KR101236509B1 - Liquid crystal display and method for repairing the same - Google Patents

Abstract

The present invention is to efficiently repair point defects, line defects and short-circuit defects, and includes a transparent insulating substrate and gate lines and data lines intersecting in a horizontal and vertical direction on the transparent insulating substrate to define a plurality of pixels. A gate electrode extending from the gate line, a semiconductor layer on the gate electrode, a source electrode branched from the data line, and facing the source electrode with the semiconductor layer interposed therebetween. A liquid crystal display including a thin film transistor having a drain electrode, a pixel electrode formed to be connected to the drain electrode, and a repair pattern configured to overlap a portion of the data line with the pixel electrode, and a repair method thereof.

Liquid crystal display, repair process, point defects, line defects, short circuit defects

Description

Liquid crystal display and its repair method {Liquid crystal display and method for repairing the same}

FIG. 1 is a diagram for describing an inspection process that is generally performed after completing an array substrate of a liquid crystal display.

2 is a plan view of an array substrate for a liquid crystal display device according to the prior art.

3 and 4 are some plan views for explaining a repair process according to the prior art.

5 is a plan view illustrating an array substrate in a liquid crystal display according to an exemplary embodiment of the present invention.

FIG. 6 is a partial plan view illustrating a specific configuration of the link repair pattern and the line repair pattern shown in FIG. 5.

7A is a plan view of a portion of an array substrate for explaining a repairing method of a liquid crystal display according to an exemplary embodiment.

FIG. 7B is a cross-sectional view illustrating the line II-VII of FIG. 7A.

8A is a plan view of a portion of an array substrate for explaining a repairing method of a liquid crystal display according to another exemplary embodiment.

FIG. 8B is a cross-sectional view illustrating the II-II ′ line of FIG. 8A.

9 is a partial plan view of an array substrate for explaining a repairing method of a liquid crystal display according to still another exemplary embodiment of the present invention.

10 is a partial plan view of an array substrate for explaining a repairing method of a liquid crystal display according to still another exemplary embodiment of the present invention.

DESCRIPTION OF THE REFERENCE NUMERALS (S)

100: transparent insulating substrates P1, P2, P3, P4,... Pixel

110: gate line 111: gate electrode

120: data line 121: source electrode

22: drain electrode 130: pixel electrode

210: line repair pattern 220: link repair pattern

The present invention relates to a liquid crystal display device and a repair method thereof, and more particularly, to a liquid crystal display device using a redundancy pattern and a repair method thereof.

The liquid crystal display device forms a liquid crystal layer having anisotropic dielectric constant between the color filter substrate, which is the upper and lower transparent insulating substrates, and the array substrate, and then adjusts the intensity of the electric field formed in the liquid crystal layer to change the molecular arrangement of the liquid crystal material. The display device expresses a desired image by adjusting the amount of light transmitted through the color filter substrate. As a liquid crystal display device, a thin film transistor liquid crystal display device (TFT LCD) using a thin film transistor (TFT) as a switching element is mainly used.

FIG. 1 is a diagram for describing an inspection process that is generally performed after completing an array substrate of a liquid crystal display.

After the array substrate is completed through the TFT array process (S10), the array test process (S11) is performed before manufacturing the liquid crystal panel by performing the liquid crystal cell process in which the array substrate and the color filter substrate are bonded and the liquid crystal layer is formed. Through the inspection of the defective array substrate is completed.

In the array test process S11, a constant test signal is applied to the gate pad and the data pad on the completed array substrate to check the on / off state of the thin film transistors formed on the array substrate. When the thin film transistors are in the on state, the test signal is applied through the data lines on the data pad to check the pixel lighting state.

If a defective product is found through such an array test process (S11), the defective product inspection operation (S12) is performed to determine the form of the defect, whether repair is possible, etc. using the naked eye or an optical apparatus.

As a result of the defective product inspection, when the degree of defect is severe and the number of the defective pixels is greater than the reference value, the repair process is not performed. When the number of the defective pixels is in the reference value region, the repair process S13 is performed for each defective pixel. .

In the case of a defective pixel, the pixel is always turned on and appears as a bright point on the liquid crystal panel, or it is always dark and appears as a dark spot on the liquid crystal panel. The repair process (S13) is performed to darken the data voltage as the driving signal so that the driving voltage is not applied to the pixel electrode.

