KR101142340B1 - Substrate for semiconductor package and method for fabricating the same - Google Patents
Substrate for semiconductor package and method for fabricating the same Download PDFInfo
- Publication number
- KR101142340B1 KR101142340B1 KR1020100093221A KR20100093221A KR101142340B1 KR 101142340 B1 KR101142340 B1 KR 101142340B1 KR 1020100093221 A KR1020100093221 A KR 1020100093221A KR 20100093221 A KR20100093221 A KR 20100093221A KR 101142340 B1 KR101142340 B1 KR 101142340B1
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- South Korea
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- substrate
- substrate body
- semiconductor package
- electrically connected
- resistors
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Automation & Control Theory (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
Abstract
The present invention discloses a substrate for a semiconductor package and a method of manufacturing the same. According to an aspect of the present invention, there is provided a semiconductor package substrate including: a substrate body having one surface and the other surface facing the one surface, the substrate body being divided into a chip mounting portion and an outer portion; A plurality of first circuit patterns formed on the one surface of the substrate body; A plurality of second circuit patterns formed on the other surface of the substrate body and electrically connected to each of the first circuit patterns and including a ball land; A plurality of resistors embedded in the substrate body and electrically connected to the first circuit pattern and the second circuit pattern, respectively; And a probe pad formed on one surface of the substrate body and electrically connected to the plurality of resistors.
Description
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor package substrate and a method for manufacturing the same, and more particularly, to a semiconductor package substrate and a method for manufacturing the same, capable of measuring a resistance value of a resistor embedded in the substrate.
As the size of various electric and electronic products is miniaturized, many studies are being conducted to achieve a small size and high capacity by mounting a larger number of chips on a limited sized substrate.
Accordingly, the size and thickness of the semiconductor package mounted on the printed circuit board (PCB) is gradually reduced. For example, research and development on how to reduce the size of the PCB is being actively conducted, and methods are used that can make fine lines finer and reduce space for electrical connection on the PCB.
Among them, a technology for forming an embedded resistor is a useful technique for reducing the size of a PCB, and after forming a hole in which an electronic device is embedded in an insulator, the electronic device is positioned and fixed using a filler or the like.
According to such a process, since the electric element is not mounted on the surface of the substrate but is mounted inside the substrate, not only can the substrate be made smaller and higher in density, but also the performance of the substrate can be improved.
On the other hand, Figure 1 is a view showing for measuring the resistance value of the conventional built-in resistance.
As shown, in order to measure the resistance value of the
Subsequently, probe pins P1 and P2 connected to a resistance measuring device are connected to the
However, since the
Therefore, due to the lack of space for forming the probe pad, it is often impossible to measure the resistance value of the resistance of the desired portion, and often the characteristics of the device cannot be properly evaluated.
The present invention provides a substrate for a semiconductor package that can measure a resistance value of a resistance to be measured in the substrate.
Moreover, this invention provides the manufacturing method of the board | substrate for semiconductor packages which has the said board | substrate.
According to an embodiment of the present invention, a semiconductor package substrate includes: a substrate body having one surface and the other surface opposite to the one surface and divided into a chip mounting portion and an outer portion; A plurality of first circuit patterns formed on the one surface of the substrate body; A plurality of second circuit patterns formed on the other surface of the substrate body and electrically connected to each of the first circuit patterns and including a ball land; A plurality of resistors embedded in the substrate body and electrically connected to the first circuit pattern and the second circuit pattern, respectively; And a probe pad formed on one surface of the substrate body and electrically connected to the plurality of resistors.
And a plurality of bond fingers on one surface of the substrate body, wherein the plurality of bond fingers are each electrically connected to the corresponding plurality of first circuit patterns.
Further comprising a plurality of electroplating lines on one surface of the substrate body, the electroplating lines electrically connect the plurality of bond fingers and the probe pad.
The probe pad is formed on an outer portion of the substrate body.
The plurality of resistors are formed on the chip mounting portion of the substrate body.
