KR101519529B1 - Vertical type probe unit block - Google Patents

Abstract

A vertical probe unit block is disclosed, wherein the vertical probe unit block includes a TCP block unit; And a plurality of plates each having a plurality of holes formed therein, a holder portion having the plurality of plates spaced apart from each other in the vertical direction, and a plurality of holes And a probe block having a probe pin, wherein the plurality of probe pins are electrically connected to the TCP block portion at an upper end thereof, and the lower end thereof is brought into contact with a pad of the display panel at the time of inspecting the display panel.

Description

Vertical probe unit block {VERTICAL TYPE PROBE UNIT BLOCK}

The present invention relates to a vertical probe unit block for inspecting display panels such as LCD panels, OLED panels and the like.

A display panel such as a liquid crystal display panel (LCD), a plasma display panel (PDP), an active matrix organic light emitting diode (OLED) A plurality of pads (electrodes) for applying an electrical signal may be provided at the edge portions of the electrodes.

The probe unit is a unit for checking whether a defect occurs in the manufacturing process by performing inspection on the produced display panel. For example, the probe unit can test a pixel error, a short circuit (wiring defect), etc. by applying a test electric signal to a pad (electrode) of a display panel.

As such a probe unit, a blade type as disclosed in Korean Patent Laid-Open Publication No. 2011-0039976 or a film type as disclosed in Korean Patent Laid-Open Publication No. 2011-008233 is mainly used have.

However, the blade-type probe unit has a disadvantage in that it is easily bent due to its structure and its durability is deteriorated. As a result, a precise contact at a certain position can not be continuously performed, thereby causing a pin miss.

In addition, although the film-type probe unit is more usable than the blade-type probe unit, there is a problem in that foreign matter easily sticks on one surface of the film on which the contact portion is formed, and the contact stability between the probe unit and the pad .

SUMMARY OF THE INVENTION It is an object of the present invention to provide a vertical probe unit block having a structure in which durability of a probe pin is secured and contact stability of an electrode pad of a display panel is greatly improved, do.

According to a first aspect of the present invention, there is provided a vertical probe unit block comprising: a TCP block; And a plurality of plates each having a plurality of holes formed therein, a holder portion having the plurality of plates spaced apart from each other in the vertical direction, and a plurality of holes And a probe block having a probe pin, wherein the plurality of probe pins are electrically connected to the TCP block portion at an upper end thereof, and the lower end thereof is brought into contact with a pad of the display panel at the time of inspecting the display panel.

Also, according to an embodiment of the present invention, the probe block unit may be detachably coupled to the TCP block unit in a vertical direction.

According to an embodiment of the present invention, the plurality of holes may be formed in a zigzag shape corresponding to the pitch of the pads of the display panel.

According to the above-mentioned problem solving means of the present invention, since the plurality of plates are arranged in the holder portion at intervals in the vertical direction, the probe pins can be horizontally supported (lateral displacement restraint) The pins can be arranged vertically and firmly and stably so that the vertical probe unit block can ensure high durability and usability.

According to the present invention, since the probe pins are vertically provided, the probe block can be detachably coupled to the TCP block part in the vertical direction in the form of a module (aggregate, ASSY) Repair or replacement of only the probe block portion including the probe pin can be made easier.

In addition, according to the above-mentioned problem solving means of the present invention, since the plurality of holes are formed in a zigzag shape on the plate, the fine pitch between the probe pins can be more easily ensured.

FIG. 1 is a schematic perspective view (not showing a probe pin) and a partially enlarged view (showing a probe pin) obliquely viewed from the front lower side of the vertical probe unit block according to an embodiment of the present invention.
FIG. 2 is a schematic perspective view (not showing a probe pin) and a partially enlarged view (showing a probe pin) obliquely viewed from the rear of the vertical probe unit block according to one embodiment of the present invention.
3 is a schematic bottom view and partial enlarged view of a vertical probe unit block according to an embodiment of the present invention.
FIG. 4 is a schematic perspective view (not showing a probe pin) obliquely viewed from a rear lower side of a state in which the TCP block portion and the probe block portion of the vertical probe unit block according to the embodiment of the present invention are separated in the vertical direction.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily carry out the present invention. It should be understood, however, that the present invention may be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. In the drawings, the same reference numbers are used throughout the specification to refer to the same or like parts.

