KR101689521B1 - Test socket - Google Patents

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Publication number
KR101689521B1
KR101689521B1 KR1020150120138A KR20150120138A KR101689521B1 KR 101689521 B1 KR101689521 B1 KR 101689521B1 KR 1020150120138 A KR1020150120138 A KR 1020150120138A KR 20150120138 A KR20150120138 A KR 20150120138A KR 101689521 B1 KR101689521 B1 KR 101689521B1
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KR
South Korea
Prior art keywords
plate
intermediate plate
test
engaging
product
Prior art date
Application number
KR1020150120138A
Other languages
Korean (ko)
Inventor
이세영
최동수
유병운
Original Assignee
디플러스(주)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority to KR1020150120138A priority Critical patent/KR101689521B1/en
Application granted granted Critical
Publication of KR101689521B1 publication Critical patent/KR101689521B1/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433Sockets for IC's or transistors
    • G01R1/0441Details
    • G01R1/0466Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282Testing of electronic circuits specially adapted for particular applications not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Connecting Device With Holders (AREA)

Abstract

The present invention relates to a test method for preventing a test failure of a product to be tested by the magnetic force or preventing a decrease in the test precision of a product by temporarily testing the product to be tested including a permanent magnet, The test socket comprising: a first plate having a first hinge portion and a product seating portion on which the test product is mounted; A second plate having a second hinge portion and including a pin block connected to a connection terminal of the test product; A hinge pin coupled to the first and second hinge portions to rotate the first plate and the second plate; An intermediate plate interposed between the first and second plates and including a third hinge portion coupled to the hinge pin, the intermediate plate covering at least a portion of the test article; And an engaging portion for engaging the intermediate plate with the first plate.

Description

Test Socket {TEST SOCKET}

The present invention relates to a test socket.

In general, portable communication devices such as a smart phone, a tablet PC, and a game machine are equipped with an ultra-small camera module for taking a picture or a moving picture.

The recently developed ultra-small camera module includes a voice coil motor (VCM) mounted on an image sensor and an image sensor for converting external incident light into an image or a moving image and performing an auto focusing function and an anti-shake function.

In particular, the voice coil motor (VCM) includes a lens actuator that performs a focusing operation by operating a lens and a lens, and the lens actuator includes a bobbin having a lens mounted thereon, a coil wound around the bobbin to generate an electromagnetic force, A permanent magnet and a leaf spring for elastically supporting the bobbin.

In a very small camera module having a very small size, a test is performed after assembling a plurality of parts.

Generally, in order to test an ultra-small camera module, a test socket such as Korean Registered Patent No. 10-1199018 and a test socket for a camera module (registered on Nov. 1, 2012) is used.

A test socket for a camera module disclosed in Korean Patent No. 10-1199018 discloses a technique in which an intermediate cover is further included between a base frame and a cover frame.

A test socket for a camera module disclosed in Korean Patent No. 10-1199018 is a test socket for a camera module in which a product to be tested is fixed to a cover frame, a middle cover is fixed to a magnet mounted on the cover frame, The test is performed after being rotated by the base frame.

However, in the test socket for camera module disclosed in Korean Patent No. 10-1199018, the intermediate cover and the cover frame are fixed by the magnetic force by the magnet.

When fixing the middle cover and the cover frame with magnets, the permanent magnet of the voice coil motor (VCM) built in the ultra-small camera module to be tested is placed in contact with the voice coil motor (VCM) The lens can be tilted from a designated position, which may cause a test failure of the ultra-small camera module.

In the test socket for a camera module disclosed in Korean Patent No. 10-1199018, the lens of the ultra-small camera module is arranged to face the inner side of the cover frame, and the connection terminal connected to the camera module is also placed facing the inner side of the cover frame do.

When the connection terminal connected to the camera module is arranged to face the inner surface of the cover frame, the test socket for the camera module disclosed in Korean Patent No. 10-1199018 requires that the circuit board and the circuit board are included in the cover frame And it is necessary to use two circuit boards, so that the configuration of the test socket becomes complicated and the manufacturing cost of the test socket increases.

