KR101561854B1 - Fpga 기반의 비실장형 스토리지 테스트 장치 - Google Patents

Fpga 기반의 비실장형 스토리지 테스트 장치 Download PDF

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KR101561854B1
KR101561854B1 KR1020130116139A KR20130116139A KR101561854B1 KR 101561854 B1 KR101561854 B1 KR 101561854B1 KR 1020130116139 A KR1020130116139 A KR 1020130116139A KR 20130116139 A KR20130116139 A KR 20130116139A KR 101561854 B1 KR101561854 B1 KR 101561854B1
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KR
South Korea
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unit
data
test
device driver
hba
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KR1020130116139A
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English (en)
Korean (ko)
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KR20150037002A (ko
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한영면
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주식회사 유니테스트
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Priority to KR1020130116139A priority Critical patent/KR101561854B1/ko
Priority to CN201410340524.5A priority patent/CN104516843B/zh
Publication of KR20150037002A publication Critical patent/KR20150037002A/ko
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/30—Monitoring
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/40—Bus structure
    • G06F13/4063—Device-to-bus coupling
    • G06F13/4068—Electrical coupling
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2213/00—Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F2213/0024—Peripheral component interconnect [PCI]

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
KR1020130116139A 2013-09-30 2013-09-30 Fpga 기반의 비실장형 스토리지 테스트 장치 KR101561854B1 (ko)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020130116139A KR101561854B1 (ko) 2013-09-30 2013-09-30 Fpga 기반의 비실장형 스토리지 테스트 장치
CN201410340524.5A CN104516843B (zh) 2013-09-30 2014-07-17 基于fpga的非安装型存储器测试装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020130116139A KR101561854B1 (ko) 2013-09-30 2013-09-30 Fpga 기반의 비실장형 스토리지 테스트 장치

Publications (2)

Publication Number Publication Date
KR20150037002A KR20150037002A (ko) 2015-04-08
KR101561854B1 true KR101561854B1 (ko) 2015-10-22

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KR1020130116139A KR101561854B1 (ko) 2013-09-30 2013-09-30 Fpga 기반의 비실장형 스토리지 테스트 장치

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KR (1) KR101561854B1 (zh)
CN (1) CN104516843B (zh)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20200077387A (ko) * 2018-12-20 2020-06-30 주식회사 아도반테스토 솔리드 스테이트 장치(ssd)의 특이한 섹터 크기 및 보호 모드를 위한 자동 검사 장비(ate) 지원 프레임 워크
US11101017B2 (en) 2018-11-13 2021-08-24 SK Hynix Inc. Memory system and test system
US11959959B2 (en) 2020-05-28 2024-04-16 Samsung Electronics Co., Ltd. Burn in board test device and system

Families Citing this family (17)

* Cited by examiner, † Cited by third party
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US9965356B2 (en) * 2016-09-02 2018-05-08 Alibaba Group Holding Limited Method and system of high-availability PCIE SSD with software-hardware jointly assisted implementation to enhance immunity on multi-cell upset
KR102124778B1 (ko) * 2017-02-16 2020-06-19 엘에스일렉트릭(주) Fpga를 이용한 파워 스택 모니터링 시스템 및 이를 포함하는 파워 스택
CN107239374B (zh) * 2017-06-06 2020-05-05 烽火通信科技股份有限公司 基于fpga实现ddr接口自动化读写测试的装置及方法
KR102039112B1 (ko) * 2017-06-20 2019-10-31 포스필 주식회사 피시험 디바이스를 테스트하기 위한 프로세서 기반의 계측 방법 및 이를 이용한 계측 장치
CN107301140A (zh) * 2017-06-27 2017-10-27 山东超越数控电子有限公司 一种利用fpga接口板采用dma进行数据传输的方法
US10663515B2 (en) * 2017-11-01 2020-05-26 Nvidia Corp. Method and apparatus to access high volume test data over high speed interfaces
CN108681500B (zh) * 2018-04-28 2021-09-07 格兰菲智能科技有限公司 具有事务记录能力的系统和事务记录方法
CN109032859A (zh) * 2018-06-26 2018-12-18 郑州云海信息技术有限公司 一种nvme ssd逻辑块检测方法、系统及相关装置
CN109062744A (zh) * 2018-07-24 2018-12-21 郑州云海信息技术有限公司 一种实现批量测试服务器内存的方法和系统
CN109032897A (zh) * 2018-08-01 2018-12-18 浪潮电子信息产业股份有限公司 数据调度方法、主机以及固态硬盘
TWI715162B (zh) * 2019-08-26 2021-01-01 點序科技股份有限公司 記憶體驗證方法及記憶體驗證系統
CN110543396B (zh) * 2019-09-06 2021-03-02 深圳市安信达存储技术有限公司 一种PCIe扩展集群测试硬盘的装置及方法
CN110851376A (zh) * 2019-10-21 2020-02-28 天津大学 一种基于FPGA的PCIe接口设计方法
CN110765033B (zh) * 2019-10-31 2023-03-10 四川效率源信息安全技术股份有限公司 一种ahci模式下访问硬盘的方法
CN112363875B (zh) * 2020-10-21 2023-04-07 海光信息技术股份有限公司 一种系统缺陷检测方法、设备、电子设备和存储介质
CN114036090B (zh) * 2021-10-25 2023-10-17 天津市英贝特航天科技有限公司 基于fpga进行dma传输的加密图像缓冲解析模块
CN114546917B (zh) * 2022-01-29 2024-06-14 山东云海国创云计算装备产业创新中心有限公司 一种fpga侧辅助ip系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100914174B1 (ko) * 2009-02-18 2009-08-26 (주) 제노맥스 Ｆｐｇａ 컨트롤러 기반 테스터 인터페이스 장치
KR101254647B1 (ko) * 2012-08-13 2013-04-15 주식회사 유니테스트 솔리드 스테이트 드라이브 테스트장치

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2011149725A2 (en) * 2010-05-28 2011-12-01 Verigy (Singapore) Pte. Ltd. Flexible storage interface tester with variable parallelism and firmware upgradeability

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100914174B1 (ko) * 2009-02-18 2009-08-26 (주) 제노맥스 Ｆｐｇａ 컨트롤러 기반 테스터 인터페이스 장치
KR101254647B1 (ko) * 2012-08-13 2013-04-15 주식회사 유니테스트 솔리드 스테이트 드라이브 테스트장치

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11101017B2 (en) 2018-11-13 2021-08-24 SK Hynix Inc. Memory system and test system
KR20200077387A (ko) * 2018-12-20 2020-06-30 주식회사 아도반테스토 솔리드 스테이트 장치(ssd)의 특이한 섹터 크기 및 보호 모드를 위한 자동 검사 장비(ate) 지원 프레임 워크
KR102146198B1 (ko) 2018-12-20 2020-08-19 주식회사 아도반테스토 솔리드 스테이트 장치(ssd)의 특이한 섹터 크기 및 보호 모드를 위한 자동 검사 장비(ate) 지원 프레임 워크
US11959959B2 (en) 2020-05-28 2024-04-16 Samsung Electronics Co., Ltd. Burn in board test device and system

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Publication number Publication date
KR20150037002A (ko) 2015-04-08
CN104516843A (zh) 2015-04-15
CN104516843B (zh) 2018-04-20

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