FIG. 2 is a plan view of an array substrate for a liquid crystal display according to the related art, and illustrates an array substrate used in a twisted nematic (TN) structure, respectively.

A conventional array substrate is composed of a plurality of pixels whose regions are defined by gate lines 10 and data lines 20 that are orthogonal to each other, as shown in FIG. 2, and extending from the gate lines 10. (11), a source layer 21 and a drain electrode 22 facing each other with a semiconductor layer (not shown) on the gate electrode 11 and a semiconductor layer (not shown) therebetween are formed to form a thin film transistor.

A gate voltage is applied to the gate electrode 11 of the thin film transistor, a data voltage is applied to the source and drain electrodes 21 and 22, and a channel is formed on the semiconductor layer (not shown). The voltage on / off is controlled by the voltage difference.

In the case of the TN structure, as illustrated in FIG. 1, the pixel electrode 30 is formed to be connected to the drain electrode 22 to display an image by generating an electric field perpendicular to a common electrode (not shown) on the color filter substrate.

Although not shown, a color filter layer and a common electrode are sequentially formed on the color filter substrate facing the array substrate.

The color filter layer is composed of a color filter for transmitting only light of a specific wavelength band and a black matrix positioned at a boundary of the color filter to block light on an area where the arrangement of liquid crystals is not controlled.

In addition, upper and lower polarizing plates for transmitting only light parallel to the polarization axis are disposed on each outer surface of the color filter substrate and the array substrate, and a back light, which is a separate light source, is disposed below the lower polarizing plate.

3 and 4 are partial plan views illustrating a repair process according to the related art, and show a repair process S13 using the array substrate of FIG. 2.

In the repair process (S13), in the case of a dot defect in which there is a defective pixel that is always on (brightness defect), the pixel electrode 30 and the gate line 10 are subjected to laser welding as shown in FIG. 3. ), Or darkening by contacting, or when a data line defect occurs, a repair is performed by performing W-CVD welding to repattern a portion of the data line 20 using a laser as shown in FIG. 4.

However, when the repair process (S13) is performed in the same manner as in FIG. 3, the repaired pixel always exists only as a dark spot, and the pixel of the dark spot that is darkened is not as easy to recognize as compared to the bright spot. There was a problem of being recognized.

In order to repair the pixel electrode 30, the drain electrode 22 portion of the thin film transistor connected to the pixel electrode 30 needs to be cut. In this case, the adjacent source electrode 21, the drain electrode 22, and the gate electrode 11 are cut. There was a problem that a short between () easily occurs.

In addition, in the repair process S13 of FIG. 4, since a process of additionally forming a pattern is to be performed, the repair process may be performed only in an array substrate state, and the repair process may be performed in a liquid crystal panel state by proceeding to a liquid crystal cell process. The disadvantage was that it was impossible.

Accordingly, an object of the present invention is to provide a liquid crystal display device in which a defect point in which a dot defect has occurred is visually defectless by cooperatively driving the adjacent defective pixel with an adjacent normal pixel, so that a defect point is not easily recognized in a general image. .

Another technical problem to be solved by the present invention is to provide a liquid crystal display device which can be easily repaired in the event of not only a dot defect but also a data open defect and a GD short defect between the gate and the data line. will be.

Another object of the present invention is to provide a liquid crystal display device which can easily perform a repair process not only in an array substrate state before bonding to a liquid crystal panel but also in a liquid crystal panel state after bonding.

Another object of the present invention is to provide a method for repairing a liquid crystal display device capable of efficiently repairing such a liquid crystal display device.

Technical problems to be achieved by the present invention are not limited to the above-mentioned technical problems, and other technical problems not mentioned above will be clearly understood by those skilled in the art from the following description. Could be.

According to an exemplary embodiment of the present invention, a liquid crystal display device includes a transparent insulating substrate and gate lines and data defining a plurality of pixels by crossing the horizontal and vertical directions on the transparent insulating substrate. A gate electrode extending from the gate line, a semiconductor layer on the gate electrode, a source electrode branched from the data line, and the semiconductor layer disposed at an intersection of each of the lines, the gate lines, and the data lines. And a thin film transistor having a drain electrode facing the source electrode, a pixel electrode formed to be connected to the drain electrode, and a repair pattern configured to overlap a portion of the data line or the pixel electrode. It features.

The repair pattern may be formed between two adjacent pixels with the gate line interposed therebetween, and the link repair pattern may be configured such that portions of both ends thereof overlap the pixel electrodes of the two adjacent pixels, respectively.

