KR101232495B1 - Measuring machine for bending quantity of flat panel - Google Patents

Abstract

The present invention relates to a flat panel warpage measuring device.

The flat panel warpage amount measuring device according to the present invention includes a fixing part for fixing the flat panel, and a measuring part for measuring the surface of the flat panel in up, down, left, right, and back directions, and using non-contact means.

Description

Flat panel warpage measuring instrument {MEASURING MACHINE FOR BENDING QUANTITY OF FLAT PANEL}             

1 is a view of a conventional flat panel warpage measuring device.

2 is a view of the flat panel warpage measuring device according to an embodiment of the present invention.

3A and 3B are views showing a combination of the first pillar portion and the first arm portion of FIG. 2.

4 is a view showing the support of FIG.

5A and 5B are views illustrating a combination of the second pedestal, the third pedestal, and the second pillar of FIG. 2.

6A and 6B are views illustrating a coupling between the measuring device of FIG. 2 and the second pillar part.

7 is a block diagram illustrating a receiver.

Description of the Related Art

10, 100: warpage amount measuring instrument 12: surface plate

16 liquid crystal panel 18 base

20: height gauge 22: column support                 

24: pillar portion 26: female portion

28: gauge 110: fixed part

120: first pedestal 130: first pillar portion

132: hall 134: hall

136: pin 140: first arm

142: hole 150: support

155: reference body 160: second pedestal

162: moving means 164: fixing means

165 measurement object 170: third support

172: line hole 180: second pillar portion

190: measuring instrument 192: converting unit

194 memory 196 arithmetic unit

198: display unit 199: receiving unit

The present invention relates to a flat panel warpage measuring device, and more particularly, to a flat panel warpage measuring device capable of measuring the amount of warpage of the panel without direct contact with the panel.

In general, a display apparatus using a flat panel includes a liquid crystal display (hereinafter referred to as "LCD"), a plasma display panel, an electroluminescence, and the like. In particular, the LCD has a trend of widening its application range due to features such as lightweight, thin, low power consumption. According to this tendency, LCD is used for office automation equipment, audio / video equipment and the like. A liquid crystal panel of such a liquid crystal display device includes a thin film transistor substrate having a thin film transistor and a pixel electrode in a pixel region defined by gate wiring and data wiring, a color filter substrate having a color filter layer and a common electrode, and between the two substrates. It consists of the liquid crystal layer interposed in the.

The size of the liquid crystal panel can be manufactured in a small size of 8 inches to 50 inches or more. In addition, the thickness of the liquid crystal panel may vary depending on the size of the liquid crystal panel, but is typically formed into a thin film of several mm in advance to several cm. Such a liquid crystal panel may be molded into a thin film as compared with the size thereof so that the surface planarity of the liquid crystal panel may not be uniform. That is, bending may be formed on part of the entire surface of the liquid crystal panel, or distortion of the panel may occur. Accordingly, after the manufacturing process of the liquid crystal panel is completed, the defect of the liquid crystal panel is checked by measuring the amount of warpage of the liquid crystal panel prior to the assembling process of assembling the liquid crystal panel and the backlight unit and case for irradiating light to the liquid crystal panel. This process is necessary to reduce the production cost by checking and correcting the defect of the liquid crystal panel before the product is completed.

1 is a view showing a measuring device for measuring the amount of warpage of the conventional liquid crystal panel.

Referring to FIG. 1, a conventional liquid crystal panel warpage measuring device 10 includes a surface plate 12, a height gauge 20 placed on one side of an upper surface of the surface plate 12, and a height gauge 20. It is disposed at a distance apart and provided with a pedestal 18 for supporting the liquid crystal panel 16.

The height gauge 20, the pedestal 18, and the liquid crystal panel 16 as a measurement target are placed on the upper surface of the surface plate 12. The upper and lower surfaces of the surface plate 12 have a uniform uniformity in order to reduce errors in the measurement.

