KR101009563B1 - 비접촉 계측 시스템의 캘리브레이션 장치 - Google Patents
비접촉 계측 시스템의 캘리브레이션 장치 Download PDFInfo
- Publication number
- KR101009563B1 KR101009563B1 KR1020080099238A KR20080099238A KR101009563B1 KR 101009563 B1 KR101009563 B1 KR 101009563B1 KR 1020080099238 A KR1020080099238 A KR 1020080099238A KR 20080099238 A KR20080099238 A KR 20080099238A KR 101009563 B1 KR101009563 B1 KR 101009563B1
- Authority
- KR
- South Korea
- Prior art keywords
- calibration
- laser beam
- measurement system
- cameras
- cross
- Prior art date
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/042—Calibration or calibration artifacts
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
- G01B11/161—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge by interferometric means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2504—Calibration devices
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/045—Correction of measurements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/20—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/32—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring the deformation in a solid
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (3)
- 피라미드 형태에서 꼭대기가 제거되어 사다리꼴 형태의 4방 측면과 사각형의 상면을 가지는 구조물이 배치된 캘리브레이션 지그와,상기 캘리브레이션 지그를 정해진 경로를 따라 이동시키는 전동 스테이지를 포함하는 비접촉 계측 시스템의 캘리브레이션 장치.
- 제 1 항에 있어서,상기 캘리브레이션 지그는, 복수의 상기 구조물이 매트릭스 형태로 배치된비접촉 계측 시스템의 캘리브레이션 장치.
- 제 1 항에 있어서,상기 캘리브레이션 지그는 상기 전동 스테이지의 상부에서 이동 가능하며 분리 가능하게 상기 전동 스테이지에 결합된비접촉 계측 시스템의 캘리브레이션 장치.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020080099238A KR101009563B1 (ko) | 2008-10-09 | 2008-10-09 | 비접촉 계측 시스템의 캘리브레이션 장치 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020080099238A KR101009563B1 (ko) | 2008-10-09 | 2008-10-09 | 비접촉 계측 시스템의 캘리브레이션 장치 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20100040144A KR20100040144A (ko) | 2010-04-19 |
KR101009563B1 true KR101009563B1 (ko) | 2011-01-18 |
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020080099238A KR101009563B1 (ko) | 2008-10-09 | 2008-10-09 | 비접촉 계측 시스템의 캘리브레이션 장치 |
Country Status (1)
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KR (1) | KR101009563B1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101359642B1 (ko) * | 2012-01-10 | 2014-02-07 | 삼성중공업 주식회사 | 레이저 비전 시스템의 캘리브레이션 장치 및 방법 |
EP3851789B1 (en) * | 2020-01-15 | 2021-12-01 | Sick IVP AB | Method for calibrating an imaging system with a calibration target object |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5769203A (en) | 1980-10-17 | 1982-04-27 | Dainippon Printing Co Ltd | Mounting device of linear light source in apparatus for measuring area of image pattern on panel |
KR930013674A (ko) * | 1991-12-05 | 1993-07-22 | 전성원 | 원통형 측정 만능 지그 |
JPH10132518A (ja) | 1996-11-01 | 1998-05-22 | Nippon Telegr & Teleph Corp <Ntt> | 3次元距離測定装置のキャリブレーション方法 |
KR20080044586A (ko) | 2006-11-17 | 2008-05-21 | 한국표준과학연구원 | 영상처리기법을 이용한 구조물 균열검출시스템의 신뢰성검증장치 |
-
2008
- 2008-10-09 KR KR1020080099238A patent/KR101009563B1/ko active IP Right Grant
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5769203A (en) | 1980-10-17 | 1982-04-27 | Dainippon Printing Co Ltd | Mounting device of linear light source in apparatus for measuring area of image pattern on panel |
KR930013674A (ko) * | 1991-12-05 | 1993-07-22 | 전성원 | 원통형 측정 만능 지그 |
JPH10132518A (ja) | 1996-11-01 | 1998-05-22 | Nippon Telegr & Teleph Corp <Ntt> | 3次元距離測定装置のキャリブレーション方法 |
KR20080044586A (ko) | 2006-11-17 | 2008-05-21 | 한국표준과학연구원 | 영상처리기법을 이용한 구조물 균열검출시스템의 신뢰성검증장치 |
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Publication number | Publication date |
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KR20100040144A (ko) | 2010-04-19 |
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