KR101023815B1 - 대량생산 시스템의 줄 가열을 이용한 증착 장치 및 방법 - Google Patents
대량생산 시스템의 줄 가열을 이용한 증착 장치 및 방법 Download PDFInfo
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- KR101023815B1 KR101023815B1 KR1020090074437A KR20090074437A KR101023815B1 KR 101023815 B1 KR101023815 B1 KR 101023815B1 KR 1020090074437 A KR1020090074437 A KR 1020090074437A KR 20090074437 A KR20090074437 A KR 20090074437A KR 101023815 B1 KR101023815 B1 KR 101023815B1
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- 230000008021 deposition Effects 0.000 title claims abstract description 92
- 238000010438 heat treatment Methods 0.000 title claims abstract description 36
- 238000000034 method Methods 0.000 title claims abstract description 25
- 239000000758 substrate Substances 0.000 claims abstract description 189
- 238000000151 deposition Methods 0.000 claims description 110
- 238000007740 vapor deposition Methods 0.000 claims description 9
- 230000004888 barrier function Effects 0.000 claims description 8
- 230000008016 vaporization Effects 0.000 claims description 5
- 230000020169 heat generation Effects 0.000 claims description 3
- 238000005137 deposition process Methods 0.000 abstract description 13
- 238000004519 manufacturing process Methods 0.000 abstract description 8
- 238000005192 partition Methods 0.000 description 18
- 238000000576 coating method Methods 0.000 description 6
- 239000011248 coating agent Substances 0.000 description 5
- 239000011651 chromium Substances 0.000 description 4
- 229910010272 inorganic material Inorganic materials 0.000 description 4
- 239000011147 inorganic material Substances 0.000 description 4
- 239000011368 organic material Substances 0.000 description 4
- 229910010293 ceramic material Inorganic materials 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 239000011810 insulating material Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000005240 physical vapour deposition Methods 0.000 description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 3
- 229910052721 tungsten Inorganic materials 0.000 description 3
- 239000010937 tungsten Substances 0.000 description 3
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- 229910052804 chromium Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 239000002245 particle Substances 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 238000007733 ion plating Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 238000005245 sintering Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 238000002207 thermal evaporation Methods 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
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Classifications
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/26—Vacuum evaporation by resistance or inductive heating of the source
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
- H01L21/2855—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table by physical means, e.g. sputtering, evaporation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
Claims (8)
- 챔버;증착하려는 패턴으로 형성된 도전층 및 상기 도전층을 덮도록 형성된 증착 대상물층이 일면에 구비된 소스기판;상기 소스기판과 대향되게 배치되는 타겟기판;상기 소스기판 및 상기 타겟기판을 상기 챔버로 로딩 및 언로딩 시키는 이송부; 및상기 도전층에 전원을 인가하여 상기 도전층을 발열시키는 전원공급부;를 포함하는 줄 가열을 이용한 증착 장치.
- 챔버;도전층과, 증착하려는 패턴으로 상기 도전층을 향해 요입부를 갖는 격벽층과, 증착 대상물층을 일면에 순서대로 구비하는 소스기판;상기 소스기판과 대향되게 배치되는 타겟기판;상기 소스기판 및 상기 타겟기판을 상기 챔버로 로딩 및 언로딩 시키는 이송부; 및상기 도전층에 전원을 인가하여 상기 도전층을 발열시키는 전원공급부;를 포함하는 줄 가열을 이용한 증착 장치.
- 제1항 또는 제2항에 있어서,상기 이송부는:상기 전원공급부에 연결되며, 상기 도전층에 전기적으로 접속하는 소켓부;를 구비하는 줄 가열을 이용한 증착 장치.
- 증착하려는 패턴으로 형성된 도전층 및 상기 도전층을 덮도록 형성된 증착 대상물층이 일면에 구비된 소스기판을 준비하는 단계;상기 소스기판과 대향되게 타겟기판을 준비하는 단계;상기 소스기판 및 상기 타겟기판을 챔버 내로 로딩하는 단계;상기 도전층을 발열시키는 단계;상기 도전층의 발열에 의해, 상기 타겟기판과 대향되는 도전층의 일면에 위치된 증착 대상물층을 증기화하여 타겟기판에 증착하는 단계; 및상기 소스기판 및 상기 타겟기판을 상기 챔버로부터 언로딩하는 단계;를 포함하는 줄 가열을 이용한 증착 방법.
- 도전층과, 증착하려는 패턴으로 상기 도전층을 향해 요입부를 갖는 격벽층과, 증착 대상물층을 일면에 순서대로 구비하는 소스기판을 준비하는 단계;상기 소스기판과 대향되게 타겟기판을 준비하는 단계;상기 소스기판 및 상기 타겟기판을 챔버 내로 로딩하는 단계;상기 도전층을 발열시키는 단계;상기 도전층의 발열에 의해, 상기 요입부에 위치된 증착 대상물층을 증기화하여 상기 타겟기판에 증착하는 단계; 및상기 소스기판 및 상기 타겟기판을 상기 챔버로부터 언로딩하는 단계;를 포함하는 줄 가열을 이용한 증착 방법.
- 제4항 또는 제5항에 있어서,상기 로딩 단계에서,상기 소스기판 및 상기 타겟기판은 수평으로 놓여진 상태로 나란히 이송되는 줄 가열을 이용한 증착 방법.
- 제4항 또는 제5항에 있어서,상기 로딩 단계에서,상기 소스기판 및 상기 타겟기판은 수직으로 세워진 상태로 나란히 이송되는 줄 가열을 이용한 증착 방법.
- 제4항 또는 제5항에 있어서,상기 로딩 단계는:상기 도전층에 전기적으로 접속되도록 상기 소스기판을 소켓부로 지지하는 단계;를 포함하는 줄 가열을 이용한 증착 방법.
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KR1020090074437A KR101023815B1 (ko) | 2009-08-12 | 2009-08-12 | 대량생산 시스템의 줄 가열을 이용한 증착 장치 및 방법 |
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KR20110016769A KR20110016769A (ko) | 2011-02-18 |
KR101023815B1 true KR101023815B1 (ko) | 2011-03-21 |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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KR101405502B1 (ko) * | 2011-08-26 | 2014-06-27 | 주식회사 엔씰텍 | 줄 가열을 이용한 유기막 증착 장치 및 이를 이용한 유기전계발광표시 소자의 제조 장치 |
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KR101769547B1 (ko) * | 2015-11-19 | 2017-08-21 | 주식회사 다원시스 | 유도 가열을 이용한 증착 장치 및 증착 시스템 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60219790A (ja) | 1984-04-16 | 1985-11-02 | 富士ゼロックス株式会社 | 電気回路パターン形成装置 |
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Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS60219790A (ja) | 1984-04-16 | 1985-11-02 | 富士ゼロックス株式会社 | 電気回路パターン形成装置 |
Cited By (1)
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KR101405502B1 (ko) * | 2011-08-26 | 2014-06-27 | 주식회사 엔씰텍 | 줄 가열을 이용한 유기막 증착 장치 및 이를 이용한 유기전계발광표시 소자의 제조 장치 |
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