Throughout this specification, when a part is referred to as being "connected" to another part, it includes not only a case directly connected but also a case where it is physically or electrically connected with another part in between.

Throughout this specification, when a member is "on " another member, it includes not only when the member is in contact with the other member, but also when there is another member between the two members.

Throughout this specification, when an element is referred to as "including " an element, it is understood that the element may include other elements as well, without departing from the other elements unless specifically stated otherwise. The terms "about "," substantially ", etc. used to the extent that they are used throughout the specification are intended to be taken to mean the approximation of the manufacturing and material tolerances inherent in the stated sense, Accurate or absolute numbers are used to help prevent unauthorized exploitation by unauthorized intruders of the referenced disclosure. The word " step (or step) "or" step "used to the extent that it is used throughout the specification does not mean" step for.

For reference, the terms (upward, downward, upper, lower, upper, lower, upper, lower, and the like) related to directions and positions in the description of the embodiments of the present invention are set based on FIG. 1, FIG. 2, and the like. For example, in FIGS. 1 and 2, the upward direction may be upward, and the downward direction may be downward. However, the embodiments of the present application may be arranged in various directions such that the lower ends are arranged in an oblique direction in various practical applications.

In addition, the description of constitution and technical matters which are obvious to a person having ordinary skill in the art to which the present invention belongs will be simplified or omitted.

A vertical probe unit block (hereinafter referred to as 'vertical probe unit block') according to an embodiment of the present invention relates to a vertical probe unit block for inspecting a display panel.

FIG. 1 is a schematic perspective view (not showing a probe pin) and a partially enlarged view (showing a probe pin) obliquely viewed from a front lower side of the vertical probe unit block according to an embodiment of the present invention, and FIG. (A probe pin not shown) and a partial enlarged view (a probe pin shown) that obliquely look at the vertical probe unit block according to the example at an obliquely downward position from the rear. FIG. 3 is a cross- A schematic bottom view and a partially enlarged view of the block.

The vertical probe unit block includes a TCP block part (1).

The TCP block unit 1 will be described below with reference to the configuration of the probe block unit 3 first.

The vertical probe unit block includes a probe block portion (3).

Referring to FIGS. 1 and 2, the probe block 3 includes a plurality of plates 31, a holder 33, and a plurality of probe pins 35.

Referring to FIGS. 1 and 2, a plurality of holes 311 are formed in a plurality of plates 31, respectively. Further, the plurality of plates 31 are arranged on the holder portion 33 with an interval in the vertical direction.

Referring to FIG. 1, a plurality of probe pins 35, which will be described later, are inserted and mounted through holes corresponding to each other in the vertical direction among a plurality of holes 311 formed for each of the plurality of plates 31 arranged at intervals as described above .

Here, the plurality of holes 311 may be formed at the same position for each of the plurality of plates 31, but is not limited thereto. The probe pins 35 may be arranged to be slightly inclined within a range of 85 degrees to 90 degrees even if the probe pins 35 are vertically arranged. In this case, the plurality of holes 311 may include a plurality of The positions of the plates 31 may be slightly different.

That is, when a plurality of probe pins 35 to be described later are respectively inserted and inserted through the holes corresponding to each other in the up-and-down direction among the plurality of holes 311, the probe pins 35 are inclined until they are arranged so as to be inclined in this manner As shown in Fig.

Since the size (diameter) of the probe pin 35 may be slightly different along the vertical direction, the plurality of holes 31 formed in each of the plurality of plates 31 may be slightly different in size from each other

The holder portion 33 is configured to hold (hold) a plurality of plates 31. [

1 and 2, the holder 33 may include a plurality of holders 331 connected to each other along the vertical direction. Here, the term " connected to each other " includes not only being directly in contact with each other but also indirectly connecting through a connecting member.

Illustratively, referring to Figs. 1 and 2, the holder portion 33 is disposed at an interval downward with respect to the upper holder portion 33a and the upper holder portion 33a, in which a plurality of holders 331 are sequentially stacked And a lower holder portion 33b in which a plurality of holders 331 having the same or different numbers as the upper holder portions 33a are stacked in order.

Illustratively, the holder portion 33 may be an engineering plastic. 1 and 2, since the upper holder 33a can be a base for supporting the lower holder 33b, the upper holder 33a is provided on a larger scale (specification) than the lower holder 33b desirable.