In addition, when the operator manually inserts the lens portion of the camera module into the receiving groove formed in the cover frame for testing, when the lens of the camera module touches the cover frame due to the operator's mistake, Scratches are generated on the lens portion, thereby causing defective appearance of the good camera module.

Korean Patent No. 10-1199018, Test Socket for Camera Module, Registered Date: November 1, 2012

The present invention relates to a test method for preventing a test failure of a product to be tested by the magnetic force or preventing a decrease in the test precision of a product by temporarily testing the product to be tested including a permanent magnet, Socket.

The present invention relates to a test socket for preventing scratches from being generated in a product by preventing a part which is likely to be scratched from being brought into contact with a test performing part during testing, to provide.

The present invention provides a test socket which improves the terminal arrangement of the parts to be tested so that the test can be performed using only one circuit board without using two circuit boards, thereby lowering the manufacturing cost due to the reduction in the number of parts.

In one embodiment, the test socket includes a first plate having a first hinge portion and a product seating portion on which the test product is mounted; A second plate having a second hinge portion and including a pin block connected to a connection terminal of the test product; A hinge pin coupled to the first and second hinge portions to rotate the first plate and the second plate; An intermediate plate interposed between the first and second plates and including a third hinge portion coupled to the hinge pin, the intermediate plate covering at least a portion of the test article; And an engaging portion for engaging the intermediate plate with the first plate.

The engaging portion of the test socket includes a first engaging portion including an elastic member coupled to a side surface of the first plate and a latch protrusion coupled to the elastic member and partially protruding from the side surface; And a second engaging portion including an engaging groove recessed in the intermediate plate so that the engaging protrusion is caught.

Wherein the engaging portion of the test socket has a first engaging portion including an elastic member accommodated in a side surface of the intermediate plate and a locking protrusion coupled to the elastic member and protruding from the side surface partly; And a second engaging portion including an engaging groove recessed in the first plate so that the engaging protrusion is caught.

On the inner surface of the first plate of the test socket, a receiving groove for receiving the intermediate plate is formed.

The intermediate plate of the test socket includes a cushioning member in the form of a sheet disposed on a surface that is in contact with the inner surface of the first plate.

The second plate of the test socket includes a single circuit board electrically connected to the pin block and an opening exposing a lens of the test product facing the second plate.

The intermediate plate of the test socket includes a first intermediate plate portion disposed between the first and second plates and a second intermediate plate portion protruding from the first intermediate plate to face the side surface of the first plate.

An incision section is formed in a part of the first and second plates to secure a space for the operator to operate the second intermediate plate portion of the test socket.

The test socket according to the present invention is a test socket which temporarily fixes a product such as a camera module to be tested including a permanent magnet in a meshing manner without magnetic force and then tests the product to prevent the test failure of the product to be tested by the magnetic force, It is possible to prevent a reduction in the test precision of the test apparatus.

In addition, it is possible to prevent scratches from being generated in the product by preventing the scratch-prone part from being in contact with the part to be tested during the test, thereby preventing the defective appearance of the product due to the test.

Further, the terminal arrangement of the parts to be tested is improved, so that the test can be performed using only one circuit board without using two circuit boards, thereby reducing the manufacturing cost due to the reduction in the number of components.

1 is an external perspective view of a test socket according to an embodiment of the present invention.
2 is a sectional view of the engaging portion of Fig.
3 to 5 are perspective views illustrating a test process of a test socket according to an embodiment of the present invention.

In the following description, only parts necessary for understanding the embodiments of the present invention will be described, and the description of other parts will be omitted so as not to obscure the gist of the present invention.

The terms and words used in the present specification and claims should not be construed as limited to ordinary or dictionary meanings and the inventor is not limited to the meaning of the terms in order to describe his invention in the best way. It should be interpreted as meaning and concept consistent with the technical idea of the present invention. Therefore, the embodiments described in the present specification and the configurations shown in the drawings are merely preferred embodiments of the present invention, and are not intended to represent all of the technical ideas of the present invention, so that various equivalents And variations are possible.