According to another aspect of the present invention, there is provided a method of manufacturing a substrate for a semiconductor package, the substrate body having one surface and the other surface facing the one surface and divided into a chip mounting portion and an outer portion, and a plurality of agents formed on the surface of the substrate body. One circuit pattern, a plurality of second circuit patterns formed on the other surface of the substrate body and electrically connected to each of the first circuit patterns, each of the second circuit patterns including a borland, and embedded in the substrate body, respectively; And forming a substrate including a plurality of resistors electrically connected to a second circuit pattern and a probe pad formed on the surface of the substrate body, the probe pads electrically connected to the plurality of resistors. And connecting a first probe pin to the probe pad formed on the one surface of the substrate body, and connecting a second probe pin to a second circuit pattern connected to any one selected from among the plurality of resistors. Measuring a value.
The forming of the substrate further includes forming a plurality of bond fingers on one surface of the substrate body, wherein the plurality of bond fingers are electrically connected to the corresponding plurality of first circuit patterns, respectively. It is characterized by forming.
In the forming of the substrate, the method may further include forming a plurality of electroplating lines on one surface of the substrate body, wherein the electroplating lines are formed to electrically connect the plurality of bond fingers and the probe pad. Characterized in that.
In the forming of the substrate, the probe pad may be formed at an outer portion of the substrate body.
In the forming of the substrate, the plurality of resistors may be formed in a chip mounting part of the substrate body.
After the step of measuring the resistance value, the step of separating the electroplating lines formed on one surface of the substrate body; characterized in that it further comprises.
The present invention can measure a resistance value of a resistance to be measured embedded in the substrate using a substrate including a probe pad electrically connected to a plurality of embedded resistors.
In addition, the present invention can improve the problem caused by the lack of space for forming the probe pad because it is not necessary to form a separate probe pad around the resistance to be measured in order to measure the resistance value of the desired portion. .
As a result, the present invention can measure the resistance value of the resistance of the desired site, it is possible to properly evaluate the characteristics of the device.
1 is a diagram for measuring the resistance value of a conventional built-in resistance.
2A and 2B illustrate a semiconductor package substrate according to an embodiment of the present invention.
Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.
2A and 2B illustrate a semiconductor package substrate according to an embodiment of the present invention.
As shown, the
Hereinafter, the
First, the
A plurality of
Subsequently, a plurality of
A plurality of
The resistor R is embedded in the
Alternatively, the plurality of resistors R may also be formed on the outer portion of the
The probe pad P is formed on one surface a of the
The probe pad P is electrically connected to the plurality of resistors R, and is electrically connected to the plurality of
Although not shown in detail, the
Since each of the
That is, since each
As described above, the present invention forms a plurality of resistors by forming the probe pad P so as to be electrically connected to the first and
In addition, the present invention can secure the formation space of the probe pad for measuring the resistance value can increase the utilization of the space in the package.
In addition, since the present invention uses the probe pad P and the
Meanwhile, although not shown in detail below, the resistance probing method using the
First, the
Then, the second probe pin P2 is connected to the
As described above, the present invention may measure the resistance value of the resistance to be measured embedded in the substrate by using a substrate including a probe pad electrically connected to a plurality of embedded resistors.
In addition, the present invention can improve the problem caused by the lack of space for forming the probe pad because it is not necessary to form a separate probe pad around the resistance to be measured in order to measure the resistance value of the desired portion. .
As a result, the present invention can measure the resistance value of the resistance of the desired site, it is possible to properly evaluate the characteristics of the device.
As mentioned above, although the present invention has been illustrated and described with reference to specific embodiments, the present invention is not limited thereto, and the following claims are not limited to the scope of the present invention without departing from the spirit and scope of the present invention. It can be easily understood by those skilled in the art that can be modified and modified.
200:
204b: second circuit pattern R: resistance
P: probe pad 250: substrate
Claims (11)
A plurality of first circuit patterns formed on the one surface of the substrate body;
A plurality of second circuit patterns formed on the other surface of the substrate body and electrically connected to each of the first circuit patterns and including a ball land;
A plurality of resistors embedded in the substrate body and electrically connected to the first circuit pattern and the second circuit pattern, respectively; And
A probe pad formed on one surface of the substrate body and electrically connected to the plurality of resistors;
Substrate for semiconductor package comprising a.