The link repair pattern may be formed of the same kind of metal material on the same layer as the data line, the source and the drain electrode.

The repair pattern may be formed on each of the plurality of pixels, one side of which is overlapped with the pixel electrode, the other side of the repair pattern is spaced apart from the data line, and a pair of protrusions extending in the upper and lower directions thereof are formed. Thus, the pair of protrusions may be configured as a line repair pattern configured to overlap the data line.

The line repair pattern is preferably made of the same kind of metal material on the same layer as the gate line and the gate electrode.

The repair pattern is formed of two types, the link repair pattern and the line repair pattern, and a region where the link repair pattern, the line repair pattern, and the pixel electrode overlap at one end of the link repair pattern is formed. Can be configured.

A repair method of a liquid crystal display according to an exemplary embodiment of the present invention includes first and second pixels which are divided into gates and data lines that cross each other and are switched by thin film transistors, and are connected to the thin film transistors on a pixel-by-pixel basis. Manufacturing an array substrate having an electrode formed thereon and having a link repair pattern formed between the adjacent first and second pixels, and applying a test signal to the first and second pixels to detect a point defect of the first pixel Cutting the thin film transistors of the first pixel, cutting both thin film transistors of the first pixel, and connecting both ends of the link repair pattern having a part of both ends overlapped with the pixel electrodes of the first and second pixels. Electrically contacting the pixel electrode of a second pixel, wherein the link repair pattern is adjacent to the first and second adjacent pixels; As formed between the small characterized in that the part of the both ends adapted to be respectively overlapped with the pixel electrode of the first and second.

A repair method of a liquid crystal display according to another exemplary embodiment of the present invention includes first and second pixels, which are divided into gates and data lines that cross each other and are switched by thin film transistors, and are connected to the thin film transistors on a pixel-by-pixel basis. Forming an array substrate having an electrode and a line repair pattern and having a link repair pattern formed between the adjacent first and second pixels, and applying a test signal to the first and second pixels to Detecting a line defect, and electrically contacting the data line to pass through the link repair pattern between the first and second pixels and the line repair pattern formed on the first and second pixels, respectively. The link repair pattern may include portions of both ends of the link repair pattern on the pixel electrodes of the first and second pixels. The line repair patterns overlap each other, and one side of the line repair pattern overlaps the pixel electrodes of the first and second pixels, and the other side of the line repair pattern is spaced apart from the data line. It is configured to overlap, characterized in that the region in which the link, the line repair pattern, and the pixel electrode all overlap.

A repair method of a liquid crystal display according to another exemplary embodiment of the present invention includes first and second pixels which are divided into gates and data lines that cross each other and are switched by thin film transistors, and are connected to the thin film transistors on a pixel basis. Manufacturing a pixel electrode and an array substrate on which a line repair pattern is formed, detecting a line defect of the first pixel by applying a test signal to the first and second pixels, and Electrically contacting the pair of protrusions formed on the upper and lower portions of the line repair pattern with the pixel electrode of the first pixel, wherein the line repair pattern has one side overlapping with the pixel electrode of the first pixel. The other side is spaced apart from the data line, and the data line is formed through the pair of protrusions formed on upper and lower portions thereof. Characterized in that it is configured to overlap with.

A repair method of a liquid crystal display according to another exemplary embodiment of the present invention includes first to fourth pixels which are divided into gates and data lines that cross each other and are switched by thin film transistors, and connected to the thin film transistors on a pixel basis. Manufacturing an array substrate having a pixel electrode, a line repair pattern formed thereon, and a link repair pattern formed between the first and third pixels adjacent to each other with the gate line interposed therebetween, and the second and fourth pixels; Applying a test signal to the first to fourth pixels to detect short-circuit defects in the gate and data lines, disconnecting both sides of the thin film transistor connected to the data lines, and first and third pixels The link repair pattern therebetween and the line repair pattern formed in the first and third pixels, respectively. And electrically contacting the data line to pass through the data line, wherein the link repair pattern overlaps the first and third pixels, the second and fourth pixels, respectively, wherein portions of both ends thereof are adjacent to each other. The repair pattern is configured such that one side overlaps the pixel electrodes of the first and third pixels, the other side is spaced apart from the data line, and overlaps the data line through a pair of protrusions formed on upper and lower portions thereof. And an area in which both the line repair pattern and the pixel electrode overlap.