The height gauge 20 is a substantial device for measuring the amount of warpage of the liquid crystal panel, and is provided from the upper surface of the pillar portion 24, the pillar portion 24 extending vertically from the upper surface of the pillar support portion 22, and the pillar portion 24. The arm part 26 extending parallel to the surface plate 12 and the liquid crystal panel 16 and the pedestal 18 which are the measurement targets from one end of the arm part 26 are arranged in contact with the surface of the liquid crystal panel. The gauge 28 which measures the curvature amount of the surface of the is provided.

The pedestal 18 serves to support the liquid crystal panel 16 as a measurement object. One surface of the pedestal 18 is in contact with the liquid crystal panel 16, and the other surface is in contact with one side of the upper surface of the surface plate 12. Therefore, the surface where the pedestal 18 and the liquid crystal panel 16 are in contact with each other and the surface which is in contact with the upper surface of the surface plate 12 are each molded to have a uniform uniformity.

The driving method of the conventional liquid crystal panel warpage amount measuring device 10 having such a structure will be described.

First, the height gauge 20 and the pedestal 18 are disposed on the surface plate at regular intervals. Thereafter, the liquid crystal panel 16 is vertically placed to face one surface of the pedestal 18 and the upper surface of the surface plate 12. Specifically, the front and rear surfaces of the liquid crystal panel 16 are placed in close contact with one surface of the pedestal 18, and one side of the edge of the liquid crystal panel 16 is parallel to the pedestal 18 on the upper surface of the surface plate 12. To be placed. Next, the gauge 28 formed in the height gauge 20 comes into contact with the surface of the liquid crystal panel 16 to measure the amount of warpage. The height gauge 20 can be moved left and right, thereby measuring the linear deflection of the liquid crystal panel 16.

The conventional method for measuring the amount of warpage using the amount of warpage of the liquid crystal panel has a limit point that can be used only for the maximum amount of warpage and the linear point of measurement. In addition, it is difficult to set the contact portion of the gauge 28 to be exactly perpendicular to the surface of the liquid crystal panel 16 by the force that the gauge 28 contacts the liquid crystal panel 16. In addition, due to such a problem, it is difficult for an operator to grasp the entire warpage distribution of the liquid crystal panel 16. In addition, after the deflection amount measurement of the liquid crystal panel 16 is completed, the distance between the height gauge 20 and the pedestal 18 is newly adjusted in order to measure the deflection amount of the next liquid crystal panel 16. In addition to aligning 16), the deflection meter should be newly aligned. This process is difficult to meet the same conditions as the operation in the previous step, even when the liquid crystal panel 16 is substantially no amount of warpage when measuring the amount of warpage of the plurality of liquid crystal panel 16 of each liquid crystal panel 16 The problem arises that the data is measured differently.

Accordingly, an object of the present invention is to provide a flat panel warpage measuring device for improving the productivity by reducing the defect of the flat panel by quantitatively and stably measuring the warp amount of the flat panel.

In order to achieve the above object, the liquid crystal panel warpage amount measuring device according to an embodiment of the present invention and the fixing portion for fixing the liquid crystal panel; It is possible to measure the surface of the liquid crystal panel in all directions, and a measurement unit for measuring by using a radio signal is provided.

The fixing part includes a first pedestal having a uniform upper surface; A first pillar portion vertically extended from one side of an upper surface of the first pedestal; A first arm portion coupled to an upper surface of the first pillar portion and coupled to the first pedestal side by side; A support portion is coupled to one side of the first arm portion and fixes the liquid crystal panel.

The length of the first pillar and the second arm is variable.

The support part is formed to adjust the interval of the support part according to the thickness of the liquid crystal panel.

A second pedestal having a uniform upper surface; A third pedestal fastened vertically to the side of the second pedestal and movably fastened in a horizontal direction; A second pillar unit coupled to the third pedestal so as to be movable in the front-rear direction; It is provided with a measuring device is fastened to the second pillar to be movable in the vertical direction.

The meter is formed from a sensor assay.                     