1 is an external perspective view of a test socket according to an embodiment of the present invention.

Referring to FIG. 1, a test socket 700 includes a first plate 100, a second plate 200, a hinge pin 300, an intermediate plate 400, and an engaging portion 500.

The first plate 100 is formed in a plate shape, for example, and a pair of first hinge parts 110 formed with hinge holes at the ends of the first plate 100 are formed.

The product mounting portion 120 on which the product to be tested is mounted is formed on the inner side surface 105 of the first plate 100 facing the second plate 200 to be described later.

The product seating portion 120 is formed, for example, with a receiving groove 125 in which a product to be tested is received, and the receiving groove 125 is formed in a size that does not flow after the product to be tested is received.

In one embodiment of the present invention, the test product stored in the receiving groove 125 is an ultra-small camera module 10 mounted on, for example, a smart phone, a tablet PC, a game machine, or the like.

The miniature camera module 10 includes a camera module body 1, an external lens 2, a flexible circuit board 5, and a connection terminal 7.

The camera module body 1 may comprise, for example, an image sensor (not shown) and a voice coil motor (VCM) coupled to the image sensor.

The voice coil motor VCM includes, for example, a stator and a mover that is driven with respect to the stator.

The stator includes a cover and a permanent magnet mounted on an inner surface of the cover.

The mover includes a hollow bobbin disposed inside the permanent magnet, a focusing lens coupled to the hollow of the bobbin, and a coil wound around the outer periphery of the bobbin.

The bobbin is elastically coupled to the stator by a plate-shaped spring, and the bobbin is lifted or lowered with respect to the stator by the electromagnetic force generated as a current is applied to the coil. Thus, the focusing lens and the image sensor Is adjusted.

The external lens 2 is coupled to the camera module body 1 and the flexible circuit board 5 is electrically coupled to the coil and image sensor wound on the bobbin and the connection terminal 7 is connected to the flexible circuit board 5 As shown in Fig. The test signal applied to the connection terminal 7 is provided to the image sensor and the coil through the flexible circuit board 5. [

In one embodiment of the present invention, the camera module body 1 is fixed to the receiving groove 125 of the product receiving portion 120 so that the external lens 2 is exposed. The flexible circuit board 5 is disposed on the product seating portion 120 and the connection terminals 7 mounted on the flexible circuit board 5 are disposed in such a state that they are exposed to the outside.

When the camera module body 1 is housed in the receiving groove 125 of the product seating portion 120 such that the external lens 2 is exposed, It is possible to prevent a scratch or the like from being generated in the external lens 2 by contacting a part of the second plate 200 to be exposed.

In addition, since the connection terminal 7 is disposed in the product seating portion 120 in a state in which the connection terminal 7 is exposed to the outside, a separate circuit board is not disposed on the first plate 100, So that the manufacturing cost of the test socket 700 can be greatly reduced.

The second plate 200 is formed, for example, in a plate shape. The second plate 200 includes a pair of second hinge parts 210 formed with a hinge hole.

The first hinge parts 110 formed on the first plate 100 are disposed on the inside of the second hinge parts 210 of the second plate 200, for example.

A pin block 220 is formed on the second plate 200 and a plurality of pins 225 are disposed on the pin block 220. The pins 225 protrude from the pin block 220 to a predetermined height, The pins 225 are formed at positions corresponding to the respective connection terminals 7 of the miniature camera module 10 and each of the pins 225 is electrically connected to each connection terminal 7.

A circuit board electrically connected to the pins 225 of the pin flock 220 is disposed on the rear surface of the second plate 200. Test signals for testing the micro camera module 10 are applied to the circuit board .

The second plate 200 is provided with an opening 230 for exposing the outer lens 3 of the micro camera module 10 and the second plate 200 having the opening 230 is provided with an outer lens 3, A chamfer 235 for preventing contact between the first plate 200 and the second plate 200 may be formed.

The first plate 100 on which the miniature camera module 10 is mounted is rotated and disposed in parallel with the second plate 200 so that the connection terminal of the miniature camera module 10 7 are electrically connected to the pins 225 of the pin block 220 disposed on the second plate 200.