Here, the step of electrically contacting both ends of the link repair pattern formed between the second and fourth pixels adjacent to each other, and the pixel electrode of the second and fourth pixels overlapping both ends of the link repair pattern It may further include.

Specific details of other embodiments are included in the detailed description and the drawings. Advantages and features of the present invention and methods for achieving them will be apparent with reference to the embodiments described below in detail with the accompanying drawings. Like reference numerals refer to like elements throughout.

Hereinafter, a liquid crystal display and a repair method thereof according to an exemplary embodiment of the present invention will be described in detail with reference to the accompanying drawings.

5 is a plan view illustrating an array substrate in a liquid crystal display according to an exemplary embodiment of the present invention, and illustrates some pixels of the array substrate.

The liquid crystal display according to the exemplary embodiment of the present invention includes a plurality of pixels, such as P1 and P2 illustrated in FIG. 5, in which the horizontal gate lines 110 intersect each other and the data lines 120 in the vertical direction. ), The area of each pixel is divided.

The thin film transistor is formed at the intersection of the gate line 110 and the data line 120. The thin film transistor may include a gate electrode 111 extending from the gate line 110, a semiconductor layer (not shown) on the gate electrode 111, a source electrode 121 branched from the data line 120 toward the drain electrode 122, It is configured to include a drain electrode 122 disposed to face each other with the source electrode 121 with a semiconductor layer (not shown) therebetween.

As illustrated in FIG. 5, the drain electrode 122 of the thin film transistor is formed in an I shape and connected to the pixel electrode 130, and the source electrode 121 has a U shape surrounding the drain electrode 122. And is connected to the data line 120. That is, the U-shaped source electrode 121 having a concave groove is formed, and the drain electrode 122 is formed to be positioned at regular intervals from the source electrode 121 in the groove of the source electrode 121. will be.

The drain electrode 122 and the source electrode 121 overlap the gate electrode 111 extending from the gate line 110 by a predetermined area, and the pixel electrode 130 configured to be connected to the drain electrode 122 has a pixel unit. Is formed.

Each pixel is provided with a repair pattern in which a partial region overlaps the data line 120 or the pixel electrode 130, and two types of repair patterns are a link repair pattern 220 and a line repair pattern 210.

In FIG. 5, the link repair pattern 220 is formed between the adjacent upper pixel P1 with the gate line 110 interposed therebetween, and the link repair pattern ( Both ends of the 220 may be partially overlapped between the upper and lower pixels, and the pixel electrodes 130 of P1 and P2, respectively. The link repair pattern 220 is formed of the same kind of S / D metal on the same layer as the data line 120, the source and drain electrodes 121 and 122, thereby providing a separate mask. Easy to configure without the need for additional processes.

As shown in FIG. 5, the line repair pattern 210 overlaps the pixel electrode 130 on one side and is spaced apart from the data line on the other side. The line repair pattern 210 may be formed on one side or both sides of the pixel electrode 130. The pair of line repair patterns 210 may extend in the upper and lower portions in the data line 120 direction as shown in the line repair pattern 210 on the right side of FIG. 5. The protrusion may be formed to have an area overlapping the data line through the protrusion.

In addition, when forming the gate line 110 and the gate electrode 111, by forming the line repair pattern 210 together with the gate metal (gate metal) of the same kind of metal material on the same layer, The line repair pattern 210 may be implemented without the addition of a mask process.

Each pixel such as P1 or P2 includes a storage capacitor Cst for maintaining a driving voltage charged in the liquid crystal cell, that is, a difference voltage between the data voltage applied to the pixel electrode 130 and the common voltage until the next voltage is charged. ) Is configured. The storage capacitor Cst may be implemented through a structure of the gate line 110 and the pixel electrode 130 overlapping each other with one or more insulating layers therebetween.

This array substrate is manufactured and used as a liquid crystal panel including a color filter substrate and a liquid crystal layer formed between the two substrates. The pixel electrode 130 on the array substrate is driven to form an electric field in the vertical direction together with a common electrode (not shown) on the color filter substrate to control the alignment of the liquid crystal layer on a pixel-by-pixel basis. A color filter or the like is provided to transmit light for each wavelength according to the alignment of the liquid crystal material to display an image.

FIG. 6 is a partial plan view illustrating a specific configuration of the link repair pattern and the line repair pattern shown in FIG. 5.

