KR101645082B1 - Substrate transfer robot, substrate transfer system and method for detecting placement state of substrate - Google Patents
Substrate transfer robot, substrate transfer system and method for detecting placement state of substrate Download PDFInfo
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- KR101645082B1 KR101645082B1 KR1020140060159A KR20140060159A KR101645082B1 KR 101645082 B1 KR101645082 B1 KR 101645082B1 KR 1020140060159 A KR1020140060159 A KR 1020140060159A KR 20140060159 A KR20140060159 A KR 20140060159A KR 101645082 B1 KR101645082 B1 KR 101645082B1
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- substrate
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- center line
- robot
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67766—Mechanical parts of transfer devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J13/00—Controls for manipulators
- B25J13/08—Controls for manipulators by means of sensing devices, e.g. viewing or touching devices
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Programme-controlled manipulators
- B25J9/02—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type
- B25J9/04—Programme-controlled manipulators characterised by movement of the arms, e.g. cartesian coordinate type by rotating at least one arm, excluding the head movement itself, e.g. cylindrical coordinate type or polar coordinate type
- B25J9/041—Cylindrical coordinate type
- B25J9/042—Cylindrical coordinate type comprising an articulated arm
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25J—MANIPULATORS; CHAMBERS PROVIDED WITH MANIPULATION DEVICES
- B25J9/00—Programme-controlled manipulators
- B25J9/16—Programme controls
- B25J9/1679—Programme controls characterised by the tasks executed
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
- H01L21/67265—Position monitoring, e.g. misposition detection or presence detection of substrates stored in a container, a magazine, a carrier, a boat or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68707—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/40—Robotics, robotics mapping to robotics vision
- G05B2219/40087—Align hand on workpiece to pick up workpiece, peg and hole
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/45—Nc applications
- G05B2219/45031—Manufacturing semiconductor wafers
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S901/00—Robots
- Y10S901/02—Arm motion controller
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S901/00—Robots
- Y10S901/46—Sensing device
Abstract
The object of the present invention is to provide a substrate carrying robot capable of detecting the arrangement state of a substrate in a substrate mounting portion even when the arm of the substrate carrying robot is relatively short.
The control unit 133 of the substrate transfer robot 13 is configured such that the hand 131 is moved in the vertical direction relative to the front surface of the cassette 30 with respect to the substrate storage center line 141, The detection unit 150 detects the arrangement state of the substrate 110 in the cassette 30 while being inclined toward the turning center C1 of the robot.
Description
The present invention relates to a substrate transport robot, a substrate transport system, and a method of detecting a disposition state of a substrate.
BACKGROUND ART [0002] A substrate transfer apparatus (substrate transfer robot) having a hand provided with a transmission type optical sensor for detecting an arrangement state of a substrate placed in a substrate storage cassette is known (see, for example, Patent Document 1). In the above-described Patent Document 1, a hand having a substantially V-shape (a shape in which the distal end is branched) is provided at the tip of the carrying arm of the substrate carrying apparatus (substrate carrying robot). A transmission type optical sensor including a light emitter for illuminating the beam and a light receiver for receiving the beam is provided at the tip of the hand. In the above-described Patent Document 1, a substantially V-shaped hand (a light emitter and a light receiver) is positioned below a substrate disposed in the cassette storage cassette, and then the hand is moved upward. At this time, on the basis of whether or not the light receiver has received the beam, it is configured to detect the arrangement state (the presence or absence of the substrate, the posture, and the projection state from the cassette) arranged in the substrate storage cassette.
In the conventional substrate transfer apparatus (substrate transfer robot) as in Patent Document 1, the hand center line (a straight line connecting the rotation center of the hand and the center of the substrate holding when the substrate is held in the hand) And is configured to detect the arrangement state of the substrate disposed in the substrate storage cassette in a state in which the substrate storage cassette is arranged in a direction perpendicular to the front surface of the substrate storage cassette.