The first hinge portion 110 of the first plate 100 and the second hinge portion 110 of the second plate 200 are rotated to rotate the first plate 100 clockwise or counterclockwise with respect to the second plate 200. [ The supporting portion 210 is joined by one hinge pin 300.

A hinge spring (not shown) is coupled to the hinge pin 300 to rotate the first plate 100 relative to the second plate 200 and the first plate 100 is coupled to the second plate 200 200 in a clockwise direction.

The clamp 240 is coupled to the second plate 200 so that the first plate 100 and the second plate 200 can be maintained parallel to each other after the first plate 100 is rotated counterclockwise .

After the micro camera module 10 is mounted on the product placement part 120 of the first plate 100 and the first and second micro camera modules 10 and 10 are not fixed, The micro camera module 10 mounted on the product placing portion 120 may be released from the product placing portion 120 due to gravity and fall to the second plate 200, Damage or scratch of the micro camera module 10 may occur, or it may take a long time to test the micro camera module.

The intermediate plate 400 temporarily fixes the micro camera module 10 accommodated in the product seating portion 120 of the first plate 100 and temporarily holds the micro camera module 10 from the product seating portion 120 by the rotation of the first plate 100. [ And serves to prevent dislodgement.

The intermediate plate 400 is disposed between the first plate 100 and the second plate 200. The intermediate plate 400 includes a pair of third hinge portions 410 formed with hinge holes and a third hinge portion 410 of the intermediate plate 410 is coupled to the hinge pin 300. Thus, the intermediate plate 400 can be pivoted toward the second plate 200 together with the first plate 100 by the hinge pin 300.

When the intermediate plate 400 is disposed between the first plate 100 and the second plate 200, the intermediate plate 400 may interfere with the first plate 100 and the second plate 200 The interference between the intermediate plate 100 and the first and second plates 100 and 200 is prevented from being applied to the first plate 100 and the second plate 200 or the first plate 100 or the second plate 200 It is possible to form the receiving groove.

A portion of the intermediate plate 400 pivoted together with the first plate 100 contacts at least a portion of the micro-camera module 10 to secure the micro-camera module 10 to the first plate 100.

In one embodiment of the present invention, the intermediate plate 400 presses the upper surface of the flexible circuit board 5 of the ultra-small camera module 10, for example, and pushes the ultra-small camera module 10 to the first plate 100 ).

Since the camera module body 1 of the ultra-small camera module 10 is accommodated in the receiving groove 125 of the product placing portion 120, the intermediate plate 400 is mounted on the flexible circuit board 5 The miniature camera module 10 can not be detached from the product placing part 120 even if only the upper surface of the miniature camera module 10 is pressed.

In order to prevent the intermediate plate 400 from causing scratches or damage to the flexible circuit board 5 of the micro camera module 10 when pressing the flexible circuit board 5 of the micro camera module 10, A buffer member 420 may be disposed at a portion of the plate 400 that is in contact with the flexible circuit board 5.

As the buffer member 420, for example, any one of a silicone material having elasticity, a synthetic resin material having elasticity, and a rubber material having elasticity can be used.

The intermediate plate 400 includes a first intermediate plate portion 415 and a second intermediate plate portion 417.

The first intermediate plate portion 415 is disposed between the first plate 100 and the second plate 200 and the first intermediate plate portion 415 is disposed between the flexible circuit board 5 ).

One side of the second intermediate plate portion 417 is connected to the third hinge portion 410. The other side of the second intermediate plate portion 417 is connected to the first intermediate plate portion 415, A portion of the first plate 417 extends to face the side of the first plate 100. [ That is, the second intermediate plate portion 417 protrudes outward of the first plate 100.

Since the second intermediate plate portion 417 functions as a handle for the operator to work, the second intermediate plate portion 417 and the second intermediate plate portion 417 are provided in order to secure a space for the operator to hold and operate the second intermediate plate portion 417 The first plate 100 and the second plate 200 have cutouts 150 and 250 formed by cutting a part of the first and second plates 100 and 200, respectively.

