KR101368485B1 - On-line monitoring system for ultrapure water - Google Patents
On-line monitoring system for ultrapure water Download PDFInfo
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- KR101368485B1 KR101368485B1 KR1020120109405A KR20120109405A KR101368485B1 KR 101368485 B1 KR101368485 B1 KR 101368485B1 KR 1020120109405 A KR1020120109405 A KR 1020120109405A KR 20120109405 A KR20120109405 A KR 20120109405A KR 101368485 B1 KR101368485 B1 KR 101368485B1
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- carrier
- ultrapure water
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67288—Monitoring of warpage, curvature, damage, defects or the like
Abstract
The present invention relates to an ultrapure water online monitoring system, and more particularly, to an ultrapure water online monitoring system capable of real-time analysis of a contamination state of an ultrapure water.
Description
The present invention relates to an ultrapure water online monitoring system, and more particularly, to an ultrapure water online monitoring system capable of real-time analysis of a contamination state of an ultrapure water.
Ultrapure water (UPW, Ultrapure water) is extremely purified water, and is used in various ways, including cleaning applications in semiconductor manufacturing processes.
More specifically, semiconductor devices generally apply a photoresist after forming an oxide film on a wafer, remove a portion of the photoresist by exposing with a mask, depositing metal particles to form and etch a metal pattern, and the like. Manufactured through the same process. That is, during the manufacturing process of a semiconductor device, a process of forming and removing a variety of material layers on a wafer is performed several times. At this time, in order to prevent the materials to be removed in the previous process from remaining in one process before moving from one process to the next process, a cleaning process is generally entered between various processes during the semiconductor manufacturing process. In particular, due to the development of semiconductor technology, the trend of high integration of semiconductor devices is rapidly achieved. Therefore, the necessity of completely removing impurities such as materials remaining in the previous process or materials introduced from the outside is increasing.
As the semiconductor device is well known, it has a very fine structure, and even a small amount of impurities such as metals are introduced, which greatly affects the yield and performance of the semiconductor device. That is, adverse effects such as poor electrical properties such as dielectric breakdown strength, capacitance, leakage current, etc., or by the formation of by-products due to the reaction of trace metals with silicon or silicon oxide on the wafer, resulting in deterioration of the device. This is what happens. Therefore, the cleaning process performed such that no impurities remain on the wafer is very important.
In particular, in the wet cleaning method using ultrapure water, when the contaminated ultrapure water solution is used, serious defects are caused in the product, so it is necessary to monitor the contamination of the ultrapure water solution.
The conventional method of taking a sample and analyzing it in a laboratory is likely to be contaminated during sampling, sample transfer, and analysis, and it is difficult to secure sufficient capacity of the measured water, which inevitably lowers the reliability of the analysis (pollution evaluation). There is a problem.
In addition, in the case of sampling and analysis, it takes a long time to analyze, and even if it is determined that the contamination state, there is a problem that it is difficult to quickly perform a subsequent response to cut off the supply of contaminated ultrapure water so as to lower the defective rate.
Meanwhile, in order to solve this problem, Korean Patent No. 0585139 ("Metal Contamination Monitoring Method of Wafer Cleaning Liquid and Wafer Cleaning Liquid") has been proposed.
However, the Korean Patent No. 0585139, which is mixed with the reagent while analyzing the cleaning solution while transporting the cleaning solution along the sampling line, may reduce the analysis reliability when the sampling line and the valves, pumps, and mixers provided along the sampling line are contaminated. There is only a problem.
Therefore, there is a need for an apparatus and method capable of accurately analyzing the contamination level of a cleaning liquid (ultra pure water solution) in real time.
The present invention has been made to solve the problems described above, an object of the present invention is to provide a ultra-pure water online monitoring system capable of real-time analysis of the contamination state of the ultrapure water, and to increase the reliability.
Particularly, an object of the present invention is that the volume of the sample loop is greater than the volume of the sample, so that a second section (buffer section) is formed between the injected sample and the carrier, thereby preventing contamination of the sample by the carrier. It is to provide a monitoring system.
It is also an object of the present invention to provide an ultra-pure water solution online monitoring system that can use an ultrapure water solution supplied to a sample by a carrier supply unit or use an inert gas.