And a plurality of bond fingers on one surface of the substrate body, wherein the plurality of bond fingers are electrically connected to the corresponding plurality of first circuit patterns, respectively.
And a plurality of electroplating lines on one surface of the substrate body, wherein the electroplating lines electrically connect the plurality of bond fingers and the probe pad.
The probe pad is a semiconductor package substrate, characterized in that formed on the outer portion of the substrate body.
The plurality of resistors are formed in the chip mounting portion of the substrate body substrate for a semiconductor package.
A first probe pin is connected to the probe pad formed on the one surface of the substrate body, and a second probe pin is connected to a second circuit pattern connected to any one selected from among the plurality of resistors to form a resistance value of the selected resistor; Measuring;
Method of manufacturing a substrate for a semiconductor package comprising a.
The forming of the substrate further includes forming a plurality of bond fingers on one surface of the substrate body, wherein the plurality of bond fingers are electrically connected to the corresponding plurality of first circuit patterns, respectively. The manufacturing method of the board | substrate for semiconductor packages characterized by the above-mentioned.
In the forming of the substrate, the method may further include forming a plurality of electroplating lines on one surface of the substrate body, wherein the electroplating lines are formed to electrically connect the plurality of bond fingers and the probe pad. A method of manufacturing a substrate for a semiconductor package, characterized in that.
In the step of forming the substrate, the probe pad is a manufacturing method for a semiconductor package substrate, characterized in that formed on the outer portion of the substrate body.
In the forming of the substrate, the plurality of resistors are formed in the chip mounting portion of the substrate body, characterized in that the manufacturing method for a substrate for a semiconductor package.
After measuring the resistance value,
Separating the electroplating lines formed on one surface of the substrate body;
Method of manufacturing a substrate for a semiconductor package, characterized in that it further comprises.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020100093221A KR101142340B1 (en) | 2010-09-27 | 2010-09-27 | Substrate for semiconductor package and method for fabricating the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020100093221A KR101142340B1 (en) | 2010-09-27 | 2010-09-27 | Substrate for semiconductor package and method for fabricating the same |
Publications (2)
Publication Number | Publication Date |
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KR20120031687A KR20120031687A (en) | 2012-04-04 |
KR101142340B1 true KR101142340B1 (en) | 2012-05-17 |
Family
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Application Number | Title | Priority Date | Filing Date |
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KR1020100093221A KR101142340B1 (en) | 2010-09-27 | 2010-09-27 | Substrate for semiconductor package and method for fabricating the same |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02163990A (en) * | 1988-12-16 | 1990-06-25 | Toshiba Corp | Hybrid integrated circuit device |
JP2000171500A (en) | 1998-12-07 | 2000-06-23 | Matsushita Electric Ind Co Ltd | Resistance-measuring device of printed wiring board and resistance measurement method using it |
JP2006237299A (en) | 2005-02-25 | 2006-09-07 | Kyocera Corp | Wiring board |
KR20100009055A (en) * | 2008-07-17 | 2010-01-27 | 삼성전자주식회사 | Printed circuit board for accomplishing a narrow scribe lane and semiconductor package having the same |
-
2010
- 2010-09-27 KR KR1020100093221A patent/KR101142340B1/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02163990A (en) * | 1988-12-16 | 1990-06-25 | Toshiba Corp | Hybrid integrated circuit device |
JP2000171500A (en) | 1998-12-07 | 2000-06-23 | Matsushita Electric Ind Co Ltd | Resistance-measuring device of printed wiring board and resistance measurement method using it |
JP2006237299A (en) | 2005-02-25 | 2006-09-07 | Kyocera Corp | Wiring board |
KR20100009055A (en) * | 2008-07-17 | 2010-01-27 | 삼성전자주식회사 | Printed circuit board for accomplishing a narrow scribe lane and semiconductor package having the same |
Also Published As
Publication number | Publication date |
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KR20120031687A (en) | 2012-04-04 |
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