As the cutouts 150 and 250 are formed in the first and second plates 100 and 200, the second intermediate plate portion 417 is exposed from the first and second plates 100 and 200, (417) toward the first plate (100).

In order to prevent the intermediate plate 400 from being disengaged from the first plate 100 in a state where the micro camera module 10 is fixed to the first plate 100 by using the intermediate plate 400, 400 and the first plate 100 are formed with engaging portions 500.

In one embodiment of the present invention, the engaging portion 500 has a configuration suitable not to affect the test of the ultra-small camera module 10 which is the product to be tested.

In an embodiment of the present invention, the engaging portion 500 does not use a magnet or the like to generate a magnetic force, and allows the intermediate plate 400 to be mechanically coupled to the first plate 100.

When the intermediate plate 400 is coupled to the first plate 100 using a magnet for generating magnetic force, the magnetic force generated by the magnet is transmitted to the voice coil motor of the camera module body 1 of the ultra- The tilting of the mover of the voice coil motor is arbitrarily tilted from the designated position, so that the test of the micro camera module 10 can not proceed accurately.

2 is a sectional view of the engaging portion of Fig.

Referring to FIGS. 1 and 2, in an embodiment of the present invention, the engaging portion 500 includes a first engaging portion 540 formed on the first plate 100 and a second engaging portion 540 formed on the intermediate plate 400, (550).

The first engaging portion 540 includes an elastic member 510 and a latching protrusion 520.

The elastic member 510 is disposed in a receiving groove formed at a predetermined depth from the side surface of the first plate 100 facing the second intermediate plate portion 417 of the intermediate plate 400, 510 are fixed in the receiving groove. The elastic member 510 may include, for example, a coil spring.

Although it is shown and described that the elastic member 510 is a coil spring in the embodiment of the present invention, the elastic member 510 may be formed of various members such as an elastic plate, a leaf spring, and an elastic rubber.

Also, in one embodiment of the present invention, it is shown and described that the elastic member 510 is disposed in the receiving groove formed at a predetermined depth from the side surface of the first plate 100, It is not necessary to form a storage groove.

The latching protrusion 520 is fixed to the other side end opposite to the one end of the elastic member 510. [ The latching protrusion 520 partially protrudes from the side surface of the first plate 100.

The latching protrusion 520 may be formed in a spherical shape, for example. Although the latching protrusion 520 is shown and described as being spherical in one embodiment of the present invention, the latching protrusion 520 may be formed in various shapes such as a hemispherical shape and an elliptical shape in addition to a spherical shape.

The second engaging portion 550 is formed on the second intermediate plate portion 517 of the intermediate plate 400 and the second engaging portion 550 is engaged with the intermediate plate 400 when the intermediate plate 400 is rotated by the first plate 100 And is formed at a position corresponding to the projection 520. [

The second engaging portion 550 may be a groove or a hole formed concavely from the second intermediate plate portion 517 so as to be engageable with the engaging projection 520, for example.

The intermediate plate 400 is rotated by the first plate 100 so that a part of the latching protrusion 520 of the second engaging portion 550 comes into contact with the second intermediate plate portion 517, Is retracted into the receiving groove while pressing the elastic member 510 and is engaged with the second engaging portion 550 while the engaging protrusion 520 reaches the second engaging portion 550. As the first engaging portion 540 is engaged with the second engaging portion 550, the intermediate plate 400 is prevented from being arbitrarily disengaged from the first plate 100.

Although the first coupling portion 540 is formed on the side surface of the first plate 100 and the second coupling portion 550 is formed on the intermediate plate 400 in the embodiment of the present invention, Alternatively, the first coupling portion 540 may be formed on the intermediate plate 400, and the second coupling portion 550 may be formed on the first plate 100.

Although the first engaging portion 540 and the second engaging portion 550 are formed with the elastic member 510 and the locking protrusion 520 in the embodiment of the present invention, The first engaging portion 540 and the second engaging portion 550 may be closely adhered to each other and temporarily fixed by frictional force.