In addition, an object of the present invention is to provide an ultra-pure solution online monitoring system, characterized in that the standard solution supply unit is provided in the sample injection unit to evaluate and correct the concentration rate of the concentration unit.
In addition, the purpose of the present invention is the ultra-pure water solution is continuously introduced into the sample loop through the ultra-pure water inflow line, the ultra-pure water that is not transferred to the condensing unit is discharged by the ultra-pure water online monitoring that can always keep the sample loop of the sample injection unit clean To provide a system.
Particularly, an object of the present invention is to provide an ultra-pure water online monitoring system that can analyze contamination in real time when used for cleaning purposes such as wafers of ultrapure water, thereby preventing product defects and improving productivity. .
Ultra-pure water solution
The
In addition, the
In addition, the
At this time, the
The
At this time, the
In addition, the ultrapure water
In addition, the standard
In addition, the
In addition, the
In addition, the ultrapure water solution
On the other hand, another ultra-pure solution
Accordingly, the ultrapure water online monitoring system of the present invention can analyze the contamination state of the ultrapure water in real time, and has an advantage of increasing reliability.
In particular, the ultra-pure water on-line monitoring system of the present invention can prevent the contamination of the sample by the carrier by forming a second section (buffer section) between the carrier and the sample to be injected is formed larger than the capacity of the sample loop. There is an advantage.
In addition, the ultra-pure water online monitoring system of the present invention has the advantage that the carrier supply using the ultra-pure water supplied to the sample, or can use an inert gas.
In addition, the ultra-pure water online monitoring system of the present invention has an advantage that the standard solution supply unit is provided in the sample injecting unit so that the concentration rate of the concentrate can be evaluated and corrected.
In addition, the ultra-pure water online monitoring system of the present invention, the ultra-pure water is continuously introduced into the sample loop through the ultra-pure water inflow line, and the ultra-pure water that is not transferred to the condenser is discharged so that the sample loop of the sample inlet can be kept clean at all times. There is an advantage.
In particular, the ultra-pure water online monitoring system of the present invention has the advantage of being able to analyze contamination in real time when used for cleaning purposes, such as wafers of ultra-pure solution, to prevent product defects in advance and to improve productivity.
1 is a block diagram of the ultrapure solution online monitoring system according to the present invention.
2 to 6 are views each showing an example of the ultrapure solution online monitoring system according to the present invention.
7 is a diagram showing the ultrapure solution capacity (first section, second section) when the sample loop of the ultrapure solution online monitoring system according to the present invention is long expressed.
8 is a view showing another example of the ultrapure solution online monitoring system according to the present invention.
FIG. 9 is a view showing a third section and a fourth section when the sample loop of the ultrapure water online monitoring system shown in FIG. 8 is long represented.
10 is a view showing another example of the ultrapure solution online monitoring system according to the present invention.
Hereinafter, the ultrapure solution
Ultra-pure water on-
The ultrapure water solution is water that is not contaminated with the metal or metal compound used in the cleaning process, and may be ultrapure water solution (UPW, Ultrapure water).
The
The
That is, the ultrapure
At this time, the ultrapure water solution is continuously transferred to the
That is, the ultrapure water solution has a continuous flow inside the ultrapure water
Through this, the ultrapure solution
The
The
2 to 5 illustrate a form in which the carrier uses an ultrapure water solution, and FIG. 6 illustrates that the carrier is stored in the
The
The first-
The first-
In this case, the first
4 is provided with a valve 221-1 for controlling the flow of the ultra-pure water solution of the first-
In FIG. 4, the valve 221-1 is provided in the longitudinal direction of the first-
That is, the valve 221-1 regulates the flow of the ultrapure water used as the carrier of the first-
2, 3, and 5 illustrate an example in which a first
In this case, the
3 is the same as that shown in FIG. 2, but the
The
That is, the ultra-pure water
6 illustrates an example in which the
The
The
In addition, the ultra-pure water
In this case, as shown in FIG. 9, the
That is, the inert gas of the fourth section can form a buffer section between the ultrapure water solution used as the carrier and the ultrapure water solution as the sample, and the analysis reliability by mixing the ultrapure water solution used as the carrier and the ultrapure water solution as the sample. The problem that can be lowered can be prevented in advance.
