KR101088952B1 - 형상 평가 방법, 형상 평가 장치 및 3차원 검사 장치 - Google Patents

형상 평가 방법, 형상 평가 장치 및 3차원 검사 장치 Download PDF

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KR101088952B1
KR101088952B1 KR1020097006074A KR20097006074A KR101088952B1 KR 101088952 B1 KR101088952 B1 KR 101088952B1 KR 1020097006074 A KR1020097006074 A KR 1020097006074A KR 20097006074 A KR20097006074 A KR 20097006074A KR 101088952 B1 KR101088952 B1 KR 101088952B1
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South Korea
Prior art keywords
shape
evaluation
highlight
surface shape
representative point
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KR1020097006074A
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English (en)
Korean (ko)
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KR20090052369A (ko
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다이찌 미따
히데오 쯔따모리
히로유끼 나까가와
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도요타지도샤가부시키가이샤
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/254—Projection of a pattern, viewing through a pattern, e.g. moiré
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M5/00—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings
    • G01M5/0033—Investigating the elasticity of structures, e.g. deflection of bridges or air-craft wings by determining damage, crack or wear
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/16—Matrix or vector computation, e.g. matrix-matrix or matrix-vector multiplication, matrix factorization
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Data Mining & Analysis (AREA)
  • Computational Mathematics (AREA)
  • Mathematical Analysis (AREA)
  • Mathematical Optimization (AREA)
  • Pure & Applied Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Biochemistry (AREA)
  • Software Systems (AREA)
  • Algebra (AREA)
  • Computing Systems (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Databases & Information Systems (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Aviation & Aerospace Engineering (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
KR1020097006074A 2007-05-25 2008-05-20 형상 평가 방법, 형상 평가 장치 및 3차원 검사 장치 KR101088952B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2007-139268 2007-05-25
JP2007139268A JP4784555B2 (ja) 2007-05-25 2007-05-25 形状評価方法、形状評価装置および三次元検査装置
PCT/JP2008/059606 WO2008146764A1 (ja) 2007-05-25 2008-05-20 形状評価方法、形状評価装置および三次元検査装置

Publications (2)

Publication Number Publication Date
KR20090052369A KR20090052369A (ko) 2009-05-25
KR101088952B1 true KR101088952B1 (ko) 2011-12-01

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KR1020097006074A KR101088952B1 (ko) 2007-05-25 2008-05-20 형상 평가 방법, 형상 평가 장치 및 3차원 검사 장치

Country Status (6)

Country Link
US (1) US8107737B2 (zh)
EP (1) EP2157403A4 (zh)
JP (1) JP4784555B2 (zh)
KR (1) KR101088952B1 (zh)
CN (1) CN101680752B (zh)
WO (1) WO2008146764A1 (zh)

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KR101624505B1 (ko) * 2009-09-24 2016-05-26 삼성전자주식회사 3-ｄ 포인팅 감지 장치 및 방법
US8532812B2 (en) 2010-06-29 2013-09-10 Mitsubishi Electric Research Laboratories, Inc. System and method for identifying defects of surfaces due to machining processes
CN101986322B (zh) * 2010-11-22 2012-08-15 南京大学 结构光光条中心点信度评价方法
CN102175206B (zh) * 2011-02-21 2013-01-09 合肥工业大学 一种基于三维表面形貌仪的谷的连通性测量方法
WO2013018235A1 (en) * 2011-08-04 2013-02-07 Mitsubishi Electric Corporation Method and system for determining defect of surface of model of object
JP6099115B2 (ja) * 2011-10-26 2017-03-22 学校法人福岡工業大学 三次元表面検査装置および三次元表面検査方法
US20150039121A1 (en) * 2012-06-11 2015-02-05 Hermary Opto Electronics Inc. 3d machine vision scanning information extraction system
DE102013209770B4 (de) * 2013-05-27 2015-02-05 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren zur Bestimmung von einstellbaren Parametern mehrerer Koordinatenmessgeräte sowie Verfahren und Vorrichtung zur Erzeugung mindestens eines virtuellen Abbilds eines Messobjekts
WO2015058982A1 (en) * 2013-10-24 2015-04-30 Koninklijke Philips N.V. Defect inspection system and method
JP5829306B2 (ja) 2014-05-12 2015-12-09 ファナック株式会社 レンジセンサの配置位置評価装置
US9341578B2 (en) * 2014-10-06 2016-05-17 GM Global Technology Operations LLC LED-based inspection of a painted surface finish
JP6723633B2 (ja) * 2015-12-10 2020-07-15 株式会社ディスコ 検査装置
KR101802812B1 (ko) 2016-04-20 2017-11-29 주식회사 고영테크놀러지 물품의 외관 검사장치 및 이를 이용한 물품의 외관 검사방법
JP6880825B2 (ja) * 2016-04-27 2021-06-02 日本製鉄株式会社 板パネルの外観の定量評価方法、装置およびプログラム
US10591277B2 (en) 2016-07-28 2020-03-17 Liberty Reach Inc. Method and system for measuring outermost dimension of a vehicle positioned at an inspection station
JP2019087008A (ja) * 2017-11-07 2019-06-06 東芝テック株式会社 画像処理システム及び画像処理方法
KR102487842B1 (ko) * 2018-03-29 2023-01-13 유브이아이 엘티디. 차량 검사 시스템 및 그 방법
US11592524B2 (en) 2018-11-02 2023-02-28 Waymo Llc Computation of the angle of incidence of laser beam and its application on reflectivity estimation
US11361511B2 (en) * 2019-01-24 2022-06-14 Htc Corporation Method, mixed reality system and recording medium for detecting real-world light source in mixed reality
JP2021085788A (ja) * 2019-11-28 2021-06-03 株式会社リコー 評価装置、評価方法
JP7544909B1 (ja) 2023-03-31 2024-09-03 東京貿易テクノシステム株式会社 画像生成装置、画像生成プログラムおよびシステム

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WO2006073036A1 (ja) 2005-01-07 2006-07-13 National University Corporation Yokohama National University 形状評価方法、形状評価装置、及び形状評価装置を備えた装置
JP2006329898A (ja) 2005-05-30 2006-12-07 Toyota Motor Corp 表面歪の測定方法および測定装置

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US5414518A (en) * 1992-08-10 1995-05-09 Chrysler Corporation Method and apparatus for the evaluation of reflective surfaces
JPH06194148A (ja) * 1992-12-25 1994-07-15 Toyota Motor Corp ハイライト線の定量化方法
JPH07332950A (ja) * 1994-06-10 1995-12-22 Toyota Motor Corp ハイライト線の定量化方法
JP3593155B2 (ja) * 1994-10-20 2004-11-24 株式会社日立製作所 形状設計支援装置
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Patent Citations (2)

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Publication number Priority date Publication date Assignee Title
WO2006073036A1 (ja) 2005-01-07 2006-07-13 National University Corporation Yokohama National University 形状評価方法、形状評価装置、及び形状評価装置を備えた装置
JP2006329898A (ja) 2005-05-30 2006-12-07 Toyota Motor Corp 表面歪の測定方法および測定装置

Also Published As

Publication number Publication date
US20090268965A1 (en) 2009-10-29
JP4784555B2 (ja) 2011-10-05
US8107737B2 (en) 2012-01-31
JP2008292365A (ja) 2008-12-04
CN101680752A (zh) 2010-03-24
WO2008146764A1 (ja) 2008-12-04
EP2157403A4 (en) 2017-07-12
CN101680752B (zh) 2012-02-22
KR20090052369A (ko) 2009-05-25
EP2157403A1 (en) 2010-02-24

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