Referring to FIG. 1, each of the plurality of holders 331 may be formed with a slot 3311 to which at least one of the plurality of plates 31 is mounted.

In addition, at least one of the upper and lower peripheries of the slot 3311 may be provided with a seating jaw 3311a. Referring to Figs. 1 and 2, the plate 31 may be disposed and fixed on the seating jaw 3311a. The fixing of the plate 31 to the seating jaw 3311a can be achieved by, for example, bonding the plate 31 to the seating jaw 3311a, but the present invention is not limited thereto.

By way of example, referring to the enlarged area of FIG. 1, the seating jaw 3311a may be formed in a depressed shape downwardly from the top of the slot 3311, or a depressed shape upwardly from the bottom of the slot 3311 have.

Further, the recessed depth of the seating step 3311a may be a depth corresponding to the thickness of the plate 31. [ The depth corresponding to the thickness of the plate 31 is a depth equal to the thickness of the plate 31 or a thickness of the plate 31 and a thickness of the adhesive layer for adhering the plate 31 to the seating jaw 3311a Can mean the same depth as the sum.

As shown in the enlarged area of FIG. 1, the center plate of the lower plate 31b (plate 31) is supported by the holder (not shown) by being recessed at a depth corresponding to the thickness of the plate 31, 331 and the holder 331, as shown in Fig.

1, the slot 3311 of the upper holder 331 of the plurality of holders 331 included in the lower holder 33b is provided with an engagement jaw 3311a And the seating 3311a is formed in the slot 3311 of the lower holder 331 of the lower holder 33b at both the upper and lower circumferences thereof.

In other words, the seating jaw 3311a may be formed on at least one of the upper and lower circumferences of the holder 331 in consideration of the thickness of each holder 331 and the like.

Although not shown in the drawings, the plurality of plates 31 may be integrally formed with the holder portion 33, as another embodiment of the plurality of plates 31 and the holder portion 33. [

In other words, as described above, the plurality of plates 31 may be fixedly assembled to the holder 33 through an adhesive or the like, but may be integrally manufactured together with the holder 33 without being assembled separately .

Illustratively, the plurality of plates 31 may be provided integrally with a holder 331 corresponding to a portion where each of the plurality of holders 331 is to be disposed. The holders 331 integrally formed with the plate 31 are connected to each other along the vertical direction so that the holders 33 integrated with the plurality of plates 31 can be provided.

In this case, the plurality of plates 31 may be made of the same material (for example, engineering plastic) as the integrally formed holder portion 33.

The plurality of probe pins 35 are electrically connected to the TCP block portion 1 at the upper end and contacted with the pads of the display panel at the time of inspection of the display panel. And are arranged to pass through the plurality of holes 311.

Further, the probe pin 35 may be fixed to one or more of the holes 311 formed in each of the plurality of plates 31. Illustratively, the probe pin 35 may be fixed to the hole of the uppermost plate among the plurality of plates 31, but is not limited thereto.

The plurality of probe pins 35 may have a circular cross-section. That is, the tip of the probe pin 35 according to the present invention may be a tip using a conventional etching, or a vertical pin having a circular section instead of the film type. When the probe pins 35 have a circular cross-section and are vertically arranged, the bending force is minimized and the axial force can be the main force. In addition, even if a predetermined bending force is applied, the probe pin 35 can secure a constant rigidity with respect to an external force that can be applied in various directions through a circular cross section.

In addition, the probe pin 35 may correspond to a vertical type probe pin. Referring to FIGS. 1 to 3, the plurality of probe pins 35 may be arranged to be in contact with one surface of the pad of the display panel at an angle of 85 to 90 degrees, respectively. In particular, referring to FIG. 3, it can be seen that the probe pin 35 on the bottom view is shown to be slightly obliquely tilted upward. In this case, the probe pin 35 is vertically arranged. However, in the vertical type, the probe pin 35 may be arranged at an angle of about 85 to 90 degrees in addition to the 90 degrees contact with one surface of the pad of the display panel. .