In addition, the
In this case, the standard
The standard
The standard
The
In addition, the standard solution is preferably transferred to the concentrating
That is, the shape shown in FIG. 10 shows the third flow
Since the
The
In the present invention, the sample supplied to the concentrating
The
The
The
The
The
On the other hand, the ultra-pure water
That is, a space in which the ultrapure water solution or carrier can be stored inside the
FIG. 7 is a view illustrating a case in which the
At this time, the ultrapure water in the
The first section means an area in which the sample to be transferred to the concentrating
The second section is a portion for preventing direct contact between the sample supplied to the concentrate and the carrier to prevent degradation of analysis reliability caused by mixing the carrier and the sample.
For example, when the supply volume of the sample is 10 ml, the volume of the
Accordingly, the ultrapure water
In particular, the ultra-pure water
It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. It goes without saying that various modifications can be made.
1000: Ultrapure water online monitoring system
100: Ultrapure water inflow line
200: sample injection unit 210: sample loop
220: carrier supply unit 221: line 1-1
221-1: Valve
222: line 1-2, 223: first flow control unit
224 filter
225: storage unit 226: second line
227: second flow control unit
230: standard solution supply unit 231: standard solution storage unit
232: third line 233: third flow control unit
234: Standard solution loop
300: concentration section 301: concentration column
310: eluent supply unit 311: eluent storage unit
312: fourth line 313: fourth flow control unit
400: Analytical Department
Claims (13)
A concentrator 300 for mixing the sample supplied through the sample injector 200 and the eluent supplied through the eluent supply unit 310 to desorb the sample to be analyzed; And
An analysis unit 400 for quantitatively analyzing an analysis target sample supplied through the concentration unit 300; , ≪ / RTI &
Ultrapure solution online monitoring system, characterized in that the capacity of the sample loop 210 is more than the supply capacity of the sample.
The sample loop 210 is
Ultra-pure solution online, characterized in that it comprises a first section in which the sample to be transferred to the concentrator 300 is located, a second section in which the ultrapure water except the sample is located between the sample and the carrier of the first section. Monitoring system.
The carrier supply unit 220
A first-first line 221 branched from the ultrapure water inflow line 100 to move the ultrapure water solution, and
A first-second line 222 connecting the first-first line 221 and the sample injector 200;
Ultra-pure water online monitoring system comprising a first flow rate control unit (223) for controlling the flow of the ultra-pure water used as a carrier.
The carrier supply unit 220
The first flow rate controller 223 is provided in the first-second line 222 and the filter 224 in the rear side of the first flow rate controller 223 in the carrier flow direction of the first-second line 222. Ultra-pure solution online monitoring system, characterized in that is further provided.
The carrier supply unit 220
A storage unit 225 in which a carrier is stored,
A second line 226 connecting the storage unit 225 and the sample injection unit 200;
Ultra-pure solution online monitoring system comprising a second flow control unit (227) for controlling the flow of the carrier.
The carrier supply unit 220
A storage unit 225 in which a carrier is stored,
A second line 226 connecting the storage unit 225 and the sample injection unit 200;
A second flow rate controller 227 provided in the second line 226 to control the flow of carriers;
Carrier stored in the storage unit 225 is an ultra-pure water online monitoring system, characterized in that the inert gas.
The sample loop 210 is
A third section in which the sample to be transferred to the concentrating unit 300 is located,
And a fourth section in which the inert gas supplied through the second flow controller 227 is located between the sample and the carrier of the third section.
The ultrapure water online monitoring system 1000
The standard solution supply unit 230 for supplying the standard solution to the sample injection unit 200 is further provided,
Ultra-pure solution online monitoring system, characterized in that the standard solution supplied to the sample injection unit 200 is supplied to the concentration unit 300.
The standard solution supply unit 230
A standard solution storage unit 231 for storing a standard solution,
A third line 232 connecting the standard solution storage part and the sample injection part 200;
Ultra-pure solution online monitoring system, characterized in that it comprises a third flow rate control unit 233 is provided in the third line (232) to supply a standard solution.