A line repair pattern 210 using a gate metal as a redundancy pattern is formed under the side of the data line 120, and a part of the line repair pattern 210 is formed in the R1 region as in the R1 region. Try to have an overlapping structure. In addition, by forming a S / D metal of the same type as the source and drain electrodes 121 and 122 as a redundancy pattern in the R2 region, which is an upper region crossing the gate line 110, the adjacent region is formed. The link repair pattern 220 connecting the two pixels, the pixel electrode 130 of P1 and P2, is formed.

Referring to P2, both ends of the link repair pattern 220 overlapping the pixel electrodes 130 of P1 and P2 are connected to the link repair patterns 220 formed on the P1 and P2, respectively. One side of the region 220 includes an area where the link repair pattern 220 connecting the pixel electrodes 130 of P1 and P2 and the line repair pattern 210 and the pixel electrode 130 of P1 overlap each other, such as an R3 region. It is configured to exist.

In addition, in each pixel, the link repair pattern 220 and the line repair pattern 210 overlap only the line repair pattern 210 and the data line 120 except for the link repair pattern 220, as in the R4 region. Except for the portion and the line repair pattern 210, the portion overlapping only the link repair pattern 220 and the pixel electrode 130 may be present.

FIG. 7A is a plan view of an array substrate for explaining a repair process when a point defect occurs, in a repairing method of a liquid crystal display according to an exemplary embodiment of the present invention, and FIG. 7B illustrates a line of FIG. 7A. It is a cross section.

When the number of defective pixels in which a dot defect occurs on the array substrate is within a reference value range, a repair process for visually defecting the defective pixels is performed using the structure of the link repair pattern 220.

For example, in the structure of FIG. 5, assuming that P1 is a bad pixel and P2 adjacent to P1 is a normal pixel, P1 and P2 through laser welding of (S21) and (S22). The defective pixel P1 is repaired by shorting the overlapping regions of the pixel electrodes 130 and the overlapped link repair pattern 220.

Then, as illustrated in FIG. 7B, the pixel electrodes 130 of P1 and P2 that are separated from each other are connected to each other through the link repair pattern 220, and the data voltage applied to the normal pixel P2 is also driven together. As a result, P1 and P2 display the same gray level, thereby enabling visual imperfections.

In the state before the repair process, the link repair pattern 220 in an isolation state is formed on the gate insulating film 101 deposited on the transparent insulating substrate 100, and the protective film 102 is interposed therebetween. Since the pixel electrodes 140 of P1 and P2 are formed respectively, respective data voltages are applied to the pixel electrodes 130 of P1 and P2.

In the state after the repair process, as shown in FIG. 7B, the pixel electrodes 130 of P1 and P2 are electrically contacted with each other through the points S21 and S22 where laser welding is performed, so that the pixel electrodes 130 of P2 are in contact with each other. The applied data voltage is transferred to the pixel electrode 130 of P1.

As such, when two pixels adjacent to each other, P1, which is one of P1 and P2, are deteriorated due to disconnection and pattern defect, the (S21) and (S22) portions, that is, the pixel electrode 130 and the link When the repair pattern 220 overlaps with the laser beam, the two pixels are electrically linked. Accordingly, the defective pixel P1 is normally driven by receiving a data voltage from the normal pixel P2.

If a channel defect occurs on the semiconductor layer (not shown) of the thin film transistor provided in P1, the drain electrode 122 of the thin film transistor provided in P1 is replaced by the laser cutting in S20. It disconnects from 130 and welds and repairs the part of (S21) and (S22).

The repair process at the time of occurrence of a point defect shown in FIGS. 7A and 7B will be described in more detail as follows.

First, a plurality of pixels P1, P2,..., Which are divided by regions of the gate line 110 and the data line 120, include a thin film transistor that operates as a switching element, and between two adjacent pixels. An array substrate on which the link repair pattern 220 is formed is manufactured. A test signal is applied to each pixel of the array substrate to recognize a point defect of P1 which is a bad pixel.

Next, in step S20, the drain electrode of the thin film transistor provided in P1, which is a bad pixel, is disconnected through laser cutting.

Next, in steps S21 and S22, the link repair pattern 220 formed between the defective pixel P1 and the normal pixel P2 adjacent thereto through laser welding is performed on the pixel electrodes 130 of the P1 and P2. Electrical contact with each other).

