the test can be performed using only one circuit board without using two circuit boards, thereby lowering the manufacturing cost due to the reduction in the number of parts.
In one embodiment, the test socket includes a first plate having a first hinge portion and a product seating portion on which the test product is mounted; A second plate having a second hinge portion and including a pin block connected to a connection terminal of the test product; A hinge pin coupled to the first and second hinge portions to rotate the first plate and the second plate; An intermediate plate interposed between the first and second plates and including a third hinge portion coupled to the hinge pin, the intermediate plate covering at least a portion of the test article; And an engaging portion for engaging the intermediate plate with the first plate.
The engaging portion of the test socket includes a first engaging portion including an elastic member coupled to a side surface of the first plate and a latch protrusion coupled to the elastic member and partially protruding from the side surface; And a second engaging portion including an engaging groove recessed in the intermediate plate so that the engaging protrusion is caught.
Wherein the engaging portion of the test socket has a first engaging portion including an elastic member accommodated in a side surface of the intermediate plate and a locking protrusion coupled to the elastic member and protruding from the side surface partly; And a second engaging portion including an engaging groove recessed in the first plate so that the engaging protrusion is caught.
On the inner surface of the first plate of the test socket, a receiving groove for receiving the intermediate plate is formed.
The intermediate plate of the test socket includes a cushioning member in the form of a sheet disposed on a surface that is in contact with the inner surface of the first plate.
The second plate of the test socket includes a single circuit board electrically connected to the pin block and an opening exposing a lens of the test product facing the second plate.
The intermediate plate of the test socket includes a first intermediate plate portion disposed between the first and second plates and a second intermediate plate portion protruding from the first intermediate plate to face the side surface of the first plate.
An incision section is formed in a part of the first and second plates to secure a space for the operator to operate the second intermediate plate portion of the test socket.
The test socket according to the present invention is a test socket which temporarily fixes a product such as a camera module to be tested including a permanent magnet in a meshing manner without magnetic force and then tests the product to prevent the test failure of the product to be tested by the magnetic force, It is possible to prevent a reduction in the test precision of the test apparatus.
In addition, it is possible to prevent scratches from being generated in the product by preventing the scratch-prone part from being in contact with the part to be tested during the test, thereby preventing the defective appearance of the product due to the test.
Further, the terminal arrangement of the parts to be tested is improved, so that the test can be performed using only one circuit board without using two circuit boards, thereby reducing the manufacturing cost due to the reduction in the number of components.
1 is an external perspective view of a test socket according to an embodiment of the present invention.
2 is a sectional view of the engaging portion of Fig.
3 to 5 are perspective views illustrating a test process of a test socket according to an embodiment of the present invention.
In the following description, only parts necessary for understanding the embodiments of the present invention will be described, and the description of other parts will be omitted so as not to obscure the gist of the present invention.
The terms and words used in the present specification and claims should not be construed as limited to ordinary or dictionary meanings and the inventor is not limited to the meaning of the terms in order to describe his invention in the best way. It should be interpreted as meaning and concept consistent with the technical idea of the present invention. Therefore, the embodiments described in the present specification and the configurations shown in the drawings are merely preferred embodiments of the present invention, and are not intended to represent all of the technical ideas of the present invention, so that various equivalents And variations are possible.
1 is an external perspective view of a test socket according to an embodiment of the present invention.
Referring to FIG. 1, a
The
The
The
In one embodiment of the present invention, the test product stored in the
The
The
The voice coil motor VCM includes, for example, a stator and a mover that is driven with respect to the stator.
The stator includes a cover and a permanent magnet mounted on an inner surface of the cover.
The mover includes a hollow bobbin disposed inside the permanent magnet, a focusing lens coupled to the hollow of the bobbin, and a coil wound around the outer periphery of the bobbin.
The bobbin is elastically coupled to the stator by a plate-shaped spring, and the bobbin is lifted or lowered with respect to the stator by the electromagnetic force generated as a current is applied to the coil. Thus, the focusing lens and the image sensor Is adjusted.
The external lens 2 is coupled to the
In one embodiment of the present invention, the
When the
In addition, since the
The
The
A
A circuit board electrically connected to the
The
The
The
A hinge spring (not shown) is coupled to the
The
After the
The
The
When the
A portion of the
In one embodiment of the present invention, the
Since the
In order to prevent the
As the
The
The first
One side of the second
Since the second
As the
In order to prevent the
In one embodiment of the present invention, the engaging
In an embodiment of the present invention, the engaging
When the
2 is a sectional view of the engaging portion of Fig.