Although the first engaging portion 540 and the second engaging portion 550 are formed with the elastic member 510 and the locking protrusion 520 in the embodiment of the present invention, Alternatively, the intermediate plate 400 and the first plate 100 may be coupled to each other by forming a clamp engaging with the first plate 100 on the intermediate plate 400.

Hereinafter, a process of testing the ultra-small camera module 10 will be described with reference to FIGS. 3 to 5. FIG.

3 to 5 are perspective views illustrating a test process of a test socket according to an embodiment of the present invention.

Referring to FIG. 3, in order to test the ultra-small camera module 10, the first plate 100 is rotated clockwise about 170 degrees with respect to the second plate 200. Although the first plate 100 is illustrated and described as being pivoted at an angle of about 170 with respect to the second plate 200 in the exemplary embodiment of the present invention, May be clockwise rotated at an angle greater than about 170 DEG or less than about 170 DEG.

After the first plate 100 is rotated clockwise about 170 degrees with respect to the second plate 200, the operator places the miniature camera module 10 to be tested on the product seating portion 120 formed on the first plate 100, As shown in FIG.

At this time, the camera module body 1 of the ultra-small camera module 10 is mounted inside the storage part 125 and the external lens 3 of the ultra-small camera module 10 is mounted on the inner surface of the first plate 100 As shown in Fig.

Since the external lens 3 is disposed in the upward direction with respect to the inner surface of the first plate 100, the connection terminal 7 is also disposed in the upward direction with respect to the inner surface of the first plate 100 do.

In an embodiment of the present invention, when the outer lens 3 is disposed in the upward direction with respect to the inner surface of the first plate 100, the outer lens 3 is disposed on the first plate 100 or the second Scratches can be prevented from being generated in the outer lens 3 by contacting the plate 200, and it is not necessary to mount the circuit board on the first plate 100.

4, when the miniature camera module 10 is mounted on the product seating portion 120 of the first plate 100, the operator rotates the intermediate plate 400 in the clockwise direction, The intermediate plate 400 is rotated in parallel with the inner surface of the first plate 100 and the first engaging portion 540 formed on the first plate 100 and the second engaging portion 550 formed on the intermediate plate 400 Are engaged with each other, thereby preventing the intermediate plate 400 from being arbitrarily disengaged from the first plate 100.

Referring to FIG. 5, when the intermediate plate 400 is meshed by the engaging portion 500, the first plate 100 is rotated counterclockwise. At this time, the micro camera module 10 is rotated by the intermediate plate 400 And is rotated together with the first plate 100 without falling.

Thereafter, the first plate 100 is rotated until it is parallel to the second plate 200, and then the connection terminal 7 of the ultra-small camera module 10 is rotated in the direction of the pin block 220 of the second plate 200 The miniature camera module 10 is tested by the test signal, which is electrically connected to the pin 225.

When the test of the ultra-small camera module 10 is completed, the operator rotates the first plate 100, rotates the intermediate plate 400 from the first plate 100, The micro camera module 10 to be tested is seated on the product seating portion 120 of the first plate 100 after being detached from the first plate 100.

As described above in detail, a product such as a camera module to be tested including a permanent magnet or the like is temporarily fixed in a meshing manner without magnetism, and then the product is tested to prevent or prevent the test failure of the product to be tested by the magnetic force. It is possible to prevent the reduction of the test precision of the product.

In addition, it is possible to prevent scratches from being generated in the product by preventing the scratch-prone part from being in contact with the part to be tested during the test, thereby preventing the defective appearance of the product due to the test.

Further, the terminal arrangement of the parts to be tested is improved, so that the test can be performed using only one circuit board without using two circuit boards, thereby reducing the manufacturing cost due to the reduction in the number of components.

It should be noted that the embodiments disclosed in the drawings are merely examples of specific examples for the purpose of understanding, and are not intended to limit the scope of the present invention. It will be apparent to those skilled in the art that other modifications based on the technical idea of the present invention are possible in addition to the embodiments disclosed herein.