However, in the conventional substrate transport apparatus (substrate transport robot), in order to detect the arrangement state of the substrates arranged in the substrate storage cassettes in a state in which the hand center lines are arranged in a direction perpendicular to the front surface of the substrate storage cassettes When the hand central line can not be arranged in the vertical direction with respect to the front surface of the substrate storage cassette due to the relatively short transfer arm of the substrate transfer robot, it is disposed in the substrate storage cassette (substrate loading portion) A problem that the arrangement state of the substrate can not be detected is considered.
SUMMARY OF THE INVENTION It is an object of the present invention to provide a substrate transfer robot capable of detecting the arrangement state of a substrate on a substrate loading section even when the arm of the substrate transfer robot is relatively short, A substrate transport system, and a method of detecting the arrangement state of the substrate.
The substrate transport robot according to the first aspect includes a hand portion provided with a detecting portion for detecting the arrangement state of the substrate on the substrate mounting portion and a control portion, In a state in which the substrate is placed in a tilted position toward the center of rotation of the substrate transfer robot with respect to the substrate holding center line in the vertical direction with respect to the substrate holding section.
In the substrate transfer robot according to the first aspect, as described above, when the hand portion is tilted toward the center of rotation of the substrate transfer robot relative to the substrate storage center line perpendicular to the front surface of the substrate loading portion, It is possible to detect the arrangement state of the substrate on the substrate mounting portion by the detecting portion in a state where the hand portion is brought close to the center of the turning center of the substrate transfer robot, The arrangement state of the substrate in the substrate mounting portion can be detected even when the arm of the carrier robot is relatively short.
The substrate transport system according to the second aspect includes a substrate transport robot disposed in a substrate transport robot mounting region surrounded by the substrate loading section and the processing apparatus, and the substrate transport robot includes: Wherein the control unit controls the hand unit such that when the hand unit is tilted toward the center of rotation of the substrate transfer robot relative to the substrate storage center line perpendicular to the front surface of the substrate loading unit, And the detecting section detects the arrangement state of the substrate in the mounting section.
In the substrate transfer system according to the second aspect, as described above, the hand portion is inclined to the center of the substrate transfer center line of the substrate transfer robot in a direction perpendicular to the front surface of the substrate loading portion, The arrangement state of the substrate on the substrate mounting portion can be detected by the detecting portion in a state in which the hand portion approaches the center of the turning center of the substrate transport robot, It is possible to provide a substrate transport system capable of detecting the arrangement state of the substrate in the substrate mounting section even when the arm of the substrate transport robot is relatively short.
The method for detecting the arrangement state of the substrate according to the third aspect is characterized in that the hand portion is moved so as to be tilted toward the center of rotation of the substrate transport robot relative to the substrate accommodating center line in the vertical direction with respect to the front surface of the substrate mounting portion, And the hand part is inclined toward the center of rotation of the substrate carrying robot relative to the substrate accommodating center line in a direction perpendicular to the front surface of the substrate mounting part so that the arrangement state of the substrate in the substrate mounting part is detected by a detecting part And a step of detecting the light beam.
In the third aspect of the present invention, in the method of detecting the arrangement state of the substrate, in the state in which the hand portion is tilted toward the center of rotation of the substrate transfer robot relative to the substrate storage center line perpendicular to the front surface of the substrate mounting portion, And detecting a placement state of the substrate in the substrate loading section by the detecting section provided in the hand section so that the placement state of the substrate in the substrate loading section is detected by the detecting section in a state in which the hand section is brought close to the turning center side of the substrate carrying robot It is possible to provide a method of detecting the arrangement state of the substrate, which can detect the arrangement state of the substrate in the substrate mounting portion even when the arms of the substrate carrying robot are relatively short.