FIG. 8A is a plan view of an array substrate for explaining a repair process when a line defect occurs, in a repairing method of a liquid crystal display according to another exemplary embodiment. FIG. 8B is a line II-II ′ of FIG. 8A. It is a cross section.

When a line open defect occurs between II-II 'lines, the parts (S30), (S31), (S32), (S33) and (S34) are electrically contacted by laser welding, and By repairing the data voltage along the same path as the -II 'line, a line fault can be repaired.

8B illustrates that the data line 120 is linked through the link repair pattern 220 in cross section.

The repair process at the time of generating a line defect shown in FIGS. 8A and 8B will be described in more detail as follows.

First, a plurality of pixels P1, P2,..., Which are divided by regions of the gate line 110 and the data line 120, include a thin film transistor that operates as a switching element, and repairs each line. A pattern 210 is formed, and an array substrate on which a link repair pattern 220 is formed between two adjacent pixels is manufactured. A test signal is applied to each pixel of the array substrate to recognize a line defect of P1 which is a bad pixel. Here, the line defect of P1 corresponds to the case where it is detected in the stepped region where the gate line 110 is formed.

Next, the link repair pattern 220 between P1 and P2 and P1 and P2 are performed through steps S30 through S33 of performing laser welding for each point corresponding to R1, R3, R4, and R1 of FIG. 6. The data lines 120 are electrically contacted to pass through the line repair patterns 210 respectively formed.

FIG. 9 is a plan view of an array substrate for explaining another repair process when a line defect occurs in a repairing method of a liquid crystal display according to another exemplary embodiment. The data line 120 having no step like D1 is shown. The case where the line defects are repaired by laser welding the portions (S40) and (S41) when a line open (data open defect) occurs in the upper region is shown.

The repair process at the time of generating a line defect shown in FIG. 9 will be described in more detail as follows.

First, a plurality of pixels P1, P2,..., Which are divided by regions of the gate line 110 and the data line 120, include a thin film transistor that operates as a switching element, and repairs each line. An array substrate on which the pattern 210 is formed is manufactured. A test signal is applied to each pixel of the array substrate to recognize a line defect of P1 which is a bad pixel. Here, the line defect of P1 corresponds to the case where it detects in the non-step part area | region where a step is not formed like D1.

Next, the pair of protrusions formed on the upper and lower portions of the line repair pattern 210 and a part of the data line 120 overlapping the electrical contact are electrically contacted by laser welding in the steps S40 and S41. Repair line defects.

FIG. 10 is a plan view of an array substrate for explaining a repair process when a short circuit defect occurs between a gate and a data line in a repair method of a liquid crystal display according to still another exemplary embodiment of the present invention.

If a GD short defect occurs at the same position as D2, the signals of the data line 120 and the gate line 110 are mixed so that both the gate line 110 and the data line 120 are defective. Therefore, all the pixels connected thereto such as P1, P2, P3, and P4 become bad pixels. Conventionally, in such a case, there is no repairable method and the array substrate is treated as defective.

In the present invention, the (S34) and (S35) portions are disconnected using a laser, and the (S30), (S31), (S32), and (S33) portions are laser welded to form a gate line 110 due to a short circuit defect. And the defect of the data line 120 can be completely repaired. At this time, since the signal is not applied to the P2 pixel, the bright point is poor, so that the portions S21 and S22 are laser-welded to interlock adjacent P2 and P4.

According to the repair process of the present invention, repair is possible in both the array substrate state and the liquid crystal panel state, and repair is possible only by laser welding without additional patterning even when a line defect occurs on the data line 120.

In addition, the repair can be performed even when the data line 120 causes a line defect in the stepped region where the gate line 110 is formed, as well as the repair of the non-stepped region for each pixel (see FIG. 9). 8A and 8B), when a point defect causing a bright point defect occurs, two adjacent pixels may be interlocked to be normalized (visually flawless) (see FIGS. 7A and 7B), and the gate and data lines 110 which have been impossible in the past may be impossible. 120 may be repaired even when a short circuit defect occurs (see FIG. 10).

While the present invention has been described in connection with what is presently considered to be practical exemplary embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but, on the contrary, You will understand.

Therefore, it should be understood that the above-described embodiments are provided so that those skilled in the art can fully understand the scope of the present invention. Therefore, it should be understood that the embodiments are to be considered in all respects as illustrative and not restrictive, The invention is only defined by the scope of the claims.