Referring to FIGS. 1 and 2, in an embodiment of the present invention, the engaging
The first
The
Although it is shown and described that the
Also, in one embodiment of the present invention, it is shown and described that the
The latching
The latching
The second
The second
The
Although the
Although the first engaging
Although the first engaging
Hereinafter, a process of testing the
3 to 5 are perspective views illustrating a test process of a test socket according to an embodiment of the present invention.
Referring to FIG. 3, in order to test the
After the
At this time, the
Since the
In an embodiment of the present invention, when the
4, when the
Referring to FIG. 5, when the
Thereafter, the
When the test of the
As described above in detail, a product such as a camera module to be tested including a permanent magnet or the like is temporarily fixed in a meshing manner without magnetism, and then the product is tested to prevent or prevent the test failure of the product to be tested by the magnetic force. It is possible to prevent the reduction of the test precision of the product.
In addition, it is possible to prevent scratches from being generated in the product by preventing the scratch-prone part from being in contact with the part to be tested during the test, thereby preventing the defective appearance of the product due to the test.
Further, the terminal arrangement of the parts to be tested is improved, so that the test can be performed using only one circuit board without using two circuit boards, thereby reducing the manufacturing cost due to the reduction in the number of components.
It should be noted that the embodiments disclosed in the drawings are merely examples of specific examples for the purpose of understanding, and are not intended to limit the scope of the present invention. It will be apparent to those skilled in the art that other modifications based on the technical idea of the present invention are possible in addition to the embodiments disclosed herein.
100 ...
300 ...
700 ... test socket
Claims (8)
A second plate having a second hinge portion and including a pin block connected to a connection terminal of the test product;
A hinge pin coupled to the first and second hinge portions to rotate the first plate and the second plate;
An intermediate plate interposed between the first and second plates and including a third hinge portion coupled to the hinge pin, the intermediate plate covering at least a portion of the test article; And
And an engaging portion for engaging the intermediate plate with the first plate.
Wherein the engaging portion includes an elastic member coupled to a side surface of the first plate and a locking protrusion coupled to the elastic member and partially protruding from the side surface; And
And a second engaging portion including an engaging groove recessed in the intermediate plate so that the engaging protrusion is caught.
Wherein the engaging portion includes a first engaging portion including an elastic member accommodated in a side surface of the intermediate plate and a locking protrusion coupled to the elastic member and partially protruding from the side surface; And
And a second engaging portion including an engaging groove recessed in the first plate so that the engaging protrusion is caught.
And a receiving groove for receiving the intermediate plate is formed on an inner surface of the first plate.
And the intermediate plate includes a cushioning member in a sheet shape disposed on a surface that contacts the inner surface of the first plate.
Wherein the second plate includes a single circuit substrate electrically connected to the pin block and an opening exposing a lens of the test product facing the second plate.
Wherein the intermediate plate includes a first intermediate plate portion disposed between the first and second plates and a second intermediate plate portion protruding from the first intermediate plate portion to face the side surface of the first plate.