The substrate transport robot according to the fourth aspect includes a hand portion provided with a detection portion for detecting the arrangement state of the substrate on the substrate mounting portion and includes a hand portion for detecting the arrangement state of the substrate on the substrate mounting portion by the detecting portion, The hand portion is set at a position inclined to the turning center side of the substrate carrying robot with respect to the substrate holding center line in a direction perpendicular to the front surface of the substrate mounting portion as viewed in plan view.
In the substrate transport robot according to the fourth aspect, as described above, the position of the hand portion when the detection portion detects the arrangement state of the substrate on the substrate mounting portion as viewed from the top, The arrangement state of the substrate in the substrate mounting portion is detected by the detecting portion in a state in which the hand portion is brought close to the center of the turning center of the substrate transfer robot by setting the substrate to the position at an inclined position with respect to the substrate transfer center line in the vertical direction with respect to the front face, It is possible to detect the arrangement state of the substrate in the substrate mounting portion even when the arms of the substrate carrying robot are relatively short.
According to the above substrate transfer robot, the substrate transfer system and the method for detecting the arrangement state of the substrate, it is possible to detect the arrangement state of the substrate in the substrate mounting section even when the arms of the substrate transfer robot are relatively short.
Fig. 1 is a plan view showing the entire configuration of a substrate processing system according to the first embodiment.
2 is a schematic side view showing the overall configuration of the substrate processing system according to the first embodiment.
3 is a perspective view showing the substrate transport robot of the substrate processing system according to the first embodiment.
4 is a view for explaining the position of the hand portion in the mapping operation of the substrate transport system according to the first embodiment.
5 is a view for explaining the position of the hand portion when the substrate is mounted on the cassette.
6 is a view for explaining the position of the hand portion in a state in which the hand center line is aligned with the board receiving center line;
Fig. 7 is a view for explaining the position of the hand portion in the mapping operation of the substrate transport system according to the second embodiment. Fig.
Hereinafter, embodiments will be described with reference to the drawings.
(First Embodiment)
First, the configuration of the
1 and 2, the
The
The
The
The
1 to 3, the
The
The
The
4, a
As shown in Fig. 3, the
4, in the first embodiment, the
In the first embodiment, the
In the first embodiment, the position of the
1, the position of the
As shown in Figs. 1 and 2, the
The
The
Next, an operation (mapping operation) for detecting the arrangement state of the
4, a
Next, by moving the
In the first embodiment, as described above, the
In the first embodiment, the
In the first embodiment, the
In the first embodiment, as described above, the
In the first embodiment, the center of rotation C1 of the
The first embodiment differs from the first embodiment in that a
In the first embodiment, as described above, the
In the first embodiment, as described above, the
(Second Embodiment)
Next, the position of the
7, in the
In the second embodiment of the present invention as described above, the
It should also be understood that the embodiments disclosed herein are illustrative and non-restrictive in all respects. The scope of the present invention is not limited to the description of the above embodiments, but is expressed by the scope of claims, and includes all modifications within the meaning and range equivalent to the claims.
For example, in the first (second) embodiment, the substrate storage center of the substrate disposed in the cassette is moved toward the center of the orbit of the substrate transfer robot with the center (center of the substrate holding center when the substrate is held in the hand) The hand is rotated around a reference point other than the substrate storage center and the substrate holding center, and the hand center line is inclined at a predetermined inclination angle with respect to the substrate storage center line toward the turning center side of the substrate carrying robot It is also good.
In the first and second embodiments, a pair of detection units (light emitters and light receivers) formed of a transmission type optical sensor are provided on the distal end side of the branched hands. However, a detection unit other than the transmission type optical sensor may be provided in the hand .
In the first and second embodiments, the distance D (see Fig. 1) from the turning center of the substrate carrying robot to the turning center of the hand located at the position of the hand when detecting the arrangement state of the substrate, (2L) of the total link length of the arm including the first arm portion and the second arm portion is shown, the distance (D) from the turning center of the substrate carrying robot to the turning center of the hand is set to be smaller than the sum (D = 2L) as the sum of the total link lengths of the arms including the first arm portion and the second arm portion.