The liquid crystal panel warpage amount measuring instrument further includes a receiving unit which displays the data measured by the measuring instrument in comparison with each other.

The receiving unit converts the sensor signal supplied from the measuring device into data; A memory for storing data from the converter; An operation unit for comparing the data stored in the memory with each other; And a display unit which scans the result of the operation unit on the screen.

The fixing unit and the measuring unit further includes a moving and fixing unit so as to be movable and fixed.

The wireless signal is formed of at least one of ultrasonic wave, infrared ray, current, voltage, ultra high frequency, and electromagnetic wave.

Flat panel bending amount measuring device according to an embodiment of the present invention and the fixing portion for fixing the flat panel; It is possible to measure the surface of the flat panel in the up, down, left, right, front and rear direction and has a measurement unit for measuring by using a non-contact means.

Other objects and features of the present invention in addition to the above object will be apparent from the description of the embodiments with reference to the accompanying drawings.

2 is a view showing a flat panel warpage measuring device according to an embodiment of the present invention.

Referring to FIG. 2, the flat panel warpage measuring device 100 according to an exemplary embodiment of the present invention includes a fixing unit 110 for fixing a measurement object, a measurement unit 210 for measuring a fixed measurement object, and measured data. It includes a receiving unit 199 for processing.

The fixing part 110 includes a first pedestal 120, a first pillar portion 130 extending vertically from one side of an upper surface of the first pedestal 120, and a first pillar side from one side of the upper surface of the first pillar portion 130. A first arm 140 is fastened in a direction parallel to the pedestal 120 and a support 150 is coupled to one side of the first arm 140 to fix the measurement object.

The first pillar portion 130 and the first arm portion 140 are formed in contact with the first pillar portion 130 so that the first arm portion 140 can move back and forth. For example, as illustrated in FIG. 3A, a hole 134 having a thickness in which the first arm part 140 may be inserted is positioned at the center of the first pillar part 130 so as to move up and down of the first arm part 140. It is formed by the distance considering. The first pillar part 130 and the first arm part 140 have fastening holes 132 and 142 to fix the first arm part 140 inserted into the hole 134. In detail, the fixing clip 136 may be inserted into the fastening holes 132 and 142 formed in the first pillar 130 and the first arm 140, respectively. As another example, as shown in FIG. 3B, each of the first pillar 130 and the first arm 140 has a structure capable of adjusting its length.

As shown in FIG. 4, one side of the support part 150 is a measurement object 165 to fix the measurement object 165 regardless of the thickness of the measurement object 165 fixed between the support parts 150 as shown in FIG. 4. It is molded to be tightened. One side of the support part 150 may be formed of a soft material or a soft material may be attached at a portion where the support part 150 and the measurement object 165 are in contact with each other to prevent cracking and scratching of the measurement object 165. .

The measuring unit 210 has a lengthwise direction from a side surface of the second pedestal 160, the second pillar portion 180 fastened vertically in the width direction from the upper surface of the second pedestal 160, and the second pedestal 160. In addition to being fastened perpendicularly to the second pillar portion 160 and the third pedestal 170 is fastened to, and has a measuring device 190 fastened to one side of the second pillar portion 180.

As shown in FIG. 5, the second pedestal 160 and the third pedestal 170 are formed to move in the X direction and the Z direction. Specifically, the third pedestal 170 is fastened to be movable in the X direction along the fastening portion formed in the second pedestal 160 so that the second pillar 180 is movable in the X direction. In addition, the bottom portion of the second pillar portion 180 is fastened to be movable along the line hole 172 formed in the third pedestal 170 so that the second pillar portion 180 can move in the Z direction.

The measuring device 190 is fastened to the second pillar 180 so as to be movable in the Y-axis direction as shown in FIGS. 6A and 6B. This meter 190 consists of a sensor assay. In the transmitting portion of the sensor assay, sensor signals which are non-contact means, for example, infrared rays, currents, voltages and ultra-high frequencies, ultrasonic waves, and the like are used. Distance measurements using a sensor assay can be calculated by measuring the intensity of the current voltage and the fed back time of the wavelengths occurring in the sensor.