The spacing between the plurality of the plates 31 is set to be shorter than the interval between the plurality of probe pins 35 to prevent the occurrence of buckling when the lower ends of the plurality of probe pins 35 are brought into contact with the pads for inspection of the display panel Lt; / RTI >

That is, the plurality of plates 31 may prevent buckling that may occur when the probe pins 35 are excessively bent. Since the probe pins 35 having a predetermined small diameter and extending vertically in the vertical direction can easily buckle, a plurality of plates 31 are provided for each specific height at which bending of the probe pins 35 can occur So that the structural rigidity of the probe pin 35 at the time of inspecting the pad of the display panel can be ensured by restricting the lateral (horizontal) displacement.

1 and 2, the plurality of plates 31 may include a plurality of upper plates 31a and a plurality of lower plates 31b.

The plurality of upper plates 31a are plates mounted on the upper holder portion 33a of the holder portion 33. [ The plurality of lower plates 31b is a plate mounted on the lower holder portion 33b of the holder portion 33. [

As described above, each of the plates 31 may be provided separately from the holder 33 through wafer processing and may be fixed to the holder 33 through assembly. However, the plate 33 may be integrally formed with the holder 33, As shown in FIG.

1 and 2, the interval between the lowermost plate of the plurality of upper plates 31a and the uppermost plate of the plurality of lower plates 31b is determined by the interval between the plurality of upper plates 31a, Is preferably larger than the interval between the plurality of lower plates 31b. In other words, a plurality of the plates 31 are respectively disposed at the upper end and the lower end of the probe pin 35, and a predetermined gap may be provided between the upper end and the lower end.

The predetermined impact which is received when the lower end of the probe pin 35 is connected to the pad of the display panel is transmitted to the upper end side of the probe pin 35 in reaction. Therefore, it is preferable that a plurality of plates 31 are arranged at closely spaced intervals on the lower end side and the upper end side of the middle portion of the probe pin 35 in terms of usability and robustness for repeated use of the probe pin 35 Lt; / RTI >

Also, as shown in FIG. 1, the spacing of the lower plate 31b, which surrounds the lower end of the probe pin 35 and restrains the lateral displacement, may be narrower than the spacing of the upper plate 31a.

A plurality of upper plates 31a are mounted on the upper holder 33a and a plurality of lower plates 31b are mounted on the lower holder 33b so that the upper plate 31a and the lower plate 31b The holder 33 may include a support member 333 for connecting the upper holder 33a and the lower holder 33b with respect to the predetermined gap.

The plate 31 having the plurality of holes 311 for arranging the probe pins 35 is manufactured through the MEMS process so that the plurality of holes 311 can have a fine pitch have. That is, the vertical probe unit block can be manufactured using a MEMS process to overcome manufacturing limitations in securing fine pitches in conventional machining. In other words, such a fine pitch can not be obtained through conventional machining, but can be regarded as a threshold value derived from a difference in manufacturing method that can be secured only through the MEMS process.

However, the plurality of holes 311 of the plate 31 of the present invention are not limited to being formed only through the MEMS process, and may be machined, if necessary, in consideration of the required pitch, applicability, As shown in FIG.

Referring to FIG. 3, a plurality of holes 311 formed in each of the plurality of plates 31 may be formed in a zigzag shape corresponding to the pitch of the pads of the display panel.

In other words, securing the fine pitch can be ensured by miniaturizing the size of the hole 311 and the size of the corresponding probe pin 35 as described above. However, by arranging the plurality of holes 311 in a staggered arrangement Thereby ensuring that the holes 311 having a predetermined size do not interfere with or overlap with adjacent holes. That is, by securing the pitch through the formation of the holes 311 as shown in FIG. 3, it is possible to manufacture the vertical probe unit block more easily.

In the following, the TCP block unit 1 will be described with reference to FIG.

FIG. 4 is a schematic perspective view (not showing a probe pin) obliquely viewed from a rear lower side of a state in which the TCP block portion and the probe block portion of the vertical probe unit block according to the embodiment of the present invention are separated in the vertical direction.

Referring to FIG. 4, the TCP block unit 1 may include a tab IC or a glass pattern 11 on the lower side. The plurality of probe pins 35 may be connected to the FPC (not shown) through contact with the tab eye or the glass pattern 11 provided in the TCP block unit 1 when the probe block unit 3 and the TCP block unit 1 are coupled. The flexible circuit board 13). That is, the intermediate medium for connecting the probe pin 35 of the probe block portion 3 and the FPC 13 may be a tab joint or a glass substrate (ASSY) with a driving chip bonded to the glass pattern 11.