In the case where the substrate carrying robot is configured to access the
In the first and second embodiments described above, the substrate carrying robot including two arm portions (the first arm portion and the second arm portion) is shown as an example of the substrate carrying robot. However, the substrate carrying robot having only one arm portion The substrate transfer robot may be a substrate transfer robot having three or more arms.
In the above-described first and second embodiments, the hand portion has the branched end side, but may have a shape other than the shape with the leading end side where the hand portion is branched.
In the first and second embodiments, a substrate transport robot having one hand portion is shown as an example of the substrate transport robot, but a substrate transport robot having two or more hand portions may be used.
In the above-described first and second embodiments, an example of the substrate transport system capable of installing four cassettes by providing four load ports has been described. However, the number of cassettes (the number of load ports) may be three or less It may be five or more.
In the first and second embodiments described above, an example of the substrate transport system for transporting the substrate by the substrate transport robot between the cassette and the processing apparatus has been described. However, the substrate transport system may be, for example, Or a substrate transfer system for transferring the substrate to an apparatus other than the processing apparatus in the semiconductor device manufacturing process, such as a temporary substrate mounting apparatus for the substrate.
In the first and second embodiments, the robot mounting region is an area interposed between the front wall and the rear wall arranged substantially parallel to each other. However, the first wall portion and the second wall portion, May be used as a robot mounting area.
In the above-described first and second embodiments, an example of detecting the arrangement state of the substrate mounted on the cassette which is the front opening type semiconductor wafer accommodating container conforming to the SEMI standard has been described. However, Or may be configured to detect the arrangement state of one wafer placed on the side of the processing apparatus.
In the first and second embodiments, an edge grip type hand portion is provided in the substrate transfer robot, but a negative pressure (vacuum) type or electrostatic zipper type hand portion may be provided in the substrate transfer robot . Furthermore, a zipper type hand unit other than edge grip type, negative pressure type and electrostatic type may be provided in the substrate transport robot.
10: substrate transport system
11: Robot mounting area (substrate carrying robot mounting area)
13: Substrate carrying robot
20: Processing device
30: Cassette (substrate mounting portion)
110: substrate
131: Hand part
132: arm
133:
136: first arm portion
137: second arm arm
138: substrate holding center
139: Hand center line
140: substrate storage center
141: substrate storage center line
150:
C1: turning center
C3: center of rotation
Claims (12)
Wherein the control unit includes a hand center line that is a straight line connecting a pivotal center of the hand unit and a center of the substrate holding unit when the substrate is held on the hand unit, In a state of being tilted toward the center of rotation of the substrate transport robot at a predetermined inclination angle with respect to the substrate storage center line which is a straight line connecting the rotation center of the hand portion when the substrate is mounted and which is perpendicular to the front surface of the substrate mount, And the detection unit detects the arrangement state of the substrate in the mounting portion,
A substrate storage center of the substrate mounting portion is previously taught,
Wherein the control unit is configured to move the substrate centering line in a state in which the hand center line is tilted toward the turning center side of the substrate transfer robot at the predetermined inclination angle with respect to the substrate accommodating center line, The position of the hand portion for detecting the arrangement state of the substrate by the detection portion is calculated,
The hand portion is configured to branch at the distal end side,
Wherein the detection unit is provided with a pair of pairs of tip ends of the hand portions that are branched,
The control unit is configured to detect the arrangement state of the substrate by the detection unit in a state in which a straight line connecting the pair of detection units extends from the plane to the substrate and the hand unit does not contact the substrate ,
Wherein the control unit controls the position of the substrate holding center of the substrate on the substrate mounting part when the hand center line coincides with the substrate accommodating center line in a plan view, The hand center line is inclined at the predetermined inclination angle with respect to the substrate accommodating center line to the turning center side of the substrate carrying robot by rotating the hand portion toward the center of the turning center of the substrate carrying robot, , And configured to detect the arrangement state of the substrate by the detection unit
Substrate transport robot.
