KR101364404B1 - 자동 에디 전류 비파괴 테스트 분석을 위한 방법 - Google Patents

자동 에디 전류 비파괴 테스트 분석을 위한 방법 Download PDF

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KR101364404B1
KR101364404B1 KR1020117019218A KR20117019218A KR101364404B1 KR 101364404 B1 KR101364404 B1 KR 101364404B1 KR 1020117019218 A KR1020117019218 A KR 1020117019218A KR 20117019218 A KR20117019218 A KR 20117019218A KR 101364404 B1 KR101364404 B1 KR 101364404B1
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analysis
detection
locale
tube
management
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KR20110122678A (ko
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제프 스트리치
톰 메탈리치
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제텍 인크
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/28—Error detection; Error correction; Monitoring by checking the correct order of processing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00—Arrangements for program control, e.g. control units
    • G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44—Arrangements for executing specific programs
    • G06F9/451—Execution arrangements for user interfaces
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9073—Recording measured data

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Software Systems (AREA)
  • Quality & Reliability (AREA)
  • Computer Hardware Design (AREA)
  • Human Computer Interaction (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
KR1020117019218A 2009-01-19 2010-01-19 자동 에디 전류 비파괴 테스트 분석을 위한 방법 Active KR101364404B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14566609P 2009-01-19 2009-01-19
US61/145,666 2009-01-19
PCT/US2010/021428 WO2010083531A1 (en) 2009-01-19 2010-01-19 Methods for automated eddy current non-destructive testing analysis

Publications (2)

Publication Number Publication Date
KR20110122678A KR20110122678A (ko) 2011-11-10
KR101364404B1 true KR101364404B1 (ko) 2014-02-17

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KR1020117019218A Active KR101364404B1 (ko) 2009-01-19 2010-01-19 자동 에디 전류 비파괴 테스트 분석을 위한 방법

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Country Link
US (1) US8386404B2 (https=)
JP (1) JP5694193B2 (https=)
KR (1) KR101364404B1 (https=)
WO (1) WO2010083531A1 (https=)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8742752B2 (en) * 2010-10-01 2014-06-03 Westinghouse Electric Company Llc Nondestructive inspection method for a heat exchanger employing adaptive noise thresholding
US10896767B2 (en) * 2011-04-07 2021-01-19 Westinghouse Electric Company Llc Method of detecting an existence of a loose part in a steam generator of a nuclear power plant
US20140012521A1 (en) * 2012-07-06 2014-01-09 Zetec, Inc. Methods for Eddy Current Data Matching
US9335296B2 (en) 2012-10-10 2016-05-10 Westinghouse Electric Company Llc Systems and methods for steam generator tube analysis for detection of tube degradation
US9945814B2 (en) 2014-07-18 2018-04-17 Westinghouse Electric Company Llc Total integrated tube analysis
US9092484B1 (en) 2015-03-27 2015-07-28 Vero Analyties, Inc. Boolean reordering to optimize multi-pass data source queries
CN105181786A (zh) * 2015-07-16 2015-12-23 宁波市鄞州磁泰电子科技有限公司 焊缝缺陷磁法检测方法
CN109975395B (zh) * 2017-12-27 2022-09-20 核动力运行研究所 一种涡流检测信号图形成像方法
CN111562307B (zh) * 2020-04-22 2022-05-20 南京航空航天大学 一种基于直流漏磁原理的钢轨伤损数量实时统计方法
CN121476372B (zh) * 2026-01-07 2026-03-27 徐州鹏程钢结构工程有限公司 一种钢结构件焊接质量无损检测方法及系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040113625A1 (en) 2002-08-29 2004-06-17 Pagano Dominick A. Method and system for analysis of ultrasonic reflections in real time
US20100307249A1 (en) 2007-12-21 2010-12-09 V & M France Non-destructive testing, in particular for pipes during manufacture or in the finished state

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4814702A (en) * 1984-05-31 1989-03-21 Westinghouse Electric Corp. Process for accurately determining the position of the edges of support plates in steam generators
US4763274A (en) * 1986-06-24 1988-08-09 Westinghouse Electric Corp. Machine implemented analysis eddy current data
JPH02248895A (ja) * 1989-03-22 1990-10-04 Nuclear Fuel Ind Ltd 蒸気発生器における伝熱管欠陥部位判定方法
US5430376A (en) * 1993-06-09 1995-07-04 General Electric Company Combined thermoelectric and eddy-current method and apparatus for nondestructive testing of metallic of semiconductor coated objects
US5442285A (en) * 1994-02-28 1995-08-15 Westinghouse Electric Corporation NDE eddy current sensor for very high scan rate applications in an operating combustion turbine
JPH10197494A (ja) * 1997-01-16 1998-07-31 Mitsubishi Heavy Ind Ltd 渦電流探傷装置
JP2002005898A (ja) * 2000-06-21 2002-01-09 Mitsubishi Heavy Ind Ltd 渦電流探傷システム及び渦電流探傷方法
JP2002022708A (ja) * 2000-07-06 2002-01-23 Mitsubishi Heavy Ind Ltd 渦流探傷信号の評価方法及びその装置
JP2002288308A (ja) * 2001-12-27 2002-10-04 Tokyo Gas Co Ltd 設備劣化診断方法及び設備劣化診断システム
GB2414809A (en) * 2003-01-23 2005-12-07 Jentek Sensors Inc Damage tolerance using adaptive model-based methods
US7231320B2 (en) 2004-11-22 2007-06-12 Papadimitriou Wanda G Extraction of imperfection features through spectral analysis
JP4917899B2 (ja) * 2006-03-03 2012-04-18 株式会社日立製作所 渦電流探傷センサ及び渦電流探傷方法
US7817845B2 (en) * 2006-12-29 2010-10-19 General Electric Company Multi-frequency image processing for inspecting parts having complex geometric shapes
DE102007004223A1 (de) 2007-01-27 2008-07-31 Bönisch, Andreas Verfahren und Vorrichtung zur zerstörungsfreien Prüfung von Rohren, Stangen o. dgl. Fertigteilen zur Ausrüstung von Ölfeldern
US8166821B2 (en) * 2008-07-14 2012-05-01 Eaton Corporation Non-destructive test evaluation of welded claddings on rods of hydraulic cylinders used for saltwater, brackish and freshwater applications

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040113625A1 (en) 2002-08-29 2004-06-17 Pagano Dominick A. Method and system for analysis of ultrasonic reflections in real time
US20100307249A1 (en) 2007-12-21 2010-12-09 V & M France Non-destructive testing, in particular for pipes during manufacture or in the finished state

Also Published As

Publication number Publication date
JP2012515896A (ja) 2012-07-12
US20100185576A1 (en) 2010-07-22
WO2010083531A1 (en) 2010-07-22
KR20110122678A (ko) 2011-11-10
JP5694193B2 (ja) 2015-04-01
US8386404B2 (en) 2013-02-26

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