The sample injector 200
The standard solution supplied through the standard solution supply unit 230 is transferred, and the carrier of the quantity is supplied to the sample loop 210 through the carrier supply unit 220 to supply the standard solution of the quantity to the concentrating unit 300. Ultrapure solution online monitoring system that the standard solution loop 234 is formed.
The eluent supply unit 310
An eluent storage unit 311 storing the eluent;
A fourth line 312 connecting the eluent storage part 311 and the concentration part 300;
Ultra-pure water online monitoring system, characterized in that it comprises a fourth flow rate control unit (313) provided in the fourth line (312) for supplying the eluent.
The ultrapure water online monitoring system 1000
Ultrapure water is continuously introduced into the sample loop 210 through the ultrapure water inflow line 100,
Ultra-pure water online monitoring system, characterized in that the ultra-pure water that is not transferred to the concentration unit 300 is discharged.
A concentrator 300 for mixing the sample supplied through the sample injector 200 and the eluent supplied through the eluent supply unit 310 to desorb the sample to be analyzed; And
An analysis unit 400 for quantitatively analyzing an analysis target sample supplied through the concentration unit 300; , ≪ / RTI &
The carrier supply unit 220 includes a first line branched from the ultrapure water inflow line 100 to move the ultrapure water and a first flow controller 223 to supply the ultrapure water in the first line. Ultra-pure water online monitoring system, characterized in that the aqueous solution is used as a carrier.
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KR1020120109405A KR101368485B1 (en) | 2012-09-28 | 2012-09-28 | On-line monitoring system for ultrapure water |
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KR1020120109405A KR101368485B1 (en) | 2012-09-28 | 2012-09-28 | On-line monitoring system for ultrapure water |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101548632B1 (en) | 2015-03-12 | 2015-08-31 | 엔비스아나(주) | Apparatus For Analyzing Substrate Contamination And Method Thereof |
WO2016144107A1 (en) * | 2015-03-12 | 2016-09-15 | 엔비스아나(주) | Substrate contaminant analysis device and substrate contaminant analysis method |
KR20160109993A (en) * | 2015-03-12 | 2016-09-21 | 엔비스아나(주) | Apparatus For Analyzing Substrate Contamination And Method Thereof |
KR101809702B1 (en) * | 2016-07-26 | 2017-12-15 | 엔비스아나(주) | On-line Contamination Monitoring System and Method using it |
CN107845585A (en) * | 2016-09-20 | 2018-03-27 | 非视觉污染分析科学技术有限公司 | On-line monitoring oil contamination system and method |
KR101848233B1 (en) | 2015-08-31 | 2018-04-16 | 주식회사 위드텍 | Gas monitoring system that automatically compensate for water |
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JP2001083127A (en) | 1999-09-14 | 2001-03-30 | Nomura Micro Sci Co Ltd | Pure water analyzer, pure water manufacturing and managing system, and pure water analysis method |
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JPH0712792A (en) * | 1993-06-22 | 1995-01-17 | Yokogawa Electric Corp | Ion chromatograph |
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Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101548632B1 (en) | 2015-03-12 | 2015-08-31 | 엔비스아나(주) | Apparatus For Analyzing Substrate Contamination And Method Thereof |
WO2016144107A1 (en) * | 2015-03-12 | 2016-09-15 | 엔비스아나(주) | Substrate contaminant analysis device and substrate contaminant analysis method |
KR20160109993A (en) * | 2015-03-12 | 2016-09-21 | 엔비스아나(주) | Apparatus For Analyzing Substrate Contamination And Method Thereof |
KR102357431B1 (en) | 2015-03-12 | 2022-01-28 | 엔비스아나(주) | Apparatus For Analyzing Substrate Contamination And Method Thereof |
KR101848233B1 (en) | 2015-08-31 | 2018-04-16 | 주식회사 위드텍 | Gas monitoring system that automatically compensate for water |
KR101809702B1 (en) * | 2016-07-26 | 2017-12-15 | 엔비스아나(주) | On-line Contamination Monitoring System and Method using it |
CN107845585A (en) * | 2016-09-20 | 2018-03-27 | 非视觉污染分析科学技术有限公司 | On-line monitoring oil contamination system and method |
CN107845585B (en) * | 2016-09-20 | 2021-07-16 | 非视觉污染分析科学技术有限公司 | On-line pollution monitoring system and method |
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