Wherein the control unit is configured such that when the hand center line is inclined toward the center of the turning center of the substrate transport robot at the predetermined inclination angle with respect to the substrate accommodating center line in a plan view, In the state of being positioned on the side of the turning center of the substrate
Substrate transport robot.
A first arm portion configured to be rotatable in a horizontal plane with one end of the substrate transfer robot on a turning center side as a pivotal axis and one end portion connected to the other end portion of the first arm portion, A second arm portion configured to be rotatable in a horizontal plane with respect to the first arm portion,
Wherein a distance from a turning center of the substrate transfer robot to a turning center of the hand portion located at a position of the hand when detecting the arrangement state of the substrate is determined by a distance between the arm including the first arm portion and the second arm portion, Lt; RTI ID = 0.0 >
Substrate transport robot.
Wherein the control unit is configured to move the hand center line in a state in which the hand center line is inclined toward the center of the turning center of the substrate transport robot at the predetermined inclination angle with respect to the substrate accommodating center line in a range in which the hand portion does not contact the substrate mounting portion , And configured to detect the arrangement state of the substrate by the detection unit
Substrate transport robot.
Wherein the substrate transport robot includes a hand portion provided with a detection portion for detecting the arrangement state of the substrate on the substrate mounting portion, and a control portion,
Wherein the control unit includes a hand center line that is a straight line connecting a pivotal center of the hand unit and a center of the substrate holding unit when the substrate is held on the hand unit, Wherein the substrate holding section is inclined to a turning center side of the substrate carrying robot at a predetermined inclination angle with respect to a substrate holding center line which is a straight line connecting the rotation center of the hand section when the substrate is mounted and which is perpendicular to the front surface of the substrate mounting section, And the detection unit detects the arrangement state of the substrate in the substrate mounting portion,
A substrate storage center of the substrate mounting portion is previously taught,
Wherein the control unit is configured to move the substrate centering line in a state in which the hand center line is tilted toward the turning center side of the substrate transfer robot at the predetermined inclination angle with respect to the substrate accommodating center line, The position of the hand portion for detecting the arrangement state of the substrate by the detection portion is calculated,
The hand portion is configured to branch at the distal end side,
Wherein the detection unit is provided with a pair of pairs of tip ends of the hand portions that are branched,
The control unit is configured to detect the arrangement state of the substrate by the detection unit in a state in which a straight line connecting the pair of detection units extends from the plane to the substrate and the hand unit does not contact the substrate ,
Wherein the control unit controls the position of the substrate holding center of the substrate on the substrate mounting part when the hand center line coincides with the substrate accommodating center line in a plan view, The hand center line is inclined at the predetermined inclination angle with respect to the substrate accommodating center line to the turning center side of the substrate carrying robot by rotating the hand portion toward the center of the turning center of the substrate carrying robot, , And configured to detect the arrangement state of the substrate by the detection unit
Substrate transport system.
A substrate storage center of the substrate mounting portion is previously taught,
The hand portion is configured to branch at the tip end side,
Wherein the detection unit is provided with a pair of pairs of tip ends of the hand portions that are branched,
Wherein the control unit is configured to determine that the hand center line that is a straight line connecting the center of rotation of the hand unit and the center of gravity of the substrate when the substrate is held on the hand unit based on the substrate storage center previously learned, And a substrate holding center line that is a straight line connecting the substrate storing center of the mounting portion and the center of rotation of the hand portion when the substrate is mounted on the substrate mounting portion and is perpendicular to the front surface of the substrate mounting portion, Calculating a position of the hand portion for detecting the arrangement state of the substrate on the substrate mounting portion by the detection portion in a state inclined to the turning center side of the robot,
From a state in which the hand center line is aligned with the substrate accommodating center line in a plan view, the center of the substrate holding center in the case where the substrate is held on the hand portion, The hand portion is in a state in which the hand center line is tilted toward the center of the turning center of the substrate transport robot at the predetermined inclination angle with respect to the substrate accommodating center line by rotating the hand portion toward the turning center side of the substrate transport robot A step of moving the hand unit to move the hand unit,
Wherein the hand portion is arranged such that a straight line connecting a pair of the detection portions as seen from a plane extends across the substrate and at the same time the hand portion is not in contact with the substrate, And a step of detecting, by the detection unit, the arrangement state of the substrate in the substrate mounting portion in a state in which the substrate is tilted to an orbiting center side of the substrate carrying robot at an angle
A method for detecting the arrangement state of a substrate.