And a cut-out portion is formed in a part of the first and second plates to secure a space for the operator to operate the second intermediate plate portion.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150120138A KR101689521B1 (en) | 2015-08-26 | 2015-08-26 | Test socket |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020150120138A KR101689521B1 (en) | 2015-08-26 | 2015-08-26 | Test socket |
Publications (1)
Publication Number | Publication Date |
---|---|
KR101689521B1 true KR101689521B1 (en) | 2017-01-03 |
Family
ID=57797171
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020150120138A KR101689521B1 (en) | 2015-08-26 | 2015-08-26 | Test socket |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR101689521B1 (en) |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101863878B1 (en) * | 2018-02-23 | 2018-06-01 | 주식회사 비티시스템 | Camera Module Test System |
KR101926806B1 (en) | 2017-11-29 | 2018-12-07 | 김광일 | Camera module test socket |
KR101926803B1 (en) | 2017-11-21 | 2018-12-07 | 김광일 | Camera module test socket |
KR102122820B1 (en) | 2019-04-19 | 2020-06-15 | 디플러스(주) | Self-aligning device for pin block connected with terminal |
KR102218871B1 (en) | 2020-04-27 | 2021-02-23 | 디플러스(주) | Socket for testing a product |
KR102219472B1 (en) * | 2020-04-16 | 2021-02-24 | 디플러스(주) | Socket for testing a product |
KR102498019B1 (en) * | 2022-11-08 | 2023-02-10 | 주식회사 프로이천 | Socket assembly |
KR20230033231A (en) | 2021-08-31 | 2023-03-08 | 디플러스(주) | Socket for testing product |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101199018B1 (en) | 2012-08-24 | 2012-11-08 | 주식회사 메카텍시스템즈 | Camera module test socket |
KR101357020B1 (en) * | 2013-11-27 | 2014-02-05 | 주식회사 티씨에스 | Socket for testing electronics |
KR20140021913A (en) * | 2012-08-13 | 2014-02-21 | 엘지이노텍 주식회사 | Camera module test socket |
KR101444774B1 (en) * | 2014-03-11 | 2014-09-26 | 주식회사 티씨에스 | Socket for testing electronics |
-
2015
- 2015-08-26 KR KR1020150120138A patent/KR101689521B1/en active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20140021913A (en) * | 2012-08-13 | 2014-02-21 | 엘지이노텍 주식회사 | Camera module test socket |
KR101199018B1 (en) | 2012-08-24 | 2012-11-08 | 주식회사 메카텍시스템즈 | Camera module test socket |
KR101357020B1 (en) * | 2013-11-27 | 2014-02-05 | 주식회사 티씨에스 | Socket for testing electronics |
KR101444774B1 (en) * | 2014-03-11 | 2014-09-26 | 주식회사 티씨에스 | Socket for testing electronics |
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101926803B1 (en) | 2017-11-21 | 2018-12-07 | 김광일 | Camera module test socket |
KR101926806B1 (en) | 2017-11-29 | 2018-12-07 | 김광일 | Camera module test socket |
KR101863878B1 (en) * | 2018-02-23 | 2018-06-01 | 주식회사 비티시스템 | Camera Module Test System |
KR102122820B1 (en) | 2019-04-19 | 2020-06-15 | 디플러스(주) | Self-aligning device for pin block connected with terminal |
KR102219472B1 (en) * | 2020-04-16 | 2021-02-24 | 디플러스(주) | Socket for testing a product |
KR102218871B1 (en) | 2020-04-27 | 2021-02-23 | 디플러스(주) | Socket for testing a product |
KR20230033231A (en) | 2021-08-31 | 2023-03-08 | 디플러스(주) | Socket for testing product |
KR102498019B1 (en) * | 2022-11-08 | 2023-02-10 | 주식회사 프로이천 | Socket assembly |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR101689521B1 (en) | Test socket | |
KR101442035B1 (en) | Apparatus for testing camera module | |
CN106444218B (en) | Lens driving device | |
KR101199018B1 (en) | Camera module test socket | |
EP3492974A1 (en) | Actuator, camera module, and camera-mounted device | |
US8284505B2 (en) | Voice coil motor and camera module using the same | |
US8011934B2 (en) | Camera apparatus, portable electronic device using the camera apparatus and method of assembling the portable electronic device | |
KR101683070B1 (en) | Face- front socket for testing of camera module | |
KR101673375B1 (en) | Module test socket | |
CN108474924A (en) | Lens driver, camera module and optical device | |
KR101246178B1 (en) | Camera lens assembly | |
KR20160084039A (en) | Socket for testing product | |
KR20170129532A (en) | Camera module | |
KR101859423B1 (en) | Aligning unit for dual camera module and aligning method using the same | |
US11448895B2 (en) | Optical element driving mechanism | |
KR101357022B1 (en) | Socket for testing electronics | |
TWM589398U (en) | camera | |
US20090075514A1 (en) | Test socket | |
JP6316979B2 (en) | Camera module manufacturing method and manufacturing apparatus | |
KR101798593B1 (en) | Camera module test socket | |
KR101619801B1 (en) | Test socket for semiconductor product | |
KR102701577B1 (en) | Socket for testing camera module | |
CN111765353A (en) | Multi-angle turnover type supporting mechanism and wireless charging seat | |
CN213714694U (en) | Testing device for lens module | |
CN211955953U (en) | Lens driving device, camera device, and electronic apparatus |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20191220 Year of fee payment: 4 |