KR101006095B1 - A electrostatic discharge protection circuit of activating a low voltage - Google Patents
A electrostatic discharge protection circuit of activating a low voltage Download PDFInfo
- Publication number
- KR101006095B1 KR101006095B1 KR1020080111264A KR20080111264A KR101006095B1 KR 101006095 B1 KR101006095 B1 KR 101006095B1 KR 1020080111264 A KR1020080111264 A KR 1020080111264A KR 20080111264 A KR20080111264 A KR 20080111264A KR 101006095 B1 KR101006095 B1 KR 101006095B1
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- South Korea
- Prior art keywords
- static electricity
- node
- discharge
- electrostatic induction
- electrostatic
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Abstract
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a low voltage operation type static electricity protection circuit, comprising: a first static electricity induction unit connected between a first node and a ground voltage line and inducing static electricity when positive static electricity flows; and a connection between the first node and a power supply voltage line And a second electrostatic induction unit for inducing static electricity when negative static electricity is introduced, the second node connected to the input / output pad and the ground voltage line, and connected to the first electrostatic induction unit and induced by the first electrostatic induction unit. A first discharge part that is turned on with positive static electricity to discharge the positive static electricity, and is connected between the second node connected to the input / output pad and the power supply voltage line and connected to the second static electricity induction part, and by the second static electricity induction part. A second discharge part and the first node and the second discharge part which are turned on by the induced negative static electricity to discharge the negative static electricity The present invention relates to a low voltage operation type static electricity protection circuit capable of electrostatic discharge at low voltage without increasing a capacitor component at a pin by including a resistor connected between nodes.
ESD, electrostatic induction, electrostatic discharge, diode chain
Description
The present invention relates to a static electricity protection circuit, and more particularly, to a low voltage operation type static electricity protection circuit that protects a semiconductor device from static electricity by quickly discharging static electricity flowing into an input / output pad of a semiconductor device at a low voltage.
In general, when a semiconductor integrated circuit is in contact with a human body or a machine, the static electricity charged in the human body or the machine is discharged into the semiconductor, and thus the semiconductor internal circuit may be greatly damaged.
The semiconductor integrated circuit configures an electrostatic protection circuit between the input / output pad and the semiconductor internal circuit to protect the semiconductor internal circuit from such damage.
However, as the semiconductor technology becomes faster and more highly integrated, the gate oxide film thickness of the semiconductor internal circuit device is gradually thinner, and thus the gate breakdown voltage is also lowered.
Therefore, as the difference between the operating voltage of the static electricity protection device and the gate breakdown voltage of the semiconductor internal circuit in the static electricity protection circuit is gradually reduced, the gate of the internal circuit device is destroyed before the static electricity introduced into the semiconductor is discharged by the static electricity protection device. May occur.
Therefore, an electrostatic protection circuit employed in a high speed and highly integrated semiconductor circuit requires a technology that can further lower the operating voltage of the electrostatic protection element.
1 is a circuit diagram of a conventional static electricity protection circuit, and shows an example of a static electricity protection circuit having a lower operating voltage.
Referring to FIG. 1, the conventional static
The
The
The conventional static
However, since the conventional static
In addition, since the operating voltage of the
The present invention provides a low voltage operation type static electricity protection circuit which does not decrease the data transfer rate into the semiconductor device by preventing the capacitor component at the pin from increasing.
In addition, the present invention provides a low voltage operation type static electricity protection circuit suitable for the protection of high speed and highly integrated semiconductor devices having low internal circuit damage voltage by enabling electrostatic discharge at low voltage.
The low voltage operation type static electricity protection circuit of the present invention is connected between a first node and a ground voltage line, and includes a first static electricity induction unit for inducing static electricity when positive static electricity is introduced, and is connected between the first node and a power supply voltage line and is negative. A second static electricity inducing part which induces static electricity when inflow of static electricity, a second node connected to the input / output pad and the ground voltage line, and connected to the first static electricity inducing part and the positive amount of static electricity induced by the first static electricity inducing part A first discharge part turned on to discharge the positive static electricity, a second node connected to an input / output pad, and the power supply voltage line, connected to the second electrostatic induction part, and induced by the second electrostatic induction part The second discharge part and the first node and the second node to turn on the negative static electricity to discharge the negative static electricity It characterized in that it comprises a resistor connected.
Preferably, the first electrostatic induction part is characterized in that it comprises a first diode chain for connecting a plurality of forward diodes in series.
The first electrostatic induction part may further include a first diode in a reverse direction connected in parallel with the first diode chain.
In addition, the second electrostatic induction part is characterized in that it comprises a second diode chain for connecting a plurality of reverse diodes in series.
In addition, preferably, the second electrostatic induction part further comprises a second diode in the forward direction connected in parallel with the second diode chain.
Preferably, the first discharge part may include an NMOS transistor having a gate connected to the first diode chain, and a source and a drain connected between the second node and the ground voltage line, respectively.
Preferably, the second discharge unit may include a PMOS transistor having a gate connected to the second diode chain, and a source and a drain connected between the second node and the power supply voltage line, respectively.