Wherein the position of the hand portion when the detection portion detects the arrangement state of the substrate on the substrate loading portion is a position where the rotation center of the hand portion and the substrate holding center Wherein a straight line connecting a substrate storage center of the substrate loading portion and a turning center of the hand portion when the substrate is mounted on the substrate loading portion is perpendicular to the front surface of the substrate loading portion, Is set at a position inclined to the turning center side of the substrate carrying robot with respect to the center line,
A substrate storage center of the substrate mounting portion is previously taught,
Wherein the control unit is configured to move the substrate centering line in a state in which the hand center line is tilted toward the center of rotation of the substrate transfer robot at a predetermined inclination angle with respect to the substrate accommodating center line, The position of the hand portion for detecting the arrangement state of the substrate in the detection section by the detection section,
The hand portion is configured to branch at the distal end side,
Wherein the detection unit is provided with a pair of pairs of tip ends of the hand portions that are branched,
The control unit is configured to detect the arrangement state of the substrate by the detection unit in a state in which a straight line connecting the pair of detection units extends from the plane to the substrate and the hand unit does not contact the substrate ,
Wherein the control unit controls the position of the substrate holding center of the substrate on the substrate mounting part when the hand center line coincides with the substrate accommodating center line in a plan view, The hand center line is inclined at the predetermined inclination angle with respect to the substrate accommodating center line to the turning center side of the substrate carrying robot by rotating the hand portion toward the center of the turning center of the substrate carrying robot, , And configured to detect the arrangement state of the substrate by the detection unit
Substrate transport robot.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JPJP-P-2013-107806 | 2013-05-22 | ||
JP2013107806A JP5750472B2 (en) | 2013-05-22 | 2013-05-22 | Substrate transport robot, substrate transport system, and method for detecting substrate arrangement state |
Publications (2)
Publication Number | Publication Date |
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KR20140137311A KR20140137311A (en) | 2014-12-02 |
KR101645082B1 true KR101645082B1 (en) | 2016-08-12 |
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KR1020140060159A KR101645082B1 (en) | 2013-05-22 | 2014-05-20 | Substrate transfer robot, substrate transfer system and method for detecting placement state of substrate |
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Country | Link |
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US (1) | US9390954B2 (en) |
JP (1) | JP5750472B2 (en) |
KR (1) | KR101645082B1 (en) |
CN (1) | CN104183521B (en) |
TW (1) | TW201444655A (en) |
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CN106660183B (en) * | 2014-08-08 | 2019-04-30 | 索尼公司 | Transmission equipment |
US9786530B2 (en) * | 2014-10-20 | 2017-10-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Wafer transfer method and system |
EP3238883B1 (en) * | 2014-12-26 | 2020-12-09 | Kawasaki Jukogyo Kabushiki Kaisha | Robot |
CN104899887B (en) * | 2015-06-17 | 2018-06-22 | 北京北方华创微电子装备有限公司 | The silicon chip distribution image detecting method and device of semiconductor equipment bearing area |
CN104952757B (en) * | 2015-06-17 | 2018-01-26 | 北京七星华创电子股份有限公司 | A kind of silicon chip distribution detection method and device with distributed image sensing unit |
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CN104183521A (en) | 2014-12-03 |
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CN104183521B (en) | 2017-07-04 |
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