As shown in FIG. 7, the receiver 199 includes a converter 192 for converting a sensor signal supplied from the measuring device 210 into data, a memory 194 for storing data from the converter 192, and An operation unit 196 for comparing the data stored in the memory 194 with each other, and a display unit 198 for scanning the result of the operation unit 196 on the screen.

When the sensor signal is current and voltage, the converter 192 quantifies the current and voltage fed back to the sensor signal according to a predefined quantization criterion. In addition, when the sensor signal is an electronic file such as infrared and ultrasonic waves, the distance from the sensor to the target point may be calculated by calculating the round trip distance by calculating the time and the speed of the wavelength.

The calculating unit 196 fixes the data obtained by measuring the reference body 155 having a uniform surface uniformity as reference data, and then compares the data of the measured object 165 to be measured and calculates the result in a simple method such as adding and subtracting. Supply to the display unit 198.

The display 198 may display the display 196 in various ways according to the result of the calculator 196. For example, each calculation value may be displayed on a grid graph corresponding to a specific portion of the measurement object 165. In addition, by implementing the 3D method, the operator can roughly check the degree of warpage of the workpiece.

Here, the second and third pedestals 160 constituting the first pedestal 120, the first pillar 130, the first arm 140, and the measuring unit 150 constituting the fixing part 110. 170 and the second pillar 180 may be marked with a scale so that a reference point can be calculated during measurement. In addition, as shown in FIG. 2, the fixing unit 110 and the measuring unit 210 are provided with a moving means 162, for example, a rail or a wheel, etc., which can move fluidly according to the working environment, and the amount of warpage after the movement. Fixing means 162 for fixing for measurement. As an example of such fixing means, there is a method of forming a brake on the moving means.

A driving method of the flat panel warpage measuring device according to an embodiment of the present invention having such a structure will be described with reference to FIGS. 2 to 7.

First, the fixing unit 110 is fixed to the position required by the user. When the fixing part 110 is fixed in position, the reference body 155 having a uniform surface uniformity is fixed to the supporting part 150 to determine the reference point. Specifically, after the first pillar portion 130 and the first arm portion 140 are spaced apart from the first pedestal 120 at an appropriate height, the reference body 155 is inserted into the support portion 150. Thereafter, the first pillar part 130 and the first arm part 140 are moved so that the reference body 155 has a distance required by the user from the first pedestal 120. In this case, the scales displayed on the first pillar part 130 and the first arm part 140 are recorded and used as reference points in the process of replacing the reference body 155 with the measurement object 165.

Next, while moving the measuring unit 210 so that the first pedestal 120 of the fixing unit 110 and the second pedestal and the third pedestal (160, 170) of the measuring unit 210 are the same height and work In consideration of the environment, the distance between the measuring unit 210 and the fixing unit 110 is set. After the setting is completed, the distance between the reference body 155 and the measuring device 190 is measured with respect to the entire surface of the reference body 155 by using the measuring device 190 installed in the second pillar part 180. The measured data is displayed on the receiving unit 199 connected with the measuring device 190 so that the operator can check in real time. In addition, data can be displayed in 2D or 3D graphics. Here, the surface measurement of the reference body 155 may be measured by the operator in detail for the specific part according to the requirements and experimental / statistical data.

Subsequently, when the surface measurement of the reference body 155 is completed and the reference setting operation is completed, the measurement object 165 for measurement is replaced with the reference body 155 installed on the support part 150 of the fixing part 110. . At this time, since the fixing part 110 and the measuring part 210 are fixed at the same position, a plurality of measurements are performed only by replacing the measuring part 165 installed in the fixing part 110 in order to measure the bending amount of the measuring object 165. The amount of warpage of the water 165 can be measured.