The liquid crystal display according to the preferred embodiment of the present invention, which is configured as described above, visually defects by driving a defective pixel having a dot defect with an adjacent normal pixel, so that a defect point is not easily recognized in a general image. can do.

In addition to repairing point defects as well as data open defects and GD short defects between gate and data lines, the repair process can be easily performed.

In addition, the repair process may be easily performed not only in the array substrate state before bonding to the liquid crystal panel but also in the liquid crystal panel state after the bonding.

In addition, the repair method of the liquid crystal display according to the preferred embodiment of the present invention can be efficiently applied to such a liquid crystal display.

Claims (13)

Transparent insulating substrates; Gate lines and data lines intersecting in the horizontal and vertical directions on the transparent insulating substrate to define a plurality of pixels; A gate electrode extending from the gate line, a semiconductor layer on the gate electrode, a source electrode branched from the data line, and the semiconductor layer interposed between the gate lines and the data lines; A thin film transistor having a drain electrode facing the source electrode; A pixel electrode formed to be connected to the drain electrode; And A partial pattern includes a repair pattern configured to overlap the data line or the pixel electrode, The repair pattern is, A link repair pattern formed between two adjacent pixels with the gate line interposed therebetween, the link repair pattern having a part of both ends overlapping the pixel electrodes of the two adjacent pixels; A pair of protrusions formed on each of the plurality of pixels, one side of which overlaps the pixel electrode, and the other side of the plurality of pixels that are spaced apart from the data line, and a pair of protrusions extending in the upper and lower portions in the data line direction are formed. Includes a line repair pattern configured to overlap the data line, And an area where the link repair pattern, the line repair pattern, and the pixel electrode overlap at one end of the link repair pattern. delete The method of claim 1, The link repair pattern, And a metal material of the same kind on the same layer as the data line, the source and the drain electrode. delete The method of claim 1, The line repair pattern, And a metal material of the same kind on the same layer as the gate line and the gate electrode. delete delete A pixel electrode divided into a gate and a data line crossing each other and switched by a thin film transistor, the pixel electrode being connected to the thin film transistor on a pixel basis, and one side of the pixel electrode of the first and second pixels A line repair pattern configured to overlap each other with the data line overlapping each other with the data line and overlapping with the data line through a pair of protrusions formed at an upper and lower sides thereof, and between the first and second pixels adjacent to each other. Manufacturing an array substrate having a link repair pattern in which a part of the stage overlaps with pixel electrodes of the first and second pixels, respectively, and forming an area in which the link and line repair patterns overlap the pixel electrodes; Detecting a line defect of the first pixel by applying a test signal to the first and second pixels; And And electrically contacting the data line to pass through the link repair pattern between the first and second pixels and the line repair pattern formed on the first and second pixels, respectively. How to repair the display device. delete A pixel electrode connected to the thin film transistor on a pixel-by-pixel basis, the first to fourth pixels being divided by a gate and a data line crossing each other, and connected to the thin film transistor on a pixel basis, and a line repair pattern is formed between the gate line Manufacturing an array substrate on which a link repair pattern is formed between the first and third pixels and the second and fourth pixels adjacent to each other; Detecting a shorting defect of the gate and the data line by applying a test signal to the first to fourth pixels; Disconnecting both sides of the thin film transistor connected to the data line; And Electrically contacting the data line to pass through the link repair pattern between the first and third pixels and the line repair pattern formed on the first and third pixels, respectively. The link repair pattern overlaps the first and third pixels, and the second and fourth pixels, each of which is partially adjacent to each other, and the line repair pattern has one side of the pixel electrode of the first and third pixels. Is overlapped with the data line, the other side is spaced apart from the data line, and is configured to overlap the data line through a pair of protrusions formed at upper and lower portions thereof, and an area in which the link, line repair pattern, and the pixel electrode overlap each other is formed. The repair method of the liquid crystal display device characterized by the above-mentioned. The method of claim 10, Electrically contacting both ends of the link repair pattern formed between the second and fourth pixels adjacent to each other, and the pixel electrodes of the second and fourth pixels overlapping both ends of the link repair pattern. The repair method of the liquid crystal display device characterized by the above-mentioned. The method of claim 8 or 10, The link repair pattern, And a metal material of the same kind on the same layer as the data line. The method of claim 8 or 10, The line repair pattern, And a metal material of the same kind on the same layer as the gate line.

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