100 ... first plate 200 ... second plate
300 ... hinge pin 400 ... intermediate plate
700 ... test socket

Claims (8)

A first plate including a product seating portion on which a first hinge portion is formed and on which a test product is mounted;
A second plate having a second hinge portion and including a pin block connected to a connection terminal of the test product;
A hinge pin coupled to the first and second hinge portions to rotate the first plate and the second plate;
An intermediate plate interposed between the first and second plates and including a third hinge portion coupled to the hinge pin, the intermediate plate covering at least a portion of the test article; And
And an engaging portion for engaging the intermediate plate with the first plate.
The method according to claim 1,
Wherein the engaging portion includes an elastic member coupled to a side surface of the first plate and a locking protrusion coupled to the elastic member and partially protruding from the side surface; And
And a second engaging portion including an engaging groove recessed in the intermediate plate so that the engaging protrusion is caught.
The method according to claim 1,
Wherein the engaging portion includes a first engaging portion including an elastic member accommodated in a side surface of the intermediate plate and a locking protrusion coupled to the elastic member and partially protruding from the side surface; And
And a second engaging portion including an engaging groove recessed in the first plate so that the engaging protrusion is caught.
The method according to claim 1,
And a receiving groove for receiving the intermediate plate is formed on an inner surface of the first plate.
The method according to claim 1,
And the intermediate plate includes a cushioning member in a sheet shape disposed on a surface that contacts the inner surface of the first plate.
The method according to claim 1,
Wherein the second plate includes a single circuit substrate electrically connected to the pin block and an opening exposing a lens of the test product facing the second plate.
The method according to claim 1,
Wherein the intermediate plate includes a first intermediate plate portion disposed between the first and second plates and a second intermediate plate portion protruding from the first intermediate plate portion to face the side surface of the first plate.
8. The method of claim 7,
And a cut-out portion is formed in a part of the first and second plates to secure a space for the operator to operate the second intermediate plate portion.
KR1020150120138A 2015-08-26 2015-08-26 Test socket KR101689521B1 (en)

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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101863878B1 (en) * 2018-02-23 2018-06-01 주식회사 비티시스템 Camera Module Test System
KR101926806B1 (en) 2017-11-29 2018-12-07 김광일 Camera module test socket
KR101926803B1 (en) 2017-11-21 2018-12-07 김광일 Camera module test socket
KR102122820B1 (en) 2019-04-19 2020-06-15 디플러스(주) Self-aligning device for pin block connected with terminal
KR102218871B1 (en) 2020-04-27 2021-02-23 디플러스(주) Socket for testing a product
KR102219472B1 (en) * 2020-04-16 2021-02-24 디플러스(주) Socket for testing a product
KR102498019B1 (en) * 2022-11-08 2023-02-10 주식회사 프로이천 Socket assembly
KR20230033231A (en) 2021-08-31 2023-03-08 디플러스(주) Socket for testing product

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KR101357020B1 (en) * 2013-11-27 2014-02-05 주식회사 티씨에스 Socket for testing electronics
KR20140021913A (en) * 2012-08-13 2014-02-21 엘지이노텍 주식회사 Camera module test socket
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KR101357020B1 (en) * 2013-11-27 2014-02-05 주식회사 티씨에스 Socket for testing electronics
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Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101926803B1 (en) 2017-11-21 2018-12-07 김광일 Camera module test socket
KR101926806B1 (en) 2017-11-29 2018-12-07 김광일 Camera module test socket
KR101863878B1 (en) * 2018-02-23 2018-06-01 주식회사 비티시스템 Camera Module Test System
KR102122820B1 (en) 2019-04-19 2020-06-15 디플러스(주) Self-aligning device for pin block connected with terminal
KR102219472B1 (en) * 2020-04-16 2021-02-24 디플러스(주) Socket for testing a product
KR102218871B1 (en) 2020-04-27 2021-02-23 디플러스(주) Socket for testing a product
KR20230033231A (en) 2021-08-31 2023-03-08 디플러스(주) Socket for testing product
KR102498019B1 (en) * 2022-11-08 2023-02-10 주식회사 프로이천 Socket assembly

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