The present invention has the effect of increasing the reliability of the semiconductor device by configuring the capacitor component at the pin not to increase so that the data transfer rate into the semiconductor device is not lowered.
In addition, the present invention can control the operating voltage of the electrostatic discharge portion by the diode chain, thereby enabling electrostatic discharge at low voltage, so that the stability of the semiconductor device by discharge under the low breakdown voltage of the high-speed and highly integrated semiconductor internal circuit There is an effect to increase.
2 is a block diagram of a low voltage operation static
First, referring to FIG. 2, the low voltage operation type static
The first
The second
The
The
In addition, a
In this case, the
The operation description of the low voltage type static
When positive static electricity flows into the input /
The amount of static electricity passing through the
On the contrary, when negative static electricity flows in, the negative static electricity passes through the
The turned-on
In this case, since a small amount of positive or negative static electricity flowing into the input /
For a detailed description thereof, referring to FIG. 3, the first
The first
The second
The second
When the
At this time, a part of the amount of static electricity that passes the
Meanwhile, when negative static electricity flows through the input /
In this case, a part of the negative static electricity passing through the
The
The
At this time, in the connection of the gate of the
To this end, the gate of the
Operation of the low voltage type static
First, when positive static electricity flows into the input /
The
That is, since the
In this case, the
3 illustrates that the operating voltage of the
Accordingly, the
A large amount of static electricity is discharged through the
At this time, a small amount of static electricity flowing into the
Meanwhile, when negative static electricity flows into the input /
The negative static electricity flows in the reverse direction of the
The
The
The influence of negative static electricity flowing through the
4 is an operation waveform diagram as a simulation result showing the operating voltage drop of the electrostatic protection element when the present invention is applied.
Referring to FIG. 4, the conventional static electricity protection circuit (100 in FIG. 1) shows an operating voltage of about 5 V in the CDM transistor unit (120 in FIG. 1), while the first discharge unit (FIG. The NMOS transistor (230 of FIG. 3) of FIG. 3 is configured to have a gate connected between the second and third diodes of the first diode chain (211 of FIG. 3) consisting of four diodes, and thus a low operating voltage of about 3 V. Seemed.
As described above, the configuration of the low-voltage operation type electrostatic protection circuit according to the preferred embodiment of the present invention is illustrated with reference to the drawings and described above. However, this is merely an example and is within the scope not departing from the technical spirit of the present invention. Various designs and modifications are possible in the art and it will be readily apparent to those skilled in the art that this is within the scope of the present invention.
1 is a detailed circuit diagram of a conventional static electricity protection circuit.
Figure 2 is a block diagram of a low voltage operation static electricity protection circuit according to an embodiment of the present invention.
3 is a detailed circuit diagram of a low voltage operation type static electricity protection circuit according to the embodiment of the present invention.
4 is a prior art comparative operation waveform diagram of a low voltage operation electrostatic discharge protection circuit according to an embodiment of the present invention;
Claims (7)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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KR1020080111264A KR101006095B1 (en) | 2008-11-10 | 2008-11-10 | A electrostatic discharge protection circuit of activating a low voltage |
Applications Claiming Priority (1)
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KR1020080111264A KR101006095B1 (en) | 2008-11-10 | 2008-11-10 | A electrostatic discharge protection circuit of activating a low voltage |
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KR20100052309A KR20100052309A (en) | 2010-05-19 |
KR101006095B1 true KR101006095B1 (en) | 2011-01-07 |
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KR1020080111264A KR101006095B1 (en) | 2008-11-10 | 2008-11-10 | A electrostatic discharge protection circuit of activating a low voltage |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4277128A1 (en) * | 2022-05-09 | 2023-11-15 | Nxp B.V. | Electrostatic discharge protection for wireless device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002208677A (en) | 2001-01-12 | 2002-07-26 | Toyota Industries Corp | Semiconductor device having temperature detection function |
JP2006100532A (en) | 2004-09-29 | 2006-04-13 | Toshiba Corp | Electrostatic protective circuit |
KR20060078173A (en) * | 2004-12-30 | 2006-07-05 | 동부일렉트로닉스 주식회사 | Esd protection circuit using diode |
JP2007335474A (en) | 2006-06-12 | 2007-12-27 | Denso Corp | Semiconductor device |
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2008
- 2008-11-10 KR KR1020080111264A patent/KR101006095B1/en not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002208677A (en) | 2001-01-12 | 2002-07-26 | Toyota Industries Corp | Semiconductor device having temperature detection function |
JP2006100532A (en) | 2004-09-29 | 2006-04-13 | Toshiba Corp | Electrostatic protective circuit |
KR20060078173A (en) * | 2004-12-30 | 2006-07-05 | 동부일렉트로닉스 주식회사 | Esd protection circuit using diode |
JP2007335474A (en) | 2006-06-12 | 2007-12-27 | Denso Corp | Semiconductor device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP4277128A1 (en) * | 2022-05-09 | 2023-11-15 | Nxp B.V. | Electrostatic discharge protection for wireless device |
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KR20100052309A (en) | 2010-05-19 |
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