Here, the configurations of the tap eye or the glass pattern 11 and the FPC 13 are obvious to those of ordinary skill in the art, and a detailed description thereof will be omitted.

4, the TCP block unit 1 may be detachably coupled to the probe block unit 3 in the vertical direction.

The probe block 35 of the vertical probe unit block is erected vertically so that the probe block portion 3 and the TCP block portion 1 in which the probe pins 35 are arranged vertically When combined, it is very easy to configure the electrical connection to be established. Accordingly, the probe block unit 3 and the TCP block unit 1 may be provided in a structure that can be separated or combined along the vertical direction through a fastening member such as a screw. It is possible to repair or replace only the probe block portion 1 provided with the probe pin 35 through the structure of the block type (aggregate ASSY) which can be easily separated (detached) Can be increased.

It will be understood by those of ordinary skill in the art that the foregoing description of the embodiments is for illustrative purposes and that those skilled in the art can easily modify the invention without departing from the spirit or essential characteristics thereof. It is therefore to be understood that the above-described embodiments are illustrative in all aspects and not restrictive. For example, each component described as a single entity may be distributed and implemented, and components described as being distributed may also be implemented in a combined form.

The scope of the present invention is defined by the appended claims rather than the detailed description, and all changes or modifications derived from the meaning and scope of the claims and their equivalents should be construed as being included within the scope of the present invention.

1: TCP block part 11: Tab window or glass pattern
13: FPC 3: Probe block section
31: a plurality of plates 31a: a plurality of upper plates
31b: a plurality of lower plates 311: a plurality of holes
33: holder part 33a: upper holder part
33b: Lower holder part 331:
3311: Slot 3311a:
333: support member 35: a plurality of probe pins

Claims (13)

A vertical probe unit block for inspecting a display panel,
TCP block; And
A plurality of plates each having a plurality of holes formed therein, a holder portion having the plurality of plates spaced apart in the vertical direction, and a plurality of probes arranged so as to vertically pass through the plurality of holes of each of the plurality of plates, And a probe block portion having a pin,
Wherein the plurality of probe pins are electrically connected to the TCP block portion at an upper end thereof and are brought into contact with a pad of the display panel at the time of inspecting the display panel,
Wherein an interval between the plurality of the probes is an interval for preventing the occurrence of buckling of the plurality of probe pins when the lower ends of the plurality of probe pins are brought into contact with the pad for inspection of the display panel, . The method according to claim 1,
Wherein the holder portion includes a plurality of holders connected to each other along a vertical direction,
Wherein each of said plurality of holders is formed with a slot in which at least one of said plurality of plates is mounted. 3. The method of claim 2,
At least one of the upper and lower peripheries of the slot is formed with a seating jaw,
And the plate is secured to the seating jaw. The method of claim 3,
Wherein the recessed depth of the seating jaw is a depth corresponding to the thickness of the plate. delete The method according to claim 1,
Wherein the plurality of plates comprises:
A plurality of upper plates mounted on upper holder portions of the holder portions; And
And a plurality of lower plates mounted on the lower holder part of the holder part,
Wherein an interval between the lowermost plate of the plurality of upper plates and the uppermost plate of the plurality of lower plates is larger than an interval between the plurality of upper plates and an interval between the lower plates, . The method according to claim 6,
And the holder portion includes a support member for connecting the upper holder portion and the lower holder portion. The method according to claim 1,
Wherein the plurality of holes are formed in a zigzag shape corresponding to the pitch of the pads of the display panel. The method according to claim 1,
Wherein the plurality of probe pins have a circular cross-section. The method according to claim 1,
Wherein the plurality of probe pins are arranged so as to be in contact with each other at an angle of 85 to 90 degrees with one surface of the pad of the display panel. The method according to claim 1,
And the probe block portion is detachably coupled with the TCP block portion in the vertical direction. 11. The method of claim 10,
Wherein the TCP block unit has a tab eye or a glass pattern on the lower side,
Wherein the plurality of probe pins are electrically connected to the FPC through contact with the tab eye or the glass pattern when the probe block and the TCP block are coupled. The method according to claim 1,
Wherein the plurality of plates are integrally formed with the holder portion.

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