In this manner, the data measuring the amount of warpage of the measurement object 165 is displayed on the receiver 199 connected to the measuring device 190. Thereafter, the amount of warpage may be quantitatively calculated by comparing the data of the reference body 155 with the data of the measurement object 165. Substantially, the amount of warpage of the measurement object 165 may be expressed quantitatively by converting all the measurement data of the reference body 155 into 100 and simply adding or subtracting the data of the measurement object 165. Alternatively, the shape of the warp of the measurement object 165 may be displayed by scanning the data of the reference body 155 on the screen to represent the graphic form, and then integrating the data of the measurement object 165 with the data graphic of the reference body 155. And bending can be easily determined. Since the amount of warpage calculated in this manner is expressed quantitatively, the degree of correction of the amount of warpage of the measurement object 165 can be calculated in advance, and thus, unnecessary work time can be saved as much work is required during calibration. .

The bending amount measuring device of the flat panel according to the embodiment of the present invention is installed so that the measuring device installed in the measuring unit is movable to measure the entire surface of the workpiece. Accordingly, the warpage amount measuring device of the flat panel according to the embodiment of the present invention can not only measure the overall warp amount of the measurement object, but also accurately measure how much warpage degree of a specific part as the measured data is displayed quantitatively. Can be. In addition, since the measuring device has a sensor assay structure, the amount of warpage of the panel is measured using non-contact electromagnetic waves and infrared rays. Thereby, no pressure or the like is applied to the surface of the panel, so that the amount of warpage of the panel can be measured more stably.                     

In addition, since both the fixed part and the measuring part are designed to be movable, the amount of deflection of the panel can be measured by moving the fixed part and the measuring part according to the working environment, so that it is not limited to a specific place and a specific time. You can work in place. In addition to these conveniences, the operation is simple, and the amount of warpage of the panel can be measured in real time, thereby increasing the working speed.

Claims (11)

A first arm portion having a uniform upper surface, a first pillar portion vertically extended from one side of an upper surface of the first pedestal, and a first arm portion coupled to an upper surface of the first pillar portion and parallel to the first pedestal. And a fixing part which is fastened to the first arm part and has a supporting part for fixing the reference body and the liquid crystal panel for measuring the uniformity of the uniformity of the surface for determining the reference point. A second pedestal having a uniform upper surface, a third pedestal fastened vertically to the side of the second pedestal, and movably fastened in a left and right direction, and fastened to the front and rear direction by being fastened to the third pedestal A measuring unit having a second pillar portion and a measuring instrument coupled to the second pillar portion so as to be movable in a vertical direction, and measuring the surface of the reference body and the surface of the liquid crystal panel in all directions; And A conversion unit which is provided in the measurement unit and converts the surface measurement value of the reference body measured by the measurement unit and the surface measurement value of the liquid crystal panel into surface data, a memory for storing surface data from the conversion unit, and And a data receiver configured to compare the surface data of the reference body and the liquid crystal panel stored in a memory with each other and a display unit configured to scan a result of the calculator on a screen to calculate the amount of surface warping of the liquid crystal panel. The measuring unit transmits the surface data of the reference body and the surface data of the liquid crystal panel to the data receiving unit using a wireless signal, The data receiver calculates the surface warping amount of the liquid crystal panel by converting all the surface data of the reference body into 100 and simply adding or subtracting the surface data of the liquid crystal panel. delete The method of claim 1, The first pillar portion and the first arm portion is a liquid crystal panel deflection amount measuring device, characterized in that the length of the variable operation. The method of claim 1, The support portion Liquid crystal panel deflection amount measuring device, characterized in that formed to be able to adjust the interval of the support portion according to the thickness of the liquid crystal panel. delete The method of claim 1, And the measuring device is a sensor assay. delete delete The method of claim 1, The fixing unit and the measuring unit further comprises a moving and fixing means for moving and fixing the liquid crystal panel deflection amount measuring device. The method of claim 1, The radio signal is Liquid crystal panel warpage measuring device, characterized in that at least one of ultrasonic waves, infrared rays, current, voltage, ultra-high frequency, electromagnetic waves. delete

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